Electronic product manufacturing workshop index system management system, construction method, device and product

Abstract

The invention discloses an electronic product manufacturing workshop index system management system, a construction method, a device and a product, relates to the field of production and manufacturing management, and is used for improving the fusion degree of an index system and an electronic product manufacturing service from macroscopic to microscopic. The method comprises the steps that at least one main dimension of an index system is constructed, at least one sub-dimension is constructed under each main dimension, components of each sub-dimension are constructed, cross combination is carried out on the components of each sub-dimension under each main dimension for each main dimension, a management node set is constructed, and the management node set is used for managing the index system. And respectively constructing a management index for each main dimension and each management node. According to the method, the comprehensive fusion of the index system and the production business and the comprehensive coverage of the production business from macroscopic to microscopic are ensured, and the development speed of the index system of the industry is obviously improved.

Description

Technical Field

[0001] The present invention relates to the technical field of production and manufacturing management, in particular to an index system management system for an electronic product manufacturing workshop, as well as a method, device and program product for constructing an index system for an electronic product manufacturing workshop. Background Art

[0002] With the development of large-scale electronic equipment towards high technology, high integration and multi-disciplinary integration, the types, compositions, structures, functions, etc. of products are becoming more and more complex. Their manufacturing process types are more, the processes are more complex, the manufacturing chain is longer, the quality risks are greater, and the costs are more difficult to control. By constructing an index system, different user roles can, based on the index data, real-time track the process operation status and change trends in various aspects such as different levels, different dimensions, different production lines, different objects, etc., so as to facilitate the timely discovery of process risks, conduct correlation analysis and evaluation on influencing factors, and thus ensure the smooth achievement of the final task. Therefore, constructing an index system has become an important measure for promoting high-quality and high-efficiency production and digital operation in electronic product manufacturing.

[0003] Currently, in the field of electronic product manufacturing, production indicators are mostly designed only for the final product, such as production cost, production efficiency, production progress, etc. Such an index system cannot comprehensively cover different links of the entire production business, and cannot quickly locate risks and abnormal nodes when the production process deviates from the production plan, seriously affecting production efficiency. In addition, the index systems constructed by different electronic product manufacturing workshops are mostly independently designed, highly dependent on the subjective experience of engineers, and once the business changes, the index system needs to be re-developed, with a relatively high development cost. Summary of the Invention

[0004] The invention purpose of the present invention is: aiming at all or part of the above problems, to provide an index system management system for an electronic product manufacturing workshop, as well as a construction method, device and product, so as to improve the integration degree of the index system and the electronic product manufacturing business from macro to micro, and improve the development efficiency of the index system.

[0005] The technical solution adopted by the present invention is as follows: An index system management system for an electronic product manufacturing workshop, which includes: A main dimension management unit, used for adding, deleting or modifying at least one main dimension of the index system; A sub-dimension management unit, used for adding, deleting or modifying at least one sub-dimension under each main dimension, and adding, deleting or modifying at least one component element for each sub-dimension; A node management unit, used for cross-combining the component elements of each sub-dimension under each main dimension to generate a management node set; An index management unit is used to add, delete, or modify management indexes for each main dimension and each management node respectively.

[0006] In another aspect of the present application, a method for constructing an index system for an electronic product manufacturing workshop is also provided, which includes: Construct at least one main dimension of the index system; Under each main dimension, construct at least one sub-dimension respectively, and construct the constituent elements of each sub-dimension respectively; For each main dimension, cross-combine the constituent elements of each sub-dimension thereunder to construct a management node set; Construct management indexes for each main dimension and each management node respectively.

[0007] In another aspect of the present application, an apparatus for constructing an index system for an electronic product manufacturing workshop is also provided, which includes: A main dimension construction unit is used to construct at least one main dimension of the index system according to the configuration; A sub-dimension construction unit is used to construct at least one sub-dimension respectively under each main dimension according to the configuration, and construct the constituent elements of each sub-dimension respectively; A node construction unit is used to cross-combine the constituent elements of each sub-dimension under each main dimension to construct a management node set; An index construction unit is used to construct management indexes for each main dimension and each management node respectively.

