A method, apparatus, device, and medium for monitoring a scintillation detector

Abstract

The application discloses a kind of scintillation detector monitoring method, device, equipment and medium, the method includes: the light-emitting lifetime of original scintillator in scintillation detector is obtained;If light-emitting lifetime is greater than preset light-emitting lifetime threshold, replacement instruction is sent to replace original scintillator with target scintillator, so that the light-emitting lifetime of target scintillator is within preset light-emitting lifetime threshold, wherein the dielectric constant of organic layer in target scintillator is less than the dielectric constant of organic layer in original scintillator.By replacing original scintillator, the target scintillator after replacement has an organic layer with a lower dielectric constant than the original scintillator.By using an organic material with a smaller dielectric constant for the organic layer without changing the inorganic layer, the light-emitting lifetime of the scintillator can be effectively reduced to meet the demand for higher time resolution in the field of radiation detection.This method is simple and effective, and has a significant effect on improving the time resolution in the field of radiation detection.

Description

Technical Field

[0001] This invention relates to the field of optoelectronic technology, and in particular to a monitoring method, apparatus, device, and medium for a scintillation detector. Background Technology

[0002] In the field of radiation detection, high temporal resolution is sometimes required, such as in positron emission tomography (PET) and time-of-flight particle sorting applications. Radiation detection can be divided into two types based on its implementation: direct detection and indirect detection. Direct detection involves collecting electrons and holes excited by high-energy rays in the detection material under the influence of an external electric field to form an electrical signal. Indirect detection, on the other hand, involves electrons and holes excited by rays recombinating to emit visible or ultraviolet light, which is then detected by photomultiplier tubes (PMTs) or silicon PMTs to obtain the electrical signal. Because indirect detection generally has higher temporal resolution, most radiation detection applications requiring high temporal resolution currently employ the indirect detection approach.

[0003] Radiation detection materials used in indirect detection are called scintillators, which can be broadly classified into inorganic and organic scintillators. High temporal resolution relies on the short emission lifetime of the scintillator. Currently, the emission lifetime of traditional inorganic scintillators is generally no less than tens of nanoseconds; for example, NaI:Tl has a emission lifetime of 230 ns, and SrI2:Eu has a emission lifetime of 2400 ns. The emission lifetime of organic scintillators is shorter; for example, anthracene has a emission lifetime of 30 ns, while stilbene has a emission lifetime of 3.5 to 4.5 ns. However, such emission lifetimes are sometimes still too long, and methods to obtain scintillators with shorter emission lifetimes more quickly are still needed to achieve higher temporal resolution. Summary of the Invention

[0004] This application provides a monitoring method, apparatus, device, and medium for a scintillation detector. By replacing the original scintillation with a target scintillation having an organic layer with a lower dielectric constant, the scintillation in the scintillation detector has a shorter emission lifetime, thereby improving the temporal resolution of the scintillation detector and enabling the acquisition of a scintillation with a shorter emission lifetime in a faster manner.

[0005] In a first aspect, the present invention provides the following technical solution through an embodiment of the present invention:

[0006] A monitoring method for a scintillation detector includes: acquiring the luminescence lifetime of an original scintillator in the scintillation detector; if the luminescence lifetime is greater than a preset luminescence lifetime threshold, sending a replacement instruction to replace the original scintillator with a target scintillator, such that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold, wherein the dielectric constant of the organic layer in the target scintillator is less than the dielectric constant of the organic layer in the original scintillator.

[0007] Preferably, the preset luminescence lifetime threshold is between 1.24 ns and 1.35 ns.

[0008] Preferably, the difference between the dielectric constant of the organic layer in the target scintillator and the dielectric constant of the organic layer in the original scintillator is between 0.5 and 1.

[0009] Preferably, the luminescence lifetime is obtained by single-photon counting, stroboscopic technology, or phase modulation.

[0010] Preferably, before obtaining the luminescence lifetime of the original scintillator in the scintillation detector, the method further includes: monitoring whether the temporal resolution of the original scintillator meets a preset requirement; if the preset requirement is not met, then the step of obtaining the luminescence lifetime of the original scintillator in the scintillation detector is performed.

[0011] Preferably, the dielectric constant of the organic layer in the target scintillator is between 3.2 and 3.5.

[0012] Preferably, the dielectric constant of the organic layer in the target scintillator is 3.28.

