Simultaneous multi-slice magnetic resonance parameter quantification imaging method
Patent Information
- Application Number
- CN202311039313.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-08-17
- Publication Date
- 2026-07-07
- Estimated Expiration
- 2043-08-17
AI Technical Summary
Traditional quantitative magnetic resonance imaging methods require multiple scans to obtain images with different weights, resulting in long data acquisition times and limiting their clinical application. Furthermore, existing single-scan methods can only image one layer, and the total acquisition time increases with the number of layers when scanning layer by layer.
The design incorporates a multi-layer magnetic resonance parameter quantitative imaging pulse sequence, combined with a deep neural network. By acquiring k-space data in a single scan and performing preprocessing, multi-layer magnetic resonance parameter quantitative images are reconstructed. The design employs a multi-layer signal excitation module, a shift gradient module, a coil sensitive map pre-scanning module, and a deep neural network reconstruction algorithm.
It enables quantitative imaging of multi-slice magnetic resonance parameters in a single scan, shortens the acquisition time, is suitable for low and high acceleration magnification, and is applicable to multi-slice quantitative imaging of 4 layers and above, thus improving imaging efficiency.
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Figure CN117017263B_ABST
Abstract
Citation Information
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