Coating defect detection method, electronic equipment and storage medium

Abstract

The invention provides a coating defect detection method, electronic equipment and a storage medium. The method comprises the following steps: uniformly mixing fluorescent powder in coating powder, and cladding the mixed powder on the surface of a substrate to form a coating to be detected; performing point-by-point detection on the to-be-detected coating to obtain an actually measured fluorescence spectrum corresponding to each detection point on the to-be-detected coating; according to the actually measured fluorescence spectrum corresponding to each detection point location and a preset standard fluorescence spectrum, judging whether each detection point location is a defect point location or not, and judging the defect type of the defect point location; and if the defect type is an apparent quality defect, determining a coating quality missing value corresponding to the defect point location, and repairing the defect point location based on the coating quality missing value. According to the invention, the detection efficiency and the detection precision of the coating surface defects can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of coating testing, and in particular to a coating defect detection method, electronic equipment and storage medium. Background Art

[0002] Anti-corrosion and wear-resistant coatings are widely used in many industrial fields such as construction, automobile manufacturing, and mechanical processing. The surface quality of the coating directly affects the performance, aesthetics, and service life of the product. In the production process of the coating, due to the influence of raw materials, process parameters, environment, and other factors, surface defects such as scratches, bubbles, cracks, and pitting are easily generated. Therefore, it is necessary to detect the surface defects of the coating so that they can be repaired in time to avoid affecting the performance, aesthetics, and service life of the product.

[0003] At present, although there are some automated detection methods, they have not been widely used due to their low detection accuracy and poor ability to identify complex defects. Most of the related technologies still use manual detection to detect coating surface defects, but manual detection methods are inefficient, highly subjective and prone to missed detections and false detections. Summary of the invention

[0004] The embodiments of the present invention provide a coating defect detection method, an electronic device and a storage medium to solve the problems of low efficiency and low detection accuracy of coating surface defects.

[0005] In a first aspect, an embodiment of the present invention provides a coating defect detection method, comprising: The fluorescent powder is uniformly mixed with the coating powder, and the mixed powder is melt-coated on the surface of the substrate to form a coating to be tested; Probing the coating to be tested point by point to obtain a measured fluorescence spectrum corresponding to each detection point on the coating to be tested; According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, whether each detection point is a defect point and the defect type of the defect point are determined; If the defect type is an apparent quality defect, the coating quality missing value corresponding to the defect point is determined, and the defect point is repaired based on the coating quality missing value.

[0006] In a possible implementation, judging whether each detection point is a defect point and the defect type of the defect point according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum includes: According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, respectively detecting whether the measured fluorescence emission wavelength in the measured fluorescence spectrum is consistent with the standard fluorescence emission wavelength in the standard fluorescence spectrum, and whether the measured fluorescence peak position in the measured fluorescence spectrum is consistent with the standard fluorescence peak position in the standard fluorescence spectrum; If the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent quality defect; If the measured fluorescence peak position is inconsistent with the standard fluorescence peak position, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent impurity defect; If the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, and the measured fluorescence peak position is consistent with the standard fluorescence peak position, then the detection point is determined to be a normal point.

[0007] In a possible implementation, if the defect type is an apparent quality defect, determining the coating quality missing value corresponding to the defect point includes: If the defect type is an apparent quality defect, obtaining a mapping relationship between the fluorescence emission wavelength and the coating quality; Determining a standard coating quality based on a standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship; Determining the measured coating quality corresponding to the defect point based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship; According to the difference between the standard coating quality and the measured coating quality, the coating quality missing value corresponding to the defective point is determined.

[0008] In a possible implementation, the repairing the defective point based on the coating quality missing value includes: If the coating quality missing value is greater than 0, the coating quality missing value is determined as the powder feeding quality; Laser cladding is performed on the defective point, and mixed powder is delivered to the defective point in real time during the laser cladding process until the mass of the delivered mixed powder reaches the powder delivery mass.

[0009] In a possible implementation, the repairing the defective point based on the coating quality missing value includes: If the coating quality missing value is less than 0, the absolute value of the coating quality missing value is determined as the powder removal quality; Laser cladding is performed on the defective points, and the mass of powder removed during the laser cladding process is collected in real time until the mass of powder removed reaches the powder removal mass.

