Chip testing method, device, system and readable storage medium

Abstract

The application discloses a chip testing method, device, system and readable storage medium, wherein the chip testing method is applied to a sorting control device, the sorting control device comprises a communication module, the communication module is connected between a test station of a testing machine and a sorting communication port of a sorting machine, the communication module is in one-to-one correspondence with the test station, and the method comprises the following steps: in the case that a trigger instruction is received, reading port identification of the sorting communication port from a first storage unit of the sorting communication port connected with the communication module, and reading test station identification of the test station corresponding to the communication module from a second storage unit of the communication module; in the case that the read port identification and test station identification are matched, controlling a first communication port in the communication module to be in communication with the sorting communication port, so that the sorting machine and the testing machine perform chip testing related communication. The probability of chip testing accidents can be reduced.

Description

Technical Field

[0001] This invention relates to the field of integrated circuit testing, and more specifically to a chip testing method, apparatus, system, and readable storage medium. Background Technology

[0002] Before leaving the factory, chips need to be tested to determine if they have defects, malfunctions, or failures. Typically, chip testing is accomplished through the collaboration of a testing machine and a sorting machine. Simply put, the sorting machine provides several test stations for placing the chips under test, along with corresponding communication ports for each test station. The testing machine provides several test stations to test the chips. Each test station connects to a corresponding pair of test stations and communication ports. After testing the chip at its connected test station, the test station returns the test results to the sorting machine through the connected communication port. When the sorting machine provides a large number of test stations and communication ports, wiring between the test stations and the sorting machine often becomes tangled, leading to chip testing failures. Summary of the Invention

[0003] In view of this, embodiments of the present invention provide a chip testing method, a chip testing system, a chip testing apparatus, and a computer-readable storage medium, which can reduce the probability of chip testing accidents.

[0004] This invention provides a chip testing method applied to a sorting control device. The sorting control device includes a communication module connected between a test station of a testing machine and a sorting communication port of a sorting machine, with each communication module corresponding to a test station. The method includes:

[0005] Upon receiving a trigger command, the port identifier of the sorting communication port is read from the first storage unit of the sorting communication port connected to the communication module, and the test station identifier of the test station corresponding to the communication module is read from the second storage unit of the communication module.

[0006] If the port identifier read matches the test station identifier, the first communication port in the communication module is connected to the sorting communication port so that the sorting machine and the test machine can communicate related to chip testing.

[0007] In some embodiments, the sorting control device includes a second communication port connected between the test station and the first communication port;

[0008] After connecting the first communication port in the communication module to the sorting communication port, the method further includes:

[0009] The message of the first protocol received through the first communication port in the communication module is converted into a message of the second protocol sent through the second communication port; or

[0010] The message of the second protocol received through the second communication port is converted into a message of the first protocol sent through the first communication port in the communication module.

[0011] In some embodiments, if the read port identifier does not match the test station identifier, the method further includes:

[0012] The first communication port in the communication module is disconnected from the sorting communication port to interrupt communication between the first communication port and the sorting communication port in the communication module.

[0013] In some embodiments, the communication module includes a test switch, which is connected in series with the first communication port;

[0014] Controlling the connection and disconnection between the first communication port in the communication module and the sorting communication port includes:

[0015] The test switch in the communication module is closed to connect the first communication port in the communication module to the sorting communication port.

[0016] The test switch in the communication module is turned off to disconnect the first communication port in the communication module from the sorting communication port.

[0017] In some embodiments, the sorting control device includes an alarm device;

[0018] If the read port identifier does not match the test station identifier, the method further includes:

[0019] The alarm device is controlled to operate in order to issue an alarm for errors in the sorting communication port connected to the communication module.

[0020] In some embodiments, the sorting control device includes a display device corresponding to each of the communication modules; the method further includes:

[0021] For any communication module, after obtaining the test station identifier from the second storage unit of the communication module, the obtained test station identifier is transmitted to the display device corresponding to the communication module for display.

[0022] In another aspect, the present invention provides a chip testing system for controlling a sorting control device. The sorting control device includes a communication module connected between a test station of the testing machine and a sorting communication port of the sorting machine. Each communication module corresponds one-to-one with a test station. The system includes:

[0023] The identifier reading module is used to read the port identifier of the sorting communication port from the first storage unit of the sorting communication port connected to the communication module, and to read the test station identifier of the test station corresponding to the communication module from the second storage unit of the communication module when a trigger command is received.

