Control device of high-frequency radiation device and control method thereof

The control device for high-frequency irradiation devices addresses the issue of abnormal output by using a processor to assess signals and control the device, preventing skin and device damage through timely intervention.

WO2025116429A1PCT designated stage expired Publication Date: 2025-06-05JEISYS MEDICAL INC
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Patent Information

Application Number
PCT/KR2024/018608
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2023-11-27
Filing Date
2024-11-22
Publication Date
2025-06-05

AI Technical Summary

Technical Problem

Conventional high-frequency investigation devices are unable to respond quickly to abnormal high-frequency output, leading to potential skin and device damage.

Method used

A control device for high-frequency irradiation devices that includes a communication unit and a processor. The processor receives signals such as output, reflection, impedance, current, and voltage signals from the device and determines if they satisfy preset conditions. If not, it determines the high-frequency output is abnormal and controls the device to stop or adjust the output accordingly.

Benefits of technology

The solution effectively prevents skin and device damage by quickly identifying abnormal high-frequency output and taking corrective action, thereby ensuring safe operation.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention includes: a communication unit for communicating with a high-frequency radiation device for irradiating the skin with high-frequency waves; and a processor for performing an operation related to control of the high-frequency radiation device. The processor receives at least one signal among an output signal, a reflection signal, an impedance measurement signal, a current measurement signal, and a voltage measurement signal from the high-frequency radiation device through the communication unit, and determines that the high-frequency output of the high-frequency radiation device is abnormal when the signal does not satisfy a preset condition.
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Description

Control device for high-frequency irradiation device and its control method

[0001] The present disclosure relates to a control device for a high-frequency irradiation device and a control method thereof.

[0002] Energy irradiation devices that apply energy to the skin include those that transmit ultrasound to the skin tissue, those that transmit electromagnetic waves to the skin tissue, and those that irradiate laser light to the skin tissue.

[0003] At this time, the method of transmitting electromagnetic waves to skin tissue is to penetrate single or multiple RF (Radio Frequency) electrodes deep into the skin, and use electric energy to remove at least one of damaged collagen and elastic fibers deep into the skin and promote new formation, and improve at least one of skin pigmentation, acne scars, and wrinkles.

[0004] However, conventional high-frequency investigation devices could not respond quickly when the high-frequency output was abnormal.

[0005] Therefore, conventional high-frequency irradiation devices could not prevent damage to the skin in advance, and could not prevent damage to parts in advance.

[0006] The embodiments disclosed in this disclosure can prevent skin damage in advance.

[0007] In addition, the embodiment disclosed in the present disclosure can prevent damage to a high-frequency irradiation device in advance.

[0008] The problems to be solved by the present disclosure are not limited to the problems mentioned above, and other problems not mentioned will be clearly understood by those skilled in the art from the description below.

[0009] According to one aspect of the present disclosure for achieving the above-described technical problem, a control device for a high-frequency irradiation device includes a communication unit for performing communication with a high-frequency irradiation device that irradiates high-frequency to skin; and a processor for performing operations related to the control of the high-frequency irradiation device, wherein the processor receives at least one signal from among an output signal, a reflection signal, an impedance measurement signal, a current measurement signal, and a voltage measurement signal from the high-frequency irradiation device through the communication unit, and when the signal does not satisfy a preset condition, determines that the high-frequency output of the high-frequency irradiation device is in an abnormal state.

[0010] In addition, the processor may be characterized in that, when determining whether the signal does not satisfy the condition, it further receives a signal in which a duty cycle-based power state is measured from the high-frequency irradiation device, and further determines whether the value of the signal in which the power state is measured is outside a preset threshold value, and at least one of the value of the output signal and the value of the reflected signal remains unchanged for a preset time.

[0011] In addition, the processor may be characterized in that it controls the high frequency irradiation unit of the high frequency irradiation device to stop the high frequency output or irradiate with target high frequency energy corresponding to the condition when the signal does not satisfy the condition.

[0012] In addition, the processor may be characterized in that, when determining whether the signal does not satisfy the condition, it determines whether the high frequency is irradiated to the high frequency irradiation area of ​​the skin for a preset time.

[0013] In addition, the processor may be characterized in that it determines whether the signal does not satisfy the condition and whether the high frequency is irradiated while not in contact with the skin.

[0014] In addition, the processor may be characterized in that, when the above abnormal state is present, the processor controls the notification unit to notify that the high-frequency output is in an abnormal state through the notification unit that communicates with the communication unit.

