A performance evaluation device
By designing a performance evaluation device, the challenges of performance evaluation for miniaturized VCMs, Driver ICs, and Gyro were solved. An integrated testing environment was provided, enabling rapid and convenient performance evaluation and problem localization, thereby improving production quality control.
Patent Information
- Application Number
- CN202011636175.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2020-12-31
- Publication Date
- 2025-10-17
- Estimated Expiration
- 2040-12-31
AI Technical Summary
Existing technologies lack complete solutions for evaluating the performance of miniaturized VCMs, Driver ICs, and Gyro components, especially in AF modules, where it is difficult to build a test environment for VCM performance management, Driver IC troubleshooting, and Gyro axis control, zero-point correction, and temperature drift.
A performance evaluation device is provided, including a carrier unit, a power source, a measurement unit, and a processing unit, for evaluating the performance of VCM, Driver IC, and Gyro, acquiring data through constant current or constant voltage and generating performance evaluation results, and the device may also include a display to output the results.
It enables rapid and convenient evaluation of the performance of VCM, Driver IC and Gyro, can locate problems, simplify AF module analysis, and improve the efficiency and accuracy of production quality control.
Smart Images

Figure CN114765683B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of performance evaluation devices, and more particularly to a miniaturized VCM (voice coil motor), Driver IC (driver chip) and Gyro (gyroscope) performance evaluation device. BACKGROUND
[0002] With the increasing and rapid development of the camera industry, more and more devices are being copied by various manufacturers, but the production levels of various manufacturers are uneven, and the quality control is uneven. Finding a substitute material requires controlling the incoming materials. In particular, there is no complete solution for VCM performance control of AF (Auto Focus, automatic focusing) modules, and for AF focusing failure problem analysis and positioning. There is also no complete solution for Driver IC performance control and for Driver IC problem analysis and positioning. Similarly, there is also no complete solution for Gyro axis control, zero point correction, temperature drift and self-checking problem analysis and positioning, or there is no way to build a test environment for the above problems.
[0003] Therefore, there is an increasing demand for a small VCM, Driver IC and Gyro performance evaluation module and evaluation system that is easy to use, and designing a complete solution and device for the above situation is a technical problem that needs to be solved by those skilled in the art. SUMMARY
[0004] The performance evaluation device provided by the present application can solve or at least partially solve the problems existing in the prior art.
[0005] The present application provides a performance evaluation device, comprising: a carrier unit comprising at least one carrier for carrying at least one device under test; a power source for providing a constant current or a constant voltage to the device under test; a measurement unit for obtaining data of a performance to be tested generated by the device under test according to the constant current or the constant voltage; and a processing unit for generating a performance evaluation result of the device under test according to the data obtained by the measurement unit.
[0006] In one embodiment, the performance evaluation device further comprises a display for outputting the performance evaluation result of the device under test.
[0007] In one embodiment, the device under test comprises at least one of a voice coil motor, a driver chip and a gyroscope.
[0008] In one embodiment, the device under test comprises a voice coil motor, and the power source comprises a constant current source for providing a constant current to the voice coil motor.
[0009] In one embodiment, the data includes at least one performance parameter representing a stroke, a starting current, a linearity, and a magnetic property of the voice coil motor.
[0010] In one embodiment, the voice coil motor generates displacement information according to the constant current supplied; the measuring unit includes a laser displacement sensor, and the data includes displacement data of the voice coil motor determined by the laser displacement sensor according to the displacement information; and the processing unit generates a stroke performance evaluation result of the voice coil motor according to the displacement data.
[0011] In one embodiment, the voice coil motor generates current-voltage information according to the constant current supplied; the measuring unit includes a voltage acquisition module, and the data includes current-voltage data of the voice coil motor determined by the voltage acquisition module according to the current-voltage information; and the processing unit generates a starting current performance evaluation result of the voice coil motor according to the current-voltage data.
