Photoluminescence measurement system

Abstract

The present invention relates to a photoluminescence measurement system that uses spectral analysis, Fourier transform and high passes filtering techniques, which is not affected by temperature changes, and has a sensor system that compensates for ambient light and instantaneously measures background noise and obtains clear signals by preventing interference signals with low signal-to-noise ratio.

Description

[0001] PHOTOLUMINESCENCE MEASUREMENT SYSTEM

[0002] Technical Field

[0003] The present invention relates to a photoluminescence measurement system that uses spectral analysis, Fourier transform and high passes filtering techniques, which is not affected by temperature changes, and has a sensor system that compensates for ambient light and instantaneously measures background noise and obtains clear signals by preventing interference signals with low signal-to-noise ratio.

[0004] State of the Art

[0005] Photoluminescence (PL) measurement systems have a wide range of applications, especially in areas such as materials science, organic electronics, optoelectronic devices, biosensors and biomedical applications, chemical analysis and environmental science, and fundamental physical research. These systems play a critical role in the characterization of semiconductor materials and nanomaterials, performance analysis of organic light emitting diodes (OLEDs) and organic photovoltaic devices (OPVs), optimizing the efficiency of LEDs and laser diodes, labeling biomolecules and cells, detecting environmental pollutants, and studying the photon emission properties of nanomaterials such as quantum dots.

[0006] Especially in the field of organic electronics, PL measurements are vital for studying the energy levels, carrier recombination processes and defects of organic semiconductors. These systems are an essential tool for developing and optimizing the performance of organic electronic devices.

[0007] Photoluminescence (PL) measurement systems are widely used in the fields of materials science and organic electronics. However, there are some deficiencies and technical problems in existing applications;

[0008] Characterization of Semiconductors and Nanomaterials:

[0009] PL measurement systems are used to determine the band gaps of semiconductor materials, detect defects, and examine material purity. Nanomaterials, quantum dots, graphene and other low-dimensional structures are analyzed using PL to understand their optical properties. However, PL measurements often suffer from low signal-to-noiseratio and limited resolution. Especially in nanomaterials, the inhomogeneity of the emission and the influence of environmental factors (e.g. temperature) during measurements can affect the accuracy of the results.

[0010] Organic Light Emitting Diodes (OLED) and Organic Photovoltaics (OPV):

[0011] It is used to evaluate the efficiency and performance of PL, OLED and OPV devices. Optical characterization is performed to understand emission mechanisms and increase efficiency. However, organic electronic materials may experience problems such as high thermal instability and low efficiency. Additionally, photoluminescence signals of organic materials may weaken due to environmental effects such as photo-oxidation, which may affect the long-term stability of the device.

[0012] Chemical Analysis and Environmental Science:

[0013] PL is used to detect contaminants in water, air and soil samples. Chemical sensors utilize PL measurements in the detection of various compounds. However, the weakness of the PL signal in environmental samples may limit the accuracy of the measurements. Additionally, parasitic signals in complex matrices can make accurate detection of contaminants difficult.

[0014] As a result of the research made in the state of the art, CN118199517A has been found. The application relates to a photoluminescence imaging system comprising a camera, a dual filtering structure, a programmable power supply, a linear array light source, a speed-adjustable conveyor belt, a test computer and a photovoltaic cell panel to be tested. However, the application does not include a system that is unaffected by temperature changes, compensates for ambient light, and instantly measures background noise.

[0015] As a result, due to the abovementioned disadvantages and the insufficiency of the current solutions regarding the subject matter, a development is required to be made in the relevant technical field.

[0016] Object of the Invention

[0017] The invention is inspired by the current situation and aims to solve the above-mentioned drawbacks.The main object of the present invention is to obtain clear signals by preventing parasitic signals with a low signal-to-noise ratio.

[0018] The invention includes an additional sensor that instantly measures background noise. With this sensor, background signals from ambient light sources are measured and their effect on the photoluminescence signal is minimized. This feature helps the system operate independently of environmental conditions and can increase measurement precision.

[0019] In particular, the ability to instantly measure background noise and include this data in the analysis process makes it possible to use the device in bright environments. In this way, the system can perform measurements without having to create a dark environment, providing ease of use in a wider range.

[0020] In addition, this feature provides the device with significant flexibility, especially in field conditions or in situations where it is difficult to create a controlled environment. Thanks to the background light correction with the invention, measurement sensitivity can be increased and the photoluminescence signal coming only from the sample can be obtained more clearly. This enables the device to make reliable and precise measurements even under limited environmental conditions.