[0015] In addition, a method for controlling a high-frequency irradiation device performed by a control device according to another aspect of the present disclosure may include the steps of: receiving, through a communication unit of the control device, at least one signal among an output signal, a reflection signal, an impedance measurement signal, a current measurement signal, and a voltage measurement signal from the high-frequency irradiation device; determining, by a processor of the control device, whether the signal does not satisfy a preset condition; and determining, by the processor, that the high-frequency output of the high-frequency irradiation device is in an abnormal state when the signal does not satisfy the condition.

[0016] In addition, the step of determining the condition may further include, when determining whether the signal does not satisfy the condition, receiving a signal in which a duty cycle-based power state is measured from the high-frequency irradiation device through the communication unit, and determining, by the processor, whether the value of the signal in which the power state is measured is outside a preset threshold value and whether at least one of the value of the output signal and the value of the reflected signal remains unchanged for a preset period of time.

[0017] In addition, the step of determining the condition may be characterized in that, if the signal does not satisfy the condition, the processor controls the high-frequency irradiation unit of the high-frequency irradiation device to stop the high-frequency output or irradiate with target high-frequency energy corresponding to the condition.

[0018] In addition, the step of determining the condition may be characterized by determining, by the processor, whether the high frequency is irradiated to the high frequency irradiation area of ​​the skin for a period of time exceeding a preset time when determining whether the signal does not satisfy the condition.

[0019] In addition, the step of determining the condition may be characterized by determining, by the processor, whether the signal does not satisfy the condition and whether the high frequency is irradiated while not in contact with the skin.

[0020] In addition, the step of determining the abnormal state may be characterized in that, in the case of the abnormal state, the processor controls the notification unit to notify that the high-frequency output is in an abnormal state through the notification unit that performs communication with the communication unit.

[0021] In addition, a computer program stored in a computer-readable recording medium may be further provided to perform a control method of a high-frequency irradiation device performed by a control device in combination with a computer as hardware.

[0022] In addition, a computer-readable recording medium recording a computer program for executing a method for implementing the present disclosure may be further provided.

[0023] According to the above-described problem solving means of the present disclosure, it provides an effect that can prevent damage to the skin in advance.

[0024] According to the above-described problem solving means of the present disclosure, it provides an effect that can prevent damage to a high-frequency irradiation device in advance.

[0025] The effects of the present disclosure are not limited to the effects mentioned above, and other effects not mentioned will be clearly understood by those skilled in the art from the description below.

[0026] Fig. 1 is a drawing showing a high-frequency investigation control system according to the present disclosure.

[0027] Fig. 2 is a drawing showing an example of the configuration of the high-frequency investigation device of Fig. 1.

[0028] Fig. 3 is a drawing showing an example of the configuration of the control device of Fig. 1.

[0029] Figures 4 to 6 are flowcharts showing a control method of a high-frequency irradiation device according to the present disclosure.

[0030] Figures 7 to 14 are diagrams showing an example of a process for determining abnormal high-frequency output conditions.

[0031] Throughout this disclosure, the same reference numerals denote the same components. This disclosure does not describe all elements of the embodiments, and any content that is common in the technical field to which this disclosure pertains or that overlaps between embodiments is omitted. The terms "part, module, element, block" used in the specification may be implemented in software or hardware, and depending on the embodiments, multiple "parts, modules, elements, blocks" may be implemented as a single component, or a single "part, module, element, block" may include multiple components.

[0032] Throughout the specification, when a part is said to be "connected" to another part, this includes not only direct connection but also indirect connection, and indirect connection includes connection via a wireless communication network.

[0033] Additionally, when a part is said to "include" a component, this does not mean that it excludes other components, but rather that it may include other components, unless otherwise specifically stated.

[0034] Throughout the specification, when we say that an element is "on" another element, this includes not only cases where the element is in contact with the other element, but also cases where another element exists between the two elements.

[0035] The terms first, second, etc. are used to distinguish one component from another, and the components are not limited by the aforementioned terms.

[0036] Singular expressions include plural expressions unless the context clearly indicates otherwise.

[0037] The identification codes for each step are used for convenience of explanation and do not describe the order of each step. Each step may be performed in a different order than specified unless the context clearly indicates a specific order.

[0038] The operating principle and embodiments of the present disclosure are described below with reference to the attached drawings.

[0039] The control device according to the present disclosure herein includes various devices capable of performing computational processing and providing results to a user. For example, the control device according to the present disclosure may include a computer, a server device, and a portable terminal, or may be any one of them.

[0040] Here, the computer may include, for example, at least one of a notebook, desktop, laptop, tablet PC and slate PC equipped with a web browser.