[0024] The communication control module is used to control the first communication port in the communication module to connect with the sorting communication port when the read port identifier matches the test station identifier, so that the sorting machine and the test machine can perform chip testing-related communication.

[0025] In some embodiments, the sorting control device includes a second communication port connected between the test station and the first communication port;

[0026] The communication control module is further configured to convert a message of the first protocol received through the first communication port in the communication module into a message of the second protocol sent through the second communication port; or to convert a message of the second protocol received through the second communication port into a message of the first protocol sent through the first communication port in the communication module.

[0027] In some embodiments, the communication control module is further configured to control the first communication port in the communication module to disconnect from the sorting communication port, so as to interrupt the communication between the first communication port in the communication module and the sorting communication port.

[0028] In some embodiments, the communication module includes a test switch connected in series with the first communication port; the communication control module is specifically used to control the test switch in the communication module to close, so that the first communication port in the communication module is connected to the sorting communication port; and to control the test switch in the communication module to open, so that the first communication port in the communication module is disconnected from the sorting communication port.

[0029] In some embodiments, the sorting control device includes an alarm device; if the read port identifier does not match the test station identifier, the communication control module is specifically used to control the alarm device to operate so as to alarm for errors in the sorting communication port connected to the communication module.

[0030] In some embodiments, the sorting control device includes a display device corresponding to each of the communication modules; for any communication module, the identifier reading module is further configured to obtain a test station identifier from the second storage unit of the communication module, and control the display device corresponding to the communication module to display the obtained test station identifier.

[0031] In another aspect, the present invention provides an electronic device comprising a processor and a memory, the memory being used to store a computer program which, when executed by the processor, implements the method described above.

[0032] In another aspect, the present invention provides a computer-readable storage medium for storing a computer program that, when executed by a processor, implements the method described above.

[0033] In some embodiments of this application, for the sorting communication port connected to the communication module, the port identifier of the corresponding sorting communication port and the test station identifier of the test station corresponding to the communication module are obtained. Only when the obtained port identifier and test station identifier match is the first communication port in the communication module connected to the sorting communication port, enabling communication between the sorting machine and the test machine related to chip testing. Thus, the first communication port will only connect to the sorting communication port when the sorting communication port connected to the first communication port is the sorting communication port corresponding to the test station. If the sorting communication port connected to the first communication port is not the sorting communication port corresponding to the test station, the first communication port will not connect to the sorting communication port. This effectively avoids chip testing accidents caused by incorrect wiring between the first communication port and the sorting communication port, thereby reducing the probability of chip detection accidents. Attached Figure Description

[0034] The features and advantages of the invention will be more clearly understood by referring to the accompanying drawings, which are schematic and should not be construed as limiting the invention in any way. In the drawings:

[0035] Figure 1 A schematic diagram of a chip testing apparatus in some technologies is shown;

[0036] Figure 2 It shows Figure 1 A schematic diagram showing a circuit connection error in a chip testing device.

[0037] Figure 3 A schematic diagram of a sorting control device according to an embodiment of this application is shown;

[0038] Figure 4 A schematic diagram of a sorting control device according to an embodiment of this application is shown;

[0039] Figure 5 A schematic diagram of a sorting control device according to an embodiment of this application is shown;

[0040] Figure 6 A schematic diagram of a sorting control device according to an embodiment of this application is shown;

[0041] Figure 7 A schematic flowchart of a chip testing method provided in one embodiment of this application is shown;

[0042] Figure 8 A schematic diagram of the modules of a sorting control system provided in one embodiment of this application is shown;

[0043] Figure 9 A schematic diagram of an electronic device provided in one embodiment of this application is shown. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0045] Please see Figure 1 This is a schematic diagram of a chip testing device 100 in some technologies. Figure 1 In this chip testing apparatus 100, a sorter 11, a tester 12, test cables 13, and sorting signal cables 14 are included. The sorter 11 includes multiple test stations 111 and communication ports 112. Each test station 111 corresponds to one communication port 112. The tester 12 includes multiple test stations 121. Each test station 111 and test station 121 is connected via test cables 13. Each communication port 112 and test station 121 is connected via sorting signal cables 14. Each test station 111 can hold one chip. Figure 1 For example, sorter 11 can hold 4 chips. Each test station 121 can be used to test the chips on the connected test station 111. The test station 111 and communication port 112 connected to the same test station 121 need to correspond. For example, assume that test station 1 corresponds to communication port 1. If test station A is connected to test station 1, then test station A needs to be connected to communication port 1 at the same time.