[0013] Secondly, through an embodiment of the present invention, the present invention provides the following technical solution:

[0014] A monitoring device for a scintillation detector, comprising:

[0015] The acquisition module is used to acquire the luminescence lifetime of the original scintillator in the scintillation detector;

[0016] The prompting module is used to send a replacement instruction to replace the original scintillator with the target scintillator if the luminescence lifetime is greater than a preset luminescence lifetime threshold, such that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold, wherein the dielectric constant of the organic layer in the target scintillator is less than the dielectric constant of the organic layer in the original scintillator.

[0017] Thirdly, through one embodiment of the present invention, the following technical solution is provided:

[0018] An electronic device includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the steps of the method described in any of the first aspects above.

[0019] Fourthly, through one embodiment of the present invention, the following technical solution is provided:

[0020] A computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the method described in any of the first aspects above.

[0021] One or more technical solutions provided in the embodiments of this application have at least the following technical effects or advantages:

[0022] The scintillation detector monitoring method provided in this invention first obtains the luminescence lifetime of the original scintillator in the scintillation detector. If the luminescence lifetime is greater than a preset luminescence lifetime threshold, a replacement instruction is sent to replace the original scintillator with a target scintillator, ensuring that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold. The dielectric constant of the organic layer in the target scintillator is lower than that of the organic layer in the original scintillator. This application replaces the original scintillator with an organic layer having a lower dielectric constant than the original scintillator. By using an organic material with a lower dielectric constant for the organic layer while keeping the inorganic layer unchanged, the two-dimensional perovskite has a weaker shielding effect on the electric field, resulting in a stronger electric field force between electrons and holes in the excitons. This shortens the average distance between electrons and holes, increases the overlap of their wave functions, and increases the rate of recombination emission, ultimately reducing the luminescence lifetime of the scintillator. This meets the demand for higher time resolution in the field of radiation detection, achieving a faster method to obtain scintillators with shorter luminescence lifetimes. This method is simple and effective, significantly improving the time resolution in the field of radiation detection. Attached Figure Description

[0023] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0024] Figure 1 A flowchart illustrating the monitoring method of the scintillation detector provided in an embodiment of the present invention;

[0025] Figure 2 A schematic diagram illustrating the principle of dielectric confinement for realizing a short-lifetime scintillator according to an embodiment of the present invention;

[0026] Figure 3 A comparison of the luminescence lifetimes of the two under ultraviolet light excitation at 300K, provided in an embodiment of the present invention;

[0027] Figure 4 A comparison diagram of the luminescence lifetimes of the two under ultraviolet light excitation at 80K provided in an embodiment of the present invention;

[0028] Figure 5 Room temperature provided for embodiments of the present invention 41 Comparison of luminescence lifetimes of Am under alpha particle excitation;

[0029] Figure 6This is a schematic diagram of the monitoring device for the scintillation detector provided in an embodiment of the present invention;

[0030] Figure 7 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0031] Scintillation detectors are primarily used for detection by utilizing the flashes of light produced by ionizing radiation in certain materials. They are among the most widely used ionizing radiation detectors today. A scintillation detector consists of a scintillator, photomultiplier tube, power supply and amplifier, analyzer, and calibrator system. Scintillation detectors are often equipped with a computer system to process the measurement results.

[0032] When radiation passes through a scintillator, the scintillator is ionized and excited by the radiation, emitting light of a specific wavelength. These photons strike the photocathode of a photomultiplier tube, causing the photoelectric effect and releasing electrons. These electrons flow through a multi-stage cathode circuit of the photomultiplier tube, where they are amplified step by step into electrical pulses. These pulses are then input into the electronic circuitry and recorded by a calibrator. The number of electrons generated by the photocathode is directly proportional to the number of photons that strike it; that is, the greater the amount of radioactive isotope, the more flashes are induced on the scintillator, and thus the more pulses are recorded by the instrument.

[0033] The high temporal resolution of scintillation detectors relies on the short luminescence lifetime of the scintillator. Traditional methods for solving the problem of excessively long luminescence lifetimes involve testing different scintillators one by one to obtain one with a shorter luminescence lifetime. However, the inventors discovered that a scintillator with a shorter luminescence lifetime can be obtained directly by changing the dielectric constant of the organic layer. In other words, by finding a scintillator containing an organic layer with a lower dielectric constant, the process of obtaining a scintillator with a shorter luminescence lifetime becomes more efficient and can quickly meet the requirement of a shorter lifetime.

