Spectrum test analysis, spectrum test wave generation method and related systems, apparatuses

Abstract

The application discloses a spectrum test analysis, a spectrum test wave generation method and related systems and devices. The method comprises the following steps: if the required scanning frequency range is within the working frequency range of a waveform generator, determining the waveform type and parameters according to the spectrum scanning parameters of a device under test; obtaining the transmission signal generated by the waveform generator according to the waveform type and parameters, and collecting the output signal of the transmission signal after passing through the device under test, and obtaining the spectrum test result according to the transmission signal and the output signal; if the required scanning frequency range is not within the working frequency range, determining the frequency conversion parameters, the waveform type and parameters of each waveform generator according to the spectrum scanning parameters; obtaining the output signal of the transmission signal after passing through the device under test, which is obtained by mixing the transmission sub-signal generated by at least two waveform generators according to the waveform type and the waveform parameters and the local oscillator signal generated according to the frequency conversion parameters, and obtaining the spectrum test result according to the transmission signal and the output signal. The spectrum test analysis can be realized quickly and at multiple frequency points.

Description

Technical Field

[0001] This invention relates to the field of spectrum analysis technology, and in particular to a spectrum test analysis, spectrum test wave generation method, and related systems and devices. Background Technology

[0002] Currently, commonly used spectrum testing and analysis methods generally employ single-frequency point scanning. Taking a vector network analyzer as an example, this method transmits a single-frequency sine wave signal to the device under test (DUT), gradually changing the frequency of the transmitted signal. By testing the received signal information, the spectrum test results for the entire frequency domain of interest are obtained. This result includes frequency, intensity, phase, and even time delay. The principle is explained in [link to documentation]. Figure 1 As shown, the horizontal axis represents frequency, and the vertical axis represents the input-to-output frequency response. S21 in the figure represents the logarithmic value of the input / output ratio, i.e., the circuit gain. The frequency response characteristic curve of the DUT's channel is obtained by measuring the amplitude and phase differences between the input and output terminals at various frequency points. The overall frequency response of the DUT and the system under test is obtained by changing the frequency of the transmitted signal point by point. Summary of the Invention

[0003] The inventors of this application have discovered that the existing single-frequency scanning spectrum testing and analysis method has the advantage of a relatively high signal-to-noise ratio. However, this method can only scan one frequency point at a time, which cannot meet the requirements of multi-frequency scanning in real-time parallel systems. Moreover, its frequency scanning speed is slow and the scanning time is long, which cannot meet the requirements of rapid testing in real-time parallel systems.

[0004] In view of the above problems, the present invention is proposed to provide a spectrum test analysis, spectrum test wave generation method and related system and apparatus that overcome or at least partially solve the above problems.

[0005] This invention provides a spectrum testing and analysis method, comprising:

[0006] If the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator, the waveform type and waveform parameters are determined according to the spectrum scanning parameters of the device under test and provided to the waveform generator; the transmitted signal generated by the waveform generator according to the waveform type and waveform parameters is acquired, and the output signal after the transmitted signal passes through the device under test is collected; the spectrum test results are obtained based on the transmitted signal and the output signal.

[0007] If the required scanning frequency range of the device under test is not within the operating frequency range of the waveform generator, the frequency conversion parameters, waveform type and waveform parameters of each waveform generator are determined according to the spectrum scanning parameters and provided to at least two waveform generators; the output signal of the transmitted signal obtained by mixing the transmitted sub-signal generated by at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters is obtained after passing through the device under test, and the spectrum test result is obtained based on the transmitted signal and the output signal.

[0008] In some optional embodiments, the above method further includes:

[0009] Based on the frequency range included in the spectrum scanning parameters of the device under test, determine whether the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator.

[0010] In some optional embodiments, the acquisition of the transmitted signal generated by the waveform generator according to the waveform type and waveform parameters, and the acquisition of the output signal after the transmitted signal passes through the device under test, and the obtaining of the spectrum test result based on the transmitted signal and the output signal, includes:

[0011] The arbitrary waveform generator generates a transmission signal based on the waveform type and waveform parameters and provides it to the device under test.

[0012] The system acquires the output signal of the transmitted signal after it passes through the device under test, and performs analog-to-digital conversion on the output signal.

[0013] The frequency response characteristics of the device under test are obtained based on the spectral characteristics of the output signal after analog-to-digital conversion and the spectral characteristics of the transmitted signal.

[0014] In some optional embodiments, if the waveform type is a sine wave, an arbitrary waveform generator is used to generate the transmitted signal according to the frequency, amplitude, and phase of the sine wave;

[0015] If the waveform type is a square wave, an arbitrary waveform generator is used to generate the transmission signal according to the frequency, amplitude and duty cycle of the square wave.

[0016] In some optional embodiments, the arbitrary waveform generator generates a transmit signal based on the waveform type and waveform parameters, including:

[0017] An arbitrary waveform generator generates square waves of different frequencies and specified duty cycles as transmitted signals; or

[0018] An arbitrary waveform generator generates at least two square waves with different frequencies and duty cycles. The transmitted signal is obtained by superimposing the at least two square waves.

[0019] In some optional embodiments, the output signal of the transmitted signal obtained by mixing the transmitted sub-signals generated by at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters, is passed through the device under test. The spectrum test results are obtained based on the transmitted signal and the output signal, including:

[0020] Each arbitrary waveform generator generates a transmit sub-signal based on a waveform type and waveform parameters;

[0021] At least two transmitting sub-signals are superimposed to obtain a superimposed signal. The superimposed signal is then up-converted based on the local oscillator signal generated according to the frequency conversion parameters to obtain a transmitting signal that is provided to the device under test. Alternatively, at least two transmitting sub-signals are up-converted according to the frequency conversion parameters to obtain frequency-converted transmitting sub-signals. The at least two frequency-converted transmitting sub-signals are then summed to obtain a transmitting signal that is provided to the device under test.

[0022] The output signal of the transmitted signal after passing through the device under test is acquired, and the output signal is down-converted according to the frequency conversion parameters to obtain the frequency-converted output signal. The frequency-converted output signal is then converted from analog to digital.

[0023] The frequency response characteristics of the device under test are obtained by analyzing the spectral characteristics of the output signal after analog-to-digital conversion and the spectral characteristics of the transmitted signal.

[0024] In some optional embodiments, the above method further includes:

[0025] Based on the noise simulation parameters, a noise simulation signal is generated and added to the transmitted signal or the mixed-frequency transmitted signal.

[0026] This invention also provides a method for generating a spectrum test wave, comprising:

[0027] If the frequency range required by the device under test is within the operating frequency range of the waveform generator, the waveform type and waveform parameters are determined according to the spectrum scanning parameters of the device under test and provided to the waveform generator so that the waveform generator can generate a transmission signal for the device under test based on the waveform type and waveform parameters.

[0028] If the frequency range required by the device under test is not within the operating frequency range of the waveform generator, the frequency conversion parameters, waveform type and waveform parameters of each waveform generator are determined according to the spectrum scanning parameters and provided to at least two waveform generators; so that at least two waveform generators generate a transmission sub-signal according to the waveform type and waveform parameters respectively, and the at least two transmission sub-signals are mixed with the local oscillator signal generated according to the frequency conversion parameters to obtain the transmission signal provided to the device under test.

