Internet of Things power supply test method and device

Abstract

The invention discloses an Internet of Things power supply test method and device, and relates to the field of power supply test, and the method comprises the steps: carrying out the power supply board test of a power supply board in an Internet of Things power supply through an ATE test system, and carrying out the control board test of a control board in the Internet of Things power supply through an FCT test system; after the power panel and the control panel pass the test, bare computer test is carried out on a bare computer through a bare computer test system, and the bare computer is obtained by splicing the power panel and the control panel which pass the test; after the bare computer passes the test, carrying out an aging test on the bare computer; after the aging test is completed, the complete machine is subjected to complete machine test through a complete machine test system, and the complete machine is obtained after the bare machine passing the test is subjected to shell filling and glue pouring treatment; when the whole machine test is passed, outputting test completion prompt information; and when the test is not passed, the reason for failure is output. According to the invention, the factory yield of the Internet of Things power supply can be improved.

Description

Technical Field

[0001] The present application relates to the field of power supply testing, and in particular to a method and device for testing power supply of an Internet of Things. Background Art

[0002] Power supply testing is an important part of ensuring power supply performance and reliability.

[0003] Traditional power supply testing only tests the power board and can only simply test whether the input and output voltage and current of the power board meet the requirements.

[0004] However, IoT power supplies have more functions than traditional power supplies. If the IoT power supply is tested using the traditional power supply testing method, it is easy to cause problems that affect the normal use of the IoT power supply, such as cold soldering of factory equipment components and defective communication modules, which cannot be detected, resulting in the entire device using the IoT power supply being unusable, greatly increasing the equipment repair rate. Summary of the invention

[0005] The purpose of this application is to provide an IoT power supply testing method and device, which can improve the factory yield of IoT power supplies.

[0006] To achieve the above objectives, this application provides the following solutions:

[0007] In a first aspect, the present application provides an IoT power supply testing method, the IoT power supply testing method comprising:

[0008] The power board in the IoT power supply is tested by an ATE test system, and the control board in the IoT power supply is tested by an FCT test system;

[0009] When the power board test fails, the reason why the power board test fails is output; when the control board test fails, the reason why the control board test fails is output;

[0010] After the power board and the control board are both tested and passed, a bare metal test is performed on the bare metal through a bare metal test system, wherein the bare metal is obtained by splicing the power board and the control board that have passed the test;

[0011] When the bare metal test fails, outputting the reason why the bare metal test fails;

[0012] After the bare metal test passes, performing an aging test on the bare metal;

[0013] After the aging test is completed, the whole machine is tested by a whole machine testing system, wherein the whole machine is obtained by casing and filling the bare machine after passing the test;

[0014] When the whole machine test fails, outputting the reason why the whole machine test fails;

[0015] When the whole machine test passes, a prompt message indicating that the test is completed is output.

[0016] In a second aspect, the present application provides an IoT power supply testing device, comprising:

[0017] The first test module is used to perform a power board test on the power board in the IoT power supply through an ATE test system, and to perform a control board test on the control board in the IoT power supply through an FCT test system;

[0018] A first output module, configured to output the reason why the power board test fails when the power board test fails; and to output the reason why the control board test fails when the control board test fails;

[0019] A second testing module is used to perform a bare metal test on a bare metal through a bare metal testing system after both the power board and the control board have passed the test, wherein the bare metal is obtained by splicing the power board and the control board that have passed the test;

[0020] A second output module, configured to output a reason why the bare metal test fails when the bare metal test fails;

[0021] A third testing module is used to perform an aging test on the bare metal after the bare metal test passes;

[0022] A third output module is used to perform a whole machine test on the whole machine through a whole machine test system after the aging test is completed, wherein the whole machine is obtained after the bare machine that has passed the test is packaged and glued;

[0023] A fourth test module, configured to output a reason why the whole machine test fails when the whole machine test fails;

[0024] The fourth output module is used to output a prompt message indicating that the test is completed when the whole machine test passes.

[0025] In a third aspect, the present application provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of any one of the IoT power supply testing methods described above.

[0026] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of any one of the above-mentioned Internet of Things power supply testing methods.

[0027] In a fifth aspect, the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the steps of any one of the above-mentioned Internet of Things power supply testing methods.