[0046] The sorting machine 11 may also include a robotic arm. The robotic arm can communicate with the testing station 121 via communication port 112. During chip testing, the robotic arm can automatically place the chip into the testing station 111, and after chip testing is completed, it can automatically remove the chip from the testing station 111. For ease of understanding, the following example illustrates the chip testing process.

[0047] Assuming the robotic arm places a chip at test station 1, it can send a message to test station A via communication port 1 corresponding to test station 1. Upon receiving the message, test station A can send a test signal to the chip at test station 1 to perform chip testing. After the chip test is completed, test station A can generate the chip's test result. This test result can be used to characterize the chip's category (e.g., excellent, good, or defective). Test station A can then feed the test result back to the robotic arm via communication port 1. Since communication port 1 corresponds to test station 1, after receiving the test result, the robotic arm will remove the chip from test station 1 and place it into its appropriate category. For example, if test station A detects that the chip belongs to the excellent category, it will place the chip in the excellent category chip compartment.

[0048] exist Figure 1 In the chip testing apparatus 100 shown, due to the large number of test stations 111, test stations 121, and communication ports 112, wiring errors often occur. (See also...) Figure 2 ,for Figure 1 A schematic diagram of a circuit connection error occurring in the chip testing device 100. Figure 2 In the diagram, assuming correct wiring, communication port 3 should correspond to test station 3, and communication port 4 should correspond to test station 4. Test station C should be connected to both communication port 3 and test station 3, and test station D should be connected to both communication port 4 and test station 4. Taking test station 3 as an example: Normally, after the robotic arm places the chip on test station 3, it should send a message to test station C via communication port 3. Upon receiving the message, test station C should test the chip on test station 3 and send the test results back to the robotic arm via communication port 3, allowing the robotic arm to remove the chip from test station 3.

[0049] However, due to incorrect wiring, test station C is actually connected to communication port 4, and test station D is connected to communication port 3. After the robotic arm places a chip at test station 3, it actually sends a message to test station D through communication port 3. After receiving the message, test station D tests the chip at test station 4 and sends the test results back to the robotic arm through communication port 3. Since the robotic arm receives the test results from communication port 3, it will place the chip at test station 3 into the chip category represented by the test results. It can be seen here that the chip at test station 4 is actually being tested, and the chip category to which the chip at test station 4 belongs is being obtained. However, due to incorrect wiring, the robotic arm may mistakenly remove the chip from test station 3, leading to an accident during chip testing. For example, assuming the chip at test station 4 is a qualified chip, but the chip at test station 3 is a defective chip, the defective chip at test station 3 will be placed into a qualified chip category due to the incorrect wiring, thus causing a chip testing accident.

[0050] Typically, since test station 111 and test station 121 are located on the same plane (e.g., both on the upper surface of their respective equipment), the probability of wiring errors between them is relatively low. However, communication port 112 is located on the side of the sorting machine 11, not on the same plane as test station 121, making wiring errors between them more likely. Therefore, when resolving wiring errors in the chip testing device 100, the focus should be on addressing the wiring errors between communication port 112 and test station 121.

[0051] Therefore, this application provides a chip testing method that can reduce the probability of chip testing accidents. The chip testing method can be applied to a sorting control device. Before describing the chip testing method, the sorting control device will be explained first.

[0052] Please see Figure 3 This is a schematic diagram of a sorting control device 31 provided in one embodiment of this application. Figure 3 In this system, the sorting control device 31 includes a communication module 311, which is connected between the test station 321 of the test machine 32 and the sorting communication port 331 of the sorting machine 33. Each communication module 311 corresponds to a test station 321, and each sorting communication port 331 corresponds to a test station on the sorting machine 33. The communication module 311 includes a first communication port 3113, a second storage unit 3112, and a control module 3111.

