A ferrite phase shifter insertion phase consistency test system and test method

Abstract

This invention discloses a ferrite phase shifter insertion phase consistency testing system, belonging to the field of microwave device technology. It comprises a driver, a ferrite phase shifter, and a vector network analyzer. The driver is electrically connected to the excitation coils at both ends of the ferrite phase shifter, and the vector network analyzer is connected to the waveguide ports at both ends of the ferrite phase shifter. This invention also discloses a method for testing the insertion phase consistency of ferrite phase shifters. Using the testing system and method of this invention, insertion phase consistency screening tests can be performed on ferrite phase shifters, thereby solving the problems of poor electrical performance and complex drive control caused by insertion phase mismatch in multiple ferrite phase shifter components.

Description

Technical Field

[0001] This invention relates to the field of microwave device technology, and in particular to a ferrite phase shifter insertion phase consistency test system and test method. Background Technology

[0002] Ferrite phase shifters, as a key component in phased array radar, are receiving increasing attention in this field. The various functions of phased array radar rely heavily on ferrite phase shifters, and their electrical performance indicators are prerequisites for ensuring the proper operation of the radar. Since a large number of ferrite phase shifters are used in phased array radar, ensuring good control over them requires precise control over the insertion phase consistency of the ferrite phase shifters.

[0003] High-power differential phase shift switches used in microwave systems contain two parallel ferrite phase shifters. To achieve good electrical performance, the outputs of the two parallel ferrite phase shifters must be ±90 degrees out of phase during operation. Therefore, this also places high demands on the consistency of the insertion phase of the two parallel phase shift segments.

[0004] However, due to manufacturing deviations in ferrite phase shifters and variations in ferrite cores, even ferrite phase shifters from the same batch can exhibit inconsistent insertion phases under the same excitation conditions. Taking a differential phase-shifting ferrite latching switch as an example, combining two ferrite phase-shifting segments with mismatched insertion phases to form a differential phase-shifting switch may lead to excessive microwave electrical performance indicators such as loss, isolation, and standing wave ratio, severely impacting device performance. Therefore, it is necessary to test and screen the insertion phase consistency of ferrite phase shifters to address the problems of excessive electrical performance and complex drive control caused by mismatched insertion phases in multi-ferrite phase shifter assemblies. Summary of the Invention

[0005] One of the objectives of this invention is to provide a ferrite phase shifter insertion phase consistency testing system to solve the above-mentioned problems.

[0006] To achieve the above objectives, the technical solution adopted by the present invention is as follows: a ferrite phase shifter insertion phase consistency test system, comprising a driver, a ferrite phase shifter and a vector network analyzer, wherein the driver is electrically connected to the excitation coils at both ends of the ferrite phase shifter, and the vector network analyzer is electrically connected to the waveguide ports at both ends of the ferrite phase shifter.

[0007] The driver of this invention mainly consists of discrete electronic components such as a programmable FPGA (e.g., EF2L45LG144B), a driver IC (e.g., SGM48524A), a power MOSFET (e.g., NCEP01ND35AG), and a high-speed comparator (e.g., SGM8743). Its main function is to generate a reset excitation current and a pulse-width adjustable set excitation current. Its internal composition is as follows: Figure 3 As shown. The vector network analyzer of this invention is commercially available, and a vector network analyzer covering the operating frequency of the phase shift segment is selected, such as KEYSIGHT, with an operating frequency of 10MHz to 43.5GHz, N5224B.

[0008] The second objective of this invention is to provide a method for testing the phase consistency of ferrite phase shifter insertion, the technical solution of which includes the following steps:

[0009] (1) Build the aforementioned test system;

[0010] (2) The driver generates a reset current excitation pulse to magnetize the ferrite of the ferrite phase shifter to the saturation state -Br, at which time the vector network analyzer insertion phase returns to zero;

[0011] (3) The ferrite phase shifter is subjected to a combination of reset current and set current excitation, wherein the width of the set current excitation pulse is adjustable so that the ferrite remanence varies between -Br and +Br.

[0012] (4) Read the data from the vector network analyzer and record the insertion phase corresponding to different set excitation pulse widths for later data analysis.

[0013] As a preferred technical solution: In step (3), the method of combined excitation is as follows: the reset current resets the ferrite phase shifter to the same reference state, and the width of the set current excitation pulse is adjusted so that the ferrite remanence changes between -Br and +Br.

[0014] As a further preferred technical solution: in steps (2) and (3), the reset current and the set current are in opposite directions.