[0028] According to the specific embodiments provided in this application, this application discloses the following technical effects:

[0029] The present application provides a method and device for testing power supply of the Internet of Things. The control board peripheral test and the power board single board test are first performed to ensure that process, welding, and hardware defects are discovered in time, and the problematic equipment will not flow into the next link. The control board and power board that pass the test are welded together, and the bare metal test is performed after the welding is completed to further test the hardware defects, whether the communication between the test boards is normal, and whether the collected quantity is accurate. The bare metal that passes the test is aged, and after the aging is completed, it is glued and assembled into a complete machine, and then the whole machine test is performed again to further intercept the defects caused by problems generated during the assembly and glue filling process, and ensure that the products leaving the factory are qualified. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0031] Figure 1 is a flow chart of a method for testing an IoT power supply according to an exemplary embodiment;

[0032] Figure 2 is a schematic diagram of a FCT test system according to an exemplary embodiment;

[0033] Figure 3 is a schematic diagram of a bare metal testing system according to an exemplary embodiment;

[0034] Figure 4 is a schematic diagram of a whole machine testing system according to an exemplary embodiment;

[0035] Figure 5 A schematic diagram of functional modules of an IoT power supply testing device provided in one embodiment of the present application;

[0036] Figure 6 A schematic diagram of the structure of a computer device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0038] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0039] Figure 1 is a flow chart of a method for testing an IoT power supply according to an exemplary embodiment. Figure 1 As shown, the process includes the following steps S101-S108:

[0040] In step S101, the power board in the IoT power supply is tested by an ATE test system, and the control board in the IoT power supply is tested by an FCT test system.

[0041] Among them, the ATE test system is used to test whether the power board can perform AC / DC conversion normally, and whether the output of the power board is normal under different input voltages. In other words, the power ATE test system is mainly used to determine whether the power board can work normally and whether it is safe and reliable during the production process.

[0042] The FCT test system is used to test whether there is a local short circuit on the control board and whether the chips in the control board are operating normally.

[0043] In step S102, when the power board test fails, the reason why the power board test fails is output; when the control board test fails, the reason why the control board test fails is output.

[0044] In one embodiment, the test items of the power board test performed by the ATE test system include at least one of the following test items: input current test, low voltage loading test, normal voltage loading test, normal voltage no-load test, normal voltage loading test and high voltage loading test.

[0045] The following is a detailed introduction to the various test items in the ATE test system:

[0046] 1. Test items: Input current test, used to detect whether the input current is normal;

[0047] Setting parameters: The output of the power board is open, and the input voltage of the power board is 30V AC;

[0048] Output mode: open circuit;

[0049] Measurement purpose: Is there any obvious short circuit on the power board?

[0050] Test method: Apply 30V AC voltage to the input of the power board to detect whether the input current is within the set range. If the input current is not within the set range, terminate the test immediately.

[0051] Test range: Input current of the power board <10mA, output voltage of the power board <2V.

[0052] When the test result is that the input current of the power board is less than 10mA and the output voltage of the power board is less than 2V, the test item passes, otherwise the test item fails.

[0053] 2. Test item: low voltage loading test.

[0054] Setting parameters: The minimum input voltage of the power board is 176V AC, and the three outputs of the power board are all at maximum load;

[0055] Output mode: isolated 5V:0.8A;

[0056] Isolation 12V: 0.02A;

[0057] Non-isolated 5V: 0.02A (electronic load CCL mode).

[0058] Measurement purpose: The stability of the power board when it is working at the lowest input voltage;

[0059] Test method: The relevant parameters of the test power board should be within the test range, otherwise stop testing.

[0060] Test range: Input power of power board: 5.5W~6.5W;

[0061] Output voltage of the power board: isolated 5V: 4.75V~5.25V;

[0062] Isolation 12V: 11.4V~12.6V;

[0063] Non-isolated 5V: 4.75V~5.25V.

[0064] When the test result meets this test range, the test item passes the test, otherwise the test item fails the test.

[0065] 3. Test items: normal pressure no-load test.

[0066] Setting parameters: The rated input voltage of the power board is 220VAC, and the three outputs of the power board are all unloaded;

[0067] Output mode: no load;

[0068] Measurement purpose: The no-load output voltage of the power board when the power board is working at the rated input voltage;

[0069] Test method: The output voltage of the test power board should be within the test range, otherwise stop the test;

[0070] Test range: Input power of power board: 0.3W~0.8W;

[0071] Output voltage of the power board: isolated 5V: 4.75V~5.25V;

[0072] Isolation 12V: 11.4V~12.6V;

[0073] Non-isolated 5V: 4.75V~5.25V.

[0074] When the test result meets this test range, the test item passes the test, otherwise the test item fails the test.

[0075] 4. Test item: normal pressure loading test.

[0076] Setting parameters: The rated input voltage of the power board is 220VAC, and the three outputs of the power board are all at maximum load;

[0077] Output mode: isolated 5V: 0.8A; isolated 12V: 0.02A; non-isolated 5V: 0.02A (electronic load CCL mode);

[0078] Measurement purpose: The working stability of the power board when it works at the rated input voltage;

[0079] Test method: The test power supply related parameters should be within the test range, otherwise stop the test;

[0080] Test range: Input power of power board: 5.5W~6.5W;

[0081] Output voltage of the power board: isolated 5V: 4.75V~5.25V;

[0082] Isolation 12V: 11.4V~12.6V;

[0083] Non-isolated 5V: 4.75V~5.25V.