[0029] This invention also provides a spectrum testing and analysis device, comprising:

[0030] The judgment module is used to determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator;

[0031] The first test analysis module is used to determine the waveform type and waveform parameters based on the spectrum scanning parameters of the device under test if the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator, and provide them to the waveform generator; acquire the transmitted signal generated by the waveform generator according to the waveform type and waveform parameters, and collect the output signal after the transmitted signal passes through the device under test, and obtain the spectrum test results based on the transmitted signal and the output signal;

[0032] The second test analysis module is used to determine the frequency conversion parameters and the waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters if the required scanning frequency range of the device under test is not within the operating frequency range of the waveform generator; to obtain the output signal of the transmitted signal obtained by mixing the transmitted sub-signal generated by the at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters after passing through the device under test; and to obtain the spectrum test result based on the transmitted signal and the output signal.

[0033] This invention also provides a spectrum test wave generation device, comprising:

[0034] The judgment module is used to determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator;

[0035] The first control module is used to determine the waveform type and waveform parameters according to the spectrum scanning parameters of the device under test if the frequency range required by the device under test is within the operating frequency range of the waveform generator, and provide them to the waveform generator so that the waveform generator can generate a transmission signal for the device under test according to the waveform type and waveform parameters.

[0036] The second control module is used to determine the frequency conversion parameters, waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters if the frequency range required by the device under test is not within the operating frequency range of the waveform generator, and provide them to at least two waveform generators; so that at least two waveform generators generate transmission sub-signals according to the waveform type and waveform parameters respectively, and mix the at least two transmission sub-signals with the local oscillator signal generated according to the frequency conversion parameters to obtain the transmission signal provided to the device under test.

[0037] This invention also provides a spectrum testing and analysis system, including: a first waveform generation unit and / or a second waveform generation unit, and an FPGA.

[0038] An FPGA is provided, wherein the aforementioned spectrum test and analysis device is configured, the first test and analysis module is used to control the operation of the first waveform generation unit, and the second test and analysis module is used to control the operation of the second waveform generation unit.

[0039] The first waveform generation unit includes a waveform generator, which generates a transmission signal with corresponding frequency and waveform based on FPGA instructions and provides it to the device under test.

[0040] The second waveform generation unit includes at least two waveform generators, a mixer, and a frequency converter. The waveform generators are used to generate transmit sub-signals with corresponding frequencies and waveforms based on FPGA instructions. The frequency converters are used to generate a local oscillator signal according to the frequency conversion parameters to perform up-conversion processing on the transmit sub-signals. The mixers are used to mix the transmit sub-signals generated by the at least two waveform generators with the local oscillator signal to obtain a transmit signal for the device under test, and to perform down-conversion processing on the output signal output by the device under test.

[0041] In some optional embodiments, the system further includes:

[0042] An analog-to-digital converter (ADC) is placed between the FPGA and the device under test (DUT) to perform analog-to-digital conversion on the output signal from the DUT.

[0043] This invention also provides a computer storage medium storing computer-executable instructions, which, when executed by a processor, implement the above-described spectrum test analysis method and / or the above-described spectrum test wave generation method.

[0044] This invention also provides a programmable logic device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements the above-described spectrum test analysis method and / or the above-described spectrum test wave generation method.

[0045] The beneficial effects of the above-described technical solutions provided in the embodiments of the present invention include at least the following:

[0046] Based on the frequency range required by the device under test (DUT), it is determined whether to use a waveform generator to directly generate the required transmit signal and provide it to the DUT, and then acquire the output signal of the DUT, or to mix the signals generated by at least two waveform generators to obtain the required transmit signal and provide it to the DUT, and then acquire the output signal of the DUT. This allows for rapid generation of transmit signals and acquisition of the DUT's output signals for comparison and analysis at multiple frequency points, meeting the needs of multi-frequency spectrum analysis testing of the DUT, especially the spectrum testing requirements of instantaneous real-time systems for rapid scanning and multi-frequency scanning. It enables spectrum testing and analysis of the DUT at different frequency points, and real-time and rapid acquisition of analysis results, improving the scanning speed of spectrum testing and analysis and reducing scanning time.

[0047] In the spectrum testing method provided in this embodiment, the required transmission signal is directly generated by a waveform generator or the required transmission signal is obtained by mixing the signals generated by at least two waveform generators, depending on the frequency range required by the device under test. This can meet the spectrum testing requirements of the device under test, especially for instantaneous real-time systems, for rapid scanning and multi-frequency scanning. The spectrum test analysis of the device under test is performed at different frequency points, and the analysis results are obtained in real time and quickly, thereby improving the scanning speed of spectrum test analysis and reducing the scanning time.

[0048] Other features and advantages of the invention will be set forth in the description which follows, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures particularly pointed out in the written description, claims, and drawings.

[0049] The technical solution of the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. Attached Figure Description

[0050] The accompanying drawings are provided to further illustrate the invention and form part of the specification. They are used in conjunction with embodiments of the invention to explain the invention and do not constitute a limitation thereof. In the drawings:

[0051] Figure 1 This is an example diagram of the spectrum test response in this invention;

[0052] Figure 2 This is a flowchart of the spectrum test wave generation method in Embodiment 1 of the present invention;

[0053] Figure 3 This is a schematic diagram of the spectrum test wave generation device in an embodiment of the present invention;

[0054] Figure 4 This is a flowchart of the spectrum testing and analysis method in Embodiment 2 of the present invention;

[0055] Figure 5 This is a schematic diagram of the spectrum testing and analysis device in Embodiment 2 of the present invention;

[0056] Figure 6 This is a schematic diagram of the spectrum analysis and testing system in Embodiment 3 of the present invention;

[0057] Figure 7 This is a schematic diagram of a specific architecture of the spectrum analysis and testing system in Embodiment 3 of the present invention;

[0058] Figure 8 This is a schematic diagram of another specific architecture of the spectrum analysis and testing system in Embodiment 3 of the present invention;

[0059] Figure 9a This is an example of the time-domain waveform corresponding to the 50MHz square wave in Embodiment 3 of the present invention;

[0060] Figure 9b This is an example of the frequency domain waveform corresponding to the 50MHz square wave in Embodiment 3 of the present invention;

[0061] Figure 10a This is an example of the time-domain waveform corresponding to the 50MHz square wave with D=5% in Embodiment 3 of the present invention;

[0062] Figure 10b This is an example of the frequency domain waveform corresponding to the 50MHz square wave with D=5% in Embodiment 3 of the present invention;

[0063] Figure 11a This is an example diagram of the time-domain waveform after combining the 10MHz and 20MHz waveforms in Embodiment 3 of the present invention;

[0064] Figure 11b This is an example diagram of the frequency domain waveform after combining the 10MHz and 20MHz waveforms in Embodiment 3 of the present invention;

[0065] Figure 12a This is an example diagram of the Q-channel time-domain waveform after mixing a 500MHz signal with a 5GHz local oscillator in Embodiment 3 of the present invention;

[0066] Figure 12b This is an example diagram of the I-channel time-domain waveform after mixing a 500MHz signal with a 5GHz local oscillator in Embodiment 3 of the present invention;

[0067] Figure 12c This is an example diagram of the time-domain waveform after combining the Q-path and I-path in Embodiment 3 of the present invention;

[0068] Figure 12d This is an example diagram of the frequency domain waveform after combining the Q-path and I-path in Embodiment 3 of the present invention;

[0069] Figure 13aThis is an example diagram of the Q-channel time-domain waveform after mixing 300MHz & 500MHz signals with a 5GHz local oscillator in Embodiment 3 of the present invention;

