Test assembly, display panel, and display device

Abstract

The application relates to a test assembly, a display panel and a display device. The test assembly comprises at least one test group, and the test group comprises a plurality of test pieces. Each test piece has a patterned structure, and the patterned structure extends along a preset direction. The extension directions of the patterned structures in each test piece in the same test group are different. The test assembly of the application can meet various test requirements by arranging a plurality of test pieces in the test group and making the extension directions of the patterned structures in each test piece in the same test group different.

Description

Technical Field

[0001] This application relates to the field of display device technology, and in particular to a test component, display panel, and display device. Background Technology

[0002] With the development of display technology, OLED (Organic Light Emitting Display) display panels have been widely used due to their advantages such as being thinner and lighter, brighter, having lower power consumption, faster response, and higher resolution.

[0003] During the manufacturing process of display panels, test specimens can be used to test and verify their process characteristics. Due to differences in manufacturing processes, the process characteristics of display panels are anisotropic. However, test specimens in related technologies often can only test the process characteristics in one direction, making it difficult to meet testing requirements. Summary of the Invention

[0004] Therefore, it is necessary to provide a test component, display panel, and display device to address the problem that test pieces in related technologies can often only test process characteristics in one direction, making it difficult to meet testing requirements.

[0005] According to one aspect of this application, an embodiment of this application provides a test component, including: at least one test group, the test group including multiple test pieces, each test piece having a patterned structure, the patterned structure extending along a preset direction, and the extension direction of the patterned structure in each test piece within the same test group being different.

[0006] The aforementioned test components, by setting multiple test pieces in a test group and ensuring that the patterned structure extension direction of each test piece in the same test group is different, can achieve the testing of the process characteristics of the test piece in different directions by using test pieces with different patterned structure extension directions, thereby meeting a variety of different testing requirements.

[0007] In one embodiment, at least one test group includes multiple test groups, each containing the same number of test pieces, and the test pieces in any two test groups are set in a one-to-one correspondence. By setting multiple test groups in the test assembly, different parts or components in the test piece can be tested simultaneously, improving testing efficiency. Furthermore, since the number of test pieces in each test group is the same, and the test pieces in any two test groups are set in a one-to-one correspondence, it is convenient to analyze and compare the test data from different test groups.

[0008] In one embodiment, the angle α between the extension directions of the patterned structures in any two test pieces within the same test group is 180°k / n, where n is the number of test pieces in the test group, and k is any positive integer (n≥2, n>k). Optionally, the number of test groups is 4, and the angle between the extension directions of the patterned structures in any two test pieces within the same test group is 45° or 90°. This design ensures that the extension directions of the patterned structures in the test pieces within the same test group are uniformly distributed within the plane of the test piece. Therefore, by using these test pieces, the process characteristics of the test piece in different directions can be uniformly tested, improving the test coverage of the test assembly.

[0009] In one embodiment, the patterned structure includes a conductive portion and a first electrode layer electrically connected to the conductive portion. This design allows for the testing of the connection resistance between the conductive portion and the first electrode layer using a test specimen, enabling targeted testing of the connection between the two.

[0010] In one embodiment, the test piece further includes a main body and a plurality of contact electrodes. A patterned structure is disposed within the main body, at least a portion of the contact electrodes are electrically connected to the main body, and at least another portion of the contact electrodes are electrically connected to the patterned structure. Optionally, the main body includes at least one of a substrate, a planarization layer, a pixel defining layer, a power line layer, a light-emitting functional layer, a second electrode layer, and an encapsulation layer. This design facilitates the electrical connection of external testing instruments to the patterned structure via the contact electrodes to achieve conductivity, thereby improving testing efficiency.

[0011] In one embodiment, the size of the patterned structure in a first direction is larger than its size in a second direction. The first direction is the extension direction of the patterned structure, and the second direction is a direction perpendicular to the first direction within the plane containing the patterned structure. By making the size of the patterned structure in the first direction larger than its size in the second direction, the testing of the patterned structure can better reflect the process characteristics of the workpiece under test in the first direction, that is, the process characteristics in the extension direction of the patterned structure, thereby improving the accuracy of the test.

[0012] In one embodiment, the ratio α of the dimension of the patterned structure in the first direction to its dimension in the second direction is ≥30. This design allows the testing of the test piece to largely reflect the process characteristics of the test piece in the first direction, while reducing the interference of process characteristics in the second direction, thereby improving the accuracy of the test.

