Beam hazard recovery method and apparatus

Abstract

The present application provides a beam failure recovery method and apparatus. The method includes: a terminal device receives configuration information of a cell, the configuration information of the cell includes M beam failure detection resource groups and M candidate beam resource groups, the M beam failure detection resource groups are in one-to-one correspondence with the M candidate beam resource groups, and M is an integer. When M is an integer greater than 1 and a beam failure occurs in at least one of the M beam failure detection resource groups, the terminal device transmits beam failure recovery information corresponding to the cell by using a first medium access control control element MAC CE. According to the beam failure recovery method provided in the present application, beam failure recovery can be performed in time.

Description

[Technical field]

[0001] The present application relates to the field of communications technology, and more particularly to beam failure recovery methods and apparatus. [Background technology]

[0002] The fifth generation (5G) mobile communication system uses high frequency communication based on analog beams. The analog beams have a narrow signal coverage and are easily blocked by obstacles, so beam failure occurs. To solve the above problem, a beam failure recovery (BFR) procedure is provided in Release (Rel) 15 of the 5G system. The procedure includes a network device configuring, for a terminal device, one beam failure detection resource group used for beam failure detection and one candidate beam resource group used for determining a candidate beam for the current beam. When detecting that the quality of each resource in the beam failure detection resource group is lower than threshold 1, the terminal device determines that a beam failure occurs. When there is a resource in one corresponding candidate beam resource group whose quality is higher than threshold 2, the terminal device can determine one candidate beam for performing beam failure recovery. The candidate beam is a beam corresponding to a candidate beam resource in the candidate beam resource group whose quality is higher than threshold 2.

[0003] However, in some scenarios, multiple beam failure detection resource groups and multiple candidate beam resource groups may need to be configured in local beam failure detection and recovery. For example, when a cell includes multiple transmission reception points (TRPs), the terminal device needs to perform beam failure detection and recovery for each TRP in the cell. In the above scenario, when the above BFR method is used to perform beam failure recovery, the terminal device determines that a beam failure occurs and performs beam failure recovery only when the quality of all beam failure detection resources configured by the network device is lower than threshold 1, so the terminal device cannot perform beam failure recovery in time.

[0004] Therefore, a beam fault recovery method is urgently needed to perform the beam fault recovery in time. Summary of the Invention

[0005] The present application provides a beam failure recovery method for performing beam failure recovery in time.

[0006] According to a first aspect, a beam failure recovery method is provided, comprising the steps of:

[0007] The terminal device receives cell configuration information, where the cell configuration information includes M beam fault detection resource groups and M candidate beam resource groups, where the M beam fault detection resource groups are in one-to-one correspondence with the M candidate beam resource groups, and M is an integer.

[0008] When M is an integer greater than 1 and a beam failure occurs in at least one of the M beam failure detection resource groups, the terminal device detects a first medium access control control element ( MAC CE ) By using the cell Corresponding to Transmits beam failure recovery information.

[0009] Corresponding to the above method, a communication device is further disclosed. The device may be the above terminal device, or may be a chip or a functional module in the terminal device, A receiving unit configured to receive cell configuration information, the cell configuration information including M beam fault detection resource groups and M candidate beam resource groups, the M beam fault detection resource groups being in one-to-one correspondence with the M candidate beam resource groups, where M is an integer; and a first medium access control element, when a beam failure occurs in at least one of the M beam failure detection resource groups, where M is an integer greater than 1; ( MAC CE ) a transmitting unit configured to transmit beam failure recovery information corresponding to the cell by using Includes.

[0010] The M beam fault detection resource groups and the M candidate beam resource groups included in the cell configuration information are information configured by a network device for a terminal device. When M is equal to 1, it can be understood that the M beam fault detection resource groups and the M candidate beam resource groups are configured by one network device. In this case, the cell can be understood as a single-TRP cell. When M is an integer greater than 1, the M beam fault detection resource groups and the M candidate beam resource groups are configured by M network devices. In this case, the cell can be understood as a multi-TRP cell. It should be further understood that when a cell is a multi-TRP cell (in other words, M is an integer greater than 1), a downlink signal in the cell is simultaneously transmitted to a terminal device by using multiple TRPs. In this case, the multiple TRPs may be regarded as one network device, or the multiple TRPs may be regarded as multiple transmitters of the entire network device. In this embodiment of the present application, descriptions such as "by using multiple TRPs", "multiple beam fault detection resource groups are configured", and "multiple candidate beam resource groups are configured" are equivalent to each other. The meanings indicated by the descriptions coincide when differences are not highlighted.

[0011] Optionally, the cell configuration information may further include a scheduling requirement (SR) resource. When the network device configures multiple cells for one terminal device, and at least one of the multiple cells is a multi-TRP cell, the network device needs to configure multiple SR resources for the one terminal device, and the multiple SR resources are in one-to-one correspondence with the multiple TRPs, or the network device configures one SR resource, but the one SR resource has multiple spatial relation parameters (i.e., uplink transmission beams). When all the cells configured by the network device for the terminal device are single-TRP cells, the network device needs to configure only one SR resource, and the one SR resource has only a single spatial relation parameter.

[0012] Optionally, when the network device configures multiple cells for the terminal device and the multiple cells include the cell, the configuration information received by the terminal device not only includes configuration information of the cell, but also includes configuration information of cells other than the cell in the multiple cells.

[0013] In the above technical solution, when the terminal device determines that a cell is a multi-TRP cell (in other words, M is an integer greater than 1) and a beam failure occurs in at least one of the M beam failure detection resource groups configured for the cell, the terminal device can report beam failure recovery information corresponding to the at least one beam failure detection resource group by using the first MAC CE. In other words, when the beam failure recovery method provided in the present application is applied to a multi-TRP cell, if the terminal device determines that a beam failure occurs in one TRP in the multi-TRP cell, the terminal device can report beam failure recovery information corresponding to the one TRP in which a beam failure occurs by using the first MAC CE, so that beam failure recovery can be implemented in the multi-TRP cell in time.

[0014] Referring to the first aspect, in some implementations of the first aspect, the first MAC CE includes one bitmap.

[0015] When the configuration information of a cell corresponding to any bit in the bitmap includes N beam failure detection resource groups and N candidate beam resource groups, where N is 0 or 1, and the value of the any bit is a first value by default, the first value indicates that no beam failure has occurred in the cell corresponding to the any bit.

[0016] In the above technical solution, when a cell corresponding to any bit in a bitmap included in the first MAC CE is a single-TRP cell, regardless of the value (e.g., 0 or 1) of the any bit, the terminal device defaults to considering that no beam failure occurs in the cell corresponding to the any bit. Also, when the configuration information of the cell corresponding to the any bit includes N beam failure detection resource groups and N candidate beam resource groups, where N is 0 or 1, the value of the any bit is a first value by default, and the first value indicates that no beam failure occurs in the cell corresponding to the any bit, and the first value may be 0 or 1. In other words, the first MAC CE provided in this embodiment of the present application is only used to report beam failure recovery information of a multi-TRP cell. For a single-TRP cell, even if a beam failure occurs in the single-TRP cell, the first MAC CE is not used to report beam failure recovery information of the single-TRP cell.

[0017] With reference to the first aspect, in some implementations of the first aspect, any bit in the bitmap corresponds to M octets.

[0018] The M octets are in one-to-one correspondence with the M beam fault detection resource groups.

[0019] Alternatively, the M octets are in one-to-one correspondence with the M candidate beam resource groups.

[0020] Alternatively, the M octets are in one-to-one correspondence with the M transmitting / receiving points TRP.

[0021] M beam fault detection resource groups and M candidate beam resource groups are configured for M TRPs. In this embodiment of the present application, descriptions such as "TRP", "beam fault detection resource group" and "candidate beam resource group" can be understood to be equivalent to each other. The meanings indicated by the descriptions are consistent when no differences are highlighted.

[0022] The arbitrary bit corresponds to M octets. The arbitrary bit may be understood as one bit corresponding to one cell configured by the network device for the terminal device, and the one cell corresponding to the arbitrary bit is a multi-TRP cell in which a beam failure occurs. For example, a beam failure may occur in one TRP in a multi-TRP cell. Alternatively, a beam failure may occur in some or all TRPs in a multi-TRP cell. The occurrence of a beam failure in one cell may be understood as the terminal device detecting that a beam failure occurs in M ​​beam failure detection resource groups included in the configuration information of one cell.

[0023] With reference to the first aspect, in some implementations of the first aspect, each of the M octets includes a first field, and the first field indicates whether a beam failure is detected in the beam failure detection resource group corresponding to each octet.

[0024] In this embodiment of the present application, the beam failure detection resource group and the TRP can be equivalent to each other. In other words, the first field may also indicate that a beam failure occurs in the TRP corresponding to each octet. The length of the first field may be 1 bit. In this case, the first field may be located in the first bit or the second bit of the octet of the first field. Optionally, the length of the first field may alternatively be more bits. For example, the length of the first field may alternatively be 2 bits. In this case, the first field may use any two bits (e.g., the first two bits) of the octet of the first field.

[0025] With reference to the first aspect, in some implementations of the first aspect, the remaining fields in each octet are reserved if the first field indicates that no beam failure is detected in the beam failure detection resource group corresponding to each octet.

[0026] With reference to the first aspect, in some implementations of the first aspect, each of the M octets further includes a second field.

[0027] The second field indicates whether there is a candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to each octet.

[0028] Optionally, the second field indicates whether there is information about a candidate beam resource in each octet. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the second field may alternatively indicate whether there is a candidate beam resource that satisfies the quality requirement in the TRP corresponding to each octet. The length of the second field may be 1 bit. In this case, the second field may be located in the first bit, the second bit, or the third bit of the octet of the second field. Optionally, the length of the second field may alternatively be more bits. For example, the length of the second field may alternatively be 2 bits. In this case, the second field may use any two bits (e.g., the first two bits) of the octet of the second field.

[0029] When the second field indicates that a candidate beam resource satisfying the quality requirement exists in the candidate beam resource group corresponding to the octet of the second field, the other remaining fields in the octet of the second field carry further beam failure recovery information.When the second field indicates that a candidate beam resource satisfying the quality requirement does not exist in the candidate beam resource group corresponding to the octet of the second field, the remaining fields in the octet of the second field are reserved, i.e., there is no beam failure recovery information, and the terminal device may ignore the remaining fields.

[0030] With reference to the first aspect, in some implementations of the first aspect, each of the M octets further includes a third field.

[0031] The third field indicates information about candidate beam resources determined within the candidate beam resource group corresponding to each octet and that satisfy the quality requirements.

[0032] In this embodiment of the present application, the candidate beam resource group and the TRP may be equal to each other. In other words, the third field may alternatively indicate whether there is information about the candidate beam resource that satisfies the quality requirement in the TRP corresponding to each octet. The length of the third field may be 6 bits or 5 bits. For example, when the length of the third field is 6 bits, the third field may specifically be the last 6 bits of the octet of the field. For example, when the length of the third field is 5 bits, the third field may specifically be the last 5 bits of the octet of the field. Optionally, the length of the third field may alternatively be other values. This is not specifically limited here.

[0033] In the above technical solution, a type of a first MAC CE is provided, which is represented as a first type of the first MAC CE. It can be understood that in some implementations, one bit in a bitmap included in the first type of the first MAC CE corresponds to one field, and one field corresponds to one cell. In some other implementations, the first type of the first MAC CE includes multiple fields, each of the multiple fields corresponds to one cell, and each of the multiple fields uses multiple bits (two bits or more than two bits). In this case, the multiple fields can be regarded as one whole bitmap. In other words, one field in the bitmap included in the first MAC CE includes multiple bits, and one field corresponds to one cell. The first field included in the first type of the first MAC CE indicates whether a beam failure occurs in a beam failure detection resource group corresponding to an octet of the field. The second field included in the first type of the first MAC CE indicates whether a candidate beam resource that satisfies a quality requirement exists in a candidate beam resource group corresponding to the beam failure detection resource group corresponding to the octet of the field. The third field included in the first type first MAC CE indicates information about the candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the octet of the field. It can be understood that the first type first MAC CE may include any one of the following fields: the first field, the second field, and the third field. After the network device receives the first type first MAC CE sent by the terminal device, the network device may determine a beam failure recovery policy by using the first type first MAC CE, so that the beam failure recovery can be implemented in the multi-TRP cell in time.

[0034] With reference to the first aspect, in some implementations of the first aspect, any bit in the bitmap corresponds to one or more octets.

[0035] With reference to the first aspect, in some implementations of the first aspect, the first field in one or more octets includes a fourth field.

[0036] The fourth field indicates the number of octets that correspond to a given bit.

[0037] Any bit corresponds to one or more octets. A cell corresponding to any bit can be understood as a multi-TRP cell with a beam failure. The specific number of octets corresponding to any bit is equal to the number of TRPs with a beam failure in the multi-TRP cell corresponding to the any bit. Specifically, when only one TRP in the multi-TRP cell corresponding to the any bit is beam failed, the any bit corresponds to only one octet, in other words, the first MAC CE of the second type includes only one octet corresponding to the any bit. For example, there are a total of two TRPs in the multi-TRP cell. When only one of the two TRPs is beam failed, the bit corresponding to the multi-TRP cell in the bitmap corresponds to only one octet, and one octet corresponds to the TRP with a beam failure. In this case, the first MAC CE of the second type includes only one octet corresponding to the any bit. When only the TRPs in the multi-TRP cell corresponding to the arbitrary bit are beam-failed, the arbitrary bit corresponds only to the octets, in other words, the bitmap includes the octets corresponding to the arbitrary bit. For example, there are a total of two TRPs in the multi-TRP cell. When the two TRPs are beam-failed, the bit corresponding to the multi-TRP cell in the bitmap corresponds only to two octets, and the two octets correspond to the two TRPs in which the beam failure occurs. In this case, the first MAC CE of the second type includes two octets corresponding to the arbitrary bit. In the above technical solution, the number of TRPs in the multi-TRP cell corresponding to the arbitrary bit in the bitmap that are beam-failed may be determined based on the fourth field, and the number of octets corresponding to the arbitrary bit is dynamically adjusted. This helps to reduce resource overhead. Furthermore, based on the fourth field, it may be further determined whether the octet next to the first octet in the multiple octets corresponding to the arbitrary bit carries beam failure recovery information of the cell corresponding to the arbitrary bit. Optionally, the fourth field may also be understood as indicating the number of TRPs in which beam obstruction occurs in a multi-TRP cell.

[0038] Optionally, the fourth field may also be understood as indicating the number of beam failure detection resource groups in which beam failure occurs in the multi-TRP cell, and may be defined, for example, as follows: the fourth field set to 0 indicates that beam failure occurs in a single TRP in the multi-TRP cell, and the fourth field set to 1 indicates that beam failure occurs in multiple TRPs in the multi-TRP cell.

[0039] Optionally, the fourth field may also be understood as indicating a beam failure type. The beam failure type may include beam failure occurring at a single TRP in a multi-TRP cell, beam failure occurring at multiple TRPs in a multi-TRP cell, or beam failure occurring at all TRPs in a multi-TRP cell. For example, cell #1 is a cell in which multiple TRPs are used for transmission. Cell #1 includes a total of four TRPs, and the four TRPs communicate with the same terminal device. In this case, the fourth field may indicate that beam failure occurs at one TRP, two TRPs, three TRPs, or four TRPs in cell #1.

[0040] With reference to the first aspect, in some implementations of the first aspect, the fourth field is a field of the first octet in the one or more octets.

[0041] The fourth field is the octet following the first octet. 、 cell Corresponding to Indicates whether beam failure recovery information is carried.

[0042] The fourth field may be located at the first or second bit in the first octet. In this case, the length of the fourth field is 1 bit. Optionally, the length of the fourth field may alternatively be more bits. For example, the length of the fourth field may alternatively be 2 bits. In this case, the fourth field may occupy any two bits (e.g., the first two bits) of the fourth field octet.

[0043] The fourth field determines whether the octet following the first octet is 、 cell Corresponding to The indication of whether beam fault recovery information is carried may also be understood as the fourth field indicating whether the first MAC CE includes a second octet corresponding to a cell corresponding to any bit. The fourth field may be located in the first or second bit of the first octet. In this case, the length of the fourth field is 1 bit. Optionally, the length of the fourth field may alternatively be more bits. For example, the length of the fourth field may alternatively be 2 bits. In this case, the fourth field may use the first two bits of the octet of the fourth field.

[0044] With reference to the first aspect, in some implementations of the first aspect, the first octet of the one or more octets further includes a fifth field.

[0045] The fifth field indicates information about the TRP where the beam obstruction occurs.

[0046] In this embodiment of the present application, the type of information about the TRP where a beam failure occurs is not limited. For example, the information about the TRP where a beam failure occurs may be information about the index of the TRP where a beam failure occurs. The index of the TRP may be the index of one beam failure detection resource group, that is, the index of the beam failure detection resource group corresponding to the TRP. Alternatively, the index of the TRP may be the index of one candidate beam resource group, that is, the index of the candidate beam resource group corresponding to the TRP. Alternatively, the index of the TRP may be the index of one CORESET group, that is, CORESETPoolIndex.

[0047] Optionally, the first MAC CE may further include multiple fifth fields. For example, the first MAC CE may include three fifth fields, which may be represented as fifth field #1, fifth field #2, and fifth field #3. The fifth field #1 indicates an index of a beam failure detection resource group corresponding to a TRP where a beam failure occurs. The fifth field #2 indicates an index of a beam failure detection resource group corresponding to a TRP where a beam failure occurs. Candidate Beam Resource Group The fifth field indicates the index of 3 indicates the index of the CORESET group corresponding to the TRP where the beam obstruction occurs.

[0048] The length of the fifth field may be 1 bit, or the length of the fifth field may be more bits. For example, the length of the fifth field may alternatively be 2 bits. In this case, the fifth field may occupy any two bits (e.g., the first two bits) of the fifth field octet.

[0049] With reference to the first aspect, in some implementations of the first aspect, each of the one or more octets further includes a sixth field, the sixth field indicating a beam fault detection resource group corresponding to each octet or a candidate beam resource group corresponding to each octet.

[0050] The length of the sixth field may be 1 bit, or the length of the sixth field may be more bits, which is not specifically limited here.

[0051] Referring to the first aspect, in some implementations of the first aspect, each of the one or more octets further includes a seventh field, and the seventh field indicates whether there is a candidate beam or a candidate beam resource that satisfies a quality requirement in the candidate beam resource group corresponding to each octet. Alternatively, the seventh field indicates whether there is information about a candidate beam resource in each octet. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the seventh field may alternatively indicate whether there is a candidate beam resource that satisfies a quality requirement in the TRP corresponding to each octet. The length of the seventh field may be 1 bit, and the seventh field may be located at the first bit, the second bit, or the third bit in the corresponding octet. For example, if any bit corresponds to multiple octets, the seventh field in the first octet of the multiple octets may be located at the third bit of the first octet, the seventh field in the second octet of the multiple octets may also be located at the third bit of the second octet, or the seventh field of the second octet may be located at the first bit of the second octet. Optionally, the length of the seventh field may alternatively be more bits. This is not specifically limited here.

[0052] Referring to the first aspect, in some implementations of the first aspect, each of the one or more octets further includes an eighth field, and the eighth field indicates information about a candidate beam or a candidate beam resource that is determined in the candidate beam resource group corresponding to each octet and satisfies a quality requirement. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the eighth field may alternatively indicate information about a candidate beam resource that satisfies a quality requirement in the TRP corresponding to each octet. News You may also indicate. 8 The length of the field may be 6 or 5 bits. 8 When the field length is 6 bits, 8Specifically, the field may be the last 6 bits of the octet of the field. For example, 8 When the field length is 5 bits, 8 The field may be specifically the last 5 bits of the octet of the field. Optionally, the length of the 8th field may alternatively be other values. This is not specifically limited here. It can be understood that in this embodiment of the present application, there are two definition methods for the 8th field. The 8th field indicates information about the candidate beam resource that is determined within the candidate beam resource group corresponding to each octet and satisfies the quality requirement. This is the first definition method for the 8th field provided in this embodiment of the present application.

[0053] In the above technical solution, another type of the first MAC CE is provided, which is represented as a second type of the first MAC CE. It can be understood that in some implementations, one bit in the bitmap included in the second type of the first MAC CE corresponds to one field, and one field corresponds to one cell. In some other implementations, the second type of the first MAC CE includes multiple fields, each of the multiple fields corresponds to one cell, and each of the multiple fields uses multiple bits (2 bits or more than 2 bits). In this case, the multiple fields can be regarded as one whole bitmap. In other words, one field in the bitmap included in the first MAC CE includes multiple bits, and one field corresponds to one cell.

[0054] The first MAC CE of the second type may include any one of the following fields: a fourth field, a fifth field, a seventh field, and an eighth field.

[0055] After the network device receives the first MAC CE of the second type transmitted by the terminal device, the network device may determine a beam failure recovery policy by using the first MAC CE of the second type, so that beam failure recovery can be implemented in the multi-TRP cell in time.

[0056] In some implementations, each of the one or more octets includes a fourth field, a sixth field, a seventh field, and an eighth field.

[0057] In the above technical solution, another type of the first MAC CE is provided, which is represented as a third type of the first MAC CE. It can be understood that in some implementations, one bit in the bitmap included in the third type of the first MAC CE corresponds to one field, and one field corresponds to one cell. In some other implementations, the third type of the first MAC CE includes multiple fields, each of the multiple fields corresponds to one cell, and each of the multiple fields uses multiple bits (two bits or more than two bits). In this case, the multiple fields corresponding to one cell can be regarded as one whole bitmap. In other words, one field in the bitmap included in the first MAC CE includes multiple bits, and one field corresponds to one cell. The third type of the first MAC CE may include a fourth field, a sixth field, a seventh field, and an eighth field. After the network device receives the third type of the first MAC CE transmitted by the terminal device, the network device may determine a beam failure recovery policy by using the third type of the first MAC CE, so that the beam failure recovery can be implemented in the multi-TRP cell in time. It may be understood that the above three types of specific formats of the first MAC CE provided in this embodiment of the present application are merely examples and do not constitute any limitation on the specific format of the first MAC CE provided in this embodiment of the present application. Optionally, in some implementations, the first MAC CE provided in this embodiment of the present application may include any one or more of a plurality of fields (the plurality of fields includes a first field, a second field, a third field, a fourth field, a fifth field, a sixth field, a seventh field, and an eighth field). For example, in some implementations, the first MAC CE may include only the first field. For example, in some implementations, the first MAC CE may include a fourth field. For example, in some implementations, the first MAC CE may include a sixth field. For example, in some implementations, the first MAC CE may include a first field and a second field.For example, in some implementations, the first MAC CE may alternatively include a first field, a second field, and a fourth field. For example, in some implementations, the first MAC CE may alternatively include a fourth field and a fifth field.

[0058] With reference to the first aspect, in some implementations of the first aspect, each of the one or more octets further includes an eighth field. The value of the eighth field includes a plurality of field values. One field value of the plurality of field values ​​indicates that there is no candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to each octet. Each field value of the plurality of field values ​​different from the one field value indicates information about one candidate beam resource that satisfies the quality requirement.

[0059] The eighth field is a second definition method provided in this embodiment of the present application. The eighth field may include multiple bits. For example, the eighth field may include 4 bits, 5 bits, 6 bits, 7 bits, etc.

[0060] Referring to the first aspect, in some implementations of the first aspect, the first MAC CE further includes a tenth field.

[0061] The tenth field indicates a beam fault type. When M is equal to 2, the beam fault type includes a beam fault occurring in a first beam fault detection resource group among the M beam fault detection resource groups, a beam fault occurring in a second beam fault detection resource group among the M beam fault detection resource groups, or a beam fault occurring in two groups among the M beam fault detection resource groups.

[0062] M may be, but is not limited to, equal to 2. M may alternatively be other integers greater than 1. For example, M may alternatively be equal to 3, 4, 5, etc. Correspondingly, the tenth field indicates further beam failure types. For example, when M is equal to 3, the tenth field indicates that the beam failure types may include a beam failure occurring in a first beam failure detection resource group among the three beam failure detection resource groups, a beam failure occurring in a second beam failure detection resource group among the three beam failure detection resource groups, a beam failure occurring in a third beam failure detection resource group among the three beam failure detection resource groups, a beam failure occurring in any two of the three beam failure detection resource groups, or a beam failure occurring in all three beam failure detection resource groups.

[0063] With reference to the first aspect, in some implementations of the first aspect, the tenth field includes two bits.

[0064] Each of the two bits corresponds to one of the M beam fault detection resource groups, and each bit indicates whether a beam fault has occurred in one corresponding beam fault detection resource group.

[0065] With reference to the first embodiment, in some implementations of the first embodiment, When the 10th field indicates that two of the M beam failure detection resource groups have beam failures, any bit corresponds to two octets, or When the tenth field indicates that a beam failure has occurred in one of the M beam failure detection resource groups, any bit corresponds to one octet.

[0066] It should be understood that the above technical solution is described by using an example where M is equal to 2 and the tenth field includes 2 bits. Optionally, M may alternatively be another integer greater than 1 and not equal to 2. For example, when M is alternatively equal to 3, the tenth field indicates that the beam failure type may specifically include a beam failure occurring in a first beam failure detection resource group in the M beam failure detection resource groups, a beam failure occurring in a second beam failure detection resource group in the M beam failure detection resource groups, a beam failure occurring in a third beam failure detection resource group in the M beam failure detection resource groups, or a beam failure occurring in three of the M beam failure detection resource groups. Optionally, the tenth field may further include more bits (e.g., 3 bits).

[0067] Based on the tenth field, another type of the first MAC CE is further provided in this embodiment of the present application, which is denoted as a fifth type of the first MAC CE.

[0068] The fifth type first MAC CE provided in this embodiment of the present application includes one bitmap. It can be understood that the definition of the one bitmap included in the fifth type first MAC CE is the same as the definition of the one bitmap included in the first type first MAC CE. For contents not described in detail here, please refer to the definition of the one bitmap included in the first type first MAC CE. Alternatively, the definition of the one bitmap included in the fifth type first MAC CE is the same as the definition of the one bitmap included in the fourth type first MAC CE. For contents not described in detail here, please refer to the definition of the one bitmap included in the fourth type first MAC CE.

[0069] Optionally, any bit in the bitmap corresponds to one or more octets.

[0070] The first MAC CE of the fifth type includes a tenth field. That is, the first MAC CE of the fifth type provided in this embodiment of the present application may be understood as a first MAC CE including a tenth field, and other fields included in the first MAC CE of the fifth type are not particularly limited. For example, the first MAC CE of the fifth type may further include a seventh field and an eighth field in a first definition method. For example, the first MAC CE of the fifth type may further include an eighth field in a second definition method. For example, the first MAC CE of the fifth type may further include a seventh field and an eighth field in a second definition method.

[0071] It may be understood that when a cell corresponding to any bit in the bitmap included in the first MAC CE is a multi-TRP cell, the first MAC CE provided in this embodiment of the present application may further include any one or more of the following fields: field 1, field 2, field 3, field 4, field 5, field 6, field 7, and field 8.

[0072] Field 1 indicates the number of TRPs in which beam failure occurs in a multi-TRP cell, or field 1 indicates the number of beam failure detection resource groups in which beam failure occurs in a multi-TRP cell.

