Connector inspection fixture, connector inspection system, and connector inspection method
The connector inspection jig with a simplified design addresses the complexity of existing technologies by using biasing members and position control to accurately detect improperly mated terminal fittings, enhancing defect detection in connectors.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- NEC CORP
- Filing Date
- 2022-03-23
- Publication Date
- 2026-06-02
AI Technical Summary
Existing connector inspection technologies, such as those described in Patent Document 1, require complex switch mechanisms in contact probes, leading to a complicated structure that is not ideal for efficient inspection.
A connector inspection jig with a simpler structure comprising a housing, first and second pins, biasing members, and a joint, along with an inspection device and position control means, allows for continuity testing by aligning terminal portions with terminal fittings and performing multiple continuity tests to detect defects.
The proposed solution enables efficient detection of improperly mated or fixed terminal fittings with a simpler structure, improving inspection accuracy and efficiency by reducing complexity and enhancing defect detection capabilities.
Smart Images

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