[0013] According to another aspect of this application, embodiments of this application also provide a display panel having a display area and a non-display area, the display panel including the test component as described above, the test component being disposed in the non-display area.

[0014] The aforementioned display panel, by setting up test components in the non-display area, with each test group of the test components containing multiple test pieces, and making the extension direction of the patterned structure in each test piece within the same test group different, can achieve the testing of the process characteristics of the test piece in different directions by using test pieces with different extension directions of the patterned structure, thereby meeting a variety of different testing needs.

[0015] In one embodiment, in the display area, the display panel further includes: a substrate; a light-emitting functional layer disposed on one side of the substrate, the light-emitting functional layer including a plurality of light-emitting functional parts spaced apart from each other; an isolation structure located between at least partially adjacent light-emitting functional parts, the isolation structure including a conductive part; and a first electrode layer disposed on the side of the light-emitting functional layer away from the substrate, the first electrode layer including a plurality of first electrode parts separated by the isolation structure, the first electrode parts at least partially overlapping with the conductive part; optionally, the light-emitting functional parts include red light-emitting functional parts, green light-emitting functional parts, and blue light-emitting functional parts; the test assembly includes a first test group corresponding to the red light-emitting functional parts, a second test group corresponding to the green light-emitting functional parts, and a third test group corresponding to the blue light-emitting functional parts. With this design, the isolation structure in the display panel can separate the plurality of light-emitting functional parts and the plurality of first electrode parts from each other, reducing crosstalk between different light-emitting functional parts and improving the display effect. The first electrode parts at least partially overlapping with the conductive part in the isolation structure can reduce the voltage drop within the display panel, thereby reducing display power consumption. Simultaneously, it can also reduce the overall stress concentration of the first electrode layer, enhancing the reliability of the display panel. Furthermore, the testing components include a first test group corresponding to the red light emitting functional unit, a second test group corresponding to the green light emitting functional unit, and a third test group corresponding to the blue light emitting functional unit, which can respectively test the process characteristics of the red light emitting functional unit, the green light emitting functional unit, and the blue light emitting functional unit.

[0016] According to another aspect of this application, embodiments of this application also provide a display device, including: a display panel as described above.

[0017] The aforementioned display device has a test component set in the non-display area of ​​the display panel. Each test group of the test component has multiple test pieces, and the patterned structure extension direction of each test piece in the same test group is different. In this way, the process characteristics of the test piece in different directions can be tested by means of test pieces with different patterned structure extension directions, thereby meeting a variety of different testing requirements. Attached Figure Description

[0018] Figure 1 This is a cross-sectional view of the overall structure of a test component provided in one embodiment of this application.

[0019] Figure 2 A cross-sectional view of the overall structure of a test component provided in another embodiment of this application.

[0020] Figure 3 This is a cross-sectional view of the test piece in a test assembly provided in one embodiment of this application.

[0021] Figure 4 This is a schematic diagram of the overall structure of a display panel provided in one embodiment of this application.

[0022] Figure 5 This is a cross-sectional view of the overall structure of a display panel provided in one embodiment of this application.

[0023] Figure 6 This is a schematic diagram of the overall structure of a display device provided in one embodiment of this application.

[0024] The reference numerals in the detailed embodiments are as follows:

[0025] 10: Display device;

[0026] 100: Display panel;

[0027] 110: Test component, 111: Test group, 1111: Test piece, 1112: Patterned structure, 1113: Main body, 1114A, 1114B: Contact electrodes;

[0028] 120: substrate;

[0029] 130: Light-emitting functional layer;

[0030] 140: Isolation structure; 141: Isolator; 142: Barrier part;

[0031] 150: First electrode layer;

[0032] 160: Second electrode layer;

[0033] 170: Pixel-limited layer;

[0034] 180: Encapsulation layer;

[0035] AA: Display area;

[0036] NA: Non-display area. Detailed Implementation

[0037] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0038] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0039] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0040] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0041] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0042] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0043] During the manufacturing process of display panels, test specimens can be used to test and verify their process characteristics. Due to differences in manufacturing processes, the process characteristics of display panels exhibit anisotropy. For example, different film layers in a display panel may be manufactured using different processes such as deposition, evaporation, and sputtering. In deposition, the deposited film layer often exhibits a thicker central area and a thinner edge area. In evaporation, the film layer deposited on the substrate near the evaporation source is relatively thicker, while the film layer deposited on the substrate farther from the evaporation source is relatively thinner. Similarly, in sputtering, the film layer deposited closer to the target center is thicker, and the film layer deposited farther from the target center is thinner. It is evident that even the same film layer manufactured using the same process may exhibit uneven film thickness. Therefore, film layers have different process characteristics in different directions; that is, the process characteristics of film layers are anisotropic.