[0073] Field 2 indicates a beam failure type of a beam failure in a multi-TRP cell, and the beam failure type may include one or more of the following: beam failure occurring at a single TRP in the multi-TRP cell, beam failure occurring at some TRPs in the multi-TRP cell, or beam failure occurring at all TRPs in the multi-TRP cell. When two beam failure detection resource groups are configured for a multi-TRP cell, the beam failure type may alternatively include one or more of the following: beam failure occurring at the first TRP, beam failure occurring at the second TRP, beam failure occurring at two TRPs, and no beam failure occurring at two TRPs. For example, field 2 includes two bits. Field 2 corresponds to four field values. Each field value corresponds to one of the aforementioned types. The beam failure type may alternatively include one or more of the following: beam failure occurring at the first TRP, beam failure occurring at the second TRP, or beam failure occurring at two TRPs. Field 2 includes two bits and corresponds to four field values. The three field values ​​respectively indicate a beam obstruction occurring at the first TRP, a beam obstruction occurring at the second TRP, and a beam obstruction occurring at two TRPs.

[0074] Field 3 corresponds to one TRP. Field 3 indicates whether a beam failure occurs in the TRP corresponding to field 3. Alternatively, field 3 corresponds to one beam failure detection resource group, and field 3 indicates whether a beam failure is detected in the beam failure detection resource group corresponding to field 3. When one of the above fields indicates that a beam failure does not occur, the remaining fields in the octet of the field may not have a specific meaning, and the terminal device may ignore the remaining fields. Each of the fields may correspond to M TRPs, each of the M beam failure detection resource groups, or each of the M beam failure detection resource groups. Candidate Beam Resource Group There may be M fields 3 corresponding respectively to the M CORESET groups.

[0075] Field 4 indicates information about the TRP where a beam failure occurs, for example, the index of the TRP. The index of the TRP may be the index of one beam failure detection resource group, i.e., the index of the beam failure detection resource group corresponding to the TRP, the index of a candidate beam resource group, i.e., the index of the candidate beam resource group corresponding to the TRP, or the index of one CORESET group, i.e., CORESETPoolIndex. Alternatively, multiple fields in the aforementioned field may be included to indicate multiple TRPs where a beam failure occurs, or the index of the beam failure detection resource group / candidate beam resource group / CORESET group corresponding to the TRP.

[0076] In this embodiment of the present application, the type of information about the TRP where a beam failure occurs is not limited. For example, the information about the TRP where a beam failure occurs may be information about the index of the TRP where a beam failure occurs. The index of the TRP may be the index of one beam failure detection resource group, that is, the index of the beam failure detection resource group corresponding to the TRP. Alternatively, the index of the TRP may be the index of one candidate beam resource group, that is, the index of the candidate beam resource group corresponding to the TRP. Alternatively, the index of the TRP may be the index of one CORESET group, that is, CORESETPoolIndex.

[0077] Optionally, the first MAC CE may further include multiple fields 4. For example, the first MAC CE may include three fields 4. The first field 4 indicates an index of a beam failure detection resource group corresponding to a TRP where a beam failure occurs. The second field 4 indicates an index of a beam failure detection resource group corresponding to a TRP where a beam failure occurs. Candidate Beam Resource Group The third field 4 indicates the index of the CORESET group corresponding to the TRP in which the beam failure occurs.

[0078] Field 5 indicates the number of candidate beam resources reported by the terminal device.

[0079] Field 6 corresponds to one TRP, and field 6 indicates whether there is a candidate beam resource that satisfies the quality requirement in the one TRP corresponding to field 6. Alternatively, field 6 corresponds to one candidate beam resource group, and field 6 indicates whether there is a candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to field 6. Alternatively, one of the aforementioned fields may indicate whether there is a candidate beam resource that satisfies the quality requirement. S When it is indicated that there is no, the remaining fields in the octet of the field have no specific meaning, and the terminal device may ignore the remaining fields. Candidate Beam Resource Group , or there may be M fields 6 corresponding respectively to the M CORESET groups.

[0080] Field 7 indicates information about candidate beam resources. They may correspond to M TRPs, M beam fault detection resource groups, or M Candidate Beam Resource Group There may be M fields 7, each corresponding to a CORESET group or M CORESET groups. One field value of field 7 may be reserved to indicate that there is no candidate beam resource that satisfies the quality requirement. For example, when the values ​​of all bits corresponding to field 7 are all 0 or all 1, it indicates that there is no candidate beam resource that satisfies the quality requirement. The other field values ​​indicate information about one candidate beam resource that satisfies the quality requirement.

[0081] It can be understood that when the first MAC CE includes multiple fields 7, the multiple candidate beam resources indicated by the multiple fields 7 may be understood as resources in multiple candidate beam resource groups. That is, the multiple candidate beam resources are in one-to-one correspondence with the multiple candidate beam resource groups. In this case, the multiple candidate beam resources may be sorted in the first MAC CE in the order (e.g., index order or configuration order) of the candidate beam resource groups corresponding to the multiple candidate beam resources. The information on the candidate beam resource may be, but is not limited to, the index of the candidate beam resource.

[0082] Field 8 indicates the TRP to which one reported candidate beam resource belongs, or field 8 indicates the candidate beam resource group to which one reported candidate beam resource belongs.

[0083] It can be understood that when the terminal device needs to report multiple candidate beam resources, the first MAC CE may include multiple fields 8. The multiple fields 8 indicate the TRPs to which the multiple reported candidate beam resources respectively belong, or the multiple fields 8 indicate the candidate beam resource groups to which the multiple candidate beam resources respectively belong.

[0084] In some cases, when a beam failure occurs in one beam failure detection resource group, the terminal device transmits a first MAC CE, and then a beam failure also occurs in another beam failure detection resource group. Specifically, a beam failure recovery of one TRP is in progress, and a beam failure occurs in another TRP. In this case, the terminal device may use the following methods. Method 1: The terminal device notifies the network device that a beam failure also occurs in another beam failure detection resource group, and transmits another first MAC CE to report information on the candidate beam resources corresponding to the beam failure detection resource group, for example, information on whether a candidate beam resource that satisfies a quality requirement exists and specific information on the candidate beam resources. Method 2: The terminal device may notify the network device that a beam failure occurs in two beam failure detection resource groups, and transmits another first MAC CE to report information on the candidate beam resources corresponding to the two beam failure detection resource groups, for example, information on whether a candidate beam resource that satisfies a quality requirement exists and specific information on the candidate beam resources. Alternatively, it may be specified that the terminal device does not transmit another first MAC CE before the previous beam failure recovery procedure is completed. In other words, the terminal device can transmit another first MAC CE only after receiving a response message of the previous first MAC CE or after receiving a response message in a previous period, for example, a period corresponding to 28 symbols, to inform the network device that beam failure also occurs in other beam failure detection resource groups.

[0085] Optionally, which of the above-mentioned methods 1 and 2 is specifically used by the terminal device may be determined based on a condition. Specifically, when a first condition is satisfied, the method 1 is used; when a second condition is satisfied, the method 2 is used; method is used.

[0086] The first condition may be one or a combination of the following:

[0087] After sending the previous first MAC CE, the terminal device has received a corresponding response message.

[0088] The period from the current time to the time when the response message of the previous first MAC CE is received is less than a certain period, for example, a period corresponding to 28 symbols.

[0089] The second condition may be one or a combination of the following:

[0090] After sending the previous first MAC CE, the terminal device has not received a corresponding response message.

[0091] With reference to the first aspect, in some implementations of the first aspect, the method further includes the following steps.

[0092] When M is equal to 1 and beam failure occurs in M ​​beam failure detection resource groups, the terminal device transmits beam failure recovery information corresponding to the cell by using the second MAC CE.

[0093] In the above technical solution, a certain type of second MAC CE is provided, which is denoted as a first type of second MAC CE.

[0094] When M is equal to 1, the cell is a single-TRP cell, and the terminal device may report beam failure recovery information corresponding to the single-TRP cell in which a beam failure occurs by using the first type second MAC CE, so that beam failure recovery can be performed in the single-TRP cell within time.

[0095] With reference to the first aspect, in some implementations of the first aspect, the second MAC CE includes one bitmap, and one bit in the bitmap corresponds to one octet.

[0096] Optionally, an octet further includes a seventh field, and the seventh field indicates whether a candidate beam or a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to the octet. Alternatively, the seventh field indicates whether information about a candidate beam resource exists in the octet. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the seventh field may alternatively indicate whether a candidate beam resource that satisfies a quality requirement exists in the TRP corresponding to the octet. The length of the seventh field is 1 bit, and the seventh field may be located in the first bit, the second bit, or the third bit of the corresponding octet. For example, if any bit corresponds to multiple octets, the seventh field in the first octet of the multiple octets may be located in the third bit of the first octet, the seventh field in the second octet of the multiple octets may also be located in the third bit of the second octet, or the seventh field in the second octet may be located in the first bit of the second octet.

[0097] Optionally, an octet further includes an eighth field, which indicates information about a candidate beam or a candidate beam resource determined in a candidate beam resource group corresponding to an octet and meeting a quality requirement. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the eighth field may alternatively indicate information about a candidate beam resource that meets a quality requirement in the TRP corresponding to an octet. News You may also indicate. 8 The length of the field may be 6 or 5 bits.

[0098] Referring to the first aspect, in some implementations of the first aspect, the second MAC CE includes one bitmap.

[0099] When the configuration information of a cell corresponding to any bit in the bitmap includes M beam failure detection resource groups and M candidate beam resource groups, where M is an integer greater than 1, and the value of the any bit is a second value by default, the second value indicates that no beam failure occurs in the cell corresponding to the any bit.

[0100] For example, when the configuration information of a cell corresponding to an arbitrary bit in one bitmap included in the second MAC CE includes M beam failure detection resource groups and M candidate beam resource groups, where M is an integer greater than 1, and the value of the arbitrary bit is 0 or 1 by default, the value of the arbitrary bit indicates that no beam failure occurs in the cell corresponding to the arbitrary bit. That is, when the value of the arbitrary bit is 0 or 1, it indicates that no beam failure occurs in the cell corresponding to the arbitrary bit.

[0101] In the above technical solution, when a cell corresponding to one bit in one bitmap included in the first type second MAC CE is a multi-TRP cell, the first type second MAC CE is not used to report beam failure recovery information corresponding to the multi-TRP cell, regardless of whether a beam failure occurs in the multi-TRP cell.

[0102] With reference to the first aspect, in some implementations of the first aspect, the second MAC CE includes one bitmap, and any bit in the one bitmap corresponds to one multi-TRP cell.

[0103] The value of any bit may be 0 or 1. For example, it may be defined as follows: a value of 0 for any bit indicates that a beam failure occurs in one TRP in a multi-TRP cell corresponding to the any bit, and a value of 1 for any bit indicates that a beam failure occurs in multiple TRPs in a multi-TRP cell corresponding to the any bit.

[0104] In the above technical solution, another type of second MAC CE is provided, which is denoted as a second type of second MAC CE.

[0105] The terminal device may report beam failure recovery information corresponding to a multi-TRP cell in which a beam failure is occurring by using a second MAC CE of the second type, so that beam failure recovery can be performed in the multi-TRP cell in time.

[0106] With reference to the first aspect, in some implementations of the first aspect, when a beam failure occurs in a multi-TRP cell corresponding to any bit in a bitmap included in the second MAC CE, the second MAC CE includes one octet, and the one octet corresponds to the any bit.

[0107] With reference to the first aspect, in some implementations of the first aspect, one octet includes one ninth field.

[0108] When the cell corresponding to the bit corresponding to the octet of the 9th field is a multi-TRP cell, the definition of the 9th field may be one of the following:

[0109] The 9th field indicates information about a TRP in which a beam failure occurs, or the 9th field indicates information about a beam failure detection resource group in which a beam failure is detected, or the 9th field indicates information about a candidate beam resource group corresponding to the reported candidate beam resource.

[0110] The 9th field indicating information regarding a TRP in which a beam failure is occurring may be understood as the 9th field indicating beam failure recovery information corresponding to a multi-TRP cell corresponding to the octet of the 9th field.

[0111] With reference to the first aspect, in some implementations of the first aspect, the ninth field indicates the number of TRPs where a beam failure occurs, or the ninth field indicates a beam failure type, including a beam failure occurring at a single TRP in a multi-TRP cell, or a beam failure occurring at some or all TRPs in a multi-TRP cell.

[0112] In the above technical solution, the network device needs to configure the candidate beam resource in the candidate beam resource group in a numbering manner across resource groups. Based on this, the terminal device can determine the TRP to which the candidate beam resource specifically belongs by using the index of the reported candidate beam resource.

[0113] For example, when M is equal to 2, the configuration information of the cell includes two candidate beam resource groups, each of which includes four candidate beam resources. The numbers of the four resources in the first candidate beam resource group may be {#0, #1, #2, #3}, and the numbers of the four resources in the second candidate beam resource group may be {#4, #5, #6, #7}. In this case, the candidate beam resources in the candidate beam resource groups configured by the network device for the cell may be considered to be configured in a cross-resource group numbering manner.

[0114] When a cell corresponding to a bit corresponding to an octet of the 9th field is a single TRP cell, the 9th field indicates a reserved field, specifically, the 9th field is reserved and has no specific meaning. With reference to the first embodiment, in some implementations of the first embodiment, one octet includes one 8th field.

[0115] The eighth field indicates information about a candidate beam or candidate beam resource determined within a candidate beam resource group corresponding to one octet and satisfying a quality requirement.

[0116] In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the eighth field can alternatively provide information about the candidate beam resource that meets the quality requirement in the TRP corresponding to one octet. News You may also indicate. 8 The length of the field may be 6 or 5 bits.

[0117] In the above technical solution, the terminal device may report beam failure recovery information corresponding to single-TRP cells and multi-TRP cells in which beam failure occurs by using a second MAC CE of a second type, so that beam failure recovery can be performed in single-TRP cells and multi-TRP cells in time. When a cell corresponding to any bit in a bitmap included in the second MAC CE of the second type is a single-TRP cell, the R field corresponding to any bit has no specific meaning. When a cell corresponding to any bit in a bitmap included in the second MAC CE of the second type is a multi-TRP cell, the R field corresponding to any bit indicates beam failure recovery information corresponding to a cell corresponding to an octet of the R field, indicates the number of TRPs in which beam failure occurs, or indicates a beam failure type.

[0118] With reference to the first aspect, in some implementations of the first aspect, a first logical channel identifier corresponding to the first MAC CE ( LCID ) is different from the second LCID corresponding to the second MAC CE.

[0119] With reference to the first embodiment, in some implementations of the first embodiment, the second LCID is 50 or 51.

[0120] The first LCID is any one of the following logical channel identifiers: 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, or 47.

[0121] It may be understood that the specific value of the first LCID and the specific value of the second LCID are merely examples and do not constitute any limitation. Specifically, when it is ensured that the value of the first LCID is different from the value of the second LCID, the value of the first LCID may alternatively be another value, and the value of the second LCID may alternatively be another value.

[0122] It may be understood that the specific format of the first MAC CE and the specific format of the second MAC CE described in the first aspect are merely examples and do not constitute any limitation. For example, the first MAC CE or the second MAC CE may further include other fields (e.g., reserved fields). It should be further understood that all MAC CEs obtained by combining the above-mentioned multiple fields (first field, second field, third field, fourth field, fifth field, sixth field, seventh field, eighth field, and ninth field) based on the correspondence between any bit and an octet in a bitmap included in each MAC CE belong to the format of the MAC CE claimed in this embodiment of the present application.

[0123] According to a second aspect, there is provided a beam failure recovery method, the method comprising the steps of:

[0124] The network device transmits cell configuration information, where the cell configuration information includes M beam fault detection resource groups and M candidate beam resource groups, where the M beam fault detection resource groups are in one-to-one correspondence with the M candidate beam resource groups, and M is an integer.

[0125] The network device includes a first medium access control element ( MAC CE ) and receiving a first MAC CE, the first MAC CE carrying beam failure recovery information corresponding to the cell, the first MAC CE being transmitted by the terminal device when a beam failure occurs in at least one of the M beam failure detection resource groups, where M is an integer greater than 1.

[0126] The network device determines whether to switch a first beam to a second beam by using a first MAC CE, where the first beam is a beam used for transmitting at least one beam failure detection resource group, and the second beam is a beam used for transmitting at least one candidate beam resource group among the M candidate beam resource groups, and the at least one candidate beam resource group is in one-to-one correspondence with the at least one beam failure detection resource group.

[0127] The network device includes a first medium access control element ( MAC CE ) Receiving the first MAC CE may be understood as the terminal device transmitting a beam failure detection resource corresponding to the cell by using the first MAC CE when the terminal device determines that beam failure has occurred in at least one of the M beam failure detection resource groups, where M is an integer greater than 1, and the network device communicating with the terminal device receiving the first MAC CE accordingly.

[0128] It should be understood that the first MAC CE in the second aspect is the same as the first MAC CE in the first aspect, so for the format of the first MAC CE that is not described in detail in the second aspect, please refer to the description in the first aspect.

[0129] In the above technical solution, the network device may determine a TRP in a multi-TRP cell where a beam failure occurs and a candidate beam resource corresponding to the TRP where a beam failure occurs by using the received first MAC CE. When the network device determines that a candidate beam resource corresponding to the TRP where a beam failure occurs exists, the network device may switch the TRP where a beam failure occurs from a current beam (i.e., the first beam) to a beam (i.e., the second beam) used to transmit the candidate beam resource, so that beam failure recovery can be implemented in the multi-TRP cell in time.

[0130] Referring to the second aspect, in some implementations of the second aspect, determining whether to switch the first beam to the second beam by using the first MAC CE by the network device includes: The network device determines, by using a first MAC CE, that a first candidate beam resource that satisfies a quality requirement is present in a candidate beam resource group corresponding to at least one beam failure detection resource group, and determines information regarding the first candidate beam resource that satisfies the quality requirement.

[0131] The network device switches from the first beam to the second beam.

[0132] With reference to the second aspect, in some implementations of the second aspect, the method further includes the following steps.

[0133] The network device receives a second MAC CE, where the second MAC CE carries beam failure recovery information corresponding to the cell, and the second MAC CE is transmitted by the terminal device when beam failure occurs in M ​​beam failure detection resource groups, where M is an integer equal to 1.

[0134] The network device determines whether to switch the third beam to a fourth beam by using the second MAC CE, where the third beam is a beam used for transmitting M beam failure detection resource groups, and the fourth beam is a beam used for transmitting M candidate beam resource groups, and the M beam failure detection resource groups correspond to the M candidate beam resource groups.

[0135] It can be understood that the second MAC CE in the second aspect is the same as the first type second MAC CE in the first aspect, so for the format of the second MAC CE that is not described in detail in the second aspect, please refer to the relevant description in the first aspect.

[0136] In the above technical solution, the network device may determine a TRP with beam failure in the single TRP cell and a candidate beam resource corresponding to the TRP with beam failure by using the received second MAC CE (i.e., the first type second MAC CE). When the network device determines that a candidate beam resource corresponding to the TRP with beam failure exists, the network device may switch the TRP with beam failure from a current beam (i.e., the third beam) to a beam (i.e., the fourth beam) used to transmit the candidate beam resource, so that beam failure recovery can be implemented in the single TRP cell in time.

[0137] Referring to the second aspect, in some implementations of the second aspect, determining whether to switch the third beam to the fourth beam by using the second MAC CE by the network device includes: The network device determines, by using a second MAC CE, that a second candidate beam resource that satisfies a quality requirement exists in a candidate beam resource group corresponding to the M beam failure detection resource groups, and determines information regarding the second candidate beam resource that satisfies the quality requirement.

[0138] The network device switches from the third beam to the fourth beam.

[0139] With reference to the second aspect, in some implementations of the second aspect, a first logical channel identifier corresponding to the first MAC CE ( LCID ) is different from the second LCID corresponding to the second MAC CE.

[0140] With reference to the second embodiment, in some implementations of the second embodiment, the second LCID is 50 or 51.

[0141] The first LCID is any one of the following logical channel identifiers: 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, or 47.

[0142] It should be understood that the first MAC CE in the second aspect is the same as the first MAC CE in the first aspect, and the second MAC CE in the second aspect is the same as the second MAC CE in the first aspect, so please refer to the description in the first aspect for the formats of the first MAC CE and the second MAC CE that are not described in detail in the second aspect.

[0143] According to a third aspect, there is provided a communication device, the communication device comprising a module or unit configured to perform the method according to the first aspect and any one of the possible implementations of the first aspect.

[0144] According to a fourth aspect, there is provided a communications device. The communications device includes a processor. The processor may be coupled to a memory and configured to execute instructions in the memory to perform a method according to the first aspect and any one of the possible implementations of the first aspect. Optionally, the communications device further includes the memory. Optionally, the communications device further includes a communications interface, the processor being coupled to the communications interface.

[0145] In implementation, the communication device is a terminal device. When the communication device is a terminal device, the communication interface may be a transceiver or an input / output interface.

[0146] In another implementation, the communication device is a chip disposed in the terminal device. When the communication device is a chip disposed in the terminal device, the communication interface may be an input / output interface.

[0147] Optionally, the transceiver may be a transceiver circuit. Optionally, the input / output interface may be an input / output circuit.

[0148] According to a fifth aspect, there is provided a communication device, the communication device comprising a module or unit configured to perform the method according to the second aspect and any one of the possible implementations of the second aspect.

[0149] According to a sixth aspect, there is provided a communications device. The communications device includes a processor. The processor may be coupled to a memory and configured to execute instructions in the memory to perform a method according to the second aspect and any one of the possible implementations of the second aspect. Optionally, the communications device further includes the memory. Optionally, the communications device further includes a communications interface, the processor being coupled to the communications interface.

[0150] In an implementation, the communication device is a network device. When the communication device is a network device, the communication interface may be a transceiver or an input / output interface.

[0151] In another implementation, the communication device is a chip disposed in the network device. When the communication device is a chip disposed in the network device, the communication interface may be an input / output interface.

[0152] Optionally, the transceiver may be a transceiver circuit. Optionally, the input / output interface may be an input / output circuit.

[0153] According to a seventh aspect, there is provided a processor, the processor including an input circuit, an output circuit, and a processing circuit, the processing circuit configured to receive a signal through the input circuit and to send a signal through the output circuit to enable the processor to perform a method according to any one of the first and second aspects and possible implementations of the first and second aspects.

[0154] In a specific implementation process, the processor may be a chip, the input circuit may be an input pin, the output circuit may be an output pin, and the processing circuit may be a transistor, a gate circuit, a trigger, various logic circuits, etc. The input signal received by the input circuit may be received and input, for example, but not limited to, by a receiver, and the signal output by the output circuit may be output and transmitted, for example, but not limited to, to a transmitter, by the transmitter, and the input circuit and the output circuit may be the same circuit, when the circuit is used as an input circuit and an output circuit at different times. The specific implementation of the processor and various circuits is not limited to the embodiments of the present application.

[0155] According to an eighth aspect, a processing device is provided. The processing device includes a processor and a memory. The processor is configured to read instructions stored in the memory to perform a method according to any one of the first and second aspects and possible implementations of the first and second aspects, and may receive a signal by using the receiver and transmit a signal by using the transmitter.

[0156] Optionally, there are one or more processors and one or more memories.

[0157] Optionally, the memory may be integral with the processor, or the memory and the processor may be separately located.

[0158] In a specific implementation process, the memory may be a non-transitory memory such as a read-only memory (ROM). The memory and the processor may be integrated on the same chip, or may be separately arranged on different chips. The type of memory and the way in which the memory and the processor are arranged are not limited in this embodiment of the present application.

[0159] It should be understood that the associated data exchange procedures, e.g., transmitting measurement configuration information, may be procedures of outputting measurement configuration information from a processor, and receiving information may be procedures of receiving information by a processor. Specifically, data output by a processor may be output to a transmitter, and input data received by a processor may be from a receiver. The transmitter and receiver may be collectively referred to as a transceiver.

[0160] The processing circuit of the eighth aspect may be a chip. The processor may be implemented by using hardware or software. When the processor is implemented by using hardware, the processor may be a logic circuit, an integrated circuit, etc. When the processor is implemented by using software, the processor may be a general-purpose processor, and may be implemented by reading software code stored in a memory. The memory may be integrated into the processor, or may be located outside the processor and exist independently.

[0161] According to a ninth aspect, a computer program product is provided. The computer program product includes a computer program (which may also be referred to as code or instructions). When the computer program is executed, the computer is capable of performing the method according to any one of the first and second aspects and possible implementations of the first and second aspects.

[0162] According to a tenth aspect, a computer readable medium is provided. The computer readable medium stores a computer program (which may also be referred to as code or instructions). When the computer program is executed on a computer, the computer can perform the method according to any one of the first and second aspects and possible implementations of the first and second aspects.

[0163] According to an eleventh aspect, there is provided a communication system, the communication system including the network device and a terminal device as described above. [Brief description of the drawings]

[0164] [Figure 1] 1 is a schematic diagram of a communication system 100 to which an embodiment of the present application is applied. [Diagram 2] 1 is a schematic diagram of a communication system 200 to which an embodiment of the present application is applied. [Diagram 3] FIG. 2 is a schematic diagram of the hardware structure of a network device and a terminal device according to an embodiment of the present application; [Figure 4] 1 is a schematic diagram of a MAC CE format applied to a beam interference recovery method. [Diagram 5] FIG. 5 is a schematic diagram of a beam failure recovery method 500 according to an embodiment of the present application. [Figure 6] FIG. 2 is a schematic diagram of a format of a first type first MAC CE according to an embodiment of the present application. [Figure 7] FIG. 2 is a schematic diagram of a format of a first type first MAC CE according to an embodiment of the present application. [Figure 8] FIG. 13 is a schematic diagram of a format of a second type first MAC CE according to an embodiment of the present application. [Figure 9] FIG. 13 is a schematic diagram of a format of a second type first MAC CE according to an embodiment of the present application. [Figure 10] FIG. 11 is a schematic diagram of a format of a third type first MAC CE according to an embodiment of the present application. [Figure 11]FIG. 11 is a schematic diagram of a format of a third type first MAC CE according to an embodiment of the present application. [Figure 12] FIG. 11 is a schematic diagram of a format of a fourth type first MAC CE according to an embodiment of the present application. [Figure 13] FIG. 11 is a schematic diagram of a format of a fourth type first MAC CE according to an embodiment of the present application. [Figure 14] FIG. 11 is a schematic diagram of a format of a fifth type first MAC CE according to an embodiment of the present application. [Figure 15] FIG. 11 is a schematic diagram of a format of a fifth type first MAC CE according to an embodiment of the present application. [Figure 16] FIG. 13 is a schematic diagram of a format of a second type second MAC CE according to an embodiment of the present application. [Figure 17] 1 is a schematic block diagram of a communication device 1000 according to an embodiment of the present application. [Figure 18] 1 is a schematic block diagram of a communication device 1100 according to an embodiment of the present application. [Figure 19] 12 is a schematic block diagram of a communication device 1200 according to an embodiment of the present application. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0165] The following describes the technical solutions of the present application with reference to the accompanying drawings.

[0166] In the description of this application, unless otherwise specified, " / " means "or." For example, A / B may refer to A or B. In the description of this application, "and / or" only describes an association relationship between related objects, and indicates that three relationships may exist. For example, A and / or B may represent the following three cases: only A exists, both A and B exist, and only B exists. Furthermore, "at least one" means one or more, and "multiple" means two or more. The terms "first" and "second" do not limit the quantity and the order of execution, and the terms "first" and "second" do not indicate clear distinctions.

[0167] It should be noted that, in this application, words such as "example" and "for example" are used to denote serving as an example, illustration, or description. Any embodiment or design scheme described in this application as an "example" or "for example" may be used without limitation as compared to other embodiments or design schemes. Come on The present invention should not be construed as having more advantages than the above. Strictly speaking, use of words such as "example" or "for example" is intended to present the relevant concept in a concrete manner.