[0070] Figure 13b This is an example diagram of the I-channel time-domain waveform after mixing 300MHz & 500MHz signals with a 5GHz local oscillator in Embodiment 3 of the present invention;

[0071] Figure 13c This is an example diagram of the time-domain waveform after combining the Q-path and I-path in Embodiment 3 of the present invention;

[0072] Figure 13d This is an example diagram of the frequency domain waveform after combining the Q-path and I-path in Embodiment 3 of the present invention;

[0073] Figure 14a This is an example diagram of the time-domain waveform of the synthesized amplitude noise in Embodiment 3 of the present invention;

[0074] Figure 14b This is an example diagram of the frequency domain waveform of the synthesized amplitude noise in Embodiment 3 of the present invention;

[0075] Figure 14c This is an example diagram of the time-domain waveform of the synthesized phase noise in Embodiment 3 of the present invention;

[0076] Figure 14d This is an example diagram of the frequency domain waveform of the synthesized phase noise in Embodiment 3 of the present invention. Detailed Implementation

[0077] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0078] Existing technologies generally employ single-frequency point scanning spectrum testing methods, which have the following main drawbacks:

[0079] 1) The frequency scanning speed is slow. The time required for frequency scanning and the scanning rate are directly related to the width of the frequency range being scanned, making it difficult to meet the testing requirements of instantaneous real-time systems.

[0080] 2) Only one single frequency point can be scanned at a time. When focusing on multiple frequency points, it is difficult to obtain test results for multiple frequency points at once.

[0081] In current instantaneous real-time parallel systems, the situation regarding spectrum testing has changed significantly, with real-time and rapid testing becoming a crucial requirement and consideration. In emerging quantum computing, real-time and rapid detection of qubits is essential and necessary because qubits have very short lifetimes, and testing needs to be completed within that lifetime. For example, the frequency response of the DUT needs to be measured within microseconds (e.g., 5 µs), as changes in the DUT's state will alter the corresponding frequency response. Existing single-frequency scanning methods are insufficient in this situation due to their relatively long scan times, failing to acquire information quickly enough. Furthermore, traditional single-frequency testing methods are even less effective when multiple frequency points are needed in a short time. Therefore, as system complexity increases, real-time requirements rise, and the number of DUTs (e.g., qubits) increases, reducing the testing time and improving testing efficiency for qubit systems becomes a significant research topic.

[0082] Furthermore, existing spectrum testing methods cannot simulate real-world conditions using swept-frequency signal sources. For example, they cannot simulate the behavior under noise interference or the behavior of complex, nonlinear sensitive systems. In other words, they lack corresponding noise simulation capabilities for the noise sensitivity and noise tolerance of the DUT. Therefore, the test analysis results will have certain errors compared to the actual situation, resulting in low test accuracy.

[0083] To address the problems existing in the prior art and the need for rapid testing of instantaneous real-time systems, such as obtaining frequency response results within microseconds and acquiring test information for multiple frequency points simultaneously, this invention provides a spectrum testing and analysis method that specifically solves at least one of the following problems:

[0084] 1) For quantum measurement and control applications such as qubits, achieve fast (e.g., 5µs) multi-frequency scanning to meet the needs of instantaneous real-time system spectrum analysis and scanning.

[0085] 2) Provides a flexible spectrum testing solution with a wide frequency range (KHz to GHz) but very high frequency testing accuracy (sub-Hz).

[0086] 3) Consider noise simulation and noise tolerance testing to ensure that the signal source can simulate the actual situation.

[0087] 4) Obtain test results for multiple frequency points at once, reducing the number of spectrum scans and test iterations, and improving test efficiency in a targeted manner.

[0088] Example 1

[0089] Embodiment 1 of the present invention provides a method for generating spectrum test waves, the process of which is as follows: Figure 2 As shown, it includes the following steps:

[0090] Step S100: Begin.

[0091] Step S101: Determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator. If yes, proceed to step S102; if no, proceed to step S104.

[0092] This step confirms the required scanning frequency range for the device under test (DUT), verifying whether the required scanning frequency falls within the operating frequency range of the AWG (Average Waveform Generator). Specifically, based on the frequency range included in the DUT's spectral scanning parameters, it determines whether the required scanning frequency range is within the operating frequency range of the waveform generator. The waveform generator can be an arbitrary waveform generator (AWG), and there are two different cases depending on the DUT's operating frequency relative to the AWG's operating frequency range.

[0093] If the frequency range required by the device under test is within the operating frequency range of the waveform generator, this is the first case. In this case, the AWG can meet the scanning requirements of the device under test, so the AWG can be used directly to generate a transmission signal to provide to the device under test.

[0094] If the frequency range required by the device under test is not within the operating frequency range of the waveform generator, it is the second case. In this case, one AWG cannot meet the scanning requirements of the device under test. Therefore, two or more AWGs can be used to generate signals and combine them. The combined signal is then provided to the device under test to meet its scanning requirements.

[0095] Step S102: If the frequency range required by the device under test is within the operating frequency range of the waveform generator, determine the waveform type and waveform parameters according to the spectrum scanning parameters of the device under test and provide them to the waveform generator.

[0096] The first scenario typically corresponds to a low scanning frequency range for the device under test (DUT). Since an AWG can generate waves of various frequencies and waveforms, it is only necessary to select and enable the waveform type and configure the corresponding waveform parameters. In other words, after obtaining the frequency scanning range and required waveform of the DUT based on its spectrum scanning parameters, the waveform type and waveform parameters can be provided to the AWG.

[0097] Step S103: The waveform generator generates a transmission signal to be provided to the device under test based on the waveform type and waveform parameters.

[0098] Step S104: If the frequency range required by the device under test is not within the operating frequency range of the waveform generator, determine the frequency conversion parameters, waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters and provide them to at least two waveform generators;

[0099] The second scenario typically corresponds to a high scanning frequency range for the device under test (DUT). Since an AWG (Automatic Waveform Generator) can generate waves of various frequencies and waveforms, mixing waves from two or more AWGs can create even more frequencies and waveforms. Therefore, after determining the frequency scanning range and required waveform of the DUT based on its spectral scanning parameters, the waveform type and parameters of each waveform generator, as well as the frequency conversion parameters of the inverter, can be determined. This scenario requires selecting appropriate inverter parameters (i.e., the inverter's local oscillator parameters) and AWGs, and then selecting waveforms and setting the parameters for each AWG.

[0100] Step S105: At least two waveform generators generate transmit sub-signals according to the waveform type and waveform parameters respectively, and mix the at least two transmit sub-signals with the local oscillator signal generated according to the frequency conversion parameters to obtain the transmit signal provided to the device under test.

[0101] Each AWG can generate a transmitter sub-signal. The transmitter sub-signal is mixed with the local oscillator signal generated according to the frequency conversion parameters to achieve up-conversion processing of the transmitter sub-signal. The mixed signal can be used as the transmitter signal to provide the device under test.

[0102] Based on the same inventive concept, this embodiment also provides a spectrum test wave generation device, the structure of which is described in [reference needed]. Figure 3 As shown, it includes:

[0103] The judgment module 11 is used to determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator.

[0104] The first control module 12 is used to determine the waveform type and waveform parameters according to the spectrum scanning parameters of the device under test if the frequency range required by the device under test is within the operating frequency range of the waveform generator, and provide them to the waveform generator so that the waveform generator can generate a transmission signal for the device under test according to the waveform type and waveform parameters.