[0044] However, in related technologies, when testing the process characteristics of display panels using test pieces, due to design flaws in the test pieces, the test pieces can often only test the process characteristics in one direction, which is difficult to meet the testing requirements.

[0045] Figure 1 This is a cross-sectional view of the overall structure of a test component 110 provided in one embodiment of this application.

[0046] To at least partially resolve the above issues, please refer to Figure 1This application provides a test component 110, which includes at least one test group 111. The test group 111 includes multiple test pieces 1111, each test piece 1111 having a patterned structure 1112. The patterned structure 1112 extends along a preset direction, and the extension direction of the patterned structure 1112 in each test piece 1111 within the same test group 111 is different.

[0047] Depending on the test object and test requirements, the test assembly 110 may include one test group 111 or multiple test groups 111, with no limit on the specific number. Each test group 111 includes multiple test pieces 1111. The number of test pieces 1111 in the same test group 111 can be flexibly set according to usage requirements. Different test pieces 1111 can be connected to each other or separated from each other, and the arrangement of the multiple test pieces 1111 is not limited. Each test piece 1111 has a patterned structure 1112. This patterned structure 1112 can be a film layer structure deposited on the substrate 120, a film layer structure evaporated on the substrate 120, or a sputtered structure sputtered on the substrate 120, etc. By testing the process characteristics of this patterned structure 1112, the process characteristics of the device under test can be reflected.

[0048] Specifically, the patterned structure 1112 in the test piece 1111 extends along a preset direction, which can be any direction on the surface of the test piece 1111. The patterned structure 1112 can reflect the process characteristics of the test piece in that preset direction to a certain extent. At the same time, the extension direction of the patterned structure 1112 in each test piece 1111 within the same test group 111 is different. Therefore, different test pieces 1111 within the same test group 111 can reflect the process characteristics of the test piece in different directions.

[0049] For example, test group 111 includes four test pieces 1111. The arrangement of the four test pieces 1111 is not limited. In order to facilitate the testing of test pieces 1111 using testing instruments, Figure 1 In the illustrated embodiment, four test pieces 1111 are arranged side by side, with intervals between them. This allows the test probe of the testing instrument to test all four test pieces 1111 simultaneously, resulting in high testing efficiency. Figure 1 From the far left to the far right, in Figure 1 Of the four test pieces 1111 shown, their patterned structures 1112 are respectively along... Figure 1 Extending in the left and right directions, along Figure 1 Extending in the vertical direction, along Figure 1 Extending from the lower left to the upper right, along Figure 1It extends from the upper left to the lower right. Therefore, by means of Figure 1 The test group 111 shown has four test pieces 1111, which can respectively test the process characteristics of the test piece in the left-right direction, up-down direction, left-to-right direction, and left-to-right direction.

[0050] The test component 110 of this application embodiment sets multiple test pieces 1111 in the test group 111, and makes the extension direction of the patterned structure 1112 in each test piece 1111 in the same test group 111 different. In this way, the process characteristics of the test piece in different directions can be tested by means of test pieces 1111 with different extension directions of patterned structure 1112, thereby meeting a variety of different test requirements.

[0051] Figure 2 A cross-sectional view of the overall structure of the test component 110 provided in another embodiment of this application.

[0052] Depending on the test object, test requirements, etc., test component 110 may include one test group 111 or multiple test groups 111, and the specific number is unlimited. For example Figure 2 As shown, in some embodiments, optionally, at least one test group 111 includes multiple test groups 111, each test group 111 has the same number of test pieces 1111, and the test pieces 1111 in any two test groups 111 are set in a one-to-one correspondence.