[0168] In the description of this application, "indication" may include direct indication and indirect indication, or may include explicit indication and implicit implementation. For example, information indicated by a field (such as a first field, a second field, etc. described below) is called referent information. In a specific implementation process, the referent information is indicated in multiple ways. For example, the referent information may be directly indicated, and the referent information, the index of the referent information, etc. are implemented. As another example, the referent information may be indirectly indicated by indicating other information. There is an association relationship between the other information and the referent information. As another example, only a part of the referent information may be indicated, and the other part of the referent information is already known or pre-agreed. Furthermore, specific information may also be indicated by using a pre-agreed (protocol-specified) arrangement order of various pieces of information to reduce indication overhead to some extent.

[0169] In the description of this application, "TRP" may be replaced with "beam failure detection resource group", "candidate beam resource group" or "CORESET group", and the meanings expressed are consistent when the differences between the terms are not emphasized. In the description of this application, a beam failure occurs in a TRP, which means that a beam failure occurs in a beam failure detection resource group corresponding to the TRP, or that a beam failure is detected in a beam failure detection resource group corresponding to the TRP. Therefore, "beam failure occurs in one TRP" may be replaced with "beam failure occurs in one beam failure detection resource group corresponding to one TRP", and the meanings expressed are consistent when the differences are not emphasized. The specific meaning of detecting a beam failure in a beam failure detection resource group is that the quality of the resource in the beam failure detection resource group is lower than a first threshold. In the description of this application, one TRP has a one-to-one correspondence with one beam detection resource group and one candidate beam resource group. The TRP index may specifically be expressed as an index of one beam failure detection resource group, an index of one candidate beam resource group, or other related index, such as an index of a CORESET group (e.g., CORESETPoolIndex). In the description of this application, "TRP" may be replaced with "network device". The meanings expressed are consistent when differences are not emphasized. In the embodiments of this application, "cell" and "serving cell" may be used alternatively, and the meanings expressed are consistent when differences are not emphasized.

[0170] To facilitate understanding of the embodiments of the present application, the following first describes terms used in the embodiments of the present application.

[0171] 1. Beam

[0172] A beam may be represented in the NR protocol as a spatial domain filter, a spatial filter, a spatial domain parameter, a spatial parameter, a spatial domain setting, a spatial setting, quasi-colocation (QCL) information, a QCL assumption, a QCL indication, etc. A beam may also be indicated by a transmission configuration index state (TCI-state) parameter or a spatial relation parameter. Thus, in embodiments of the present application, a beam may be replaced by a spatial domain filter, a spatial filter, a spatial domain parameter, a spatial parameter, a spatial setting, a QCL information, a QCL assumption, a QCL indication, a TCI-state (e.g., a downlink (DL) TCI-state or an uplink (UL) TCI-state), a spatial relation, etc. The aforementioned terms are equivalent to each other. It should be understood that a beam may alternatively be replaced by other terms indicating a beam. This is not particularly limited in the embodiment of the present application.

[0173] A beam for transmitting a signal may be called a transmit beam (Tx beam), spatial domain transmission filter, spatial transmission filter, spatial domain transmission parameter, spatial transmission parameter, spatial domain transmission setting, or spatial transmission setting. Downlink transmit beams may be dictated by the TCI-state.

[0174] A transmit beam may refer to a signal strength distribution formed in different directions in space after a signal is transmitted through an antenna, and a receive beam may refer to a signal strength distribution of a wireless signal received through an antenna in different directions in space.

[0175] Furthermore, the beam may be a wide beam, a narrow beam, or other types of beams. The technology for forming the beam may be a beamforming technology or other technology. The beamforming technology may specifically be a digital beamforming technology, an analog beamforming technology, a hybrid digital / analog beamforming technology, etc.

[0176] A beam usually corresponds to a resource. For example, during beam measurement, the network measures different beams by using different resources, and the terminal device feeds back the measured quality of the resource, so that the network device knows the quality of the corresponding beam. During data transmission, the beam information is also indicated by the resource corresponding to the beam information. For example, the network device indicates information about the physical downlink shared channel (PDSCH) beam of the terminal device by using a transmission configuration indicator (TCI) resource in downlink control information (DCI).

[0177] Optionally, multiple beams having the same or similar communication characteristics may be considered as one beam. A beam may include one or more antenna ports and may be used to transmit a data channel, a control channel, a sounding signal, etc. One or more antenna ports forming a beam may also be considered as an antenna port set.

[0178] In the embodiment of the present application, unless otherwise specified, the beam is the transmission beam of the network device. During beam measurement, each beam of the network device corresponds to one resource. Therefore, the index of the resource can be used to uniquely identify the beam corresponding to the resource.

[0179] 2. Beam Fault Detection Resources

[0180] The network device configures one or more beam failure detection resources (RadioLinkMonitoringRS) for the terminal device by using radio resource control (RRC) signaling to detect whether a beam failure occurs. The RadioLinkMonitoringRS includes multiple parameters. The parameters are described as follows:

[0181] The settings for beam failure detection are included in the RadioLinkMonitoringConfig IE.

number

[0182] 3. Beam Failure Recovery Settings

[0183] The network device configures a beam failure recovery configuration (BeamFailureRecoveryConfig) for the terminal device by using RRC signaling, and the beam failure recovery configuration includes parameters related to the beam failure recovery of the cell, such as resources used for discovering a new beam. The specific parameters are described as follows (some parameters that are not related to this patent are omitted):

number

[0184] 4. Quasi-co-location (QCL)

[0185] QCL is also called quasi-collocation. Signals corresponding to antenna ports having a QCL relationship have the same parameters, and the parameters of one antenna port may be used to determine the parameters of another antenna port having a QCL relationship with the antenna port, where the two antenna ports have the same parameters or the parameter difference between the two antenna ports is less than a threshold. The parameters may include one or more of the following: delay spread, Doppler spread, Doppler shift, average delay, average gain, and spatial Rx parameters. The spatial Rx parameters may include one or more of the following: angle of arrival (AOA), average AOA, AOA spread, angle of departure (AOD), average angle of departure AOD, AOD spread, receive antenna spatial correlation parameters, transmit antenna spatial correlation parameters, transmit beam, receive beam, and resource identifier.

[0186] The angles may be decomposition values ​​in different dimensions or combinations of decomposition values ​​in different dimensions. The antenna ports may be antenna ports with different numbers of antenna ports, antenna ports with the same number of antenna ports used to transmit or receive information at different times, at different frequencies, and / or at different code domain resources, and / or antenna ports with different numbers of antenna ports used to transmit or receive information at different times, at different frequencies, and / or at different code domain resources. The resource identifier may include a CSI-RS resource identifier, an SRS resource identifier, an SSB resource identifier, a resource identifier of a preamble sequence transmitted on a physical random access channel (PRACH), or a resource identifier of a demodulation reference signal (DMRS), and indicates a beam on a resource.

[0187] In the NR protocol, the QCL relationships can be classified into four types based on different parameters: Type A: Doppler shift, Doppler spread, mean delay, and mean spread; Type B: Doppler shift and Doppler spread; Type C: Doppler shift and mean delay; and Type D: Spatial reception parameters.

[0188] The QCL in the embodiments of the present application is a QCL of type D. Unless otherwise specified below, a QCL may be understood as a QCL of type D, i.e. a QCL defined based on spatial reception parameters.

[0189] When the QCL relationship is a type D QCL relationship, the QCL relationship may be considered as a spatial domain QCL relationship. When the antenna ports satisfy the spatial domain QCL relationship, the QCL relationship between the ports for downlink signals or between the ports for uplink signals may be that the two signals have the same AOA or AOD, indicating that the two signals have the same receive beam or transmit beam. As another example, the QCL relationship between the downlink signal and the uplink signal or between the ports for uplink signals and the ports for downlink signals may be that there is a correspondence between the AOA and AOD of the two signals, or that there is a correspondence between the AOD and AOA of the two signals. Specifically, the beam reciprocity may be used to determine an uplink transmit beam based on the downlink receive beam, or to determine a downlink receive beam based on the uplink transmit beam.

[0190] From the perspective of the transmitting end, if two antenna ports satisfy the spatial domain QCL relationship, it may indicate that the corresponding beam directions of the two antenna ports are coincident in space. From the perspective of the receiving end, if two antenna ports satisfy the spatial domain QCL relationship, it may indicate that the receiving end can receive signals transmitted through the two antenna ports with the same beam direction.

[0191] The signals transmitted through the ports having the spatial domain QCL relationship may further have corresponding beams, including at least one of the following: the same receive beam, the same transmit beam, a transmit beam corresponding to the receive beam (corresponding to a reciprocity scenario), and a receive beam corresponding to the transmit beam (corresponding to a reciprocity scenario).

[0192] The signals transmitted through the ports having the spatial domain QCL relationship may alternatively be understood as the received or transmitted signals by using the same spatial filter, which may be at least one of the following: precoding, antenna port weight, antenna port phase deviation, or antenna port amplitude gain.

[0193] Signals transmitted through ports having a spatial domain QCL relationship may alternatively be understood as having corresponding beam pair links (BPLs), including at least one of the following: the same downlink BPL, the same uplink BPL, an uplink BPL corresponding to a downlink BPL, or a downlink BPL corresponding to an uplink BPL.

[0194] Therefore, the spatial reception parameters (i.e., type D QCL) can be understood as parameters that indicate the directional information of the reception beam.

[0195] 5. Spatial relation (SR)

[0196] The spatial relationship may also be referred to as an uplink transmission configuration indicator (UL TCI). The spatial relationship may be used to determine a transmission beam of an uplink signal. The spatial relationship may be determined through beam training. The reference signal used for beam training may be, for example, an uplink reference signal such as SRS, or a downlink reference signal such as SSB or CSI-RS.

[0197] In the communication process, the terminal device may determine a transmitting beam based on the spatial relationship indicated by the network device, and the network device may determine a receiving beam based on the same spatial relationship.

[0198] Optionally, the spatial relationship may further include parameters related to uplink transmission power control, including one or more of the following: a path loss estimation reference signal (Pathloss Reference RS), a reference power, a compensation factor (Alpha), an open loop or closed loop power control indication, a closed loop power control index (closedLoopIndex), etc.

[0199] SR is set by the network device for each terminal device. The following is the format of SR:

number

[0200] 6. Control resource set (CORESET)

[0201] CORESET is a resource set used to transmit downlink control information, and may also be called a control resource area or a physical downlink control channel resource set. Each CORESET may be a set of groups of resource element groups (REGs). REG is a basic unit of allocating physical resources by using downlink control signaling, and is used to define the mapping from downlink control signaling to REs. For example, one REG may include four consecutive resource elements (REs) of a non-reference signal (RS) in the frequency domain. It should be understood that REG is just a unit used for resource allocation, and should not constitute any limitation on this application. This application does not exclude that new resource allocation units may be defined in future protocols to implement the same or similar functions.

[0202] For a network device, CORESET may be understood as a set of resources that can be used to transmit a PDCCH. For a terminal device, the resources corresponding to the PDCCH search space of each terminal device belong to CORESET. In other words, the network device may determine the resources used to transmit the PDCCH in CORESET, and the terminal device may determine the PDCCH search space based on CORESET.

[0203] The CORESET may include time-frequency resources. For example, in the frequency domain, the time-frequency resources may be a bandwidth segment or one or more subbands. In the time domain, the time-frequency resources may be one or more symbols. In the time-frequency resources, the control resource set may be contiguous or discontinuous resource units, for example, contiguous resource blocks (RBs) or discontinuous RBs.

[0204] Furthermore, the CORESET may further include a TCI state (TCI-state). The CORESET may include multiple TCI-states, and the active TCI-state may be one of the multiple TCI-states. In other words, the resource used to transmit the PDCCH may specifically use one of the multiple TCI-states, and the specific TCI-state to be used is specified by the network device. For example, the network device sends a MAC CE to the terminal device, where the MAC CE carries an index of one TCI-state, and the index of the TCI-state indicates that the PDCCH corresponding to the CORESET uses the TCI-state. Furthermore, the network device may also change the TCI-state of the PDCCH by using the MAC CE. The network device may configure one or more CORESETs for the terminal device to transmit different types of PDCCH.

[0205] The CORESET may be configured, for example, by using a ControlResourceSet information element in higher layer parameters. The higher layer parameters may include, for example, an identifier (ID) of the CORESET, the number of symbols contained in the frequency domain resources, and the duration. The specific parameters used to configure the CORESET are not limited by this application.

[0206] 7.TCI-state

[0207] A TCI-state is set by a network device for each terminal device. The TCI-state may indicate a QCL relationship between two reference signals. Each TCI-state may include a serving cell index (ServeCellIndex), a bandwidth part (BWP) identifier (ID), and a reference signal resource identifier. The reference signal resource identifier may be, for example, at least one of the following: a non-zero power (NZP) CSI-RS reference signal resource identifier (NZP-CSI-RS-ResourceId), a non-zero power CSI-RS reference signal resource set identifier (NZP-CSI-RS-ResourceSetId), or an SSB index (SSB-Index).

[0208] Information about a transmission beam (i.e., a transmission beam of a network device or a reception beam of a terminal device) may be indicated by using a TCI-state. Each TCI-state is represented by one index (tci-StateId) of the TCI-state and two QCs. L information( QCL -Info) included. L -Info may include one reference signal resource (referenceSignal) that indicates that the resource in the TCI-state and the reference signal resource included in the QCL-Info form a QCL relationship. For example, if one TCI-state is set to resource 1 and the resource included in the QCL-Info included in the TCI-state is resource 2, it indicates that resource 1 and resource 2 satisfy the QCL relationship.

[0209] The TCI-state is set by the network device for the end device. The format of the TCI-state is as follows:

number

[0210] In a subsequent communication process, the terminal device may determine a receiving beam based on the TCI-state indicated by the network device, and the network device may determine a transmitting beam based on the same TCI-state.

[0211] Furthermore, the TCI-state may be configured globally. For TCI-states configured for different cells and different BWPs, if the index of the TCI-state is the same, the corresponding TCI-state configuration is also the same. A cell is described by a higher layer in terms of resource management, mobility management, or service unit. The coverage of each network device may be divided into one or more serving cells, and a serving cell may be considered to include a specific frequency domain resource. In the embodiments of the present application, "cell" and "serving cell" may be used alternatively, and the meanings expressed are consistent when differences are not emphasized.

[0212] 8. TCI

[0213] The TCI may indicate a TCI-state. In implementation, the network device may configure a TCI-state list for the terminal device by using higher layer signaling (e.g., radio resource control (RRC)). For example, the network device may configure a TCI-state list for the terminal device by using a TCI-state to add mode list (tci-StatesToAddModList) in an RRC message. The TCI-state list may include multiple TCI-states. For example, the network device may configure up to 64 TCI-states for each BWP in each cell.

[0214] The network device then receives higher layer signaling (e.g., medium access control element (MAC CE) Signaling ), the network device may activate one or more TCI-states by using an RRC message. The activated TCI-states are a subset of the TCI-state list set by using an RRC message. For example, a network device may activate up to eight TCI-states for each BWP in each cell.

[0215] The network device may then further indicate the selected TCI-state by using a TCI field in physical layer signaling (e.g., downlink control information (DCI)), which may be, for example, DCI applicable for scheduling physical downlink resources.

[0216] The configuration information of one TCI-state may include one or two reference signal resource identifiers and a QCL type associated with the reference signal resource identifiers. When the QCL relationship is configured to be one of Type A, Type B, or Type C, the terminal device can demodulate a physical downlink control channel (PDCCH) or a physical downlink shared channel (PDSCH) based on the indication of the TCI-state. When the QCL relationship is configured to be Type D, the terminal device can know a transmission beam used by a network device to transmit a signal, and can further determine a receiving beam used to receive a signal based on a beam pairing relationship determined through channel measurement. The terminal device can determine a receiving beam for receiving a PDSCH based on a TCI field in a DCI on a PDCCH.

[0217] 9. Single TRP Cells

[0218] A single-TRP cell is also referred to as a cell in which a single TRP is used for transmission. A single-TRP cell includes only one TRP, and the network side implements data transmission of the cell by using the one TRP. The network side may configure one or more single-TRP cells for a terminal device. Each single-TRP cell corresponds to one group of configuration information including one beam failure detection resource group and one candidate beam resource group. It can be understood that in a single-TRP cell, only a single beam failure detection resource group and a single candidate beam resource group are needed to implement beam failure recovery of the cell. It should be understood that a TRP is a network device.

[0219] For example, cell #1 is a cell in which a single TRP (TRP #1) is used for transmission, and the network side transmits data of cell #1 to the terminal device by using TRP #1. In this case, cell #1 can be considered as a single TRP cell. In this case, one beam failure detection resource group and one candidate beam resource group are configured for the terminal device.

[0220] 10. Multi-TRP Cells

[0221] A multi-TRP cell is also referred to as a cell in which multiple TRPs are used for transmission. A multi-TRP cell includes multiple TRPs, and the network side implements data transmission of the cell by using multiple TRPs. The network side may configure one or more multi-TRP cells for a terminal device. Each multi-TRP cell corresponds to a group of configuration information including multiple beam failure detection resource groups and multiple candidate beam resource groups. It can be understood that in a multi-TRP cell, multiple beam failure detection resource groups and multiple candidate beam resource groups are required to implement beam failure recovery of the cell.

[0222] For example, cell #1 uses two TRPs (TRP #1 and TRP #2), and the network side transmits data of cell #1 to the terminal device by using TRP #1 and TRP #2. In this case, cell #1 can be considered as a multi-TRP cell. In this case, two failure detection resource groups and two candidate beam resource groups are configured for the terminal device.

[0223] Embodiments of the present application may be applied to a beam-based communication system, such as a 5th generation (5G) system, a new radio (NR) system, a long term evolution (LTE) system, an LTE frequency division duplex (FDD) system, an LTE time division duplex (TDD) system, a universal mobile telecommunication system (UMTS), or other evolved communication systems.

[0224] A communication system to which the embodiments of the present application are applied may include one or more network devices and one or more terminal devices. One network device may transmit data or control signaling to one or more terminal devices. Alternatively, multiple network devices may simultaneously transmit data or control signaling to one terminal device.

[0225] By way of example, and not limitation, FIG. 1 is a schematic diagram of a communication system 100 in which embodiments of the present application may be applied.

[0226] As shown in FIG. 1, the communication system 100 includes one network device 110 and multiple terminal devices (e.g., terminal device 120a and terminal device 120b shown in FIG. 1). The network device 110 may simultaneously transmit multiple analog beams on multiple radio frequency channels to transmit data or control signaling to multiple terminal devices. As shown in FIG. 1, the network device simultaneously transmits beam 1 and beam 2, where beam 1 is used to transmit data or control signaling to terminal device 120a, and beam 2 is used to transmit data or control signaling to terminal device 120b. Beam 1 may be referred to as a serving beam of terminal device 120a, and beam 2 may be referred to as a serving beam of terminal device 120b. Terminal device 120a and terminal device 120b may belong to the same cell. It may be understood that the communication system 100 is a single TRP transmission scenario.

[0227] By way of example, and not limitation, FIG. 2 is a schematic diagram of a communication system 200 in which embodiments of the present application may be applied.

[0228] As shown in FIG. 2, the communication system 200 may include at least two network devices (e.g., the network device 210a and the network device 210b shown in FIG. 2). The communication system 200 may further include at least one terminal device, e.g., the terminal device 220 shown in FIG. 2. The terminal device 220 may establish a wireless link with the network device 210a and the network device 210b by using a dual connectivity (DC) technology or a multi-connectivity technology. The network device 210a may be, for example, a primary base station, and the network device 210b may be, for example, a secondary base station. In this case, the network device 210a is the network device that is first accessed by the terminal device 220 and is involved in radio resource control (RRC) communication with the terminal device 220. The network device 210b may be added during RRC reconfiguration and is configured to provide additional radio resources. It may be understood that the communication system 200 is a multi-TRP transmission scenario.

[0229] It should be understood that FIGS. 1 and 2 are merely examples and do not constitute any limitation on the communication system to which the embodiments of the present application may be applied.

[0230] The terminal device in this embodiment of the present application may also be referred to as user equipment (UE), mobile station (MS), mobile terminal (MT), access terminal, subscriber unit, subscriber station, mobile station, remote station, remote terminal, mobile device, user terminal, terminal, wireless communication device, user agent, user equipment, etc.

[0231] The terminal device may be a device that provides voice / data connectivity to a user, for example, a handheld device or an in-vehicle device with a wireless connection function. Currently, some terminals include, for example, a mobile phone, a tablet computer, a notebook computer, a palmtop computer, a mobile internet device (MID), a wearable device, a virtual reality (VR) device, an augmented reality (AR) device, a wireless terminal in industrial control, a wireless terminal in self-driving, a wireless terminal in remote medical surgery, a wireless terminal in smart grid, a wireless terminal in transportation safety, a wireless terminal in smart city, a wireless terminal in smart home, a cellular phone, a cordless phone, a session initiation protocol (SIP) phone, a wireless local loop (WLL) station, a personal digital assistant (PDAS), ... The following devices may be used as terminal devices: a mobile assistant (PDA), a handheld device or a computing device equipped with a wireless communication function or other processing device connected to a wireless modem, an in-vehicle device, a wearable device, a terminal device in a 5G network, and a terminal device in a future evolved public land mobile network (PLMN). This is not limited to the embodiments of the present application.

[0232] By way of example, but not by way of limitation, in this embodiment of the present application, the terminal device may alternatively be a wearable device. A wearable device may also be called a wearable intelligent device, which is a general term for wearable devices, such as glasses, gloves, watches, clothes, and shoes, that are intelligently designed and developed for daily wear by using wearable technology. A wearable device is a portable device that can be directly worn on the body or integrated into the user's clothes or accessories. A wearable device is not only a hardware device, but also implements powerful functions through software support, data exchange, and cloud interaction. In a broad sense, wearable intelligent devices include full-featured large-scale devices that can implement all or part of the functions without relying on a smartphone, such as smart watches or smart glasses, and also include devices that focus only on one type of application function and need to cooperate with other devices such as smartphones, such as various smart bands, or smart jewelry that monitors physical signs.

[0233] Furthermore, in the embodiments of the present application, the terminal device may alternatively be a terminal device in an Internet of Things (IoT) system. IoT is an important part of the future development of information technology. The main technical feature of IoT is to connect things to the network by using communication technology to implement an intelligent network for human-machine interconnection and thing-thing interconnection.

[0234] Furthermore, the network device in the embodiment of the present application may be a device configured to communicate with a terminal device, and the network device may also be referred to as an access network device or a radio access network device. In a system using different radio access technologies, the name of the network device may be different. For example, the network device may be a transmission reception point (TRP), an evolved NodeB (eNB or eNodeB) in an LTE system, a home NodeB (e.g., home evolved NodeB, or home NodeB, HNB) or a baseband unit (BBU), a radio controller in a cloud radio access network (CRAN) scenario, a base transceiver station (BBU) in a global system for mobile communication (GSM) or a code division multiple access (CDMA) network, and a base transceiver station (BBU) in a code division multiple access (CDMA) network. b ase t ransceiver s Alternatively, the network device may be a relay station, an access point, an in-vehicle device, a wearable device, a network device in a 5G network, a network device in a future evolved PLMN network, etc., an access point (AP) in a WLAN, or a gNB in ​​a new radio (NR) system. This is not limited to the embodiments of the present application.

[0235] In the network structure, the network devices may include a central unit (CU) node, a distributed unit (DU) node, a RAN device including a CU node and a DU node, or a RAN device including a CU control plane node (CU-CP node), a CU user plane node (CU-UP node), and a DU node.

[0236] A network device serves a cell, and a terminal device communicates with the cell by using a transmission resource (e.g., a frequency domain resource or a spectrum resource) allocated by the network device. The cell may belong to a macro base station (e.g., a macro eNB or a macro gNB), or may belong to a base station corresponding to a small cell. The small cell here may include a metro cell, a micro cell, a pico cell, a femto cell, etc. These small cells have characteristics of small coverage and low transmission power, and are applied to provide high-rate data transmission services.

[0237] In addition, the network architecture and service scenarios described in the embodiments of the present application are intended to more clearly describe the technical solutions in the embodiments of the present application, and do not constitute limitations on the technical solutions provided in the embodiments of the present application. Those skilled in the art may know that with the advancement of network architectures and the emergence of new service scenarios, the technical solutions provided in the embodiments of the present application can also be applied to similar technical problems.

[0238] By way of example, and not by way of limitation, FIG. 3 is a schematic diagram of a hardware structure of a network device and a terminal device according to an embodiment of the present application.

[0239] As shown in FIG. 3, the terminal device includes at least one processor 101 , at least one memory 102 , and at least one transceiver 103 .

[0240] The processor 101, the memory 102, and the transceiver 103 are connected via a bus. The processor 101 may be a general-purpose central processing unit (CPU), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits configured to control program execution of the solutions of the present application. The processor 101 may further include multiple CPUs, and the processor 101 may be a single-core (single-CPU) processor or a multi-core (multi-CPU) processor. A processor here may be one or more devices, circuits, or processing cores configured to process data (e.g., computer program instructions).

[0241] The memory 102 may be a read-only memory (ROM) or other type of static storage device capable of storing static information and instructions, or a random access memory (RAM) or other type of dynamic storage device capable of storing information and instructions, or may be an electrically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM) or other compact disc storage, an optical disc storage (compact disc, laser disc, optical disc, digital versatile disc, Blu-ray disc, etc.), a magnetic disc storage medium or other magnetic storage device, or any other medium that can be used to carry or store the expected program code in the form of instructions or data structures and that can be accessed by a computer. This is not limited to the embodiment of the present application. The memory 102 may exist independently and be connected to the processor 101 through a bus. Alternatively, the memory 102 may be integrated with the processor 101. The memory 102 is configured to store application program code for implementing the solutions of the present application, and the processor 101 controls the execution. The processor 101 is configured to execute the computer program code stored in the memory 102 to implement the methods provided in the embodiments of the present application.

[0242] The transceiver 103 includes a transmitter 1031 and a receiver 1032. The transceiver 103 may be any device, such as a transceiver, configured to communicate with other devices or a communications network, such as Ethernet, a radio access network (RAN), or a wireless local area network (WLAN).

[0243] Optionally, the terminal device may further include an output device and an input device (not shown in FIG. 3). The output device may communicate with the processor 101 and display information in a number of ways. For example, the output device may be a liquid crystal display (LCD), a light emitting diode (LED) display device, a cathode ray tube (CRT) display device, or a projector. The input device may communicate with the processor 101 and receive input from a user in a number of ways. For example, the input device may be a mouse, a keyboard, a touch screen device, or a sensing device. The input and output correspond to the receiving and transmitting, respectively, of the method embodiments.

[0244] The network device includes at least one processor 201, at least one memory 202, and at least one transceiver 203. The processor 201, the memory 202, and the transceiver 203 are connected through a bus. Furthermore, for related descriptions of the processor 201, the memory 202, and the transceiver 203, please refer to the descriptions of the processor 101, the memory 102, and the transceiver 103. Details will not be described again here.

[0245] FIG. 4 is a schematic diagram of a format of a MAC CE applied to a beam interference recovery method.

[0246] The following describes the format of the existing MAC CE by using an example in which a network device configures eight cells in one terminal device, and each cell is configured with one beam failure detection resource group and one candidate beam resource group. Each of the eight cells is configured with one beam failure detection resource group and one candidate beam resource group. In other words, all eight cells are single TRP cells.

