Optically Investigating Flaws/Contamination TRIZ Cases

A chromatic confocal sensor array acquires 2D and 3D data simultaneously using wavelength-dependent focal distances.

Segmented illumination adjusts intensity per region to prevent detector saturation while maintaining defect detection sensitivity.

Optical sensing measures reflected light to predict air filter remaining life, replacing fixed schedules with condition-based maintenance.

A separator with distinct optical properties enables detector focusing on the substrate lower surface for curved displays.

Asymmetrical magnification illumination module converts circular beams to elliptical shapes using rotating anamorphic prisms.

A portable deep ultraviolet fluorescence detection system identifies contaminants in seconds.

Optimizing illumination field parameters suppresses particle mirror crosstalk and pattern interference on chrome masks to enhance detection accuracy.

Image processing analyzes unstretched base regions to assess material distribution in stretch-blow-molded plastic containers.

Synchronizes periodic illumination patterns with image recording to detect surface defects during continuous movement.

A rotary inspection system applies angular error correction values to align data acquisition with the wafer surface.

Section-specific evaluation of plastic preform material quality using characteristic values assigned to distinct zones.

A misalignment calibration database stores position data to correct non-spatial camera measurements without precise mechanical alignment.

A hyperspectral imager captures scattered radiation across multiple wavelengths to generate a three-dimensional data cube from a two-dimensional projection.

Mechanochromic material in the ball wall reveals cracks visually, eliminating manual inspection delays during play.

A dual illumination visual inspection device captures top and bottom images of lead frames to isolate resin sealing bodies.

Segmented light sources replace mechanical choppers to resolve the trade-off between measurement precision and sampling speed in high-rate production.

A dark-field confocal microscopy apparatus uses vortex light interference to extract amplitude and phase information from sample surfaces.

Segmenting the light exit surface into distinct sectors allows simultaneous inspection of container sidewalls and closures, reducing device complexity.

An optical detector selects specific rectangular elements to form active zones for precise yarn quality monitoring.

Rotating glass containers capture multiple edge profiles to detect horizontal mold seal defects with high speed.

Collimated light radiation transmits through transparent slabs to identify internal defects via optical scattering.

Automates defect detection in laminated sheets by replacing manual visual inspection with image processing, reducing operation time while maintaining accuracy.

A review method captures multiple images under varying optical conditions to isolate defect scattering signals from background noise.

Correlation-based image alignment overcomes resolution limits to detect sub-wavelength defects without electron beam throughput constraints.

Optical inspection replaces X-ray analysis to determine turbine blade grain orientation through peak reflectance, reducing harmful radiation exposure.

A compact optical fiber connector inspector integrates two-dimensional scanning to align its imaging axis across multi-row endfaces.

Sinusoidal clock signals reduce noise coupling and improve signal accuracy in high-speed semiconductor inspection systems.

Curved calibration zones increase support point density to correct higher-order imaging aberrations in optical measuring devices.

Controller detects lowest point on laser welding mark to screen defective vehicle wheels, reducing inspection time while maintaining quality reliability.

Mirror surfaces redirect timber images to one camera, resolving the trade-off between comprehensive imaging completeness and device complexity.

Processor compares optical modes with detection algorithms to identify optimal combinations based on capture versus nuisance rates.

Multi-angle lighting captures surface images to reconstruct geometry, resolving sensitivity limits for small and wide-angle discontinuities.

Multi-mode LED illumination enables automated detection of scratches and contamination in intraocular lenses, replacing manual optical scope checks.

A defect inspection apparatus separates scattering light into orthogonal directions to enhance detection accuracy.

Load-lock chamber uses UV irradiation and cold traps to evaporate and capture moisture, preventing mask oxidation during EUV inspection.

Image analysis of illuminated lenses identifies inverted units before sterilization, preventing physical distortion and ensuring product reliability.

Controlled polarized and infrared illumination enhances image contrast to resolve shallow dents and scratches that standard surveillance cameras miss.

Multi-angle scattering analysis measures phase and intensity variations to classify small particles, bypassing slow spectroscopic integration times.

Scanning ultrabroadband photoconduction microscopy maps sub-bandgap defect density in semiconductor devices using tunable laser excitation.

Sensor-controlled ultraviolet illuminator directs UV-C and blue-UV radiation to eliminate microorganisms without chemical residues or heat damage.

An extracted external light source directs excitation through a wafer to a photo luminescent layer, eliminating heat buildup and mechanical complexity.

A quality check module uses multi-angle cameras and spectrally-switchable light sources to image specimen containers.

Alternating uniform and patterned illumination detects low-contrast refractive defects without requiring multiple inspection stations.

An optical system uses an offset relay lens axis to illuminate and capture images from recessed angled fiber end faces, reducing contamination risk.

Decomposing detected pupil representations into symmetric and asymmetric components identifies correct parameter values from candidate sets.

An inspection apparatus separates diffracted radiation into portions corresponding to different radiation characteristics and diffraction orders for simultaneous measurement.

Optical sensors measure gear distances to determine stock removal amounts, eliminating clamping errors from mechanical chucks.

A defect inspection device uses linear illumination and a two-dimensional array sensor to detect infinitesimal defects with high precision.

A panorama image dataset combines segment images from multiple viewing angles into a unified record for defect detection.

A composite material optical fiber array detects structural damage by analyzing visible light transmission through embedded grid sensors.