[0041] The server device is a server that processes information by communicating with an external device, and may include at least one of an application server, a computing server, a database server, a file server, a mail server, a proxy server, and a web server.

[0042] A portable terminal is, for example, a wireless communication device that ensures portability and mobility, and may include all kinds of handheld-based wireless communication devices, such as at least one of a PCS (Personal Communication System), GSM (Global System for Mobile communications), PDC (Personal Digital Cellular), PHS (Personal Handyphone System), PDA (Personal Digital Assistant), IMT (International Mobile Telecommunication)-2000, CDMA (Code Division Multiple Access)-2000, W-CDMA (W-Code Division Multiple Access), WiBro (Wireless Broadband Internet) terminal, and a smart phone, and a wearable device, such as at least one of a watch, a ring, a bracelet, an anklet, a necklace, glasses, a contact lens, and a head-mounted device (HMD).

[0043] A control device of a high-frequency irradiation device according to the present disclosure receives at least one signal from the high-frequency irradiation device through a communication unit, among an output signal, a reflection signal, an impedance measurement signal, a current measurement signal, and a voltage measurement signal, and if the signal does not satisfy a preset condition, it can determine that the high-frequency output of the high-frequency irradiation device is in an abnormal state.

[0044] The control device of the high-frequency irradiation device according to the present disclosure can prevent damage to the skin in advance and can prevent damage to the high-frequency irradiation device in advance.

[0045] Below, the control device of the high-frequency investigation device according to the present disclosure will be examined in detail.

[0046] Fig. 1 is a drawing illustrating a high-frequency irradiation control system according to the present disclosure. Fig. 2 is a drawing illustrating an example of the configuration of the high-frequency irradiation device of Fig. 1. Fig. 3 is a drawing illustrating an example of the configuration of the control device of Fig. 1.

[0047] Referring to FIGS. 1 to 3, a high-frequency irradiation control system (1000) may include a high-frequency irradiation device (10) and a control device (100).

[0048] A high-frequency irradiation device (10) can irradiate high-frequency waves to the skin. Here, the high-frequency irradiation device (10) may be a general-purpose electrosurgical device that transmits high-frequency current to the skin, generates heat through skin electrical resistance, and coagulates tissue. In this case, the general-purpose electrosurgical device may be a device used for at least one of incision, hemostasis, and bonding using high-frequency current.

[0049] The control device (100) may include a communication unit (110), a memory (120), a processor (130), and a notification unit (140).

[0050] The communication unit (110) can communicate with the high-frequency investigation device (10). At this time, the communication unit (110) can include at least one of a wired communication module and a wireless communication module.

[0051] The wired communication module may include at least one of a Local Area Network (LAN) module, a Wide Area Network (WAN) module, and a Value Added Network (VAN) module, and may include at least one cable communication module of Universal Serial Bus (USB), High Definition Multimedia Interface (HDMI), Digital Visual Interface (DVI), RS-232 (recommended standard232), power line communication, and plain old telephone service (POTS).

[0052] The wireless communication module may include at least one of GSM (global System for Mobile Communication), CDMA (Code Division Multiple Access), WCDMA (Wideband Code Division Multiple Access), UMTS (universal mobile telecommunications system), TDMA (Time Division Multiple Access), LTE (Long Term Evolution), 4G, 5G, and 6G, in addition to a WiFi module and a Wireless broadband module.

[0053] The memory (120) can store data regarding an algorithm for controlling the operation of components within the device or a program that reproduces the algorithm. The processor (130) can perform the aforementioned operations using the data stored in the memory (120). Here, the memory (120) and the processor (130) may each be implemented as separate chips. Furthermore, the memory (120) and the processor (130) may each be implemented as a single chip.

[0054] The memory (120) can store data supporting various functions of the device, programs for the operation of components within the device, input / output data, and a plurality of application programs (or applications) run on the device, data for the operation of the device, and commands. At least some of these application programs can be downloaded from an external server via wireless communication.

[0055] The memory (120) may include at least one type of storage medium among a flash memory type, a hard disk type, an SSD (Solid State Disk type), an SDD (Silicon Disk Drive type), a multimedia card micro type, a card type memory (e.g., SD or XD memory, etc.), a random access memory (RAM), a static random access memory (SRAM), a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), a programmable read-only memory (PROM), a magnetic memory, a magnetic disk, and an optical disk.

[0056] The memory (120) can store data related to the control of the high-frequency irradiation device (10), and the processor (130) can perform operations related to the control of the high-frequency irradiation device (10).