[0247] The MAC CE shown in FIG. 4 includes one bitmap and eight bits in the bitmap. The eight bits are represented as C0, C1, C2, C3, C4, C5, C6, and C7, respectively. The eight bits are in one-to-one correspondence with eight cells. If the cell corresponding to any bit is a single TRP cell with a beam failure, the MAC CE includes one octet corresponding to the arbitrary bit. If the cell corresponding to any bit is a single TRP cell with no beam failure, the MAC CE does not include one octet corresponding to the arbitrary bit. If the MAC CE includes one octet corresponding to any bit, the one octet may include an AC field, an R field, and a candidate RS ID field. The AC field indicates whether there is a candidate beam resource that satisfies the quality requirement. The R field is a reserved field and has no specific meaning. The candidate RS ID field indicates the index of the candidate beam resource. It can be understood that when the AC field indicates that there are no candidate beam resources that satisfy the quality requirements, the Candidate RS ID field is reserved. For example, when an AC field set to 0 indicates that there are no candidate beam resources that satisfy the quality requirements, the Candidate RS ID field is reserved. When an AC field set to 1 indicates that there are candidate beam resources, the Candidate RS ID field indicates an identifier of a new available beam.

[0248] For example, it may be defined as follows: any bit in the bitmap included in the MAC CE is set to 1 to indicate that a beam failure has occurred in the single TRP cell corresponding to the any bit, or any bit is set to 0 to indicate that a beam failure has not occurred in the single TRP cell corresponding to the any bit. When the terminal device determines that a beam failure has occurred in the single TRP cell corresponding to the second bit C1 of the eight bits, and the MAC CE includes one octet corresponding to the second bit C1, the one octet may include an AC field, an R field, and a candidate RS ID field, or the one octet may include an AC field and an R field.

[0249] The MAC CE format shown in Figure 4 is applicable to reporting only beam failure recovery information of a single-TRP cell, but is not applicable to reporting beam failure recovery information of a multi-TRP cell. In other words, when the existing beam failure recovery method and the existing MAC CE format are applied to a communication system including a multi-TRP cell, when a beam failure occurs in the multi-TRP cell, the related beam failure recovery information cannot be reported by using the existing method.

[0250] The present application provides a beam failure recovery method. The method may be applied to a communication system including a multi-TRP cell and a single-TRP cell. By using the method, beam failure recovery can be performed in time.

[0251] The following describes in detail the beam failure recovery method provided in the embodiment of the present application with reference to Figures 5 to 16. It should be noted that the names of messages between network elements, the names of parameters in messages, the names of fields, etc. in the embodiment of the present application are merely examples, and there may be other names in specific implementation, which are not particularly limited in the embodiment of the present application.

[0252] FIG. 5 is a schematic diagram of a beam failure recovery method 500 according to an embodiment of the present application.

[0253] As shown in Fig. 5, the method 500 includes steps 510 to 530. The following describes steps 510 to 530 in detail. The method 500 may be applied to, but is not limited to, the communication system shown in Fig. 2. When the method 500 is applied to the communication system shown in Fig. 2, the method 500 may be performed by the terminal device 220 in Fig. 2 and the network device 210a and the network device 210b in Fig. 2.

[0254] Step 510: The terminal device receives cell configuration information sent by the network device, where the cell configuration information includes M beam failure detection resource groups and M candidate beam resource groups, where the M beam failure detection resource groups are in one-to-one correspondence with the M candidate beam resource groups, and M is an integer.

[0255] In this embodiment of the present application, the M beam failure detection resource groups and the M candidate beam resource groups may be understood as resources configured by a network device for the same terminal device in a cell, where M is equal to 1. With reference to FIG. 1, for example, the terminal device in step 510 is the terminal device 120 in FIG. aWhen M is 1, one beam failure detection resource group and one candidate beam resource group in the cell configuration information may be understood as a resource configured by the network device 110 for the terminal device 120a, and one beam failure detection resource group is used to detect whether a beam failure occurs in the network device 110. M is greater than 1. For example, when M is equal to 2, referring to FIG. 2, when the terminal device in step 510 is the terminal device 220 in FIG. 2, the cell configuration information includes two beam failure detection resource groups (i.e., beam failure detection resource group #1 and beam failure detection resource group #2) and two candidate beam resource groups (i.e., candidate beam resource group #1 and candidate beam resource group #2). The beam failure detection resource group #1 and the candidate beam resource group #1 may correspond to the network device 210a, and the beam failure detection resource group #2 and the candidate beam resource group #2 may correspond to the network device 210b. The beam failure detection resource group #1 is used to detect whether a beam failure occurs in the network device 210a, and the beam failure detection resource group #2 is used to detect whether a beam failure occurs in the network device 210b. The two beam failure detection resource groups and the two candidate beam resource groups may be delivered to the terminal device 220 by using RRC signaling of the network device 210a, or may be delivered to the terminal device 220 by using RRC signaling of the network device 210b.

[0256] The configuration information of the cell includes M beam failure detection resource groups and M candidate beam resource groups. Each beam failure detection resource group may include S beam failure detection resources. Each candidate beam resource group may include Q candidate beam resources. Each beam failure detection resource is used for beam failure detection. Each candidate beam resource is used to identify a new available beam. S and Q are integers equal to or greater than 1. One candidate beam resource group and a beam failure detection resource group corresponding to the candidate beam resource group may be used for beam failure recovery of one TRP. The specific values ​​of S and Q may be set by the network device or may be reported to the network device by the terminal device based on the terminal capability. This is not particularly limited here.

[0257] In this embodiment of the present application, the manner in which the M beam fault detection resource groups are in one-to-one correspondence with the M candidate beam resource groups is not particularly limited. In one example, the beam fault detection resource group and the candidate beam resource group having the same index may correspond to each other. In another example, according to the configuration order, the k-th beam fault detection resource group may correspond to the k-th candidate beam resource group. Optionally, the indexes of the resources in the M candidate beam resource groups may be numbered separately within the resource group. For example, when M is equal to 2, the configuration information of the cell includes two candidate beam resource groups, each of which includes four resources. The numbers of the four candidate beam resources in each candidate beam resource group may be {#0, #1, #2, #3}. Optionally, the indexes of the resources in the M candidate beam resource groups are numbered collectively across the resource groups. For example, when M is equal to 2, the configuration information of the cell includes two candidate beam resource groups, each of which includes four candidate beam resources. The numbers of the four resources in the first candidate beam resource group may be {#0, #1, #2, #3}, and the numbers of the four resources in the second candidate beam resource group may be {#4, #5, #6, #7}. Optionally, it may be further specified that the maximum number of resources included in each candidate beam resource group is L, for example, L=64 or 32. Optionally, it may be specified that the maximum number of resources in all candidate beam resource groups is T, for example, T=64 or 128. Furthermore, it may be specified that the numbers of resources in all candidate beam resource groups are equal. For example, when M=2, the total number of resources in the two candidate beam resource groups is 64, and the number of resources in each candidate beam resource group is 32. As another example, when M=2, the total number of resources in the two candidate beam resource groups is 128, and the number of resources in each candidate beam resource group is 64. Alternatively, it may not be specified that the numbers of resources in all candidate beam resource groups are equal.For example, when M=2, the total number of resources in the two candidate beam resource groups is 64, and the maximum number of resources in one candidate beam resource group is 63. As another example, when M=2, the total number of resources in the two candidate beam resource groups is 128, and the maximum number of resources in one candidate beam resource group is 127.

[0258] In this embodiment of the present application, the cell in step 510 may be one of two types of cells:

[0259] Cell Type 1: Single TRP cell. Only a single beam failure detection resource group and a single candidate beam resource group are needed to perform beam failure recovery for a single TRP cell.

[0260] When M is equal to 1, the cell may be understood as a single-TRP cell. Specifically, when a network device configures only one beam failure detection resource group and one candidate beam resource group for the cell, the cell may be considered to be a single-TRP cell. The cell is a cell that serves a terminal device, and the cell includes only one TRP that communicates with the terminal device.

[0261] In this embodiment of the present application, descriptions such as "single TRP cell" and "cell configured with a single beam failure detection resource group", "cell configured with a single candidate beam resource group", "configuring a single CORESET group", or "configuring a single beam failure detection timer / counter" are equivalent to each other.

[0262] Cell Type 2: Multi-TRP cell. Multiple (two or more) beam failure detection resource groups and multiple candidate beam resource groups are required to perform beam failure recovery for a multi-TRP cell.

[0263] A cell may be understood as a multi-TRP cell when M is greater than 1. Specifically, a cell may be considered to be a multi-TRP cell when a network device configures M beam failure detection resource groups and M candidate beam resource groups for the cell, where M is an integer greater than 1. The cell is a cell that serves a terminal device, and the cell includes M TRPs that communicate with the terminal device.

[0264] In cell type 2, when a cell is a multi-TRP cell, downlink signals in the cell are simultaneously transmitted to a terminal device by using multiple TRPs. In this case, the multiple TRPs may be regarded as one network device, or the multiple TRPs may be regarded as multiple transmitters of the entire network device.

[0265] In this embodiment of the present application, statements such as "multiple TRPs are used," "multiple beam failure detection resource groups are configured," "multiple candidate beam resource groups are configured," "multiple CORESET groups are configured," or "multiple beam failure detection timers / counters are configured" are equivalent to each other.

[0266] In this embodiment of the present application, the configuration information of a cell is a resource configured by a network device (e.g., a base station) for a terminal device in a cell. When the network device configures only one cell for the terminal device, the configuration information sent by the network device to the terminal device includes the configuration information of one cell. The configuration information of a cell may be regarded as the configuration information of one cell. In other words, the terminal device receiving the configuration information of a cell may be understood as the terminal device receiving the configuration information from the network device. In a carrier aggregation (CA) mode, the network device usually configures multiple cells (i.e., serving cells) for the terminal device. When the network device configures K (when K is greater than 1) cells for the terminal device, the configuration information sent by the network device to the terminal device includes the configuration information of the K cells. The configuration information of a cell may be understood as the configuration information of one cell in the configuration information of the K cells. In this case, the terminal device receiving the configuration information of a cell may be understood as the terminal device receiving the configuration information from the network device and obtaining the configuration information of the cell from the configuration information. Among the K cells, some cells are single-TRP cells, and some cells are multi-TRP cells. This is not particularly limited here. If one of the K cells is a single-TRP cell, the network device only needs to configure a single beam failure detection resource group and a single candidate beam resource group for the one cell. If one of the K cells is a multi-TRP cell, the network device needs to configure multiple beam failure detection resource groups and multiple candidate beam resource groups for the one cell.

[0267] For example, a network device (e.g., a base station) configures eight cells for the same terminal device (see Table 1 below). For ease of description, the eight cells are represented as cell 1, cell 2, cell 3, cell 4, cell 5, cell 6, cell 7, and cell 8, respectively. Each of cell 1, cell 2, cell 3, and cell 4 is a cell in which two TRPs are used for transmission (i.e., an example of a multi-TRP cell), and the TRP needs to configure two beam failure detection resource groups and two candidate beam resource groups for each of the four cells. To explain how a TRP in a multi-TRP cell configures resources, cell 1 is used as an example. Cell 1 includes two TRPs that communicate with the same terminal device. The two TRPs configure one beam failure detection resource group and one candidate beam resource group for the terminal device, respectively. Therefore, the number of beam failure detection resource groups configured for the terminal device is two, and the number of candidate beam resource groups configured for the terminal device is also two. Cell 5, cell 6, cell 7, and cell 8 are all single-TRP cells, and the network device needs to configure a single beam failure detection resource group and a single candidate beam resource group for each of the four cells. Cell 5 is used as an example to explain how a TRP in a single-TRP cell configures resources. Cell 5 includes one TRP that communicates with the same terminal device, and one TRP configures one beam failure detection resource group and one candidate beam resource group for the terminal device. [Table 1]

[0268] The configuration information of any cell is sent via a scheduling request. request, SR) resources. When a network device configures multiple cells for one terminal device, and at least one of the multiple cells is a multi-TRP cell (e.g., cell 1 in Table 1), the network device needs to configure multiple SR resources for one terminal device, and the multiple SR resources are in one-to-one correspondence with the multiple TRPs, or the network device configures one SR resource, but the one SR resource has multiple spatial relation parameters (i.e., uplink transmission beams). When all cells configured by the network device for the terminal device are single-TRP cells (e.g., cell 6 in Table 1), the network device needs to configure only one SR resource, and the one SR resource has only a single spatial relation parameter.

[0269] In this embodiment of the present application, the method by which the network device configures the cell configuration information for the terminal device is not particularly limited. For example, the network device may configure the information for the terminal device in an explicit manner. For example, the network device may alternatively configure the information for the terminal device in an implicit manner.

[0270] For the purposes of explanation, the following uses an example in which a network device configures a beam failure detection resource group for a terminal device.

[0271] Method 1: The configuration information includes M beam fault detection resource groups, each of which includes one or more beam fault detection resources. Method 1 may be understood as a network device configuring a beam fault detection resource group for a terminal device in an explicit manner.

[0272] For example, each beam failure detection resource group in the configuration information may be configured in the following manner: Beam fault detection resource group (e.g., RadioLinkMonitoringRSSet) : Beam fault detection resource group index (e.g., RadioLinkMonitoringRSSetID) and Beam fault detection resource list (e.g., RadioLinkMonitoringRSList) 。

[0273] The beam fault detection resource group index is used to identify a beam fault detection resource group, and the beam fault detection resource list includes M beam fault detection resources.

[0274] Method 2: The configuration information includes M CORESET groups or K CORESETs constituting the M CORESET groups, where K is a positive integer greater than or equal to M. Method 2 may be understood as a network device configuring a beam failure detection resource group for a terminal device in an implicit manner.

[0275] In method 2, the QCL resources of the CORESETs in each CORESET group are used as beam fault detection resource groups. The QCL resources of all CORESETs in one CORESET group may be used as beam fault detection resource groups. Alternatively, to reduce resource overhead, only the QCL resources of K (e.g., K=1 or K=2) CORESETs in one CORESET group are restricted as beam fault detection resource groups. Specifically, the K CORESETs with the smallest or largest indexes may be used, or the first K CORESETs or the last K CORESETs may be used in the CORESET configuration sequence. The QCL resources may be type A, type B, type C, or type D QCL resources. Optionally, the total number M of CORESETs whose QCL resources are used as beam fault detection resources may alternatively be restricted in each CORESET group, where M is a positive integer (e.g., M=1, M=2, M=3, or M=4). The values ​​of K and M may be set by the network device or may be reported to the network device by the terminal device based on the terminal capabilities.

[0276] It should be noted that in this embodiment of the present application, for example, the resource used for beam failure detection is called a beam failure detection resource, and the resource used for identifying a new available beam is called a candidate beam resource. The resource used for beam failure detection and / or the resource used for identifying a new available beam may have other names in specific implementation. The names of the two kinds of resources are not particularly limited in this embodiment of the present application.

[0277] Step 520: The terminal device performs beam obstruction detection.

[0278] The following describes in detail the beam fault detection performed by the terminal device by using an example in which the terminal device measures the beam fault detection resource group #1. The beam fault detection resource group #1 may be understood as any one of the M beam fault detection resource groups in step 510, and among the M candidate beam resource groups, the candidate beam resource group corresponding to the beam fault detection resource group #1 is the candidate beam resource group #1.

[0279] Optionally, the terminal device may measure each beam fault detection resource in the beam fault detection resource group #1. When the quality of each beam fault detection resource is lower than a first threshold, the terminal device determines that a beam fault occurs in the beam fault detection resource group #1.

[0280] In one example, the configuration information of a cell includes M beam failure detection resource groups and M candidate beam resource groups, where M is an integer greater than 1. After performing beam failure detection on each of the M beam failure detection resource groups, the terminal device determines that beam failure is detected in at least one of the M beam failure detection resource groups. When M is greater than 1, it may be understood that the cell is a multi-TRP cell. In this case, if beam failure is detected in only one of the M beam failure detection resource groups, the terminal device may determine that beam failure occurs in the cell.

[0281] In another example, the configuration information of the cell includes M beam failure detection resource groups and M candidate beam resource groups, where M is equal to 1. After performing beam failure detection on each of the M beam failure detection resource groups, the terminal device determines that beam failure is detected in the M beam failure detection resource groups. It can be understood that when M is equal to 1, the cell is a single-TRP cell, and beam failure is detected in the M beam failure detection resource groups, that is, the terminal device detects that beam failure occurs in one beam failure detection resource group configured in the cell.

[0282] It should be understood that the M beam failure detection resource groups correspond to the M TRPs and are used to detect whether a beam failure occurs in the M TRPs, respectively. detection Detecting that a beam fault has occurred in a resource group is equivalent to detecting that a beam fault has occurred in a TRP corresponding to the beam fault detection resource group. For example, beam fault detection resource group #1 corresponds to TRP #1, and detecting that a beam fault has occurred in beam fault detection resource group #1 is equivalent to detecting that a beam fault has occurred in TRP #1.

[0283] Step 530: When M is an integer greater than 1 and a beam failure occurs in at least one of the M beam failure detection resource groups, the terminal device transmits beam failure recovery information corresponding to the cell by using the first MAC CE.

[0284] In step 530, M is an integer greater than 1, and the cell can be understood as a multi-TRP cell. As long as a beam failure occurs in at least one beam failure detection resource group configured in the cell, the terminal device may transmit beam failure recovery information corresponding to the cell by using the first MAC CE.

[0285] For example, when M is equal to 2, the configuration information of the cell includes two beam failure detection resource groups and two candidate beam resource groups. When the terminal device detects that a beam failure occurs in one of the two beam failure detection resource groups, the terminal device may transmit beam failure recovery information corresponding to the cell by using the first MAC CE. Alternatively, when the terminal device detects that a beam failure occurs in the two beam failure detection resource groups, the terminal device may transmit beam failure recovery information corresponding to the cell by using the first MAC CE.

[0286] When a beam failure occurs in one beam failure detection resource group, all resources in the beam failure detection resource group are Quality may be understood as being lower than a preset threshold. For example, beam failure detection resource group #1 includes a total of k resources. k resources Quality are all lower than the preset thresholds, it may be considered that a beam failure occurs in the beam failure detection resource group #1, where k is an integer.

[0287] Optionally, in some implementations, a beam failure occurring in one beam failure detection resource group may alternatively be detected by some of the resources in the beam failure detection resource group. Quality may be understood as being lower than a preset threshold. For example, beam failure detection resource group #1 includes a total of four resources. Four of the six resources Quality are all lower than the preset thresholds, it may be considered that a beam failure has occurred in beam failure detection resource group #1.

[0288] In step 530, when M is greater than 1, the beam failure is detected in at least one beam failure detection resource group, which can be classified into the following two cases:

[0289] Case 1: Among M (M>1) beam failure detection resource groups of a cell, beam failure is detected in some beam failure detection resource groups. In this case, the beam failure recovery information corresponding to the cell may be transmitted by using the first MAC CE. This method is applicable to, but not limited to, the following cells: the cell is a primary cell (P C ell, and the cell is a primary cell in a secondary cell group. cell in a secondary cell group ,PSCell) and the cell is a secondary cell (SCell). The secondary cell group (SCG) may be the secondary cell group of two configured cell groups. The other cell group is the master cell group (MCG).

[0290] Case 2: Among M (M>1) beam failure detection resource groups of a cell, beam failure is detected in all beam failure detection resource groups. In this case, how the beam failure recovery information is transmitted depends on the type of the cell. If the cell is a SCell, the beam failure recovery information corresponding to the cell may be transmitted by using the first MAC CE. If the cell is a P CWhen the cell is a PSCell, the beam failure recovery information corresponding to the cell may be transmitted by using a random access process. When the cell is a PSCell, the beam failure recovery information corresponding to the cell may be transmitted by using the first MAC CE, or the beam failure recovery information corresponding to the cell may be transmitted by using a random access process. In this embodiment of the present application, when the cell is a multi-TRP cell, the terminal transmits the beam failure recovery information corresponding to the cell by using the first MAC CE. The beam failure recovery information corresponding to the cell may include the following information: beam failure recovery information corresponding to a beam failure detection resource group among the M beam failure detection resource groups in which a beam failure is detected, and information on a beam failure detection resource group among the M beam failure detection resource groups in which a beam failure is not detected. The beam failure recovery information corresponding to a beam failure detection resource group among the M beam failure detection resource groups in which a beam failure is detected at least includes information on a beam failure detection resource group among the M beam failure detection resource groups in which a beam failure is detected. Optionally, the beam failure recovery information corresponding to a beam failure detection resource group among the M beam failure detection resource groups in which a beam failure is detected may alternatively include: quality requirements Optionally, the beam failure recovery information corresponding to the beam failure detection resource group in which the beam failure is detected among the M beam failure detection resource groups may alternatively include information regarding the candidate beam resource group in which the beam failure is detected among the M beam failure detection resource groups.

[0291] The format of the first type first MAC CE provided in this embodiment of the present application is described below by using the example that "the beam failure recovery information corresponding to a cell may include the following information: beam failure recovery information corresponding to a beam failure detection resource group among the M beam failure detection resource groups in which a beam failure is detected, and information regarding a beam failure detection resource group among the M beam failure detection resource groups in which a beam failure is not detected."

[0292] Format of 1st MAC CE of 1st type

[0293] The first type first MAC CE provided in this embodiment of the present application includes one bitmap. One bitmap may include P bits. At least one bit in the bitmap (i.e., at least one field in the bitmap) corresponds to a cell set by a network device for a terminal device, and the value of the bit may be 0 or 1. In other words, some bits of the P bits may not correspond to any cell. The bits that do not correspond to any cell are not specifically designed in the present application. In some implementations, when one bitmap includes 8 bits, P is a positive integer less than or equal to 8. For example, one bitmap may include 8 bits (i.e., P is equal to 8), and the 8 bits correspond one-to-one with 8 cells. For example, one bitmap may include 8 bits (i.e., P is equal to 8), and only 3 bits of the 8 bits are in one-to-one correspondence with 3 cells, and the remaining 5 bits of the 8 bits do not correspond to any cell. For example, a bitmap may include five bits (i.e., P is equal to 5), where only three of the five bits are in one-to-one correspondence with three cells, and the remaining two of the five bits do not correspond to any cell. The bits that do not correspond to any cell are not specifically designed in this application.

[0294] The following describes the correspondence between bits in the bitmap and cells. The correspondence methods include correspondence method 1 and correspondence method 2. It should be understood that the two correspondence methods are only applicable to bits corresponding to a specific cell, that is, the bits in the following description only represent bits corresponding to a specific cell.

[0295] Solution 1

[0296] In method 1, one bit in the bitmap corresponds to one set cell, the value of the one bit indicates whether a beam failure occurs in the cell corresponding to the one bit, and the cell corresponding to the one bit may be a single-TRP cell or a multi-TRP cell.

[0297] When the cell corresponding to the 1 bit is a single TRP cell, the value of the 1 bit is null, and the terminal device ignores the value of the bit and regards the 1 bit as a reserved field containing no information. It can also be understood that when the cell corresponding to the 1 bit is a single TRP cell, the value of the 1 bit is a first value by default, and the network device cannot set the value of the 1 bit to another value, or the terminal device regards the value of the 1 bit as the first value regardless of the value of the bit set by the network device. The first value indicates that no beam failure occurs in the cell corresponding to the 1 bit. For example, the first value may be 0 or 1. It can be understood that when the number of beam failure detection resource groups or candidate beam resource groups configured for the cell corresponding to the 1 bit is 0, the above information may still be used. In other words, the value of the 1 bit corresponding to the cell is null or defaults to the first value.

[0298] When the cell corresponding to the 1 bit is a multi-TRP cell, the value of the bit indicates whether a beam failure occurs in the cell. For example, a value of 1 of the 1 bit indicates that a beam failure occurs in at least one TRP in the cell corresponding to the 1 bit, i.e., a beam failure is detected in at least one beam failure detection resource group. In this case, the first MAC CE further includes one or more octets. The one or more octets may indicate a cell corresponding to the one or more octets. Corresponding to It includes a field indicating beam failure recovery information. For example, it may be defined as follows: a value of 0 of one bit indicates that no beam failure occurs in the cell corresponding to the one bit, i.e., no beam failure is detected in all beam failure detection resource groups. In this case, the first MAC CE does not include one or more of the aforementioned octets. As another example, it may be defined as follows: a value of 0 of one bit indicates that a beam failure occurs in at least one TRP in the cell corresponding to the one bit, and a value of 1 of one bit indicates that no beam failure occurs in the cell corresponding to the one bit. Whether a beam failure occurs in a multi-TRP cell may be understood as whether a beam failure is detected in at least one beam failure detection resource group configured for a multi-TRP cell. The correspondence between the bits and the cells is represented by C in the i-th bit or bitmap. i This includes, but is not limited to, that a bit named i corresponds to a cell with index i, where i is an integer equal to or greater than 0.

[0299] Solution 2

[0300] In method 2, a bit in the bitmap may correspond only to a multi-TRP cell, and a value of the bit indicates whether a beam failure occurs in the cell corresponding to the bit. For example, a value of the bit being 1 indicates that a beam failure occurs in at least one TRP in the cell corresponding to the bit, i.e., a beam failure is detected in at least one beam failure detection resource group. In this case, the first MAC CE further includes one or more octets. The one or more octets may include: bit The cell corresponding to for The bit map includes beam failure recovery information. A value of 0 of the bit indicates that no beam failure occurs in the cell corresponding to the bit, i.e., no beam failure is detected in all beam failure detection resource groups. In this case, the first MAC CE does not include one or more of the aforementioned octets. As another example, a value of 0 of the bit indicates that a beam failure occurs in at least one TRP in the cell corresponding to the bit, and a value of 1 of the bit indicates that no beam failure occurs in the cell corresponding to the bit. Whether a beam failure occurs in a multi-TRP cell may be understood as whether a beam failure is detected in at least one beam failure detection resource group configured for a multi-TRP cell. The correspondence between the bits and the cells is represented by C in the i-th bit or bitmap. i and a bit named C0, C1, C2, and C3 in the bitmap correspond to the i-th multi-TRP cell or the multi-TRP cell with the i-th minimum index or the i-th maximum index in the configured multi-TRP cells, where i is an integer equal to or greater than 0. For example, if a network device configures eight cells for a terminal device, and cell 1, cell 3, cell 5, and cell 7 are multi-TRP cells, then C0, C1, C2, and C3 in the bitmap correspond to cell 1, cell 3, cell 5, and cell 7, respectively.

[0301] It can be understood that the first MAC CE of the first type is only used to report beam failure recovery information of a multi-TRP cell. For a single-TRP cell, even if a beam failure occurs in the single-TRP cell, the first MAC CE of the first type is not used to report beam failure recovery information of the single-TRP cell.

[0302] Optionally, in some implementations, one bit in one bitmap included in the first MAC CE of the first type corresponds to M octets (or bytes).

[0303] The M octets are in one-to-one correspondence with the M beam fault detection resource groups, or The M octets are in one-to-one correspondence with the M candidate beam resource groups, or The M octets are in one-to-one correspondence with the M transmitting / receiving points TRP, or The M octets are in one-to-one correspondence with the M CORESET groups.

[0304] The one bit corresponds to M octets, which may be understood as meaning that if the value of the one bit is a second value, the first MAC CE includes M octets used to carry beam failure recovery information of the cell corresponding to the one bit, and does not include M octets otherwise. The second value indicates that a beam failure occurs in the cell corresponding to the one bit. Among the M beam failure detection resource groups and the M candidate beam resource groups, each beam failure detection resource group and The Beam Fault Detection Resource Group A candidate beam resource group associated with corresponds to one TRP, for which beam failure detection and recovery are performed.