[0053] in:

[0054] The first communication port 3113 can be connected one-to-one with the sorting communication port 331. Each test station 321 can communicate with the sorting machine 33 through the first communication port 3113 of its corresponding communication module 311 and the sorting communication port 331 connected to that first communication port 3113. Each test station 321 corresponds one-to-one with a test station on the sorting machine 33. Under normal circumstances, for any test station 321, during chip testing, the test station connected to that test station 321 should correspond to the sorting communication port 331 connected to the first communication port 3113 of its corresponding communication module 311. The specific principle is as follows: Figure 1 Similar descriptions are available here, so they will not be repeated.

[0055] The second storage unit 3112 can be a read-write storage unit, which can be used to store the test station identifier corresponding to the communication module 311.

[0056] The control module 3111 contains program code that, when executed, can perform at least some steps of the chip testing method of this application.

[0057] Furthermore, the sorting control device 31 includes a second communication port 313 connected between the test station 321 and the first communication port 3113, and a protocol conversion module 314 connected between the first communication port 3113 and the second communication port 313.

[0058] Please see Figure 4 This is a schematic diagram of a sorting control device 51 provided in one embodiment of this application. Figure 4 and Figure 3 They are basically similar, with the main difference being that the communication module 511 includes a test switch 5114, which is connected in series with the first communication port 5113, and the control module 5111 is connected to the test switch 5114.

[0059] Please see Figure 5 This is a schematic diagram of a sorting control device 61 provided in one embodiment of this application. Figure 5 and Figure 3 The basic structure is similar, with the main difference being that the sorting control device 61 also includes an alarm device 6115, and the control module 6111 is connected to the alarm device 6115. Specifically, the alarm device 6115 and the communication module 611 are configured in a one-to-one correspondence, and the control module 6111 in each communication module 611 is connected to the corresponding alarm device 6115.

[0060] Please see Figure 6 This is a schematic diagram of a sorting control device 71 provided in one embodiment of this application. Figure 6 and Figure 3 The basic structure is similar, with the main difference being that the sorting machine 73 includes a first display device 733 corresponding to each sorting communication port 731, and the sorting control device 71 includes a second display device 7117 corresponding to each communication module 711. The first display device 733 can be used to display the port identifier of the corresponding sorting communication port 731, and the second display device 7117 can be used to display the test station identifier in the second storage unit 7112 of the corresponding communication module 711.

[0061] Combination Figure 3 Please refer to the sorting control device 31 shown. Figure 7 This is a schematic flowchart of a chip testing method provided in one embodiment of this application. Figure 7 In this context, chip testing methods may include the following steps:

[0062] In step S71, upon receiving a trigger command, the port identifier of the sorting communication port 331 is read from the first storage unit 332 of the sorting communication port 331 connected to the communication module 311, and the test station identifier of the test station 321 corresponding to the communication module 311 is read from the second storage unit 3112 of the communication module 311.

[0063] In this embodiment, during the power-on startup process, the sorting control device 31 sends a trigger command to the control module 3111 in each communication module 311, so that the control module 3111 reads the port identifier of the sorting communication port 331 from the first storage unit 332 connected to it, and reads the test station identifier of the test station 321 from the second storage unit 3112 of the communication module 311.

[0064] In other embodiments, trigger commands can also be sent to the control module 3111 in other ways. For example, the sorting control device 31 may include a trigger button, and when the trigger button is pressed, a trigger command is sent to each control module 3111.

[0065] Different sorting communication ports 331 have different port identifiers, and different test stations 321 have different test station identifiers. Each control module 3111 can read a port identifier and a test station identifier from the connected storage units 3112 and 332, respectively.

[0066] In step S72, if the read port identifier matches the test station identifier, the first communication port 3113 in the control communication module 311 is connected to the sorting communication port 331 so that the sorting machine 33 and the test machine 32 can communicate related to chip testing.