[0053] There are three test groups 111, and the arrangement of the test pieces 1111 in the three test groups 111 is not limited. In order to facilitate the testing of the test pieces 1111 using testing instruments, Figure 2 In the illustrated embodiment, the three test groups 111 are arranged in three rows from top to bottom. Each test group 111 includes four test pieces 1111. The four test pieces 1111 in the same group are arranged in four columns from left to right. In this way, the test probe of the testing instrument can test all four test pieces 1111 in the same test group 111 at once. The testing of the three test groups 111 can be completed in three tests, resulting in high testing efficiency. Different test groups 111 can be used to test different film layers or different regions of the test piece. Furthermore, in each test group 111, the patterned structures 1112 in the four test pieces 1111 are respectively along... Figure 2 Extending in the left and right directions, along Figure 2 Extending in the vertical direction, along Figure 2 Extending from the lower left to the upper right, along Figure 2Extending from the upper left to the lower right, the four test pieces 1111 in any two different test groups 111 are set up one-to-one. By setting up multiple test groups 111 in the test assembly 110, different parts or components in the test piece can be tested simultaneously, improving testing efficiency. Furthermore, since the number of test pieces 1111 in each test group 111 is the same, and the test pieces 1111 in any two test groups 111 are set up one-to-one, it is convenient to analyze and compare the test data of different test groups 111.

[0054] The extension directions of the patterned structures 1112 in each test piece 1111 within the same test group 111 are all different. In some embodiments, optionally, the angle α between the extension directions of the patterned structures 1112 in any two test pieces 1111 within the same test group 111 is 180°k / n, where n is the number of test pieces 1111 in the test group 111, and k is any positive integer (n≥2, n>k). Please continue reading. Figure 2 Optionally, the number of test groups 111 is four, and the angle between the extension directions of the patterned structures 1112 in any two test pieces 1111 within the same test group 111 is 45° or 90°. That is, in Figure 2 In the illustrated embodiment, n = 4. When k = 1, α = 45°; when k = 2, α = 90°; and when k = 3, α = 135°. Since α is the angle between the extension directions of the patterned structures 1112 in any two test pieces 1111, in a plane, the angle 135° between two scalars can be converted to 45°. Therefore, the angle between the extension directions of the patterned structures 1112 in any two test pieces 1111 within this test group 111 is 45° or 90°. This design ensures that the extension directions of the patterned structures 1112 in the test pieces 1111 within the same test group 111 are uniformly distributed in the plane where the test pieces 1111 are located. Therefore, by using these test pieces 1111, the process characteristics of the test piece in different directions can be uniformly tested, improving the test coverage of the test assembly 110.

[0055] Figure 3 This is a cross-sectional view of the test piece 1111 in the test component 110 provided in one embodiment of this application.

[0056] Please combine Figure 1 , Figure 2 And see Figure 3In some embodiments, the test piece 1111 may optionally include a main body 1113 and a plurality of contact electrodes 1114A, 1114B, with a patterned structure 1112 disposed within the main body 1113, at least a portion of the contact electrodes 1114A being electrically connected to the main body 1113, and at least another portion of the contact electrodes 1114B being electrically connected to the patterned structure 1112.

[0057] The main body 1113 can be the substrate in the test piece 1111, and the patterned structure 1112 can be a film structure formed on the substrate. At least a portion of the contact electrodes 1114A are electrically connected to the main body 1113, and at least another portion of the contact electrodes 1114B are electrically connected to the patterned structure 1112. This design facilitates the connection of external testing instruments to the patterned structure 1112 via the contact electrodes 1114A and 1114B to achieve conductivity, thereby improving testing efficiency. Figures 1 to 3 In the illustrated embodiment, each test piece 1111 contains four contact electrodes 1114A and 1114B. Two contact electrodes 1114A are electrically connected to the main body 1113, and the other two contact electrodes 1114B are electrically connected to the patterned structure 1112. It should be noted that the contact electrodes 1114A electrically connected to the main body 1113 can be connected to different sides of the main body 1113, and the contact electrodes 1114B electrically connected to the patterned structure 1112 can also be connected to different sides of the patterned structure 1112.

[0058] To reduce test signal interference in different directions of the patterned structure 1112 and improve its test accuracy in a specific direction, in some embodiments, optionally, the size of the patterned structure 1112 in the first direction is larger than its size in the second direction, where the first direction is the extension direction of the patterned structure 1112, and the second direction is the direction perpendicular to the first direction within the plane containing the patterned structure 1112. For example, in... Figure 3 In the embodiment shown, the first direction is Figure 3 The left and right directions, the second direction is Figure 3 In the vertical direction, the dimension of the patterned structure 1112 in the horizontal direction is larger than its dimension in the vertical direction. By making the dimension of the patterned structure 1112 in the first direction larger than its dimension in the second direction, the test of the patterned structure 1112 can better reflect the process characteristics of the workpiece under test in the first direction, that is, the process characteristics in the extension direction of the patterned structure 1112, thereby improving the accuracy of the test.