[0034] In view of this, the embodiments of this application provide a monitoring method, apparatus, device and medium for a scintillation detector. By replacing the original scintillation with a target scintillation having an organic layer with a lower dielectric constant, the scintillation in the scintillation detector has a shorter luminescence lifetime, thereby improving the temporal resolution of the scintillation detector.

[0035] The overall technical solution of this application embodiment is as follows:

[0036] A monitoring method for a scintillation detector includes: first, obtaining the luminescence lifetime of an original scintillator in the scintillation detector; if the luminescence lifetime is greater than a preset luminescence lifetime threshold, sending a replacement instruction to replace the original scintillator with a target scintillator, such that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold, wherein the dielectric constant of the organic layer in the target scintillator is less than the dielectric constant of the organic layer in the original scintillator.

[0037] To better understand the above technical solutions, the following will provide a detailed explanation of the technical solutions in conjunction with the accompanying drawings and specific implementation methods.

[0038] Firstly, the present invention provides a monitoring method for a scintillation detector, specifically, as follows: Figure 1 As shown, the method includes the following steps S101 to S102:

[0039] Step S101: Obtain the luminescence lifetime of the original scintillator in the scintillation detector;

[0040] Step S102: If the luminescence lifetime is greater than a preset luminescence lifetime threshold, a replacement instruction to replace the original scintillator with a target scintillator is sent, such that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold, wherein the dielectric constant of the organic layer in the target scintillator is less than the dielectric constant of the organic layer in the original scintillator. This application relates to a two-dimensional perovskite scintillator that may include organic layers.

[0041] In a specific embodiment, before obtaining the luminescence lifetime of the original scintillator in the scintillation detector, the method further includes: monitoring whether the temporal resolution of the original scintillator meets a preset requirement; if it does not meet the preset requirement, then the step of obtaining the luminescence lifetime of the original scintillator in the scintillation detector is performed. If the preset requirement is met, then the original scintillator is directly used without replacement.

[0042] It should be noted that the scintillator in the scintillation detector is used for high-energy detection. When a high-energy particle hits the scintillator, the scintillator will emit light. The time resolution of the scintillator refers to the minimum time interval between two consecutive high-energy particle incidents. The preset requirement here can be 1 second, 1 / 30 of a second, etc.

[0043] Specifically, the luminescence lifetime is obtained through single-photon counting, stroboscopic techniques, or phase modulation methods. Alternatively, the luminescence lifetime can also be obtained through streak camera methods or upconversion methods. Since the focus of this application is not on the method for obtaining the luminescence lifetime, the specific acquisition process will not be elaborated upon here.

[0044] If the luminous lifetime is greater than the preset luminous lifetime threshold, a replacement instruction is sent to replace the original scintillator with the target scintillator, so that the user can replace the original scintillator based on the prompt information, and finally obtain a scintillator with a shorter luminous lifetime, that is, a scintillator with a higher time resolution.

[0045] The replacement prompts may include: the luminescence lifetime of the original scintillator, the dielectric constant of the organic layer of the scintillator, the replaceable target scintillator (which may include multiple ones), and the dielectric constant of the target scintillator, etc. In actual implementation, users can select a suitable target scintillator to replace the original scintillator as needed.

[0046] To obtain a scintillation detector with higher time resolution, the preset emission lifetime threshold mentioned in this application can be between 1.24 ns and 1.35 ns. That is, if the emission lifetime of the original scintillator is higher than 1.35 ns, the original scintillator will be replaced.

[0047] Preferably, to ensure the high temporal resolution of the replaced scintillator is significant and to simplify the operation process, the difference between the dielectric constant of the organic layer in the target scintillator and the dielectric constant of the organic layer in the original scintillator can be between 0.5 and 1. The larger the difference, the shorter the luminous lifetime of the target scintillator will be. Of course, the difference between the dielectric constant of the organic layer in the target scintillator and the dielectric constant of the organic layer in the original scintillator can also be 0.5 or higher.

[0048] This application uses (BI)₂PbBr₄ with an organic layer having a low dielectric constant as a novel scintillator. For example, if the original scintillator is (PEA)₂PbBr₄ and its luminescence lifetime is greater than a preset luminescence lifetime threshold, then (BI)₂PbBr₄ with an organic layer having a low dielectric constant is used to replace Br₄(PEA)₂PbBr₄, so that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold.

