Method for measuring two-dimensional distribution of impurities in divertor area of nuclear fusion device
By using a visible light imaging system and mathematical inversion methods, the problems of regional coverage and accuracy in measuring impurity distribution in nuclear fusion devices have been solved, achieving high spatial resolution impurity distribution measurement and optimizing the design and operational stability of fusion devices.
Patent Information
- Application Number
- CN202511110133.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-08
- Publication Date
- 2025-11-07
AI Technical Summary
Existing methods for measuring two-dimensional impurity distribution have limited coverage areas and low accuracy in nuclear fusion devices, affecting plasma confinement quality and fusion efficiency. Furthermore, existing vacuum ultraviolet systems are difficult to accurately measure impurity distribution in the divertor region.
A visible light imaging system is used to acquire plasma radiation image data, perform image correction and absolute calibration, and combine narrowband filters and mathematical inversion to achieve high spatial resolution measurement of impurity distribution.
It provides high-precision information on impurity distribution, which helps in the study of impurity transport mechanisms, optimizes the design of fusion devices, and improves plasma performance and device stability.