[0105] The second control module 13 is used to determine the frequency conversion parameters, waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters if the frequency range required by the device under test is not within the operating frequency range of the waveform generator, and provide them to at least two waveform generators; so that at least two waveform generators generate transmission sub-signals according to the waveform type and waveform parameters respectively, and mix the at least two transmission sub-signals with the local oscillator signal generated according to the frequency conversion parameters to obtain the transmission signal provided to the device under test.

[0106] The aforementioned spectrum test wave generation device can be installed in a field-programmable gate array (FPGA) or in other devices with similar functions.

[0107] In the method and apparatus described in this embodiment, the required transmission signal is determined based on the frequency range required by the device under test (DUT). The method determines whether to directly generate the required transmission signal using an arbitrary waveform generator or to mix the signals generated by at least two arbitrary waveform generators to obtain the required transmission signal. This satisfies the spectrum testing requirements of the DUT, especially for instantaneous real-time systems, for rapid scanning and multi-frequency scanning. The DUT is subjected to spectrum testing and analysis at different frequency points, and the analysis results are obtained quickly and in real time, improving the scanning speed of spectrum testing and analysis and reducing scanning time.

[0108] Example 2

[0109] Embodiment 2 of the present invention provides a spectrum testing and analysis method, the process of which is as follows: Figure 4 As shown, it includes the following steps:

[0110] Step S200: Begin.

[0111] Step S201: Determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator. If yes, proceed to step S202; if no, proceed to step S204.

[0112] Step S202: If the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator, determine the waveform type and waveform parameters according to the spectrum scanning parameters of the device under test and provide them to the waveform generator.

[0113] Step S203: Obtain the transmitted signal generated by the waveform generator according to the waveform type and waveform parameters, and collect the output signal after the transmitted signal passes through the device under test. Obtain the spectrum test results based on the transmitted signal and the output signal.

[0114] An arbitrary waveform generator generates a transmission signal based on a determined waveform type and waveform parameters and provides it to the device under test (DUT). The output signal of the transmission signal after passing through the DUT is acquired, and the output signal is converted from analog to digital. The frequency response characteristics of the DUT are obtained based on the spectral characteristics of the output signal after analog-to-digital conversion and the spectral characteristics of the transmission signal.

[0115] Waveforms can be sine waves, square waves, etc., and different waveforms can be generated based on different waveform parameters. For example, if the waveform type is a sine wave, an arbitrary waveform generator can be used to generate the transmitted signal based on the frequency, amplitude, and phase of the sine wave; if the waveform type is a square wave, an arbitrary waveform generator can be used to generate the transmitted signal based on the frequency, amplitude, and duty cycle of the square wave.

[0116] Optionally, when the arbitrary waveform generator generates a transmission signal according to the waveform type and waveform parameters, it may include generating square waves with different frequencies and specified duty cycles as transmission signals; or it may include generating at least two square waves with different frequencies and different duty cycles, and superimposing the at least two square waves to obtain the transmission signal.

[0117] Step S204: If the required scanning frequency range of the device under test is not within the operating frequency range of the waveform generator, determine the frequency conversion parameters, waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters and provide them to at least two waveform generators.

[0118] Step S205: Obtain the output signal of the transmitted signal obtained by mixing the transmitted sub-signals generated by at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters and passing it through the device under test. Obtain the spectrum test result based on the transmitted signal and the output signal.

[0119] Each arbitrary waveform generator generates a transmit sub-signal based on a waveform type and waveform parameters;

[0120] At least two transmitting sub-signals are superimposed to obtain a superimposed signal. The superimposed signal is then up-converted based on the local oscillator signal generated according to the frequency conversion parameters to obtain a transmitting signal that is provided to the device under test. Alternatively, at least two transmitting sub-signals are up-converted separately according to the frequency conversion parameters to obtain frequency-converted transmitting sub-signals. The at least two frequency-converted transmitting sub-signals are then added together to obtain a transmitting signal that is provided to the device under test. During the mixing process, the two transmitting sub-signals can be superimposed first and then mixed with the local oscillator signal. Alternatively, each transmitting sub-signal can be mixed with the local oscillator signal first, and then the mixed transmitting sub-signals can be superimposed.

[0121] The output signal of the transmitted signal after passing through the device under test is acquired, and the output signal is down-converted according to the frequency conversion parameters to obtain the frequency-converted output signal. The frequency-converted output signal is then converted from analog to digital.

[0122] The frequency response characteristics of the device under test are obtained by analyzing the spectral characteristics of the output signal after analog-to-digital conversion and the spectral characteristics of the transmitted signal.

[0123] In some optional embodiments, the methods provided in Embodiments 1 and 2 above further include: generating a noise simulation signal based on noise simulation parameters, and adding the noise simulation signal to the transmitted signal or the mixed-frequency transmitted signal. This enables better simulation of the real transmitted signal and improves the accuracy of spectrum testing and analysis.

[0124] Based on the unified inventive concept, embodiments of the present invention also provide a spectrum testing and analysis device, the structure of which is as follows: Figure 5As shown, it includes:

[0125] The judgment module 21 is used to determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator.

[0126] The first test analysis module 22 is used to determine the waveform type and waveform parameters according to the spectrum scanning parameters of the device under test if the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator, and provide them to the waveform generator; acquire the transmitted signal generated by the waveform generator according to the waveform type and waveform parameters, and acquire the output signal after the transmitted signal passes through the device under test, and obtain the spectrum test result based on the transmitted signal and the output signal;

[0127] The second test analysis module 23 is used to determine the frequency conversion parameters and the waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters if the required scanning frequency range of the device under test is not within the operating frequency range of the waveform generator; to obtain the output signal of the transmitted signal obtained by mixing the transmitted sub-signal generated by the at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters after passing through the device under test; and to obtain the spectrum test result based on the transmitted signal and the output signal.

[0128] The aforementioned spectrum testing and analysis device can be installed in a Field Programmable Gate Array (FPGA) or in other devices with similar functions.

[0129] In this embodiment, the relationship between the required scanning frequency and the AWG frequency is first confirmed in the application scenario. If the scanning frequency is within the AWG's operating frequency range, a direct spectrum scanning system architecture can be used. Figure 7 The system architecture shown illustrates a scenario where multiple frequency points need to be scanned. The smallest frequency point is used as the fundamental frequency, and a sine wave, square wave, or pseudo-arbitrary wave is selected based on application requirements. After selecting the waveform type, waveform parameters are configured. Waveforms are transmitted and acquired, obtaining three types of data: transmitted waveform data, acquired data with and without the DUT (Distributed Under Test). By comparing these three types of data, the spectrum scanning results and characteristics of the DUT can be calculated and analyzed. If the sweep frequency exceeds the operating frequency range of the AWG (Automatic Gauge), then... Figure 8 The system architecture shown requires the use of two AWGs and adjustment of the local oscillator frequency. Frequency sweeping of the DUT is achieved through up-conversion and down-conversion.

[0130] In this embodiment, based on the frequency range required by the device under test (DUT), it is determined whether to directly generate the required transmit signal using an arbitrary waveform generator and provide it to the DUT, and then acquire the output signal of the DUT, or to mix the signals generated by at least two arbitrary waveform generators to obtain the required transmit signal and provide it to the DUT, and then acquire the output signal of the DUT after frequency conversion. This allows for rapid generation of transmit signals and acquisition of the output signals of the DUT for multiple frequency points, enabling comparative analysis and meeting the needs of multi-frequency spectrum analysis testing of the DUT, especially the spectrum testing requirements of instantaneous real-time systems for rapid scanning and multi-frequency scanning. Spectrum testing and analysis of the DUT are performed at different frequency points, and the analysis results are acquired quickly in real time, improving the scanning speed of spectrum testing and analysis and reducing scanning time.