[0049] The principle behind shortening the luminescence lifetime of a scintillation detector by replacing the original scintillator with one containing an organic layer with a low dielectric constant is as follows: Since two-dimensional perovskite materials are superlattice structures with alternating organic and inorganic layers, if the organic layer is made of an organic material with a lower dielectric constant while keeping the inorganic layer unchanged, the shielding effect of the two-dimensional perovskite on the electric field will be weaker. This leads to a stronger electric field force between electrons and holes within the exciton, bringing the average distance between electrons and holes closer together. This results in greater overlap of the wave functions of electrons and holes, increasing the recombination rate of luminescence and ultimately reducing the luminescence lifetime. Figure 2 As shown.

[0050] Specifically, the dielectric constant of the organic layer in the target scintillator can be between 3.2 and 3.5. For example, the dielectric constant of the organic layer in the target scintillator is 3.28.

[0051] This application conducted experimental analyses on two types of two-dimensional perovskites with different organic layer dielectric constants. The specific experimental results are as follows:

[0052] Following the above approach, two-dimensional perovskites with different organic layer dielectric constants, (BI)₂PbBr₄ and (PEA)₂PbBr₄, were selected. The relative dielectric constant of the organic layer in (BI)₂PbBr₄ is 3.28, while that in (PEA)₂PbBr₄ is 3.81. Here, BI represents benzimidazole, and PEA represents phenylethylamine. To verify that (BI)₂PbBr₄ achieves a stronger dielectric confinement effect by modifying the organic layer, thereby resulting in a shorter emission lifetime, the emission lifetimes of these two perovskites were compared under various conditions.

[0053] Figure 3 This graph compares the luminescence lifetimes of the two materials under UV excitation at 300K. The horizontal axis represents time, and the vertical axis represents fluorescence intensity. As can be seen from the graph, (BI)2PbBr4 reaches a stable fluorescence intensity faster than (PEA)2PbBr4. Therefore, (BI)2PbBr4 has a shorter luminescence lifetime of 1.35 ns, while (PEA)2PbBr4 has a luminescence lifetime of 8.15 ns.

[0054] Figure 4 The graph compares the luminescence lifetimes under 80K and ultraviolet light excitation. The horizontal axis represents time and the vertical axis represents fluorescence intensity. As can be seen from the graph, (BI)2PbBr4 reaches a stable fluorescence intensity faster than (PEA)2PbBr4, indicating that (BI)2PbBr4 has a shorter luminescence lifetime.

[0055] Figure 5 At room temperature 241 The graph compares the luminescence lifetimes of Am under α-particle excitation, with the horizontal axis representing time and the vertical axis representing fluorescence intensity. It can be seen from the graph that (BI)2PbBr4 has a shorter luminescence lifetime than (PEA)2PbBr4.

[0056] The above experimental results all demonstrate that (BI)₂PbBr₄ exhibits a shorter emission lifetime. (BI)₂PbBr₄ can be used in radiation detection scenarios requiring high temporal resolution. That is, by using an organic layer with a low dielectric constant while keeping the inorganic layer unchanged, a stronger dielectric confinement effect can be achieved, thus enabling the scintillator to achieve a shorter emission lifetime. To meet the demand for higher temporal resolution in the field of radiation detection, this application reduces the emission lifetime of two-dimensional perovskites through dielectric confinement modulation, achieving a emission lifetime of 1.35 ns at 300 K.

[0057] In summary, the scintillation detector monitoring method provided by this invention, based on the applicant's discovery that scintillators with lower dielectric constant organic layers have shorter emission lifetimes, can rapidly and effectively reduce the emission lifetime of two-dimensional perovskites, thereby meeting the demand for higher temporal resolution in the field of radiation detection. This method is simple and effective, and significantly improves the temporal resolution in the field of radiation detection.

[0058] Secondly, based on the same inventive concept, this embodiment provides a monitoring device for a scintillation detector, such as... Figure 6 As shown, it includes:

[0059] Acquisition module 401 is used to acquire the luminescence lifetime of the original scintillator in the scintillator detector;

[0060] The prompting module 402 is used to send a replacement instruction to replace the original scintillator with the target scintillator if the luminescence lifetime is greater than a preset luminescence lifetime threshold, so that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold, wherein the dielectric constant of the organic layer in the target scintillator is less than the dielectric constant of the organic layer in the original scintillator.

[0061] As an optional embodiment, the preset emission lifetime threshold is between 1.24 ns and 1.35 ns.

[0062] As an optional embodiment, the difference between the dielectric constant of the organic layer in the target scintillator and the dielectric constant of the organic layer in the original scintillator is between 0.5 and 1.

[0063] As an optional embodiment, the acquisition module is specifically used to: acquire the luminescence lifetime using single-photon counting, stroboscopic technology, or phase modulation method.