[0305] The M octets are in one-to-one correspondence with the M beam fault detection resource groups, specifically, the jth octet in the M octets corresponds to the jth beam fault detection resource group in the M beam fault detection resource groups. The jth beam fault detection resource group may be the jth beam fault detection resource group sorted in the configuration order or index order. Similarly, the M octets are in one-to-one correspondence with the M candidate beam resource groups, specifically, the jth octet in the M octets corresponds to the jth candidate beam resource group in the M candidate beam resource groups. The jth candidate beam resource group may be the jth candidate beam resource group sorted in the configuration order or index order. Similarly, the M octets are in one-to-one correspondence with the M CORESET groups, specifically, the jth octet in the M octets corresponds to the jth CORESET group in the M CORESET groups. The j-th CORESET group may be the j-th CORESET group sorted in configuration order or index order, where j is a positive integer less than or equal to M.

[0306] In this embodiment of the present application, descriptions such as "TRP", "beam fault detection resource group", "candidate beam resource group", and "CORESET group" can be understood to be equivalent to each other. The meanings indicated by the descriptions are consistent when differences are not emphasized.

[0307] One bit corresponds to M octets. One bit may be understood as one bit corresponding to one cell configured by the network device for the terminal device, and the cell corresponding to the one bit is a multi-TRP cell in which a beam failure occurs. For example, a beam failure may occur in one TRP in a multi-TRP cell. Alternatively, a beam failure may occur in some or all TRPs in a multi-TRP cell. The occurrence of a beam failure in a cell may be understood as the terminal device detecting that a beam failure occurs in at least one of the M beam failure detection resource groups included in the configuration information of a cell.

[0308] For example, the first bit C0 in one bitmap included in the first type first MAC CE corresponds to cell 1, and the network device configures M beam failure detection resource groups and M candidate beam resource groups for cell 1, where M is an integer greater than 1. When a beam failure occurs in at least one of the M beam failure detection resource groups, the first MAC CE includes M octets corresponding to the first bit C0, and the M octets may be in one-to-one correspondence with the M beam failure detection resource groups, the M octets are in one-to-one correspondence with the M candidate beam resource groups, or the M octets are in one-to-one correspondence with the M transmission / reception points TRP.

[0309] Optionally, each of the M octets includes one first field, which indicates whether a beam failure is detected in the beam failure detection resource group corresponding to each octet. In this embodiment of the present application, the beam failure detection resource group and the TRP can be equivalent to each other. In other words, the first field can also indicate that a beam failure occurs in the TRP corresponding to each octet. The length of the first field may be 1 bit. In this case, the first field may be located in the first bit or the second bit of the octet of the first field. When the first field indicates that a beam failure is detected in the beam failure detection resource group corresponding to the octet of the first field, the remaining other fields in the octet of the first field carry further beam failure recovery information. When the first field indicates that a beam failure is not detected in the beam failure detection resource group corresponding to the octet of the first field, the remaining fields in the octet of the first field are reserved, i.e., there is no beam failure recovery information, and the terminal device may ignore the remaining fields. Optionally, the length of the first field may alternatively be more bits. For example, the length of the first field may alternatively be 2 bits. In this case, the first field may use the first two bits of the octet of the first field. Optionally, each of the M octets further includes one second field, and the second field indicates whether there is a candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to each octet. Alternatively, the second field indicates whether there is information about the candidate beam resource in each octet. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the second field may alternatively indicate whether there is a candidate beam resource that satisfies the quality requirement in the TRP corresponding to each octet. The length of the second field may be 1 bit. In this case, the second field may be located in the first bit, the second bit, or the third bit of the octet of the second field.When the second field indicates that the candidate beam resource group corresponding to the octet of the second field has a candidate beam resource that satisfies the quality requirement, the remaining other fields in the octet of the second field carry further beam failure recovery information. When the second field indicates that the candidate beam resource group corresponding to the octet of the second field has no candidate beam resource that satisfies the quality requirement, the remaining fields in the octet of the second field are reserved, i.e., there is no beam failure recovery information, and the terminal device may ignore the remaining fields. Optionally, the length of the second field may alternatively be more bits. For example, the length of the second field may alternatively be 2 bits. In this case, the second field may use the first 2 bits of the octet of the second field.

[0310] Optionally, each of the M octets further includes one third field, and the third field indicates information about a candidate beam resource that is determined in the candidate beam resource group corresponding to each octet and satisfies the quality requirement. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the third field may alternatively indicate whether there is information about a candidate beam resource that satisfies the quality requirement in the TRP corresponding to each octet. The length of the third field may be 6 bits or 5 bits. For example, when the length of the third field is 6 bits, the third field may specifically be the last 6 bits of the octet of the field. For example, when the length of the third field is 5 bits, the third field may specifically be the last 5 bits of the octet of the field. Optionally, the length of the third field may alternatively be other values. This is not specifically limited here.

[0311] Optionally, the third field may indicate whether a candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to each octet. For example, the field value of the third field indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. For example, the length of the third field is 6 bits, and the field value 000000 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. Alternatively, the field value 111111 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. In other words, the remaining 63 field values ​​may indicate one of the 63 candidate beam resources individually. The candidate beam resource group configured by the network device for the terminal device may be specified to include a maximum of 63 candidate beam resources. Alternatively, the two candidate beam resource groups configured by the network device for the terminal device may be specified to include a maximum of 63 candidate beam resources in total. As another example, the length of the third field is 5 bits, and the field value 00000 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. Alternatively, the field value 11111 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. In other words, the remaining 31 field values ​​may individually indicate one of the 31 candidate beam resources. The candidate beam resource group configured by the network device for the terminal device may be specified to include up to 31 candidate beam resources. Alternatively, the two candidate beam resource groups configured by the network device for the terminal device may be specified to include up to 31 candidate beam resources in total.As another example, the length of the third field is 7 bits, and the field value 0000000 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. Alternatively, the field value 1111111 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. In other words, the remaining 127 field values ​​may individually indicate one of the 127 candidate beam resources. The candidate beam resource group configured by the network device for the terminal device may be specified to include a maximum of 127 candidate beam resources. Alternatively, the two candidate beam resource groups configured by the network device for the terminal device may be specified to include a maximum of 127 candidate beam resources in total.

[0312] Each of the M octets may include only one of the aforementioned fields. Specifically, each of the M octets may include only one first field. Alternatively, each of the M octets may include only one second field. Alternatively, each of the M octets may include only one third field.

[0313] Optionally, each of the M octets may include any number of the aforementioned fields. For example, each of the M octets may include a first field and a second field. For example, each of the M octets may include a first field, a second field, and a third field. For example, each of the M octets may include a first field and a third field.

[0314] Optionally, if the first field in any one of the M octets indicates that no beam failure is detected in the beam failure detection resource group corresponding to that any octet, then the remaining fields in that any octet are reserved.

[0315] For example, if any one of the M octets includes a first field and a second field, and the first field of the any one of the octets indicates that no beam failure is detected in the beam failure detection resource group corresponding to the any one of the octets, the second field of the any one of the octets is reserved. Accordingly, after the network device receives the first MAC CE, the network device may determine that no beam failure occurs in the beam failure detection resource group corresponding to the any one of the M octets. If any one of the M octets includes a first field, a second field, and a third field, and the first field of the any one of the octets indicates that no beam failure is detected in the beam failure detection resource group corresponding to the any one of the octets, the second field and the third field of the any one of the octets are reserved. If any one of the M octets includes a first field, a second field, and a third field, and the first field of the any octet indicates that a beam failure is detected in the beam failure detection resource group corresponding to the any octet, and the second field of the any octet indicates that there is no candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the any octet, the third field of the any octet is reserved. Correspondingly, after the network device receives the first MAC CE, the network device may determine that a beam failure occurs in the beam failure detection resource group corresponding to the any octet, and that there is no candidate beam resource corresponding to the beam failure detection resource group.

[0316] It can be understood that the first type of first MAC CE is used to report beam failure recovery information of a multi-TRP cell. For a single TRP cell, even if a beam failure occurs in the single TRP cell, the first MAC CE is not used to report the beam failure recovery information of the single TRP cell to the network device.

[0317] For example, if the network device configures only one beam failure detection resource group #1 and one candidate beam resource group #1 for the terminal device #1, in other words, if the cell through which the terminal device #1 communicates with the network device is a single TRP cell, regardless of the value of the bit in the bitmap corresponding to the cell (in other words, regardless of whether beam failure occurs in the single TRP cell corresponding to the bit), the terminal device will assume by default that beam failure does not occur in the single TRP cell corresponding to the bit. Therefore, the first MAC CE does not include an octet corresponding to the bit, and the terminal device does not transmit beam failure recovery information of the single TRP cell corresponding to the bit by using the first MAC CE.

[0318] It should be further understood that the above description is given by using the example that "one bit in a bitmap included in the first MAC CE of the first type corresponds to one field, and one field corresponds to one cell". Optionally, the first MAC CE of the first type includes multiple fields, each of the multiple fields corresponds to one cell, and each of the multiple fields uses multiple bits (two bits or more than two bits). In this case, the multiple fields can be considered as one whole bitmap, and one "bit" in the one bitmap is equal to one "field", and the field includes multiple bits.

[0319] Based on the format of the first type of first MAC CE provided in this embodiment of the present application, when a terminal device needs to transmit beam failure recovery information corresponding to a cell by using the first MAC CE, it is necessary to ensure that one bit in one bitmap included in the first MAC CE corresponds to a cell, the terminal device detects that a beam failure occurs in the cell, and the configuration information of the cell includes M beam failure detection resource groups and M candidate beam resource groups, where M is an integer greater than 1 (in other words, the cell is a multi-TRP cell). That is, the terminal device can transmit beam failure recovery information corresponding to a cell by using the first MAC CE only in the above case.

[0320] Optionally, the network device may further assign another cell different from the aforementioned cell to the terminal device. For ease of description, the other cell different from the aforementioned cell is used. For example, the other cell may be a single-TRP cell, in other words, the configuration information of the other cell includes one beam failure detection resource group and one candidate beam resource group. In this case, one bit in one bitmap included in the first MAC CE corresponds to the other cell, and the terminal device considers that no beam failure occurs in the other cell by default, regardless of the value of the one bit. In this case, the first MAC CE does not include one octet corresponding to one bit. For example, the other cell may alternatively be a multi-TRP cell, in other words, the configuration information of the other cell includes multiple (e.g., "multiple" means S, S is an integer greater than 1, S may be equal to M, or S may not be equal to M) beam failure detection resource groups and multiple candidate beam resource groups. In this case, one bit in one bitmap included in the first MAC CE corresponds to the other cell. When a beam failure occurs in at least one of the multiple beam failure detection resource groups, the first MAC CE further includes multiple octets corresponding to one bit, and the multiple octets are in one-to-one correspondence with the multiple beam failure detection resource groups configured for other cells.

[0321] The above description, with reference to the text, describes in detail the format of the first type of first MAC CE provided in this embodiment of the present application. The following describes the format of the first type of first MAC CE with reference to Figures 6 and 7.

[0322] For example, a schematic diagram of the format of the first type first MAC CE provided in this embodiment of the present application is described by using an example in which a network device configures eight cells for one terminal device, and configures M (M is an integer greater than 1) beam failure detection resource groups and M candidate beam resource groups for each cell. It can be understood that all eight cells are multi-TRP cells.

[0323] As shown in FIG. 6, the first MAC CE of the first type provided in this embodiment of the present application includes one bitmap (one bitmap includes 8 bits (i.e., 8 fields, where each field uses 1 bit), and the 8 bits are represented as C0, C1, C2, C3, C4, C5, C6, and C7, respectively, and have one-to-one correspondence with the 8 cells) and the i-th bit C i Furthermore, the i-th bit C i The cell corresponding to the i-th bit C i The number of octets corresponding to the i-th C i The number of beam failure detection resource groups or candidate beam resource groups included in the cell corresponding to the i-th bit C i The M octets corresponding to may have a one-to-one correspondence with the M beam fault detection resource groups, and the i-th bit C i The M octets corresponding to may be in one-to-one correspondence with the M candidate beam resource groups, or the i-th bit C i The M octets corresponding to may have a one-to-one correspondence with the M TRPs. When a bit in a bitmap corresponds to a multi-TRP cell with a beam obstruction, or when a bit in a bitmap corresponds to a single-TRP cell, the first MAC CE does not include an octet corresponding to the bit.

[0324] For example, when a beam failure occurs in a multi-TRP cell (whose configuration information includes M beam failure detection resource groups and M candidate beam failure detection resource groups, where M is an integer greater than 1) corresponding to the first bit C0 in one bitmap included in the first MAC CE, the first MAC CE may include M octets corresponding to the first bit C0, and the M octets may be in one-to-one correspondence with the M beam failure detection resource groups. When a beam failure is detected in only one of the M beam failure detection resource groups and the one beam failure detection resource group corresponds to the first octet in the M octets, the first octet in the M octets may include an F1 field (i.e., an example of a first field), an AC1 field (i.e., an example of a second field), and a candidate RS ID1 field (i.e., an example of a third field). The value of the F1 field indicates that a beam failure has occurred in the beam failure detection resource group corresponding to the first octet, the value of the AC1 field indicates that a candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the octet of the field, and the value of the RS ID1 field indicates information about the candidate beam resource that satisfies the quality requirement. Alternatively, the first octet of the M octets may include only the F1 field (i.e., an example of the first field) and the AC1 field (i.e., an example of the second field). The value of the F1 field is first The AC1 field indicates that a beam failure has occurred in the beam failure detection resource group corresponding to the octet of the field, and the value of the AC1 field indicates that there is no candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the octet of the field. In this case, the value of the Candidate RS ID1 field is null, that is, the Candidate RS ID1 has no specific meaning. Furthermore, each of the M octets excluding the first octet includes only the F1 field (i.e., an example of the first field), and the value of the F1 field indicates that no beam failure has occurred in the beam failure detection resource group corresponding to the octet of the field.

[0325] Optionally, in some implementations, F of FIG. M The field may be located in the second bit of each octet and is shown in AC M The field may be located in the first bit of each octet. In this case, F in FIG. M Field and AC M The positions of the fields need to be swapped. Optionally, in some implementations, the candidate RS IDs in FIG. M The length of the field may alternatively be 6 6 may be 1 bit. Optionally, in some implementations, the length of the candidate RS ID field in one octet of FIG. 6 may be fewer bits (e.g., 5 bits), and the length of the AC field may be more bits (e.g., 2 bits). For example, the length of the R field may be 1 bit, the length of the AC field may be 2 bits, and the candidate RS ID field may be 5 bits. In this case, it may be defined as follows: the value of the AC field is 11 indicates that there is a candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the octet of the AC field.

[0326] It should be understood that in Fig. 6, the specific format of the first type first MAC CE provided in this embodiment of the present application is described by using the example that "a network device configures 8 cells for one terminal device, and M beam failure detection resource groups and M candidate beam resource groups are configured for each cell, where M is an integer greater than 1." That is, Fig. 6 is only an example and does not constitute any limitation on the format of the first type first MAC CE provided in this embodiment of the present application.

[0327] The following uses the format of the first type first MAC CE shown in FIG. 6 as an example for explanation.

[0328] For example, a network device configures three cells for one terminal device: cell 0, cell 1, and cell 2. Cell 0 is a cell configured with three beam failure detection resource groups and three candidate beam resource groups, cell 1 is a cell configured with two beam failure detection resource groups and two candidate beam resource groups, and cell 2 is a cell configured with one beam failure detection resource group and one candidate beam resource group. Cell 0 corresponds to the first bit C0 in the bitmap included in the first MAC CE, cell 1 corresponds to the second bit C1 in the bitmap included in the first MAC CE, and cell 2 corresponds to the third bit C2 in the bitmap included in the first MAC CE.

[0329] The terminal device detects that beam failure occurs in two beam failure detection resource groups (beam failure detection resource group #1 and beam failure detection resource group #3) out of three beam failure detection resource groups (beam failure detection resource group #1, beam failure detection resource group #2, and beam failure detection resource group #3) set in cell 0, and among the three candidate beam resource groups, only the candidate beam resource corresponding to beam failure detection resource group #1 exists. Beam failure detection resource group #1 corresponds to the first octet of the three octets corresponding to the first bit C0, beam failure detection resource group #2 corresponds to the second octet of the three octets corresponding to the first bit C0, and beam failure detection resource group #3 corresponds to the third octet of the three octets corresponding to the first bit C0.

[0330] The terminal device detects that a beam failure has occurred in one beam failure detection resource group (i.e., beam failure detection resource group #2) of the two beam failure detection resource groups (beam failure detection resource group #1 and beam failure detection resource group #2) set in cell 1, 2In one candidate beam resource group, there are only candidate beam resources corresponding to beam fault detection resource group #1 and candidate beam resources corresponding to beam fault detection resource group #3. Beam fault detection resource group #1 corresponds to the first octet of the two octets corresponding to the second bit C1, and beam fault detection resource group #2 corresponds to the second octet of the two octets corresponding to the second bit C1.

[0331] The terminal device detects that the number of beam failure detection resource groups and candidate beam resource groups configured for cell 2 is 1. Therefore, the first MAC CE does not include an octet corresponding to the third bit C2, and the value of the third bit C2 is 0 or 1 by default.

[0332] In one example, it is defined as follows: A bit in the bitmap corresponding to a multi-TRP cell has a value of 1. cell indicates that a beam obstruction has occurred, and multi-TRP cell A bit in the bitmap that corresponds to a multi-TRP cellIt is defined as follows: the value of the first field in each of the multiple octets corresponding to one bit is 1, which indicates that a beam fault occurs in the beam fault detection resource group corresponding to each octet, and the value of the first field in each of the multiple octets corresponding to one bit is 0, which indicates that a beam fault does not occur in the beam fault detection resource group corresponding to each octet. In this case, please refer to FIG. 7 for the specific contents of the three octets corresponding to the first bit C0 and the two octets corresponding to the second bit C1. The octet corresponding to the first bit C0 is used as an example. When a field in the octet corresponding to C0 is reserved, it indicates that the field has no specific meaning. For example, when the F2 field in the second octet corresponding to the first bit C0 is set to 0, it indicates that a beam fault does not occur in the beam fault detection resource group corresponding to the second octet. Therefore, the remaining fields in the second octet are reserved.

[0333] It should be understood that Figures 6 and 7 are merely examples and do not constitute any limitation on the format of the first MAC CE of the first type provided in this embodiment of the present application. All formats of the first MAC CE obtained based on the definition of the format of the first MAC CE of the first type provided in this embodiment of the present application belong to the format of the MAC CE claimed in this embodiment of the present application.

[0334] The format of the first type 1MAC CE provided in this embodiment of the present application is described above by using an example that "the beam failure recovery information corresponding to a cell may include the following information: beam failure recovery information corresponding to a beam failure detection resource group among the M beam failure detection resource groups where a beam failure is detected, and information about a beam failure detection resource group among the M beam failure detection resource groups where a beam failure is not detected". The following describes the format of the second type 1MAC CE, the format of the third type 1MAC CE, the format of the fourth type 1MAC CE, and the format of the fifth type 1MAC CE provided in this embodiment of the present application by using an example that "the beam failure recovery information corresponding to a cell may include beam failure recovery information corresponding to a beam failure detection resource group among the M beam failure detection resource groups where a beam failure is detected".

[0335] Format of the 1st MAC CE of the 2nd type

[0336] The second type first MAC CE provided in this embodiment of the present application includes one bitmap. It can be understood that the definition of the one bitmap included in the second type first MAC CE is the same as the definition of the one bitmap included in the first type first MAC CE. For contents not described in detail here, please refer to the definition of the one bitmap included in the first type first MAC CE.

[0337] Optionally, one bit in the bitmap corresponds to one or more octets. The first MAC CE further includes a fourth field, which indicates the number of octets that correspond to one bit.

[0338] A cell corresponding to one bit can be understood as a multi-TRP cell in which a beam failure occurs. The specific number of octets corresponding to one bit is equal to the number of TRPs in which a beam failure occurs among the multi-TRP cell corresponding to the one bit, or the number of TRPs in which a beam failure occurs among the multi-TRP cell corresponding to the one bit. detectionThe bitmap is equal to the number of resource groups. Specifically, when only one TRP in a multi-TRP cell corresponding to one bit has a beam failure, one bit corresponds to only one octet, in other words, the first MAC CE of the second type includes only one octet corresponding to one bit. For example, there are a total of two TRPs in the multi-TRP cell. When only one of the two TRPs has a beam failure, the bit corresponding to the multi-TRP cell in the bitmap corresponds to only one octet, and the octet corresponds to the TRP where the beam failure occurs or corresponds to the beam failure detection resource group where the beam failure is detected. In this case, the first MAC CE of the second type includes only one octet corresponding to one bit. When only multiple TRPs in a multi-TRP cell corresponding to one bit have a beam failure, one bit corresponds to only multiple octets, in other words, the bitmap includes multiple octets corresponding to one bit. For example, there are a total of two TRPs in the multi-TRP cell. When two TRPs are beam-failed, the bit corresponding to the multi-TRP cell in the bitmap corresponds to two octets, which correspond to the two TRPs where beam failure occurs or to the two beam failure detection resource groups where beam failure is detected in the multi-TRP cell. In this case, the first MAC CE of the second type includes two octets corresponding to the bit. Optionally, the fourth field can also be understood as indicating the number of TRPs where beam failure occurs in the multi-TRP cell, or the fourth field can also be understood as indicating the number of beam failure detection resource groups where beam failure occurs in the multi-TRP cell. For example, it can be defined as follows: the fourth field set to 0 indicates that a single TRP in the multi-TRP cell is beam-failed, and the fourth field set to 1 indicates that multiple TRPs in the multi-TRP cell are beam-failed.Alternatively, it may be defined as follows: a fourth field set to 1 indicates that a beam failure has occurred at a single TRP in a multi-TRP cell, and a fourth field set to 0 indicates that a beam failure has occurred at multiple TRPs in a multi-TRP cell.

[0339] In a second type of first MAC CE provided in this embodiment of the present application, the first MAC CE includes one or more octets corresponding to any bit in a bitmap included in the first MAC CE only if the cell corresponding to the any bit is a multi-TRP cell in which a beam failure has occurred, and the beam failure detection resource group corresponding to the one or more octets is a beam failure detection resource group in which a beam failure has occurred.

[0340] Optionally, the fourth field may be a field in the first octet of one or more octets corresponding to a cell, and the fourth field may be a field in the first octet of one or more octets corresponding to a cell, and the fourth field may be a field in the first octet of the first octet of the cell. Corresponding to The fourth field indicates whether the first MAC CE carries beam fault recovery information or includes the second octet according to the cell. The fourth field may be located at the first or second bit in the first octet. In this case, the length of the fourth field is 1 bit. Optionally, the length of the fourth field may alternatively be more bits. For example, the length of the fourth field may alternatively be 2 bits. In this case, the fourth field may use the first two bits of the octet of the fourth field.

[0341] Optionally, the first octet of the one or more octets further includes a fifth field, and the fifth field includes information about the TRP where a beam failure occurs. For example, the information about the TRP where a beam failure occurs includes, but is not limited to, an index of the TRP where a beam failure occurs, or an index of a beam failure detection resource group where a beam failure is detected. The index of the TRP, the index of the beam failure detection resource group corresponding to the TRP, the index of the candidate beam resource group corresponding to the TRP, and the index of the CORESET group are equivalent, that is, the meanings indicated by these descriptions are consistent.

[0342] Furthermore, when the fourth field indicates that only one octet exists, the fifth field may be specified to indicate information about a TRP where a beam failure occurs, or information about a beam failure detection resource group where a beam failure is detected. When the fourth field indicates that M octets exist, the value of the fifth field may be null, that is, there is no specific information, and the terminal device may ignore the fifth field. In this case, the M octets are in one-to-one correspondence with the M beam failure detection resource groups, the M octets are in one-to-one correspondence with the M candidate beam resource groups, the M octets are in one-to-one correspondence with the M TRPs, or the M octets are in one-to-one correspondence with the M CORESET groups. For specific correspondence, please refer to the format of the first MAC CE of the first type.

[0343] The length of the fifth field may be 1 bit, or the length of the fifth field may be more bits, which is not specifically limited here. For example, the length of the fifth field may alternatively be 2 bits. In this case, the fifth field may use the first 2 bits of the octet of the fifth field.

[0344] Optionally, each of the one or more octets further includes a seventh field, and the seventh field indicates whether there is a candidate beam or a candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to each octet. Alternatively, the seventh field indicates whether there is information about a candidate beam resource in each octet. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the seventh field may alternatively indicate whether there is a candidate beam resource that satisfies the quality requirement in the TRP corresponding to each octet. The length of the seventh field may be 1 bit, and the seventh field may be located at the first bit, the second bit, or the third bit in the corresponding octet. For example, when any bit corresponds to multiple octets, the seventh field in the first octet of the multiple octets may be located at the third bit of the first octet, the seventh field in the second octet of the multiple octets may also be located at the third bit of the second octet, or the seventh field of the second octet may be located at the first bit or the second bit of the second octet. In this case, the seventh field uses one bit. Optionally, the length of the seventh field may alternatively be more bits. This is not specifically limited here.

[0345] Optionally, each of the one or more octets further includes an eighth field. Furthermore, this embodiment of the present application further provides two definition methods of the eighth field. The following specifically describes the two definition methods of the eighth field. In the first definition method, the eighth field indicates information about a candidate beam or a candidate beam resource determined in a candidate beam resource group corresponding to each octet and satisfying a quality requirement. In this embodiment of the present application, the candidate beam resource group and the TRP can be equivalent to each other. In other words, the eighth field may alternatively indicate information about a candidate beam resource in a TRP corresponding to each octet that satisfies a quality requirement. 8 The length of the field may be 6 or 5 bits.8 When the field length is 6 bits, 8 Specifically, the field may be the last 6 bits of the octet of the field. For example, 8 When the field length is 5 bits, 8 The field may specifically be the last 5 bits of the octet of the field. Optionally, the length of the 8th field may alternatively be other values. This is not specifically limited here.

[0346] In the second definition method, the value of the eighth field may include a plurality of field values. One of the plurality of field values ​​indicates that there is no candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to each octet, and each of the remaining field values ​​of the plurality of field values ​​different from the one field value indicates information about the candidate beam resource that satisfies the quality requirement. Optionally, some of the remaining field values ​​may not indicate information about the candidate beam resource that satisfies the quality requirement, that is, not all of the remaining field values ​​indicate information about the candidate beam resource that satisfies the quality requirement. For example, the length of the eighth field is 6 bits, and the field value 000000 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field value (e.g., 111100) indicates information about a specific candidate beam resource that satisfies the quality requirement. Alternatively, the field value 111111 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field value (e.g., 111000) indicates information about a specific candidate beam resource that satisfies the quality requirement. In other words, the remaining 63 field values ​​may individually indicate one of the 63 candidate beam resources. The candidate beam resource group configured by the network device for the terminal device may be specified to include up to 63 candidate beam resources. Alternatively, the two candidate beam resource groups configured by the network device for the terminal device are specified to include up to 63 candidate beam resources in total. As another example, the length of the eighth field is 5 bits, and the field value 00000 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. Alternatively, the field value 11111 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. In other words, the remaining 31 field values ​​may individually indicate one of the 31 candidate beam resources.The candidate beam resource group configured by the network device for the terminal device may be specified to include up to 31 candidate beam resources. Alternatively, the two candidate beam resource groups configured by the network device for the terminal device are specified to include up to 31 candidate beam resources in total. As another example, the length of the eighth field is 7 bits, and the field value 0000000 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. Alternatively, the field value 1111111 indicates that there is no candidate beam resource that satisfies the quality requirement, and the remaining field values ​​indicate information about a specific candidate beam resource that satisfies the quality requirement. In other words, the remaining 127 field values ​​may individually indicate one of the 127 candidate beam resources. The candidate beam resource group configured by the network device for the terminal device may be specified to include up to 127 candidate beam resources. Alternatively, the two candidate beam resource groups configured by the network device for the terminal device are specified to include up to 127 candidate beam resources in total.