[0131] Example 3

[0132] In instantaneous real-time systems, obtaining information from multiple frequency points in a single test is crucial for rapidly assessing frequency response. Unlike traditional network analyzers, the spectrum testing method provided in this invention utilizes an arbitrary waveform generator, a high signal-to-noise ratio (AWG) signal generator, and a low-noise ADC digitizer, digitally controlled by an FPGA, serving as both the signal source and data acquisition unit. For the specific architecture of the spectrum analysis and testing system, please refer to [link / reference needed]. Figure 6 As shown, it includes a first waveform generation unit 32 and / or a second waveform generation unit 33, and an FPGA 31.

[0133] A spectrum test and analysis device is set in FPGA31. The first test and analysis module is used to control the first waveform generation unit 32 to work, and the second test and analysis module is used to control the second waveform generation unit 33 to work.

[0134] First waveform generating unit 32 and / or second waveform generating unit 33, wherein:

[0135] The first waveform generation unit 32 includes a waveform generator, which is used to generate a transmission signal with corresponding frequency and waveform based on FPGA instructions and provide it to the device under test.

[0136] The second waveform generation unit 33 includes at least two waveform generators, a mixer, and a frequency converter. The waveform generators are used to generate transmit sub-signals with corresponding frequencies and waveforms based on FPGA instructions. The frequency converters are used to generate a local oscillator signal according to the frequency conversion parameters to perform up-conversion processing on the transmit sub-signals. The mixers are used to mix the transmit sub-signals generated by the at least two waveform generators with the local oscillator signal to obtain a transmit signal for the device under test, and to perform down-conversion processing on the output signal output by the device under test.

[0137] Optionally, the system may further include an analog-to-digital converter, positioned between the FPGA and the device under test, for performing analog-to-digital conversion on the output signal from the device under test.

[0138] For a specific architecture of the spectrum testing and analysis system, see [link to relevant documentation]. Figure 7 As shown, this system is designed for an architecture including the aforementioned first waveform generation unit 32. The system includes an FPGA, an AWG1 (i.e., the first waveform generation unit) connected to the FPGA, a DUT connected to the AWG1, an analog-to-digital converter (ADC) connected to the DUT, and the ADC connected to the FPGA. Under the control of the FPGA, the AWG1 can generate waves of the required frequency and waveform. The following description uses the generation of a square wave with an adjustable duty cycle D as an example. After being output by the device under test and converted from analog to digital, the FPGA performs spectrum analysis.

[0139] For another specific architecture of the spectrum testing and analysis system, see [link to relevant documentation]. Figure 8 As shown, this system is designed for an architecture including the aforementioned second waveform generation unit 33. The system includes an FPGA, AWG1, AWG2, and a frequency converter LO connected to the FPGA, a mixer connected to AWG1, AWG2, and the frequency converter LO (together forming the second waveform generation unit), a DUT connected to the mixer, and a mixer connected to the DUT and the frequency converter LO. This mixer converts the signal output from the DUT and outputs it to the ADC, which is then connected to the FPGA. Under the control of the FPGA, AWG1 and AWG2 can generate waves of the required frequency and waveform. These waves are mixed with the local oscillator signal generated by the frequency converter and then supplied to the device under test (DUT). After being output by the DUT and undergoing frequency conversion and analog-to-digital conversion, the FPGA performs spectrum analysis.

[0140] The above system architecture has the functions of rapid multi-frequency testing and noise simulation.

[0141] The specific implementation process of the above-mentioned spectrum testing and analysis method is described in detail below.

[0142] See Figure 7 and Figure 8 As shown, there are two usage scenarios based on the required scanning frequency of the device under test (i.e., the operating frequency of the device under test) relative to the operating frequency range of the AWG.

[0143] The first case uses Figure 7The system shown allows for the direct generation of a transmitted signal via the AWG when the required scanning frequency of the device under test (DUT) is relatively low and falls within the operating frequency range of the AWG. After passing through the DUT and then through an ADC, the output signal is acquired by the FPGA. By comparing the frequency characteristics of the transmitted and output signals, the frequency response of the DUT can be obtained. Alternatively, a square wave with an adjustable duty cycle (D) can be generated. After passing through the DUT, the output signal is acquired, and spectral analysis is performed on the input square wave and the output signal to determine the amplitude and phase changes of the output signal relative to the input transmitted signal.

[0144] The second scenario uses Figure 8 The system shown, when the required scanning frequency of the device under test (DUT) is relatively high, for example exceeding the operating frequency range of the AWG (Automatic Waveform Generator), corresponds to the second scenario. An IQ mixer (in-phase / quad-phase mixer) and a high-frequency oscillator (i.e., frequency converter) are used to frequency-shift the transmitted signal. At least two arbitrary waveform generators (AWGs) are used as signal sources to generate a transmitted sub-signal. The high-frequency oscillator generates an up-converted local oscillator signal. The IQ mixer mixes the transmitted sub-signal with the local oscillator signal to output an RF signal, which passes through the DUT. After being down-converted by the high-frequency oscillator, the output signal data is acquired using an FPGA. See also... Figure 8 As shown, the AWG emits a suitable waveform, performs mixing processing, and generates up-converted transmit signals for multiple frequencies of interest. After passing through the DUT, the signals are down-converted, and the FPGA acquires the down-converted signals to obtain the required acquisition structure. This allows for the simultaneous determination of the characteristics of multiple frequencies of interest.

[0145] The first scenario is described in detail below. In this case, the AWG can scan the signal response at pure frequency using a sine wave, just like a traditional frequency scanning device. Alternatively, the AWG can emit a transmit signal of any desired waveform. Specifically, an adjustable duty cycle square wave is used to perform an FFT transform on the transmitted signal, yielding initial spectral information. After passing through the device under test (DUT), the output signal can be acquired. This acquired output signal is then sampled by an ADC, and an FFT transform is performed on the acquired data to obtain the spectral characteristics of the output signal. This spectral characteristic carries the frequency response of the DUT. Therefore, the difference between the output signal and the transmitted signal is the frequency response of the DUT. The advantage of this approach is its intuitiveness and convenience, allowing for very fast frequency response testing. Unlike ordinary frequency scanning, this method, due to the presence of an arbitrary waveform generator, allows for fine-tuning of the transmitted waveform as needed.

[0146] In the first case, without a mixer for frequency conversion and in the case of direct drive, mathematical analysis is performed on a square wave signal with a variable duty cycle. For a square wave with an adjustable duty cycle, its function is described as shown in Equation 1:

[0147] (1)

[0148] The square wave waveform has a single-sided amplitude of A and a period of (). The frequency is f, the duty cycle is duty, and the duty range is 0~1.

[0149] Normalization process: Let A=1, x= The Fourier expansion of y(t) is obtained as follows:

[0150] (2)

[0151] The solution yields: (3-1)

[0152] (3-2)

[0153] (3-3)

[0154] When D is a constant, using trigonometric transformations, the second term in equation (2) can be written as:

[0155] = (4)

[0156] We can let tan( ) = / Then the above equation (2) can be written as:

[0157] (5)

[0158] In the above formulas, It is the magnitude of the nth harmonic. That is the corresponding phase angle.