[0012] In one embodiment, the device under test includes a driving chip, and the power source includes a constant voltage source for supplying a constant voltage to the driving chip.
[0013] In one embodiment, the data obtained by the measuring unit includes at least one of a linearity of an output current, a supply voltage test, an erasable number of times, an aging test, and an electrostatic voltage test related to a performance of the driving chip.
[0014] In one embodiment, the driving chip generates voltage-current information according to the constant voltage supplied; the measuring unit includes a digital multimeter, and the digital multimeter measures voltage-current data of the driving chip; and the processing unit generates a linearity performance evaluation result of the output current of the driving chip and a supply voltage test performance evaluation result according to the voltage-current data.
[0015] In one embodiment, the device under test includes a gyroscope, and the power source includes a constant current source for supplying a constant current to the gyroscope or a constant voltage source for supplying a constant voltage to the gyroscope.
[0016] In one embodiment, the data obtained by the measuring unit includes at least one performance parameter representing an axis control, an acceleration accuracy, a sensitivity, a zero-point correction, a temperature drift, and a self-checking performance of the gyroscope.
[0017] In one embodiment, the apparatus further includes a controllable vibration table for providing vibrations of different amplitudes, frequencies, and directions to the gyroscope; the gyroscope generates performance information related to at least one of the axis control, the acceleration accuracy, the sensitivity, the zero-point correction, the temperature drift, and the self-checking performance of the gyroscope according to the vibrations of different amplitudes, frequencies, and directions; the measuring unit obtains the performance information; and the processing unit generates corresponding performance evaluation results of the gyroscope according to the performance information.
[0018] In one embodiment, the carrier unit includes a plurality of carriers for carrying a plurality of devices under test.
[0019] In one embodiment, at least one of the power source, the measuring unit, and the processing unit is integrated into an IC.
[0020] In one embodiment, at least one of the power source, the measuring unit, and the processing unit is integrated into an IC, while the other units are provided independently of the IC.
[0021] The performance evaluation device according to at least one of the above-mentioned embodiments can be used to evaluate at least one of the VCM stroke, starting current, sensitivity, linearity and hysteresis performance; and at least one of the Driver IC's output current linearity, power supply voltage test, erasable number of times, aging test and electrostatic withstand voltage test performance; and can also be used to evaluate at least one of the Gyro's axis control, acceleration accuracy, sensitivity, zero point correction, temperature drift and self-test performance. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Other features, objects and advantages of the present application will become more apparent from the detailed description of non-limiting embodiments made with reference to the following drawings, in which:
[0023] Figure 1 is a schematic functional module diagram of a performance evaluation device according to one embodiment of the present application;
[0024] Figure 2 According to one embodiment of the present application, Figure 1 The specific implementation diagram of the performance evaluation device shown is shown. DETAILED DESCRIPTION
[0025] In order to better understand the present application, various aspects of the present application will be described in more detail with reference to the accompanying drawings. It should be understood that these detailed descriptions are merely descriptions of exemplary embodiments of the present application and do not limit the scope of the present application in any way. Throughout the specification, the same figure numbers refer to the same elements. The expression "and / or" includes any one of the relevant listed items and any combination of any two or more. It is understood that the specific embodiments described herein are merely used to explain the relevant inventions and are not limitations of the inventions. It should also be noted that, for ease of description, only the parts related to the relevant inventions are shown in the accompanying drawings.
[0026] Use of the word “may” with respect to an example or embodiment (e.g., with respect to what an example or embodiment may include or implement) means that there is at least one example or embodiment that includes or implements such feature, while all examples or embodiments are not limited thereto.
[0027] It should be noted that the recitations of first, second, third, etc. in the present description are used only to distinguish one feature from another, and do not imply any order or sequence unless otherwise specifically indicated.
[0028] In the drawings, the thicknesses of various components can be exaggerated for clarity. The drawings are not necessarily to scale.
