A polarized stress detection device suitable for large crystal materials

Abstract

This invention provides a polarization stress detection device suitable for large crystal materials, including a base, a light source, and a first polarizer, a waveplate, and a second polarizer arranged parallel to each other at both ends of the base. A fixing device consisting of two parallel guide rails and two rollers is provided between the two polarizers. The two ends of the roller core are placed in the sliding grooves of the guide rails and are engaged with positioning holes on the top surface of the guide rails by pins, enabling flexible adjustment and secure fixing of the roller spacing. The roller consists of a core and a bushing connected by bearings, facilitating crystal rotation. Furthermore, the device includes a ramp bridge, the top surface of which is flush with the highest point of the roller to achieve stable, impact-free loading of the crystal. This invention effectively solves the problems of fragile loading, difficult rotation, and incompatibility with different sizes of large crystals in polarization stress detection, offering advantages such as high safety, labor-saving operation, and strong versatility.

Description

Technical Field

[0001] This utility model relates to the field of physics, and more particularly to optical measuring instruments, especially a polarization stress detection device suitable for large crystal materials. Background Technology

[0002] A polarized light stress meter, also known as a polarized light detector or stress observer, is an optical instrument that uses polarized light to qualitatively or quantitatively detect residual stress within transparent, isotropic crystalline materials. A polarized light stress meter can detect internal stresses invisible to the naked eye. These internal stresses are generally caused by uneven temperature changes or external forces during the production process. Excessive residual stress can significantly reduce the mechanical strength, thermal stability, and optical homogeneity of the material, potentially leading to spontaneous breakage of the product during transportation, use, or subsequent processing.

[0003] A polarizing stress meter typically consists of a light source, a waveplate, and two polarizers. The polarization directions of the two polarizers are orthogonal to each other, and the fast axis of the waveplate is orthogonal to the polarization direction of the first polarizer. The waveplate and the second polarizer can rotate 360° around the optical axis. When a sample with internal stress is placed between the first polarizer and the waveplate, light passes through the first polarizer, then through the sample, then through the waveplate, and finally through the second polarizer, allowing observation of bright and dark colored fringes. The density and color of the fringes directly reflect the magnitude and distribution of the internal stress in the sample.

[0004] In existing technologies, ordinary polarizing stress meters are generally suitable for small to medium-sized crystal samples, where the sample simply needs to be placed between the two polarizers. However, the testing of large crystal samples requires the use of a specially designed large polarizing stress meter. Unlike ordinary polarizing stress meters, large polarizing stress meters present the following drawbacks and difficulties during testing:

[0005] 1. To avoid impacts, large crystals are usually placed in large polarizers by means of hoisting. However, the impact of falling crystals can easily cause them to break or their edges to be damaged. In addition, hoisting is cumbersome and inefficient.

[0006] 2. During the testing process, it is necessary to continuously rotate the crystal to observe the stripe pattern, but large crystals are heavy and difficult to rotate.

[0007] 3. The crystal being tested needs to be entirely within the polarizer's illumination range. Large crystals are difficult to adjust in position and are also difficult to adapt to crystals of different sizes. Utility Model Content

[0008] The purpose of this invention is to provide a polarization stress detection device suitable for large crystal materials. This polarization stress detection device for large crystal materials aims to solve the technical problems of difficulty in loading, difficulty in rotation, and difficulty in adapting to different specifications in the prior art.

[0009] This utility model provides a polarization stress detection device suitable for large crystal materials. A first polarizer is disposed at one end of the base, and a waveplate and a second polarizer are disposed at the other end. The first polarizer, waveplate, and second polarizer are arranged in parallel sequence. A light source is disposed on the side of the base near the first polarizer. A fixing device is disposed between the first polarizer and the second polarizer. The fixing device comprises two guide rails and two rollers; the guide rails are fixedly disposed on the base; the two guide rails are parallel to each other; a sliding groove is formed on the side of each guide rail along its length; the top of each guide rail... A row of first positioning holes is formed along the length direction of the roller shaft; each of the roller shafts includes a shaft core and a bushing, the bushing being coaxially sleeved on the shaft core; both ends of the shaft core are respectively set in the sliding grooves of the two guide rails; the two roller shafts are parallel to each other, and the roller shafts are perpendicular to the first polarizer and the second polarizer; a second positioning hole is formed at both ends of the side surface of each of the shaft cores; the first positioning hole and the second positioning hole on the same side are connected by a pin; a ramp bridge is included, the ramp bridge is located between the two guide rails, and the highest point of the ramp bridge and the highest point of the bushing are located on the same horizontal plane.