[0347] Each of one or more octets corresponding to one bit may include only one of the aforementioned fields. Specifically, each of one or more octets corresponding to one bit may include only one fourth field. Each of one or more octets corresponding to one bit may include only one fifth field. Each of one or more octets corresponding to one bit may include only one seventh field. Each of one or more octets corresponding to one bit may include only one eighth field (e.g., the eighth field in the first definition method or the eighth field in the second definition method).

[0348] Optionally, each of one or more octets corresponding to one bit may include a plurality of fields among the above-mentioned fields. For example, each of one or more octets corresponding to one bit may include one fourth field and one fifth field. For example, each of one or more octets corresponding to one bit may include one fourth field, one fifth field, one seventh field, and one eighth field (for example, the eighth field in the first definition method or the eighth field in the second definition method). When the seventh field indicates that the TRP corresponding to the octet of the seventh field does not have a candidate beam resource that satisfies the quality requirement, the value of the eighth field is null.

[0349] The above description, with reference to the text, describes in detail the format of the second type first MAC CE provided in this embodiment of the present application. The following describes the format of the second type first MAC CE with reference to Figures 8 and 9.

[0350] For example, a schematic diagram of the format of the second type first MAC CE provided in this embodiment of the present application is described by using an example in which a network device configures eight cells for one terminal device, and configures M (M is an integer greater than 1) beam failure detection resource groups and M candidate beam resource groups for each cell. All eight cells can be understood as multi-TRP cells.

[0351] As shown in FIG. 8, the second type first MAC CE provided in this embodiment of the present application includes one bitmap (one bitmap includes 8 bits (i.e., 8 fields, where each field uses 1 bit), and the 8 bits are represented as C0, C1, C2, C3, C4, C5, C6, and C7, respectively, and have one-to-one correspondence with the 8 cells) and any bit C i (i is an integer between 0 and 7, inclusive) and one or more octets corresponding to any bit C iThe cell corresponding to is a multi-TRP cell with a beam disturbance. i The number of octets corresponding to any bit C i This is equal to the number of TRPs in the multi-TRP cell that corresponds to the beam failure.

[0352] As shown in FIG. 8(a), any bit C i If the number of TRPs with beam failure in the multi-TRP cell corresponding to is 1, any bit C i corresponds to one octet, which may include an E field (i.e., an example of the fourth field), a T field (i.e., an example of the fifth field), an AC1 field (i.e., an example of the seventh field), and a candidate RS ID1 field (i.e., an example of the eighth field). The E field may include any bit C i The AC1 field indicates that a beam failure occurs in only one TRP in a multi-TRP cell corresponding to the one octet. The T field indicates information about one TRP in which a beam failure occurs (e.g., an index of the TRP). The AC1 field indicates that a candidate beam or a candidate beam resource that satisfies a quality requirement exists in a candidate beam resource group corresponding to the one octet. The Candidate RS ID1 field indicates information about a candidate beam or a candidate beam resource that is determined in a candidate beam resource group corresponding to the one octet and satisfies a quality requirement. Optionally, an octet may alternatively include an E field (i.e., an example of the fourth field), a T field (i.e., an example of the fifth field), and an AC1 field (i.e., an example of the seventh field). In this case, the AC1 field indicates that a candidate beam or a candidate beam resource that satisfies a quality requirement does not exist in a candidate beam resource group corresponding to the one octet. In this case, the value of the Candidate RS ID1 field corresponding to the one octet may also be understood to be null.

[0353] As shown in FIG. 8(b), any bit C iIf the number of TRPs in which beam failure occurs among the multi-TRP cells corresponding to the TRPs is M (M is an integer greater than 1), then any bit C i corresponds to M octets, where the first octet in the M octets may include an E field (i.e., an example of the fourth field), a T field (i.e., an example of the fifth field), an AC1 field (i.e., an example of the seventh field), and a candidate RS ID1 field (i.e., an example of the eighth field). The E field may include any bit C i It indicates that beam failure has occurred in all multi-TRP cells corresponding to one octet, and the value of the T field is null. The AC1 field indicates that a candidate beam or candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to one octet. The Candidate RS ID1 field indicates information about a candidate beam or candidate beam resource that is determined in the candidate beam resource group corresponding to one octet and satisfies the quality requirement. Each of the M octets excluding the first octet may include an R field, an AC field, and a candidate RS ID field. The second octet in the M octets is used as an example. The second octet may include an R field, an AC2 field, and a candidate RS ID2 field. The R field is a reserved field and has no specific meaning. The AC2 field is SecondThe first octet indicates that a candidate beam or candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the first octet. The Candidate RS ID2 field indicates information about a candidate beam or candidate beam resource that is determined in the candidate beam resource group corresponding to the second octet and satisfies the quality requirement. Optionally, the second octet may alternatively include an R field and an AC2 field. The R field is a reserved field and has no specific meaning. The AC2 field indicates that there is no candidate beam or candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the second octet. In this case, the second octet also includes a Candidate RS ID2 field, but it can also be understood that the value of the Candidate RS ID2 field is null.

[0354] Optionally, the E field shown in FIG. 8(b) may alternatively include an optional bit C i 8, the number of bits used for the above fields may be other values. This is not particularly limited here. Optionally, the number of bits used for the same field (e.g., AC field) may be different in different octets included in the MAC CE in FIG. 8. In FIG. 8, the E field, T field, AC field, and R field each use 1 bit, and the candidate RS ID field uses 5 bits. In some other implementations, the number of bits used for the above fields may alternatively be other values. This is not particularly limited here. Optionally, the number of bits used for the same field (e.g., AC field) may be different in different octets included in the MAC CE in FIG. 8.

[0355] The following uses the format of the second type first MAC CE shown in FIG. 8 as an example for explanation.

[0356] For example, a network device configures three cells for one terminal device: cell 0, cell 1, and cell 2. Cell 0 is a cell configured with three beam failure detection resource groups and three candidate beam resource groups, cell 1 is a cell configured with two beam failure detection resource groups and two candidate beam resource groups, and cell 2 is a cell configured with two beam failure detection resource groups and two candidate beam resource groups. Cell 0 corresponds to the first bit C0 in the bitmap included in the first MAC CE, cell 1 corresponds to the second bit C1 in the bitmap included in the first MAC CE, and cell 2 corresponds to the third bit C2 in the bitmap included in the first MAC CE.

[0357] The terminal device detects that beam failure has occurred in all three beam failure detection resource groups (beam failure detection resource group #1, beam failure detection resource group #2, and beam failure detection resource group #3) configured in cell 0, and among the three candidate beam resource groups, only the candidate beam resource corresponding to beam failure detection resource group #2 and the candidate beam resource corresponding to beam failure detection resource group #3 exist. The beam failure detection resource group #1 corresponds to the first octet of the three octets corresponding to the first bit C0, the beam failure detection resource group #2 corresponds to the second octet of the three octets corresponding to the first bit C0, and the beam failure detection resource group #3 corresponds to the third octet of the three octets corresponding to the first bit C0. The terminal device detects that beam failure has occurred in one beam failure detection resource group (i.e., beam failure detection resource group #2) of the two beam failure detection resource groups (beam failure detection resource group #1 and beam failure detection resource group #2) configured in cell 1, 2In one candidate beam resource group, there are only candidate beam resources corresponding to beam fault detection resource group #1 and candidate beam resources corresponding to beam fault detection resource group #3. 2 corresponds to one octet corresponding to the second bit C1. The terminal device detects that no beam failure occurs in the two beam failure detection resource groups configured for the cell. Therefore, the first MAC CE does not include an octet corresponding to the third bit C2.

[0358] In one example, it is defined as follows: A bit in the bitmap corresponding to a multi-TRP cell has a value of 1. cell indicates that a beam obstruction has occurred, and multi-TRP cell A bit in the bitmap that corresponds to a multi-TRP cell It is defined as follows: the value of the fifth field in the first octet of the multiple octets corresponding to one bit is 1, which indicates that beam failure occurs in multiple beam failure detection resource groups among the multiple beam failure detection resource groups corresponding to the first octet, and the value of the fifth field in the first octet of the multiple octets corresponding to one bit is 0, which indicates that beam failure occurs in only one of the multiple beam failure detection resource groups corresponding to the first octet. In this case, please refer to FIG. 9 for the specific contents of the three octets corresponding to the first bit C0 and the two octets corresponding to the second bit C1. The E field is an example of the fourth field, the AC1 field, the AC2 field, or the AC3 field is an example of the seventh field, and the candidate RS ID1 field or the candidate RS ID2 field is an example of the eighth field.

[0359] In Fig. 8 and Fig. 9, it is explained by using an example that "one bit in the bitmap included in the second type first MAC CE corresponds to one field, and one field corresponds to one cell". Optionally, in some implementations, the second type first MAC CE in Fig. 8 and Fig. 9 may include multiple fields, each of the multiple fields corresponds to one cell, and each field uses multiple bits (two bits or more than two bits). In this case, the multiple fields may be regarded as one whole bitmap, and one "bit" in one bitmap is equal to one "field", and the field includes multiple bits. Fig. 8 and Fig. 9 are only examples and do not constitute any limitation on the format of the second type first MAC CE provided in this embodiment of the present application. All formats of the first MAC CE obtained based on the definition of the format of the second type first MAC CE provided in this embodiment of the present application belong to the format of the MAC CE claimed in this embodiment of the present application.

[0360] 3rd type 1MAC CE format

[0361] The third type first MAC CE provided in this embodiment of the present application includes one bitmap. It can be understood that the definition of the one bitmap included in the third type first MAC CE is the same as the definition of the one bitmap included in the first type first MAC CE. For contents not described in detail here, please refer to the definition of the one bitmap included in the first type first MAC CE.

[0362] Optionally, any bit in the bitmap corresponds to one or more octets.

[0363] The first MAC CE further includes one fourth field, which indicates the number of octets corresponding to any bit.

[0364] Optionally, the fourth field is a field in the first octet of the one or more octets, and the fourth field indicates whether the octet following the first octet carries beam failure recovery information of the cell. The fourth field may be located in the first or second bit in the first octet. For specific characteristics of the fourth field, please refer to the format of the first MAC CE of the second type.

[0365] Optionally, each of the one or more octets further includes a sixth field, and the sixth field indicates a beam fault detection resource group corresponding to each octet, or a candidate beam resource group corresponding to each octet. The length of the sixth field may be 1 bit, or the length of the sixth field may be more bits. This is not specifically limited here.

[0366] Optionally, each of the one or more octets further includes a seventh field, and the seventh field indicates whether a candidate beam or a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to each octet. For specific characteristics of the seventh field, please refer to the format of the first MAC CE of the second type.

[0367] Optionally, each of the one or more octets further includes an eighth field, which indicates information about a candidate beam or a candidate beam resource that is determined within the candidate beam resource group corresponding to each octet and satisfies a quality requirement. For specific characteristics of the eighth field, please refer to the format of the first MAC CE of the second type.

[0368] Each of one or more octets corresponding to a bit may include only one of the aforementioned fields. Specifically, each of one or more octets corresponding to a bit may include only one fourth field. Each of one or more octets corresponding to a bit may include only one sixth field. Each of one or more octets corresponding to a bit may include only one seventh field. Each of one or more octets corresponding to a bit may include only one eighth field.

[0369] Optionally, each of one or more octets corresponding to one bit may include a plurality of fields among the above-mentioned fields. For example, each of one or more octets corresponding to one bit may include one fourth field and one sixth field. For example, each of one or more octets corresponding to one bit may include one fourth field, one sixth field, one seventh field, and one eighth field (i.e., the eighth field in the first definition method). When the seventh field indicates that the TRP corresponding to the octet of the seventh field does not have a candidate beam resource that satisfies the quality requirement, the value of the eighth field is null.

[0370] It should be understood that the specific definitions of the fourth, seventh, and eighth fields in each octet in the format of the first MAC CE of the third type are the same as those of the fourth, seventh, and eighth fields in each octet in the format of the first MAC CE of the second type. For specific contents not described here, please refer to the above description regarding the format of the first MAC CE of the second type.

[0371] The above description, with reference to the text, describes in detail the format of the third type first MAC CE provided in this embodiment of the present application. The following describes the format of the third type first MAC CE with reference to Figures 10 and 11.

[0372] For example, a schematic diagram of the format of the third type first MAC CE provided in this embodiment of the present application is described by using an example in which a network device configures eight cells for one terminal device, and configures M (M is an integer greater than 1) beam failure detection resource groups and M candidate beam resource groups for each cell. The eight cells can be understood as multi-TRP cells.

[0373] As shown in FIG. 10, the third type first MAC CE provided in this embodiment of the present application includes one bitmap (one bitmap includes eight bits (i.e., eight fields, where each field uses one bit), and the eight bits are represented as C0, C1, C2, C3, C4, C5, C6, and C7, respectively, and have one-to-one correspondence with the eight cells) and any bit C i (i is an integer between 0 and 7, inclusive) and one or more octets corresponding to any bit C i The cell corresponding to is a multi-TRP cell with a beam disturbance. i The number of octets corresponding to any bit C i This is equal to the number of TRPs in the multi-TRP cell that corresponds to the beam failure.

[0374] As shown in FIG. 10(a), any bit C i If the number of TRPs with beam failure in the multi-TRP cell corresponding to is 1, any bit C i corresponds to one octet, which may include an E field (i.e., an example of the fourth field), a T1 field (i.e., an example of the sixth field), an AC1 field (i.e., an example of the seventh field), and a candidate RS ID1 field (i.e., an example of the eighth field). The E field may include any bit C iThe T1 field indicates that a beam failure has occurred in only one TRP in a multi-TRP cell corresponding to the one octet. The T1 field indicates a beam failure detection resource group corresponding to the one octet, or the T1 field indicates a candidate beam resource group corresponding to the one octet. The AC1 field indicates that a candidate beam or candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the one octet. The Candidate RS ID1 field indicates information about a candidate beam or candidate beam resource that is determined in the candidate beam resource group corresponding to the one octet and satisfies the quality requirement. Optionally, the one octet may alternatively include an E field (i.e., an example of the fourth field), a T1 field (i.e., an example of the first field), or a B field (i.e., an example of the second field). 6 The 7th field may include a candidate beam resource group corresponding to the one octet, an AC1 field (i.e., an example of the 7th field), and an AC2 field (i.e., an example of the 7th field). In this case, the AC2 field indicates that there is no candidate beam or candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the one octet. In this case, the value of the candidate RS ID1 field corresponding to the one octet may also be understood to be null.

[0375] As shown in FIG. 10(b), any bit C i If the number of TRPs in which beam failure occurs among the multi-TRP cells corresponding to the TRPs is M (M is an integer greater than 1), then any bit C i corresponds to M octets, where the first octet in the M octets may include an E field (i.e., an example of the fourth field), a T1 field (i.e., an example of the sixth field), an AC1 field (i.e., an example of the seventh field), and a candidate RS ID1 field (i.e., an example of the eighth field). The E field may include any bit C i indicates that only one TRP in a multi-TRP cell corresponding to the T1 field has a beam failure. first or the T1 field indicates the beam fault detection resource group corresponding to the octet of first The AC1 field indicates the candidate beam resource group corresponding to the octet in first This indicates that there is a candidate beam or candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the octet in the Candidate RS ID1 field. first The M octets indicate information about a candidate beam or a candidate beam resource that is determined within a candidate beam resource group corresponding to the octet of the first octet and satisfies a quality requirement. Each of the M octets except the first octet may include an R field, a T field, an AC field, and a candidate RS ID field. The second octet in the M octets is used as an example. The second octet may include an R field, a T2 field, an AC2 field, and a candidate RS ID2 field. The R field is a reserved field and has no specific meaning. The T2 field is Second or the T2 field indicates a beam fault detection resource group corresponding to the octet of Second The AC2 field indicates the candidate beam resource group corresponding to the octet in Second This indicates that there is a candidate beam or candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the octet in the Candidate RS ID2 field. Second The first octet indicates information about the candidate beam or candidate beam resource that satisfies the quality requirement determined within the candidate beam resource group corresponding to the second octet. To Alternatively, the 128-bit ... Second or the T2 field indicates a beam fault detection resource group corresponding to the octet of Second The AC2 field indicates the candidate beam resource group corresponding to the octet in Second indicates that there is no candidate beam or candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the octet of the second octet. In this case, the second octet also includes a candidate RS ID2 field, but the value of the candidate RS ID2 field can also be understood to be null.

[0376] Optionally, the E field shown in FIG. 10(b) may alternatively include an optional bit C i 10, the E field, T field, AC field, and R field each use 1 bit, and the candidate RS ID field uses 5 bits. In some other implementations, the number of bits used for the aforementioned fields may alternatively be other values. This is not particularly limited here. Optionally, the number of bits used for the same field (e.g., AC field) may be different in different octets included in the MAC CE in FIG. 10. The following uses the format of the third type first MAC CE shown in FIG. 10 as an example for explanation.

[0377] For example, a network device configures three cells for one terminal device: cell 0, cell 1, and cell 2. Cell 0 is a cell configured with three beam failure detection resource groups and three candidate beam resource groups, cell 1 is a cell configured with two beam failure detection resource groups and two candidate beam resource groups, and cell 2 is a cell configured with two beam failure detection resource groups and two candidate beam resource groups. Cell 0 corresponds to the first bit C0 in the bitmap included in the first MAC CE, cell 1 corresponds to the second bit C1 in the bitmap included in the first MAC CE, and cell 2 corresponds to the third bit C2 in the bitmap included in the first MAC CE.

[0378] The terminal device detects that beam failure has occurred in all three beam failure detection resource groups (beam failure detection resource group #1, beam failure detection resource group #2, and beam failure detection resource group #3) configured in cell 0, and among the three candidate beam resource groups, only the candidate beam resource corresponding to beam failure detection resource group #2 and the candidate beam resource corresponding to beam failure detection resource group #3 exist. The beam failure detection resource group #1 corresponds to the first octet of the three octets corresponding to the first bit C0, the beam failure detection resource group #2 corresponds to the second octet of the three octets corresponding to the first bit C0, and the beam failure detection resource group #3 corresponds to the third octet of the three octets corresponding to the first bit C0. The terminal device detects that beam failure has occurred in one beam failure detection resource group (i.e., beam failure detection resource group #2) of the two beam failure detection resource groups (beam failure detection resource group #1 and beam failure detection resource group #2) configured in cell 1, 2 In one candidate beam resource group, there are only candidate beam resources corresponding to beam fault detection resource group #1 and candidate beam resources corresponding to beam fault detection resource group #3. 2 corresponds to one octet corresponding to the second bit C1. The terminal device detects that no beam failure occurs in the two beam failure detection resource groups configured for the cell. Therefore, the first MAC CE does not include an octet corresponding to the third bit C2.

[0379] In one example, it is defined as follows: A bit in the bitmap corresponding to a multi-TRP cell has a value of 1. cell indicates that a beam obstruction has occurred, and multi-TRP cell A bit in the bitmap that corresponds to a multi-TRP cellIt is defined as follows: the value of the fifth field in the first octet of the multiple octets corresponding to one bit is 1, which indicates that beam failure occurs in multiple beam failure detection resource groups among the multiple beam failure detection resource groups corresponding to the first octet, and the value of the fifth field in the first octet of the multiple octets corresponding to one bit is 0, which indicates that beam failure occurs in only one of the multiple beam failure detection resource groups corresponding to the first octet. In this case, please refer to FIG. 11 for the specific contents of the three octets corresponding to the first bit C0 and the two octets corresponding to the second bit C1. The E field is an example of the fourth field, and the T1 field, the T2 field, or the T3 field is an example of the fourth field. 6 The AC1 field, AC2 field, or AC3 field is an example of the seventh field, and the candidate RS ID1 field or the candidate RS ID2 field is an example of the eighth field. The candidate RS ID1 field of the first octet of the three octets corresponding to the first bit C0 is reserved. In other words, the AC1 field of the first octet of the three octets corresponding to the first bit C0 indicates that there is no candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to the octet of the field.

[0380] In Fig. 10 and Fig. 11, it is explained by using an example that "one bit in the bitmap included in the third type first MAC CE corresponds to one field, and one field corresponds to one cell". Optionally, in some implementations, the third type first MAC CE in Fig. 10 and Fig. 11 may include multiple fields, each of the multiple fields corresponds to one cell, and each field uses multiple bits (two bits or more than two bits). In this case, the multiple fields may be regarded as one whole bitmap, and one "bit" in one bitmap is equal to one "field", and the field includes multiple bits. Fig. 10 and Fig. 11 are only examples and do not constitute any limitation on the format of the third type first MAC CE provided in this embodiment of the present application. All formats of the first MAC CE obtained based on the definition of the format of the third type first MAC CE provided in this embodiment of the present application belong to the format of the MAC CE claimed in this embodiment of the present application.

[0381] The above description describes in detail the format of the first MAC CE of the first type, the format of the first MAC CE of the second type, and the format of the first MAC CE of the third type. Furthermore, the above description is given by using an example that "one bit in the bitmap included in the first MAC CE corresponds to one field, and one field corresponds to one cell (e.g., a multi-TRP cell or a single-TRP cell)".

[0382] Based on the format of the second type first MAC CE and the format of the third type first MAC CE, in the following, for the sake of explanation, it is assumed that "a plurality of bits in a bitmap included in the first MAC CE corresponds to one field, and a plurality of bitIn the description, the first MAC CE in which "multiple bits in a bitmap included in the first MAC CE correspond to one field, and multiple fields correspond to one cell" is described by using an example in which "multiple bits in a bitmap included in the first MAC CE correspond to one field, and multiple fields correspond to one cell" is simply denoted as a fourth type first MAC CE.

[0383] In implementation, the 4th type 1 MAC C E isThe bit includes one or more fields, each corresponding to one configured cell. The one or more fields may be regarded as one whole bitmap (e.g., a bitmap in the MAC CE format shown in FIG. 6), and multiple bits in the bitmap are used as one field. When a cell corresponding to a field is a single-TRP cell, the value of the field is null, and the terminal device ignores the value of the field and regards the field as a reserved field containing no information. Alternatively, when a cell corresponding to a cell is a single-TRP cell, the value of the field is a first value by default, and the network device cannot set the value of the field to another value, or the terminal device regards the value of the field as the first value regardless of the value of the field set by the network device. The first value indicates that no beam failure occurs in the cell corresponding to the bit. For example, the first value may be 00, 01, 10, or 11. When the number of beam failure detection resource groups or candidate beam resource groups configured for a cell corresponding to a field is 0, the above method may also be used. In other words, the value of the field corresponding to the cell is null or defaults to the first value. Optionally, when the cell corresponding to a field is a multi-TRP cell, the value of the field indicates the number of TRPs where beam failure occurs in the cell, the value of the field indicates the number of beam failure detection resource groups where beam failure is detected among the multiple beam failure detection resource groups of the cell, or the value of the field indicates the number of octets corresponding to the cell in the MAC CE. When a field indicates that the number of TRPs where beam failure occurs in the cell is two, the MAC CE includes two octets used to carry beam failure recovery information of two TRPs or two beam failure detection resource groups of the cell. The first octet corresponds to the first beam failure detection resource group, and the second octet corresponds to the second beam failure detection resource group.When the field indicates that the number of TRPs with beam failure in the cell is 1, the MAC CE includes one octet used to carry beam failure recovery information of the TRPs with beam failure or the beam failure detection resource group. When the field indicates that the number of TRPs with beam failure in the cell is 0, the MAC CE includes one octet used to carry beam failure recovery information of the TRPs with beam failure or the beam failure detection resource group. Corresponding to It does not include octets used to carry beam failure recovery information. For example, a value of 00 in the field indicates that the number of TRPs with beam failure in the cell is 0, the number of beam failure detection resource groups in which beam failure is detected is 0, or the number of octets in the MAC CE corresponding to the cell is 0. A value of 01 in the field indicates that the number of TRPs with beam failure in the cell is 1, the number of beam failure detection resource groups in which beam failure is detected is 1, or the number of octets in the MAC CE corresponding to the cell is 1. A value of 10 in the field indicates that the number of TRPs with beam failure in the cell is 2, the number of beam failure detection resource groups in which beam failure is detected is 2, or the number of octets in the MAC CE corresponding to the cell is 2, etc.

[0384] Optionally, one field may also indicate a beam failure state in a corresponding cell. When the number of beam failure detection resource groups set for a cell corresponding to one field is two, the beam failure state includes: no beam failure occurs in two beam failure detection resource groups, a beam failure occurs in the first beam failure detection resource group, a beam failure occurs in the second beam failure detection resource group, or a beam failure occurs in two beam failure detection resource groups. Optionally, one field may include two bits. The value of one field may be one of 00, 01, 10, and 11, and each value indicates one of the aforementioned four cases. For example, 00 indicates that no beam failure occurs in two beam failure detection resource groups, 01 indicates that a beam failure occurs in the first beam failure detection resource group, 10 indicates that a beam failure occurs in the second beam failure detection resource group, and 11 indicates that a beam failure occurs in two beam failure detection resource groups. As another example, 00 indicates that no beam failure occurs in two beam failure detection resource groups, 10 indicates that a beam failure occurs in the first beam failure detection resource group, 01 indicates that a beam failure occurs in the second beam failure detection resource group, and 11 indicates that a beam failure occurs in two beam failure detection resource groups. Optionally, two bits in one field may also be regarded as two independent one-bit fields. The two one-bits may be two consecutive bits or may be two discontinuous bits. Each one-bit field indicates whether a beam failure occurs in one corresponding beam failure detection resource group. For example, the first bit corresponds to the first beam failure detection resource group, and the second bit corresponds to the second beam failure detection resource group. Alternatively, the first bit corresponds to the second beam failure detection resource group, and the second bit corresponds to the first beam failure detection resource group.A bit value of 0 indicates that no beam failure has occurred in the corresponding beam failure detection resource group, or a bit value of 1 indicates that a beam failure has occurred in the corresponding beam failure detection resource group. Alternatively, a bit value of 0 indicates that a beam failure has occurred in the corresponding beam failure detection resource group, or a bit value of 1 indicates that no beam failure occurs in the corresponding beam failure detection resource group. When the beam failure status indicated by one field is that beam failure occurs in two beam failure detection resource groups, the MAC CE includes two octets used to carry beam failure recovery information of two TRPs or two beam failure detection resource groups of the cell. The first octet corresponds to the first beam failure detection resource group, and the second octet corresponds to the second beam failure detection resource group. When the field indicates that the number of TRPs with beam failure in the cell is 1, for example, when beam failure occurs in the first beam failure detection resource group or beam failure occurs in the second beam failure detection resource group, the MAC CE includes one octet used to carry beam failure recovery information of the TRP or beam failure detection resource group with beam failure. When no beam failure occurs in the two beam failure detection resource groups, the MAC CE includes one octet used to carry beam failure recovery information of the TRP or beam failure detection resource group with beam failure. Corresponding toThe octets used to carry beam failure recovery information are not included. The beam failure recovery information includes indication information indicating whether there are candidate beam resources that satisfy the quality requirements, information on the candidate beam resources that satisfy the quality requirements, etc. In another implementation, the format of the first MAC CE of the fourth type includes one or more fields, each corresponding to one multi-TRP cell. The one or more fields may be regarded as an entire bitmap, and multiple bits in the bitmap are used as one field. The correspondence between each field and each multi-TRP cell may be that the i-th field corresponds to the i-th multi-TRP cell, the multi-TRP cell with the i-th smallest index, or the multi-TRP cell with the i-th largest index. The value of each field indicates the number of TRPs in which beam failure occurs in the corresponding cell, the number of beam failure detection resource groups in which beam failure is detected among multiple beam failure detection resource groups in the corresponding cell, or the number of octets corresponding to the corresponding cell in the MAC CE. For example, a value of 00 in the field indicates that the number of TRPs in which beam failure occurs in the corresponding cell is 0, the number of beam failure detection resource groups in which beam failure is detected is 0, or the number of octets in which the corresponding cell in the MAC CE is 0. A value of 01 in the field indicates that the number of TRPs in which beam failure occurs in the corresponding cell is 1, the number of beam failure detection resource groups in which beam failure is detected is 1, or the number of octets in which the corresponding cell in the MAC CE is 1. A value of 10 in the field indicates that the number of TRPs in which beam failure occurs in the corresponding cell is 2, the number of beam failure detection resource groups in which beam failure is detected is 2, or the number of octets in which the corresponding cell in the MAC CE is 2, etc.

