Automatic testing method, device, workbench, equipment and medium of hardware device

Abstract

The application discloses an automatic testing method and device of a hardware device, a workbench, equipment and a medium. The method is executed by an automatic workbench, comprising: acquiring multiple test information of each test case through a data processing component, and generating a test case library; reading multiple target test cases in the test case library in sequence through a test component, loading the target test cases into a target hardware device for testing, and acquiring test results of each target test case; generating a problem detection number matched with each target test case through an evaluation component; matching the problem detection number of each target test case with a problem identification number in a problem database through an identification component, and marking a test problem of the currently matched target test case in the test case library when the matching is successful. The above technical scheme can automatically deploy each test case in the automatic workbench, automatically mark the test problem, and improve the automatic testing efficiency.

Description

Technical Field

[0001] This invention relates to the field of testing technology, and in particular to an automatic testing method, apparatus, workbench, equipment and medium for hardware devices. Background Technology

[0002] Hardware-in-the-loop testing is a technique used for the development and testing of complex device controllers. Control Desk and Automation Desk are commonly used workbenches for hardware device testing.

[0003] Currently, hardware testing can be categorized into manual testing using a control console and automated testing using an automation console. Manual testing requires manually triggering various functions on the control console to execute test cases, which is time-consuming and labor-intensive, and has low accuracy. Automated testing requires deploying test cases and evaluation modules line by line in an automation console. While it achieves automation, it also reduces testing efficiency to some extent. Summary of the Invention

[0004] This invention provides an automated testing method, apparatus, workbench, device, and medium for hardware devices, which can automatically deploy test cases and mark test problems in an automated workbench, thereby improving the efficiency of automated testing.

[0005] According to one aspect of the present invention, an automated testing method for a hardware device is provided, executed by an automated workbench, comprising:

[0006] The data processing component acquires multiple test information for each test case and generates a test case library.

[0007] The testing component reads multiple target test cases sequentially from the test case library according to the test steps of each test case in the test case library, loads the target test cases into the target hardware device for testing, and obtains the test results of each target test case.

[0008] By evaluating the component, the test results of multiple target test cases are obtained in the test component, and the number of problem detections matching each target test case is generated based on the signal test results of each signal of the hardware device in the test results.

[0009] By identifying components, the number of issues detected in each target test case is matched with the number of issue identifiers in the issue database. When a match is successful, the test issue of the currently matched target test case is marked in the test case library.

[0010] Optionally, the test information includes the test steps, observed signals, acquired signals, and expected test results.

[0011] Optionally, by evaluating the component, test results for multiple target test cases can be obtained in the test component, including:

[0012] By evaluating the components, the test results of each target test case are obtained in the test components based on the observed and acquired signals of each target test case.

[0013] Optionally, after obtaining the test results of multiple target test cases in the test component through the evaluation component, the following steps are also included:

[0014] By evaluating the components, the result value of the target test case is obtained based on the test results of the target test case and the expected test results that match the target test case.

[0015] By evaluating the components, the target test cases are marked with results in the test case library based on the result values ​​of the target test cases.

[0016] Optionally, based on the signal test results of each signal of the hardware device in the test results, generate the number of problem detections matching each target test case, including:

[0017] By evaluating the components, the Boolean values ​​of each signal are obtained based on the signal test results of each signal of the hardware device in the target test case and the expected test results that match the target test case.

[0018] The evaluation component combines the Boolean values ​​of each signal into a binary string, converts the binary string to decimal, and generates the number of problem detections that match the target test cases.

[0019] Optional, automated testing methods for hardware devices also include:

[0020] The data processing component aggregates multiple historical test issues from the target hardware device.

[0021] Each historical test question is analyzed to generate a unique number of question identifiers that match each historical test question, and each historical test question is marked using the number of question identifiers.

[0022] According to another aspect of the present invention, an automated testing apparatus for hardware devices is provided, which is performed by an automated workbench, comprising:

[0023] The test case library generation module is used to obtain multiple test information for each test case through the data processing component and generate a test case library.

[0024] The test result acquisition module is used to read multiple target test cases sequentially from the test case library according to the test steps of each test case in the test case library through the test component, load the target test cases into the target hardware device for testing, and obtain the test results of each target test case;

[0025] The issue detection number generation module is used to obtain the test results of multiple target test cases in the test component through the evaluation component, and generate the issue detection number that matches each target test case based on the signal test results of each signal of the hardware device in the test results;

[0026] The test issue labeling module is used to match the number of issues detected in each target test case with the number of issue identifiers in the issue database through an identification component, and when a match is successful, it labels the test issue of the currently matched target test case in the test case library.