[0021] In the invention, the sensor (TCS34725) is used, which minimizes the effects of low signal-to-noise ratio and environmental factors in PL measurements. The sensor has a wide dynamic range and high sensitivity. These features enable it to reliably detect PL signals even in low-light conditions. The sensor comprises an integrated 16-bit analog-to-digital converter (ADC), which makes it possible to obtain clear signals with a low signal-to-noise ratio. The sensor allows accurate results to be obtained even with weakly emissive samples such as nanomaterials. Thanks to its high sensitivity, it minimizes signal loss in PL measurements.

[0022] The TCS34725 sensor comprises an integrated IR-cut filter that blocks infrared (IR) light. This feature reduces the influence of environmental light sources (especially IR components) during measurements, thus avoiding parasitic signals. Additionally, the sensor is sensitive to red, green, blue, and clear light channels, making spectral analysis easier. By minimizing the effects of environmental factors, the sensor provides more reliable and consistent PL measurements. RGB spectral sensitivity allows for precise measurements across a wide wavelength range.The TCS34725 sensor is designed to be unaffected by temperature changes and has the ability to compensate for ambient light. This is particularly important in PL measurements, which are sensitive to temperature changes. Temperature stabilization and ambient light compensation features ensure the sensor delivers stable and repeatable results. This reduces the negative effects of temperature fluctuations that may occur during measurements.

[0023] Various filtering techniques are used in the Python algorithm used in the invention to filter signal noise. For example, low-pass filters, median filters, and adaptive filtering methods remove random noise and small fluctuations in the data set. These filtering techniques increase the clarity of the signal, ensuring accurate data is obtained. Minimizing noise increases the reliability and accuracy of analysis results.

[0024] To detect and remove interference in the invention, the algorithm applies various methods in data analysis. These methods include techniques such as spectral analysis, Fourier transform and high pass filters. These techniques are used to distinguish and clean unwanted signals. Removing noise ensures that only the photoluminescence signal is included in the analysis. This allows the actual signals in PL measurements to be acquired and analyzed more clearly.

[0025] The invention optimizes the analysis of data with advanced data processing techniques. This includes techniques such as statistical methods, regression analysis, and machine learning algorithms. These methods are used to draw accurate and reliable conclusions from data. The use of data processing techniques ensures high accuracy and reliability in the analysis process. This ensures that research results and application data are more precise and valid.

[0026] The structural and characteristic features of the present invention will be understood clearly by the following drawings and the detailed description made with reference to these drawings and therefore the evaluation shall be made by taking these figures and the detailed description into consideration.

[0027] Figures Clarifying the Invention

[0028] Figure 1 is a view of the casing and a light source of the photoluminescence measurement system.Figure 2 is the view of the photoluminescence measurement system of a single light source from different angles.

[0029] Figure 3 is the view showing the location details of sensor-1 of the single light source.

[0030] Figure 4 is the appearance of the photoluminescence measurement system of the dual light source.

[0031] Figure 5 is the view of the photoluminescence measurement system of the dual light source from different angles.

[0032] Part References

[0033] 1. Casing

[0034] 2. Light source

[0035] 3. Tub

[0036] 4. Sensor Housing

[0037] 5. Light source housing

[0038] 6. Sensor-1

[0039] 7. Sensor-2

[0040] 8. Background measurement area

[0041] 9. Electronic component box

[0042] Detailed Description of the Invention

[0043] In this detailed description, the preferred embodiments of the photoluminescence measurement system are described solely for the purpose of a better understanding of the subject matter.

[0044] The present invention is a photoluminescence measurement system, comprising:

[0045] • tub (3) located in the casing (1 ), wherein sample to be measured is placed in the tub (3),

[0046] • light source (2) that provides optical stimulation of the sample by sending a beam along the wavelength to be measured,

[0047] • sensor-1 (6), which comprises an integrated analog-to-digital converter and an infrared cut filter that blocks infrared light, is not affected bytemperature changes and compensates for ambient light, detects the photoluminescence radiation produced by the sample according to its characteristic state, converts the detected signal into electrical signals and sends it for processing,

[0048] • sensor-2 (7), which is located in the background measurement area (8), measures the background noise instantly and transmits the measurement result,

[0049] • processor, which uses spectral analysis, Fourier transform and high-pass filtering techniques through the algorithm run therethrough; processes the data received from sensor-1 (6) and calculates the photoluminescence intensity and color coordinate parameters corresponding to the wavelength of the sample; compares the data received from sensor-2 (7) with the sample from which photoluminescence measurements were taken and processes only the data coming from the sample.