[0064] As an optional embodiment, the device further includes:

[0065] The time resolution monitoring module is used to monitor whether the time resolution of the original scintillator meets the preset requirements; if it does not meet the preset requirements, the step of obtaining the luminescence lifetime of the original scintillator in the scintillator detector is executed.

[0066] As an alternative embodiment, the dielectric constant of the organic layer in the target scintillator is between 3.2 and 3.5.

[0067] As an alternative embodiment, the dielectric constant of the organic layer in the target scintillator is 3.28.

[0068] The monitoring device for a scintillation detector provided in this embodiment of the invention has the same implementation principle and technical effect as the aforementioned method embodiment. For the sake of brevity, any parts not mentioned in the product embodiment can be referred to the corresponding content in the aforementioned method embodiment.

[0069] Thirdly, based on the same inventive concept, this embodiment provides an electronic device 500, such as... Figure 7 As shown, it includes: a memory 501, a processor 502, and a computer program 503 stored in the memory and executable on the processor. When the processor 501 executes the program, it implements the steps of the monitoring method of the flicker detector described in the first aspect above.

[0070] Since the electronic device described in this embodiment is the electronic device used to implement the monitoring method of the flicker detector in the embodiments of this application, those skilled in the art can understand the specific implementation method and various variations of the electronic device in this embodiment based on the monitoring method of the flicker detector described in the embodiments of this application. Therefore, how the electronic device implements the method in the embodiments of this application will not be described in detail here. Any electronic device used by those skilled in the art to implement the monitoring method of the flicker detector in the embodiments of this application falls within the scope of protection of this application.

[0071] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0072] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A monitoring method for a scintillation detector, characterized in that, include: The luminescence lifetime of the original scintillator in the scintillation detector is obtained, wherein the original scintillator is a two-dimensional perovskite material; If the luminescence lifetime is greater than a preset luminescence lifetime threshold, a replacement instruction to replace the original scintillator with a target scintillator is sent, such that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold, thereby improving the temporal resolution of the scintillator. The dielectric constant of the organic layer in the target scintillator is less than that of the organic layer in the original scintillator, and the dielectric constant of the inorganic layer in the target scintillator is the same as that of the inorganic layer in the original scintillator. The preset luminescence lifetime threshold is between 1.24 ns and 1.35 ns; the difference between the dielectric constant of the organic layer in the target scintillator and the dielectric constant of the organic layer in the original scintillator is between 0.5 and 1, and the dielectric constant of the organic layer in the target scintillator is between 3.2 and 3.

5.

2. The monitoring method as described in claim 1, characterized in that, The step of obtaining the luminescence lifetime of the original scintillator in the scintillation detector includes: The luminescence lifetime is obtained by single-photon counting, stroboscopic technology, or phase modulation.

3. The monitoring method as described in claim 1, characterized in that, Before obtaining the luminescence lifetime of the original scintillator in the scintillation detector, the method further includes: Monitor whether the temporal resolution of the original scintillator meets the preset requirements; If the preset requirements are not met, then the step of obtaining the luminescence lifetime of the original scintillator in the scintillator detector is performed.

4. The monitoring method as described in claim 1, characterized in that, The dielectric constant of the organic layer in the target scintillator is 3.

28.

5. A monitoring device for a scintillation detector, characterized in that, include: The acquisition module is used to acquire the luminescence lifetime of the original scintillator in the scintillation detector, wherein the original scintillator is a two-dimensional perovskite material; The prompting module is used to send a replacement instruction to replace the original scintillator with a target scintillator if the luminescence lifetime is greater than a preset luminescence lifetime threshold, so that the luminescence lifetime of the target scintillator is within the preset luminescence lifetime threshold, thereby improving the temporal resolution of the scintillator detector. The dielectric constant of the organic layer in the target scintillator is less than the dielectric constant of the organic layer in the original scintillator, and the dielectric constant of the inorganic layer in the target scintillator is the same as the dielectric constant of the inorganic layer in the original scintillator. The preset luminescence lifetime threshold is between 1.24 ns and 1.35 ns; the difference between the dielectric constant of the organic layer in the target scintillator and the dielectric constant of the organic layer in the original scintillator is between 0.5 and 1, and the dielectric constant of the organic layer in the target scintillator is between 3.2 and 3.

5.

6. An electronic device, characterized in that, include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the program, implements the steps of the method according to any one of claims 1-4.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by a processor, the program implements the steps of the method described in any one of claims 1-4.

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