[0084] When the test result meets this test range, the test item passes the test, otherwise the test item fails the test.

[0085] 5. Test items: high voltage loading test;

[0086] Setting parameters: The maximum input voltage of the power board is 264VAC, and the three outputs of the power board are all at maximum load;

[0087] Output mode: isolated 5V: 0.8A; isolated 12V: 0.02A; non-isolated 5V: 0.02A (electronic load CCL mode);

[0088] Measurement purpose: The stability of the power board when it is working at the maximum input voltage;

[0089] Test method: The test power supply related parameters should be within the test range, otherwise stop the test;

[0090] Test range: Input power of power board: 5.5W~6.6W;

[0091] Output voltage of the power board: isolated 5V: 4.75V~5.25V;

[0092] Isolation 12V: 11.4V~12.6V;

[0093] Non-isolated 5V: 4.75V~5.25V.

[0094] When the test result meets this test range, the test item passes the test, otherwise the test item fails the test.

[0095] The reason why the power board test fails may include the test items that failed in various test items of the power board. Similarly, the reason why the control board test fails may include the test items that failed in various test items of the control board.

[0096] In the present disclosure, the first test item in the power board test is a mandatory option, and the following test items 2-5 can be selected according to user needs. Any one of 2-5 can be selected, or any several of 2-5 can be selected.

[0097] It is worth noting that among the above-mentioned test items, the input current test is performed first. If the input current test passes, the tests of the following items are performed. After the test is completed, the test results are output. The test results here may include failed test items and passed test items. If the input current test fails, the test is terminated directly and the failed test items are output, that is, the input current test fails.

[0098] In one embodiment, a test record table may be set, which includes a mapping relationship between test items and test item results, and then corresponding markings may be made directly in the record table according to the test results of the test items.

[0099] In one embodiment, the test items of the control board test performed by the FCT test system include at least one of the following test items: 5V loop input total current test, voltage test, device information reading test, FLASH storage test, real-time clock test, temperature sensor test, light sensor test, metering module communication status test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, watchdog test, RTC supercapacitor voltage test, real-time clock reading test after power off and restart, parameter configuration test and parameter reading test.

[0100] like Figure 2 As shown, the FCT test system includes: FCT test fixture and FCT test software. The power supply is connected to the FCT test fixture. The FCT test fixture is mainly used to fix the control board and supply power to the control board. The analog quantity acquisition module is used to collect the parameters to be evaluated for each test item. The FCT test software is responsible for communicating with the control board, the FCT test fixture and the analog quantity acquisition module, sending test commands and collecting test results. The following is a detailed introduction to each test item in the FCT test system:

[0101] 1. Test item: 5V loop input total current test.

[0102] Test purpose: Check whether the PCBA has a local short circuit or abnormal chip power consumption.

[0103] Test method:

[0104] 1) The FCT test software is connected to the FCT test fixture through the fixture communication serial port. The FCT test software sends a power-on command to the FCT test fixture, and the control board is powered on and stands by for 2S.

[0105] 2) After 2S, the FCT test software reads the total input current of the 5V loop from the analog acquisition module through the analog communication serial port.

[0106] Test standard: 5V loop input total current <400mA.

[0107] If the total 5V loop input current is less than 400mA, the test item passes; otherwise, the test item fails and the control board power supply is immediately disconnected.

[0108] 2. Voltage test.

[0109] Test purpose: Check whether the working voltage of MCU and communication module in the control board is normal.

[0110] Test method: The FCT test software is connected to the FCT test fixture through the fixture communication serial port. The FCT test software sends a power-on command to the FCT test fixture, the control board is powered on, and the FCT test software reads the working voltage of the communication module and the working voltage of the MCU.

[0111] Test standard: The operating voltage range of the communication module: 3.9-4.1V; the operating voltage range of the MCU: 3.2-3.4V.

[0112] When the test result meets the range of the test standard at this time, the voltage test passes, otherwise the voltage test fails.

[0113] 3. Device information reading test.

[0114] Test purpose: Check the software version number in the control board to prevent burning the wrong version of software or taking the wrong hardware;

[0115] Test method: FCT test software reads the hardware version number, software version number and CLASS through the test port in the control board;

[0116] Test criteria: Hardware, software version numbers and CLAS are the same as the configuration items.

[0117] When the hardware, software version numbers and CLAS are all the same as the configuration items, the device information reading test passes, otherwise the device information reading test fails.