[0159] When D is 0.5, for n to be even (2k), = When the value is 0, its modulus becomes 0; when n=2k-1, odd harmonics are preserved; at this time, the spectral decomposition of a square wave with duty cycle D=0.5 is as follows:

[0160] (6)

[0161] When D is not equal to 0.5, an and bn are not zero, and the corresponding modulus is not zero; both odd and even harmonic components will exist.

[0162] When the duty cycle D approaches zero, for a square wave with an amplitude of + / -A, D tending towards 1 and tending towards 0 are dual, so we only need to consider one of the cases, because... As you can see, As the coefficients approach zero (where both D and n are relatively small), we can obtain an approximate solution using the knowledge of limits. :

[0163] (7)

[0164] At this point, D tends towards a periodic square wave of 0, and towards a periodic delta function. The modulus of this harmonic component is... The phase angle φn is 45 degrees.

[0165] The simulation was performed in simulation software, such as Matlab, with D=0.5, a sampling frequency of 1GHz, a signal frequency of 50MHz, an amplitude of A=16383, and a length of 5µs, forming a square wave. The time-domain waveform corresponding to this 50MHz square wave can be found in [reference needed]. Figure 9a As shown, the horizontal axis represents signal time, and the vertical axis represents signal amplitude. The frequency domain waveform corresponding to this 50MHz square wave can be found in [reference needed]. Figure 9b The image shows a discrete square wave waveform with a 50MHz duty cycle. The horizontal axis represents frequency, and the vertical axis represents spectral amplitude. Because the AWG (Average Weight) and sampling frequency are limited in practical systems, at a sampling rate of 1GHz, the shortest time for one sample is 1ns.

[0166] For a 50MHz square wave (period 20ns), when D is reduced to a minimum of 0.05 (i.e., 5%), the corresponding time-domain and frequency waveforms are shown below. Figure 10a and 10b As shown. The time-domain waveform (5µs) corresponding to the 50MHz square wave with D=5% is shown in [reference]. Figure 10a As shown, the horizontal axis represents signal time, and the vertical axis represents signal amplitude. The frequency domain waveform (100MHz) corresponding to this 50MHz square wave with D=5% can be found here. Figure 10bThe image shows a 50MHz discrete square wave waveform with a 50% duty cycle. The horizontal axis represents frequency, and the vertical axis represents spectral amplitude. It can be seen that at 5%, the frequency components are relatively rich, including DC components, ranging from the fundamental frequency of 50MHz to the 9th harmonic at 450MHz. Frequency components exceeding 500MHz (0.5 * sampling frequency) need to be filtered out due to aliasing. This waveform, as the transmitted signal, is acquired by high-speed acquisition after passing through the DUT. By comparing the changes in frequency, amplitude, and phase between the transmitted signal and the output signal, and after normalization, the discrete S-curve corresponding to the DUT can be obtained.

[0167] Furthermore, to quickly obtain more frequency components and perform analysis, the frequency response can be obtained by superimposing square waves with multiple different fundamental frequencies using an AWG. For example, adding 10MHz and 20MHz square waves with a 50% duty cycle can be used as an example; the results can be found in [reference needed]. Figure 11a and 11b As shown, the time-domain composite waveform after combining a 10MHz waveform and a 20MHz waveform of equal amplitude is shown in the figure. Figure 11a The image shows a composite time-domain waveform with a 50% duty cycle. The horizontal axis represents signal time, and the vertical axis represents signal amplitude. For the frequency-domain waveform resulting from combining a 10MHz waveform with a 20MHz waveform of equal amplitude, please refer to [link to relevant documentation]. Figure 11b As shown, this is a composite frequency domain waveform with a 50% duty cycle. The horizontal axis represents frequency, and the vertical axis represents spectral amplitude. This allows for greater variation and flexibility to meet application requirements.

[0168] When it is necessary to eliminate the DC component, the AWG performs DC offset compensation on the DC part of the output waveform through mathematical calculations and formulas, which can eliminate the DC component a0, thereby removing or reducing the DC component in the spectrum conversion.

[0169] Therefore, during instantaneous real-time frequency scanning, for example, if it is necessary to know the response of a certain frequency and its integer harmonics, a square wave with an adjustable duty cycle of that frequency waveform can be emitted. This allows a large amount of spectrum-related data to be obtained at once.

[0170] The second scenario is described in detail below. For the second scenario of up-conversion and down-conversion, a high-frequency oscillator can be used to shift the frequency band to a higher frequency. This can be used for S-parameter scanning of a point frequency. In the example, a 5GHz local oscillator is used, and the frequency of the AWG-generated transmit sub-signal is 0.5GHz. Through IQ pure frequency modulation, an ideal high-frequency signal can be obtained for spectrum scanning of the device under test. After down-conversion, the high-frequency part of the output signal of the device under test is filtered out, and the low-frequency part is acquired. Then, by comparing the spectral amplitude and phase of the preceding transmit signal and the following output signal, the frequency response of a single point of the system can be obtained. When the local oscillator is 5GHz and the AWG signal frequency is 500MHz, the simulation results are shown in [reference needed]. Figure 12a , Figure 12b , Figure 12c and Figure 12d The diagram illustrates single-frequency IQ modulation at high frequencies, followed by analysis after mixing. Figure 12a The waveform in the Q-channel time domain after mixing (the 500MHz transmit signal is mixed and modulated using a 5GHz local oscillator), with the horizontal axis representing signal time and the vertical axis representing signal amplitude. Figure 12b The I-channel time-domain waveform after mixing (the 500MHz transmit signal is modulated using a 5GHz local oscillator), with the horizontal axis representing signal time and the vertical axis representing signal amplitude. Figure 12c The waveform of the IQ combiner is shown, with the horizontal axis representing signal time and the vertical axis representing signal amplitude. Figure 12d The mixing frequency corresponding to the IQ combined waveform is used to generate a single frequency point of 4.5GHz.

[0171] When multiple frequency points need to be tested simultaneously, a formula for IQ mixing modulation to detect information at multiple frequency points is proposed. For example, if the local oscillator frequency is flo, and it is necessary to test the system frequency response at two frequency points (e.g., flo-f1, flo-f2), the output formula for generating arbitrary waveforms using two AWGs is:

[0172] ; (8)

[0173] The corresponding time-varying waveform functions for the I and Q paths can be the superposition of multiple waveforms of different frequencies. Taking a waveform containing two frequencies as an example:

[0174] ; (9-a)

[0175] (9-b)

[0176] By mixing and adding the signal with the local oscillator signal, we can obtain:

[0177]

[0178] (10)

[0179] Typically, 1 and Setting 2 to 0 simplifies the formula; multi-frequency design can be performed based on formula (10), see simulation results. Figure 13a , Figure 13b , Figure 13c , Figure 13d The image shows IQ modulation at multiple frequency points at high frequencies, and the resulting spectrum after mixing. It also shows the ideal IQ mixing configuration at two frequency points. Figure 13a The waveform in the Q-channel time domain after mixing of the composite signal (two transmitter sub-signals with equal amplitudes of 300MHz and 500MHz are mixed and modulated using a 5GHz local oscillator), with the horizontal axis representing signal time and the vertical axis representing signal amplitude. Figure 13b The I-channel time-domain waveform after mixing and frequency conversion (two transmitter sub-signals with equal amplitude of 300MHz and 500MHz are mixed and modulated using a 5GHz local oscillator), with the horizontal axis representing signal time and the vertical axis representing signal amplitude. Figure 13c for Figure 13a The Q-path shown and Figure 13b The waveform shown is the result of I-Q combining of the I-channel. The horizontal axis represents the signal time, and the vertical axis represents the signal amplitude. Figure 13d The mixing frequencies corresponding to the IQ combined waveform are used to generate dual frequency points of 4.5GHz and 4.7GHz. If more frequency points need to be tested at once, the corresponding frequencies can be added to the AWG transmission components of the I and Q paths.