[0008] In another aspect of the present application, a computer program product is also provided, including a computer program, which when executed by a processor, can run the above-mentioned method for constructing an index system for an electronic product manufacturing workshop.

[0009] In summary, due to the adoption of the above technical solutions, the beneficial effects of the present invention are: The management system and construction plan for the indicator system of an electronic product manufacturing workshop provided by this application offer a general solution for constructing an indicator system in a complex electronic device manufacturing workshop. The main production elements involved in the workshop's production operations are decomposed according to the internal logical relationship of the main dimension and sub-dimensions, and a multi-level, multi-dimensional, and penetrable indicator system is constructed through the combination of the decomposed elements. On the one hand, it ensures the comprehensive integration of the indicator system with production operations and the full coverage of production operations from macro to micro. Once a deviation from the production plan occurs, risks and abnormal nodes can be promptly detected, facilitating the rapid positioning of the root cause of the failure. On the other hand, the indicator system follows a unified architecture. For different production operations, there is no need to develop the indicator system from scratch, which can significantly improve the development speed of the indicator system in this industry. In summary, this application can reflect the operating status of each level and dimension of the electronic product manufacturing workshop from macro to micro in real-time, comprehensively, and systematically, achieve indicator penetration from macro to micro, promptly detect risks and anomalies, and find the root cause, significantly enhancing the timeliness, accuracy, and efficiency of production manufacturing management. Description of the Drawings

[0010] The present invention will be described by way of examples with reference to the accompanying drawings, in which: Figure 1 is the structural diagram of the management system for the indicator system of an electronic product manufacturing workshop provided by an embodiment of this application.

[0011] Figure 2 is the indicator penetration diagram of the main dimension of process management in an embodiment of this application.

[0012] Figure 3 is the indicator penetration diagram of the main dimension of integrated manufacturing in an embodiment of this application.

[0013] Figure 4 is the indicator penetration diagram of the main dimension of quality management in an embodiment of this application.

[0014] Figure 5 is the indicator penetration diagram of the main dimension of cost management in an embodiment of this application.

[0015] Figure 6 is the schematic diagram of the three-dimensional element matrix of the main dimension of process management in an embodiment of this application.

[0016] Figure 7 is the schematic diagram of the management indicator format in an embodiment of this application.

[0017] Figure 8 is the schematic diagram of some management indicators of the main dimension of cost management in an embodiment of this application.

[0018] Figure 9 is the flowchart of the method for constructing the indicator system of an electronic product manufacturing workshop provided by an embodiment of this application.

[0019] Figure 10 It is a structural diagram of a device for constructing an index system for an electronic product manufacturing workshop provided by an embodiment of the present application. Detailed implementation manners

[0020] All features disclosed in this specification, or all steps in the disclosed methods or processes, except for mutually exclusive features and / or steps, can be combined in any manner.

[0021] Any feature disclosed in this specification (including any additional claims, abstract) can be replaced by other equivalent or similar-purpose alternative features unless specifically stated otherwise. That is, unless specifically stated otherwise, each feature is only an example of a series of equivalent or similar features.

[0022] Aiming at the problems of the current complex electronic equipment manufacturing workshop index system being incomplete, lacking objectivity, and having poor portability, an embodiment of the present application provides an electronic product manufacturing workshop index system management system, a construction method, a device, and a product, aiming to improve the integration degree of the index system and the electronic product manufacturing business from macro to micro, and improve the development efficiency of the index system.

[0023] As Figure 1 shown, the electronic product manufacturing workshop index system management system provided by an embodiment of the present application includes: A main dimension management unit, configured to add, delete, or modify at least one main dimension of the index system.