[0118] 4. FLASH storage test.

[0119] Test purpose: Check whether the FLASH in the control board is well welded and can work normally;

[0120] Test method: The FCT test software sends a command to read the FLASH status to the control board. After receiving the command, the control board performs a FLASH self-test and feeds back the FLASH self-test result to the FCT test software.

[0121] Test standard: The FLASH self-test result returned by the control board to the FCT test software is OK.

[0122] When the FLASH self-test result returned by the control board to the FCT test software is OK, the FLASH storage test passes, otherwise the FLASH storage test fails.

[0123] 5. Real-time clock test.

[0124] Test purpose: Check whether the real-time clock in the control board can calibrate time and run normally.

[0125] Test method: The FCT test software sends a time calibration command to the control board to calibrate the current real-time time of the FCT test software to the control board. The FCT test software then sends a real-time clock read instruction to the control board to read the time data of the real-time clock of the control board, and compares the time data of the real-time clock of the control board with the current time of the FCT test software. If the error is within 2 seconds, the test is considered to have passed.

[0126] Test standard: The time error between the real-time clock of the control board and the time of the current FCT test software shall not exceed 2s.

[0127] When the time data of the real-time clock of the control board and the time error of the current FCT test software do not exceed 2s, the real-time clock test passes, otherwise the real-time clock test fails.

[0128] 6. Temperature sensor test.

[0129] Test purpose: Check whether the temperature and humidity sensor chip in the control board is well soldered and whether the communication with the MCU in the control board is normal.

[0130] Test method: The FCT test software sends a temperature reading command to the control board, and the control board returns the temperature measurement value to the FCT test software. The FCT test software compares the measurement value with the standard temperature value. If the temperature deviation is less than 3.0℃, it is considered normal.

[0131] Test standard: The temperature deviation between the measured value and the standard temperature value is less than 3.0℃.

[0132] When the temperature deviation between the measured value and the standard temperature value is less than 3.0°C, the temperature sensor test passes, otherwise the temperature sensor test fails.

[0133] 7. Light sensor test.

[0134] Test purpose: Check whether the light sensor interface in the control board is in good condition and whether it can receive light normally.

[0135] Test method:

[0136] 1) The FCT test software controls the small test light on the FCT test fixture to turn on and read the illuminance.

[0137] 2) The FCT test software controls the small test light on the FCT test fixture to turn off and read the illuminance.

[0138] Test standard:

[0139] The illuminance read when the light is on low is less than 10 Lux from the standard illuminance when the light is on low.

[0140] The illuminance read when the light is turned down should deviate from the standard illuminance when the light is turned down by less than 10 Lux.

[0141] When the above test criteria are met, the light sensor test passes, otherwise the light sensor test fails.

[0142] 8. Test the communication status reading of the metering module.

[0143] Test purpose: Check whether the metering module in the control board is welded normally and whether it can communicate normally.

[0144] Test method:

[0145] 1) The FCT test fixture supplies 5V to the 5VP and PGND test points.

[0146] 2) The FCT test software sends a communication status reading instruction of the metering module through the production test serial port.

[0147] 3) After receiving the communication status reading instruction of the metering module, the control board self-checks the communication status of the metering module and returns the result.

[0148] Test standard: The result returns OK.

[0149] When the result returns OK, the metering module communication status reading test passes, otherwise the metering module communication status reading test fails.

[0150] 9. Dimming output test.

[0151] Test purpose: Check whether the dimming output function in the control board is normal.

[0152] Purpose of the test:

[0153] 1) The FCT test software sends a 100% dimming command through the production test serial port, and the FCT test software reads the voltage of the PWM port.

[0154] 2) The FCT test software sends a 50% dimming command through the production test serial port, and the FCT test software reads the voltage of the PWM port.

[0155] 3) The FCT test software sends a 0% dimming command through the production test serial port, and the FCT test software reads the voltage of the PWM port.

[0156] Test standard:

[0157] The PWM output analog voltage value corresponding to the 100% dimming command is >3V;

[0158] The PWM output analog voltage value corresponding to the 50% dimming command is >1.5V;

[0159] The PWM output analog voltage value corresponding to the 0% dimming command is <0.3V;

[0160] When the test result meets the test standard, the dimming output test passes, otherwise the dimming output test fails.

[0161] 10. Three-axis sensor test.

[0162] Test purpose: Check whether the three-axis sensor in the control board functions normally.

[0163] Test method: Place the control board flat, and the FCT test software sends angle reading instructions to the control board through the production test serial port.

[0164] Test standard:

[0165] Abs(x)<=5, Abs(y)<=5, Abs(z)<=90 and the sum of the absolute values ​​of the three angles is greater than 85.