[0057] The processor (130) can receive at least one signal from the high frequency irradiation device (10) among an output signal, a reflection signal, an impedance measurement signal, a current measurement signal, and a voltage measurement signal through the communication unit (110). Here, if the signal does not satisfy a preset condition, the processor (130) can determine that the high frequency output of the high frequency irradiation device (10) is in an abnormal state.

[0058] At this time, the output signal may be a signal generated and output by the RF generator (hereinafter, RF FORWARD signal). In addition, the reflected signal may be a signal reflected and returned due to a mismatch in the impedance of the RF generator and the skin (hereinafter, RF REFLECTOR signal). In addition, the impedance measurement signal may be a signal in which the impedance of the skin is measured (hereinafter, impedance signal). In addition, the current measurement signal may be a signal in which the current flowing through the skin is measured (hereinafter, current signal). In addition, the voltage measurement signal may be a signal in which the voltage applied to the skin is measured (hereinafter, voltage signal).

[0059] Here, the notification unit (140) can notify that the high frequency output of the high frequency irradiation device (10) is in an abnormal state. For example, the notification unit (140) can notify that the high frequency output of the high frequency irradiation device (10) is in an abnormal state by voice through a speaker, and can notify that the high frequency output of the high frequency irradiation device (10) is in an abnormal state by error message through a display module.

[0060] At this time, the signal can be output from the signal generation unit (12) of the high-frequency investigation device (10). For example, the signal generation unit (12) can be an RF generator, and the RF generator can be a device that converts AC power into high-frequency power.

[0061] Here, the signal generation unit (12) can output at least one signal from among an RF FORWARD signal generated and output by an RF generator, an RF REFLECTOR signal reflected and returned due to a mismatch in impedance between the RF generator and the skin, an impedance signal in which the impedance of the skin is measured, a current signal in which the current flowing through the skin is measured, and a voltage signal in which the voltage applied to the skin is measured.

[0062] At this time, if the impedance of the RF generator and the skin do not match, the RF signal may be reflected from the skin and returned to the RF generator. Here, impedance matching refers to a method of reducing reflections caused by impedance differences between two different connections when connecting an output terminal and an input terminal. For example, the output terminal may be an RF generator, and the input terminal may be at least one of a load resistor and the skin.

[0063] The processor (130) can control the high frequency irradiation unit (11) of the high frequency irradiation device (10) to stop high frequency output when at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition. In addition, the processor (130) can control the high frequency irradiation unit (11) of the high frequency irradiation device (10) to irradiate with target high frequency energy corresponding to a preset condition when at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition.

[0064] At this time, when the processor (130) determines whether at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition, it can determine whether the state is one in which high frequency is irradiated to the high frequency irradiation area of ​​the skin for a preset time. Here, the sensing unit (13) of the high frequency irradiation device (10) may include a high frequency sensor, and the high frequency sensor may sense the high frequency irradiation time of the high frequency irradiation unit (11). At this time, the high frequency irradiation device (10) may transmit the sensed high frequency irradiation time to the control device (100).

[0065] When focusing RF output on a specific area, the skin in that area initially heats up, lowering its impedance. This causes an impedance mismatch, increasing the value of the RF REFLECTOR signal. This, in turn, increases the value of the sixth signal, which is measured based on the duty cycle, for real-time compensation. As time passes and the skin temperature rises to a preset level, the impedance increases rapidly, leading to an abnormal increase in the RF REFLECTOR signal, potentially posing a risk of burns.

[0066] In addition, when the processor (130) determines that at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition, it can determine whether the high frequency is irradiated without contacting the skin. Here, the sensing unit (13) of the high frequency irradiation device (10) can include a contact sensor, and the contact sensor can sense skin contact. At this time, when the high frequency irradiation device (10) does not sense skin contact, it can transmit a skin non-contact signal to the control device (100).

[0067] When high frequency is applied without contacting the skin, current does not flow and the impedance of the skin is considered to be infinite. In this situation, the impedance is not matched, so the value of the RF REFLECTOR signal increases rapidly, and accordingly, the signal generation unit (12) controls the value of POWER DUTY to adjust the output power in order to compensate for the increase in the value of the RF REFLECTOR signal. However, if a high output is generated in a no-load state, it may cause damage to the signal generation unit (12).