[0385] Optionally, the first MAC CE may further include a fifth field.

[0386] Optionally, the first MAC CE may further include a sixth field.

[0387] Optionally, the first MAC CE further includes a seventh field.

[0388] Optionally, the first MAC CE further includes an eighth field.

[0389] A field occupies multiple (2 or more) bits in the bitmap.

[0390] It may be understood that the first MAC CE of the fourth type may include any one or more of the above-mentioned fields. This is not particularly limited here. For example, the first MAC CE of the fourth type may include only the fifth field. For example, the first MAC CE of the fourth type may include only the seventh field and the eighth field.

[0391] For specific functions of the fifth, sixth, seventh, and eighth fields included in the fourth type of first MAC CE, please refer to the specific functions of the fifth, seventh, and eighth fields included in the second type of first MAC CE, and also refer to the specific functions of the sixth, seventh, and eighth fields included in the third type of first MAC CE. Details will not be described again here.

[0392] The following describes a specific format of the fourth type first MAC CE provided in this embodiment of the present application with reference to FIG.

[0393] For example, the fourth type first MAC CE provided in this embodiment of the present application is described by using an example in which two bits in a bitmap included in the first MAC CE correspond to one field, and a network device configures four cells for one terminal device, and configures M (M is an integer greater than 1) beam failure detection resource groups and M candidate beam resource groups for each cell. The four cells can be understood as a multi-TRP cell.

[0394] As shown in FIG. 12, the fourth type first MAC CE provided in this embodiment of the present application includes four fields (the four fields are respectively represented as C0, C1, C2, and C3, each field occupies two bits, and the four fields are in one-to-one correspondence with four cells), and each field is represented as C i (i is an integer between 0 and 3). The cell corresponding to each field is a multi-TRP cell in which beam failure has occurred. The number of octets corresponding to each field is the same as the number of TRPs in which beam failure has occurred among the multi-TRP cell in which each field is corresponding. The four fields included in the first MAC CE of the fourth type may be regarded as one whole bitmap (e.g., the bitmap included in the MAC CE shown in FIG. 6). As shown in FIG. 12(a), each field C i If the number of TRPs with beam disturbances in the multi-TRP cell corresponding to is 1, then field C icorresponds to one octet, and the one octet may include a T field (i.e., an example of the fifth field), an AC1 field (i.e., an example of the seventh field), and a candidate RS ID1 field (i.e., an example of the eighth field). The T field indicates information about one TRP in which a beam failure occurs (e.g., an index of the TRP). The AC1 field indicates that a candidate beam or a candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the one octet. The candidate RS ID1 field indicates information about a candidate beam or a candidate beam resource that is determined in the candidate beam resource group corresponding to the one octet and satisfies the quality requirement. Optionally, the one octet may alternatively include a T field (i.e., an example of the fifth field) and an AC1 field (i.e., an example of the seventh field). In this case, the AC1 field indicates that a candidate beam or a candidate beam resource that satisfies the quality requirement does not exist in the candidate beam resource group corresponding to the one octet. In this case, the value of the Candidate RS ID1 field corresponding to one octet may also be understood to be null.

[0395] As shown in FIG. 12(b), field C i If the number of TRPs in which beam failure occurs among the multi-TRP cells corresponding to field C is M (M is an integer greater than 1), icorresponds to M octets, and the first octet in the M octets may include a T field (i.e., an example of the fifth field), an AC1 field (i.e., an example of the seventh field), and a candidate RS ID1 field (i.e., an example of the eighth field). The value of the T field is null. In this case, information about the beam failure detection resource group in which the beam failure is detected does not need to be detected by using the T field, but the beam failure detection resource group or the candidate beam resource group corresponding to each octet is determined based on the correspondence between the M octets and the M beam failure detection resource groups or between the M octets and the M candidate beam resource groups. For specific correspondence, please refer to the above description. The AC1 field indicates that a candidate beam or a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to one octet. The candidate RS ID1 field indicates information about a candidate beam or a candidate beam resource that is determined in the candidate beam resource group corresponding to one octet and satisfies a quality requirement. Each of the M octets except the first octet may include an R field, an AC field, and a candidate RS ID field. The second octet in the M octets is used as an example. The second octet may include an R field, an AC2 field, and a candidate RS ID2 field. The R field is a reserved field and has no specific meaning. The AC2 field indicates that a candidate beam or a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to the second octet. The candidate RS ID2 field indicates information about a candidate beam or a candidate beam resource that is determined in the candidate beam resource group corresponding to the second octet and satisfies a quality requirement. Optionally, the second octet may alternatively include an R field and an AC2 field. The R field is a reserved field and has no specific meaning. The AC2 field indicates that a candidate beam or a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to the second octet. SIn this case, the second octet also includes a Candidate RS ID2 field, but the value of the Candidate RS ID2 field may also be understood to be null.

[0396] Optionally, the T field may be located in an octet other than the first octet in the M octets. For example, the T field in the first octet of the M octets may be replaced with the R field in the second octet of the M octets. In this case, the T field is located in the second octet of the M octets. In FIG. 12, an example is described in which the T field, the AC field, and the R field each use one bit, and the candidate RS ID field uses six bits. In some other implementations, the number of bits used for the aforementioned fields may alternatively be other values. This is not particularly limited here. Optionally, the number of bits used for the same field (e.g., the AC field) may be different in different octets included in the MAC CE in FIG. 12.

[0397] The following describes another specific format of the fourth type first MAC CE provided in this embodiment of the present application with reference to FIG.

[0398] For example, the format of the fourth type first MAC CE provided in this embodiment of the present application is described by using an example in which two bits in a bitmap included in the first MAC CE correspond to one field, and a network device configures four cells for one terminal device, and configures M (M is an integer greater than 1) beam failure detection resource groups and M candidate beam resource groups for each cell. The four cells can be understood as a multi-TRP cell.

[0399] As shown in FIG. 13, the fourth type first MAC CE provided in this embodiment of the present application includes four fields (the four fields are represented as C0, C1, C2, and C3, respectively, each field occupies two bits, and the four fields are in one-to-one correspondence with four cells) and an optional field C i (i is an integer between 0 and 3, inclusive) and one or more octets corresponding to the optional field C i The cell corresponding to is a multi-TRP cell with a beam obstruction. i The number of octets corresponding to any field C i The number of TRPs with beam failures in the multi-TRP cell corresponding to the fourth type may be regarded as one whole bitmap (e.g., the bitmap included in the MAC CE shown in FIG. 6).

[0400] As shown in Figure 13, any field C i If the number of TRPs with beam failures in the multi-TRP cell corresponding to icorresponds to M octets, and each of the M octets may include a T field (i.e., an example of the sixth field), an AC field (i.e., an example of the seventh field), and a candidate RS ID field (i.e., an example of the eighth field). The T field indicates a beam failure detection resource group corresponding to the octet of the T field, or the T field indicates a candidate beam resource group corresponding to the octet of the T field. The AC field indicates that a candidate beam or a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to the octet of the AC field. The candidate RS ID field indicates information about a candidate beam or a candidate beam resource that is determined within the candidate beam resource group corresponding to the octet of the candidate RS ID field and satisfies a quality requirement. The first octet of the M octets is used as an example. The first octet may include a T1 field (i.e., an example of the sixth field), an AC1 field, and a candidate RS ID1 field. The second octet of the M octets is used as an example. The second octet may include a T2 field (ie, an example of the sixth field), an AC2 field, and a candidate RS ID2 field.

[0401] Optionally, each of the M octets may alternatively include a T field (i.e., an example of the sixth field) and an AC field (i.e., an example of the seventh field). In this case, the AC field indicates that there is no candidate beam or candidate beam resource in the candidate beam resource group corresponding to the octet of the AC field that satisfies the quality requirement. In this case, the candidate RSI corresponding to the octet of the AC field D F The value of the field may also be understood to be null.

[0402] 12 and 13 are merely examples and do not constitute any limitation on the format of the fourth type first MAC CE provided in this embodiment of the present application. For example, FormatBased on this, it may be described by using the example that "multiple bits in a bitmap included in the first MAC CE of the first type correspond to one field, and multiple fields correspond to one cell (e.g., a multi-TRP cell or a single-TRP cell)."

[0403] 5th type 1MAC CE

[0404] The fifth type first MAC CE provided in this embodiment of the present application includes one bitmap. It can be understood that the definition of the one bitmap included in the fifth type first MAC CE is the same as the definition of the one bitmap included in the first type first MAC CE. For contents not described in detail here, please refer to the definition of the one bitmap included in the first type first MAC CE. Alternatively, the definition of the one bitmap included in the fifth type first MAC CE is the same as the definition of the one bitmap included in the fourth type first MAC CE. For contents not described in detail here, please refer to the definition of the one bitmap included in the fourth type first MAC CE.

[0405] Optionally, any bit in the bitmap corresponds to one or more octets.

[0406] The first MAC CE further includes a tenth field. The tenth field indicates a beam failure type. When M is equal to 2, the beam failure type may include a beam failure occurring in a first beam failure detection resource group of the M beam failure detection resource groups, a beam failure occurring in a second beam failure detection resource group of the M beam failure detection resource groups, a beam failure occurring in two of the M beam failure detection resource groups, etc.

[0407] Optionally, the tenth field may be located in the first octet of the one or more octets.

[0408] Optionally, the tenth field may include two bits. For example, the tenth field may be the first two bits in the first octet. The tenth field may alternatively include more bits (e.g., three bits). This is not specifically limited here.

[0409] In some implementations, when the tenth field includes two bits, each of the two bits corresponds to one of M (M is equal to 2) beam failure detection resource groups, and each bit indicates whether a beam failure occurs in one corresponding beam failure detection resource group. For example, when the tenth field includes two bits (i.e., the tenth field occupies two bits) and two (i.e., M is equal to 2) beam failure detection resource groups are configured for a cell, the value of the tenth field corresponds to four field values: 00, 01, 10, and 11. Each of the four field values ​​may indicate any one of the following: a beam failure occurs in the first beam failure detection resource group, a beam failure occurs in the second beam failure detection resource group, and a beam failure occurs in two beam failure detection resource groups. For example, 01 indicates that a beam failure has occurred in the first beam failure detection resource group, 10 indicates that a beam failure has occurred in the second beam failure detection resource group, and 00 or 11 indicates that a beam failure has occurred in two beam failure detection resource groups. As another example, 10 indicates that a beam failure has occurred in the first beam failure detection resource group, 01 indicates that a beam failure has occurred in the second beam failure detection resource group, and 00 or 11 indicates that a beam failure has occurred in two beam failure detection resource groups. As another example, 00 indicates that a beam failure has occurred in the first beam failure detection resource group, 01 indicates that a beam failure has occurred in the second beam failure detection resource group, and 10 or 11 indicates that a beam failure has occurred in two beam failure detection resource groups. In some other implementations, when the 10th field includes two bits (i.e., the 10th field occupies two bits) and two (i.e., M is equal to 2) beam failure detection resource groups are configured for a cell, the 10th field may also be regarded as two independent 1-bit fields, each of which indicates whether a beam failure occurs in one corresponding beam failure detection resource group.For example, the first bit corresponds to a first beam failure detection resource group and the second bit corresponds to a second beam failure detection resource group. Alternatively, the first bit corresponds to a second beam failure detection resource group and the second bit corresponds to the first beam failure detection resource group. A bit value of 0 indicates that no beam failure has occurred in the corresponding beam failure detection resource group, or a bit value of 1 indicates that a beam failure has occurred in the corresponding beam failure detection resource group. Alternatively, a bit value of 0 indicates that a beam failure has occurred in the corresponding beam failure detection resource group, or a bit value of 1 indicates that no beam failure occurs in the corresponding beam failure detection resource group. In the above technical solution, an example in which the tenth field includes two bits and M is equal to 2 is used for illustration, but does not constitute a limitation on the function of the tenth field provided in this embodiment of the present application. In some implementations, the tenth field may alternatively include more bits, for example, 3 bits.

[0410] Optionally, when the tenth field indicates that beam failure occurs in two of the M beam failure detection resource groups, the arbitrary bit corresponds to two octets. When the tenth field indicates that beam failure occurs in one of the M beam failure detection resource groups, the arbitrary bit corresponds to one octet. In other words, when M is equal to two and the beam failure type indicated by the tenth field is that beam failure occurs in two of the M beam failure detection resource groups, the first MAC CE includes two octets used to carry beam failure recovery information of two TRPs or two beam failure detection resource groups of the cell. The first octet corresponds to the first beam failure detection resource group, and the second octet corresponds to the second beam failure detection resource group. When M is equal to 2 and the beam failure type indicated by the 10th field is that a beam failure occurs in one of the M beam failure detection resource groups, for example, when a beam failure occurs in the first beam failure detection resource group or a beam failure occurs in the second beam failure detection resource group, the first MAC CE includes one octet used to carry beam failure recovery information of the TRP or beam failure detection resource group in which the beam failure occurs. The beam failure recovery information includes indication information indicating whether there is a candidate beam resource that satisfies the quality requirement, information about the candidate beam resource that satisfies the quality requirement, etc.

[0411] Each of any one or more octets further includes a seventh field, which indicates whether a candidate beam or a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to each octet. For specific characteristics of the seventh field, please refer to the format of the first MAC CE of the second type.

[0412] Optionally, each of the one or more octets further includes an eighth field, which indicates information about a candidate beam or a candidate beam resource that is determined within the candidate beam resource group corresponding to each octet and satisfies a quality requirement. For specific characteristics of the eighth field, please refer to the format of the first MAC CE of the second type.

[0413] The above description, with reference to the text, describes in detail the format of the fifth type first MAC CE provided in this embodiment of the present application. The following describes the format of the fifth type first MAC CE with reference to Figures 14 and 15.

[0414] For example, a schematic diagram of the format of the fifth type first MAC CE provided in this embodiment of the present application is described by using an example in which a network device configures eight cells for one terminal device, and configures M (M is an integer greater than 1) beam failure detection resource groups and M candidate beam resource groups for each cell. The eight cells can be understood as multi-TRP cells.

[0415] The following describes a specific format of the fifth type first MAC CE with reference to FIG.

[0416] As shown in FIG. 14(a), the fifth type first MAC CE provided in this embodiment of the present application includes one bitmap (one bitmap includes eight bits (i.e., eight fields, where each field uses one bit), and the eight bits are represented as C0, C1, C2, C3, C4, C5, C6, and C7, respectively, and have one-to-one correspondence with the eight cells) and any bit C i (i is an integer between 0 and 7, inclusive) and one or more octets corresponding to any bit C i The cell corresponding to is a multi-TRP cell with a beam disturbance. i The number of octets corresponding to any bit Ci This is equal to the number of TRPs in the multi-TRP cell that corresponds to the beam failure.

[0417] As shown in FIG. 14(a), any bit C i If the number of TRPs with beam failure in the multi-TRP cell corresponding to is 1, any bit C i corresponds to one octet, and one octet may include an E field (i.e., an example of the 10th field), an AC1 field (i.e., an example of the 7th field), and a candidate RS ID1 field (i.e., an example of the 8th field in the first definition method). The E field may include any bit C i The E field indicates that a beam failure occurs in a first beam failure detection resource group among M beam failure detection resource groups (M is an integer greater than 1, for example, M is equal to 2) in a cell corresponding to the octet. The E field may include two bits, each of which corresponds to one beam failure detection resource group, and one bit of the two bits (for example, the one bit is set to 0) indicates that a beam failure does not occur in the corresponding beam failure detection resource group, and the other bit of the two bits (for example, the one bit is set to 1) indicates that a beam failure occurs in the corresponding beam failure detection resource group. The AC1 field includes one bit, and indicates that a candidate beam or a candidate beam resource that satisfies a quality requirement exists in a candidate beam resource group corresponding to an octet. The Candidate RS ID1 field includes five bits, and indicates information about a candidate beam or a candidate beam resource that is determined in a candidate beam resource group corresponding to an octet and satisfies a quality requirement.

[0418] Optionally, any bit C i The one octet corresponding to may further include a reserved field, and the value of the reserved field is null.

[0419] The first MAC CE of the fifth type shown in FIG. 14(b) includes one bitmap. The definition of the bitmap is the same as the definition of the bitmap included in the first MAC CE of the fifth type shown in FIG. 14(a). The details will not be described again here. As shown in FIG. 14(b), any bit C i If the number of TRPs with beam failures in the multi-TRP cell corresponding to the TRP is M (M is an integer greater than 1, for example, M is equal to 2), any bit C i corresponds to M octets, where the first octet in the M octets may include an E field (i.e., an example of the 10th field), an AC1 field (i.e., an example of the 7th field), and a candidate RS ID1 field (i.e., an example of the 8th field in the first definition method). 。E The field may include M bits, each of the M bits corresponding to one beam failure detection resource group, and each of the M bits indicating that a beam failure has occurred in the corresponding beam failure detection resource group. Each octet following the first octet may include an R field (i.e., a reserved field), an AC field (i.e., an example of the seventh field), and a candidate RS ID field (i.e., an example of the eighth field in the first definition method).

[0420] The following describes another specific format of the fifth type first MAC CE provided in this embodiment of the present application with reference to FIG.

[0421] The definition of one bitmap included in the first MAC CE of the fifth type shown in (a) of Figure 15 and (b) of Figure 15 is the same as the definition of one bitmap included in the first MAC CE of the fifth type shown in (a) of Figure 14. For contents not described in detail, please refer to the above description of the bitmap in (a) of Figure 14.

[0422] As shown in FIG. 15(a), any bit C iIf the number of TRPs with beam failure in the multi-TRP cell corresponding to is 1, any bit C i corresponds to one octet, and one octet may include an E field (i.e., an example of the 10th field) and a candidate RS ID1 field (i.e., an example of the 8th field in the second definition method). The E field may include any bit C i The E field indicates that a beam failure occurs in a first beam failure detection resource group among M beam failure detection resource groups (M is an integer greater than 1, for example, M is equal to 2) in a cell corresponding to the E field. The E field may include two bits, each of which corresponds to one beam failure detection resource group, and one bit of the two bits (for example, the one bit is set to 1) indicates that a beam failure does not occur in the corresponding beam failure detection resource group, and the other bit of the two bits (for example, the one bit is set to 0) indicates that a beam failure occurs in the corresponding beam failure detection resource group. The Candidate RS ID1 field includes six bits, and the Candidate RS ID1 field may indicate that there is no candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to one octet, and may also indicate information about the candidate beam resource that satisfies the quality requirement. In this case, the function of the candidate RS ID1 field includes the function of the AC1 field in the first octet shown in FIG. 14(a) and the function of the candidate RS ID1 field in the first octet shown in FIG. 14(a).

[0423] Optionally, any bit C i The one octet corresponding to may further include a reserved field, and the value of the reserved field is null.

[0424] As shown in FIG. 15(b), any bit C i If the number of TRPs with beam failures in the multi-TRP cell corresponding to the TRP is M (M is an integer greater than 1, for example, M is equal to 2), any bit C icorresponds to M octets. The first octet in the M octets may include an E field (i.e., an example of the 10th field) and a candidate RS ID1 field (i.e., an example of the 8th field in the second definition method). The E field may include any bit C i The E field indicates that beam failure has occurred in M ​​(M is an integer greater than 1, for example, M is equal to 2) beam failure detection resource groups in the cell corresponding to the E field. The E field may include M bits, each of the M bits corresponding to one beam failure detection resource group, and each of the M bits indicates that beam failure has occurred in the corresponding beam failure detection resource group. Each octet following the first octet may include an R field (i.e., a reserved field) and a candidate RS ID field (i.e., an example of the eighth field in the first definition method).

[0425] It can be understood that Figures 14 and 15 are merely examples and do not constitute any limitations on the format of the fifth type first MAC CE provided in this embodiment of the present application. For example, i may occupy more bits. For example, C i Alternatively, C may occupy two bits. For example, i may occupy more bits. For example, C i may alternatively occupy 2 bits.

[0426] The above description describes five types of formats of the first MAC CE provided in this embodiment of the present application. Each type of the first MAC CE is used by the terminal device to report only beam failure recovery information corresponding to a multi-TRP cell. In other words, each type of the first MAC CE provided in this embodiment of the present application is not used by the terminal device to report beam failure recovery information corresponding to a single-TRP cell. Furthermore, it should be understood that the aforementioned five types of formats of the first MAC CE do not constitute any limitation on the format of the first MAC CE provided in this embodiment of the present application. For example, in some implementations, more bits (e.g., three bits) in the bitmap correspond to one field (e.g., a fourth field). Features in the aforementioned five types of formats of the first MAC CE may be combined, and a new MAC CE format generated by the combination also falls within the scope of protection of the present application. For example, one first MAC C E is , A 2-bit field included in the 4th type 1MAC CE, which indicates beam failure information in the cell, and CE and a fifth field of the first MAC CE format. Such a first MAC CE format also falls within the scope of protection of this application.

[0427] In some other implementations, the first MAC CE may further include any one or more of the following fields: field 1, field 2, field 3, field 4, field 5, field 6, and field 8.

[0428] Field 1 indicates the number of TRPs in which beam failure occurs in a multi-TRP cell, or field 1 indicates the number of beam failure detection resource groups in which beam failure occurs in a multi-TRP cell.

[0429] Field 2 indicates a beam failure type of a beam failure in a multi-TRP cell, and the beam failure type may include one or more of the following: beam failure occurring at a single TRP in the multi-TRP cell, beam failure occurring at some TRPs in the multi-TRP cell, or beam failure occurring at all TRPs in the multi-TRP cell. When two beam failure detection resource groups are configured for a multi-TRP cell, the beam failure type may alternatively include one or more of the following: beam failure occurring at the first TRP, beam failure occurring at the second TRP, beam failure occurring at two TRPs, and no beam failure occurring at two TRPs. For example, field 2 includes two bits. Field 2 corresponds to four field values. Each field value corresponds to one of the aforementioned types. The beam failure type may alternatively include one or more of the following: beam failure occurring at the first TRP, beam failure occurring at the second TRP, or beam failure occurring at two TRPs. Field 2 includes two bits and corresponds to four field values. The three field values ​​respectively indicate a beam obstruction occurring at the first TRP, a beam obstruction occurring at the second TRP, and a beam obstruction occurring at two TRPs.

[0430] Field 3 corresponds to one TRP. Field 3 indicates whether a beam failure occurs in the TRP corresponding to field 3. Alternatively, field 3 corresponds to one beam failure detection resource group, and field 3 indicates whether a beam failure is detected in the beam failure detection resource group corresponding to field 3. When one of the above fields indicates that a beam failure does not occur, the remaining fields in the octet of the field may not have a specific meaning, and the terminal device may ignore the remaining fields. Each of the fields may correspond to M TRPs, each of the M beam failure detection resource groups, or each of the M beam failure detection resource groups. Candidate Beam Resource Group There may be M fields 3 corresponding respectively to the M CORESET groups.

[0431] Field 4 indicates information about the TRP where a beam failure occurs, for example, the index of the TRP. The index of the TRP may be the index of one beam failure detection resource group, i.e., the index of the beam failure detection resource group corresponding to the TRP, the index of a candidate beam resource group, i.e., the index of the candidate beam resource group corresponding to the TRP, or the index of one CORESET group, i.e., CORESETPoolIndex. Alternatively, multiple fields in the aforementioned field may be included to indicate multiple TRPs where a beam failure occurs, or the index of the beam failure detection resource group / candidate beam resource group / CORESET group corresponding to the TRP.

[0432] In this embodiment of the present application, the type of information about the TRP where a beam failure occurs is not limited. For example, the information about the TRP where a beam failure occurs may be information about the index of the TRP where a beam failure occurs. The index of the TRP may be the index of one beam failure detection resource group, that is, the index of the beam failure detection resource group corresponding to the TRP. Alternatively, the index of the TRP may be the index of one candidate beam resource group, that is, the index of the candidate beam resource group corresponding to the TRP. Alternatively, the index of the TRP may be the index of one CORESET group, that is, CORESETPoolIndex.

[0433] Optionally, the first MAC CE may further include multiple fields 4. For example, the first MAC CE may include three fields 4. The first field 4 indicates an index of a beam failure detection resource group corresponding to a TRP where a beam failure occurs. The second field 4 indicates an index of a beam failure detection resource group corresponding to a TRP where a beam failure occurs. Candidate Beam Resource Group The third field 4 indicates the index of the CORESET group corresponding to the TRP in which the beam failure occurs.

[0434] Field 5 indicates the number of candidate beam resources reported by the terminal device.

[0435] Field 6 corresponds to one TRP, and field 6 indicates whether there is a candidate beam resource that satisfies the quality requirement in the one TRP corresponding to field 6. Alternatively, field 6 corresponds to one candidate beam resource group, and field 6 indicates whether there is a candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to field 6. Alternatively, one of the aforementioned fields may indicate whether there is a candidate beam resource that satisfies the quality requirement. S When it is indicated that there is no, the remaining fields in the octet of the field have no specific meaning, and the terminal device may ignore the remaining fields. Candidate Beam Resource Group , or there may be M fields 6 corresponding respectively to the M CORESET groups.

[0436] Field 7 indicates information about candidate beam resources. They may correspond to M TRPs, M beam fault detection resource groups, or M Candidate Beam Resource Group There may be M fields 7, each corresponding to a CORESET group or M CORESET groups. One field value of field 7 may be reserved to indicate that there is no candidate beam resource that satisfies the quality requirement. For example, when the values ​​of all bits corresponding to field 7 are all 0 or all 1, it indicates that there is no candidate beam resource that satisfies the quality requirement. The other field values ​​indicate information about one candidate beam resource that satisfies the quality requirement.

[0437] It can be understood that when the first MAC CE includes multiple fields 7, the multiple candidate beam resources indicated by the multiple fields 7 may be understood as resources in multiple candidate beam resource groups. That is, the multiple candidate beam resources are in one-to-one correspondence with the multiple candidate beam resource groups. In this case, the multiple candidate beam resources may be sorted in the first MAC CE in the order (e.g., index order or configuration order) of the candidate beam resource groups corresponding to the multiple candidate beam resources. The information on the candidate beam resource may be, but is not limited to, the index of the candidate beam resource.

[0438] Field 8 indicates the TRP to which one reported candidate beam resource belongs, or field 8 indicates the candidate beam resource group to which one reported candidate beam resource belongs.

[0439] It can be understood that when the terminal device needs to report multiple candidate beam resources, the first MAC CE may include multiple fields 8. The multiple fields 8 indicate the TRPs to which the multiple reported candidate beam resources respectively belong, or the multiple fields 8 indicate the candidate beam resource groups to which the multiple candidate beam resources respectively belong.