[0180] In real-world environments, various types of noise are inevitable. How can we simulate noise and its impact on a system? For noise simulation testing needs, this embodiment of the invention uses an AWG (Amplitude and Phase Noise Gauge) for convenient amplitude and phase noise simulation. Simulation and testing are performed by adding noise terms to arbitrary waveforms. For sine waves, noise can be categorized into amplitude noise and phase noise, or it can be external crosstalk noise. For example, in the second case, corresponding amplitude or phase noise can be added to the I and Q paths. When 10% crosstalk amplitude noise is added, the simulation results... Figure 14a and Figure 14b As shown, Figure 14a The synthesized time-domain waveform for amplitude noise (maximum limit of 10%) Figure 14b The corresponding spectrum is given; π / 2 of random phase noise is added, and the simulation results are as follows. Figure 14c and Figure 14d As shown, Figure 14c The synthesized time-domain waveform with phase noise (maximum limit of pi / 2) Figure 14bThe corresponding spectrum is shown. For 10% amplitude random noise and π / 2 random phase jitter, it can be seen that the waveform variation caused by phase noise is closer to the actual non-ideal waveform.

[0181] At the same time, because the AWG arbitrary waveform generator is used, the actual signal can be modeled, and the system response can be evaluated by using the simulated signal with added noise, so as to obtain the system's sensitivity and tolerance to various added noises.

[0182] use Figure 7 and Figure 8 The system architecture enables spectrum testing and analysis. Furthermore, as needed, inverse Fourier transform can be performed to obtain the required time-domain waveform, which can then be output via AWG to obtain the characteristics of the required frequency points.

[0183] This invention also provides a computer storage medium storing computer-executable instructions, which, when executed by a processor, implement the above-described spectrum test analysis method and / or the above-described spectrum test wave generation method.

[0184] This invention also provides a programmable logic device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements the above-described spectrum test analysis method and / or the above-described spectrum test wave generation method.

[0185] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated in detail in the apparatus section.

[0186] The methods, systems, and apparatus described in this invention embodiment: 1) Utilize a high-speed, flexible AWG and high-speed ADC architecture to achieve microsecond-level rapid multi-frequency spectrum scanning. 2) At lower frequencies, rapid frequency scanning is achieved using a square wave with adjustable duty cycle D, or even a combination of square waves. In the reference example, a square wave with a 5% duty cycle is used to generate signals at multiple frequencies. Simultaneously, by adding a DC compensation term, the DC component of the spectrum can be removed. 3) At high frequencies, through IQ modulation, the frequency scanning device of this architecture can test the performance of specific or multiple frequency points by combining signals from a single wavelet or multiple wavelets. 4) By adding a noise sub-term to the emission term using arbitrary AWG waveforms, noise modeling and noise simulation testing can be performed, yielding relevant performance characteristics such as the system's noise tolerance.

[0187] Through the above design and operation, a rich spectrum of frequency response data can be obtained with just one or a few tests, enabling rapid acquisition of the frequency response characteristics of the DUT channel. A single AWG can be used to scan the spectrum within the AWG operating frequency; two or more AWGs are needed to scan the frequency beyond the AWG operating frequency. This scheme is compatible with positive selection wave, square wave, and arbitrary wave scanning, fully utilizing the inherent characteristics of arbitrary waveform generators. Noise simulation of the tested channel can be performed, such as evaluating amplitude noise and phase noise, making the spectrum test more closely resemble real-world conditions.

[0188] Unless otherwise specifically stated, terms such as processing, calculation, operation, determination, display, etc., may refer to the actions and / or processes of one or more processing or computing systems or similar devices that represent the manipulation and conversion of data representing physical (e.g., electronic) quantities within the registers or memory of the processing system into other data similarly representing physical quantities within the memory, registers, or other such information storage, transmission, or display devices of the processing system. Information and signals can be represented using any of a variety of different techniques and methods. For example, data, instructions, commands, information, signals, bits, symbols, and chips mentioned throughout the above description can be represented by voltage, current, electromagnetic waves, magnetic fields or particles, light fields or particles, or any combination thereof.

[0189] It should be understood that the specific order or hierarchy of steps in the disclosed process is an example of an exemplary method. Based on design preferences, it should be understood that the specific order or hierarchy of steps in the process may be rearranged without departing from the scope of this disclosure. The appended method claims provide elements of various steps in an exemplary order and are not intended to limit the scope to the specific order or hierarchy described.

[0190] In the detailed description above, various features are combined together in a single embodiment to simplify this disclosure. This approach to disclosure should not be construed as reflecting an intention that embodiments of the claimed subject matter require more features than are explicitly stated in each claim. Rather, as reflected in the appended claims, the invention is presented with fewer features than all of the features in a single disclosed embodiment. Therefore, the appended claims are hereby explicitly incorporated into the detailed description, with each claim representing a separate preferred embodiment of the invention.

[0191] Those skilled in the art will also understand that the various illustrative logic blocks, modules, circuits, and algorithm steps described in conjunction with the embodiments herein can be implemented as electronic hardware, computer software, or a combination thereof. To clearly illustrate the interchangeability between hardware and software, the various illustrative components, blocks, modules, circuits, and steps described above are generally described in terms of their functionality. Whether such functionality is implemented as hardware or software depends on the specific application and the design constraints imposed on the overall system. Those skilled in the art can implement the described functionality in alternative ways for each specific application; however, such implementation decisions should not be construed as departing from the scope of this disclosure.

[0192] The steps of the methods or algorithms described in conjunction with the embodiments herein can be directly embodied in hardware, software modules executed by a processor, or a combination thereof. The software modules can reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disks, removable disks, CD-ROMs, or any other form of storage medium well known in the art. An exemplary storage medium is connected to the processor, enabling the processor to read information from and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and storage medium can reside in an ASIC. The ASIC can reside in a user terminal. Alternatively, the processor and storage medium can exist as discrete components in the user terminal.

[0193] For software implementation, the techniques described in this application can be implemented using modules (e.g., procedures, functions, etc.) that perform the functions described in this application. This software code can be stored in memory units and executed by a processor. The memory units can be implemented within the processor or outside the processor; in the latter case, they are communicatively coupled to the processor via various means, as is well known in the art.

[0194] The foregoing description includes examples of one or more embodiments. It is certainly impossible to describe all possible combinations of components or methods in order to describe the above embodiments, but those skilled in the art will recognize that further combinations and arrangements of the various embodiments are possible. Therefore, the embodiments described herein are intended to cover all such changes, modifications, and variations that fall within the scope of the appended claims. Furthermore, the term "comprising" as used in the specification or claims is interpreted in a manner similar to the term "including," as interpreted when used as a conjunction in the claims. Additionally, the use of any term "or" in the specification of the claims is intended to mean "non-exclusive or."