[0059] Based on the above embodiments, optionally, the ratio a of the dimension of the patterned structure 1112 in the first direction to its dimension in the second direction is ≥30. Figure 3In the illustrated embodiment, the ratio of the dimension of the patterned structure 1112 in the left-right direction to its dimension in the up-down direction is greater than or equal to 30. For example, the dimension of the patterned structure 1112 in the left-right direction can be 35 mm, and its dimension in the up-down direction can be 1 mm. In this case, the ratio of its dimension in the first direction to its dimension in the second direction is a = 35, and 35 > 30. This design allows the testing of the test piece 1111 to reflect the process characteristics of the test piece in the first direction to a large extent, while reducing the interference of the process characteristics in the second direction and improving the accuracy of the test.

[0060] Figure 4 This is a schematic diagram of the overall structure of a display panel 100 provided in one embodiment of this application. Figure 5 This is a cross-sectional view of the overall structure of a display panel 100 provided in one embodiment of this application.

[0061] Please combine Figure 1 And see Figure 4 This application embodiment also provides a display panel 100, which has a display area AA and a non-display area NA. The display panel 100 includes a test component 110 as described in any of the above embodiments, and the test component 110 is located in the non-display area NA.

[0062] The display area AA of the display panel 100 is used to display image information, and the non-display area NA is set around the display area AA. The test component 110 is set in the non-display area NA to avoid affecting the display effect of the display panel 100 when testing it.

[0063] The display panel 100 of this application embodiment provides a test component 110 in the non-display area NA. Each test group 111 of the test component 110 has multiple test pieces 1111, and the patterned structure 1112 in each test piece 1111 in the same test group 111 extends in different directions. In this way, the process characteristics of the test piece in different directions can be tested by means of test pieces 1111 with different extension directions of patterned structure 1112, thereby meeting a variety of different testing requirements.

[0064] Figure 5 This is a cross-sectional view of the overall structure of a display panel 100 provided in one embodiment of this application.

[0065] Please see Figures 4 to 5In the display panel 100, the patterned structure 1112 can be a film layer structure deposited on the substrate 120, a film layer structure vapor-deposited on the substrate 120, or a sputtered structure sputtered on the substrate 120, etc. In some embodiments, the patterned structure 1112 includes a conductive portion and a first electrode layer 150 electrically connected to the conductive portion. The conductive portion can be any other structure in the display panel 100 electrically connected to the first electrode layer 150. With this design, the connection resistance between the conductive portion and the first electrode layer 150 can be tested using a test piece, and the connection between the conductive portion and the first electrode layer 150 can be tested specifically.

[0066] In some embodiments, the display panel 100 may optionally include a substrate 120, a light-emitting functional layer 130, an isolation structure 140, and a first electrode layer 150; the light-emitting functional layer 130 is disposed on one side of the substrate 120 and includes a plurality of light-emitting functional portions spaced apart from each other; the isolation structure 140 is located between at least partially adjacent light-emitting functional portions; the first electrode layer 150 is disposed on the side of the light-emitting functional layer 130 away from the substrate 120 and includes a plurality of first electrode portions separated by the isolation structure 140.

[0067] In the display panel 100, the main body 1113 of the test group 111 can be one or more of the following film layer structures: substrate 120, planarization layer, pixel limiting layer 170, power line layer, light-emitting functional layer 130, second electrode layer 160, encapsulation layer 180, etc., and the patterned structure 1112 can be formed on the main body 1113.

[0068] Specifically, the substrate 120 is used to support and carry other film layers in the display panel 100. Exemplarily, the substrate 120 can be made of materials such as glass or polyimide (PI). A light-emitting functional layer 130 is provided on one side of the substrate 120. The light-emitting functional layer 130 includes a plurality of light-emitting functional parts arranged at intervals between each other. Exemplarily, the light-emitting functional parts can be red light-emitting functional parts, green light-emitting functional parts, blue light-emitting functional parts, or white light-emitting functional parts, etc., and are not limited here. Specifically, the light-emitting functional parts can include a multilayer structure. Exemplarily, the light-emitting functional parts include stacked hole injection parts, hole transport parts, light-emitting parts, electron transport parts, electron injection parts, etc.