[0024] The index system management system provides the function for users to add, delete, or modify the main dimension. The so-called main dimension refers to the key aspects or production factors concerned in managing the electronic product manufacturing business. In the process of complex electronic equipment manufacturing, the integrated manufacturing process mainly includes assembly, debugging, testing, trial production, and inspection (abbreviated as assembly, debugging, testing, trial production, and inspection in sequence). In the manufacturing process, the process is the input and execution guarantee of the entire integrated manufacturing, the quality is related to whether the electronic product meets the usage requirements, and the cost is related to whether the electronic product can be successfully commercialized. Different dimensions have different focuses. Therefore, first, it is necessary to determine the main direction to be managed according to the actual production business, and the main dimension management unit is used to determine the main dimension to be managed.

[0025] As an optional implementation manner, in order to meet the requirements of high-efficiency, high-quality, and low-cost delivery of large-scale electronic product manufacturing workshops, in the electronic product manufacturing workshop index system, the main dimensions include process management A, integrated manufacturing B, quality management C, and cost management D. By performing addition, deletion, or modification operations in the main dimension management unit, four main dimensions of process management, integrated manufacturing, quality management, and cost management can be constructed.

[0026] In addition to the main dimensions, the indicator system can also include management indicators of non-main dimensions.

[0027] Sub-dimension management unit, used to add, delete or modify at least one sub-dimension under each main dimension, and add, delete or modify at least one component element for each sub-dimension.

[0028] The sub-dimension management unit provides the function for users to design different sub-dimensions respectively under each main dimension. Sub-dimensions belong to the concerned objects involved under the designed main dimension. And the component elements are the specific operations or production links involved according to the operation logic of the sub-dimension (such as PDCA logic, process group logic, life cycle logic, function logic, etc.). Through the indicator decomposition of the three levels of main dimension, sub-dimension and component element, the comprehensive integration with production business from macro to micro is realized.

[0029] For example, the sub-dimensions included under the four main dimensions designed in the above embodiments can be designed as follows: 1) Process management main dimension.

[0030] The sub-dimensions under Process Management A include: Process Life Cycle A1, Workshop Level A2, and Process A3.

[0031] For the process life cycle, its component elements can include: Process Design A11, Process Archiving A12, Process Usage A13, Process Change A14, and Process Obsolete A15.

[0032] For the workshop level, its component elements can include: Workshop A21, Production Line A22, Project A23, Batch A24, Set A25, and Process Step A26. Each component element at the workshop level has a hierarchical relationship. For example, Process Step A26 belongs to the most microscopic level, its upper level is Set A25, the next upper level is Batch A24, and so on, and the highest level is Workshop A21.

[0033] For the process, its component elements can include: Assembly A31, Commissioning A32, Testing A33, Experiment A34, and Inspection A35.

[0034] Finally, the process management main dimension contains 3 sub-dimensions, and each sub-dimension contains several component elements respectively. If each sub-dimension is represented in the form of an axis, 3 axes will be obtained. Then, using the element values of the axes to represent the component elements of the sub-dimension and performing an orthogonal combination of every 3 axes, a three-dimensional element matrix of the process management main dimension as shown in Figure 2 can be obtained, meeting the multi-dimensional and multi-level penetration management requirements for process management.

[0035] 2) Integrated manufacturing main dimension.

[0036] The sub-dimensions under integrated manufacturing B include: planning process group B1, shop floor level B2, and process B3.

[0037] For the planning process group B1, its components may include: production planning B11, resource distribution B12, operation execution B13, and production scheduling B14.

[0038] For the shop floor level B2 and process B3, their components are the same as those in the previous process management main dimension. To distinguish from the process management main dimension, the shop floor level and process under the integrated manufacturing main dimension are respectively identified as B2 and B3. The components of the shop floor level B2 are represented as: workshop B21, production line B22, project B23, batch B24, set B25, and process step B26. The components of the process B3 are represented as: assembly B31, commissioning B32, testing B33, experiment B34, and inspection B35.

[0039] Similar to the treatment method for the process management main dimension, a three-dimensional element matrix of the integrated manufacturing main dimension as shown in Figure 3 is obtained to meet the penetration management requirements for the multi-dimension and multi-level of integrated manufacturing.

