Optically Investigating Flaws/Contamination TRIZ Cases

A two-dimensional polynomial approximation stabilizes autofocus coordinates during semiconductor mask inspection.

A gas outlet nozzle with varying aperture ratios directs high-velocity flow to remove surface contaminants while protecting sensitive structures.

A camera coupled to a movable holding tube captures undercut images, resolving inspection speed versus image quality trade-offs.

Removable inserts in chucks enable combined wafer and photomask inspection, eliminating separate setups and reducing switching damage.

Dynamic light intensity adjustment compensates for dirt accumulation in the fiber optic strap, distinguishing true tampering from environmental degradation.

Software compares reflected and transmitted light images to automatically count fission tracks, eliminating manual labor and increasing throughput.

T-slot coupling joins modular LED arrays end-to-end, eliminating gaps that cause missed defects and staff fatigue in paint inspection.

Motorized gimbal and actuators adjust camera angles to inspect obstructed PCB components without physical handling.

Rotating the template inserter aligns light channels to inspect both PC and APC ruggedized connectors, eliminating separate specialized adapters.

Oblique laser sheet illumination and darkfield imaging identify small inclusions in textured glass while filtering surface noise to reduce false positives.

Multi-wavelength light sources replicate solar spectra to reduce spectral mismatch errors in personal UV exposure monitoring.

A multi-surface optical inspector uses a polarizing beam splitter to separate reflected radiation from transparent samples.

A radiation count controller identifies coincidence events between particle radiation and illumination signals to refine feature detection.

Line sensor scans wafer streets to detect foreign matter near electrodes, preventing short circuits and improving inspection productivity.

A laser-based optical sensing device acquires point cloud data to identify structural abnormalities in inspection targets.

Mobile apparatus projects a grid pattern onto vehicle surfaces and captures reflected images to count and classify dents during continuous movement.

A pinhole detection device measures luminous intensity through unwound separator film using a winder roller unit to maintain tension.

A vehicle optical surface detection system introduces light into the window and measures transmission at the edge to identify contaminants.

A single inspection apparatus merges defect detection and surface metrology using dual illumination bandwidths on one substrate stage.

Multi-point optical sensing detects container sidewall contour variations to resolve measurement precision versus device complexity trade-offs.

An optical scanning system uses Brewster angle illumination to differentiate signals from top and bottom surfaces of transparent samples.

Area camera streams images to dual processing modules for height data.

A measuring system combines transmission and reflection optics to determine tablet quality.

A multiple mode imager alternates optical paths during a single scan to capture diverse image sets.

A measuring light source and detector device determine transmittance of laminated plastic film layers to assess lamination quality.

A correction method approximates measurement values using smooth and subregion functions to reproduce variable progression across parameter ranges.

Diffraction grating and PDI plate enable in-situ wavefront aberration measurement of mounted lenses without separate dedicated equipment.

Oblique incident light generates scattered signals captured by dual sensors, resolving layer-specific defects in OLED manufacturing.

A second harmonic generation measurement device uses a femtosecond laser and nonlinear crystal to convert optical signals for semiconductor analysis.

Switchable window elements control light ingress in biological samples, resolving the contradiction between light protection and observation capability.

Remote temperature sensor captures thermal images to detect gas leaks via environmental temperature changes, replacing costly handheld hyperspectral cameras.

A dark-field confocal microscopy apparatus generates vortex light with different fractional orders to scan samples and collect reflected signals.

Near-infrared illumination reduces ambient light interference and heating to enable real-time corrosion imaging on aircraft aluminum.

Segmented optical members emit light with varying wavelengths and solid angles, enabling uniform irradiation without bulky telecentric systems.

A dual-camera apparatus splits reflected light into orthogonal optical arms to acquire three-dimensional surface data.

Toroidal liquid flow positions particles by density and size within a defined inspection volume.

Interferometer systems extract amplitude and phase maps from wafer intensity frames to detect surface defects.

Segmenting the detector into pixel groups captures polarization data across the entire field in one exposure, resolving sequential recording bottlenecks.

Coordinate reader acquires precise substrate positions via intersecting slide rails, eliminating blind area errors from large magnification.

Optical imaging replaces liquid rinsing to identify particles in drug containers, reducing false positives and unnecessary product discard.

Standard container-sized chambers enable on-site scanning, eliminating the need for dedicated fields and reducing operational time.

Segmenting hair fibers allows comparison of root and tip attributes, quantifying degradation rates for personalized treatment insights.

A lighting system emits infrared flash and visible candling flux to inspect high-temperature glass receptacles.

Optical interferometry measures thin-film material strength limits using diffraction grating sensors and periodic laser modulation.

A mirror array outcouples light from the beam path to establish defined illumination times, normalizing image data against light source energy fluctuations.

A defect inspection device uses vertical and oblique laser illumination with polarization conversion to isolate scattered light from bridge defects.

Fluorescent indicators mark contamination sources, enabling accurate detection of foreign material in black composite plies despite ambient light variations.