Microscopic transient angle-resolved reflectance / transmission spectroscopy measurement system based on streak camera
The microscopic transient angle-resolved reflectance/transmission spectroscopy measurement system based on a streak camera solves the problem of the lack of time resolution in angle-resolved spectroscopy measurement systems, and realizes ultrafast dynamics research on exciton polaritons and surface plasmon polaritons. It can analyze light signals from three dimensions: time, angle and wavelength, and determine the light-matter coupling state of the sample.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING INST OF TECH
- Filing Date
- 2023-02-07
- Publication Date
- 2026-05-26
AI Technical Summary
Existing angle-resolved spectral measurement systems lack time resolution, making it impossible to effectively study the ultrafast dynamics of exciton polaritons and surface plasmon polaritons.
A microscopic transient angle-resolved reflection/transmission spectroscopy measurement system based on a streak camera is adopted. By combining the reflection/transmission excitation optical path, the collection optical path and the microscopic illumination module with the streak camera, the time, angle and wavelength are resolved. The optical signal is resolved by using a grating, so as to realize the acquisition of transient angle-resolved spectra at different times.
It can achieve ultrafast dynamic analysis of diagonally resolved spectroscopy, obtain information on time, angle and wavelength, comprehensively analyze the response state of the sample to excitation light, determine the coupling state of light and matter, and support the testing of transient fluorescence spectroscopy and transient absorption spectroscopy.
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Figure CN116337828B_ABST