Identifiable adaptive eddy current detection probe

Abstract

The application discloses a recognizable self-adaptive eddy current detection probe, which comprises a probe adapter and a flexible probe, the probe adapter mainly comprises two parts of a circuit connector and a probe connector, the circuit connector is electrically connected with an eddy current instrument and an upper computer, a plurality of interfaces are arranged on the circuit connector, a part of the interfaces are connected with high and low potential voltages, and the upper computer identifies different probes through the potential of the part of the interfaces; the flexible probe mainly comprises a probe rod and a coil group, the coil group is connected with the eddy current instrument through a first signal line, a second signal line and a ground wire, and the eddy current instrument changes a pickup signal line to change the probe from a differential probe to a DP probe. The application improves the surface topography adaptability of the probe, the probe has the recognizable property, the probe structure is simple, and the application provides a feasible idea for nondestructive testing automation.

Description

Technical Field

[0001] This invention belongs to the field of eddy current nondestructive testing technology, specifically a design scheme for an adaptive eddy current nondestructive testing probe with identification capabilities. Background Technology

[0002] With the application of automated inspection technology, automated eddy current nondestructive testing (EDT) is gradually replacing manual scanning. Automated eddy current testing is commonly used in the raw material stage, where structures are simple and shapes are straightforward. However, when dealing with parts with complex shapes, false alarms frequently occur due to variations in the curvature of the inspected surface. This necessitates a comprehensive manual re-inspection of the false alarm locations after automated testing, reducing efficiency. Furthermore, the diverse shapes of the inspected objects require the use of probes of different specifications. Automatic identification of these probes is also a key issue; incorrect probe gripping can lead to interference between the probe and the inspected object, causing damage. False alarms due to part shape, difficulties in automatic probe identification, and the resulting safety concerns limit the application of automated eddy current testing in complex workpieces. Summary of the Invention

[0003] This invention aims to provide an identifiable adaptive eddy current testing probe that ensures the probe remains in constant contact with the deformed testing surface during automated eddy current testing, guaranteeing testing effectiveness, enhancing the adaptability of automated eddy current testing, and reducing the difficulty of path planning. Simultaneously, it enables the identification of different types of eddy current testing probes, avoiding probe-object mismatch issues during automated eddy current testing, preventing probe-object interference, damage to the probe or testing object, and improving the safety of the testing process.

[0004] To achieve the above objectives, the present invention adopts the following technical solution:

[0005] Identifiable adaptive eddy current detection probes, including,

[0006] The probe adapter mainly consists of two parts: a circuit connector and a probe connector. The circuit connector is electrically connected to the eddy current meter and the host computer. The circuit connector contains multiple interfaces, some of which are connected to high and low potential voltages. The host computer identifies different probes through the potential of these interfaces.

[0007] The flexible probe mainly consists of a probe rod and a coil assembly. The probe rod is a PCB board and is detachably connected to the probe connector. The coil assembly includes a first coil and a second coil connected in series.

[0008] The system comprises a first signal line, a second signal line, and a ground line. The first signal line connects the eddy current meter to the first coil, the second signal line connects the eddy current meter to the second coil, and the ground line is connected to the eddy current meter. When the eddy current meter picks up the voltage difference between the first signal line and the second signal line, differential probe detection is achieved. When the eddy current meter picks up the voltage difference between the first signal line and the ground line or the voltage difference between the second signal line and the ground line, DP probe detection is achieved.

[0009] Alternatively, the circuit connector may have at least one 8-pin connector for connecting high and low potential voltages to enable identification of different probes.

[0010] Alternatively, the probe connector includes a circuit connector connection portion, an adapter portion, and an extension portion. The circuit connector connection portion is used for positioning, connecting, and installing the circuit connector. The adapter portion is used to accommodate the connection between the circuit connector and the flexible probe, the first signal line, the second signal line, and the ground line. The extension portion is a flexible structure that internally contains the first signal line, the second signal line, and the ground line.

[0011] Alternatively, the probe connector is connected to the flexible probe via a snap-fit ​​mechanism.