[0166] When the test result meets the test standard, the three-axis sensor test passes, otherwise the three-axis sensor test fails.

[0167] 11. Human body induction test.

[0168] Test purpose: To check whether the human body sensor port in the control panel can work normally.

[0169] Test method:

[0170] 1) The FCT test software sends instructions to the analog quantity acquisition module through the analog quantity communication serial port to disconnect the corresponding relay dry node of the analog quantity acquisition module, and then sends a human body sensing port reading notification to the control board through the production test serial port. The control board returns the read human body sensing port level value to the FCT test software.

[0171] 2) The FCT test software sends instructions to the analog quantity acquisition module through the analog quantity communication serial port, so that the corresponding relay dry node of the analog quantity acquisition module is closed, and then sends a human body sensing port reading notification to the control board through the production test serial port. The control board returns the read human body sensing port level value to the FCT test software.

[0172] Test standard: When the relay is open, a low level is read; when the relay is closed, a high level is read.

[0173] When the test result meets the test standard, the human body induction test passes, otherwise the human body induction test fails.

[0174] 12. IMEI reading test.

[0175] Test purpose: Read the IMEI number of the communication module in the control board to ensure that the communication module communicates normally;

[0176] Test method: The FCT test software sends a read IMEI command to the control board through the production test serial port, and the control board sends the 15-byte string of IMEI to the FCT test software.

[0177] Test standard: The 15-byte string range of IMEI is 0-9, AF.

[0178] When the test result meets the test standard, the IMEI reading test passes, otherwise the IMEI reading test fails.

[0179] 13.ICCID reading test.

[0180] Test purpose: Check whether the communication module can detect the SIM card and ensure that the communication module can correctly identify the SIM card.

[0181] Test method: The FCT test software sends an ICCID read command to the control board through the production test serial port, and the control board sends the 20-byte string of ICCID to the FCT test software.

[0182] Test standard: The 20-byte string range of ICCID is 0-9, AF.

[0183] When the test result meets the test criteria, the ICCID reading test passes, otherwise the ICCID reading test fails.

[0184] 14. Communication module network attachment test.

[0185] Test purpose: Check whether the communication module can attach to the network normally.

[0186] Test method: The FCT test software sends a communication module network attachment status reading instruction to the control board through the production test serial port, and the control board sends the communication module network attachment status to the FCT test software.

[0187] Test standard: The communication module network attachment status returned by the control board is 1 or 5.

[0188] When the communication module network attachment status returned by the control board is 1 or 5, the communication module network attachment test passes, otherwise the communication module network attachment test fails.

[0189] 15. Signal strength test.

[0190] Test purpose: Test the communication signal strength of the communication module to determine whether the antenna is welded normally.

[0191] Test method: The FCT test software sends a "read signal strength" command to the control board through the production test serial port, and the control board sends the read signal strength to the FCT test software.

[0192] Test standard: signal strength ≥-70, bit error rate ≥0.

[0193] When the test result meets the test standard, the signal strength test passes, otherwise the signal strength test fails.

[0194] 16. Watchdog test.

[0195] Test purpose: Check whether the watchdog chip is well soldered and whether the control board can be forced to reset without feeding the watchdog.

[0196] Test method: The FCT test software sends a watchdog test command to the control board through the production test serial port. After receiving the watchdog test command, the control board stops feeding the watchdog, and then the control board automatically resets and sends an MCU reset prompt to the FCT test software through the production test serial port.

[0197] Test standard: The FCT test software receives the MCU reset prompt within 3 seconds.

[0198] When the test result meets the test criteria, the watchdog test passes, otherwise the watchdog test fails.

[0199] 17.RTC supercapacitor voltage test.

[0200] Test purpose: Check whether the RTC backup capacitor voltage in the control board is normal;

[0201] Test method: Read the voltage of VBAT point in the control board through the analog quantity acquisition module;

[0202] Test standard: VBAT ≥ 2.8V;

[0203] When the test result meets the test standard, the RTC super capacitor voltage test passes, otherwise the RTC super capacitor voltage test fails.

[0204] 18. Real-time clock reading test after power off and restart.

[0205] Test purpose: To check whether the real-time clock can calibrate time and run normally after the control board is powered off for a period of time;

[0206] Test method: The FCT test software controls the FCT test fixture to cut off the power supply to the control board for 3 seconds and then restore the power supply. The FCT test software sends a real-time clock reading instruction to the control board through the production test serial port. The control board reads the time data of the real-time clock and sends it to the FCT test software. The FCT test software compares the time data of the real-time clock read by the control board with the current PC time. If the error is within 2 seconds, the test is considered to have passed.

