Measuring device for x-ray emission spectrochemical analysis

USD1120783SActive Publication Date: 2026-03-31RIGAKU CORP
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2024-11-27
Publication Date
2026-03-31

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Description

[0001] 1.1 : Front perspective view

[0002] 1.2 : Back perspective view

[0003] 1.3 : Front

[0004] 1.4 Back

[0005] 1.5 : Left

[0006] 1.6 : Right

[0007] 1.7 : Top plan view

[0008] 1.8 : Bottom

[0009] 1.9: Reference view showing a translucent part

[0010] Where broken lines are used, they should be defined in the specification as forming no part of the claimed design or as showing the environment in which the article embodying the design is used.

Claims

The ornamental design for a measuring device for x-ray emission spectrochemical analysis as shown and described.

Citation Information

Patent Citations

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  • X-ray spectrometer sample cell having an adjustable secondary x-radiation radiator and taut x-ray transparent window

    US3409769A