[0067] In this embodiment, the matching of the test station identifier and the port identifier means that the test station 321 represented by the test station identifier corresponds to the sorting communication port 331 represented by the port identifier. When the test station identifier and the port identifier match, it indicates that the sorting communication port 331 connected to the first communication port 3113 is the sorting communication port 331 corresponding to the test station 321. Therefore, the first communication port 3113 and the sorting communication port 331 can be connected, allowing the test station 321 to communicate with the sorting machine 33 through the corresponding first communication port 3113 and the sorting communication port 331 connected to it. When the test station identifier and the port identifier do not match, it indicates that the sorting communication port 331 connected to the first communication port 3113 is not the sorting communication port 331 corresponding to the test station 321. In this case, the communication between the first communication port 3113 and the sorting communication port 331 in the communication module 331 can be interrupted, thereby avoiding chip testing accidents caused by communication between the test station 321 and the sorting machine 33.

[0068] Specifically, the correspondence between test station identifiers and port identifiers can be pre-stored in the second storage unit 3112 of each communication module 311. This correspondence is used to characterize the correspondence between each test station 321 and the sorting communication port 331. After the control module 3111 reads the test station identifier and port identifier from the connected storage units 3112 and 332, it can determine whether the read test station identifier and port identifier match based on the pre-stored correspondence. If they match, it controls the first communication port 3113 and the sorting communication port 331 to connect; otherwise, it controls the first communication port 3113 and the sorting communication port 331 to remain in a communication interruption state.

[0069] In summary, in some embodiments of this application, for the sorting communication port 331 connected to the communication module 311, the port identifier of the corresponding sorting communication port 331 and the test station identifier of the test station 321 corresponding to the communication module 311 are obtained. Only when the obtained port identifier and test station identifier match is the first communication port 3113 in the communication module 311 connected to the sorting communication port 331 connected, so that the sorting machine 33 and the test machine 32 can perform chip testing-related communication. Thus, the first communication port 3113 will only connect to the sorting communication port 331 when the sorting communication port 331 connected to the first communication port 3113 is the sorting communication port 331 corresponding to the test station 321. When the sorting communication port 331 connected to the first communication port 3113 is not the sorting communication port 331 corresponding to the test station 321, the first communication port 3113 will not connect to the sorting communication port 331. This can effectively avoid chip testing accidents caused by wiring errors between the first communication port 3113 and the sorting communication port 331, thereby reducing the probability of chip testing accidents.

[0070] Furthermore, in some embodiments, the connection method between the first communication port 3113 and the sorting communication port 331 may differ from the connection method between the second communication port 313 and the test station 321. The communication protocol will also differ under different connection methods. For example, in this embodiment, the first communication port 3113 and the sorting communication port 331 can be connected via a ribbon cable, while the second communication port 313 and the test station 321 can be connected via a serial communication cable. Clearly, the communication protocol between the first communication port 3113 and the sorting communication port 331 is different from the communication protocol between the second communication port 313 and the test station 321. Therefore, after the first communication port 3113 and the sorting communication port 331 in the control communication module 311 are connected, the method of this application may further include:

[0071] The message of the first protocol received through the first communication port 3113 in the communication module 311 is converted into a message of the second protocol sent through the second communication port 313; or

[0072] The message of the second protocol received through the second communication port 313 is converted into a message of the first protocol sent through the first communication port 3113 in the communication module 311.

[0073] Specifically, this protocol conversion can be performed by the protocol conversion module 314. Through protocol conversion, the connection between the sorting control device 31 and the sorting machine 33 and the testing machine 32 can be made more flexible.

[0074] In combination with the above Figure 4 The sorting control device 500 shown above, in step S72, includes the connection and disconnection of the first communication port 5113 and the sorting communication port 531 in the control communication module 511, including:

[0075] The test switch 5114 in the control communication module 511 is closed so that the first communication port 5113 in the communication module 511 is connected to the sorting communication port 531.

[0076] The test switch 5114 in the control communication module 511 is turned off, so that the first communication port 5113 in the communication module 511 is disconnected from the sorting communication port 531.

[0077] The on / off control logic of the test switch 5114 can be executed by the control module 5111.

[0078] In combination with the above Figure 5 In the case where the sorting control device 61 shown does not read a port identifier that matches the test station identifier, the method of this application further includes:

[0079] The alarm control device 6115 is activated to issue an alarm for errors in the sorting communication port 631 connected to the communication module 611. This allows for timely alerts to staff in case of a connection error between the sorting communication port 631 and the first communication port 6113.