[0029] Throughout this specification, where it is stated that an element is "on", "connected to", or "coupled to" another element, that element can be directly on, directly connected to, or directly coupled to the other element, or one or more other elements can be interposed between the element and the other element. Conversely, where it is stated that an element is "directly on", "directly connected to", or "directly coupled to" another element, then no other elements are interposed between the element and the other element.
[0030] To facilitate description, spatially relative terms such as "above", "upper", "below", and "lower" can be used herein for describing the relationships between one element and another element as shown in the drawings. Such spatially relative terms are intended to encompass different orientations of the device in use or operation, in addition to the orientations depicted in the drawings. For example, if the device in the drawings is turned over, then the element described as being "above" or "up" of another element would be oriented "below" or "down" relative to the other element. Accordingly, the expression "above" encompasses both "above" and "below", and "up" encompasses both "up" and "down". The device can be otherwise oriented (e.g., rotated 90 degrees or at other orientations) and the spatially relative expressions used herein interpreted accordingly.
[0031] It will also be understood that the terms "comprise", "comprising", "have", "has", "including", and / or "includes" when used in this specification, specify the presence of stated features, elements, and / or components, but do not preclude the presence or addition of one or more other features, elements, components, and / or groups thereof. Furthermore, when used in the following claims, the terms "comprise", "comprising", "have", "has", "including", and / or "includes" are each construed as a non- limiting term.
[0032] As used herein, the words "substantially", "approximately", and similar terms are used as terms of approximation and not as terms of degree, unless otherwise indicated by the context of their usage, and are intended to account for the inherent deviations in measurements or calculations that are recognized by those of ordinary skill in the art.
[0033] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an overly literal or overly formal sense unless expressly so defined herein.
[0034] A performance evaluation module according to an embodiment of the present application, including a carrier unit, a power source, a measurement unit, and a processing unit, etc., can be used for performance evaluation of VCM, Driver IC, and Gyro. Exemplary embodiments of the present application will be described in detail below with reference to the accompanying drawings.
[0035] Figure 1 is a schematic functional module diagram of a performance evaluation apparatus 100 according to an embodiment of the present application. As shown in Figure 1 According to the embodiment, the performance evaluation apparatus 100 can include a carrier unit 10, a power source 20, a measurement unit 30, and a processing unit 40 in terms of function.
[0036] The carrier unit 10 includes at least one carrier for carrying at least one device under test. For example, the carrier unit 10 can include one or more VCM carriers for carrying one or more VCMs, and accordingly, the device under test includes a VCM.
[0037] In some embodiments, the carrier unit 10 can include a plurality of carriers for carrying a plurality of devices under test. For example, as shown in Figure 2 the carrier unit 10 can include a VCM carrier, a Driver IC carrier, and a Gyro carrier, and accordingly, the device under test includes a VCM, a Driver IC, and a Gyro.
[0038] The power source 20 is electrically connected to the carrier unit 10, and is configured to provide constant current or constant voltage to at least one device under test carried by the carrier unit 10. The power source 20 can include, for example, a constant current source module, and can provide driving current to the device under test, such as a VCM or a Gyro. The power source 20 can also include, for example, a constant voltage source module, and can provide driving voltage to the device under test, such as a Driver IC or a Gyro.
[0039] The measurement unit 30 acquires data of a performance to be measured generated by the device under test according to the constant current or constant voltage provided by the power source 20. The measurement unit 30 can include, for example, a digital multimeter (DMM), a laser displacement sensor, a controllable vibration table, an oscilloscope, a voltage acquisition module, etc., and can measure information such as displacement, current, or voltage generated by the device under test, or other parameters indicative of the performance of the device under test, which will be described in further detail below.
[0040] The processing unit 40 is electrically connected to the carrier unit 10, the power source 20 and the measuring unit 30, respectively, for generating the performance evaluation result of the device under test according to the data acquired by the measuring unit 30 and the performance parameters of the device under test. For example, the processing unit 40 can control the power source 20 to selectively provide constant current or constant voltage to the device under test, so as to selectively obtain the test results as described below.