[0027] According to another aspect of the present invention, an automated workbench is provided, including a data processing component, a testing component, an evaluation component, and an identification component, for executing the automated testing method for hardware devices described in any embodiment of the present invention;

[0028] Each of the testing, evaluation, and identification components has a document processing unit. The document processing unit is used to parse the test case library and write the information generated by each component back to the test case library.

[0029] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0030] At least one processor; and

[0031] A memory communicatively connected to the at least one processor; wherein,

[0032] The memory stores a computer program that can be executed by the at least one processor, which enables the at least one processor to perform an automated testing method for the hardware device according to any embodiment of the present invention.

[0033] According to another aspect of the present invention, a computer-readable storage medium is provided, the computer-readable storage medium storing computer instructions for causing a processor to execute and implement the automated testing method for the hardware device according to any embodiment of the present invention.

[0034] The technical solution of this invention, by automating the testing of multiple test cases in the test case library, generating a number of problem detections matching each test case based on the test results, and marking test problems in the test case library using the number of problem detections, can automatically deploy each test case and automatically mark test problems in the automated workbench. This solves the problem that in existing automated workbench, technicians need to manually deploy test cases and evaluation modules, thus improving the efficiency of automated testing.

[0035] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0036] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0037] Figure 1 This is a flowchart of an automated testing method for a hardware device according to Embodiment 1 of the present invention;

[0038] Figure 2 This is a flowchart of another automated testing method for a hardware device provided according to Embodiment 2 of the present invention;

[0039] Figure 3 This is a schematic diagram of the structure of an automated testing device for hardware equipment according to Embodiment 3 of the present invention;

[0040] Figure 4 This is a schematic diagram of the structure of an automated workbench provided in Embodiment 4 of the present invention;

[0041] Figure 5 This is a schematic diagram of the structure of an electronic device that implements the automated testing method for hardware devices according to embodiments of the present invention. Detailed Implementation

[0042] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0043] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0044] Example 1

[0045] Figure 1 This is a flowchart of an automated testing method for a hardware device provided in Embodiment 1 of the present invention. This embodiment is applicable to situations where problematic test cases are marked after automated testing of hardware device test cases. This method can be executed by an automated testing device for the hardware device, which can be implemented in hardware and / or software. This automated testing device can be configured in a processor with data processing capabilities within an automated workbench. Figure 1 As shown, the method includes:

[0046] S110. Through the data processing component, obtain multiple test information for each test case and generate a test case library.

[0047] The test information may include test steps, observed signals, acquired signals, and expected test results.

[0048] Optionally, the testing component can test the test cases step by step according to the testing steps. Under the influence of observed and acquired signals, the evaluation component can obtain the test information of each test case from the testing component. That is, when a test case is configured with an observed signal, the evaluation component can observe the test results of the test case based on that observed signal; when a test case is configured with an acquired signal, the evaluation component can obtain the test results of the test case based on the acquired signal. The expected test result can be understood as the possible test result that might occur if each test case is successfully tested. Since hardware devices generally include multiple components, an optional form of test result can be the specific values ​​of the measured signals of each component.

[0049] S120. Using the testing component, according to the test steps of each test case in the test case library, read multiple target test cases sequentially from the test case library, load the target test cases into the target hardware device for testing, and obtain the test results of each target test case.

[0050] The advantage of this setup is that by automatically reading each test case from the test case library through the test component, the problem of manually deploying each test case one by one in the existing automated workbench can be solved, thus improving testing efficiency.

[0051] Optionally, target test cases can be understood as test cases in the test case library that currently need to be tested, as determined by the test component.

[0052] Optionally, after obtaining the test results of each target test case, the test case can be judged as successful based on the expected test results in the test case library and the actual test results, and the success or failure result can be marked in the test case library.

[0053] S130. By evaluating the component, the test results of multiple target test cases are obtained in the test component, and the number of problem detections matching each target test case is generated based on the signal test results of each signal of the hardware device in the test results.

[0054] It is understandable that the test results of hardware devices may include the signal values ​​of their various components. For example, for an electronic controller, which may have multiple buttons, the test results of the electronic controller may include the signal values ​​fed back by each button.

[0055] Optionally, the signal test result can be a Boolean value, i.e., 0 or 1. The Boolean values ​​of each signal from the hardware device can be used to form a binary number. After converting the binary number to decimal, the number of problem detections matching the test case can be obtained. However, this invention only provides one optional method for obtaining the number of problem detections; other methods can also be used, as long as it ensures that a unique number of problem detections matching the test result can be obtained.