[0080] In combination with the above Figure 6 The sorting control device 71 and the method of this application further include:

[0081] For any communication module 711, after obtaining the test station identifier from the second storage unit 7112 of that communication module 711, the obtained test station identifier is transmitted to the second display device 7117 corresponding to that communication module 711 for display. Simultaneously, on the sorting machine 73 side, the port identifier of the corresponding sorting communication port 731 can also be displayed through the first display device 733. Thus, during the wiring process, the operator can determine the correspondence between the sorting communication port 731 and the first communication port 7113 by observing the displays on the first display device 733 and the second display device 7117, reducing the probability of wiring errors.

[0082] Please see Figure 8 This is a schematic diagram of a sorting control system provided in one embodiment of this application. The system is used to control a sorting control device, which includes a communication module connected between the test station of the testing machine and the sorting communication port of the sorting machine. Each communication module corresponds one-to-one with a test station. The system includes:

[0083] The identifier reading module is used to read the port identifier of the sorting communication port from the first storage unit of the sorting communication port connected to the communication module, and to read the test station identifier of the test station corresponding to the communication module from the second storage unit of the communication module when a trigger command is received.

[0084] The communication control module is used to connect the first communication port in the communication module to the sorting communication port when the read port identifier matches the test station identifier, so that the sorting machine and the test machine can communicate related to chip testing.

[0085] In some embodiments, the sorting control device includes a second communication port connected between the test station and the first communication port;

[0086] The communication control module is also used to convert messages of the first protocol received through the first communication port in the communication module into messages of the second protocol sent through the second communication port; or to convert messages of the second protocol received through the second communication port into messages of the first protocol sent through the first communication port in the communication module.

[0087] In some embodiments, the communication control module is further configured to control the first communication port in the communication module to disconnect from the sorting communication port, thereby interrupting the communication between the first communication port in the communication module and the sorting communication port.

[0088] In some embodiments, the communication module includes a test switch connected in series with a first communication port; the communication control module is specifically used to control the test switch in the communication module to close, so that the first communication port in the communication module is connected to the sorting communication port; and to control the test switch in the communication module to open, so that the first communication port in the communication module is disconnected from the sorting communication port.

[0089] In some embodiments, the sorting control device includes an alarm device; if the read port identifier does not match the test station identifier, the communication control module is specifically used to control the alarm device to operate so as to alarm for errors in the sorting communication port connected to the communication module.

[0090] In some embodiments, the sorting control device includes a display device corresponding to each communication module; for any communication module, the identifier reading module is further configured to obtain a test station identifier from the second storage unit of the communication module, and control the display device corresponding to the communication module to display the obtained test station identifier.

[0091] Please see Figure 9 The diagram below illustrates an electronic device according to an embodiment of this application. The electronic device includes a processor and a memory, the memory storing a computer program that, when executed by the processor, implements the method described above.

[0092] The processor can be a central processing unit (CPU). It can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or combinations thereof.

[0093] Memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs, non-transitory computer-executable programs, and modules, such as the program instructions / modules corresponding to the methods in the embodiments of this invention. The processor executes various functional applications and data processing by running the non-transitory software programs, instructions, and modules stored in the memory, thereby implementing the methods described in the above embodiments.

[0094] The memory may include a program storage area and a data storage area. The program storage area may store the operating system and applications required for at least one function; the data storage area may store data created by the processor, etc. Furthermore, the memory may include high-speed random access memory and non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory may optionally include memory remotely located relative to the processor, which can be connected to the processor via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0095] One embodiment of this application also provides a computer-readable storage medium for storing a computer program that, when executed by a processor, implements the above-described method.

[0096] Although embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention, and such modifications and variations all fall within the scope defined by the appended claims.