[0040] 3) Quality management main dimension.

[0041] The sub-dimensions under quality management C include: quality process C1, shop floor level C2, and process C3.

[0042] For the quality process C1, its components may include: quality planning C11, quality execution C12, quality monitoring C13, and quality optimization C14.

[0043] For the shop floor level C2 and process C3, their components are the same as those in the previous process management main dimension. Similarly, to distinguish from the process management main dimension, the shop floor level and process under quality management C are respectively identified as C2 and C3. The components of the shop floor level C2 are represented as: workshop C21, production line C22, project C23, batch C24, set C25, and process step C26. The components of the process C3 are represented as: assembly C31, commissioning C32, testing C33, experiment C34, and inspection C35.

[0044] Similar to the treatment method for the process management main dimension, a three-dimensional element matrix of the quality management main dimension as shown in Figure 4 is obtained to meet the penetration management requirements for the multi-dimension and multi-level of quality management.

[0045] 4) Cost management main dimension.

[0046] The sub-dimensions under cost management D include: cost dimension D1, shop floor level D2, and execution process D3.

[0047] For the cost dimension D1, its constituent elements may include: materials, rework, labor, testing, and travel.

[0048] For the workshop level D2, its constituent elements are the same as those in the previous process management main dimension. However, for the sake of distinction, the constituent elements of the workshop level D2 are represented as: workshop D21, production line D22, project D23, batch D24, set D25, and process D26.

[0049] For the execution process D3, its constituent elements may include: planning D31, execution D32, adjustment D33, and closure D34.

[0050] Similar to the treatment of the process management main dimension, we obtain Figure 5 the three-dimensional element matrix of the cost management main dimension as shown, to meet the multi-dimensional and multi-level penetration management requirements of cost management.

[0051] The node management unit is used to cross-combine the constituent elements of each sub-dimension under each main dimension for each main dimension to generate a set of management nodes.

[0052] In some alternative embodiments, the node management unit obtains each constituent element from each sub-dimension for each main dimension and combines them, that is, traverses each sub-dimension separately and combines the currently traversed constituent elements from each sub-dimension. For example, in the process management main dimension, one constituent element is obtained from each of the three sub-dimensions: process life cycle A1, workshop level A2, and process A3. Suppose the constituent element obtained from the process life cycle A1 is "design A11", the constituent element obtained from the workshop level A2 is "workshop A21", and the constituent element obtained from the process A3 is "assembly A31". Then, the constituent elements of the three dimensions of "A11 design", "workshop A21", and "assembly A31" are combined.

[0053] In addition, the node management unit constructs the management node corresponding to each combination respectively. All the constructed management nodes form a set of management nodes. That is to say, after the main dimension, the sub-dimensions under each main dimension, and the constituent elements of each sub-dimension are determined, the node management unit can automatically generate management nodes to form a set of management nodes. All the management nodes together cover the multi-level, multi-dimensional, and penetrable management refinement requirements of the entire production task.

[0054] As an alternative embodiment, the management node unit can construct a multi-dimensional matrix for each main dimension based on all the sub-dimensions under it. The dimension of this multi-dimensional matrix is the same as the number of sub-dimensions, and each sub-dimension serves as a vector axis of one dimension of the multi-dimensional matrix. As Figure 6As shown, taking the main dimension of process management set above as an example, the process life cycle A1, the workshop level A2, and the process A3 are orthogonally connected as the axes of three dimensions respectively, and the constituent elements on each axis are used as the element values in the direction of that axis, so as to construct a three-dimensional element matrix. On this basis, a management node is generated at each cell of the multi-dimensional matrix. For example Figure 6 in Figure 6 , the management node "Production Line Assembly Process Usage Management A13-22-31" generated at the intersection of "Using A13", "Production Line A22" and "Assembly A31". The naming of this management node is constructed from the names of the constituent elements on the three involved dimensions and the corresponding coordinates. The management nodes generated on each cell of the multi-dimensional matrix form a management node set.