[0041] Specifically, when the device under test is a VCM, the power source 20 can include a constant current source for providing constant current to the VCM. Under the control of the processing unit 40, the current provided by the constant current source can be determined according to the power size of the VCM, for example, the processing unit 40 can also control the combination of the constant current source module and the variable resistor to provide step current to the VCM, so as to obtain the data (parameters) representing the performance of the VCM through the measurement of the measuring unit. As an example, the drive current value of the VCM can be in the range of, for example, -120mA-120mA. Alternatively, as a practical application option, the power source 20 can include a constant voltage source for providing constant voltage to the VCM, and the drive voltage value can be in the range of, for example, 1.5V-6V. Specifically, the performance data (parameters) of the VCM can include at least one of stroke, starting current, sensitivity, linearity and magnetic performance. The processing unit 40 then generates the performance evaluation result of the device under test according to the data (parameters) acquired by the measuring unit 30.
[0042] Specifically, when the device under test is a Driver IC, the power source 20 can include a constant voltage source for providing constant voltage to the Driver IC. The voltage provided by the constant voltage source can be determined according to the rated voltage range of the Driver IC, for example, the drive voltage value of the Driver IC can be in the range of, for example, 1.5V-6V. Alternatively, as a practical application option, the power source 20 can include a constant current source for providing constant current to the Driver IC, and the drive current value can be in the range of, for example, -120mA-120mA. Specifically, the performance parameters of the Driver IC can include at least one of linearity of output current, power supply voltage test, erasable times, aging test and electrostatic voltage resistance test. The processing unit 40 can control the measuring unit 30 to measure the Driver IC to obtain the parameters representing these performances, so as to further generate the performance evaluation result of the device under test.
[0043] Specifically, when the device under test is a gyro, the power source 20 may include a constant current source for providing a constant current to the gyro or a constant voltage source for providing a constant voltage to the gyro. For example, the constant current source may provide a driving current to the gyro in the range of -120 mA to 120 mA, and the constant voltage source may provide a driving voltage to the gyro in the range of 1.5 V to 6 V. Specifically, the performance parameters of the gyro may include at least one of: axis control performance, acceleration accuracy, sensitivity, zero point correction, temperature drift, and self-test performance. The processing unit 40 may control the measurement unit 30 to measure the gyro to obtain parameters representing these performance characteristics, thereby further generating performance evaluation results for the device under test.
[0044] In addition, when the device under test is a Gyro, the processing unit 40 can also control the controllable vibration table included in the measuring unit 30 (see Figure 2 Processing unit 40 controls the controllable vibration table to output vibrations of varying frequencies, amplitudes, and directions to simulate the gyroscope's test environment, allowing measurement unit 30 to obtain gyroscope performance parameters under these test conditions. Specifically, gyroscope performance parameters may include at least one of axis control performance, acceleration accuracy, sensitivity, zero-point correction, temperature drift, and self-test performance. Based on the data characterizing these performance characteristics obtained by measurement unit 30, processing unit 40 generates gyroscope performance evaluation results.
[0045] In one embodiment, in order to generate the performance evaluation results of the device under test, the processing unit 40 may perform conventional processing such as various comparisons and analyses on the data obtained from the measuring unit 30 as needed.
[0046] In one embodiment, the performance evaluation device 100 may further include a display 50 , and the display 50 is configured to output the performance evaluation result of the device under test generated by the processing unit 40 .
[0047] Figure 2 According to one embodiment of the present application, Figure 1 The specific implementation diagram of the performance evaluation device is shown in FIG. Figure 2 As shown, the carrier unit 10 of the performance evaluation device 100 may specifically include, for example, a VCM carrier 10-1, a Driver IC carrier 10-2, and a Gyro carrier 10-3. Furthermore, the output port 102 of the performance evaluation device 100 is a carrier expansion port, allowing for expansion of carriers for different DUTs, such as one to eight. This allows the performance evaluation device 100 to simultaneously connect to multiple DUTs for performance evaluation, thereby improving the operating efficiency of the performance evaluation device 100.