[0056] S140. By identifying the component, the number of issues detected in each target test case is matched with the number of issue identifiers in the issue database, and when a match is successful, the test issue of the currently matched target test case is marked in the test case library.

[0057] Optionally, the issue database can store multiple test issues matching the target hardware device, and each test issue has a unique issue identifier. When the number of issues detected in the target test case matches the number of issue identifiers in the issue database, the issues existing in the target test case can be directly obtained from the issue database. This avoids technical personnel from analyzing repetitive types of issues multiple times, effectively saving manpower and time costs, and ensuring the efficiency of test issue analysis.

[0058] The technical solution of this invention, by automating the testing of multiple test cases in the test case library, generating a number of problem detections matching each test case based on the test results, and marking test problems in the test case library using the number of problem detections, can automatically deploy each test case and automatically mark test problems in the automated workbench. This solves the problem that in existing automated workbench, technicians need to manually deploy test cases and evaluation modules, thus improving the efficiency of automated testing.

[0059] Example 2

[0060] Figure 2 This is a flowchart of an automated testing method for a hardware device provided in Embodiment 2 of the present invention. Based on the above embodiments, this embodiment specifically illustrates the method for obtaining the number of problem detections. Figure 2 As shown, the method includes:

[0061] S210. Through the data processing component, obtain multiple test information for each test case and generate a test case library.

[0062] S220. Using the testing component, according to the test steps of each test case in the test case library, read multiple target test cases sequentially from the test case library, load the target test cases into the target hardware device for testing, and obtain the test results of each target test case.

[0063] S230. By evaluating the component, based on the observed and acquired signals of each target test case in the test component, the test results of each target test case are obtained in the test component.

[0064] Optionally, after obtaining the test results of multiple target test cases in the test component through the evaluation component, it may also include:

[0065] By evaluating the components, the result value of the target test case is obtained based on the test results of the target test case and the expected test results that match the target test case.

[0066] By evaluating the components, the target test cases are marked with results in the test case library based on the result values ​​of the target test cases.

[0067] Optionally, the result value of the target test case can be understood as the final result value of the test case. For example, for an electronic handle, the final result value can represent whether each of its components has been tested successfully or failed. It can be represented by Boolean values, i.e., 1 for test success and 0 for test failure. Furthermore, the target test case can be marked in the test case library, with success marked as pass and failure marked as fail.

[0068] S240. By evaluating the components, based on the signal test results of each signal of the hardware device in the target test case and the expected test results that match the target test case, obtain the Boolean value of each signal.

[0069] S250. Through the evaluation component, the Boolean values ​​of each signal are combined into a binary number string, and the binary number string is converted to decimal to generate the number of problem detections that match the target test case.

[0070] Optionally, the order of the binary number strings can be set according to the generation process of the number of problem identifiers in the problem database, so that the number of problem detections and the number of problem identifiers can match for the target problem.

[0071] S260. By identifying the component, the number of issues detected in each target test case is matched with the number of issue identifiers in the issue database, and when a match is successful, the test issue of the currently matched target test case is marked in the test case library.

[0072] Optionally, automated testing methods for hardware devices may also include:

[0073] The data processing component aggregates multiple historical test issues from the target hardware device.

[0074] Each historical test question is analyzed to generate a unique number of question identifiers that match each historical test question, and each historical test question is marked using the number of question identifiers.

[0075] Optionally, one possible method for parsing historical test questions is to obtain the Boolean values ​​of each signal of the target hardware device when each historical question was generated, generate a binary number string based on the Boolean values ​​of the signals, convert the binary number string into a decimal number, and generate a question identifier number.

[0076] It should be noted that the process of parsing historical test issues and generating issue identifiers should be the same as the process of generating issue detection numbers during the testing process.

[0077] The technical solution of this invention, by automating the testing of multiple test cases in the test case library, generating a number of problem detections matching each test case based on the test results, and marking test problems in the test case library using the number of problem detections, can automatically deploy each test case and automatically mark test problems in the automated workbench. This solves the problem that in existing automated workbench, technicians need to manually deploy test cases and evaluation modules, thus improving the efficiency of automated testing.

[0078] Example 3

[0079] Figure 3 This is a schematic diagram of an automated testing device for a hardware device provided in Embodiment 3 of the present invention. Figure 3 As shown, the device includes: a test case library generation module 310, a test result acquisition module 320, a problem detection number generation module 330, and a test problem marking module 340.

[0080] The test case library generation module 310 is used to obtain multiple test information for each test case through the data processing component and generate a test case library.

[0081] The test result acquisition module 320 is used to read multiple target test cases sequentially from the test case library according to the test steps of each test case in the test case library through the test component, load the target test cases into the target hardware device for testing, and obtain the test results of each target test case.

