A smart adaptive microwave and millimeter-wave testing system

Abstract

This invention provides an intelligent adaptive microwave and millimeter-wave testing system, relating to the field of radio testing. It includes a signal generation module, a signal receiving module, a data processing module, and an intelligent control module. The signal generation module generates and transmits test signals, the signal receiving module receives reflected signal information, the data processing module analyzes the received signal information, and the intelligent control module coordinates and controls the operation of the entire system. This system can intelligently select microwave or millimeter-wave testing based on the target information and continuously optimize model parameters based on test results to improve testing effectiveness.

Description

Technical Field

[0001] This invention relates to the field of radio testing, and more specifically to an intelligent adaptive microwave and millimeter-wave testing system. Background Technology

[0002] Microwave testing and millimeter-wave testing have different characteristics. Generally, the corresponding testing equipment needs to be selected manually for testing. However, this method requires a high level of experience from the user and cannot quickly obtain satisfactory test results. Therefore, there is a need for a testing system that can automatically select microwave or millimeter-wave and automatically select the appropriate frequency based on the information of the target being tested, thereby improving the testing effect.

[0003] The foregoing description of the background art is intended only to facilitate understanding of the invention. This description does not endorse or acknowledge any common general knowledge in the materials mentioned.

[0004] Many radio testing systems have been developed. Extensive research and reference have revealed existing systems such as the one disclosed in publication number CN111082861B. These systems generally include a general public radio interface testing device, a 10GE circuit bearer testing device, and a GE leased line circuit bearer testing device. The general public radio interface testing device includes a first microwave network management unit, a radio frequency remote unit, a first millimeter-wave transmitter, a first millimeter-wave receiver, a baseband processing unit, an integrated services optical transmission network, and a wireless network management unit. The 10GE circuit bearer testing device includes a second microwave network management unit, a data analyzer, a second millimeter-wave transmitter, and a second millimeter-wave receiver. The GE leased line circuit bearer testing device includes a third microwave network management unit, a third millimeter-wave transmitter, a first switch, a GE leased line and internet interface, a third millimeter-wave receiver, a second switch, and a speed measurement computer. However, this type of system can only be used for millimeter-wave testing, has poor testing performance for specific targets, and a limited testing range. Summary of the Invention

[0005] The purpose of this invention is to address the shortcomings by proposing an intelligent adaptive microwave and millimeter-wave testing system.

[0006] The present invention adopts the following technical solution:

[0007] An intelligent adaptive microwave and millimeter-wave testing system includes a signal generation module, a signal receiving module, a data processing module, and an intelligent control module;

[0008] The signal generation module is used to generate and transmit test signals, the signal receiving module is used to receive reflected signal information, the data processing module is used to analyze the received signal information, and the intelligent control module is used to coordinate and control the operation of the entire system.

[0009] The signal generation module includes a microwave signal generation unit, a millimeter-wave signal generation unit, and a switching control unit. The microwave signal generation unit is used to generate microwave test signals, the millimeter-wave signal generation unit is used to generate millimeter-wave test signals, and the switching control unit is used to control the state of the signal generation unit.

[0010] The signal receiving module includes a microwave signal receiving unit, a millimeter-wave signal receiving unit, and an automatic gain control unit. The microwave signal receiving unit is used to receive reflected microwave signals, the millimeter-wave signal receiving unit is used to receive reflected millimeter-wave signals, and the automatic gain control unit is used to adjust the gain of the received signals in real time.

[0011] The data processing module includes a data storage unit and a signal analysis unit. The data storage unit is used to store the received signal data, and the signal analysis unit is used to test and analyze the received signal.

[0012] The intelligent control module includes a central control unit, an interactive display unit, and an intelligent algorithm unit. The central control unit is used to control the overall process and allocate resources. The interactive display unit is used to provide an interactive interface for inputting information and displaying test results. The intelligent algorithm unit is used to execute adaptive calculation tasks and optimize the adaptive model.

[0013] Furthermore, the intelligent algorithm unit includes a test adaptation processor and an adaptation optimization processor. The test adaptation processor is used to convert test information into output parameters through the adaptation model, and the adaptation optimization processor optimizes the adaptation model based on the test results.

[0014] Furthermore, the test adapter processor calculates the comprehensive score S according to the following formula:

[0015]

[0016] Where D is the target distance, R is the target resolution, E is the environment type value, B is the signal bandwidth requirement, and α1, α2, α3, and α4 are four weighting coefficients. min and D max R represents the minimum and maximum distances supported by the system. min and R max For the minimum and maximum resolutions supported by the system, B min and B max These are the minimum and maximum bandwidths supported by the system.