[0048] The power source 20 of the performance evaluation device 100 may, for example, specifically include a constant current source module 20-1 and a constant voltage source module 20-2, wherein the constant current source module 20-1 is electrically connected with the VCM carrier 10-1 and can provide a constant current signal to the VCM; the constant voltage source module 20-2 is electrically connected with the Driver IC carrier 10-2 and can provide a constant voltage signal to the Driver IC; and the processing unit 40 can selectively control the constant current source module 20-1 or the constant voltage source module 20-2 to provide a constant current or constant voltage signal to the Gyro.
[0049] The measurement unit 30 of the performance evaluation device 100 may, for example, specifically include a digital multimeter (DMM) 30-1, a laser laser displacement sensor 30-2, a controllable vibration table 30-3, an oscilloscope 30-4, and a voltage acquisition module 30-5. The digital multimeter 30-1 can be used to measure, for example, voltage or current data of the device under test, the laser laser displacement sensor 30-2 can be used to obtain, for example, displacement data of the device under test, the controllable vibration table 30-3 can be used to simulate a test environment of the device under test, and the oscilloscope 30-4 and the voltage acquisition module 30-5 can also help to obtain, for example, voltage or current data of the device under test.
[0050] The above-mentioned processing unit of the performance evaluation device 100 may, for example, be a core circuit and a peripheral power supply system 40 integrated in the mainboard 101 (herein, the terms “processing unit” and “core circuit and peripheral power supply system” can be interchangeable). The above-mentioned constant current source module 20-1, constant voltage source module 20-2, and voltage acquisition module 30-5 can also be selectively integrated in the IC mainboard 101, as shown in Figure 2
[0051] The mainboard 101 also includes an IO interface module 60, wherein the IO interface module 60 can include an IIC communication module, a UART communication module, an SPI communication module, and a display screen interface, for realizing information interaction between different modules and the mainboard, or between different modules.
[0052] In addition, the mainboard 101 can also include a USB interface, which can facilitate IAP (application programming) to update and upgrade the firmware program in the device, and can also facilitate the device to be connected with a server or other equipment for data transmission and other operations.
[0053] The performance evaluation device 100 further includes a display 50, such as the display screen module shown in Figure 2 The display screen 50 is connected with the IC mainboard 101 and is used to visually display the evaluation results of various performances of the device under test for the user to refer to.
[0054] In Figure 2 Although the specific implementation shown shows that the modules 40, 60 and the power supply module are arranged on the IC circuit board, and some other components are arranged outside the IC circuit board, those skilled in the art should understand that this arrangement is only exemplary, and those skilled in the art can adjust which components are arranged on the IC circuit board and which components are arranged outside the IC circuit board according to needs.
[0055] For the VCM carried by the VCM carrier 10-1, the constant current source module 20-1 provides a constant current to the VCM through the VCM carrier 10-1. The VCM generates displacement information according to the constant current supplied. The laser displacement sensor 30-2 determines the displacement data of the VCM according to the displacement information generated by the VCM. The core circuit and peripheral power supply system 40, i.e., the processing unit 40, acquires and analyzes the displacement data of the VCM fed back by the laser displacement sensor 30-2, and generates the stroke performance evaluation result of the VCM. Alternatively, as a practical application option, the laser displacement sensor 30-2 can also convert the acquired displacement information generated by the VCM into a corresponding voltage signal through the oscilloscope 30-4, and then collect and feed back to the processing unit 40 by the voltage acquisition module 30-5. The processing unit 40 analyzes and generates the stroke performance evaluation result of the VCM. Moreover, the processing unit 40 generates other performance evaluation results of the VCM including at least one of the starting current, the sensitivity, the linearity, and the magnetic hysteresis performance by analyzing other performance parameters of the VCM acquired by the measurement unit 30. The evaluation results are transmitted and displayed on the display screen of the display 50, and the user can understand the performance of the measured device VCM according to the displayed evaluation results.
