Device and method for manufacturing insulating film for semiconductor wafer
By electrospinning and thermally fusing nanofiber clusters on semiconductor wafers in a controlled manner, the method addresses sagging issues, ensuring uniform air gaps and enhanced device performance.
Patent Information
- Application Number
- PCT/KR2025/003292
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-03-22
- Filing Date
- 2025-03-14
- Publication Date
- 2025-09-25
AI Technical Summary
Existing methods for forming air gaps in semiconductor wafers using nanofiber webs face issues such as sagging and uneven shape, leading to reduced efficiency and reliability of semiconductor devices due to conductive films penetrating into circuit patterns.
A method involving electrospinning a polymer solution to form nanofiber clusters on semiconductor wafers, followed by thermal fusion in a soft state, rotating, and then re-fusing in a hard state to create a flat insulating film with maximized air gaps, using a device with a thermal bonding unit and robot arm for precise handling.
The solution prevents sagging and ensures uniform air gaps, improving mechanical strength, process reliability, and reducing power consumption and heat generation in semiconductor devices.