[0012] Alternatively, the coil assembly is located on the probe rod at the end away from the probe connector.

[0013] Alternatively, both the first and second coils can be coils wound with copper wire.

[0014] Alternatively, the first signal line, the second signal line, and the ground line are all printed circuits within the probe rod.

[0015] Compared with the prior art, the present invention has the following characteristics:

[0016] (1) This invention can effectively improve the adaptability of the probe to the deformation of the object being tested during the automatic eddy current testing process, increase the probe's recognizability to the testing equipment, ensure the safety of the testing process, and reduce the difficulty of path planning during the automatic eddy current testing process. (During the automatic eddy current testing process, the probe needs to scan along a fixed route of the part to be inspected. When the surface of the part changes in the path, it often cannot adapt well. At this time, it is possible to replan the scanning route or add an optical instrument to scan before scanning, and then apply the scanning results to the probe scanning path planning. The probe of this invention has a certain toughness. For slight changes in the surface of the part, the probe can adapt to the changes in the scanning surface through the deformation of the probe itself. At this time, it is not necessary to replan the scanning path or add an optical scan of the part surface, thus reducing the difficulty of path planning during the automatic eddy current testing process.)

[0017] (2) This invention can provide ideas for the design of probe structures for other types of automated non-destructive testing, and improve the degree of automation of non-destructive testing.

[0018] (3) The present invention can provide an efficient adaptive solution, using only a small number of structures to ensure that the detection probe fits the detection surface, ensuring the distinction between different types of probes and reducing the complexity of the probe structure.

[0019] (4) The present invention uses a coil made of traditional copper wire instead of the circuit copper wire printed on a flexible PCB board, which has high detection sensitivity, stable signal and good versatility. At the same time, since the probe rod of the present invention also has a certain rigidity, it is more wear-resistant and less prone to damage when scanning the surface of the part. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the identifiable adaptive eddy current detection probe in this invention;

[0021] Figure 2 This is a schematic diagram of the probe adapter structure;

[0022] Figure 3 This is a schematic diagram of a flexible probe being bent.

[0023] Figure 4 This is a schematic diagram of the circuit connector on the probe adapter corresponding to the identity recognition port;

[0024] Figure 5 This is a schematic diagram of a flexible probe structure;

[0025] Figure 6 This is a schematic diagram of the wiring for a flexible probe;

[0026] In the diagram: 1-Probe adapter, 2-Snap fastener, 3-Flexible probe, 4-Circuit connector, 5-Probe connector, 6-Probe rod, 7-Coil assembly. Detailed Implementation

[0027] The present invention will be further described below with reference to the accompanying drawings and specific embodiments. However, it should not be construed that the scope of the subject matter of the present invention is limited to the following embodiments. All modifications, substitutions and alterations made based on ordinary technical knowledge and common practices in the art without departing from the above-described technical concept of the present invention are included within the scope of the present invention.

[0028] like Figure 1 As shown, the identifiable adaptive eddy current detection probe consists of three parts: a probe adapter 1, a clip 2, and a flexible probe 3.

[0029] The probe adapter 1 consists of an upper circuit connector 4 and a lower probe connector 5. The circuit connector 4 is responsible for connecting the eddy current meter and the host computer, and the probe connector 5 is responsible for connecting the flexible probe 3 and the circuit connector 4 to ensure the normal transmission of the eddy current signal.

[0030] like Figure 2 The probe connector 5 consists of a housing for fixing and an internal circuit wiring unit, mainly composed of three parts. Figure 2 The leftmost cylindrical shape represents the circuit connector connection part, the middle cube represents the adapter part, and the rightmost cuboid represents the extension part. The function of the circuit connector connection part is to facilitate probe positioning and stable connection. Since the probe is relatively large, a large contact surface is required to ensure the connection effect, so the circuit connector connection part is designed as a large housing. The main function of the adapter part is to connect and guide the signal line of the flexible probe 3 below to the contact point of the circuit connector 4. The main function of the extension part is to extend the detection length of the coil. The material of the extension part is tough and flexible (similar to the PCB board of the probe rod 6), which can achieve adaptive changes when the detection surface bends, thereby extending the measurable length range of the probe rod 6.