[0068] In addition, when the processor (130) determines that at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition, the processor (130) can determine whether the signal generation unit (12) of the high-frequency irradiation device (10) is not outputting a normal operating signal. Here, the sensing unit (13) of the high-frequency irradiation device (10) can include a signal analyzer. At this time, the signal analyzer can sense the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal, and analyze whether the sensed RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal are output as preset normal operating signals. At this time, if the sensed RF FORWARD signal, RF REFLECTOR signal, impedance signal, current signal and voltage signal are not output as preset normal operation signals, the high-frequency investigation device (10) can transmit an abnormal operation signal regarding the status of the signal generation unit (12) to the control device (100).

[0069] Here, if the value of the RF FORWARD signal and the value of the RF REFLECTOR signal do not change even when the value of the POWER DUTY is adjusted by the processor (130), it can be determined that the high-frequency irradiation is not smooth due to damage to the signal generation unit (12).

[0070] Figures 4 to 6 are flowcharts showing a control method of a high-frequency irradiation device according to the present disclosure.

[0071] Referring to FIG. 4, a control method of a high-frequency investigation device may include a receiving step (S410), a judgment step (S420), and a notification step (S430).

[0072] The communication unit (110) can receive a signal that is reflected and returned due to a mismatch in impedance between the RF generator and the skin from the high-frequency irradiation device (10) (S410). Here, the signal can be output from the signal generation unit (12) of the high-frequency irradiation device (10). At this time, the signal generation unit (12) can output at least one signal from among an RF FORWARD signal, an RF REFLECTOR signal, an impedance signal, a current signal, and a voltage signal.

[0073] The processor (130) can determine whether at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition (S420).

[0074] At this time, when the processor (130) determines whether at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition, it can determine whether the state is one in which high frequency is irradiated to the high frequency irradiation area of ​​the skin for a preset time. Here, the sensing unit (13) of the high frequency irradiation device (10) may include a high frequency sensor, and the high frequency sensor may sense the high frequency irradiation time of the high frequency irradiation unit (11). At this time, the high frequency irradiation device (10) may transmit the sensed high frequency irradiation time to the control device (100).

[0075] In addition, when the processor (130) determines that at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition, it can determine whether the high frequency is irradiated without contacting the skin. Here, the sensing unit (13) of the high frequency irradiation device (10) can include a contact sensor, and the contact sensor can sense skin contact. At this time, when the high frequency irradiation device (10) does not sense skin contact, it can transmit a skin non-contact signal to the control device (100).

[0076] In addition, when the processor (130) determines that at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition, the processor (130) can determine whether the signal generation unit (12) of the high-frequency irradiation device (10) is not outputting a normal operating signal. Here, the sensing unit (13) of the high-frequency irradiation device (10) can include a signal analyzer. At this time, the signal analyzer can sense the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal, and analyze whether the sensed RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal are output as preset normal operating signals. At this time, if the sensed RF FORWARD signal, RF REFLECTOR signal, impedance signal, current signal and voltage signal are not output as preset normal operation signals, the high-frequency investigation device (10) can transmit an abnormal operation signal regarding the status of the signal generation unit (12) to the control device (100).

[0077] The processor (130) can control the notification unit (140) to notify that the high frequency output of the high frequency irradiation device (10) is in an abnormal state when at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, and the voltage signal does not satisfy a preset condition (S430). At this time, the notification unit (140) can notify that the high frequency output of the high frequency irradiation device (10) is in an abnormal state.

[0078] Specifically, as illustrated in FIGS. 5 and 6, the communication unit (110) can receive at least one signal among an RF FORWARD signal, an RF REFLECTOR signal, an impedance signal, a current signal, and a voltage signal from the signal generation unit (12) of the high-frequency irradiation device (10) (S511). Here, the processor (130) can adjust the value of the sixth signal of the signal generation unit (12) to reach a preset high-frequency output (S512). At this time, the preset high-frequency output may be a value obtained by subtracting the value of the second signal from the value of the first signal.

[0079] The processor (130) can determine whether the signal generation unit (12) is not outputting a preset normal operation signal (S521). If the signal generation unit (12) is not outputting a preset normal operation signal, the processor (130) can display a first error message through the notification unit (140) because a problem may occur due to damage to the signal generation unit (12) (S531).

[0080] For example, when the processor (130) determines whether the signal generator (12) is not outputting a preset normal operation signal, it can determine whether the value of the POWER DUTY increases and whether there is no change in the value of the RF FORWARD signal and the value of the RF REFLECTOR signal. At this time, the processor (130) can display a first error message indicating an abnormal operation state due to damage to the signal generator (12) through the notification unit (140).