[0055] The index management unit is used to add, delete, or modify management indicators for each main dimension and each management node respectively.

[0056] In principle, the number of management indicators allowed to be designed for each main dimension and each management node can be unlimited. However, in this application, a comprehensive index system for production tasks has been constructed from macro to micro. Therefore, it is not necessary to design too many management indicators for each main dimension or management node. In some alternative embodiments, the index management unit is configured to: only allow no more than a set number (such as 2) of management indicators to be designed for each main dimension or management node respectively.

[0057] To distinguish the management indicators of the main dimension and the management node, the management indicators of the main dimension are called main indicators MI, and the management indicators of the management node are called process indicators PI. The index management unit is responsible for configuring the calculation methods of each main indicator MI and each process indicator PI.

[0058] The main dimension represents the direction that focuses on the production task. Therefore, the main indicator MI is mainly set from the perspective of the management main dimension around the final value output of the electronic product manufacturing workshop and the ultimate goal to support the value output. In addition, the main indicator MI needs to be set in combination with the KPI of the workshop given by external factors and the performance direction that the workshop focuses on. For example, the main indicator MI of process management A can be set as the process execution rate, and the main indicator MI of integrated manufacturing B can be set as the task completion rate, etc. There is a certain subordinate relationship between the main dimension and the management node, and the calculation data of the main indicator MI comes from the process indicator PI.

[0059] The process indicator PI belongs to the indicator constructed at the sub-dimension level. There is no hierarchical relationship among the sub-dimensions of the main dimension. However, there may be a superior-subordinate relationship within the same sub-dimension. In this regard, in some alternative implementation manners, the index management unit is configured to: For the management indicators corresponding to each component element under the same sub-dimension, when calculating the management indicators corresponding to the upper-level component element, the management indicator corresponding to the lower-level component element is used as the parent indicator.

[0060] For example, the sub-dimension at the workshop level includes 6 component elements: workshop, production line, project, batch, set, and process. The "workshop" has the highest level, followed by "production line", "project", "batch", "set", and "process" in sequence. These 6 component elements are decomposed layer by layer from the "workshop" to the "process", that is, the upper-level component element is decomposed into multiple lower-level component elements. Then, for the calculation of the management indicator corresponding to the "workshop", the management indicator corresponding to the "project" is used as the parent indicator. Similarly, for the calculation of the management indicator corresponding to the "production line", the management indicator corresponding to the "batch" is used as the parent indicator. The so-called parent indicator is the indicator relied on during calculation. The current indicator cannot be calculated without the parent indicator first.

[0061] In addition, in some alternative embodiments, the indicator management unit also decomposes the management indicators of each main dimension and management node in the time dimension. For example, according to five time scales: annual, quarterly, monthly, weekly, and daily, the management indicators are decomposed, that is, for each management indicator, the indicator reference values at the 5 time scales of annual, quarterly, monthly, weekly, and daily are respectively set.

[0062] The indicator management unit also uniformly manages each management indicator according to a predetermined format, and its format is as Figure 7 shown, including indicator main dimension, indicator number, indicator name, indicator description, indicator calculation formula, data extraction rule, value range, and unit, etc. According to this format, the indicator management unit can add, delete, or modify management indicators. For example, as Figure 8 shown, it is part of the management indicators generated under the main dimension of cost management, including 1 main indicator MI and 1 process indicator PI of cost management D.

[0063] Through the above management system, it is possible to construct and manage a multi-dimensional and multi-level penetrative indicator system for a complex electronic product manufacturing workshop, thereby ensuring the timeliness, accuracy, and efficiency of production task management.

[0064] According to the idea of the present application, the embodiments of the present application also provide a method for constructing an indicator system for an electronic product manufacturing workshop. This method can be based on the above management system or can be implemented independently. As Figure 9 shown, this method includes: S1. Construct at least one main dimension of the indicator system.

[0065] In some alternative embodiments, the constructed main dimensions include: process management A, integrated manufacturing B, quality management C, and cost management D.

