Mechanisms for beam failure detection

Abstract

Embodiments of the present disclosure relate to beam failure detection. According to embodiments of the present disclosure, after a serving cell is activated from a deactivated state, a terminal device monitors a beam failure on a serving beam of the serving cell. If a beam failure instance indication is received within a short time after the activation, the terminal device determines that a beam failure is detected on the serving beam. In this way, beam failure recovery can be triggered faster to perform candidate beam search.

Description

Technical Field

[0001] Embodiments of this disclosure generally relate to the telecommunications field, and more particularly to methods, apparatus, devices, and computer-readable storage media for beam failure detection. Background Technology

[0002] With the development of communication technology, several techniques have been proposed to increase system capacity. For example, a technique called "beamforming" has been proposed. Beamforming allows for specific processing of signals transmitted or received in a directional manner. If a beam failure occurs when the surrounding environment changes, the terminal device can report the beam failure and request beam recovery. Summary of the Invention

[0003] Generally speaking, the exemplary embodiments of this disclosure provide a solution for beam failure detection.

[0004] In a first aspect, a first device is provided. The first device includes at least one processor; and at least one memory including computer program code; the at least one memory and the computer program code are configured, together with the at least one processor, to cause the first device to: perform an activation process on a deactivated serving cell; after activating the serving cell, monitor for beam failures on the serving beam of the serving cell; determine that a beam failure has been detected on the serving beam based on the receipt of an indication that at least one beam failure instance has been received within a predetermined time period; and send a beam failure report to a second device.

[0005] In a second aspect, a second device is provided. The second device includes at least one processor; and at least one memory including computer program code; the at least one memory and the computer program code are configured to, together with the at least one processor, cause the second device to: receive a beam failure report from the first device within a predetermined time period, based on the determination that at least one beam failure instance of the serving beam of the serving cell is received after activation of the serving cell.

[0006] In a third aspect, a method is provided. The method includes performing an activation process on a deactivated serving cell on a first device; after activating the serving cell, monitoring for beam failures on the serving beam of the serving cell; determining that a beam failure has been detected on the serving beam based on the determination that at least one beam failure instance indication has been received within a predetermined time period; and sending a beam failure report to a second device.

[0007] In a fourth aspect, a method is provided. The method includes: receiving a beam failure report from a first device at a second device, based on the determination that at least one beam failure instance of the serving beam of the serving cell is received within a predetermined time period after activation of the serving cell.

[0008] In a fifth aspect, an apparatus is provided. The apparatus includes: components for performing an activation process on a deactivated serving cell; components for monitoring beam failures on a serving beam of the serving cell after activation; components for determining that a beam failure has been detected on the serving beam based on the determination that at least one beam failure instance indication has been received within a predetermined time period; and components for sending a beam failure report to a second device.

[0009] In a sixth aspect, an apparatus is provided. The apparatus includes components for receiving a beam failure report from a first device at a second device based on the determination that at least one beam failure instance indication regarding the serving beam of the serving cell is received within a predetermined time period after activation of the serving cell.

[0010] In a seventh aspect, a computer-readable medium is provided. This computer-readable medium includes program instructions for causing a device to perform at least the method according to any one of the third or fourth aspects described above.

[0011] It should be understood that the overview section is not intended to identify key or essential features of embodiments of this disclosure, nor is it intended to limit the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description

[0012] Some exemplary embodiments will now be described with reference to the accompanying drawings, in which:

[0013] Figure 1 An example communication environment in which example embodiments of this disclosure may be implemented is shown;

[0014] Figure 2 The following is illustrated: a signaling stream for transmitting beam information according to some example embodiments of the present disclosure;

[0015] Figure 3 A flowchart is shown illustrating a method implemented at a first device according to some exemplary embodiments of the present disclosure;

[0016] Figure 4 A flowchart is shown illustrating a method implemented at a second device according to some other exemplary embodiments of the present disclosure;

[0017] Figure 5 A simplified block diagram of an apparatus suitable for implementing exemplary embodiments of the present disclosure is shown; and

[0018] Figure 6 A block diagram of an example computer-readable medium according to some example embodiments of the present disclosure is shown.

[0019] Throughout the accompanying drawings, the same or similar reference numerals denote the same or similar elements. Detailed Implementation

[0020] The principles of this disclosure will now be described with reference to some exemplary embodiments. It should be understood that these embodiments are described for illustrative purposes only and to help those skilled in the art understand and implement the purposes of this disclosure, and do not impose any limitations on the scope of this disclosure. The embodiments described herein can be implemented in various other ways besides those described below.

[0021] In the following description and claims, unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure pertains.

[0022] References to "an embodiment," "an embodiment," "an example embodiment," etc., in this disclosure indicate that the described embodiment may include a particular feature, structure, or characteristic, but not every embodiment is required to include that particular feature, structure, or characteristic. Furthermore, these phrases do not necessarily refer to the same embodiment. Additionally, when a particular feature, structure, or characteristic is described in connection with an embodiment, it is believed that combining it with other embodiments (whether explicitly described or not) to affect such a feature, structure, or characteristic is within the knowledge of those skilled in the art.

[0023] It should be understood that although the terms “first” and “second” may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used only to distinguish one element from another. For example, without departing from the scope of the exemplary embodiments, a first element may be referred to as a second element, and similarly, a second element may be referred to as a first element. As used herein, the term “and / or” includes any and all combinations of one or more of the listed terms.

[0024] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments. As used herein, the singular forms “a,” “an,” and “the” are also intended to include the plural forms unless the context clearly indicates otherwise. It will be further understood that the terms “comprising,” “including,” “having,” “having,” “containing,” and / or “comprising” as used herein specify the presence of the stated features, elements, and / or components, etc., but do not exclude the presence or addition of one or more other features, elements, components, and / or combinations thereof.

[0025] As used in this application, the term "circuit system" may refer to one or more or all of the following:

[0026] (a) Pure hardware circuit implementation (such as implementations only in analog and / or digital circuit systems), and

[0027] (b) A combination of hardware circuitry and software, such as (if applicable):

[0028] (i) A combination of analog and / or digital hardware circuitry with software / firmware, and

[0029] (ii) Any part of a hardware processor (including a digital signal processor), software, and memory that works together to cause a device (such as a mobile phone or a server) to perform various functions, and

[0030] (c) Hardware circuitry and / or processors, such as microprocessors or a portion thereof, which require software (e.g., firmware) to operate, but which may be absent when operation is not required.

[0031] The definition of "circuit system" applies to all uses of the term in this application, including in any claim. As another example, as used in this application, the term "circuit system" also covers implementations of hardware circuitry or processors (or processors in general) and their accompanying software and / or firmware. The term "circuit system" also covers (e.g., and if applicable to a particular claim element) baseband integrated circuits or processor integrated circuits in mobile devices, or similar integrated circuits in servers, cellular network devices, or other computing or networking devices.

[0032] As used herein, the term "communication network" refers to a network that conforms to any suitable communication standard, such as Long Term Evolution (LTE), LTE-A Advanced (LTE-A), Wideband Code Division Multiple Access (WCDMA), High-Speed ​​Packet Access (HSPA), Narrowband Internet of Things (NB-IoT), New Radio (NR), etc. Furthermore, communication between terminal devices and network devices in a communication network can be performed according to any suitable generation of communication protocols, including but not limited to first-generation (1G), second-generation (2G), 2.5G, 2.75G, third-generation (3G), fourth-generation (4G), 4.5G, fifth-generation (5G) communication protocols, and / or any other protocols currently known or developed in the future. Embodiments of this disclosure can be applied to various communication systems. Given the rapid development of communications, there will naturally be future types of communication technologies and systems that can be used to embody the nature of this disclosure. The scope of this disclosure should not be limited to the systems described above.