[0069] The display panel 100 also includes an isolation structure 140, which is located between at least some of the adjacent light-emitting functional parts. That is, among the multiple light-emitting functional parts, an isolation structure 140 is provided between a portion of two adjacent light-emitting functional parts, or an isolation structure 140 is provided between every two adjacent light-emitting functional parts. The light emitted by each light-emitting functional part is blocked by the isolation structure 140 so as not to interfere with the light emitted by its adjacent light-emitting functional parts, thereby avoiding signal crosstalk between adjacent light-emitting functional parts. The isolation structure 140 can be a single, integrated structure. In other embodiments, the isolation structure 140 can also consist of a relatively independent isolation body 141 and a blocking portion 142. The isolation body 141 is located on the substrate 120, and the blocking portion 142 is located on the side of the isolation body 141 facing away from the substrate 120. The area covered by the orthogonal projection of the blocking portion 142 on the substrate 120 is larger, while the area covered by the orthogonal projection of the isolation body 141 on the substrate 120 is relatively smaller, ensuring that the orthogonal projection of the blocking portion 142 on the substrate 120 covers the orthogonal projection of the isolation body 141 on the substrate 120. The cross-sectional shapes of the isolation body 141 and the blocking portion 142 can be regular shapes, such as rectangles or triangles, or irregular shapes.

[0070] The display panel 100 further includes a first electrode layer 150 and a second electrode layer 160. The first electrode layer 150 is disposed on the side of the light-emitting functional layer 130 away from the substrate 120, and the second electrode layer 160 is disposed on the side of the light-emitting functional layer 130 close to the substrate 120. The first electrode layer 150 can be an anode electrode, and the second electrode layer 160 can be a cathode electrode. The light-emitting functional part emits light under the combined action of the first electrode layer 150 and the second electrode layer 160. At the location where the isolation structure 140 is provided in the display panel 100, the first electrode layer 150 includes a plurality of first electrode portions separated by the isolation structure 140.

[0071] The isolation structure 140 includes a conductive portion. This conductive portion can be a part of the structure on the isolator 141, a part of the structure on the blocking portion 142, or both the isolator 141 and the blocking portion 142 may have portions of conductive material. The first electrode portion overlaps with the conductive portion to achieve conductivity between multiple first electrode portions. In this case, the patterned structure 1112 includes a conductive portion and a first electrode portion electrically connected to the conductive portion. The connection resistance between the conductive portion and the first electrode portion can be tested using the test piece 1111, allowing for targeted testing of the connection between the conductive portion and the first electrode layer.

[0072] In some embodiments, the display panel 100 is further provided with an array substrate (not shown in the figure), and the array substrate is provided with a driving circuit for driving each light-emitting functional part to emit light. Under the drive of the driving circuit, different light-emitting functional parts can be excited to emit light of different colors, so that the display panel 100 can achieve a colorful display effect.

[0073] With this design, the isolation structure 140 in the display panel 100 can separate multiple light-emitting functional parts and multiple first electrode parts from each other, which can reduce crosstalk between different light-emitting functional parts, improve the display effect, reduce the voltage drop in the display panel 100, thereby reducing display power consumption. At the same time, it can also reduce the stress concentration of the first electrode layer 150 as a whole, and enhance the reliability of the display panel 100.

[0074] exist Figure 5 In the illustrated embodiment, the display panel 100 may further include a pixel defining layer 170 and an encapsulation layer 180. The pixel defining layer 170 is disposed on the substrate 120 and defines a plurality of pixel openings spaced apart from each other. The light-emitting functional part is at least partially located within the pixel openings. The isolation structure 140 is disposed on the pixel defining layer 170 and located between at least partially adjacent two pixel openings. The encapsulation layer 180 is used to encapsulate the pixel openings and also covers the top surface of the isolation structure 140, thereby providing protection for the entire display panel 100.