[0010] In a possible implementation, the mixed powder is melt-coated on the surface of the substrate to form a coating to be tested, including: The surface of the substrate is heated by microwaves, and during the microwave heating process, the mixed powder is clad on the surface of the substrate by using laser cladding technology to form the coating to be tested.

[0011] In a possible implementation, in the process of cladding the mixed powder onto the surface of the substrate using laser cladding technology, the powder feeding rate of the mixed powder ranges from 0.2 to 0.5 g / min, the laser scanning rate ranges from 6 to 8 mm / s, and the laser power ranges from 1200 to 1500 W.

[0012] In a possible implementation, the point-by-point detection of the coating to be tested includes: The coating to be tested is detected point by point using a thermal laser.

[0013] In a second aspect, an embodiment of the present invention provides a coating defect detection device, comprising: The cladding module is used to evenly mix the fluorescent powder into the coating powder, and clad the mixed powder on the surface of the substrate to form a coating to be tested; Detection module for: Probing the coating to be tested point by point to obtain a measured fluorescence spectrum corresponding to each detection point on the coating to be tested; According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, whether each detection point is a defect point and the defect type of the defect point are determined; A repair module is used to determine the coating quality missing value corresponding to the defect point if the defect type is an apparent quality defect, and repair the defect point based on the coating quality missing value.

[0014] In a third aspect, an embodiment of the present invention provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the processor implements the steps of the method described in the first aspect or any possible implementation manner of the first aspect.

[0015] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method described in the first aspect or any possible implementation of the first aspect are implemented.

[0016] The embodiment of the present invention provides a coating defect detection method, electronic device and storage medium, which forms a coating to be tested by uniformly mixing fluorescent powder into coating powder and melting it on the surface of a substrate, so that the fluorescence spectrum corresponding to each detection point on the coating to be tested can be used to reflect whether there are defects in the coating covering at each detection point, as well as the corresponding defect type, thereby achieving fast and accurate coating defect detection. In addition, the embodiment of the present invention can further determine the coating quality missing value on the basis of determining that the defect type is an apparent quality defect, and repair the defective point according to the coating quality missing value, thereby targetedly and accurately repairing the defective point on the coating to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0018] Figure 1 is a flow chart of an implementation of a coating defect detection method provided by an embodiment of the present invention; Figure 2 is a detection schematic diagram of performing point-by-point detection on a coating to be tested provided by an embodiment of the present invention; Figure 3 is a schematic structural diagram of a coating defect detection device provided by an embodiment of the present invention; Figure 4 is a schematic diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0019] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present invention. However, it should be clear to those skilled in the art that the present invention may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present invention.

[0020] Defects such as scratches, bubbles, cracks, pits, etc. on the coating surface not only affect the aesthetics of the product, but also affect the product performance and service life. Therefore, it is necessary to detect defects in the coating so that they can be repaired in time. Most of the related technologies use manual detection, but manual detection methods are inefficient, highly subjective, and prone to missed detections and false detections.

[0021] In order to improve the detection accuracy and efficiency of apparent defects in coatings, the embodiment of the present invention uniformly mixes fluorescent powder into coating powder, and melts the mixed powder onto the surface of the substrate to form a coating to be tested. On this basis, the measured fluorescence spectrum corresponding to each detection point on the coating to be tested is used to reflect the melting condition of the mixed powder at each detection point, thereby realizing the apparent defect detection of the coating to be tested.

[0022] In order to make the purpose, technical solutions and advantages of the present invention more clear, specific embodiments will be described below in conjunction with the accompanying drawings.

[0023] Figure 1 The implementation flow chart of the coating defect detection method provided by the embodiment of the present invention is detailed as follows: Step 101 : Evenly mix the fluorescent powder into the coating powder, and melt-coat the mixed powder on the surface of the substrate to form a coating to be tested.

[0024] The embodiment of the present invention forms a coating by uniformly mixing the fluorescent powder into the coating powder and coating it on the surface of the substrate, which can provide a basis for subsequent defect detection. The fluorescent powder does not affect the function of the coating itself. For example, the fluorescent powder can be fluorescein isothiocyanate.

[0025] Here, the mass ratio of the fluorescent powder to the coating powder can be determined according to actual conditions, and the embodiment of the present invention does not specifically limit this. For example, the mass of the fluorescent powder can be 10% of the mass of the coating powder.