[0010] Furthermore, the first positioning holes on the guide rail are evenly distributed.

[0011] Furthermore, the bushing is rotatably connected to the shaft core via two or more bearings.

[0012] Furthermore, a buffer layer is provided on the surface of the bushing.

[0013] Furthermore, a buffer layer is also provided on the surface of the ramp approach bridge.

[0014] Compared with existing technologies, the advantages of this invention are positive and obvious:

[0015] 1. This utility model achieves low-impact, stable rolling loading of large crystal materials through a ramp approach bridge. It avoids the instantaneous impact force caused by the suspension and falling of traditional hoisting methods, reducing the risk of crystal breakage or edge chipping due to bumps and vibrations during placement, making it safe and efficient.

[0016] 2. This utility model utilizes a rolling roller structure composed of a shaft core, bushing, and bearings to transform the sliding friction between the crystal and the support into rolling friction. When it is necessary to rotate the crystal to observe stress stripes at different angles, the operator only needs to apply a small force to easily rotate the heavy, large crystal on the roller, reducing labor intensity and improving detection efficiency and ease of operation.

[0017] 3. This utility model achieves flexible, precise, and secure adjustment of the distance between two roller shafts through the cooperation of guide rails, sliding grooves, first positioning holes, second positioning holes, and pins. This allows for stable support and testing of large crystal materials of various widths, and ensures that the area to be tested on the crystal is precisely located in the effective optical path between the two polarizers. It is highly versatile and avoids the cost of customizing equipment for crystals of different sizes. Attached Figure Description

[0018] Figure 1 A schematic diagram of the structure of an embodiment of this utility model.

[0019] Figure 2 A schematic diagram of the fixing device in this embodiment of the present invention.

[0020] Figure 3 A cross-sectional structural diagram of an embodiment of this utility model.

[0021] In the figure: 1. Base; 2. Guide rail; 201. Sliding groove; 202. First positioning hole; 3. Roller shaft; 301. Shaft core; 302. Bushing; 303. Second positioning hole; 4. First polarizer; 5. Second polarizer; 6. Light source; 7. Inclined approach bridge; 8. Lens under test; 9. Pin; 10. Wave plate. Detailed Implementation

[0022] The following embodiments will further illustrate the present invention, but are not intended to limit the present invention.

[0023] like Figures 1 to 3 As shown, this embodiment provides a polarization stress detection device suitable for large crystal materials, including a base 1, a light source 6, a first polarizer 4, a second polarizer 5, a waveplate 10, and a fixing device.

[0024] The base 1 is a stable, rigid platform. A first polarizer (4) is mounted on one end of the base 1 via a support frame, and a waveplate 10 and a second polarizer 5 are mounted on the other end via a support frame. The first polarizer 4, waveplate 10, and second polarizer 5 are arranged in parallel. The polarization directions of the first polarizer 4 and the second polarizer 5 are adjusted to be orthogonal to form a dark field background. A light source 6 is provided near the first polarizer 4 next to the base 1. This light source 6 is preferably a light source with a small divergence angle and uniform brightness to ensure coverage of the detection area of ​​the large crystal.

[0025] A fixing device is mounted on the base 1 and located between the first polarizer 4 and the second polarizer 5, for safely and flexibly supporting and rotating large crystals. The fixing device includes two guide rails 2 and two rollers 3.

[0026] Two guide rails 2 are fixedly welded to the upper surface of the base 1. The two guide rails 2 are parallel to each other, and their length direction is perpendicular to the optical path direction. On the side of each guide rail 2, a sliding groove 201 is formed along its length direction. This groove is used to accommodate and guide the end of the roller 3. At the same time, on the top surface of each guide rail 2, a row of evenly distributed first positioning holes 202 is formed along its length direction.

[0027] The two rollers 3 are parallel to each other, and their axes are perpendicular to the planes of the first polarizer 4 and the second polarizer 5, to ensure that the relative positions of each part of the crystal with respect to the polarizers remain unchanged when the crystal rotates. Each roller 3 consists of a core 301 and a sleeve 302. The sleeve 302 is coaxially mounted on the core 301 through two bearings at both ends, allowing the sleeve 302 to rotate very smoothly relative to the core 301.

[0028] To further protect the crystal surface, this embodiment wraps a buffer layer around the outer surface of the bushing 302. This buffer layer can be made of soft materials such as rubber, silicone, or polyurethane. The two ends of the shaft core 301 are respectively placed within the sliding grooves 201 of the two guide rails 2, allowing the entire roller shaft 3 to slide along the guide rails 2. A second positioning hole 303 is provided at both ends of the side of each shaft core 301.