[0207] Test standard: The time data of the real-time clock read by the control board should be within 2s compared with the time of the current FCT test software.

[0208] When the test result meets the test standard, the real-time clock reading test after power failure and restart passes, otherwise the real-time clock reading test after power failure and restart fails.

[0209] 19. Parameter configuration test.

[0210] Test purpose: To configure the server information of the data communication platform corresponding to the IoT power supply according to different customer needs.

[0211] Test method: The FCT test software sends the pre-configured data communication platform address, port, communication interval, APN and other server information to the control board. After receiving it, the control board stores the server information in the flash and returns the storage result.

[0212] Test standard: The control board returns to storage OK.

[0213] When the control board returns storage OK, the parameter configuration test passes, otherwise the parameter configuration test fails.

[0214] 20. Parameter reading test.

[0215] Test purpose: Read the server information of the communication platform corresponding to the IoT power supply data, and check whether it is consistent with the content of the parameter configuration test configuration in 19 above;

[0216] Test method: FCT test software sends parameter reading instructions to the control board, the control board returns parameter content to FCT test software, and FCT test software compares the received parameter content with the configuration content;

[0217] Test standard: The received parameter content is consistent with the configuration content.

[0218] When the received parameter content is consistent with the configuration content, the parameter reading test passes, otherwise the parameter reading test fails.

[0219] In the present disclosure, the first test item in the control panel test is a mandatory option, and the following 2-20 test items can be selected according to user needs. Any one item in 2-20 can be selected, or any several items in 2-20 can be selected.

[0220] It is worth noting that among the above test items, the first one is the 5V loop input total current test. If the 5V loop input total current test passes, the following items are tested. After the test is completed, the test results are output. The test results here can include failed test items and passed test items. If the 5V loop input total current test fails, the test is terminated directly and the failed test items are output, that is, the 5V loop input total current test fails. That is, the FCT test is carried out in sequence according to the steps of the above test items. If there is no problem with the 5V loop input total current test, the subsequent steps will be completed. One test can screen out multiple defects, which is convenient for maintenance.

[0221] In one embodiment, a test record table may be set, which includes a mapping relationship between test items and test item results, and then corresponding markings may be made directly in the record table according to the test results of the test items.

[0222] In step S103, after the power board and the control board are tested and passed, a bare metal test is performed on the bare metal through a bare metal test system. The bare metal is obtained by splicing the power board and the control board that have passed the test.

[0223] In step S104, when the bare metal test fails, the reason why the bare metal test fails is output.

[0224] In step S105, after the bare metal test passes, the bare metal is subjected to an aging test;

[0225] Among them, the bare metal test system is used to test the abnormal working conditions of the hardware in the control board after the power board in the bare metal supplies power to the control board.

[0226] The test items for bare metal testing by the bare metal testing system include at least one of the following test items: When the test system is a bare metal testing system, the test items include at least one of the following tests: device information reading test, temperature sensor test, light sensor test, measurement calibration and test, output voltage and current calibration and test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, real-time clock test, power-off capacitor function test and QR code printing test.

[0227] The bare metal test system mainly tests the operation of the control board and the power board after they are spliced ​​together, and whether the power supply of the power board will cause some hardware abnormalities, and screens out equipment failures caused by mismatch, such as Figure 3 As shown, the bare metal test system includes a bare metal test fixture and bare metal test software, wherein the bare metal test fixture is used to fix the bare metal to be tested, supply power to the bare metal, and connect power meter 1 and power meter 2. Power meter 1 provides standard readable input voltage, current and power to the bare metal test software for calibration of input voltage, input current and input power. Power meter 2 provides standard readable output voltage and current to the bare metal test software for calibration of output voltage and output current. The bare metal test fixture controls the serial port for the bare metal test software to send power supply instructions to the bare metal. The bare metal test software is responsible for communicating with the bare metal, sending test commands, collecting test results and displaying them.

[0228] The following is a detailed introduction to the various test items in the bare metal test system:

[0229] 1. Test item: device information reading test.

[0230] Test purpose: Check the software version number to prevent burning the wrong version of software or taking the wrong hardware.

[0231] Test method: The bare metal test software reads the hardware version number, software version number and CLASS from the bare metal through the production test serial port.

[0232] Test criteria: Hardware, software version numbers and CLAS are the same as the configuration items.

[0233] When the hardware, software version numbers and CLAS are the same as the configuration items, the device information reading test passes, otherwise the device information reading test fails.

[0234] 2. Test item: temperature sensor test.

[0235] Test purpose: Check whether the temperature and humidity sensor chip in the bare machine is well soldered and whether the communication with the MCU is normal.