[0082] The issue detection number generation module 330 is used to obtain the test results of multiple target test cases in the test component through the evaluation component, and generate the issue detection number that matches each target test case based on the signal test results of each signal of the hardware device in the test results.

[0083] The test issue marking module 340 is used to match the number of issues detected in each target test case with the number of issue identifiers in the issue database through the identification component, and when a match is successful, mark the test issue of the currently matched target test case in the test case library.

[0084] The technical solution of this invention, by automating the testing of multiple test cases in the test case library, generating a number of problem detections matching each test case based on the test results, and marking test problems in the test case library using the number of problem detections, can automatically deploy each test case and automatically mark test problems in the automated workbench. This solves the problem that in existing automated workbench, technicians need to manually deploy test cases and evaluation modules, thus improving the efficiency of automated testing.

[0085] Based on the above embodiments, the test information includes test steps, observed signals, acquired signals, and expected test results.

[0086] Based on the above embodiments, the problem detection number generation module 330 can be specifically used for:

[0087] By evaluating the components, the test results of each target test case are obtained in the test components based on the observed and acquired signals of each target test case.

[0088] Based on the above embodiments, a result marking module may also be included, which, after obtaining the test results of multiple target test cases in the test component, can be specifically used for:

[0089] By evaluating the components, the result value of the target test case is obtained based on the test results of the target test case and the expected test results that match the target test case.

[0090] By evaluating the components, the target test cases are marked with results in the test case library based on the result values ​​of the target test cases.

[0091] Based on the above embodiments, the problem detection number generation module 330 can also be specifically used for:

[0092] By evaluating the components, the Boolean values ​​of each signal are obtained based on the signal test results of each signal of the hardware device in the target test case and the expected test results that match the target test case.

[0093] The evaluation component combines the Boolean values ​​of each signal into a binary string, converts the binary string to decimal, and generates the number of problem detections that match the target test cases.

[0094] Based on the above embodiments, a historical test problem marking module may also be included, specifically used for:

[0095] The data processing component aggregates multiple historical test issues from the target hardware device.

[0096] Each historical test question is analyzed to generate a unique number of question identifiers that match each historical test question, and each historical test question is marked using the number of question identifiers.

[0097] The automated testing device for hardware devices provided in the embodiments of the present invention can execute the automated testing method for hardware devices provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of executing the method.

[0098] Example 4

[0099] Figure 4This is a schematic diagram of the structure of an automated workbench provided in Embodiment 4 of the present invention. Figure 4 As shown, the automated workbench includes a data processing component 410, a testing component 420, an evaluation component 430, and an identification component 440.

[0100] The data processing component 410 is used to obtain multiple test information for each test case and generate a test case library.

[0101] Test component 420 is used to read multiple target test cases sequentially from the test case library according to the test steps of each test case in the test case library, load the target test cases into the target hardware device for testing, and obtain the test results of each target test case.

[0102] Evaluation component 430 is used to obtain the test results of multiple target test cases in the test component, and generate the number of problem detections that match each target test case based on the signal test results of each signal of the hardware device in the test results.

[0103] The identification component 440 is used to match the number of issues detected in each target test case with the number of issue identifiers in the issue database, and when a match is successful, to mark the test issue of the currently matched target test case in the test case library.

[0104] Each of the test component 420, evaluation component 430, and identification component 440 is equipped with a document processing unit. The document processing unit is used to parse the test case library and write the information generated by each component back to the test case library.

[0105] Understandably, the document processing unit can be used to enable the test component 420, evaluation component 430, and identification component 440 to interact with the test case library in order to solve the problem in the prior art that test cases and evaluation components cannot be automatically deployed.

[0106] The technical solution of this invention, by setting up a data processing component, a testing component, an evaluation component, and an identification component in an automated workbench, and by setting up a document processing unit in the testing component, the evaluation component, and the identification component, can automatically deploy each test case and automatically mark test problems in the automated workbench. This solves the problem that in existing automated workbenches, technicians need to manually deploy test cases and evaluation modules, thereby improving the efficiency of automated testing.

[0107] Example 5

[0108] Figure 5A schematic diagram of an electronic device 10 that can be used to implement embodiments of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0109] like Figure 5 As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded from storage unit 18 into the RAM 13. The RAM 13 can also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0110] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0111] Processor 11 can be various general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, central processing unit (CPU), graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, digital signal processors (DSPs), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as the automated testing method for hardware devices as described in the embodiments of the present invention. That is:

[0112] The data processing component acquires multiple test information for each test case and generates a test case library.

