Wheat high-quality disease-resistant synergistic improvement method based on creation and utilization of T1DL.1 VS translocation line

By creating the wheat-fleshed wheat T1DL.1VS translocation line and integrating the Pm67 and Glu-V1 genes, the problems of disease resistance and quality in wheat breeding were solved, and the high-efficiency breeding of powdery mildew resistant, high-quality, strong gluten wheat varieties was achieved.

CN122128462APending Publication Date: 2026-06-02NANJING AGRICULTURAL UNIVERSITY
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Patent Information

Application Number
CN202610513973.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-04-17
Publication Date
2026-06-02

AI Technical Summary

Technical Problem

Existing technologies make it difficult to efficiently breed wheat varieties that are resistant to powdery mildew and have high-quality, strong gluten, mainly because disease-resistant genes and quality genes are distributed on different chromosomes, resulting in high breeding difficulty and low efficiency.

Method used

By creating the wheat-fungi T1DL.1VS translocation line, the powdery mildew resistance gene Pm67 and the quality gene Glu-V1 were combined and co-segregated on the 1VS chromosome arm. Co-dominant molecular marker screening and morphological marker selection were used to achieve simultaneous improvement of wheat quality and powdery mildew resistance.

Benefits of technology

It significantly improved the powdery mildew resistance and gluten quality of wheat, increased breeding efficiency, and enabled the efficient breeding of disease-resistant, high-quality, and strong-gluten wheat varieties.

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Abstract

The invention discloses a wheat high-quality disease-resistant synergistic improvement method based on creation and utilization of a T1DL.1 VS translocation line. In order to solve the problem of low breeding efficiency caused by dispersion of a disease-resistant gene and a quality gene, a T1DL.1 V # 4S translocation line NAU195 carrying Glu-V1 and a T1DL.1 V # 5S translocation line NAU196 carrying Pm67 are hybridized, a recombinant single plant is screened in an F2 generation, and a novel T1DL.1 VS translocation line polymerizing Pm67 / Glu-V1 is created; and by utilizing the co-separation characteristic of the translocation line and the wax inhibitor gene IW-V1, a double-marker selection system combining a morphological marker and an NAU1VS-1 molecular marker is established, and the double-marker selection system is introduced into a high-yield variety background. The translocation line has no significant negative effect on yield traits, the bred new line has high powdery mildew resistance, the bread processing quality is significantly improved, and synergistic and efficient improvement of wheat disease resistance and processing quality is realized.
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