[0033] As used herein, the term "network device" refers to a node in a communication network through which terminal devices access the network and receive services. Network devices can refer to base stations (BS) or access points (APs), such as Node B (NodeB or NB), evolved Node B (eNodeB or eNB), NR NB (also known as gNB), Remote Radio Unit (RRU), Radio Header (RH), Remote Radio Header End (RRH), relay, Integrated Access Backhaul (IAB) node, low-power node (such as femtosecond, picosecond), non-terrestrial network (NTN), or non-terrestrial network equipment such as satellite network equipment, low Earth orbit (LEO) satellites and geostationary Earth orbit (GEO) satellites, aircraft network equipment, etc., depending on the terminology and technology applied. The term "terminal device" refers to any terminal device capable of wireless communication. In the following description, the terms "terminal device," "communication equipment," "terminal," "user equipment," and "UE" are used interchangeably.

[0034] Terminal equipment configured with carrier aggregation (CA) has at least one serving cell, referred to as the primary cell (PCell) or primary-secondary cell (PSCell), and / or other serving cells referred to as secondary cells (SCell). As described above, if a beam failure occurs, the terminal equipment can report the beam failure and request beam recovery. Beam failure recovery (BFR) for a special cell (SpCell) is performed via a random access (RA) procedure. BFR for an SCell can be performed using a report based on a Media Access Control (MAC) control element (CE). The term "special cell (SpCell)" as used herein can include both primary and primary-secondary cells.

[0035] According to conventional techniques, if a Beam Failure Instance (BFI) indication has been received from a lower layer, the MAC entity at the UE can start a beam failure detection timer (beamFailureDetectionTimer) and increment the BFI counter (BFI_COUNTER) by 1. If BFI_COUNTER is not less than the maximum beam failure instance count (beamFailureInstanceMaxCount) and the serving cell is an SCell, the UE can trigger a beam failure detection (BFR) for that serving cell. Alternatively, the UE can initiate a beam failure detection (RA) procedure on the SCell. The beam failure detection (BFD) procedure can involve a timer denoted as "beamFailureDetectionTimer" and a threshold parameter denoted as "beamFailureInstanceMaxCount". The parameter "beamFailureDetectionTimer" used here can refer to the timer used for beam failure detection. The value of the beam failure detection timer can be the Q of the beam failure detection reference signal. out，LR Number of reporting periods. Value " pbfd1 "Corresponding to 1 Q of the beam failure detection reference signal" out，LR Reporting period, value " pbfd2 "Corresponding to the two Q values ​​of the beam failure detection reference signal" out，LR Reporting period. The parameter "beamFailureInstanceMaxCount" determines how many beam failure events the UE must wait before triggering beam failure recovery. Value " n1 "Corresponding to 1 beam failure instance, the value" n2 "This corresponds to two instances of beam failure."

[0036] Furthermore, activation / deactivation mechanisms for SCGs (including PSCells and SCells within SCGs) and SCells have been proposed. Additionally, there are proposals supporting and not supporting beam failure detection (BFD) when an SCG is deactivated. For radio link monitoring (RLM) that supports SCG deactivation, some proposals support RLM for deactivating SCGs on PSCells, taking into account SCG activation delays and allowing the reuse of traditional SCG failure information (SCGFailureInformation) messages after RLM detection. Some other proposals do not support RLM because radio resource management (RRM) measurements are sufficient to assess PSCell coverage.

[0037] According to some traditional techniques, RLM can be supported after SCG deactivation, and the traditional SCG Failure Information message and reporting procedure can be reused after RLM is detected. Some proposals support BFD after SCG deactivation. If BFD, beam management, and channel state information (CSI) are not supported, the UE will always need random access during SCG activation, which increases activation latency, even if the TA timer is running. For deactivated SCG, BFD on top of agreed RRM measurements is not expected to be very expensive in terms of UE power consumption. Due to UE power consumption issues, some proposals do not support BFD after SCG deactivation and question the necessity of BFD due to the lack of data activity. Some proposals also suggest that RRM measurements can compensate for the absence of BFD.

[0038] If BFD is supported after SCG deactivation, some proposals suggest that the UE should report the BFD occurrence to the SCG via the Primary Cell Group (MCG). Simultaneously, L1 measurement results and beam measurement results can be reported to the network, and the network can instruct the Active Transport Configuration Indicator (TCI) status to perform BFR without triggering the Random Access Channel (RACH). Another proposal is to reuse the SCG failure message.

[0039] For UEs deactivating a secondary cell group (SCG) in the network (NW), the serving beam that was previously active when the SCG was activated may easily drift due to UE movement (e.g., rotation or change in a congested radio environment). Therefore, when the SCG is activated again for the UE (e.g., after 10 seconds), the serving beam may no longer be active. BFD performance requires the UE to count beam failure instances until the maximum count threshold for beam failure instances is reached (hit). However, this can take a considerable amount of time because, given that the serving beam is active, BFI_COUNTER is expected to be 0 when the UE previously had SCG activity (and even if they are not active, the beam failure detection timer is expected to expire during the SCG inactivity period).

[0040] According to some traditional techniques, random access may always be required when BFD is not performed during SCG inactivity. However, after activating the SCG from deactivation, the previous serving beam appears to be equally valid, and the RA procedure can be avoided. On the other hand, if BFD is declared only after multiple beam failure instances following the activation of the SCG from the UE's deactivated state, this will result in additional latency for data transmission and additional UE power consumption if the serving beam is indeed no longer valid.

[0041] To address at least some of the aforementioned problems, a novel solution for beam failure detection is needed. According to embodiments of this disclosure, after activating a serving cell from a deactivated state, the terminal device detects beam failure on the serving beam of the serving cell. If a beam failure instance indication is received within a short period after activation, the terminal device determines that a beam failure has been detected on the serving beam of the serving cell. This allows for faster triggering of beam failure recovery to perform candidate beam search.

[0042] Figure 1 A schematic diagram of a communication environment 100 in which embodiments of the present disclosure may be implemented is shown. The communication environment 100, as part of a communication network, also includes devices 110-1, 110-2, ..., 110-N, which may be collectively referred to as "first device 110". The communication environment 100 includes a second device 120. The number N can be any suitable integer.

[0043] The communication environment 100 may include any suitable number of devices and cells. In the communication environment 100, the first device 110 and the second device 120 can transmit data and control information to each other. When the first device 110 is a terminal device and the second device 120 is a network device, the link from the second device 120 to the first device 110 is called a downlink (DL), and the link from the first device 110 to the second device 120 is called an uplink (UL). The second device 120 and the first device 110 are interchangeable. The first device 110 may be configured with more than one cell. For illustrative purposes only, the first device 110 may be configured with a serving cell 130.

[0044] In some example embodiments, serving cell 130 may be a secondary cell. Alternatively, serving cell 130 may be a secondary cell group (SCG) or a PSCell. The term "primary cell" as used herein may refer to a primary cell group (MCG) cell operating on the primary frequency, where the UE performs the initial connection establishment procedure or initiates a connection re-establishment procedure. The term "secondary cell" as used herein may refer to a cell that provides additional radio resources above a special cell (SpCell) for a UE configured with CA. For a UE in RRC_CONNECTED without carrier aggregation (CA) / dual connectivity (DC), there is only one serving cell including the primary cell. For a UE in RRC_CONNECTED with CA / DC configured, the term "serving cell" is used to represent the set of cells including special cells and all secondary cells. The term "PSCell" as used herein may refer to the primary cell of a secondary cell group (SCG). The term "SpCell" as used herein refers to a PCell or PSCell.