[0066] S2. Construct at least one sub-dimension under each main dimension respectively, and construct the constituent elements of each sub-dimension respectively.

[0067] In some alternative embodiments, the sub-dimensions and constituent elements constructed under each main dimension include: 1) The main dimension of process management.

[0068] The sub-dimensions under process management A include: process life cycle A1, workshop level A2, and process A3.

[0069] For the process life cycle, its constituent elements may include: process design A11, process filing A12, process use A13, process change A14, and process invalidation A15.

[0070] For the workshop level, its constituent elements may include: workshop A21, production line A22, project A23, batch A24, set A25, and process step A26. Each constituent element of the workshop level has a hierarchical relationship. For example, process step A26 belongs to the most microscopic level, its upper level is set A25, and the next upper level is batch A24, and so on, and the highest level is workshop A21.

[0071] For the process, its constituent elements may include: assembly A31, commissioning A32, testing A33, experiment A34, and inspection A35.

[0072] 2) The main dimension of integrated manufacturing.

[0073] The sub-dimensions under integrated manufacturing B include: planning process group B1, workshop level B2, and process B3.

[0074] For the planning process group B1, its constituent elements may include: production planning B11, resource distribution B12, operation execution B13, and production scheduling B14.

[0075] For the workshop level B2, its constituent elements include: workshop B21, production line B22, project B23, batch B24, set B25, and process step B26.

[0076] For the process B3, its constituent elements include: assembly B31, commissioning B32, testing B33, experiment B34, and inspection B35.

[0077] 3) The main dimension of quality management.

[0078] The sub-dimensions under quality management C include: quality process C1, workshop level C2, and process C3.

[0079] For the quality process C1, its constituent elements may include: quality planning C11, quality execution C12, quality monitoring C13, and quality optimization C14.

[0080] For the workshop level C2, its constituent elements include: workshop C21, production line C22, project C23, batch C24, set C25, and process C26.

[0081] For the process C3, its constituent elements include: assembly C31, commissioning C32, testing C33, experiment C34, and inspection C35.

[0082] 4) The main dimension of cost management.

[0083] The sub-dimensions under cost management D include: cost dimension D1, workshop level D2, and execution process D3.

[0084] For the cost dimension D1, its constituent elements may include: materials, rework, labor, experiments, and travel.

[0085] For the workshop level D2, its constituent elements include: workshop D21, production line D22, project D23, batch D24, set D25, and process D26.

[0086] For the execution process D3, its constituent elements may include: planning D31, execution D32, adjustment D33, and closure D34.

[0087] In addition, in some feasible implementation manners, each sub-dimension is respectively represented in the form of an axis, and the constituent elements of the sub-dimension are represented by the element values of the axis.

[0088] S3. For each main dimension, cross-combine the constituent elements of each sub-dimension under it to construct a set of management nodes.

[0089] In some alternative implementation manners, for each main dimension, obtain each constituent element from each sub-dimension respectively for combination, and for each combination, construct the management node corresponding to the combination respectively. All management nodes form a set of management nodes.

[0090] S4. Construct management indicators for each main dimension and each management node respectively.

[0091] Constructing management indicators includes the process of configuring management indicator calculation methods. Among them, for the management indicators corresponding to the constituent elements under the same sub-dimension, when calculating the management indicators corresponding to the upper-level constituent elements, the management indicators corresponding to the lower-level constituent elements are used as the parent indicators.

[0092] In addition, the management indicators of each main dimension and each management node can be respectively decomposed into indicators in the time dimension.

[0093] The embodiment of the present application also provides a device for constructing an index system for an electronic product manufacturing workshop, as Figure 10 shown. The construction device includes: A main dimension construction unit, configured to construct at least one main dimension of the index system according to the configuration.

[0094] A sub-dimension construction unit, configured to respectively construct at least one sub-dimension under each main dimension according to the configuration, and respectively construct the constituent elements of each sub-dimension.

[0095] A node construction unit, configured to, for each main dimension, perform cross-combinations on the constituent elements of each sub-dimension thereunder to construct a set of management nodes.