[0026] In some embodiments, when the mixed powder is clad on the substrate surface, the substrate surface may be pre-heated with microwaves, and during the microwave heating process, the mixed powder may be clad on the substrate surface using laser cladding technology to form a coating to be tested.

[0027] Before microwave heating the substrate surface, the substrate surface may be ultrasonically cleaned to keep the substrate surface clean and free of oil and other pollutants, thereby ensuring that the cladding coating can better adhere to the substrate surface.

[0028] The embodiment of the present invention can perform microwave heating on the substrate surface by adding a microwave heating device on the substrate surface. Microwave heating can effectively remove air, water stains, dirt, etc. on the substrate surface, avoiding the generation of pseudo defects during the coating cladding process. In addition, microwave heating can quickly heat up the material as a whole, making it easier to melt the substrate thin layer and the cladding material (i.e., mixed powder) during the cladding process, reducing the thermal stress of the cladding layer (i.e., coating) and the material surface.

[0029] In some embodiments, in the process of using laser cladding technology to clad the mixed powder on the surface of the substrate, laser cladding can be performed by powder feeding, the powder feeding rate range of the mixed powder can be set to 0.2~0.5g / min, the laser scanning rate range can be set to 6~8mm / s, and the laser power range can be set to 1200~1500W.

[0030] Among them, the powder feeding rate range of the mixed powder is set to 0.2~0.5g / min, which can effectively ensure a stable supply of mixed powder during the laser cladding process.

[0031] The embodiment of the present invention can perform double-layer cladding on the substrate, and the thickness of each cladding layer is 0.1-0.2 μm to ensure the coating performance.

[0032] After the cladding is completed, the substrate temperature is gradually cooled to room temperature using a microwave heating device so that the cladding layer cools slowly, thereby avoiding the generation of thermal stress.

[0033] The embodiment of the present invention adopts microwave heating and laser cladding technology to achieve coating cladding, which can ensure the quality of coating cladding to the greatest extent during the process, thereby reducing the coating surface defects as much as possible.

[0034] Step 102 , detect the coating to be tested point by point to obtain a measured fluorescence spectrum corresponding to each detection point on the coating to be tested.

[0035] See also Figure 2 The embodiment of the present invention can establish a coordinate system on the coating surface, and use laser to perform point detection one by one in the coordinate system to obtain the measured fluorescence spectrum corresponding to each detection point.

[0036] In some embodiments, a thermal laser may be used to detect the coating to be tested point by point.

[0037] Among them, thermal laser can eliminate pseudo defects on the coating surface that can evaporate at high temperatures, such as water stains, oil stains, and some organic matter, by heating.

[0038] Step 103 , judging whether each detection point is a defect point and the defect type of the defect point according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum.

[0039] The embodiments of the present invention mainly divide the defect types of defect points into apparent quality defects and apparent impurity defects. Among them, apparent quality defects mainly include: quality loss defects such as scratches, bubbles, cracks, pinholes, etc., and quality increase defects such as bulges, sagging, and accumulation. Apparent impurity defects mainly include: defects caused by the outside of the coating such as impurities and stolen goods.

[0040] The measured fluorescence spectrum corresponding to the detection point may include data such as the measured fluorescence emission wavelength and the measured fluorescence peak position. Among them, the measured fluorescence emission wavelength can reflect the quality of the fluorescent powder at the detection point, and then reflect the quality of the coating at the detection point. The measured fluorescence peak position can reflect the physical properties of the coating at the detection point, and then reflect whether there are impurities, stolen goods, etc. at the detection point.

[0041] According to the embodiment of the present invention, by comparing the measured fluorescence spectrum with the standard fluorescence spectrum, it is possible to determine whether each detection point is a defect point, and further determine the defect type of the defect point.

[0042] It is understandable that different fluorescent powders correspond to different fixed fluorescence spectra. Based on the determination of the fluorescent powder, the preset standard fluorescence spectrum is also determined accordingly. For example, when the fluorescent powder is fluorescein isothiocyanate, the fluorescence spectrum corresponding to fluorescein isothiocyanate can be directly used as the preset standard fluorescence spectrum. Among them, the fluorescence emission wavelength in the fluorescence spectrum corresponding to fluorescein isothiocyanate is 520-530nm.

