An electric testing fixture for inner arc variable cross-section L-shaped terminals

By designing an internal arc variable cross-section L-shaped terminal electrical test fixture, adopting an L-shaped connecting force arm and variable cross-section structure, combining a deep U-shaped structure and arc surface design, the problems of traditional test fixtures' connection failure and low detection efficiency are solved, and efficient and reliable testing performance and miniaturized design are achieved.

CN111426861BActive Publication Date: 2025-05-06HONG RI DA TECH CO LTD
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Patent Information

Application Number
CN202010436349.5
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2020-05-21
Publication Date
2025-05-06
Estimated Expiration
2040-05-21

AI Technical Summary

Technical Problem

Traditional test fixtures are prone to failure of connection, broken terminals or poor deformation after long-term connection, which affects the testing efficiency and small contact surfaces lead to low detection efficiency and poor reliability.

Method used

Design an internal arc variable cross-section L-shaped terminal electrical measuring tool, adopting an L-shaped connecting force arm and variable cross-section structure to form a bending load and optimize stress distribution, combining a deep U-shaped structure and arc surface design to improve the service life and test reliability of the terminal piece, and realize a miniaturized design.

Benefits of technology

It realizes stable and reliable test performance, improves the service life and test reliability of terminal chips, can achieve up to 1 million times of plug-in times, and realizes miniaturized design, saving R&D cycle and cost.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses an inner arc variable cross-section L-shaped terminal electrical testing fixture, which includes a plastic shell, a plurality of terminal pieces placed in the plastic shell and partially exposed, the terminal piece includes a support welding foot plug plate, an L-shaped connecting force arm extending forward from the front edge of the support welding foot plug plate, and a contact piece formed by bending upward from the free end of the L-shaped connecting force arm, the L-shaped connecting force arm includes a horizontal support section, and a first vertical connecting section formed by bending downward from the free end of the horizontal support section, and the free end surface of the contact piece is provided with an inner concave arc surface. The present invention has stable and reliable testing performance, high structural strength, long service life, and can achieve miniaturized design.
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Description

[Technical field]

[0001] The invention belongs to the technical field of electric testing fixtures, and in particular relates to an inner arc type variable cross-section L-shaped terminal electric testing fixture. [Background technology]

[0002] Various devices and products with circuit boards are inevitably subject to electrical performance tests during the manufacturing process to detect whether their internal circuits are qualified and whether there are short circuits. When conducting electrical performance tests, it is necessary to use a connection structure to plug in with the corresponding part of the product circuit board to connect the circuit before testing can be performed. On the automated production line, as the manufacturing efficiency of products gradually improves, the efficiency of product testing also gradually improves. The frequency of plug-in of test fixtures for testing products on the production line is greatly increased. After a long period of plug-in connection, the test fixture connection often fails or the terminal breaks, or the terminal is deformed and the connection is poor and unstable, which seriously affects the test efficiency. In addition, the contact surface of the traditional test head when in contact with the product to be tested is very small, and electrical contact is used, resulting in a very small tolerance value, low detection efficiency and poor reliability of the detection result. In addition, the traditional test head is composed of different materials, and the up and down floating of the contact terminal is achieved by spring pressure, which is greatly limited in realizing miniaturized design, seriously affecting the size of the test fixture for miniaturized design.

[0003] Therefore, it is necessary to provide a new inner arc variable cross-section L-shaped terminal electrical testing fixture to solve the above problems. [Summary of the invention]

[0004] The main purpose of the present invention is to provide an inner arc variable cross-section L-shaped terminal electrical testing fixture, which has stable and reliable testing performance, high structural strength, long service life, and can achieve miniaturized design.