[0015] Compared with the prior art, the advantages of the present invention are as follows: by using the test system and test method of the present invention, the insertion phase consistency screening test of ferrite phase shifters can be performed, thereby solving the problem of poor electrical performance and complex drive control caused by the insertion phase mismatch of multiple ferrite phase shifter components. Attached Figure Description

[0016] Figure 1 This invention provides a ferrite phase shifter insertion phase consistency testing system.

[0017] Figure 2The hysteresis loop of a lock-type ferrite phase shifter;

[0018] Figure 3 This refers to the internal components of the driver.

[0019] In the diagram: 1. Driver; 2. Ferrite phase shifter; 3. Vector network analyzer. Detailed Implementation

[0020] The invention will now be further described with reference to the accompanying drawings.

[0021] Example 1:

[0022] A method for testing the insertion phase consistency of a ferrite phase shifter includes the following steps:

[0023] (1) Construct a ferrite phase shifter insertion phase consistency test system, such as Figure 1 The test consists of a driver 1, a ferrite phase shifter 2, and a vector network analyzer 3. The driver 1 is electrically connected to the excitation coils at both ends of the ferrite phase shifter 2, and the vector network analyzer 3 is also electrically connected to the waveguide ports at both ends of the ferrite phase shifter 2.

[0024] (2) The driver generates a reset current excitation pulse to magnetize the ferrite to the saturation state -Br. At this time, the phase inserted in the vector network analyzer 3 is zeroed, as shown in Table 1 at 0° of phase shifter A.

[0025] (3) Apply a combination of reset current and set current to the ferrite phase shifter 2. The reset current resets the ferrite phase shifter to the same reference state. Adjust the width of the set current excitation pulse (assuming that the set current increases with the pulse width) to make the ferrite remanence change between -Br and +Br, thereby achieving the adjustment of the ferrite phase shifter's insertion phase; Figure 2 As shown, when the pulse width of the set excitation current is T1, the corresponding remanence is Br1; when the pulse width of the set excitation current is T2, the corresponding remanence is Br2; when the pulse width of the set excitation current is Tn, the corresponding remanence is Br; when the pulse width of the set excitation current is Tn, the ferrite is excited to the positive saturation point +Br.

[0026] (4) Read the data from the vector network analyzer and record the insertion phase corresponding to different set excitation pulse widths.

[0027] (5) Replace the phase shifter sample and repeat steps 3 and 4;

[0028] (6) Data analysis to eliminate ferrite phase shifters with large differences.

[0029] Table 1 below shows the variation of the insertion phase of a group of six ferrite phase shifters made of grade X8HA11 ferrite material at room temperature as a function of the pulse width of the set excitation current.

[0030] Table 1 shows the variation of the insertion phase of the ferrite phase shifter with the pulse width of the set excitation current at room temperature.

[0031]

[0032] Based on the test data in Table 1, the following conclusions can be drawn: First, for the same ferrite phase shifter, the insertion phase gradually increases with the increase of the set pulse excitation pulse width, eventually reaching saturation. Second, different ferrite phase shifters using the same set pulse excitation width exhibit inconsistent insertion phases, with some showing significant differences (such as phase shifter D in Table 1). Therefore, this test method can be used to screen ferrite phase shifters for insertion phase consistency, resolving the problem of poor electrical performance and complex drive control caused by insertion phase mismatch in multi-ferrite phase shifter components.

[0033] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for testing the phase consistency of a ferrite phase shifter insertion, characterized in that: Includes the following steps: (1) Build a test system, which consists of a driver, a ferrite phase shifter and a vector network analyzer. The driver is electrically connected to the excitation coils at both ends of the ferrite phase shifter and the vector network analyzer is electrically connected to the waveguide ports at both ends of the ferrite phase shifter. (2) The driver generates a reset current excitation pulse to magnetize the ferrite of the ferrite phase shifter to the saturation state -Br, at which time the vector network analyzer insertion phase returns to zero; (3) The ferrite phase shifter is subjected to a combination of reset current and set current excitation, wherein the width of the set current excitation pulse is adjustable so that the ferrite remanence varies between -Br and +Br. (4) Read the data from the vector network analyzer and record the insertion phase corresponding to different set excitation pulse widths for later data analysis.

2. The method according to claim 1, characterized in that: In step (3), the combined excitation method is as follows: the reset current resets the ferrite phase shifter to the same reference state, and the width of the set current excitation pulse is adjusted so that the ferrite remanence changes between -Br and +Br.

3. The method according to claim 2, characterized in that: In steps (2) and (3), the reset current and the set current are in opposite directions.

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