[0081] As another example, as illustrated in FIG. 7, the signal analyzer may analyze at least one of the values ​​of the RF FORWARD signal and the RF REFLECTOR signal corresponding to a state in which the signal generator (12) does not output a preset normal operation signal, and display at least one of the information of the analyzed RF FORWARD signal and the information of the RF REFLECTOR signal. In addition, the processor (130) may further control the notification unit (140) to further display at least one of the information of the analyzed RF FORWARD signal and the information of the RF REFLECTOR signal through the notification unit (140). At this time, the information of the analyzed RF FORWARD signal and the information of the second signal RF REFLECTOR signal may be information with no change in value. The notification unit (140) may protect the signal generator (12) from damage.

[0082] As another example, as illustrated in FIG. 8, the signal analyzer may analyze whether the value of POWER DUTY, which corresponds to a state in which the signal generator (12) does not output a preset normal operation signal, is outside a preset threshold value (TH1), and display change information (PD1) of the analyzed value of POWER DUTY. In addition, the processor (130) may further control the notification unit (140) to further display change information (PD1) of the analyzed value of POWER DUTY through the notification unit (140). The notification unit (140) may protect at least one of skin damage and damage to the signal generator (12).

[0083] The processor (130) can determine whether or not it is in a state of irradiating high frequency without contacting the skin. At this time, if the processor (130) is in a state of irradiating high frequency without contacting the skin, damage to the signal generation unit (12) may occur, so a second error message can be displayed through the notification unit (140) (S532).

[0084] For example, when determining a state of irradiating high frequency without contacting the skin, the processor (130) can determine whether the current value is 0, the voltage is increased, and the impedance is measured as 999. At this time, the processor (130) can display a second error message indicating a state of irradiating high frequency without contacting the skin through the notification unit (140).

[0085] As another example, as illustrated in FIG. 9, the signal analyzer may analyze at least one of voltage and current corresponding to a state of irradiating high frequency without contacting the skin, and display at least one of the analyzed voltage change information (VG) and current change information (IG). In addition, the processor (130) may further control the notification unit (140) to further display at least one of the analyzed voltage change information (VG) and current change information (IG) through the notification unit (140). For example, the processor (130) may display increased voltage change information (VG) through the notification unit (140). The notification unit (140) may protect the signal generation unit (12) from damage.

[0086] As another example, as illustrated in FIG. 10, the signal analyzer may analyze whether the value of the impedance signal corresponding to the state of irradiating high frequency without contacting the skin is outside the preset threshold value (TH2), and display change information (IP1) of the value of the analyzed impedance signal. In addition, the processor (130) may further control the notification unit (140) to further display change information (IP1) of the value of the analyzed impedance signal through the notification unit (140). The notification unit (140) may protect the signal generation unit (12) from damage.

[0087] The processor (130) can determine whether the high frequency is being irradiated to the high frequency irradiation area of ​​the skin for a preset time (S523).

[0088] If the processor (130) is in a state of irradiating high frequency to the high frequency irradiated area of ​​the skin for a preset time, there is a risk of skin damage, so a third error message can be displayed through the notification unit (140) (S533).

[0089] For example, when determining whether a state of irradiating high frequency to a high frequency irradiated area of ​​the skin exceeding a preset time is present, the processor (130) may determine whether at least one of a state of increasing the ratio of the value of an RF FORWARD signal, a state of increasing the ratio of the value of an RF REFLECTOR signal, a state of increasing the value of a POWER DUTY, and a state of increasing the value of an impedance signal is present. At this time, the processor (130) may display a third error message through the notification unit (140) indicating a state of intensively irradiating high frequency to a high frequency irradiated area of ​​the skin exceeding a preset time.

[0090] As another example, as illustrated in FIG. 11, the signal analyzer may analyze at least one of a voltage and a current corresponding to a state of irradiating high frequency to a high frequency irradiated area of ​​the skin for a period of time exceeding a preset period of time, and display at least one of the analyzed voltage change information (VC1, VC2) and current change information (IC1, IC2). In addition, the processor (130) may further control the notification unit (140) to further display at least one of the analyzed voltage change information (VC1, VC2) and current change information (IC1, IC2) through the notification unit (140). In this way, the notification unit (140) may protect at least one of skin damage and damage to the signal generation unit (12).

[0091] As another example, as illustrated in FIG. 12, the signal analyzer may analyze whether at least one of the value of the RF FORWARD signal and the value of the RF REFLECTOR signal corresponding to the state of irradiating high frequency to the high frequency irradiation area of ​​the skin exceeds the preset threshold value (TH3) or whether a sudden slope change occurs, and may display at least one of the change information (RV) of the analyzed RF FORWARD signal value and the change information (LV) of the RF REFLECTOR signal value. In addition, the processor (130) may further control the notification unit (140) to further display at least one of the change information (RV) of the analyzed RF FORWARD signal value and the change information (LV) of the RF REFLECTOR signal value through the notification unit (140). In this way, the notification unit (140) may protect at least one of skin damage and damage to the signal generation unit (12).