[0045] It should be understood that Figure 1 The number of first devices and cells shown, as well as their connections, are given for illustrative purposes and do not imply any limitation. The communication environment 100 may include any suitable number of devices and networks appropriate for implementing embodiments of this disclosure.

[0046] Communication in communication environment 100 can be implemented according to any suitable communication protocol, including but not limited to cellular communication protocols such as first-generation (1G), second-generation (2G), third-generation (3G), fourth-generation (4G), and fifth-generation (5G), wireless local area network communication protocols such as IEEE 802.11, and / or any other currently known or to be developed in the future. Furthermore, the communication can utilize any suitable wireless communication technology, including but not limited to: Code Division Multiple Access (CDMA), Frequency Division Multiple Access (FDMA), Time Division Multiple Access (TDMA), Frequency Division Duplex (FDD), Time Division Duplex (TDD), Multiple-Input Multiple-Output (MIMO), Orthogonal Frequency Division Multiplexing (OFDM), Discrete Fourier Transform Extended OFDM (DFT–s-OFDM), and / or any other currently known or to be developed in the future.

[0047] Exemplary embodiments of this disclosure will now be described in detail with reference to the accompanying drawings. (Refer to...) Figure 2 This illustrates a signaling flow 200 for beam failure detection according to an example embodiment of this disclosure. For purposes of discussion, reference will be made to... Figure 1 The signaling flow 200 is described. For illustrative purposes only, the signaling flow 200 may refer to the first device 110-1 and the second device 120.

[0048] The second device 120 can send a 2005 configuration to the first device 110-1. For example, this configuration may include a first timer for beam failure detection. The first timer can be applied after the serving cell (e.g., cell 130) is activated. For example, the configuration may be an indication of the available time period for the first timer. For illustrative purposes only, the serving cell used herein may refer to cell 130. Alternatively or additionally, this configuration may include a second timer for beam failure detection. The second timer can be used for normal beam failure detection. The first timer may be shorter than the second timer. This allows for faster triggering of beam failure recovery.

[0049] In other embodiments, the configuration may include a first counter for beam failure detection. The first counter may be applied after cell 130 is activated. For example, the configuration may be an indication of the time period during which the first counter is available. Alternatively or additionally, the configuration may include a second counter for beam failure detection. The second counter may be used for normal beam failure detection. The maximum value of the first counter may be less than the maximum value of the second counter. For example, a beam failure may be detected when either the first counter reaches its maximum value or the second counter reaches its maximum value. The configuration may include any one or a combination of the following: a first timer, a second timer, a first counter, and a second counter. The first timer, the second timer, the first counter, and the second counter may be transmitted in the same configuration or different configurations. In some examples, the counters are applied by the first device 110-1 itself, but the configuration only includes the maximum values ​​of the first and second counters.

[0050] The configuration can be sent via any appropriate signaling. For example, it can be sent via RRC signaling. Alternatively, the configuration can be transmitted in the downlink control information (DCI).

[0051] First device 110-1 can deactivate the serving cell 2010 (i.e., cell 130). In some example embodiments, second device 120 can send a MAC CE to first device 110-1 to deactivate cell 130. Alternatively, first device 110-1 can be configured with a deactivation timer by second device 120. In this case, if no data or Physical Downlink Control Channel (PDCCH) message is received on cell 130 within the deactivation timer, first device 110-1 can deactivate cell 130.

[0052] After cell 130 is deactivated, the first device 110-1 may not transmit a Sounding Reference Signal (SRS) on the serving cell. Furthermore, the first device 110-1 may not transmit Channel Quality Indicator (CQI) / Channel State Information (CSI) reports. Alternatively or additionally, the first device 110-1 may not transmit a rank indicator or a precoding matrix indicator. After deactivation, the first device 110-1 may also not transmit or receive data on cell 130.

[0053] First device 110-1 performs a 2015 activation procedure on cell 130. For example, second device 120 can send an instruction to first device 110-1 to activate cell 130. This instruction can be based on MAC CE information or RRC signaling. After activating cell 130, first device 110-1 can send an SRS on the serving cell. Additionally, first device 110-1 can perform CQI / CSI reporting. Alternatively or additionally, first device 110-1 can send a rank indicator or a precoding matrix indicator. First device 110-1 can also send or receive data on cell 130 after deactivation.

[0054] After cell 130 is activated, the first device 110-1 monitors for beam failures on (multiple) serving beams of cell 130. For example, the first device 110-1 may have a threshold. If the signal received on the serving beam is below the threshold, the first device 110-1 can determine that a beam failure instance has been detected. After detecting a beam failure instance, a lower layer of the first device 110-1 can send a beam failure instance indication to the MAC entity of the first device 110-1.

[0055] In some example embodiments, the first device 110-1 may activate a first timer for 2025. For example, the first timer may be activated if a beam failure instance is detected within a predetermined duration after activation. Alternatively or additionally, a first counter may be applied for a predetermined duration after activation. The predetermined duration may be any suitable length.

[0056] If at least one beam failure instance indication is received within a predetermined period after activation, the first device 110-1 determines that a beam failure has been detected. For example, if the beam failure instance is detected by a lower layer of the first device 110-1 (e.g., layer 1, L1), the lower layer may send the beam failure instance indication to the MAC entity of the first device 110-1. In an example embodiment, if a beam failure instance is received, the first device 110-1 may determine that a beam failure has been detected regardless of a second timer or a second counter (e.g., (2005) received in the configuration). In some embodiments, a first counter or a first timer may not be required. In this case, if a beam failure instance is received, the first device 110-1 may determine that a beam failure has been detected.

[0057] If no beam failure instance indication is received within a predetermined period after activation, the first device 110-1 may assume that a normal BFD procedure is applied. For example, if a beam failure instance indication is received after the predetermined period after activation, the first device 110-1 may start a second timer. Alternatively or additionally, the first device 110-1 may apply a second counter.

[0058] The predetermined time period can be fixed to the first device 110-1. Alternatively, the predetermined time period can be configured by the second device 120. In some example embodiments, the predetermined time period can be a first number of symbols. For example, if the first number of symbols is M, and a beam failure instance indication is received within M symbols after activation, the first device 110-1 can determine that a beam failure has been detected. Optionally or additionally, the predetermined time period can be a second number of milliseconds. For example, the second number can be P. In this case, if a beam failure instance indication is received within P milliseconds after activation, the first device 110-1 can determine that a beam failure has been detected. In other embodiments, the predetermined time period can be a third number of time slots. By way of example only, the third number can be Q. In this case, if a beam failure instance indication is received within Q time slots after activation (e.g., after the time slot where the activation indication is a command from the second device 120), the first device 110-1 can determine that a beam failure has been detected. In other embodiments, the predetermined time period can be determined based on the interval of the beam failure instance indications. The numbers M, P, and Q can be any suitable number. In this way, beam failure can be detected faster than traditional beam failure detection, thus ensuring communication quality.

[0059] In some example embodiments, as described above, a first timer can be started. In this case, if another beam failure instance indication is received before the expiration of the first timer, the first device 110-1 can determine that a beam failure has been detected. In this way, the first device 110-1 is able to detect beam failures more quickly than conventional beam failure detection.

[0060] In other embodiments, as described above, a first counter can be activated. In this case, if the first counter reaches its maximum value, the first device 110-1 can determine that a beam failure has been detected. In this way, the first device 110-1 can detect beam failure more quickly compared to conventional beam failure detection.

[0061] Alternatively, if the quality of the serving beam is below a threshold quality before deactivation and at least one beam failure instance indication is received, the first device 110-1 can determine that a beam failure has been detected. The threshold quality can be configured by the second device 120. In other embodiments, the threshold quality can be fixed.