[0056] In addition, for the VCM carried by the VCM carrier 10-1, the constant current source module 20-1 provides a constant current to the VCM, and the VCM generates current-voltage information according to the constant current supplied. The voltage or current data of the VCM can be collected by using the oscilloscope 30-4, and the current-voltage data of the VCM is further determined by the voltage acquisition module 30-5 through the oscilloscope 30-4. The processing unit 40 acquires and analyzes the current-voltage data of the VCM fed back by the voltage acquisition module 30-5, and generates the starting current performance evaluation result of the VCM. Moreover, the processing unit 40 generates other performance evaluation results of the VCM including at least one of the sensitivity, the linearity, and the magnetic hysteresis performance by analyzing other performance parameters of the VCM acquired by the measurement unit 30. The evaluation results are transmitted and displayed on the display screen of the display 50, and the user can understand the performance of the measured device VCM according to the displayed evaluation results.
[0057] For the Driver IC carrier 10-2, a device under test, Driver IC, is mounted thereon. The constant voltage source module 20-2 provides constant voltage to the Driver IC. The Driver IC generates voltage current information according to the constant voltage supplied. The digital multimeter 30-1 measures the voltage current data of the Driver IC. The processing unit 40 acquires and analyzes the voltage current data of the Driver IC fed back by the digital multimeter 30-1, generates the linearity performance evaluation result of the output current of the Driver IC and the power supply voltage test performance evaluation result, and generates other performance evaluation results of the Driver IC including at least one of erasable times, aging test and electrostatic pressure test by analyzing other performance parameters of the Driver IC acquired by the measurement unit 30. The evaluation results are all transmitted and displayed on the display screen of the display 50, and the user can understand the performance of the device under test, Driver IC, according to the displayed evaluation results.
[0058] The gyro carrier 10-3 mounts a device under test, Gyro, thereon. The processing unit 40 controls the constant current source module 20-1 to provide constant current to the Gyro or controls the constant voltage source module 20-2 to provide constant voltage to the Gyro, so that the Gyro is initialized. In order to further test the performance of the Gyro, the device 100 can further include a controllable vibration table 30-3, and the processing unit 40 controls the controllable vibration table 30-3 to output vibrations of different frequencies, amplitudes and directions to simulate the test environment of the Gyro. The Gyro generates a series of performance change data including shaft control according to the vibrations provided by the vibration table, and the processing unit 40 generates the performance evaluation result of the Gyro including at least one of shaft control performance, acceleration accuracy, sensitivity, zero point correction, temperature drift and self-checking performance by analyzing the performance change data of the Gyro acquired by the measurement unit 30. The evaluation results are all transmitted and displayed on the display screen of the display 50, and the user can understand the performance of the device under test, Gyro, according to the displayed evaluation results.
[0059] The above device can be used to evaluate the performance of VCM stroke, starting current, sensitivity, linearity and hysteresis, and the performance of Driver IC output current linearity, power supply voltage test, erasable times, aging test and electrostatic pressure test, and can also be used to evaluate the performance of Gyro shaft control, acceleration accuracy, sensitivity, zero point correction, temperature drift and self-checking, and can output and display the evaluation results of each performance. At the same time, the device has the advantages of small size, low cost, easy to carry, easy to use and one-to-eight expansion test, can be used for rapid positioning of VCM, Driver IC and Gyro problems, and is convenient for AF module to analyze complaints, Driver IC device incoming complaint analysis, and preliminary analysis of Gyro device precision, self-checking, shaft control problems.
[0060] The features described in this application can be implemented in different forms and should not be construed as limited to the examples described in this application. Rather, these examples are provided so that this application will be thorough and complete, and fully convey the disclosure to those skilled in the art. Further, the description should not be read to imply that any aspects have preferred or alternative embodiments.