[0092] As another example, as illustrated in FIG. 13, the signal analyzer may analyze whether the value of POWER DUTY corresponding to the state of irradiating high frequency to the high frequency irradiated area of ​​the skin exceeds the preset threshold value (TH4) or whether a sudden slope change occurs, and display change information (PD2) of the analyzed value of POWER DUTY. In addition, the processor (130) may further control the notification unit (140) to further display change information (PD2) of the analyzed value of POWER DUTY through the notification unit (140). The notification unit (140) may protect at least one of skin damage and damage to the signal generation unit (12).

[0093] As another example, as illustrated in FIG. 14, the signal analyzer may analyze whether the value of the impedance signal corresponding to the state of irradiating high frequency to the high frequency irradiated area of ​​the skin exceeds the preset threshold value (TH5) or whether a sudden slope change occurs, and display information on the change in the value of the analyzed impedance signal (IP2). In addition, the processor (130) may further control the notification unit (140) to further display information on the change in the value of the analyzed impedance signal (IP2) through the notification unit (140). The notification unit (140) may protect at least one of skin damage and damage to the signal generation unit (12).

[0094] The processor (130) can determine whether to investigate high frequencies for the preset output time (S524). At this time, if the processor (130) investigates high frequencies for the preset output time, the processor (130) can stop high frequency output (S525).

[0095] The control method of the high-frequency investigation device according to the present disclosure may further include a control step (S440).

[0096] The processor (130) can control the high frequency irradiation unit (11) of the high frequency irradiation device (10) to stop high frequency output when at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, the voltage signal, and the POWER DUTY does not satisfy a preset condition (S440).

[0097] In addition, the processor (130) can control the high frequency irradiation unit (11) of the high frequency irradiation device (10) to irradiate with target high frequency energy corresponding to the preset condition when at least one of the RF FORWARD signal, the RF REFLECTOR signal, the impedance signal, the current signal, the voltage signal, and the POWER DUTY does not satisfy the preset condition (S440).

[0098] For example, when the signal generation unit (12) is not outputting a preset normal operation signal, the processor (130) can control the high-frequency irradiation unit (11) of the high-frequency irradiation device (10) to irradiate with the first target high-frequency energy corresponding to the state of not outputting the preset normal operation signal. At this time, the high-frequency irradiation unit (11) can irradiate with the first target high-frequency energy having the first intensity preset in the processor (130).

[0099] For another example, the processor (130) may control the high frequency irradiation unit (11) of the high frequency irradiation device (10) to irradiate with a second target high frequency energy corresponding to the state of irradiating with high frequency without contacting the skin, when the processor (130) is in a state of irradiating with high frequency without contacting the skin. At this time, the high frequency irradiation unit (11) may irradiate with a second target high frequency energy having a second intensity preset in the processor (130).

[0100] As another example, the processor (130) may control the high frequency irradiation unit (11) of the high frequency irradiation device (10) to irradiate a third target high frequency energy corresponding to the state of irradiating high frequency to the high frequency irradiation area of ​​the skin for a period exceeding a preset time, when the processor (130) is in a state of irradiating high frequency to the high frequency irradiation area of ​​the skin for a period exceeding a preset time. At this time, the high frequency irradiation unit (11) may irradiate a third target high frequency energy having a third intensity preset in the processor (130). At this time, the first target high frequency energy having a first intensity, the second target high frequency energy having a second intensity, and the third target high frequency energy having a third intensity may be different from each other.

[0101] Meanwhile, the present disclosure can be applied to at least one of a skin examination device and a human body examination device in addition to a high-frequency irradiation device.

[0102] At least one component may be added or deleted in accordance with the performance of the components illustrated in FIGS. 1 to 3 and FIGS. 7 to 14. Furthermore, it will be readily apparent to those skilled in the art that the relative positions of the components may be altered in accordance with the performance or structure of the system.

[0103] Although FIGS. 4 to 6 describe the sequential execution of multiple steps, this is merely an example of the technical idea of ​​the present embodiment, and a person having ordinary skill in the art to which the present embodiment pertains may modify and change the order described in FIGS. 4 to 6 without departing from the essential characteristics of the present embodiment, or may execute one or more of the multiple steps in parallel, thereby allowing for various modifications and variations. Therefore, FIGS. 4 to 6 are not limited to a chronological order.