[0062] As another embodiment, if a timer (e.g., a second timer) used for beam failure detection is running before deactivation and at least one beam failure instance indication is received, the first device 110-1 can determine that a beam failure has been detected. In yet another embodiment, if a counter (e.g., a second counter) used for beam failure detection before deactivation is greater than a predetermined number and at least one beam failure instance indication is received, the first device 110-1 can determine that a beam failure has been detected. The predetermined number can be any suitable number less than the maximum value of the counter, such as 0. The predetermined number can be configured by the second device 120. In other embodiments, the predetermined number can be fixed.

[0063] First device 110-1 sends a 2035 beam failure report to second device 120. The beam failure report indicates that the serving beam of the serving cell has failed. In some example embodiments, first device 110-1 may select a candidate beam for cell 130. In this case, if the candidate beam is different from the serving beam, the beam failure report may indicate the candidate beam. If the candidate beam is the same as the serving beam, the beam failure report may not indicate the candidate beam. Alternatively, if the quality of the candidate beam is better than the quality of the serving beam, the beam failure report may indicate the candidate beam. If the quality of the candidate beam is worse than the quality of the serving beam, the beam failure report may not indicate the candidate beam. After receiving a beam failure report, if the beam failure report does not indicate a candidate beam, second device 120 may assume that the serving beam is still operational. In this way, unnecessary beam failure recovery is avoided.

[0064] The first device 110-1 can perform the 2040 beam failure recovery procedure. In some example embodiments, the MAC entity can be configured by an RRC with a beam failure recovery procedure used to indicate a new synchronization signal block (SSB) or channel state information reference signal (CSI-RS) to the second device 120 upon detection of a beam failure. Alternatively, if the beam failure recovery configuration is reconfigured by an upper layer during an ongoing random access procedure for beam failure recovery, the MAC entity can stop the ongoing random access procedure and initiate a random access procedure with the new configuration.

[0065] Figure 3A flowchart of an example method 300 according to some example embodiments of the present disclosure is shown. For the purposes of discussion, method 300 will be described from the perspective of a first device. For illustrative purposes only, method 300 will be described with reference to the first device 110-1.

[0066] The first device 110-1 may receive configuration from the second device 120. For example, this configuration may include a first timer for beam failure detection. The first timer may be applied after the serving cell (e.g., cell 130) is activated. For example, the configuration may be an indication of the available time period for the first timer. For illustrative purposes only, the serving cell referred to herein may refer to cell 130. Alternatively or additionally, this configuration may include a second timer for beam failure detection. The second timer may be used for normal beam failure detection. The first timer may be shorter than the second timer. This allows for faster triggering of beam failure recovery.

[0067] In other embodiments, the configuration may include a first counter for beam failure detection. The first counter may be applied after cell 130 is activated. For example, the configuration may be an indication of the time period during which the first counter is available. Alternatively or additionally, the configuration may include a second counter for beam failure detection. The second counter may be used for normal beam failure detection. The maximum value of the first counter may be less than the maximum value of the second counter. For example, a beam failure may be detected when either the first counter reaches its maximum value or the second counter reaches its maximum value. The configuration may include any one or a combination of the following: a first timer, a second timer, a first counter, and a second counter. The first timer, the second timer, the first counter, and the second counter may be transmitted in the same configuration or different configurations. In some examples, the counters are applied by the first device 110-1 itself, but the configuration only includes the maximum values ​​of the first and second counters.

[0068] The configuration can be sent via any appropriate signaling. For example, it can be sent via RRC signaling. Alternatively, the configuration can be transmitted in the downlink control information (DCI).

[0069] In some example embodiments, the first device 110-1 can deactivate the serving cell (i.e., cell 130). In some example embodiments, the first device 110-1 can receive a MAC CE from the second device 120 to deactivate cell 130. Alternatively, the first device 110-1 can have a deactivation timer configured by the second device 120. In this case, if no data or Physical Downlink Control Channel (PDCCH) message is received on cell 130 within the deactivation timer, the first device 110-1 can deactivate cell 130.

[0070] After cell 130 is deactivated, the first device 110-1 may not transmit a sounding reference signal (SRS) on the serving cell. Furthermore, the first device 110-1 may not transmit a channel quality indicator (CQI) / channel state information (CSI) report. Alternatively or additionally, the first device 110-1 may not transmit a rank indicator or a precoding matrix indicator. After deactivation, the first device 110-1 may also not transmit or receive data on cell 130.

[0071] At box 310, the first device 110-1 performs an activation procedure on cell 130. For example, the second device 120 may send an indication to the first device 110-1 to activate cell 130. This indication may be based on MAC CE information or RRC signaling. After activating cell 130, the first device 110-1 may send an SRS on the serving cell. Additionally, the first device 110-1 may perform a CQI / CSI report. Alternatively or additionally, the first device 110-1 may send a rank indicator or a precoding matrix indicator. The first device 110-1 may also send or receive data on cell 130 after deactivation.

[0072] At box 320, after cell 130 is activated, first device 110-1 monitors for beam failures on the serving beam of cell 130. For example, first device 110-1 may have a threshold. If the signal received on the serving beam is below the threshold, first device 110-1 can determine that a beam failure instance has been detected. After detecting a beam failure instance, lower layers of first device 110-1 can send a beam failure instance indication to the MAC entity of first device 110-1.

[0073] In some example embodiments, the first device 110-1 may start a first timer. For example, the first timer may be started if a beam failure instance is detected within a predetermined duration after activation. Alternatively or additionally, a first counter may be applied for a predetermined duration after activation. The predetermined duration may be any suitable length.

[0074] At block 330, if at least one beam failure instance indication is received within a predetermined period after activation, the first device 110-1 determines that a beam failure has been detected. For example, if a lower layer of the first device 110-1 (e.g., layer 1, L1) detects a beam failure instance, the lower layer may send a beam failure instance indication to the MAC entity of the first device 110-1. In an example embodiment, if a beam failure instance is received, the first device 110-1 may determine that a beam failure has been detected regardless of a second timer or a second counter (e.g., received in the configuration). In some embodiments, a first counter or a first timer may not be required. In this case, if a beam failure instance is received, the first device 110-1 may determine that a beam failure has been detected.

[0075] If no beam failure instance indication is received within a predetermined period after activation, the first device 110-1 may assume that a normal BFD procedure is applied. For example, if a beam failure instance indication is received after the predetermined period after activation, the first device 110-1 may start a second timer. Alternatively or additionally, the first device 110-1 may apply a second counter.

[0076] The predetermined time period can be fixed to the first device 110-1. Alternatively, the predetermined time period can be configured by the second device 120. In some example embodiments, the predetermined time period can be a first number of symbols. For example, if the first number of symbols is M, and a beam failure instance indication is received within M symbols after activation, the first device 110-1 can determine that a beam failure has been detected. Optionally or additionally, the predetermined time period can be a second number of milliseconds. For example, the second number can be P. In this case, if a beam failure instance indication is received within P milliseconds after activation, the first device 110-1 can determine that a beam failure has been detected. In other embodiments, the predetermined time period can be a third number of time slots. By way of example only, the third number can be Q. In this case, if a beam failure instance indication is received within Q time slots after activation (e.g., after the time slot where the activation indication is a command from the second device 120), the first device 110-1 can determine that a beam failure has been detected. In other embodiments, the predetermined time period can be determined based on the interval of the beam failure instance indications. The numbers M, P, and Q can be any suitable number. In this way, beam failure can be detected faster than traditional beam failure detection, thus ensuring communication quality.

[0077] In some example embodiments, as described above, a first timer can be started. In this case, if another beam failure instance indication is received before the expiration of the first timer, the first device 110-1 can determine that a beam failure has been detected. In this way, the first device 110-1 is able to detect beam failures more quickly than conventional beam failure detection.