Claims

1. A chip testing method, characterized in that, The method is applied to a sorting control device, which includes multiple communication modules and a second communication port. Each communication module includes a first communication port and a second storage unit. The communication module is connected between a test station of a testing machine and a sorting communication port of a sorting machine. The second communication port is connected between the test station and the first communication port. Each communication module corresponds one-to-one with a test station. Upon receiving a trigger command, the port identifier of the sorting communication port is read from the first storage unit of the sorting communication port connected to the communication module, and the test station identifier of the test station corresponding to the communication module is read from the second storage unit of the communication module. If the port identifier read matches the test station identifier, the first communication port in the communication module is connected to the sorting communication port so that the sorting machine and the test machine can communicate related to chip testing. After connecting the first communication port in the communication module to the sorting communication port, the method further includes: The message of the first protocol received through the first communication port in the communication module is converted into a message of the second protocol sent through the second communication port; or The message of the second protocol received through the second communication port is converted into a message of the first protocol sent through the first communication port in the communication module.

2. The method as described in claim 1, characterized in that, If the read port identifier does not match the test station identifier, the method further includes: The first communication port in the communication module is disconnected from the sorting communication port to interrupt communication between the first communication port and the sorting communication port in the communication module.

3. The method as described in claim 2, characterized in that, The communication module includes a test switch, which is connected in series with the first communication port. Controlling the connection and disconnection between the first communication port in the communication module and the sorting communication port includes: The test switch in the communication module is closed to connect the first communication port in the communication module to the sorting communication port. The test switch in the communication module is turned off to disconnect the first communication port in the communication module from the sorting communication port.

4. The method as described in claim 2, characterized in that, The sorting control device includes an alarm device; If the read port identifier does not match the test station identifier, the method further includes: The alarm device is controlled to operate in order to issue an alarm for errors in the sorting communication port connected to the communication module.

5. The method as described in claim 1, characterized in that, The sorting control device includes a display device corresponding to each of the communication modules; the method further includes: For any communication module, after obtaining the test station identifier from the second storage unit of the communication module, the obtained test station identifier is transmitted to the display device corresponding to the communication module for display.

6. A sorting control system, characterized in that, The system is used to control a sorting control device. The sorting control device includes multiple communication modules and a second communication port. Each communication module includes a first communication port and a second storage unit. The communication module is connected between the test station of the testing machine and the sorting communication port of the sorting machine. The second communication port is connected between the test station and the first communication port. Each communication module corresponds one-to-one with a test station. The system includes: The identifier reading module is used to read the port identifier of the sorting communication port from the first storage unit of the sorting communication port connected to the communication module, and to read the test station identifier of the test station corresponding to the communication module from the second storage unit of the communication module when a trigger command is received. The communication control module is used to control the first communication port in the communication module to connect with the sorting communication port when the read port identifier matches the test station identifier, so that the sorting machine and the test machine can perform chip testing-related communication. The communication control module is further configured to convert a message of the first protocol received through the first communication port in the communication module into a message of the second protocol sent through the second communication port; or to convert a message of the second protocol received through the second communication port into a message of the first protocol sent through the first communication port in the communication module.

7. The system as described in claim 6, characterized in that, The communication control module is also used to control the first communication port in the communication module to disconnect from the sorting communication port, so as to interrupt the communication between the first communication port in the communication module and the sorting communication port.

8. The system as described in claim 7, characterized in that, The communication module includes a test switch connected in series with the first communication port; the communication control module is specifically used to control the test switch in the communication module to close, so that the first communication port in the communication module is connected to the sorting communication port; and to control the test switch in the communication module to open, so that the first communication port in the communication module is disconnected from the sorting communication port.

9. The system as described in claim 7, characterized in that, The sorting control device includes an alarm device; if the port identifier read does not match the test station identifier, the communication control module is specifically used to control the alarm device to alarm for errors in the sorting communication port connected to the communication module.

10. The system as described in claim 6, characterized in that, The sorting control device includes a display device corresponding to each of the communication modules; for any communication module, the identifier reading module is further configured to obtain the test station identifier from the second storage unit of the communication module, and control the display device corresponding to the communication module to display the obtained test station identifier.

11. An electronic device, characterized in that, The electronic device includes a processor and a memory, the memory being used to store a computer program that, when executed by the processor, implements the method as described in any one of claims 1 to 5.

12. A computer-readable storage medium, characterized in that, The computer-readable storage medium is used to store a computer program that, when executed by a processor, implements the method as described in any one of claims 1 to 5.

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