Product defect rate prediction method and system

Abstract

A product defect rate prediction method and system. The product defect rate prediction method comprises: providing a data set, wherein each piece of data in the data set separately corresponds to a design combination, and comprises at least one first-type data field and at least one second-type data field; using the first-type data field of a part of the data set to train a first model, and using the second-type data field to train a second model; inputting the remaining part of the data set into the trained first / second model to obtain a plurality of first prediction results and a plurality of second prediction results; using the plurality of first prediction results and the plurality of second prediction results to train an ensemble prediction model; and inputting new data into the first model and the second model to obtain a new first prediction result and a new second prediction result, and inputting the two prediction results into the ensemble prediction model to obtain a defect rate prediction result of the new data.

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