[0078] In other embodiments, as described above, a first counter can be activated. In this case, if the first counter reaches its maximum value, the first device 110-1 can determine that a beam failure has been detected. In this way, the first device 110-1 can detect beam failure more quickly compared to conventional beam failure detection.

[0079] Alternatively, if the quality of the serving beam is below a threshold quality before deactivation and at least one beam failure instance indication is received, the first device 110-1 can determine that a beam failure has been detected. The threshold quality can be configured by the second device 120. In other embodiments, the threshold quality can be fixed.

[0080] As another embodiment, if a timer (e.g., a second timer) used for beam failure detection is running before deactivation and at least one beam failure instance indication is received, the first device 110-1 can determine that a beam failure has been detected. In yet another embodiment, if a counter (e.g., a second counter) used for beam failure detection before deactivation is greater than a predetermined number and at least one beam failure instance indication is received, the first device 110-1 can determine that a beam failure has been detected. The predetermined number can be any suitable number less than the maximum value of the counter, such as 0. The predetermined number can be configured by the second device 120. In other embodiments, the predetermined number can be fixed.

[0081] At block 340, the first device 110-1 sends a beam failure report to the second device 120. The beam failure report indicates that the serving beam of the serving cell has failed. In some example embodiments, the first device 110-1 may select a candidate beam for cell 130. In this case, if the candidate beam is different from the serving beam, the beam failure report may indicate the candidate beam. If the candidate beam is the same as the serving beam, the beam failure report may not indicate the candidate beam. Alternatively, if the quality of the candidate beam is better than the quality of the serving beam, the beam failure report may indicate the candidate beam. If the quality of the candidate beam is worse than the quality of the serving beam, the beam failure report may not indicate the candidate beam. After receiving a beam failure report, if the beam failure report does not indicate a candidate beam, the second device 120 may assume that the serving beam is still operational. In this way, unnecessary beam failure recovery is avoided.

[0082] Figure 4 A flowchart of an example method 400 according to some example embodiments of the present disclosure is shown. For the purposes of discussion, method 400 will be described from the perspective of a second device. For illustrative purposes only, the second device may be second device 120.

[0083] In some example embodiments, at block 410, the second device 120 may send a configuration to the first device 110-1. For example, this configuration may include a first timer for beam failure detection. The first timer may be applied after the serving cell (e.g., cell 130) is activated. For example, the configuration may indicate the period of time during which the first timer is available. For illustrative purposes only, the serving cell referred to herein may refer to cell 130. Alternatively or additionally, this configuration may include a second timer for beam failure detection. The second timer can be used for normal beam failure detection. The first timer may be shorter than the second timer. This allows beam failure recovery to be triggered more quickly.

[0084] In other embodiments, the configuration may include a first counter for beam failure detection. The first counter may be applied after activation unit 130. For example, the configuration may indicate a time period during which the first counter is available. Alternatively or additionally, the configuration may be a second counter for beam failure detection. The second counter can be used for normal beam failure detection. The maximum value of the first counter may be less than the maximum value of the second counter. The configuration may include any one or a combination of the following: a first timer, a second timer, a first counter, and a second counter. The first timer, the second timer, the first counter, and the second counter may be sent in the same configuration or different configurations.

[0085] The configuration can be sent via any appropriate signaling. For example, it can be sent via RRC signaling. Alternatively, the configuration can be transmitted in the downlink control information (DCI).

[0086] In some example embodiments, the second device 120 may send a MAC CE to the first device 110-1 to deactivate cell 130. Alternatively, the first device 110-1 may be configured with a deactivation timer by the second device 120. In this case, if no data or physical downlink control channel (PDCCH) message is received on cell 130 within the deactivation timer, the first device 110-1 may deactivate cell 130.

[0087] At box 420, if at least one beam failure instance indication for the serving beam of cell 130 is received at the first device 110-1 within a predetermined period after activation, the second device 120 receives a beam failure report from the first device 110-1.

[0088] The predetermined time period can be fixed to the first device 110-1. Alternatively, the predetermined time period can be configured by the second device 120. In some example embodiments, the predetermined time period can be a first number of symbols. Optionally or additionally, the predetermined time period can be a second number of milliseconds. In other embodiments, the predetermined time period can be a third number of time slots. In other embodiments, the predetermined time period can be determined based on the interval indicated by beam failure instances. The numbers of M, P, and Q can be any suitable number. In this way, beam failures can be detected faster compared to conventional beam failure detection, thereby ensuring communication quality.

[0089] In some example embodiments, a first timer may be started. In this case, if another beam failure instance indication is received before the first timer expires, the second device 120 can receive a beam failure report from the first device 110-1.

[0090] In other embodiments, a first counter may be activated. In this case, if the first counter reaches its maximum value, the second device 120 may receive a beam failure report from the first device 110-1.

[0091] Alternatively, if the quality of the serving beam is below a threshold quality and at least one beam failure instance indication is received before deactivation, the second device 120 may receive a beam failure report from the first device 110-1. The threshold quality may be configured by the second device 120. In other embodiments, the threshold quality may be fixed.

[0092] As another embodiment, if a timer (e.g., a second timer) used for beam failure detection before deactivation runs and at least one beam failure instance indication is received, the second device 120 can receive a beam failure report from the first device 110-1. In yet another embodiment, if a counter (e.g., a second counter) used for beam failure detection before deactivation is greater than a predetermined number and at least one beam failure instance indication is received, the second device 120 can receive a beam failure report from the first device 110-1. The predetermined number can be any suitable number less than the maximum value of the counter, such as 0. The predetermined number can be configured by the second device 120. In other embodiments, the predetermined number can be fixed.

[0093] In some example embodiments, the first device 110-1 may select a candidate beam for cell 130. In this case, if the candidate beam is different from the serving beam, a beam failure report may indicate the candidate beam. If the candidate beam is the same as the serving beam, the beam failure report may not indicate the candidate beam. Alternatively, if the quality of the candidate beam is better than the quality of the serving beam, the beam failure report may indicate the candidate beam. If the quality of the candidate beam is worse than the quality of the serving beam, the beam failure report may not indicate the candidate beam. After receiving a beam failure report, if the beam failure report does not indicate a candidate beam, the second device 120 may assume that the serving beam is still operational. In this way, unnecessary beam failure recovery is avoided.

[0094] In some example embodiments, a first means (e.g., first device 110) capable of performing any method 300 may include components for performing the corresponding operations of method 300. These components may be implemented in any suitable form. For example, the means may be implemented in a circuit or software module. The first means may be implemented as or included in the first device 110. In some example embodiments, the components may include at least one processor and at least one memory including computer program code. The at least one memory and the computer program code are configured to, together with the at least one processor, cause performance issues in the means.

[0095] In some example embodiments, the apparatus includes components for performing an activation process on a deactivated serving cell; components for monitoring beam failures on the serving beam of the serving cell after activation; components for determining that a beam failure has been detected on the serving beam based on the determination that at least one beam failure instance indication has been received within a predetermined time period; and components for sending a beam failure report to a second device.

[0096] In some example embodiments, the component for determining that a beam failure has been detected on the serving beam includes: a component for determining that a beam failure has been detected on the serving beam based on the determination that the quality of the serving beam is below a threshold quality before deactivation and that at least one beam failure instance indication has been received.

[0097] In some example embodiments, the component for determining that a beam failure has been detected on the serving beam includes: a component for determining that a beam failure has been detected on the serving beam based on the determination that a timer for beam failure detection is running before deactivation and that at least one beam failure instance indication has been received.