[0104] The disclosed embodiments have been described with reference to the attached drawings as described above. Those skilled in the art will understand that the present disclosure can be implemented in forms other than the disclosed embodiments without altering the technical spirit or essential features of the present disclosure. The disclosed embodiments are illustrative and should not be construed as limiting.

Claims

1. A communication unit that performs communication with a high-frequency irradiation device that irradiates high-frequency waves to the skin; and Comprising a processor that performs operations related to controlling the high-frequency investigation device; The above processor, Receive at least one signal among an output signal, a reflection signal, an impedance measurement signal, a current measurement signal and a voltage measurement signal from the high-frequency investigation device through the communication unit, A control device of a high-frequency irradiation device, characterized in that if the above signal does not satisfy a preset condition, it is determined that the high-frequency output of the high-frequency irradiation device is in an abnormal state.

2. In paragraph 1, The above processor, When determining whether the above signal does not satisfy the above condition, Further receiving a signal in which a duty cycle-based power state is measured from the above high-frequency investigation device, A control device for a high-frequency irradiation device, characterized in that it further determines whether the value of the signal measured by the power state exceeds a preset threshold value and whether at least one of the value of the output signal and the value of the reflected signal remains unchanged for a preset period of time.

3. In paragraph 1, The above processor, If the above signal does not satisfy the above conditions, A control device of a high-frequency irradiation device, characterized in that it controls a high-frequency irradiation unit of the high-frequency irradiation device to stop the high-frequency output or to irradiate with target high-frequency energy corresponding to the above conditions.

4. In paragraph 1, The above processor, When determining whether the above signal does not satisfy the above condition, A control device for a high-frequency irradiation device, characterized in that it determines whether the high-frequency irradiation state is exceeded while the high-frequency irradiation area of ​​the skin is being irradiated for a preset period of time.

5. In paragraph 1, The above processor, When determining whether the above signal does not satisfy the above condition, A control device for a high-frequency irradiation device, characterized in that it determines whether the high-frequency irradiation state is in a state where it is not in contact with the skin.

6. In paragraph 1, The above processor, A control device for a high-frequency irradiation device, characterized in that, in the case of the above abnormal state, the notification unit is controlled to notify that the high-frequency output is in an abnormal state through the notification unit that performs communication with the communication unit.

7. A method for controlling a high-frequency irradiation device performed by a control device, A step of receiving at least one signal among an output signal, a reflection signal, an impedance measurement signal, a current measurement signal, and a voltage measurement signal from the high-frequency irradiation device through a communication unit of the control device; A step of determining, by the processor of the control device, whether the signal does not satisfy a preset condition; and A method comprising the step of determining, by the processor, that the high frequency output of the high frequency investigation device is in an abnormal state if the signal does not satisfy the condition.

8. In paragraph 7, The step of judging the above conditions is, When determining whether the above signal does not satisfy the above condition, Through the above communication unit, a signal in which a duty cycle-based power state is measured is further received from the above high-frequency investigation device, A method characterized in that the processor further determines whether the value of the signal measured by the power state exceeds a preset threshold value and whether at least one of the value of the output signal and the value of the reflected signal remains unchanged for a preset time.

9. In paragraph 7, The step of judging the above conditions is, If the above signal does not satisfy the above conditions, A method characterized in that the high frequency irradiation unit of the high frequency irradiation device is controlled to stop the high frequency output or to irradiate with target high frequency energy corresponding to the condition by the processor.

10. In paragraph 7, The step of judging the above conditions is, When determining whether the above signal does not satisfy the above condition, A method characterized in that it is determined by the processor whether the high frequency is irradiated to the high frequency irradiated area of ​​the skin for a preset period of time.

11. In paragraph 7, The step of judging the above conditions is, When determining whether the above signal does not satisfy the above condition, A method characterized in that it is determined by the processor whether the high frequency is irradiated without contacting the skin.

12. In paragraph 7, The steps for judging the above abnormal condition are: A method characterized in that, in the case of the above abnormal state, the notification unit is controlled to notify that the high-frequency output is in an abnormal state through the notification unit that performs communication with the communication unit by the processor.

Citation Information

Patent Citations

  • A radio frequency medical device

    KR1020160128079A

  • Apparatus and method for recognizing character

    KR1020200106110A

  • A Micro-Current Appling Type of a Mask Pack

    KR1020200114253A

  • Connector integrated distributor and cable connecting assembly for preventing loosening

    KR1020210047799A

  • Operating program box for vertical machining center

    KR1020220049168A