[0113] The testing component reads multiple target test cases sequentially from the test case library according to the test steps of each test case in the test case library, loads the target test cases into the target hardware device for testing, and obtains the test results of each target test case.

[0114] By evaluating the component, the test results of multiple target test cases are obtained in the test component, and the number of problem detections matching each target test case is generated based on the signal test results of each signal of the hardware device in the test results.

[0115] By identifying components, the number of issues detected in each target test case is matched with the number of issue identifiers in the issue database. When a match is successful, the test issue of the currently matched target test case is marked in the test case library.

[0116] In some embodiments, the automated testing method for the hardware device may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the automated testing method for the hardware device described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the automated testing method for the hardware device by any other suitable means (e.g., by means of firmware).

[0117] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0118] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0119] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0120] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0121] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0122] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0123] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0124] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. An automated testing method for hardware devices, executed by an automated workbench, characterized in that, include: The data processing component acquires multiple test information for each test case and generates a test case library. The testing component reads multiple target test cases sequentially from the test case library according to the test steps of each test case in the test case library, loads the target test cases into the target hardware device for testing, and obtains the test results of each target test case. By evaluating the component, the test results of multiple target test cases are obtained in the test component, and the number of problem detections matching each target test case is generated based on the signal test results of each signal of the hardware device in the test results. By identifying components, the number of issues detected in each target test case is matched with the number of issue identifiers in the issue database, and when a match is successful, the test issue of the currently matched target test case is marked in the test case library; Specifically, based on the signal test results of each signal of the hardware device in the test results, a number of problem detections matching each target test case are generated, including: By evaluating the components, the Boolean values ​​of each signal are obtained based on the signal test results of each signal of the hardware device in the target test case and the expected test results that match the target test case. The evaluation component combines the Boolean values ​​of each signal into a binary string, converts the binary string to decimal, and generates the number of problem detections that match the target test cases.

2. The method according to claim 1, characterized in that, The test information includes the test steps, observed signals, acquired signals, and expected test results.

3. The method according to claim 2, characterized in that, By evaluating the component, test results for multiple target test cases are obtained within the test component, including: By evaluating the components, the test results of each target test case are obtained in the test components based on the observed and acquired signals of each target test case.

4. The method according to claim 2, characterized in that, After obtaining test results for multiple target test cases in the test component through the evaluation component, the process also includes: By evaluating the components, the result value of the target test case is obtained based on the test results of the target test case and the expected test results that match the target test case. By evaluating the components, the target test cases are marked with results in the test case library based on the result values ​​of the target test cases.

5. The method according to claim 1, characterized in that, Also includes: The data processing component aggregates multiple historical test issues from the target hardware device. Each historical test question is analyzed to generate a unique number of question identifiers that match each historical test question, and each historical test question is marked using the number of question identifiers.

6. An automated testing device for hardware equipment, performed by an automated workbench, characterized in that, include: The test case library generation module is used to obtain multiple test information for each test case through the data processing component and generate a test case library. The test result acquisition module is used to read multiple target test cases sequentially from the test case library according to the test steps of each test case in the test case library through the test component, load the target test cases into the target hardware device for testing, and obtain the test results of each target test case; The issue detection number generation module is used to obtain the test results of multiple target test cases in the test component through the evaluation component, and generate the issue detection number that matches each target test case based on the signal test results of each signal of the hardware device in the test results; The test issue labeling module is used to match the number of issues detected in each target test case with the number of issue identifiers in the issue database by identifying components, and when a match is successful, to mark the test issue of the currently matched target test case in the test case library; The problem detection count generation module is specifically used for: By evaluating the components, the Boolean values ​​of each signal are obtained based on the signal test results of each signal of the hardware device in the target test case and the expected test results that match the target test case. The evaluation component combines the Boolean values ​​of each signal into a binary string, converts the binary string to decimal, and generates the number of problem detections that match the target test cases.

7. An automated workbench, characterized in that, It includes a data processing component, a testing component, an evaluation component, and an identification component, for performing an automatic testing method for the hardware device according to any one of claims 1-5; Each of the testing, evaluation, and identification components has a document processing unit. The document processing unit is used to parse the test case library and write the information generated by each component back to the test case library.

8. An electronic device, characterized in that, The electronic device includes: At least one processor; and A memory communicatively connected to the at least one processor; wherein, The memory stores a computer program that can be executed by the at least one processor, the computer program being executed by the at least one processor to enable the at least one processor to perform an automatic testing method for the hardware device according to any one of claims 1-5 of the present invention.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that, when executed by a processor, implement the automatic testing method for the hardware device according to any one of claims 1-5.

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