[0017] The test-adapted processor selects microwave or millimeter wave based on the comprehensive score, and calculates the specific generation frequency f0 according to the following formula:

[0018]

[0019] Furthermore, the test adapter processor calculates the control power P0 according to the following formula:

[0020]

[0021] Among them, P min and P max The minimum and maximum power supported by the system;

[0022] Furthermore, the adaptive optimization processor obtains the defect index F of the test results and optimizes and adjusts the four weight coefficients α1, α2, α3, and α4 according to the following formula:

[0023]

[0024] Where η is the learning rate, α i ′ represents the weight coefficient after optimization.

[0025] The beneficial effects achieved by this invention are:

[0026] This system can automatically select microwave or millimeter wave for testing based on the input test information. By using the appropriate test method, the lower limit of the test effect can be guaranteed. After selecting the test method, the specific frequency information is calculated based on the test information to improve the upper limit of the test effect. The model parameters are continuously optimized based on the test results to make the frequency after model conversion more accurate.

[0027] To further understand the features and technical content of the present invention, please refer to the following detailed description and drawings of the present invention. However, the drawings provided are for reference and illustration only and are not intended to limit the present invention. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of the overall structural framework of the present invention;

[0029] Figure 2 This is a schematic diagram of the intelligent control module of the present invention;

[0030] Figure 3 This is a schematic diagram of the microwave signal generating unit of the present invention;

[0031] Figure 4 This is a schematic diagram of the millimeter-wave signal generating unit of the present invention;

[0032] Figure 5 This is a schematic diagram of the intelligent algorithm unit structure of the present invention. Detailed Implementation

[0033] The following specific embodiments illustrate the implementation of the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various details in this specification can also be modified and changed based on different viewpoints and applications without departing from the spirit of the present invention. Furthermore, the accompanying drawings of the present invention are for simple illustrative purposes only and are not depictions of actual dimensions; this is stated beforehand. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the scope of protection of the present invention.

[0034] Example 1.

[0035] This embodiment provides an intelligent adaptive microwave and millimeter-wave testing system, combined with... Figure 1 It includes a signal generation module, a signal receiving module, a data processing module, and an intelligent control module;

[0036] The signal generation module is used to generate and transmit test signals, the signal receiving module is used to receive reflected signal information, the data processing module is used to analyze the received signal information, and the intelligent control module is used to coordinate and control the operation of the entire system.

[0037] The signal generation module includes a microwave signal generation unit, a millimeter-wave signal generation unit, and a switching control unit. The microwave signal generation unit is used to generate microwave test signals, the millimeter-wave signal generation unit is used to generate millimeter-wave test signals, and the switching control unit is used to control the state of the signal generation unit.

[0038] The signal receiving module includes a microwave signal receiving unit, a millimeter-wave signal receiving unit, and an automatic gain control unit. The microwave signal receiving unit is used to receive reflected microwave signals, the millimeter-wave signal receiving unit is used to receive reflected millimeter-wave signals, and the automatic gain control unit is used to adjust the gain of the received signals in real time.

[0039] The data processing module includes a data storage unit and a signal analysis unit. The data storage unit is used to store the received signal data, and the signal analysis unit is used to test and analyze the received signal.

[0040] The intelligent control module includes a central control unit, an interactive display unit, and an intelligent algorithm unit. The central control unit is used to control the overall process and allocate resources. The interactive display unit is used to provide an interactive interface for inputting information and displaying test results. The intelligent algorithm unit is used to execute adaptive calculation tasks and optimize the adaptive model.

[0041] The intelligent algorithm unit includes a test adaptation processor and an adaptation optimization processor. The test adaptation processor is used to convert test information into output parameters through the adaptation model, and the adaptation optimization processor optimizes the adaptation model based on the test results.

[0042] The test-adapted processor calculates its comprehensive score S according to the following formula:

[0043]

[0044] Where D is the target distance, R is the target resolution, E is the environment type value, B is the signal bandwidth requirement, and α1, α2, α3, and α4 are four weighting coefficients. min and D max R represents the minimum and maximum distances supported by the system. min and R max For the minimum and maximum resolutions supported by the system, B min and B max These are the minimum and maximum bandwidths supported by the system.

[0045] The test-adapted processor selects microwave or millimeter wave based on the comprehensive score, and calculates the specific generation frequency f0 according to the following formula:

[0046]

[0047] The test adapter processor calculates the control power P0 according to the following formula:

[0048]

[0049] Among them, P min and P max The minimum and maximum power supported by the system;

[0050] The adaptive optimization processor obtains the defect index F of the test results and optimizes and adjusts the four weight coefficients α1, α2, α3 and α4 according to the following formula:

[0051]

[0052] Where η is the learning rate, α i ′ represents the weight coefficient after optimization.