[0043] Alternatively, in order to avoid theoretical errors, laser detection may be performed on a defect-free coating in advance to obtain a fluorescence spectrum corresponding to the defect-free coating, and the fluorescence spectrum may be determined as a preset standard fluorescence spectrum.

[0044] Step 104: If the defect type is an apparent quality defect, determine the coating quality missing value corresponding to the defect point, and repair the defect point based on the coating quality missing value.

[0045] According to the above, the embodiment of the present invention can determine the defect type of the defect point according to the measured fluorescence spectrum at the defect point. If the defect point is an apparent quality defect, the embodiment of the present invention can determine the coating quality missing value at the defect point according to the measured fluorescence spectrum, and repair the defect point according to the coating quality missing value.

[0046] It can be understood that when the defect point is a quality defect such as scratches, bubbles, cracks, pinholes, etc., the coating quality loss value is greater than 0. On the contrary, when the defect point is a quality increase defect such as bulges, sagging, accumulation, etc., the coating quality loss value is less than 0.

[0047] Among them, for the apparent impurity defects at the defect points, artificial cleaning can be used to eliminate impurities, stolen goods, etc. at the defect points to repair the apparent impurity defects.

[0048] In some embodiments, after each defective point is repaired, the repaired coating to be tested can be re-detected point by point to obtain the measured fluorescence spectrum corresponding to each detection point, and then jump to the step of judging whether each detection point is a defective point based on the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, until all detection points on the coating to be tested are normal points, it is determined that the repair is completed.

[0049] Compared with the prior art, the embodiment of the present invention forms a coating to be tested by uniformly mixing fluorescent powder into coating powder and melting it on the surface of the substrate, so that the fluorescence spectrum corresponding to each detection point on the coating to be tested can be used to reflect whether there are defects in the coating coating at each detection point, as well as the corresponding defect type, thereby achieving fast and accurate coating defect detection. In addition, the embodiment of the present invention can further determine the coating quality missing value based on determining that the defect type is an apparent quality defect, and repair the defective points according to the coating quality missing value, thereby targetedly and accurately repairing the defective points on the coating to be tested.

[0050] According to the above, the fluorescence emission wavelength of the fluorescence spectrum can reflect the quality of the fluorescent powder, and the mass ratio between the fluorescent powder and the coating powder is a fixed value. Therefore, the embodiment of the present invention uses the fluorescence emission wavelength to reflect the quality of the coating at the detection point, and then detects whether there are apparent quality defects at the detection point. The fluorescence peak position can reflect the physical properties of the coating at the detection point, and then reflect whether there are impurities, stolen goods, etc. at the detection point. Therefore, the embodiment of the present invention can use the fluorescence peak position to detect whether there are apparent impurity defects at the detection point.

[0051] In some embodiments, when judging whether each detection point is a defect point and the defect type of the defect point, the measured fluorescence emission wavelength in the measured fluorescence spectrum and the preset standard fluorescence spectrum corresponding to each detection point can be first detected to see whether it is consistent with the standard fluorescence emission wavelength in the standard fluorescence spectrum, and whether the measured fluorescence peak position in the measured fluorescence spectrum is consistent with the standard fluorescence peak position in the standard fluorescence spectrum.

[0052] Among them, if the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, the detection point is determined to be a defective point, and the defect type of the defective point is an apparent quality defect; if the measured fluorescence peak position is inconsistent with the standard fluorescence peak position, the detection point is determined to be a defective point, and the defect type of the defective point is an apparent impurity defect; if the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, and the measured fluorescence peak position is consistent with the standard fluorescence peak position, the detection point is determined to be a normal point.

[0053] Here, the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, which can be understood as that the difference between the measured fluorescence emission wavelength and the standard fluorescence emission wavelength is within a preset error range.

[0054] In another embodiment, considering that the fluorescence emission wavelength corresponding to the same coating quality is not a fixed parameter but is within a numerical range, the embodiment of the present invention can also pre-acquire the fluorescence emission wavelengths in the fluorescence spectra corresponding to multiple defect-free coatings, and determine the initial fluorescence emission wavelength range based on the multiple fluorescence emission wavelengths. At the same time, combined with the preset coating quality error allowable range, the standard fluorescence emission wavelength range is determined on the basis of the initial fluorescence emission wavelength range. Among them, if the measured fluorescence emission wavelength is within the standard fluorescence emission wavelength range, it is determined that there is no apparent quality defect at the detection point, and if the measured fluorescence emission wavelength is not within the standard fluorescence emission wavelength range, it is determined that there is an apparent quality defect at the detection point.

