A load and probe connection positioning system for power amplifier module testing and calibration method
By combining real-time image acquisition and algorithm analysis with a graded calibration mechanism, the problem of test data distortion caused by the installation posture deviation of the power amplifier module was solved, achieving accurate posture calibration and an efficient testing process.
CN121656942BActive Publication Date: 2026-07-24SHANGHAI SHENGZHOU JUNENG SEMICONDUCTOR TECHNOLOGY CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI SHENGZHOU JUNENG SEMICONDUCTOR TECHNOLOGY CO LTD
- Filing Date
- 2025-12-10
- Publication Date
- 2026-07-24
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Figure CN121656942B_ABST
Abstract
The application discloses a load and probe connection positioning system for power amplifier module testing and a calibration method, relates to the technical field of connection positioning, and has the following principle: when the probe moves downward, a camera collects images in real time, the posture of the power amplifier module is judged by analyzing the contact profile, and if the posture is normal, direct testing is completed; if there is only horizontal deviation, testing is performed after realignment; if there is warping, different pressures are repeatedly applied to correct and eliminate the warping, multiple detection and analysis are performed to improve the trend, and continuous circulation optimization is performed until the posture is normal; if the posture cannot still be effectively adjusted, an alarm is sent. The application converts artificial experience judgment into quantitative calculation based on area, position and shape by means of real-time collection of the camera and algorithm analysis, constructs a module posture abnormal coefficient model, and accurately distinguishes various states; a hierarchical intelligent calibration mechanism is adopted to differentially process, closed-loop feedback is formed by combining trend improvement analysis, calibration accuracy is ensured, and test efficiency is significantly improved.
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Citation Information
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