[0098] In some example embodiments, the component for determining that a beam failure has been detected on the serving beam includes: a component for determining that a beam failure has been detected on the serving beam based on determining that a counter for beam failure detection is greater than a predetermined number and that at least one beam failure instance indication has been received.

[0099] In some example embodiments, the predetermined time period includes one of the following: a first predetermined number of symbols, a second predetermined number of milliseconds, or a third predetermined number of time slots; or wherein the apparatus includes components for determining the predetermined time period based on intervals indicating beam failure instances.

[0100] In some example embodiments, the apparatus further includes a component for receiving a configuration from the second device, the configuration indicating at least one of the following: a first timer for beam failure detection and a second timer for beam failure detection, the first timer being shorter than the second timer; or a first counter for beam failure detection and a second counter for beam failure detection, the maximum value of the first counter being less than the maximum value of the second counter.

[0101] In some example embodiments, the apparatus further includes: a component for starting a first timer based on determining that at least one beam failure instance indication has been received within a predetermined time period; and wherein the component for determining that a beam failure has been detected on the serving beam includes: a component for determining that a beam failure has been detected on the serving beam based on determining that another beam failure instance indication has been received before the expiration of the first timer.

[0102] In some example embodiments, the apparatus further includes: a component for applying a first counter based on determining that at least one beam failure instance indication has been received within a predetermined time period; and wherein the component for determining that a beam failure has been detected on the serving beam includes: a component for determining that a beam failure has been detected on the serving beam based on determining that a first counter has reached its maximum value.

[0103] In some example embodiments, the apparatus also includes a component for applying at least one of the following based on determining that no beam failure instance indication has been received within a predetermined time period: a second timer or a second counter.

[0104] In some example embodiments, the components for sending beam failure reports include: components for sending a beam failure report indicating a candidate beam based on determining that the candidate beam is different from the serving beam; or components for sending a beam failure report indicating a candidate beam based on determining that the quality of the candidate beam is better than the quality of the serving beam.

[0105] In some example embodiments, the component for sending a beam failure report includes a component for sending a beam failure report without indicating the candidate beam based on determining that the candidate beam is the same as the serving beam or determining that the quality of the candidate beam is worse than the quality of the serving beam.

[0106] In some example embodiments, the serving cell is a secondary cell or a group of secondary cells.

[0107] In some example embodiments, the first device includes a terminal device, while the second device includes a network device.

[0108] In some example embodiments, a first device (e.g., second device 120) capable of performing any method 400 may include components for performing the corresponding operations of method 400. These components may be implemented in any suitable form. For example, the components may be implemented in a circuit or software module. The first device may be implemented as or included in the first device 120. In some example embodiments, the components may include at least one processor and at least one memory including computer program code. The at least one memory and the computer program code are configured to, together with the at least one processor, cause the performance of the device.

[0109] In some example embodiments, the apparatus includes a component for receiving a beam failure report from a first device, based on a determination that at least one beam failure instance of the serving beam of the serving cell is received at a first device within a predetermined time period after activation of the serving cell, at a second device.

[0110] In some example embodiments, the component for receiving beam failure reports includes: a component for receiving beam failure reports from a first device based on determining that the quality of the serving beam is below a threshold quality before deactivation and that at least one beam failure instance indication has been received.

[0111] In some example embodiments, the component for receiving a beam failure report includes a component for receiving a beam failure report from a first device based on determining that a timer for beam failure detection is running before deactivation and that at least one beam failure instance indication has been received.

[0112] In some example embodiments, the component for receiving a beam failure report includes a component for receiving a beam failure report from a first device based on determining that a counter for beam failure detection is greater than a predetermined number and that at least one beam failure instance is indicated to have been received.

[0113] In some example embodiments, the predetermined time period includes one of the following: a first predetermined number of symbols, a second predetermined number of milliseconds, a third predetermined number of time slots; or an interval for indicating beam failure instances.

[0114] In some example embodiments, the apparatus further includes a component for sending a configuration to a first device, the configuration indicating at least one of the following: a first timer for beam failure detection and a second timer for beam failure detection, the first timer being shorter than the second timer; or a first counter for beam failure detection and a second counter for beam failure detection, the maximum value of the first counter being less than the maximum value of the second counter.

[0115] In some example embodiments, the apparatus further includes a component for receiving a beam failure report from a first device based on determining that at least one beam failure instance indication has been received within a predetermined time period and that another beam failure instance indication has been received before the expiration of a first timer.

[0116] In some example embodiments, the apparatus further includes a component for receiving a beam failure report from a first device based on the determination that at least one beam failure instance indication has been received within a predetermined time period and that a first counter has reached its maximum value.

[0117] In some example embodiments, the component for receiving a beam failure report includes: a component for receiving a beam failure report indicating a candidate beam based on determining that the candidate beam is different from the serving beam; or a component for receiving a beam failure report indicating a candidate beam based on determining that the quality of the candidate beam is better than the quality of the serving beam.

[0118] In some example embodiments, the components for receiving beam failure reports include: components for receiving beam failure reports without indicating the candidate beam based on determining that the candidate beam is the same as the serving beam or determining that the quality of the candidate beam is worse than that of the serving beam; and components for determining that the serving beam is working.

[0119] In some example embodiments, the serving cell is a secondary cell or a group of secondary cells.

[0120] In some example embodiments, the first device includes a terminal device, while the second device includes a network device.

[0121] Figure 5 This is a simplified block diagram of a device 500 suitable for implementing embodiments of the present disclosure. Device 500 can be used to implement a communication device, such as... Figure 1 The first device 110 or the second device 120 shown. As shown, device 500 includes one or more processors 510, one or more memories 520 coupled to processor 510, and one or more communication modules 540 coupled to processor 510.

[0122] Communication module 540 is used for bidirectional communication. Communication module 540 has one or more communication interfaces to facilitate communication with one or more other modules or devices. The communication interface can represent any interface required for communication with other network elements. In some example embodiments, communication module 540 may include at least one antenna.

[0123] Processor 510 can be of any type suitable for a local technology network, and by way of non-limiting example, can include one or more of the following: general-purpose computer, special-purpose computer, microprocessor, digital signal processor (DSP), and processor based on a multi-core processor architecture. Device 500 can have multiple processors, such as application-specific integrated circuit chips that are time-dependent on a clock synchronized with the main processor.

[0124] Memory 520 may include one or more non-volatile memories and one or more volatile memories. Examples of non-volatile memories include, but are not limited to, read-only memory (ROM) 524, electrically programmable read-only memory (EPROM), flash memory, hard disk, optical disc (CD), digital video disk (DVD), optical disc, laser disc, and other magnetic and / or optical storage devices. Examples of volatile memories include, but are not limited to, random access memory (RAM) 522 and other volatile memories that do not persist during power-off periods.

[0125] Computer program 530 includes computer-executable instructions that are executed by the associated processor 510. Program 530 may be stored in memory, such as ROM 524. Processor 510 can perform any suitable actions and processes by loading program 530 into RAM 522.

[0126] The exemplary embodiments of this disclosure can be implemented by program 530, enabling device 500 to perform as described in the reference. Figures 2 to 4 Any process discussed in this disclosure. Exemplary embodiments of this disclosure may also be implemented using hardware or a combination of software and hardware.

[0127] In some example embodiments, program 530 may be tangibly contained in a computer-readable medium, which may be included in device 500 (such as in memory 520) or other storage devices accessible to device 500. Device 500 may load program 530 from the computer-readable medium into RAM 522 for execution. The computer-readable medium may include any type of tangible non-volatile memory, such as ROM, EPROM, flash memory, hard disk, CD, DVD, and other magnetic and / or optical storage devices. Figure 6 An example of a computer-readable medium 600 in the form of an optical storage disk is shown. The computer-readable medium has a program 530 stored thereon.

