Using Wave/Particle Radiation Means TRIZ Cases

Transmission intensity measurements correct diffraction intensities for absorption errors caused by unknown sample thickness and variable composition.

Multi-energy radiation interacts with cargo objects to extract material attributes, resolving single-energy limitations in identifying intermixed materials.

A mechanical manipulator positions testpieces for X-ray examination using calculated rotation and displacement vectors to achieve image congruence.

Reference objects in a calibration tool allow projection transformation matrix calculation to determine the rotation center position of rotating tables.

A dielectric boundary surface estimation device performs three-dimensional synthetic aperture processing on radar wave data to reconstruct subsurface interfaces.

RF sensors transmit beams to road surfaces and analyze reflected Doppler signatures to resolve detection accuracy inconsistencies on rough asphalt.

Regression equation predicts wafer bow from full width at half maximum measurements, preventing ingot waste.

Determines solder thickness by varying absorber layers and fitting constants, eliminating time-consuming lookup tables.

A single calibration plate generates multiple data points for X-ray thickness gauges through positional dose measurement.

Synchronizing capture signals with periodic deformation cycles resolves the inability to observe interior structures during dynamic material stress.

Varying the irradiation angle while keeping the detector fixed minimizes background noise from scattered X-rays to improve measurement precision.

Automated determination of emergency stop effective ranges using 3D models and ray tracing algorithms.

Eight-axis robotic manipulation automates digital radiography, eliminating manual film handling and vault entry for faster aerospace part inspection.

An X-ray inspection device uses characteristic radiation to generate contrast images of foreign matter within lithium-ion battery samples.

Coherent x-ray diffraction determines slit height for nanometer-scale near field sensor positioning, avoiding evanescent mode sensitivity.

A segmented x-ray source and detector assembly moves around a pipeline weld to capture real-time external inspection data.

Monochromatic microwave radiation creates an interference pattern to resolve ambiguity in bulk dielectric material measurements.

Multi-angle X-ray imaging captures layer geometry to resolve measurement precision limits in complex multi-layer structures.

X-ray tomography measures flame structures inside closed chambers by penetrating metal walls, correcting beam hardening to resolve optical access limitations.

Non-contact RF sensors monitor bridge abutment scour changes without mechanical damage from turbulent water.

An X-ray inspection device calculates safe approach distances using preliminary projection images to prevent component collisions during specimen rotation.

An adaptive sliding window adjusts its length based on range and height estimates to eliminate multipath interference errors.

An x-ray imaging system acquires multiple images during tube current ramping to generate a final display.

A cystic applicator scattering foil converts electron beams to X-rays while modulating radiation intensity for uniform dose distribution.

A Compton scattering inspection device emits radiation particles across composite repairs to detect backscattered photons for structural assessment.

A microwave probe detects pipe deposits via reflection measurements, resolving signal damping from discontinuities.

A pipe thickness measuring device uses distinct luminance profiles to detect outer and inner diameter points for radiographic analysis.

Correlating brightness reduction in X-ray images with particle size enables accurate foreign matter detection despite catalyst absorption interference.

A single-crystal substrate bowing measurement method uses variable X-ray flux width to determine curvature radius without moving the specimen.

A thickness measurer uses a Peltier heat pump to stabilize ionizing radiation emission from the source device.

A real-time mark device adjusts classification parameters using auxiliary beam data to maintain substance identification accuracy.

A fixed X-ray source emits radiation over a wide solid angle while an inspection object moves along a planar path.

A directional x-ray source rotates coaxially with a pipeline to maintain constant flux intensity and eliminate inverse square law reduction effects.

Equidistant photodiodes on printed circuit boards create virtual pixels for high precision X-ray detection.