A 3D silicon cantilever with a graphene mesh boosts piezoresistive sensitivity and continuous signals for micro and nano particle detection.
In-vacuo amorphous ice deposition creates uniform cryo-EM grids, improving particle density, orientation control, and image resolution.
Mass flux calibration turns SP-ICP-MS histograms into fast, accurate nanoparticle sizing and counting, including aggregates and mixed-element particles.
Under-vacuum amorphous ice deposition and gas-phase purification improve particle orientation, density, and cryo-EM image resolution.