Error measuring device and error measuring method
JP7872332B2Active Publication Date: 2026-06-09ANRITSU CORP
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- ANRITSU CORP
- Filing Date
- 2024-11-14
- Publication Date
- 2026-06-09
AI Technical Summary
Benefits of technology
【0017】 本発明は、マトリックススキャン機能実行時の被測定信号の信頼性レベルを表示できる誤り測定装置及び誤り測定方法を提供するものである。
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure 0007872332000006 
Figure 0007872332000007 
Figure 0007872332000008
Abstract
This invention provides an error measurement device and method that can display the reliability level of a measured signal when a matrix scan function is executed. [Solution] The error measurement device displays a matrix scan display screen 40 that displays information related to the matrix scan function. The matrix scan display screen 40 includes a spin box 44 for inputting the measurement time of the signal under test, spin boxes 52a and 52b for inputting the tolerance value of the error rate of the signal under test, and a text box 51 for displaying the reliability level. The error measurement device calculates the reliability level based on the data rate of the signal under test, the tolerance values of the measurement time and error rate input to the matrix scan display screen 40, and the measured number of errors.
Need to check novelty before this filing date? Find Prior Art