[0440] In some cases, when a beam failure occurs in one beam failure detection resource group, the terminal device transmits a first MAC CE, and then a beam failure also occurs in another beam failure detection resource group. Specifically, a beam failure recovery of one TRP is in progress, and a beam failure occurs in another TRP. In this case, the terminal device may use the following methods. Method 1: The terminal device notifies the network device that a beam failure also occurs in another beam failure detection resource group, and transmits another first MAC CE to report information on the candidate beam resources corresponding to the beam failure detection resource group, for example, information on whether a candidate beam resource that satisfies a quality requirement exists and specific information on the candidate beam resources. Method 2: The terminal device may notify the network device that a beam failure occurs in two beam failure detection resource groups, and transmits another first MAC CE to report information on the candidate beam resources corresponding to the two beam failure detection resource groups, for example, information on whether a candidate beam resource that satisfies a quality requirement exists and specific information on the candidate beam resources. Alternatively, it may be specified that the terminal device does not transmit another first MAC CE before the previous beam failure recovery procedure is completed. In other words, the terminal device can transmit another first MAC CE only after receiving a response message of the previous first MAC CE or after receiving a response message in a previous period, for example, a period corresponding to 28 symbols, to inform the network device that beam failure also occurs in other beam failure detection resource groups.

[0441] Optionally, which of the above-mentioned methods 1 and 2 is specifically used by the terminal device may be determined based on a condition. Specifically, when a first condition is satisfied, the method 1 is used; when a second condition is satisfied, the method 2 is used; method is used.

[0442] The first condition may be one or a combination of the following:

[0443] After sending the previous first MAC CE, the terminal device has received a corresponding response message.

[0444] The period from the current time to the time when the response message of the previous first MAC CE is received is less than a certain period, for example, a period corresponding to 28 symbols.

[0445] The second condition may be one or a combination of the following:

[0446] After sending the previous first MAC CE, the terminal device has not received a corresponding response message.

[0447] Optionally, after the terminal device performs step 530, the terminal device may further perform a subsequent step 540 (not shown in FIG. 5).

[0448] When M is equal to 1 and beam failure is detected in M ​​beam failure detection resource groups, the terminal device transmits beam failure recovery information corresponding to the cell by using the second MAC CE. It may be understood that the method described in step 540 may be applied to the communication system shown in FIG. 1. In other words, step 540 may be performed by the network device 110 of FIG. 1 and the terminal device 120a and / or the terminal device 120b of FIG. 1. It may be further specified that the above method is only applicable to SCell. Specifically, when beam failure is detected in a cell in which only a single beam failure detection resource group is configured, if the cell is an SCell, the beam failure recovery information is generated by using the second MAC CE, if the cell is a PCell, the beam failure recovery information is generated by using a random access process, or if the cell is a PSCell, the beam failure recovery information is generated by using the second MAC CE or the beam failure recovery information is generated by using a random access process.

[0449] The following specifically describes the format of the first type second MAC CE provided in this embodiment of the present application.

[0450] Format of the 1st type 2nd MAC CE

[0451] The second MAC CE includes a bitmap. The configuration information of a cell corresponding to any bit in the bitmap includes M beam failure detection resource groups and M candidate beam resource groups, and when M is equal to 1, when the value of any bit is a first value, it indicates that no beam failure occurs in the cell corresponding to the bit, or when the value of any bit is a second value, it indicates that a beam failure occurs in the cell corresponding to the bit. The first value is different from the second value. For example, the first value is 0 and the second value is 1. For example, the first value is 1 and the second value is 0.

[0452] Optionally, when a beam failure occurs in the configuration information of a cell corresponding to the arbitrary bit, the second MAC CE includes one octet corresponding to the arbitrary bit. The one octet includes an AC field and a candidate RS ID field. The AC field indicates whether a candidate beam resource that satisfies a quality requirement exists in the candidate beam resource group corresponding to the one octet. The candidate RS ID field indicates information about a candidate beam resource that is determined in the candidate beam resource group corresponding to the one octet and satisfies the quality requirement.

[0453] Optionally, if the configuration information of a cell corresponding to any bit in one bitmap includes M beam failure detection resource groups and M candidate beam resource groups, where M is an integer greater than 1, the value of the bit is null, and the terminal device ignores the value of the bit and regards the bit as a reserved field containing no information. It may also be understood that the value of the bit is a first value by default, and the network device cannot set the value of the bit to another value, or the terminal device regards the value of the bit as the first value regardless of the value of the bit set by the network device. The first value indicates that no beam failure occurs in the corresponding cell.

[0454] In the above technical solution, the terminal device may report beam failure recovery information corresponding to a single-TRP cell in which a beam failure occurs by using the first type of second MAC CE. In other words, in the above technical solution, the first type of second MAC CE is not used to report beam failure recovery information corresponding to a multi-TRP cell in which a beam failure occurs.

[0455] A first logical channel identifier corresponding to the first MAC CE provided in this embodiment of the present application ( LCID ) It can be understood that the second LCID corresponding to the second MAC CE is different from the second LCID.

[0456] Optionally, the second LCID may be 50 or 51 and the first LCID may be any one of the following logical channel identifiers: 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, or 47.

[0457] The format of the first type of second MAC CE provided in this embodiment of the present application is for a beam corresponding to a single TRP cell where a beam failure is detected. hindrance It should be understood that this is applicable to reporting only recovery information.

[0458] No. 1The format of the second MAC CE of the type is the same as that shown in FIG. 1 It can be understood that the definition of the R field in the format of the second MAC CE of the type is different from the definition of the R field in the format of the MAC CE of FIG. 1 For the format of the second MAC CE of the type, please refer to the format of the MAC CE shown in FIG.

[0459] The above description describes a beam failure recovery reporting method. Specifically, the terminal device reports beam failure recovery information of a multi-TRP cell in which a beam failure occurs by using a first MAC CE, and the terminal device reports beam failure recovery information of a single-TRP cell in which a beam failure occurs by using a first type second MAC CE.

[0460] The following describes another beam failure recovery reporting method. Specifically, the terminal device reports beam failure recovery information of a single TRP cell and a multi-TRP cell in which a beam failure occurs by using a second type of second MAC CE. That is, regardless of whether a beam failure occurs in a single TRP cell or a beam failure multi-TRP cell, the beam failure recovery information is reported by using a second type of second MAC CE.

[0461] The following describes the second type of second MAC CE. The terminal device may report beam failure recovery information of a single TRP cell and a multi-TRP cell in which a beam failure occurs by using the second type of second MAC CE.

[0462] Second type second MAC CE format

[0463] The second type of second MAC CE includes one bitmap. One bit in one bitmap corresponds to one cell. The cell may be a single-TRP cell or a multi-TRP cell. The bit indicates whether a beam failure occurs in the cell. The value of the bit is 0 or 1. For example, it may be defined as follows: a bit value of 1 indicates that a beam failure occurs in the cell, and a bit value of 0 indicates that a beam failure does not occur in the cell. Alternatively, it may be defined as follows: a bit value of 0 indicates that a beam failure occurs in the cell, and a bit value of 1 indicates that a beam failure does not occur in the cell.

[0464] If a beam failure occurs in a cell corresponding to a bit in the bitmap, the second MAC CE contains one octet, which corresponds to the bit, and Corresponding toThe octet includes beam failure recovery information. The octet may further include a field #1. The field #1 is used to report whether a candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the octet of the field #1. The octet may further include a field #2 (i.e., an example of the ninth field). The field #2 is used to report beam failure recovery information corresponding to the cell corresponding to the octet of the field #2. The R field indicates the number of TRPs in which a beam failure occurs. The R field indicates a beam failure type. Alternatively, the field #2 is a reserved field, in other words, the field #2 has no specific meaning. Optionally, the octet may further include a field #3. The field #3 is used to report information about a candidate beam resource that is determined in the candidate beam resource group corresponding to the octet of the field #3 and satisfies the quality requirement. For the sake of simplicity, in the following, for the sake of explanation, the AC field is used to represent one field #1, the R field is used to represent one field #2, and the candidate RS ID field is used to represent one field #3. It can be understood that one field #1, one field #2, and one field #3 may also be defined by other names, which are not particularly limited here.

[0465] The R field of the second MAC CE may be the second bit of the octet of the R field. When the configuration information of a cell corresponding to any bit in a bitmap includes M beam failure detection resource groups and M candidate beam resource groups, where M is an integer greater than 1, the definition of the R field of the second MAC CE may be any one of the following:

[0466] definition 1

[0467] The R field indicates information about the TRP in which a beam failure occurs (e.g., an index of the TRP in which a beam failure occurs), or the R field indicates information about a beam failure detection resource group in which a beam failure is detected, or the R field indicates information about a candidate beam resource group corresponding to the reported candidate beam resource.

[0468] definition 2

[0469] The R field indicates the number of TRPs where beam failure occurs, or the R field indicates the beam failure type, which can be a beam failure occurring at a single TRP in a multi-TRP cell, or a beam failure occurring at some or all TRPs in a multi-TRP cell. For example, it can be defined as follows: R=0 indicates that a beam failure occurs at a single TRP in a multi-TRP cell, and R=1 indicates that a beam failure occurs at some or all TRPs in a multi-TRP cell. For example, it can be defined as follows: R=1 indicates that a beam failure occurs at a single TRP in a multi-TRP cell, and R=0 indicates that a beam failure occurs at some or all TRPs in a multi-TRP cell.

[0470] It can be understood that when the R field is defined in the manner of the above definition 2, the terminal device may determine the TRP to which the candidate beam resource specifically belongs by using the index of the reported candidate beam resource. In this case, the network device needs to configure the candidate beam resource in the candidate beam resource group in the cell in a numbering manner across resource groups (for details, see step 510).

[0471] For example, the format of the second type second MAC CE is shown in FIG. obtainIn FIG. 16(a), the second type second MAC CE includes one bitmap and one octet corresponding to an arbitrary bit in the one bitmap. One bitmap includes eight bits represented as C0, C1, C2, C3, C4, C5, C6, and C7, respectively. The eight bits are in one-to-one correspondence with eight multi-TRP cells configured for one terminal device by a network device. The network device configures M beam failure detection resource groups and M candidate beam resource groups for any one of the eight multi-TRP cells, where M is an integer greater than 1, and the cell corresponding to the arbitrary bit is a multi-TRP cell in which a beam failure occurs. If the candidate beam resource group corresponding to the arbitrary bit's octet has a candidate beam resource that satisfies the quality requirement, the arbitrary bit's octet includes a candidate RS ID field. If the candidate beam resource group corresponding to the arbitrary bit's octet has no candidate beam resource that satisfies the quality requirement, the arbitrary bit's octet does not include a candidate RS ID field.

[0472] For example, when a beam failure occurs in a multi-TRP cell corresponding to the first bit C0 in the aforementioned eight bits, a beam failure occurs in a multi-TRP cell corresponding to the second bit C1 in the aforementioned eight bits, a candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the octet of the first bit C0, and a candidate beam resource that satisfies the quality requirement does not exist in the candidate beam resource group corresponding to the octet of the second bit C1, the format of the second type of second MAC CE becomes the format shown in (b) of Figure 16. When the configuration information of a cell corresponding to any bit in one bitmap includes M beam failure detection resource groups and M candidate beam resource groups, and M is equal to 1, the R field of the second MAC CE may be understood as a reserved field. In this case, the R field is reserved, that is, the R field has no specific meaning.

[0473] In FIG. 16, an example is described in which the AC field and the R field use one bit each, and the candidate RS ID field uses six bits. In some other implementations, the number of bits used for the aforementioned fields may alternatively be other values. This is not particularly limited here. Optionally, the number of bits used for the same field (e.g., the AC field) may be different in different octets included in the MAC CE in FIG. 16. That is, FIG. 16 is merely an example and does not constitute any limitation on the format of the second type second MAC CE provided in this embodiment of the present application. The format of the second type second MAC CE provided in this embodiment of the present application may be used in the case of a beam corresponding to a multi-TRP cell or a single-TRP cell in which a beam failure occurs. hindrance It should be understood that the R field can be applied to reporting recovery information. When a cell corresponding to any bit in one bitmap included in the second MAC CE of the second type is a single-TRP cell, it can be understood that the R field corresponding to the any bit has no specific meaning. When a cell corresponding to any bit in one bitmap included in the second MAC CE of the second type is a multi-TRP cell, the R field corresponding to the any bit indicates beam failure recovery information corresponding to the cell corresponding to the octet of the R field, indicates the number of TRPs where beam failure occurs, or indicates a beam failure type.

[0474] The above description describes two beam obstruction recovery methods.

[0475] Method 1: The terminal device reports beam failure recovery information of a multi-TRP cell in which a beam failure occurs by using any one of the above-mentioned types of a first MAC CE, and reports beam failure recovery information of a single-TRP cell in which a beam failure occurs by using a second MAC CE of the above-mentioned first type.

[0476] Method 2: The terminal device reports beam failure recovery information of a single TRP cell and a multi-TRP cell where a beam failure occurs by using a second MAC CE of a second type.

[0477] The following describes the third beam obstruction recovery reporting method. When a beam failure occurs in a single TRP in a multi-TRP cell, the beam failure recovery information is reported by using any one of the above-mentioned types of the first MAC CE. When a beam failure occurs in all TRPs in a multi-TRP cell or when a beam failure occurs in a single TRP cell, the beam failure recovery information is reported by using a second MAC CE of the second type.

[0478] It may be understood that the format of any type of the first MAC CE and the specific format of any type of the second MAC CE are merely examples and do not constitute any limitation. For example, any type of the first MAC CE or any type of the second MAC CE may further include other fields. Furthermore, it should be understood that all MAC CEs obtained by combining the above-mentioned multiple fields (first field, second field, third field, fourth field, fifth field, sixth field, seventh field, eighth field, and ninth field) based on the correspondence between any bit and an octet in the bitmap included in each MAC CE belong to the format of the MAC CE claimed in this embodiment of the present application.

[0479] In this embodiment of the present application, the terminal device may report a beam failure recovery method corresponding to a multi-TRP cell where a beam failure occurs by using any one of the aforementioned types of the first MAC CE and a second MAC CE of the aforementioned second type, so that beam failure recovery can be performed in the multi-TRP cell in time.Furthermore, the terminal device may report beam failure recovery information corresponding to a single-TRP cell where a beam failure occurs by using any one of the aforementioned types of the second MAC CE, so that beam failure recovery can be performed in the single-TRP cell in time.

[0480] The above description describes in detail the communication system to which the embodiment of the present application is applied with reference to Figs. 1 to 3, and describes in detail the beam failure recovery method provided in the embodiment of the present application with reference to Figs. 5 to 16. The following describes in detail the communication device provided in the embodiment of the present application with reference to Figs. 17 to 19. It should be understood that the description of the device embodiment corresponds to the description of the method embodiment. Therefore, for contents that are not described in detail, please refer to the aforementioned method embodiment. For the sake of brevity, the details will not be described again here.

[0481] The above description merely describes the solutions provided in the embodiments of the present application from the viewpoint of interactions between network elements. It can be understood that, to implement the aforementioned functions, each network element, such as a transmitting end device or a receiving end device, includes a corresponding hardware structure and / or software module for performing each function. Those skilled in the art can easily understand that the units and algorithm steps are implemented by the hardware of the present application or by the hardware and computer in combination with the examples described in the embodiments disclosed herein. softwareIt should be noted that the functions may be implemented by hardware or a combination of hardware and computer software. Whether the functions are implemented by hardware or a combination of hardware and computer software depends on the specific application and design constraints of the technical solution. Those skilled in the art may use different methods to implement the described functions for each specific application, but it should not be considered that the implementation goes beyond the scope of the present application.

[0482] In the embodiment of the present application, the division into functional modules may be performed in the sending end device or the receiving end device based on the above-mentioned method example. For example, each functional module may be obtained through division corresponding to each function, or two or more functions may be integrated into one processing module. The integrated module may be implemented in the form of hardware, or may be implemented in the form of a software functional module. It should be noted that in the embodiment of the present application, the module division is an example and is merely a logical function division. In actual implementation, other division methods may be used. An example in which each functional module is obtained through division based on each corresponding function is used below for explanation.

[0483] FIG. 17 is a schematic block diagram of a communication device 1000 according to an embodiment of the present application. As shown, the communication device 1000 may include a communication unit 1010 and a processing unit 1020. The communication unit 1010 may communicate with the outside, and the processing unit 1020 is configured to process data. The communication unit 1010 may also be referred to as a communication interface or a transceiver unit. The transceiver unit may include a transmitting unit and a receiving unit, which are respectively configured to perform the transmitting step and the receiving step in the method embodiment. The communication interface is configured to input and / or output information. The information includes at least one of data and instructions. Optionally, the communication device may be a chip or a chip system. When the communication device is a chip or a chip system, the communication interface may be an input / output interface, or may be an input / output interface, an interface circuit, an output circuit, an input circuit, a pin, an associated circuit, etc. on the chip or chip system. The processor may alternatively be a processing circuit or a logic circuit. The input and output correspond to the receiving and transmitting, respectively, in the method embodiment.

[0484] In a possible design, the communication device 1000 may perform steps or procedures performed by a terminal device in the aforementioned method embodiments, and may be, for example, a terminal device, or a chip, chip system, or circuit configured in a terminal device. In this case, the communication device 1000 may be referred to as a terminal device. The communication unit 1010 is configured to perform transmission / reception related operations on the terminal device side in the aforementioned method embodiments, and the processing unit 1020 is configured to perform processing related operations of the terminal device in the aforementioned method embodiments.

[0485] In a possible implementation, the communication unit 1010 is configured to receive cell configuration information. The cell configuration information includes M beam fault detection resource groups and M candidate beam resource groups. The M beam fault detection resource groups are in one-to-one correspondence with the M candidate beam resource groups, where M is an integer.

[0486] The processing unit 1020 is configured to determine that a beam failure occurs in at least one of the M beam failure detection resource groups, where M is an integer greater than 1.

[0487] Optionally, the communication unit 1010 includes a first medium access control element: ( MAC CE ) The beam failure recovery information corresponding to the cell is further configured to transmit the beam failure recovery information corresponding to the cell by using the beam failure recovery information corresponding to the cell.

[0488] Optionally, the first MAC CE includes one bitmap.

[0489] When the configuration information of a cell corresponding to any bit in the bitmap includes N beam failure detection resource groups and N candidate beam resource groups, where N is 0 or 1, and the value of the any bit is a first value by default, the first value indicates that no beam failure has occurred in the cell corresponding to the any bit.

[0490] Arbitrarily, any bit in the bitmap corresponds to M octets.

[0491] The M octets are in one-to-one correspondence with the M beam fault detection resource groups.

[0492] The M octets are in one-to-one correspondence with the M candidate beam resource groups.

[0493] The M octets are in one-to-one correspondence with the M transmitting / receiving points TRP.

[0494] Optionally, each of the M octets includes a first field, which indicates whether a beam failure is detected in a beam failure detection resource group corresponding to each octet.

[0495] Optionally, the remaining fields in each octet are reserved if the first field indicates that no beam failure is detected in the beam failure detection resource group corresponding to each octet.

[0496] Optionally, each of the M octets further comprises a second field.

[0497] The second field indicates whether there is a candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to each octet.

[0498] Optionally, each of the M octets further comprises a third field.

[0499] The third field indicates information about candidate beam resources determined within the candidate beam resource group corresponding to each octet and that satisfy the quality requirements.

[0500] Optionally, any bit in the bitmap corresponds to one or more octets.

[0501] Optionally, the first octet of the one or more octets contains a fourth field. A fourth field is a sequence of octets following the first octet. 、 cell Corresponding to The fourth field indicates whether beam fault recovery information is carried or not, or indicates the number of octets corresponding to the optional bit.

[0502] Optionally, the first octet in the one or more octets further comprises a fifth field.

[0503] The fifth field indicates information about the TRP where the beam obstruction occurs.

[0504] Optionally, each of the one or more octets further includes a sixth field, which indicates a beam fault detection resource group corresponding to each octet or a candidate beam resource group corresponding to each octet.

[0505] Optionally, each of the one or more octets further comprises a seventh field.

[0506] The seventh field indicates whether there is a candidate beam or candidate beam resource that satisfies the quality requirement in the candidate beam resource group corresponding to each octet.

[0507] Optionally, each of the one or more octets further comprises an eighth field.

[0508] The eighth field indicates information about candidate beams or candidate beam resources determined within the candidate beam resource group corresponding to each octet and that satisfy the quality requirements.

[0509] Optionally, each of the one or more octets further comprises an eighth field, the value of which comprises a plurality of field values.

[0510] One field value among the multiple field values ​​indicates that there is no candidate beam resource in the candidate beam resource group corresponding to each octet that satisfies the quality requirement, and each field value among the multiple field values ​​that is different from the one field value indicates information about one candidate beam resource that satisfies the quality requirement.

[0511] Optionally, the first MAC CE further includes a tenth field.

[0512] The tenth field indicates a beam fault type. When M is equal to 2, the beam fault type includes a beam fault occurring in a first beam fault detection resource group among the M beam fault detection resource groups, a beam fault occurring in a second beam fault detection resource group among the M beam fault detection resource groups, or a beam fault occurring in two groups among the M beam fault detection resource groups.

[0513] Optionally, the tenth field contains 2 bits.

[0514] Each of the two bits corresponds to one of the M beam fault detection resource groups, and each bit indicates whether a beam fault has occurred in one corresponding beam fault detection resource group.

[0515] Optionally, when the tenth field indicates that beam failure occurs in two of the M beam failure detection resource groups, any bit corresponds to two octets.

[0516] When the 10th field indicates that a beam failure has occurred in one of the M beam failure detection resource groups, any bit corresponds to one octet.

[0517] Optionally, the processing unit 1020 is further configured to determine that M is equal to 1 and beam failure occurs in the M beam failure detection resource groups.

[0518] Optionally, the communication unit 1010 is further configured to transmit beam failure recovery information corresponding to the cell by using a second MAC CE.

[0519] Optionally, the second MAC CE includes one bitmap.

[0520] When the configuration information of a cell corresponding to any bit in the bitmap includes N beam failure detection resource groups and N candidate beam resource groups, where N is an integer greater than 1, and the value of the any bit is a second value by default, the second value indicates that no beam failure has occurred in the cell corresponding to the any bit.

[0521] Optionally, a first logical channel identifier corresponding to the first MAC CE. ( LCID ) is different from the second LCID corresponding to the second MAC CE.

[0522] Optionally, the second LCID is 50 or 51.

[0523] The first LCID is any one of the following logical channel identifiers: 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, or 47.

[0524] FIG. 18 is a schematic block diagram of a communication device 1100 according to an embodiment of the present application. As shown, the communication device 1100 may include a communication unit 1110 and a processing unit 1120. The communication unit 1110 may communicate with the outside, and the processing unit 1120 is configured to process data. The communication unit 1110 may also be referred to as a communication interface or a transceiver unit. The transceiver unit may include a transmitting unit and a receiving unit, which are respectively configured to perform the transmitting step and the receiving step in the method embodiment. The communication interface is configured to input and / or output information. The information includes at least one of data and instructions. Optionally, the communication device may be a chip or a chip system. When the communication device is a chip or a chip system, the communication interface may be an input / output interface, or may be an input / output interface, an interface circuit, an output circuit, an input circuit, a pin, an associated circuit, e...

Claims

1. 1. A beam obstruction recovery method, comprising: receiving configuration information of a first cell by a terminal device, the configuration information of the first cell including two beam fault detection resource groups and two candidate beam resource groups, the two beam fault detection resource groups being in one-to-one correspondence with the two candidate beam resource groups; When a beam failure occurs in one or two of the two beam failure detection resource groups, transmitting, by the terminal device, beam failure recovery information corresponding to the first cell by using a first medium access control control element (MAC CE); having The first MAC CE includes a bitmap, a first bit in the bitmap corresponds to the first cell, and the first bit indicates that a beam failure occurs in the first cell; A first field included in the first MAC CE indicates that the beam failure recovery information corresponding to the first cell is included in one or two octets depending on whether the beam failure is detected in one or both of the two beam failure detection resource groups. method.

2. the one or two octets comprise a second field; The second field indicates information about a beam failure detection resource group in which the beam failure occurs. The method of claim 1.

3. The bitmap includes a plurality of bits, each of the plurality of bits corresponding to a cell, and each of the plurality of bits is used to indicate whether a beam disturbance occurs in a corresponding cell. The method of claim 1.

4. each of the one or two octets further includes a third field; The third field indicates a beam fault detection resource group corresponding to the octet.

4. The method according to any one of claims 1 to 3.

5. each of the one or two octets further includes a fourth field; The fourth field indicates whether a candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the octet; 4. The method according to any one of claims 1 to 3.

6. each of the one or two octets further includes a fifth field; The fifth field indicates information about a candidate beam resource that is in the candidate beam resource group corresponding to the octet and satisfies a quality requirement; 4. The method according to any one of claims 1 to 3.

7. The logical channel identifier corresponding to the first MAC CE is any one of the following logical channel identifiers: 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, or 47.

4. The method according to any one of claims 1 to 3.

8. A receiving unit configured to receive configuration information of a first cell, the configuration information of the first cell including two beam fault detection resource groups and two candidate beam resource groups, the two beam fault detection resource groups being in one-to-one correspondence with the two candidate beam resource groups; a transmitting unit configured to transmit beam failure recovery information corresponding to the first cell by using a first medium access control control element (MAC CE) when a beam failure occurs in one or two of the two beam failure detection resource groups; having The first MAC CE includes a bitmap, a first bit in the bitmap corresponds to the first cell, and the first bit indicates that a beam failure occurs in the first cell; A first field included in the first MAC CE indicates that the beam failure recovery information corresponding to the first cell is included in one or two octets depending on whether the beam failure is detected in one or both of the two beam failure detection resource groups. Terminal device.

9. the one or two octets comprise a second field; The second field indicates information about a beam failure detection resource group in which the beam failure occurs. A terminal device according to claim 8.

10. The bitmap includes a plurality of bits, each of which corresponds to a cell, and each of which is used to indicate whether a beam disturbance occurs in a corresponding cell. A terminal device according to claim 8.

11. each of the one or two octets further includes a third field; The third field indicates a beam fault detection resource group corresponding to the octet. A terminal device according to any one of claims 8 to 10.

12. each of the one or two octets further includes a fourth field; The fourth field indicates whether a candidate beam resource that satisfies the quality requirement exists in the candidate beam resource group corresponding to the octet; A terminal device according to any one of claims 8 to 10.

13. each of the one or two octets further includes a fifth field; The fifth field indicates information about a candidate beam resource that is in the candidate beam resource group corresponding to the octet and satisfies a quality requirement; A terminal device according to any one of claims 8 to 10.

14. The logical channel identifier corresponding to the first MAC CE is any one of the following logical channel identifiers: 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, or 47. A terminal device according to any one of claims 8 to 10.

15. 1. A communication device having at least one processor and a communication interface, The at least one processor is configured to execute a computer program or instructions such that the communication device performs a method according to any one of claims 1 to 7. Communications equipment.

16. the communication device further comprises at least one memory, the at least one memory being coupled to the at least one processor, and the computer program or instructions being stored in the at least one memory; 16. The communication device of claim 15.

17. configured to store computer instructions; The computer instructions, when executed by a processor, cause the processor to perform a method according to any one of claims 1 to 7. A computer-readable storage medium.

18. A chip comprising a processor and an interface and configured to call from a memory a computer program stored in said memory and to execute said computer program to perform the method according to any one of claims 1 to 7.

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