[0236] Test method: The bare metal test software sends a temperature reading command to the bare metal, and the bare metal returns the temperature measurement value to the bare metal test software. The bare metal test software compares the measurement value with the standard temperature value. If the temperature deviation is less than 3.0℃, it is considered normal.

[0237] Test standard: The temperature deviation between the measured value and the standard temperature value is less than 3.0℃.

[0238] When the temperature deviation between the measured value and the standard temperature value is less than 3.0°C, the temperature sensor test passes, otherwise the temperature sensor test fails.

[0239] 3. Test item: light sensor test.

[0240] Test purpose: Check whether the light sensor interface in the bare machine is in good condition and whether it can receive light normally.

[0241] Test method:

[0242] 1) The bare metal test software controls the small test light on the bare metal test fixture to turn on. The bare metal test software sends a light intensity reading instruction to the bare metal through the production test serial port. After receiving the light intensity reading instruction, the bare metal sends the light intensity to the bare metal test software.

[0243] 2) The bare metal test software controls the small test light on the bare metal test fixture to turn off, and the bare metal test software sends a light intensity reading instruction to the bare metal through the production test serial port. After receiving the light intensity reading instruction, the bare metal sends the light intensity to the bare metal test software.

[0244] Test standard:

[0245] The illuminance read when the light is on low is less than 10 Lux from the standard illuminance when the light is on low.

[0246] The illuminance read when the light is turned down should deviate from the standard illuminance when the light is turned down by less than 10 Lux.

[0247] When the above test criteria are met, the light sensor test passes, otherwise the light sensor test fails.

[0248] 4. Test items: metrology calibration and testing.

[0249] Test purpose: To calibrate the gain of electrical parameters and correct the deviation caused by the device to achieve the designed accuracy.

[0250] Test method:

[0251] calibration:

[0252] 1) Adjust the full power input voltage of the electronic load according to the product model.

[0253] 2) The bare metal test software sends a dimming command to the bare metal through the production test serial port. At this time, due to the load change, the power meter 1 will test the voltage and current values ​​under the corresponding dimming value conditions. The bare metal test software reads the voltage and current values ​​of the power meter 1 at this time, and sends a calibration command containing this group of voltage and current values ​​to the bare metal through the production test serial port. After receiving it, the bare metal compares it with the voltage and current values ​​collected by the bare metal metering module at this time to calculate the calibration value.

[0254] 3) Repeat step 2 and send calibration instructions for 100%, 20%, and 10% respectively.

[0255] test:

[0256] After the calibration is completed, the bare metal test software sends a dimming 100% instruction and an electrical parameter reading instruction to the bare metal through the production test serial port.

[0257] Test standard: The deviation between the input voltage collected by the bare metal metering module and the voltage value of the power meter 1 is less than 0.5%, the deviation between the input current collected by the bare metal metering module and the current value of the power meter 1 is less than 0.5%, and the deviation between the input power collected by the bare metal metering module and the power value of the power meter 1 is less than 0.5%.

[0258] When the test standards are met, the metrological calibration and test pass, otherwise the metrological calibration and test fail.

[0259] 5. Test items: output voltage and current calibration and testing.

[0260] Test purpose: To calibrate the gain of output voltage and current, and correct the deviation caused by the device to achieve the designed accuracy.

[0261] Test method:

[0262] calibration:

[0263] 1) Adjust the full power input voltage of the electronic load according to the product model.

[0264] 2) The bare metal test software sends a dimming 100% command to the bare metal through the production test serial port. At this time, due to the load change, the power meter 2 will test the voltage and current values ​​under the corresponding dimming value conditions. The bare metal test software reads the voltage and current values ​​of the power meter 2 at this time, and sends a calibration command containing this group of voltage and current values ​​to the bare metal through the production test serial port. After receiving it, the bare metal compares it with the output voltage and output current values ​​collected at this time to calculate the calibration value.

[0265] test:

[0266] After the calibration is completed, the bare metal test software sends a dimming 100% instruction and an output voltage and current value reading instruction to the bare metal through the production test serial port.

[0267] Test standard: The output voltage value collected by the bare metal has a deviation of less than 0.5% compared with the voltage value of the power meter 2, and the output current value collected by the bare metal has a deviation of less than 0.5% compared with the current value of the power meter 2.

[0268] When the test standard is met, the output voltage and current calibration and test pass, otherwise the output voltage and current calibration and test fail.

[0269] 6. Test item: dimming output test.

[0270] Test purpose: Check whether the dimming output function is normal.

[0271] Test method:

[0272] 1) Adjust the full power input voltage of the electronic load according to the product type;

[0273] 2) The bare metal test software sends dimming commands of 100% and 50% to the bare metal through the production test serial port, and then sends input and output voltage and current reading instructions to the bare metal through the production test serial port. The bare metal test software reads the voltage and current values ​​of power meter 1, as well as the voltage and current values ​​of power meter 2, and compares them to see if the following conditions are met.