[0005] The present invention achieves the above-mentioned purpose through the following technical scheme: an inner arc variable cross-section L-shaped terminal electrical testing fixture, which includes a plastic shell, a plurality of terminal pieces placed in the plastic shell and partially exposed, the terminal piece includes a supporting weld foot plug plate, an L-shaped connecting force arm extending forward from the front edge of the supporting weld foot plug plate, and a contact piece formed by bending upward from the free end of the L-shaped connecting force arm, the L-shaped connecting force arm includes a horizontal supporting section, a first vertical connecting section formed by bending downward from the free end of the horizontal supporting section, and the free end surface of the contact piece is provided with an inner concave arc surface.

[0006] Furthermore, the supporting solder pin insert is welded to the PCB circuit board at the bottom.

[0007] Furthermore, the horizontal support section is a variable cross-section structure with a cross-section gradually decreasing from the support weld foot plug plate end toward the other end.

[0008] Furthermore, the contact piece includes a second vertical connecting section located at the bottom and a contact part located above the second vertical connecting section.

[0009] Furthermore, the second vertical connecting section is a variable cross-section structure whose cross-section gradually decreases from bottom to top.

[0010] Furthermore, the bottom of the contact piece is transitionally connected to the first vertical connecting section through an arc portion to form a U-shaped structure.

[0011] Furthermore, a chamfer is provided at the inflection point of the U-shaped structure.

[0012] Furthermore, the intersection of the four sides of the contact part is an arc surface structure.

[0013] Furthermore, the center distance between two adjacent terminal pieces is greater than or equal to 0.3 mm.

[0014] Furthermore, the upper end of the contact portion of the terminal piece is exposed outside the upper surface of the plastic housing, and the bottom of the supporting solder foot plug board is exposed outside the lower surface of the plastic housing.

[0015] Compared with the prior art, the beneficial effects of the inner arc variable cross-section L-shaped terminal electrical testing fixture of the present invention are: through the structural design of the L-shaped connecting force arm, the contact piece is provided with telescopic deformation support, and the load formed is a bending load, which effectively improves the service life of the terminal piece; further, the horizontal section of the L-shaped connecting force arm adopts a variable cross-section structural design to optimize its internal stress distribution, effectively avoid stress concentration, and thus improve the service life. The combination of these two structural features can make the product plug-in times up to more than 1 million times; the connection between the contact piece and the L-shaped connecting force arm forms a deep U-shaped joint The structure can reduce the bending moment of the terminal, avoid stress concentration, and improve the stability of the contact piece pressing down, thereby improving the reliability of the test; arc structures or chamfered structures are set at multiple positions where the terminal piece may contact the plastic shell, effectively avoiding the terminal piece from scratching the plastic shell and affecting the test results; by changing the structure of the electrical test fixture, the traditional spring pressure is cancelled to achieve up and down floating, so that the minimum pitch value is only 0.3mm, and the minimum test width is only 0.8mm. The entire structure can realize modular design, saving R&D cycle and R&D cost, and laying a decisive foundation for miniaturization design.

Brief Description of the Drawings

[0016] Figure 1 It is a schematic diagram of the three-dimensional structure of an embodiment of the present invention;

[0017] Figure 2 is a schematic cross-sectional structural diagram of an embodiment of the present invention;

[0018] Figure 3This is a schematic diagram of the structure of the terminal piece in an embodiment of the present invention;

[0019] Figure 4 This is a schematic diagram of the structure of the contact position between the embodiment of the present invention and the product to be tested;

[0020] The numbers in the figure represent:

[0021] 100 inner arc variable cross-section L-shaped terminal electrical testing fixture;

[0022] 1 plastic shell, 11 hollow cavity;

[0023] 2 terminal piece, 21 supporting welding foot plug board, 22 L-shaped connecting force arm, 221 horizontal supporting section, 222 first vertical connecting section, 23 contact piece, 231 concave arc surface, 232 second vertical connecting section, 233 contact part, 24 arc part. [Specific implementation method]

[0024] Example:

[0025] Please refer to Figure 1-Figure 4 The present embodiment is an inner arc type variable cross-section L-shaped terminal electrical testing fixture 100, which includes a plastic housing 1, a plurality of terminal pieces 2 placed in the plastic housing 1 and partially exposed, the terminal piece 2 includes a support soldering foot plug board 21 welded to the circuit board at the bottom, an L-shaped connecting force arm 22 extending forward from the front edge of the support soldering foot plug board 21, and a contact piece 23 formed by bending upward from the free end of the L-shaped connecting force arm 22, the L-shaped connecting force arm 22 includes a horizontal supporting section 221, and a first vertical connecting section 222 formed by bending downward from the free end of the horizontal supporting section 221, and the free end surface of the contact piece 23 is provided with an inner concave arc surface 231. Through the structural design of the L-shaped connecting force arm 22, the L-shaped structure is adopted, so that the load borne by the connecting force arm section is a bending load, thereby effectively improving the material life and service life of the terminal piece 2. Through the structural design of the concave arc surface 231, the concave arc surface is used to fit the product to be tested, which greatly improves the fit with the upper surface contour of the product and improves the contact stability, thereby ensuring the stability and reliability of the test process.

[0026] The supporting solder pin inserting plate 21 is soldered to the PCB circuit board at the bottom.

[0027] The horizontal support section 221 is a variable cross-section structure, and the cross-section gradually decreases from one end of the supporting welding foot plug plate 21 to the other end, forming a variable cross-section structure with one end being thick and the other free end being thin.

[0028] The contact piece 23 includes a second vertical connection section 232 at the bottom and a contact part 233 at the upper part of the second vertical connection section 232. The second vertical connection section 232 is a variable cross-section structure, and the cross-section gradually decreases from bottom to top, forming a variable cross-section structure with a thicker bottom end and a thinner top end.

[0029] Through the variable cross-section structural design of the second vertical connecting section 232 and the horizontal supporting section 221, the stress distribution inside the terminal piece 2 is optimized, and the service life of the electrical testing fixture is greatly improved. After actual verification, the service life of the electrical testing fixture can reach more than 1 million plug-in times.

[0030] The bottom of the contact piece 23 is transitionally connected to the first vertical connection section 222 through an arc portion 24 to form a U-shaped structure, and a chamfer is provided at the inflection point of the U-shaped structure. The chamfer design prevents the upward and downward telescopic movement of the contact piece 23 from scratching the plastic housing 1 during operation. The design of the U-shaped structure can effectively reduce the terminal bending moment to avoid stress concentration, thereby improving the stability of the contact piece 23 when pressed down.

[0031] The intersection of the four sides of the contact part 233 is an arc surface structure, which effectively prevents the contact part 233 from scratching the plastic housing 1 when pressed down, thereby affecting the test result.

[0032] The cross-sectional dimension of the contact portion 233 is greater than the cross-sectional dimension of the second vertical connection section 232 , so as to ensure the structural strength of the contact portion 233 and prevent the contact portion 233 from being squeezed and deformed when in contact with the product to be tested, thereby affecting the test result.

[0033] In the plastic housing 1, the center distance between two adjacent terminal pieces 2 is greater than or equal to 0.3mm, and the minimum pitch value can reach 0.3mm, realizing the miniaturized design of the test fixture, which can cover almost all current connector product sizes and has good compatibility. The number of terminal pieces 2 can be flexibly designed according to the test requirements during design, and is compatible with different product series. For the test of products in the same series, the required number of terminal pieces 2 can be flexibly installed on the same plastic housing 1 to meet the test of products with different PIN numbers in the same series of products, eliminating the need for additional development and production of test fixtures and saving costs. The test width of the electrical testing fixture of this embodiment can be as small as 0.8mm, and the test width is flexibly adjustable, which is compatible with different product series and has strong applicability.

[0034] The upper end of the contact portion 233 of the terminal piece 2 is exposed outside the upper surface of the plastic housing 1 , and the bottom of the supporting solder foot plug board 21 is exposed outside the lower surface of the plastic housing 1 .