[0128] Generally, the various embodiments of this disclosure can be implemented in hardware or dedicated circuitry, software, logic, or any combination thereof. Some aspects can be implemented in hardware, while others can be implemented in firmware or software that can be executed by a controller, microprocessor, or other computing device. Although various aspects of the embodiments of this disclosure are shown and described as block diagrams, flowcharts, or using some other graphical representation, it should be understood that the block diagrams, apparatuses, systems, techniques, or methods described herein can be implemented in hardware, software, firmware, dedicated circuitry or logic, general-purpose hardware or controllers or other computing devices, or some combination thereof.

[0129] This disclosure also provides at least one computer program product tangibly stored on a non-transitory computer-readable storage medium. The computer program product includes computer-executable instructions, such as computer-executable instructions included in a program module, which execute in a device on a target physical or virtual processor to perform the above-mentioned references. Figure 2-4 Any method described. Typically, a program module includes routines, programs, libraries, objects, classes, components, data types, etc., that perform specific tasks or implement specific abstract data structures. The functionality of program modules can be combined or split among program modules as needed in various embodiments. The machine-executable instructions used for a program module can execute on a local or distributed device. In a distributed device, program modules can reside on local and remote storage media.

[0130] Program code used to perform the methods of this disclosure may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing apparatus, such that when executed by the processor or controller, it causes the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The program code may be executed entirely on a machine, partially on a machine, as a stand-alone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0131] In the context of this disclosure, computer program code or related data may be carried by any suitable carrier to enable a device, apparatus, or processor to perform the various processes and operations described above. Examples of carriers include signals, computer-readable media, etc.

[0132] Computer-readable media can be computer-readable signal media or computer-readable storage media. Computer-readable media can include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatuses, or devices, or any suitable combination thereof. More specific examples of computer-readable storage media include electrical connections having one or more wires, portable computer floppy disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable optical disc read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0133] Furthermore, although operations are described in a specific order, this should not be construed as requiring such operations to be performed in the specific order shown or in a sequential order, or to perform all shown operations to achieve the desired result. In some cases, multitasking and parallel processing may be advantageous. Similarly, although several specific implementation details are included in the above discussion, these details should not be construed as limiting the scope of this disclosure, but rather as descriptions of features specific to particular embodiments. Certain features described in the context of individual embodiments may also be implemented in combination in a single embodiment. Conversely, various features described in the context of a single embodiment may also be implemented separately in multiple embodiments or in any suitable sub-combination.

[0134] Although this disclosure has been described in language specific to structural features and / or methodological actions, it should be understood that the disclosure as defined in the appended claims is not necessarily limited to the specific features or actions described above. Rather, the specific features and actions described above are disclosed as exemplary forms for implementing the claims.

Claims

1. A first device for communication, comprising: At least one processor; as well as At least one memory, including computer program code; The at least one memory and the computer program code are configured to, together with the at least one processor, enable the first device to: Perform the activation process on the deactivated serving cell; After activating the serving cell, monitor for beam failure on the serving beam of the serving cell; Based on the determination that at least one beam failure instance is received within a predetermined time period, it is determined that the beam failure is detected on the serving beam, regardless of the configuration of the second timer and the second counter for beam failure detection. as well as Send a beam failure report to the second device.

2. The first device of claim 1, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the first device to determine that the beam failure is detected on the serving beam by: Based on the determination that the quality of the serving beam is below a threshold quality before the deactivation and that at least one beam failure instance indication is received, it is determined that the beam failure was detected on the serving beam.

3. The first device of claim 1, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the first device to determine that the beam failure is detected on the serving beam by: The beam failure is determined to be detected on the serving beam based on the fact that a timer for beam failure detection was running before the deactivation and that the at least one beam failure instance indication was received.

4. The first device of claim 1, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the first device to determine that the beam failure is detected on the serving beam by: The beam failure is determined to be detected on the serving beam based on the determination that the counter used for beam failure detection is greater than a predetermined number and the at least one beam failure instance indication is received.

5. The first device according to claim 1, wherein the predetermined time period includes one of the following: The first predetermined number of symbols, The second predetermined number of milliseconds, or The third predetermined number of time slots; or The at least one memory and the computer program code are configured to, together with the at least one processor, enable the first device to: The predetermined time period is determined based on the interval used for beam failure instance indication.

6. The first device of claim 1, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to further enable the first device to: Receive configuration from the second device, the configuration indicating at least one of the following: A first timer for beam failure detection and a second timer for beam failure detection, wherein the first timer is shorter than the second timer; or A first counter for beam failure detection and a second counter for beam failure detection, wherein the maximum value of the first counter is less than the maximum value of the second counter.

7. The first device of claim 6, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to further enable the first device to: Based on the determination that at least one beam failure instance indication is received within the predetermined time period, the first timer is started; and The at least one memory and the computer program code are configured, together with the at least one processor, to cause the first device to determine that the beam failure is detected on the serving beam by: Based on the determination that another beam failure instance indication is received before the expiration of the first timer, it is determined that the beam failure was detected on the serving beam.

8. The first device of claim 6, wherein the at least one memory and the computer program code are configured to, together with the at least one processor, further enable the first device to: The first counter is applied based on the determination that the at least one beam failure instance was received within the predetermined time period; and The at least one memory and the computer program code are configured, together with the at least one processor, to enable the first device to determine that the beam failure has been detected on the serving beam by: Based on the determination that the first counter has reached its maximum value, it is determined that the beam failure was detected on the serving beam.

9. The first device of claim 6, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to further enable the first device to: Based on the determination that no beam failure instance indication is received within the predetermined time period, at least one of the following is applied: the second timer or the second counter.

10. The first device of claim 1, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the first device to send the beam failure report by: Based on the determination that the candidate beam is different from the serving beam, a beam failure report indicating the candidate beam is sent; or Based on the determination that the quality of the candidate beam is superior to the quality of the serving beam, a beam failure report indicating the candidate beam is sent.

11. The first device of claim 1, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the first device to send the beam failure report by: If the candidate beam is determined to be the same as the serving beam, or if the quality of the candidate beam is determined to be worse than that of the serving beam, a beam failure report is sent without indicating the candidate beam.

12. The first device according to any one of claims 1-11, wherein the serving cell is a secondary cell or a group of secondary cells.

13. The first device according to any one of claims 1-11, wherein the first device includes a terminal device and the second device includes a network device.

14. A second device for communication, comprising: At least one processor; as well as At least one memory, including computer program code; The at least one memory and the computer program code are configured to, together with the at least one processor, enable the second device to: A beam failure report is received from the first device based on the determination that at least one beam failure instance of the serving beam of the serving cell is received within a predetermined time period after the serving cell is activated, regardless of the configuration of the second timer and the second counter for beam failure detection.

15. The second device of claim 14, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the second device to receive the beam failure report by: The beam failure report is received from the first device based on the determination that the quality of the serving beam is below a threshold quality before the deactivation of the serving cell and the at least one beam failure instance indication is received.

16. The second device of claim 14, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the second device to receive the beam failure report by: A beam failure report is received from the first device based on the determination that a timer for beam failure detection is running before the deactivation of the serving cell and that at least one beam failure instance indication has been received.

17. The second device of claim 14, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the second device to receive the beam failure report by: The beam failure report is received from the first device based on the determination that the counter used for beam failure detection is greater than a predetermined number and the at least one beam failure instance indication is received.

18. The second device according to claim 14, wherein the predetermined time period includes one of the following: The first predetermined number of symbols, The second predetermined number of milliseconds, The third predetermined number of time slots; or The interval used to indicate beam failure instances.