[0029] When it is necessary to adjust the distance between the two rollers 3 to accommodate crystals of different widths, the operator pushes the rollers 3 along the sliding groove 201 of the guide rail 2 to the desired position. At this time, the second positioning holes 303 at both ends of the shaft core 301 are aligned with the corresponding first positioning holes 202 on the top surface of the guide rail 2. Then, the pins 9 are inserted into the first positioning holes 202 and the second positioning holes 303 on the same side to lock the rollers 3 in this position, preventing them from moving when bearing weight or when the crystal rotates.

[0030] The device also includes a ramp bridge 7. The ramp bridge 7 is detachably mounted on the base 1 between the two guide rails 2. Its end near the outer side of the device has a lower inlet, extending inward so that the upper surface of its highest point is at the same level as the highest point of the rear bushing 302 carrying the crystal. Similarly, for anti-slip and cushioning purposes, a buffer layer is also provided on the surface of the ramp bridge 7 in this embodiment.

[0031] The working process of this utility model is as follows:

[0032] 1. Preparation: Adjust the distance between the two rollers 3 according to the width of the crystal 8 to be tested, so that the distance is slightly smaller than the width of the crystal 8, and lock them in place using the pins 9. Turn on the light source 6, and confirm that the first polarizer 4 and the second polarizer 5 are orthogonal, and the field of view is dark.

[0033] 2. Loading the crystal: Align the inlet of the ramp bridge 7 with the roller 3. Place the crystal 8 to be tested near the inlet of the ramp bridge 7, and then slowly push the crystal 8 to roll smoothly up the ramp bridge 7 onto the roller 3 until the crystal 8 rolls between the two rollers 3. Note that crystals that are too heavy and may pose a danger to personnel when pushed are not suitable for this device.

[0034] 3. Testing: The operator can stand beside the device and gently rotate the waveplate 10 by hand. Once obvious bright and dark fringes appear, the second polarizer 5 can be rotated appropriately to find an image with suitable brightness. Then, the crystal 8 under test is rotated. Because the bushing 302 rotates flexibly on the shaft core 301 via bearings, the heavy crystal can easily rotate on the roller 3. During rotation, the stress distribution in different directions inside the crystal is assessed by observing the changes in the interference fringes behind the second polarizer 5.

[0035] In the description of this utility model, it should be understood that the terms "upper," "lower," "front," "rear," "left," "right," "top," "bottom," "inner," and "outer," etc., indicating orientation or positional relationships, are based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present invention. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present utility model.

Claims

1. A polarization stress detection device suitable for large crystal materials, comprising a base (1), wherein a first polarizer (4) is disposed at one end of the base (1), and a waveplate (10) and a second polarizer (5) are disposed at the other end, the first polarizer (4), the waveplate (10) and the second polarizer (5) being arranged in parallel in sequence; a light source (6) is disposed on the side of the base (1) near the first polarizer (4), and a fixing device is disposed between the first polarizer (4) and the second polarizer (5), characterized in that: The fixing device includes two guide rails (2) and two rollers (3); The guide rail (2) is fixedly mounted on the base (1); the two guide rails (2) are parallel to each other; a sliding groove (201) is provided on the side of any one of the guide rails (2) along the length direction; a row of first positioning holes (202) is provided on the top surface of any one of the guide rails (2) along the length direction. Each of the roller shafts (3) includes a shaft core (301) and a bushing (302), the bushing (302) being coaxially sleeved on the shaft core (301); the two ends of the shaft core (301) are respectively disposed in the sliding through grooves (201) of the two guide rails (2); the two roller shafts (3) are parallel to each other, and the roller shafts (3) are perpendicular to the first polarizer (4) and the second polarizer (5); Each of the aforementioned shaft cores (301) has a second positioning hole (303) at both ends of its side surface; the first positioning hole (202) and the second positioning hole (303) on the same side are connected by a pin (9); It also includes a ramp approach bridge (7), which is located between the two guide rails (2), and the highest point of the ramp approach bridge (7) is on the same horizontal plane as the highest point of the bushing (302).

2. The polarization stress detection device for large crystal materials according to claim 1, characterized in that: The first positioning holes (202) on the guide rail (2) are evenly distributed.

3. The polarization stress detection device for large crystal materials according to claim 1, characterized in that: The bushing (302) is rotatably connected to the shaft core (301) via two or more bearings.

4. The polarization stress detection device for large crystal materials according to claim 1, characterized in that: The bushing (302) has a buffer layer on its surface.

5. The polarization stress detection device for large crystal materials according to claim 4, characterized in that: The surface of the ramp approach bridge (7) is also provided with a buffer layer.

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