[0053] Example 2.

[0054] This embodiment includes all the contents of Embodiment 1, and provides an intelligent adaptive microwave and millimeter wave testing system, including a signal generation module, a signal receiving module, a data processing module and an intelligent control module;

[0055] The signal generation module is used to generate and transmit test signals, the signal receiving module is used to receive reflected signal information, the data processing module is used to analyze the received signal information, and the intelligent control module is used to coordinate and control the operation of the entire system.

[0056] The signal generation module includes a microwave signal generation unit, a millimeter-wave signal generation unit, and a switching control unit. The microwave signal generation unit is used to generate microwave test signals, the millimeter-wave signal generation unit is used to generate millimeter-wave test signals, and the switching control unit is used to control the state of the signal generation unit.

[0057] The signal receiving module includes a microwave signal receiving unit, a millimeter-wave signal receiving unit, and an automatic gain control unit. The microwave signal receiving unit is used to receive reflected microwave signals, the millimeter-wave signal receiving unit is used to receive reflected millimeter-wave signals, and the automatic gain control unit is used to adjust the gain of the received signals in real time.

[0058] The data processing module includes a data storage unit and a signal analysis unit. The data storage unit is used to store the received signal data, and the signal analysis unit is used to test and analyze the received signal.

[0059] Combination Figure 2 The intelligent control module includes a central control unit, an interactive display unit, and an intelligent algorithm unit. The central control unit is used to control the overall process and allocate resources. The interactive display unit is used to provide an interactive interface for inputting information and displaying test results. The intelligent algorithm unit is used to execute adaptive calculation tasks and optimize the adaptive model.

[0060] Combination Figure 3 The microwave signal generating unit includes a frequency synthesis processor, a signal synthesis processor, and a first power control processor. The frequency synthesis processor synthesizes multiple frequency signals based on a fundamental frequency. The signal synthesis processor is used to synthesize the frequency signals and modulation signals into an output signal. The first power control processor is used to control the power intensity of the microwave signal and transmit it outward.

[0061] Combination Figure 4 The millimeter-wave signal generation unit includes a frequency multiplier processor, a noise suppression processor, and a second power control processor. The frequency multiplier processor is used to multiply and mix low-frequency signals to obtain high-frequency signals. The noise suppression processor is used to reduce the phase noise of the millimeter waves. The second power control processor is used to control the power intensity of the millimeter-wave signal and transmit it outward.

[0062] The switching control unit includes a parameter conversion processor, a signal transmission processor, and a transmission control processor. The parameter conversion processor is used to receive output parameters and convert them into generated parameters. The signal transmission processor is used to control the transmission direction of the signal synthesis processor. The transmission control processor is used to control the transmission functions of the first power control processor and the second power control processor.

[0063] The received output parameters refer to the parameter information of the externally emitted microwave or millimeter wave, and the generated parameters refer to the parameter information acting on the frequency synthesis processor, signal synthesis processor, and frequency multiplier processor.

[0064] When transmitting microwave signals, the signal synthesis processor transmits the output signal to the first power control processor; when transmitting millimeter wave signals, the signal synthesis processor transmits the output signal to the frequency multiplier processor.

[0065] The microwave signal receiving unit includes a microwave antenna processor and a microwave filter processor. The microwave antenna processor is used to receive microwave electromagnetic signals and convert them into electrical signals, and the microwave filter processor is used to filter the microwave electrical signals.

[0066] The millimeter-wave signal receiving unit includes a millimeter-wave antenna processor and a millimeter-wave filter processor. The millimeter-wave antenna processor is used to receive millimeter-wave electromagnetic signals and convert them into electrical signals. The millimeter-wave filter processor is used to filter the millimeter-wave electrical signals.

[0067] The automatic gain control unit includes a signal amplification processor and an analog-to-digital converter. The signal amplification processor is used to amplify the filtered signal, and the analog-to-digital converter is used to convert the amplified analog signal into a digital signal.

[0068] The signal analysis unit includes a time-domain analysis processor, a frequency-domain analysis processor, and a feature analysis processor. The time-domain analysis processor is used to analyze and obtain time-domain information in the digital signal. The frequency-domain analysis processor is used to perform Fourier transform processing on the digital signal to obtain frequency-domain information. The feature analysis processor is used to analyze and process the time-domain information and frequency-domain information to obtain test features.

[0069] The central control unit includes a process control processor and a resource allocation processor. The process control processor is used to control the workflow of the entire system, and the resource allocation processor is used to allocate computing resources between the signal analysis unit and the intelligent algorithm unit.