19. The second device of claim 14, wherein the at least one memory and the computer program code are configured to further enable the second device with respect to the at least one processor: Send a configuration to the first device, the configuration indicating at least one of the following: A first timer for beam failure detection and a second timer for beam failure detection, wherein the first timer is shorter than the second timer; or A first counter for beam failure detection and a second counter for beam failure detection, wherein the maximum value of the first counter is less than the maximum value of the second counter.

20. The second device of claim 19, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to further enable the second device to: The beam failure report is received from the first device based on the determination that at least one beam failure instance indication is received within the predetermined time period and another beam failure instance indication is received before the expiration of the first timer.

21. The second device of claim 19, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to further enable the second device to: The beam failure report is received from the first device based on the determination that at least one beam failure instance was received within the predetermined time period and the first counter reached the maximum value of the first counter.

22. The second device of claim 14, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the second device to receive the beam failure report by: Based on the determination that the candidate beam is different from the serving beam, a beam failure report indicating the candidate beam is received; or Based on the determination that the quality of the candidate beam is superior to the quality of the serving beam, a beam failure report indicating the candidate beam is received.

23. The second device of claim 14, wherein the at least one memory and the computer program code are configured, together with the at least one processor, to cause the second device to receive the beam failure report by: Based on whether the candidate beam is determined to be the same as the serving beam or the quality of the candidate beam is determined to be worse than the quality of the serving beam, a beam failure report is received without indicating the candidate beam; and It has been confirmed that the service beam is operational.

24. The second device according to any one of claims 14-23, wherein the serving cell is a secondary cell or a group of secondary cells.

25. The second device according to any one of claims 14-23, wherein the first device includes a terminal device and the second device includes a network device.

26. A method for communication, comprising: At the first device, the activation process is performed on the deactivated serving cell; After activating the serving cell, monitor for beam failure on the serving beam of the serving cell; Based on the determination that at least one beam failure instance is received within a predetermined time period, it is determined that the beam failure is detected on the serving beam, regardless of the configuration of the second timer and the second counter for beam failure detection. as well as Send a beam failure report to the second device.

27. The method of claim 26, wherein determining that the beam failure is detected on the serving beam comprises: Based on the determination that the quality of the serving beam is below a threshold quality before the deactivation and that at least one beam failure instance indication is received, it is determined that the beam failure was detected on the serving beam.

28. The method of claim 26, wherein determining that the beam failure is detected on the serving beam comprises: The beam failure is determined to be detected on the serving beam based on the fact that a timer for beam failure detection was running before the deactivation and that the at least one beam failure instance indication was received.

29. The method of claim 26, wherein determining that the beam failure is detected on the serving beam comprises: The beam failure is determined to be detected on the serving beam based on the determination that the counter used for beam failure detection is greater than a predetermined number and the at least one beam failure instance indication is received.

30. The method of claim 26, wherein the predetermined time period includes one of the following: The first predetermined number of symbols, The second predetermined number of milliseconds, or The third predetermined number of time slots; or The method includes: The predetermined time period is determined based on the interval used for beam failure instance indication.

31. The method of claim 26, further comprising: Receive configuration from the second device, the configuration indicating at least one of the following: A first timer for beam failure detection and a second timer for beam failure detection, wherein the first timer is shorter than the second timer; or A first counter for beam failure detection and a second counter for beam failure detection, wherein the maximum value of the first counter is less than the maximum value of the second counter.

32. The method of claim 31, further comprising: The first timer is started based on the determination that at least one beam failure instance is received within the predetermined time period; as well as Determining that the beam failure is detected on the serving beam includes: Based on the determination that another beam failure instance indication is received before the expiration of the first timer, it is determined that the beam failure was detected on the serving beam.

33. The method of claim 31, further comprising: The first counter is applied based on the determination that the at least one beam failure instance was received within the predetermined time period; as well as Determining that the beam failure is detected on the serving beam includes: Based on the determination that the first counter has reached its maximum value, it is determined that the beam failure was detected on the serving beam.

34. The method of claim 31, further comprising: Based on the determination that no beam failure instance indication is received within the predetermined time period, at least one of the following is applied: the second timer or the second counter.

35. The method of claim 26, wherein sending the beam failure report comprises: Based on the determination that the candidate beam is different from the serving beam, a beam failure report indicating the candidate beam is sent; or Based on the determination that the quality of the candidate beam is superior to the quality of the serving beam, a beam failure report indicating the candidate beam is sent.

36. The method of claim 26, wherein sending the beam failure report comprises: If the candidate beam is determined to be the same as the serving beam, or if the quality of the candidate beam is determined to be worse than that of the serving beam, a beam failure report is sent without indicating the candidate beam.

37. The method according to any one of claims 26-36, wherein the serving cell is a secondary cell or a group of secondary cells.

38. The method according to any one of claims 26-36, wherein the first device includes a terminal device and the second device includes a network device.

39. A method for communication, comprising: At the second device, a beam failure report is received from the first device within a predetermined time period, based on the determination that at least one beam failure instance of the serving beam of the serving cell is received after the serving cell is activated, regardless of the configuration of the second timer and the second counter for beam failure detection.

40. The method of claim 39, wherein receiving the beam failure report comprises: The beam failure report is received from the first device based on the determination that the quality of the serving beam is below a threshold quality before the deactivation of the serving cell and the at least one beam failure instance indication is received.

41. The method of claim 39, wherein receiving the beam failure report comprises: A beam failure report is received from the first device based on the determination that a timer for beam failure detection is running before the deactivation of the serving cell and that at least one beam failure instance indication has been received.

42. The method of claim 39, wherein receiving the beam failure report comprises: The beam failure report is received from the first device based on the determination that the counter used for beam failure detection is greater than a predetermined number and the at least one beam failure instance indication is received.

43. The method of claim 39, wherein the predetermined time period includes one of the following: The first predetermined number of symbols, The second predetermined number of milliseconds, The third predetermined number of time slots; or The interval used to indicate beam failure instances.

44. The method of claim 39, further comprising: Send a configuration to the first device, the configuration indicating at least one of the following: A first timer for beam failure detection and a second timer for beam failure detection, wherein the first timer is shorter than the second timer; or A first counter for beam failure detection and a second counter for beam failure detection, wherein the maximum value of the first counter is less than the maximum value of the second counter.

45. The method of claim 44, further comprising: The beam failure report is received from the first device based on the determination that at least one beam failure instance indication is received within the predetermined time period and another beam failure instance indication is received before the expiration of the first timer.

46. ​​The method of claim 44, further comprising: The beam failure report is received from the first device based on the determination that at least one beam failure instance was received within the predetermined time period and the first counter reached the maximum value of the first counter.

47. The method of claim 39, wherein receiving the beam failure report comprises: Based on the determination that the candidate beam is different from the serving beam, a beam failure report indicating the candidate beam is received; or Based on the determination that the quality of the candidate beam is superior to the quality of the serving beam, a beam failure report indicating the candidate beam is received.

48. The method of claim 39, wherein receiving the beam failure report comprises: If the candidate beam is determined to be the same as the serving beam or the quality of the candidate beam is determined to be worse than that of the serving beam, a beam failure report is received without indicating the candidate beam. as well as It has been confirmed that the service beam is operational.

49. The method according to any one of claims 39-48, wherein the serving cell is a secondary cell or a group of secondary cells.

50. The method according to any one of claims 39-48, wherein the first device comprises a terminal device and the second device comprises a network device.

51. A device for communication, comprising: Components for performing the method as described in at least any one of claims 26-38 or any one of claims 39-50.

52. A computer-readable medium storing instructions for causing a device to perform the method according to any one of claims 26-38 or the method according to any one of claims 39-50.

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