[0035] A hollow cavity 11 for accommodating the terminal piece 2 is formed inside the plastic housing 1, providing space for the upward and downward extension of the contact piece 23 and the bending deformation of the L-shaped connecting force arm 22.

[0036] The beneficial effects of the inner arc variable cross-section L-shaped terminal electrical testing fixture 100 of the present embodiment are: through the structural design of the L-shaped connecting force arm, the contact piece is provided with telescopic deformation support, and the load formed is a bending load, which effectively improves the service life of the terminal piece; further, a variable cross-section structural design is adopted in the horizontal section of the L-shaped connecting force arm to optimize its internal stress distribution, effectively avoid stress concentration, and thus improve the service life. The combination of these two structural features can make the product plug-in times up to more than 1 million times; a deep U-shaped structure is formed at the connection between the contact piece and the L-shaped connecting force arm to reduce the terminal bending moment, avoid stress concentration, and improve the stability of the contact piece pressing down, thereby improving the reliability of the test; arc structures or chamfered structures are set at multiple positions where the terminal piece may contact the plastic shell, effectively avoiding the terminal piece from scratching the plastic shell and affecting the test results; by changing the structure of the electrical testing fixture, the pitch value is minimized to only 0.3mm, and the test width is minimized to only 0.8mm. The entire structure can be modularly designed, saving R&D cycle and R&D cost, and laying a decisive foundation for miniaturized design.

[0037] The above are only some embodiments of the present invention. For those skilled in the art, several modifications and improvements can be made without departing from the creative concept of the present invention, which all belong to the protection scope of the present invention.

Claims

1. An inner arc variable cross-section L-shaped terminal electrical testing fixture, characterized in that: It includes a plastic shell, a plurality of terminal pieces arranged in the plastic shell and partially exposed, the terminal piece includes a supporting weld leg plug plate, an L-shaped connecting force arm extending forward from the front edge of the supporting weld leg plug plate, and a contact piece formed by bending upward from the free end of the L-shaped connecting force arm, the L-shaped connecting force arm includes a horizontal supporting section, a first vertical connecting section formed by bending downward from the free end of the horizontal supporting section, and the free end surface of the contact piece is provided with a concave arc surface; the horizontal supporting section is a variable cross-section structure with a cross-section gradually decreasing from the end of the supporting weld leg plug plate to the other end; the contact piece includes a second vertical connecting section located at the bottom and a contact part located on the upper part of the second vertical connecting section; the second vertical connecting section is a variable cross-section structure with a cross-section gradually decreasing from bottom to top.

2. The inner arc variable cross-section L-shaped terminal electrical testing fixture as claimed in claim 1, characterized in that: The supporting solder pin inserting plate is soldered together with the PCB circuit board at the bottom.

3. The inner arc variable cross-section L-shaped terminal electrical testing jig according to claim 1, characterized in that: The bottom of the contact piece is transitionally connected to the first vertical connecting section through an arc portion to form a U-shaped structure.

4. The inner arc variable cross-section L-shaped terminal electrical testing jig according to claim 3, characterized in that: A chamfer is provided at the inflection point of the U-shaped structure.

5. The inner arc variable cross-section L-shaped terminal electrical testing jig according to claim 1, characterized in that: The intersection of the four sides of the contact part is an arc surface structure.

6. The inner arc variable cross-section L-shaped terminal electrical testing jig according to claim 1, characterized in that: The center distance between two adjacent terminal pieces is greater than or equal to 0.3 mm.

7. The inner arc variable cross-section L-shaped terminal electrical testing jig according to claim 1, characterized in that: The upper end of the contact portion of the terminal piece is exposed outside the upper surface of the plastic housing, and the bottom of the supporting solder foot plug board is exposed outside the lower surface of the plastic housing.

Citation Information

Patent Citations

  • Electric connector terminal structure for elastic fatigue resistant USB interface

    CN202094368U

  • Inner arc type variable cross-section L-shaped terminal electric measurement jig

    CN212904989U