[0070] The interactive display unit includes a demand input processor and a result display processor. The demand input processor is used to input test information, and the result display processor is used to display test results.

[0071] Combination Figure 5 The intelligent algorithm unit includes a test adaptation processor and an adaptation optimization processor. The test adaptation processor is used to convert test information into output parameters through the adaptation model, and the adaptation optimization processor optimizes the adaptation model based on the test results.

[0072] The process of adapting the test processor includes the following steps:

[0073] S1. Calculate the overall score S according to the following formula:

[0074]

[0075] Where D is the target distance, R is the target resolution, E is the environment type value, B is the signal bandwidth requirement, and α1, α2, α3, and α4 are four weighting coefficients. min and D max R represents the minimum and maximum distances supported by the system. min and R max For the minimum and maximum resolutions supported by the system, B min and B max These are the minimum and maximum bandwidths supported by the system.

[0076] The environment type value is divided into three cases: 0.5 for indoor, 1.0 for outdoor, and 1.5 for when there is interference;

[0077] S2. Select microwave or millimeter wave based on the comprehensive score, and calculate the specific generation frequency f0 according to the following formula:

[0078]

[0079] S3. Calculate the control power P0 according to the following formula:

[0080]

[0081] Among them, P min and P max The minimum and maximum power supported by the system;

[0082] S4. Obtain the modulation parameter M0 according to the following formula:

[0083]

[0084] The adaptive optimization processor obtains the defect index F of the test results and optimizes and adjusts the four weight coefficients α1, α2, α3 and α4 according to the following formula:

[0085]

[0086] Where η is the learning rate, α i ′ represents the weight coefficient after optimization;

[0087] The defect index is determined based on the test results and the test type. Different test types have different defect index calculation methods, which are set by the testers themselves.

[0088] The 'i' mentioned above is an ordinal number used to represent the sequence number.

[0089] The content disclosed above is only a preferred and feasible embodiment of the present invention, and is not intended to limit the scope of protection of the present invention. Therefore, all equivalent technical changes made based on the content of the present invention specification and drawings are included within the scope of protection of the present invention. Furthermore, the elements therein can be updated as technology develops.

Claims

1. An intelligent adaptive microwave millimeter wave test system, characterized in that, The signal generation module, the signal receiving module, the data processing module and the intelligent control module are included. The signal generation module is used to generate and emit test signals, the signal receiving module is used to receive reflected signal information, the data processing module is used to analyze received signal information, and the intelligent control module is used to coordinate and control the operation of the entire system. The signal generation module includes a microwave signal generation unit, a millimeter wave signal generation unit and a switching control unit, the microwave signal generation unit is used to generate microwave test signals, the millimeter wave signal generation unit is used to generate millimeter wave test signals, and the switching control unit is used to control the state of the signal generation unit. The signal receiving module includes a microwave signal receiving unit, a millimeter wave signal receiving unit and an automatic gain control unit, the microwave signal receiving unit is used to receive reflected microwave signals, the millimeter wave signal receiving unit is used to receive reflected millimeter wave signals, and the automatic gain control unit is used to adjust the gain of the received signal in real time. The data processing module includes a data storage unit and a signal analysis unit, the data storage unit is used to save received signal data, and the signal analysis unit is used to test and analyze received signals. The intelligent control module includes a central control unit, an interactive display unit and an intelligent algorithm unit, the central control unit is used to control the overall process and allocate resources, the interactive display unit is used to provide an interactive interface for inputting information and displaying test results, and the intelligent algorithm unit is used to perform adaptive computing tasks and optimize adaptive models. The intelligent algorithm unit includes a test adaptation processor and an adaptation optimization processor, the test adaptation processor is used to convert test information into output parameters through an adaptive model, and the adaptation optimization processor is used to optimize the adaptive model based on test results. The test adaptation processor calculates the comprehensive score S according to the following formula: ； wherein D is a target distance, R is a target resolution, E is an environment type value, B is a signal bandwidth requirement, , , and are four weight coefficients, and are minimum and maximum distances supported by the system, and are minimum and maximum resolutions supported by the system, and are minimum and maximum bandwidths supported by the system; The test adaptation processor selects the microwave or millimeter wave according to the comprehensive score value and calculates the specific generation frequency according to the following formula : ； The test adaptation processor calculates the control power P0 according to the following formula: ； wherein, and are the minimum and maximum power supported by the system; The adaptive optimization processor obtains the flaw index F of the test result, and optimally adjusts the four weight coefficients according to the following formula: , , and ​ ； wherein, is the learning rate, is the corresponding weight coefficient after optimization.

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