[0050] The casing (1 ) forms the main line of the system which is the subject of the invention and carries the entire load. The light source (2) produces the light used in the system and is positioned in the light source housing (5). Tub (3) is the part where the sample to be measured is placed in the device and held fixedly. Sensor-1 (6) has high sensitivity in the optical visible region to detect the color spectrum correctly and is positioned in the sensor housing (4). Sensor-2 (7) measures the background instantly.

[0051] The casing (1) keeps the entire system stable and protected from environmental conditions. The light source (2) sends light of the required wavelength to the system. Thus, it contributes to PL measurement by optically stimulating the sample. The tub (3) is the part in which the sample is placed and helps to keep the sample stable. The sensor housing (4) is the part where sensor-1 (6) is placed. It contributes to the stable measurement by keeping the sensor-1 (6) fixed. The light source housing (5) is the part in which the light source (2) is placed and ensures that the light source (2) is kept fixed.

[0052] Sensor-1 (6) has a wide dynamic range and high sensitivity. These features enable it to reliably detect PL signals even in low-light conditions. The sensor-1 (6) comprises an integrated 16-bit analog-to-digital converter (ADC), which makes it possible to obtain clear signals with a low signal-to-noise ratio. The sensor allows accurate results to be obtained even with weakly emissive samples such as nanomaterials.The sensor-1 (6) comprises an integrated IR-cut filter that blocks infrared (IR) light. This feature reduces the influence of environmental light sources (especially IR components) during measurements, thus avoiding parasitic signals. Additionally, the sensor is sensitive to red, green, blue, and clear light channels, making spectral analysis easier. The sensor-1 (6) is designed to be unaffected by temperature changes and has the ability to compensate for ambient light.

[0053] The sensor-1 (6) detects the light coming out of the sample. The detected light is converted into electrical signals and analyzed by the Arduino Nano microprocessor programmed with Python. The processor performs the necessary mathematical operations and plots the PL intensity and CIE color coordinates against the wavelength of the sample. Sensor-2 (7) analyses the intensity of the excitation light source (2) before and after it falls on the sample. Thus, the quantum yield of the sample can also be calculated. Sensor-2 (7) also measures the background noise instantly. The signals resulting from the measurement are transmitted to the processor. The processor compares the received data with the sample from which the PL measurement was taken and processes only the data coming from the sample. This allows analysis to be carried out even in a brightly lit environment.

[0054] The algorithm running within the processor uses various filtering techniques. For example, low-pass filters, median filters, and adaptive filtering methods remove random noise and small fluctuations in the data set. Additionally, spectral analysis, Fourier transform and high-pass filtering techniques are used in the processor.

[0055] The operating principle of the invention

[0056] The sample to be measured in PL is placed in the sample tub (3) located in the casing (1). Then the computer program coded in Python is run. Then, the light source (2) is turned on and the wavelength to be used in the measurement is selected. Then, the sample is optically stimulated by sending a beam from the light source (2) onto the sample. The excited material emits photoluminescence according to its characteristic state. Sensor-1 (6) detects this radiation, converts it into electrical signals and sends these signals to the processor for processing. The data processed by the processor is presented to the user in the form of graphical and mathematical outputs. Sensor-2 (7) measures the background noise instantly. The signals resulting from the measurement are transmitted to the processor. The processor compares the received data with thesample from which the PL measurement was taken and processes only the data coming from the sample.

Claims

CLAIMS1. Photoluminescence measurement system, characterized by comprising:• tub (3) located in the casing (1 ), wherein sample to be measured is placed in the tub (3),• light source (2) that provides optical stimulation of the sample by sending a beam along the wavelength to be measured,• sensor-1 (6), which comprises an integrated analog-to-digital converter and an infrared cut filter that blocks infrared light, is not affected by temperature changes and compensates for ambient light, detects the photoluminescence radiation produced by the sample according to its characteristic state, converts the detected signal into electrical signals and sends it for processing,• sensor-2 (7), which is located in the background measurement area (8), measures the background noise instantly and transmits the measurement result,• processor, which uses spectral analysis, Fourier transform and high-pass filtering techniques through the algorithm run therethrough, o processes the data received from sensor-1 (6) and calculates the photoluminescence intensity and color coordinate parameters corresponding to the wavelength of the sample,o compares the data received from sensor-2 (7) with the sample from which photoluminescence measurements were taken and processes only the data coming from the sample.

Images