[0096] An index construction unit, configured to construct management indicators for each main dimension and each management node respectively.

[0097] The specific data configured for each unit of the above construction device may refer to the features designed in each step of the foregoing construction method.

[0098] In addition, the embodiment of the present application also provides a computer program product, including a computer program, which when executed by a processor, can run the method for constructing an index system for an electronic product manufacturing workshop in the above embodiment.

[0099] The present invention is not limited to the foregoing specific embodiments. The present invention extends to any new feature or any new combination disclosed in this specification, as well as any new method or process step or any new combination disclosed.

Claims

1. An index system management system for an electronic product manufacturing workshop, characterized in that, including: a main dimension management unit for adding, deleting, or modifying at least one main dimension of an index system; a sub-dimension management unit for adding, deleting, or modifying at least one sub-dimension under each main dimension, and adding, deleting, or modifying at least one constituent element for each sub-dimension; a node management unit for cross-combining the constituent elements of each sub-dimension under each main dimension to generate a management node set; an index management unit for adding, deleting, or modifying management indexes for each main dimension and each management node respectively.

2. The management system for the index system of the electronic product manufacturing workshop according to claim 1, wherein, The sub-dimension management unit is configured to: represent each sub-dimension in the form of an axis for each main dimension, and represent the constituent elements of the sub-dimension with the element values of the axis.

3. The management system for the index system of the electronic product manufacturing workshop according to claim 1, characterized in that, The node management unit is configured to: obtain each constituent element from each sub-dimension respectively for each main dimension for combination, and construct a management node corresponding to the combination; all the management nodes form the management node set.

4. The management system for the index system of an electronic product manufacturing workshop according to claim 2, wherein, The node management unit is configured to: construct a multi-dimensional matrix based on all sub-dimensions for each main dimension, where the dimension of the multi-dimensional matrix is the same as the number of sub-dimensions; generate a management node at each unit of the multi-dimensional matrix; all the management nodes form the management node set.

5. The management system for the indicator system of an electronic product manufacturing workshop according to claim 1, wherein, The index management unit is configured to: perform index decomposition in the time dimension for the management indexes of each main dimension and each management node respectively.

6. The management system for the index system of the electronic product manufacturing workshop according to claim 1, wherein, The main dimensions include: process management, integrated manufacturing, quality management, and cost management; The sub-dimensions under the process management include: process life cycle, workshop level, and process; The sub-dimensions under the integrated manufacturing include: planning process group, workshop level, and process; The sub-dimensions under the quality management include: quality process, workshop level, and process; The sub-dimensions under the cost management include: cost dimension, workshop level, and execution process.

7. The management system for the index system of an electronic product manufacturing workshop according to any one of claims 1-6, characterized in that The index management unit is configured to: configure the calculation methods of each management index; wherein, for the management indexes corresponding to the constituent elements under the same sub-dimension, when calculating the management index corresponding to the upper-level constituent element, the management index corresponding to the lower-level constituent element is used as the parent index.

8. A method for constructing an index system for an electronic product manufacturing workshop, characterized in that, including: constructing at least one main dimension of an index system; respectively constructing at least one sub-dimension under each main dimension, and respectively constructing the constituent elements of each sub-dimension; cross-combining the constituent elements of each sub-dimension under each main dimension to construct a management node set; constructing management indexes for each main dimension and each management node respectively.

9. An apparatus for constructing an index system for an electronic product manufacturing workshop, characterized in that, including: a main dimension construction unit for constructing at least one main dimension of an index system according to the configuration; a sub-dimension construction unit for respectively constructing at least one sub-dimension under each main dimension according to the configuration, and respectively constructing the constituent elements of each sub-dimension; a node construction unit for cross-combining the constituent elements of each sub-dimension under each main dimension to construct a management node set; an index construction unit for constructing management indexes for each main dimension and each management node respectively.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it can run the method for constructing an index system for an electronic product manufacturing workshop as described in claim 8.

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