[0031] The clip 2 securely connects the flexible probe 3 to the probe adapter 1.

[0032] Circuit connector 4 is designed to connect to the host computer port and features multiple external circuit contacts for easy circuit connection when replacing different probes. Its type can be selected as MEG-ARRAY. Circuit connector 4 has multiple interfaces, eight of which are connected to high and low voltage levels. The host computer can identify 256 different probes by recognizing the voltage of these eight interfaces. The number of interfaces used for probe identification can be increased or decreased depending on the actual application.

[0033] The flexible probe 3 consists of a probe rod 6 and a coil assembly 7. The probe rod 6 is a PCB board, and the coil assembly 7 is composed of two copper wire coils. Since the PCB board is made of glass fiber, it has a certain rigidity and a certain toughness. When the tough probe rod 6 encounters deformation of the detection surface, it can press down the front coil assembly 7 well and is not easy to break, thus keeping the front end of the probe in close contact with the detection surface.

[0034] Coil group 7 is connected to the eddy current meter via three lines: a first signal line, a second signal line, and a ground line. These three lines are contained within the PCB board of the probe rod 6. By changing the lines used to pick up the signals, the eddy current meter can switch between a differential probe and a DP probe. When the eddy current meter picks up the voltage difference between the first and second signal lines, differential probe detection is achieved; when the eddy current meter picks up the voltage difference between the second signal line and the ground line, DP probe detection is achieved.

[0035] Contents not described in detail in this specification are prior art known to those skilled in the art. Although illustrative specific embodiments of the invention have been described above to facilitate understanding by those skilled in the art, it should be understood that the invention is not limited to the scope of the specific embodiments. Various modifications are readily apparent to those skilled in the art as long as they fall within the spirit and scope of the invention as defined and determined by the appended claims, and all inventions utilizing the concept of this invention are protected.

Claims

1. A recognizable adaptive eddy current detection probe, characterized in that: include, The probe adapter (1) is mainly composed of two parts: a circuit connector (4) and a probe connector (5). The circuit connector (4) is electrically connected to the eddy current meter and the host computer. The circuit connector (4) contains multiple interfaces, some of which are connected to high and low potential voltages. The host computer identifies different probes through the potential of these interfaces. The flexible probe (3) is mainly composed of a probe rod (6) and a coil group (7). The probe rod (6) is a PCB board and is detachably connected to the probe connector (5). The coil group (7) includes a first coil and a second coil connected in series. The system comprises a first signal line, a second signal line, and a ground line. The first signal line connects the eddy current meter and the first coil. The second signal line connects the eddy current meter and the second coil. The ground line is connected to the eddy current meter. When the eddy current meter picks up the voltage difference between the first signal line and the second signal line, differential probe detection is achieved. When the eddy current meter picks up the voltage difference between the first signal line and the ground line or the voltage difference between the second signal line and the ground line, DP probe detection is achieved. The circuit connector (4) has at least 8 interfaces for connecting high and low potential voltages to enable the identification of different probes; The probe connector (5) includes a circuit connector connection part, an adapter part and an extension part. The circuit connector connection part is used to position, connect and install the circuit connector (4). The adapter part is used to accommodate the connection between the circuit connector (4) and the flexible probe (3), the first signal line, the second signal line and the ground line. The extension part is a flexible structure and contains the first signal line, the second signal line and the ground line inside.

2. The identifiable adaptive eddy current detection probe according to claim 1, characterized in that: The probe connector (5) is connected to the flexible probe (3) via a snap (2).

3. The identifiable adaptive eddy current detection probe according to claim 1, characterized in that: The coil assembly (7) is located on the probe rod (6) at the end away from the probe connector (5).

4. The identifiable adaptive eddy current detection probe according to claim 1, characterized in that: Both the first coil and the second coil are coils wound with copper wire.

5. The identifiable adaptive eddy current detection probe according to claim 1, characterized in that: The first signal line, the second signal line, and the ground line are all printed circuits inside the probe rod (6).

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