[0061] It should be noted that the embodiments and features of the embodiments in this application can be combined with each other without conflict. In addition, unless specifically limited or contradicted by context, the specific steps contained in the methods described in this application do not have to be limited to the order described, but can be executed in any order or in parallel.
[0062] Finally, it should be noted that the above description is only an embodiment of the application and an explanation of the technical principles used. Those skilled in the art should understand that other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the technical concept should also be covered within the protection scope of the application. For example, the above features are replaced with each other with technical features disclosed in this application (but not limited to) having similar functions to form technical solutions.
Claims
1. A performance evaluation device, characterized in that: include: A carrier unit, comprising a plurality of carriers for carrying a plurality of devices under test; a power source, configured to provide a constant current or a constant voltage to the plurality of devices under test; a measuring unit, configured to obtain data on the performance to be measured generated by the plurality of devices under test according to the constant current or constant voltage; as well as a processing unit, generating performance evaluation results of the plurality of devices under test according to the data acquired by the measuring unit, The multiple devices under test include a voice coil motor, a driver chip, and a gyroscope; the power source includes a constant current source and a constant voltage source; the constant current source provides the constant current to the voice coil motor; the constant voltage source provides the constant voltage to the driver chip; and the constant current source or the constant voltage source selectively provides the constant current or the constant voltage to the gyroscope; Among them, the driver chip generates voltage and current information according to the constant voltage supplied; the measurement unit measures and obtains the voltage and current data of the driver chip; and the processing unit generates the linearity performance evaluation result of the output current of the driver chip and the power supply voltage test performance evaluation result according to the voltage and current data.
2. The device according to claim 1, characterized in that The device further comprises: A display is used to output the performance evaluation result of the device under test.
3. The device according to claim 1, characterized in that The data includes at least one performance parameter representing the stroke, starting current, sensitivity, linearity, and hysteresis performance of the voice coil motor.
4. The device according to claim 3, characterized in that The voice coil motor generates displacement information according to the constant current supplied; The measuring unit includes a laser displacement sensor, and the data includes displacement data of the voice coil motor determined by the laser displacement sensor according to the displacement information; The processing unit generates a stroke performance evaluation result of the voice coil motor according to the displacement data.
5. The device according to claim 3, characterized in that The voice coil motor generates current and voltage information according to the constant current supplied; The measuring unit includes a voltage acquisition module, wherein the data includes current and voltage data of the voice coil motor determined by the voltage acquisition module according to the current and voltage information; The processing unit generates a starting current performance evaluation result of the voice coil motor according to the current and voltage data.
6. The device according to claim 1, characterized in that The data acquired by the measuring unit includes at least one of the linearity of the output current, the supply voltage test, the number of erasable and write times, the aging test, and the electrostatic withstand voltage test related to the performance of the driver chip.
7. The device according to claim 6, characterized in that The measuring unit includes a digital multimeter, and the digital multimeter measures and obtains the voltage and current data.
8. The device according to claim 1, characterized in that The data acquired by the measuring unit includes at least one performance parameter representing axis control, acceleration accuracy, sensitivity, zero point correction, temperature drift, and self-test performance of the gyroscope.
9. The device according to claim 8, characterized in that The apparatus further includes a controllable vibration table for providing vibrations of varying amplitudes, frequencies, and directions to the gyroscope; The gyroscope generates performance information related to at least one of the axis control, acceleration accuracy, sensitivity, zero point correction, temperature drift and self-test performance of the gyroscope according to the vibrations of different amplitudes, frequencies and directions; The measuring unit obtains the performance information; as well as The processing unit generates a corresponding performance evaluation result of the gyroscope according to the performance information.
10. The device according to claim 1, wherein At least one of the power source, the measuring unit, and the processing unit is integrated into an IC.
11. The device according to claim 1, wherein At least one of the power source, the measuring unit, and the processing unit is integrated into an IC, while the other units are provided independently of the IC.
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