Transient spectrometer acquisition time measurement device and measurement method

Abstract

The present application belongs to the technical field of optical metrology testing, and discloses a transient spectrometer acquisition time measuring device and measuring method, which comprises a signal generator, a series pulse laser, a beam splitter, a nanosecond detector, a measured transient spectrometer and an oscilloscope; the signal generator generates and outputs a standard square wave signal, the standard square wave signal is divided into two paths, one path is input to a I channel of the oscilloscope; the pulse laser outputs pulse laser, which is divided into two beams, one beam of laser is received by the nanosecond detector after being turned by the beam splitter, and an output electric signal is output to a II channel of the oscilloscope; the other path is split and incident to the measured transient spectrometer, and an output electric signal is output to a III channel of the oscilloscope; the time delay of the rising edge starting position of the III channel relative to the rising edge starting position of the II channel is the acquisition time. The present application solves the transient spectrometer acquisition time measurement and the laser trigger delay time measurement, and eliminates the influence of the pulse laser trigger light delay on the acquisition time.

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