[0055] Specifically, the embodiment of the present invention can determine the initial fluorescence emission wavelength range according to the maximum and minimum values ​​of the fluorescence emission wavelengths in the fluorescence spectra corresponding to the plurality of defect-free coatings. On this basis, combined with the fluorescence emission wavelength range corresponding to the preset mass error range, the initial fluorescence emission wavelength range is broadened to the standard fluorescence emission wavelength range.

[0056] If the defect type is an apparent quality defect, the embodiment of the present invention can also determine the coating quality missing value corresponding to the defect point based on the measured fluorescence spectrum at the defect point, and then perform defect repair based on the coating quality missing value.

[0057] Among them, when determining the missing value of coating quality, the mapping relationship between the fluorescence emission wavelength and the coating quality can be obtained first; then, based on the standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship, the standard coating quality is determined; based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship, the measured coating quality corresponding to the defect point is determined; finally, according to the difference between the standard coating quality and the measured coating quality, the missing value of the coating quality corresponding to the defect point is determined.

[0058] The embodiment of the present invention can pre-acquire the fluorescence emission wavelength in the measured fluorescence spectrum at normal points of different coating thicknesses, wherein the coating quality can be determined according to the coating thickness, thereby obtaining a mapping relationship between the fluorescence emission wavelength and the coating quality. See Table 1, which takes fluorescein isothiocyanate as an example and exemplarily shows the mapping relationship between the fluorescence emission wavelength, the coating thickness, and the coating quality.

[0059] Table 1

[0060] According to the correspondence between the fluorescence emission wavelength and the coating quality, the standard coating quality and the measured coating quality can be determined respectively. In the embodiment of the present invention, the difference between the standard coating quality and the measured coating quality is determined as the coating quality missing value. Here, Table 1 is only used as an example to illustrate the mapping relationship between the fluorescence emission wavelength and the coating quality, and is not a specific limitation on the mapping relationship. The user can measure and determine the specific numerical mapping relationship between the fluorescence emission wavelength and the coating quality according to the actual situation.

[0061] It should be noted that, in the embodiment of the present invention, based on the preset mass error allowable range and the characteristics of the fluorescence emission wavelength, the standard fluorescence emission wavelength is broadened to a standard fluorescence emission wavelength range, for example, 100-101 nm.

[0062] In some embodiments, when repairing a defective point based on a coating quality missing value, if the coating quality missing value is greater than 0, the coating quality missing value is determined as the powder delivery quality; laser cladding is performed on the defective point, and mixed powder is delivered to the defective point in real time during the laser cladding process until the quality of the delivered mixed powder reaches the powder delivery quality.

[0063] Here, if the coating quality missing value is greater than 0, the defect point is determined to be a quality missing defect. At this time, the powder feeding quality can be determined according to the coating quality missing value, and the defect point can be re-performed with microwave heating and synchronized powder feeding laser cladding according to the powder feeding quality, thereby achieving targeted repair of the defect point.

[0064] If the coating quality missing value is less than 0, the absolute value of the coating quality missing value is determined as the powder removal quality; laser cladding is performed on the defective points, and the mass of powder removed during the laser cladding process is collected in real time until the mass of the removed powder reaches the powder removal quality.

[0065] Here, if the coating quality missing value is less than 0, the defect point is determined to be a quality increase defect. At this time, the powder removal quality can be determined according to the coating quality missing value, and the defect point can be laser clad again according to the powder removal quality to remove excess powder, thereby achieving targeted repair of the defect point.

[0066] It should be understood that the order of execution of the steps in the above embodiment does not necessarily mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present invention.

[0067] The following is an embodiment of the device of the present invention. For details not described in detail therein, reference may be made to the corresponding method embodiment described above.

[0068] Figure 3The structure diagram of the coating defect detection device provided by the embodiment of the present invention is shown. For the convenience of explanation, only the part related to the embodiment of the present invention is shown, which is described in detail as follows: like Figure 3 As shown, the coating defect detection device 3 includes: a cladding module 31 , a detection module 32 and a repair module 33 .