[0075] In the display panel 100, different light-emitting functional units can be excited by a driving circuit to emit light of different colors. For example, the light-emitting functional units may include a red light-emitting functional unit for emitting red light, a green light-emitting functional unit for emitting green light, and a blue light-emitting functional unit for emitting blue light. In this case, such as... Figure 2 As shown, the test assembly 110 includes a first test group 111A corresponding to the red light emitting functional unit, a second test group 111B corresponding to the green light emitting functional unit, and a third test group 111C corresponding to the blue light emitting functional unit. In this way, the process characteristics of the red light emitting functional unit, the green light emitting functional unit, and the blue light emitting functional unit can be tested separately.

[0076] Figure 6 This is a schematic diagram of the overall structure of a display device 10 provided in one embodiment of this application.

[0077] Please combine Figure 4 , Figure 5 And see Figure 6 This application also provides a display device 10, which includes a display panel 100 as described in any of the above embodiments.

[0078] The display panel 100 disclosed in any of the above embodiments of this application is applied in the display device 10 to provide the function of displaying a screen. The display device 10 can be any product or component with display function, including but not limited to mobile phones, tablets, laptops, e-readers, wearable devices, remote controls, televisions, desktop computers, in-vehicle devices, etc. In the display device 10 of the embodiments of this application, a test component 110 is provided in the non-display area NA of the display panel 100. Each test group 111 of the test component 110 has multiple test pieces 1111, and the patterned structure 1112 in each test piece 1111 in the same test group 111 extends in different directions. In this way, the process characteristics of the test piece in different directions can be tested by means of test pieces 1111 with different extension directions of patterned structure 1112, thereby meeting a variety of different testing requirements.

[0079] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0080] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A test assembly characterized by, The application relates to a test assembly, comprising: a plurality of test groups, each of which comprises a plurality of test pieces, each of which has a patterned structure extending in a preset direction, and the extending directions of the patterned structures in each test piece in the same test group are different; the number of test pieces in each test group is the same, and the test pieces in any two test groups are arranged one by one; the included angle between the extending directions of the patterned structures in any two test pieces in the same test group is alpha=180k / n, wherein n is the number of test pieces in the test group, k is any positive integer, n>=2, and n>k.

2. The test assembly of claim 1, wherein, The number of test groups is four, and the included angle between the extending directions of the patterned structures in any two test pieces in the same test group is 45 degrees or 90 degrees.

3. The test assembly of claim 1, wherein, The patterned structure comprises a conductive part and a first electrode layer electrically connected with the conductive part.

4. The test assembly of claim 1, wherein, The test piece further comprises a main body part and a plurality of contact electrodes, the patterned structure is arranged in the main body part, at least part of the contact electrodes are electrically connected with the main body part, and at least another part of the contact electrodes are electrically connected with the patterned structure.

5. The test assembly of claim 4, wherein, The main body part comprises at least one of a substrate, a planarization layer, a pixel definition layer, a power line layer, a light-emitting functional layer, a second electrode layer and an encapsulation layer.

6. The test assembly of claim 1, wherein, The size of the patterned structure in a first direction is greater than the size of the patterned structure in a second direction, the first direction is the extending direction of the patterned structure, and the second direction is a direction perpendicular to the first direction in the plane where the patterned structure is located.

7. The test assembly of claim 6, wherein, The ratio of the size of the patterned structure in the first direction to the size of the patterned structure in the second direction is a>=30.

8. A display panel, characterized by, The display panel has a display area and a non-display area, and comprises the test assembly according to any one of claims 1 to 7, and the test assembly is arranged in the non-display area.

9. The display panel of claim 8, wherein, In the display area, the display panel further comprises: a substrate; a light-emitting functional layer arranged on one side of the substrate, the light-emitting functional layer comprising a plurality of light-emitting functional parts arranged at intervals; an isolation structure between at least part of adjacent light-emitting functional parts, the isolation structure comprising a conductive part; and a first electrode layer arranged on the side, away from the substrate, of the light-emitting functional layer, the first electrode layer comprising a plurality of first electrode parts separated by the isolation structure, and the first electrode parts at least partially overlap the conductive part.

10. The display panel of claim 9, wherein, The light-emitting functional parts comprise red light-emitting functional parts, green light-emitting functional parts and blue light-emitting functional parts; the test assembly comprises a first test group corresponding to the red light-emitting functional parts, a second test group corresponding to the green light-emitting functional parts, and a third test group corresponding to the blue light-emitting functional parts.

11. A display device comprising: The application further relates to a display panel, comprising: the display panel according to any one of claims 8 to 10.

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