Claims

1. A spectrum testing and analysis method, characterized in that, include: If the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator, the waveform type and waveform parameters are determined according to the spectrum scanning parameters of the device under test and provided to the waveform generator; the transmitted signal generated by the waveform generator according to the waveform type and waveform parameters is acquired, and the output signal after the transmitted signal passes through the device under test is collected; the spectrum test results are obtained based on the transmitted signal and the output signal. If the required scanning frequency range of the device under test is not within the operating frequency range of the waveform generator, the frequency conversion parameters are determined according to the spectrum scanning parameters, and the waveform type and waveform parameters of each waveform generator are provided to at least two waveform generators. The output signal of the device under test is obtained by mixing the transmit sub-signals generated by at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters. The spectrum test result is obtained based on the transmit signal and the output signal.

2. The method as described in claim 1, characterized in that, Also includes: Based on the frequency range included in the spectrum scanning parameters of the device under test, determine whether the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator.

3. The method as described in claim 1, characterized in that, The waveform generator acquires the transmitted signal generated according to the waveform type and waveform parameters, and the output signal after the transmitted signal passes through the device under test. The spectrum test results are obtained based on the transmitted signal and the output signal, including: The arbitrary waveform generator generates a transmission signal based on the waveform type and waveform parameters and provides it to the device under test. The system acquires the output signal of the transmitted signal after it passes through the device under test, and performs analog-to-digital conversion on the output signal. The frequency response characteristics of the device under test are obtained based on the spectral characteristics of the output signal after analog-to-digital conversion and the spectral characteristics of the transmitted signal.

4. The method as described in claim 3, characterized in that, If the waveform is a sine wave, an arbitrary waveform generator is used to generate the transmission signal based on the frequency, amplitude, and phase of the sine wave. If the waveform type is a square wave, an arbitrary waveform generator is used to generate the transmission signal according to the frequency, amplitude and duty cycle of the square wave.

5. The method as described in claim 4, characterized in that, An arbitrary waveform generator generates a transmit signal based on the waveform type and waveform parameters, including: An arbitrary waveform generator generates square waves of different frequencies and specified duty cycles as transmitted signals; or An arbitrary waveform generator generates at least two square waves with different frequencies and duty cycles. The transmitted signal is obtained by superimposing the at least two square waves.

6. The method as described in claim 1, characterized in that, The output signal of the device under test is obtained by mixing the transmit sub-signals generated by at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters, and then passing the transmit signal through the device under test. The spectrum test results are obtained based on the transmit signal and the output signal, including: Each arbitrary waveform generator generates a transmit sub-signal based on a waveform type and waveform parameters; At least two transmitting sub-signals are superimposed to obtain a superimposed signal. The superimposed signal is then up-converted based on the local oscillator signal generated according to the frequency conversion parameters to obtain a transmitting signal that is provided to the device under test. Alternatively, at least two transmitting sub-signals are up-converted according to the frequency conversion parameters to obtain frequency-converted transmitting sub-signals. The at least two frequency-converted transmitting sub-signals are then summed to obtain a transmitting signal that is provided to the device under test. The output signal of the transmitted signal after passing through the device under test is acquired, and the output signal is down-converted according to the frequency conversion parameters to obtain the frequency-converted output signal. The frequency-converted output signal is then converted from analog to digital. The frequency response characteristics of the device under test are obtained by analyzing the spectral characteristics of the output signal after analog-to-digital conversion and the spectral characteristics of the transmitted signal.

7. The method according to any one of claims 1-6, characterized in that, Also includes: Based on the noise simulation parameters, a noise simulation signal is generated and added to the transmitted signal or the mixed-frequency transmitted signal.

8. A method for generating a spectrum test wave, characterized in that, include: If the frequency range required by the device under test is within the operating frequency range of the waveform generator, the waveform type and waveform parameters are determined according to the spectrum scanning parameters of the device under test and provided to the waveform generator so that the waveform generator can generate a transmission signal for the device under test based on the waveform type and waveform parameters. If the frequency range required by the device under test is not within the operating frequency range of the waveform generator, the frequency conversion parameters are determined according to the spectrum scanning parameters, and the waveform type and waveform parameters of each waveform generator are provided to at least two waveform generators. So that at least two waveform generators generate transmit sub-signals according to the waveform type and waveform parameters respectively, and the at least two transmit sub-signals are mixed with the local oscillator signal generated according to the frequency conversion parameters to obtain the transmit signal provided to the device under test.

9. A spectrum testing and analysis device, characterized in that, include: The judgment module is used to determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator; The first test analysis module is used to determine the waveform type and waveform parameters based on the spectrum scanning parameters of the device under test if the required scanning frequency range of the device under test is within the operating frequency range of the waveform generator, and provide them to the waveform generator; acquire the transmitted signal generated by the waveform generator according to the waveform type and waveform parameters, and collect the output signal after the transmitted signal passes through the device under test, and obtain the spectrum test results based on the transmitted signal and the output signal; The second test and analysis module is used to determine the frequency conversion parameters and the waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters if the required scanning frequency range of the device under test is not within the operating frequency range of the waveform generator. The output signal of the device under test is obtained by mixing the transmit sub-signals generated by at least two waveform generators according to the waveform type and waveform parameters with the local oscillator signal generated according to the frequency conversion parameters. The spectrum test result is obtained based on the transmit signal and the output signal.

10. A spectrum test wave generation device, characterized in that, include: The judgment module is used to determine whether the frequency range required by the device under test is within the operating frequency range of the waveform generator; The first control module is used to determine the waveform type and waveform parameters according to the spectrum scanning parameters of the device under test if the frequency range required by the device under test is within the operating frequency range of the waveform generator, and provide them to the waveform generator so that the waveform generator can generate a transmission signal for the device under test according to the waveform type and waveform parameters. The second control module is used to determine the frequency conversion parameters and the waveform type and waveform parameters of each waveform generator according to the spectrum scanning parameters if the frequency range required by the device under test is not within the operating frequency range of the waveform generator. So that at least two waveform generators generate transmit sub-signals according to the waveform type and waveform parameters respectively, and the at least two transmit sub-signals are mixed with the local oscillator signal generated according to the frequency conversion parameters to obtain the transmit signal provided to the device under test.

11. A spectrum testing and analysis system, characterized in that, include: The first waveform generation unit and / or the second waveform generation unit, and the FPGA, An FPGA is provided, wherein the spectrum test and analysis device as described in claim 9 is provided, wherein the first test and analysis module is used to control the operation of the first waveform generation unit, and the second test and analysis module is used to control the operation of the second waveform generation unit. The first waveform generation unit includes a waveform generator, which generates a transmission signal with corresponding frequency and waveform based on FPGA instructions and provides it to the device under test. The second waveform generation unit includes at least two waveform generators, a mixer, and a frequency converter. The waveform generators are used to generate transmit sub-signals with corresponding frequencies and waveforms based on FPGA instructions. The frequency converters are used to generate a local oscillator signal according to the frequency conversion parameters to perform up-conversion processing on the transmit sub-signals. The mixers are used to mix the transmit sub-signals generated by the at least two waveform generators with the local oscillator signal to obtain a transmit signal for the device under test, and to perform down-conversion processing on the output signal output by the device under test.

12. The system as claimed in claim 11, characterized in that, Also includes: An analog-to-digital converter (ADC) is placed between the FPGA and the device under test (DUT) to perform analog-to-digital conversion on the output signal from the DUT.

13. A computer storage medium, characterized in that, The computer storage medium stores computer-executable instructions, which, when executed by a processor, implement the spectrum test analysis method according to any one of claims 1-7 and / or the spectrum test wave generation method according to claim 8.

14. A programmable logic device, characterized in that, include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the program, implements the spectrum test analysis method according to any one of claims 1-7 and / or the spectrum test wave generation method according to claim 8.

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