[0069] The cladding module 31 is used to uniformly mix the fluorescent powder into the coating powder, and clad the mixed powder on the surface of the substrate to form a coating to be tested; The detection module 32 is used for: Probing the coating to be tested point by point to obtain a measured fluorescence spectrum corresponding to each detection point on the coating to be tested; According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, whether each detection point is a defect point and the defect type of the defect point are determined; The repair module 33 is used to determine the coating quality missing value corresponding to the defect point if the defect type is an apparent quality defect, and repair the defect point based on the coating quality missing value.

[0070] Optionally, the detection module 32 is specifically used for: According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, respectively detecting whether the measured fluorescence emission wavelength in the measured fluorescence spectrum is consistent with the standard fluorescence emission wavelength in the standard fluorescence spectrum, and whether the measured fluorescence peak position in the measured fluorescence spectrum is consistent with the standard fluorescence peak position in the standard fluorescence spectrum; If the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent quality defect; If the measured fluorescence peak position is inconsistent with the standard fluorescence peak position, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent impurity defect; If the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, and the measured fluorescence peak position is consistent with the standard fluorescence peak position, then the detection point is determined to be a normal point.

[0071] Optionally, the repair module 33 is specifically used for: If the defect type is an apparent quality defect, obtaining a mapping relationship between the fluorescence emission wavelength and the coating quality; Determining a standard coating quality based on a standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship; Determining the measured coating quality corresponding to the defect point based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship; According to the difference between the standard coating quality and the measured coating quality, the coating quality missing value corresponding to the defective point is determined.

[0072] Optionally, the repair module 33 is specifically used for: If the coating quality missing value is greater than 0, the coating quality missing value is determined as the powder feeding quality; Laser cladding is performed on the defective point, and mixed powder is delivered to the defective point in real time during the laser cladding process until the mass of the delivered mixed powder reaches the powder delivery mass.

[0073] Optionally, the repair module 33 is specifically used for: If the coating quality missing value is less than 0, the absolute value of the coating quality missing value is determined as the powder removal quality; Laser cladding is performed on the defective points, and the mass of powder removed during the laser cladding process is collected in real time until the mass of powder removed reaches the powder removal mass.

[0074] Optionally, the cladding module 31 is specifically used for: The surface of the substrate is heated by microwaves, and during the microwave heating process, the mixed powder is clad on the surface of the substrate by using laser cladding technology to form the coating to be tested.

[0075] Optionally, in the process of cladding the mixed powder onto the surface of the substrate using laser cladding technology, the powder feeding rate of the mixed powder ranges from 0.2 to 0.5 g / min, the laser scanning rate ranges from 6 to 8 mm / s, and the laser power ranges from 1200 to 1500 W.

[0076] Optionally, the detection module 32 is specifically used for: The coating to be tested is detected point by point using a thermal laser.

[0077] The present device embodiment can be used to implement the above method embodiment. Its technical principle and implementation effect are the same as those of the above method embodiment, and will not be described in detail here.

[0078] Figure 4 Schematic diagram of an electronic device provided by an embodiment of the present invention. Figure 4 As shown, the electronic device 4 of this embodiment includes: a processor 40, a memory 41, and a computer program 42 stored in the memory 41 and executable on the processor 40. When the processor 40 executes the computer program 42, the steps in the above-mentioned coating defect detection method embodiments are implemented, for example Figure 1Alternatively, when the processor 40 executes the computer program 42, the functions of each module / unit in the above-mentioned device embodiments are realized, for example, Figure 3 The functions of the modules 31 to 33 are shown.

[0079] Exemplarily, the computer program 42 may be divided into one or more modules / units, which are stored in the memory 41 and executed by the processor 40 to implement the present invention. The one or more modules / units may be a series of computer program instruction segments capable of implementing specific functions, which are used to describe the execution process of the computer program 42 in the electronic device 4. For example, the computer program 42 may be divided into Figure 3 Modules 31 to 33 are shown.

[0080] The electronic device 4 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The electronic device 4 may include, but is not limited to, a processor 40 and a memory 41. Those skilled in the art will appreciate that Figure 4 It is only an example of the electronic device 4 and does not constitute a limitation of the electronic device 4. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device may also include input and output devices, network access devices, buses, etc.

[0081] The processor 40 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0082] The memory 41 may be an internal storage unit of the electronic device 4, such as a hard disk or memory of the electronic device 4. The memory 41 may also be an external storage device of the electronic device 4, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 4. Further, the memory 41 may also include both an internal storage unit and an external storage device of the electronic device 4. The memory 41 is used to store the computer program and other programs and data required by the electronic device. The memory 41 may also be used to temporarily store data that has been output or is to be output.

[0083] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0084] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0085] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0086] In the embodiments provided by the present invention, it should be understood that the disclosed devices / electronic devices and methods can be implemented in other ways. For example, the device / electronic device embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0087] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0088] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0089] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned coating defect detection method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device that can carry the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal and software distribution medium. The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A coating defect detection method, characterized in that: include: The fluorescent powder is uniformly mixed with the coating powder, and the mixed powder is melt-coated on the surface of the substrate to form a coating to be tested; Probing the coating to be tested point by point to obtain a measured fluorescence spectrum corresponding to each detection point on the coating to be tested; According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, whether each detection point is a defect point and the defect type of the defect point are determined; If the defect type is an apparent quality defect, the coating quality missing value corresponding to the defect point is determined, and the defect point is repaired based on the coating quality missing value.

2. The coating defect detection method according to claim 1, characterized in that: The step of judging whether each detection point is a defect point and the defect type of the defect point according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum includes: According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, respectively detecting whether the measured fluorescence emission wavelength in the measured fluorescence spectrum is consistent with the standard fluorescence emission wavelength in the standard fluorescence spectrum, and whether the measured fluorescence peak position in the measured fluorescence spectrum is consistent with the standard fluorescence peak position in the standard fluorescence spectrum; If the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent quality defect; If the measured fluorescence peak position is inconsistent with the standard fluorescence peak position, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent impurity defect; If the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, and the measured fluorescence peak position is consistent with the standard fluorescence peak position, then the detection point is determined to be a normal point.

3. The coating defect detection method according to claim 1 or 2, characterized in that: If the defect type is an apparent quality defect, determining the coating quality missing value corresponding to the defect point includes: If the defect type is an apparent quality defect, obtaining a mapping relationship between the fluorescence emission wavelength and the coating quality; Determining a standard coating quality based on a standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship; Determining the measured coating quality corresponding to the defect point based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship; According to the difference between the standard coating quality and the measured coating quality, the coating quality missing value corresponding to the defective point is determined.

4. The coating defect detection method according to claim 3, characterized in that: The repairing of the defective point based on the coating quality missing value comprises: If the coating quality missing value is greater than 0, the coating quality missing value is determined as the powder feeding quality; Laser cladding is performed on the defective point, and mixed powder is delivered to the defective point in real time during the laser cladding process until the mass of the delivered mixed powder reaches the powder delivery mass.

5. The coating defect detection method according to claim 3, characterized in that: The repairing of the defective point based on the coating quality missing value comprises: If the coating quality missing value is less than 0, the absolute value of the coating quality missing value is determined as the powder removal quality; Laser cladding is performed on the defective points, and the mass of powder removed during the laser cladding process is collected in real time until the mass of powder removed reaches the powder removal mass.

6. The coating defect detection method according to claim 1 or 2, characterized in that: The mixed powder is melt-coated on the surface of the substrate to form a coating to be tested, comprising: The surface of the substrate is heated by microwaves, and during the microwave heating process, the mixed powder is clad on the surface of the substrate by using laser cladding technology to form the coating to be tested.

7. The coating defect detection method according to claim 6, characterized in that: In the process of cladding the mixed powder onto the substrate surface using laser cladding technology, the powder feeding rate of the mixed powder ranges from 0.2 to 0.5 g / min, the laser scanning rate ranges from 6 to 8 mm / s, and the laser power ranges from 1200 to 1500 W.

8. The coating defect detection method according to claim 1 or 2, characterized in that: The point-by-point detection of the coating to be tested comprises: The coating to be tested is detected point by point using a thermal laser.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the coating defect detection method as described in any one of claims 1 to 8 are implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the coating defect detection method as described in any one of claims 1 to 8 are implemented.

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