[0274] Test standard:

[0275] When dimming at 100%, the input voltage collected by the bare metal metering module deviates from the actual voltage of the power meter 1 by ±0.5%, and the input current collected by the bare metal metering module deviates from the actual current of the power meter 1 by ±0.5% when dimming at 100%.

[0276] When dimming at 100%, the output voltage collected by the bare machine deviates from the actual voltage of the power meter 2 by ±0.5%, and the output current collected by the bare machine deviates from the actual current of the power meter 2 by ±0.5% when dimming at 100%.

[0277] When dimming at 50%, the input voltage collected by the bare metal metering module deviates from the actual voltage of the power meter 1 by ±0.5%, and when dimming at 50%, the input current collected by the bare metal metering module deviates from the actual current of the power meter 1 by ±0.5%.

[0278] When dimming at 50%, the output voltage collected by the bare machine deviates from the actual voltage of the power meter 2 by ±0.5%, and the output current collected by the bare machine deviates from the actual current of the power meter 2 by ±0.5% when dimming at 50%.

[0279] When the test standard is met, the dimming output test passes, otherwise the dimming output test fails.

[0280] 7. Test item: three-axis sensor test.

[0281] Test purpose: Check whether the three-axis sensor functions normally.

[0282] Test method: Lay the bare metal machine flat, and the bare metal test software sends an angle reading instruction to the bare metal machine through the production test serial port. After receiving the angle reading instruction, the bare metal machine sends the read angle value to the bare metal test software.

[0283] Test standard: Abs(x)<=5, Abs(y)<=90, Abs(z)<=5 and the sum of the absolute values ​​of the three angles is greater than 85.

[0284] When the test standard is met, the three-axis sensor test passes, otherwise the three-axis sensor test fails.

[0285] 8. Test item: human body induction test.

[0286] Test purpose: To check whether the human body sensor port can work normally.

[0287] Test method:

[0288] 1) The bare metal test software sends instructions to the analog quantity acquisition card through the analog quantity communication serial port to disconnect the relay dry node corresponding to the analog quantity acquisition module, and then sends a human body sensing port reading notification to the bare metal through the production test serial port. The bare metal returns the read human body sensing port level value to the bare metal test software.

[0289] 2) The bare metal test software sends instructions to the analog quantity acquisition card through the analog quantity communication serial port to close the relay dry node corresponding to the analog quantity acquisition module, and then sends a human body sensing port reading notification to the bare metal through the production test serial port. The bare metal returns the read human body sensing port level value to the bare metal test software.

[0290] Test standard: When the relay is open, a low level is read; when the relay is closed, a high level is read.

[0291] When the test standard is met, the human body induction test passes, otherwise the human body induction test fails.

[0292] 9. Test item: IMEI reading test.

[0293] Test purpose: Read the IMEI number of the communication module to ensure that the communication module communicates normally.

[0294] Test method: The bare metal test software sends a read IMEI command to the bare metal through the production test serial port, and the bare metal sends the 15-byte string of IMEI to the bare metal test software.

[0295] Test standard: The 15-byte string range of IMEI is 0-9, AF.

[0296] When the test criteria are met, the IMEI reading test passes, otherwise the IMEI reading test fails.

[0297] 10. Test item: ICCID reading test.

[0298] Test purpose: Whether the communication module can detect the SIM card and ensure that the communication module can correctly identify the SIM card.

[0299] Test method: The bare metal test software sends an ICCID read instruction to the bare metal through the production test serial port, and the bare metal sends the 20-byte string of ICCID to the bare metal test software.

[0300] Test standard: The 20-byte string range of ICCID is 0-9, AF.

[0301] When the test standard is met, the ICCID read test passes, otherwise the ICCID read test fails.

[0302] 11. Test item: Communication module network attachment test.

[0303] Test purpose: Check whether the communication module can attach to the network normally.

[0304] Test method: The bare metal test software sends a communication module network attachment status read instruction to the bare metal through the production test serial port, and the bare metal sends the communication module network attachment status to the bare metal test software.

[0305] Test standard: The network attachment status of the communication module returned by the bare metal is 1 or 5.

[0306] When the communication module network attachment status returned by the bare metal is 1 or 5, the communication module network attachment test passes, otherwise the communication module network attachment test fails.

[0307] 12. Test item: signal strength test.

[0308] Test purpose: Test the communication signal strength of the communication module to determine whether the antenna is welded normally.

[0309] Test method: The bare metal test software sends a "read signal strength" command to the bare metal through the production test serial port, and the bare metal sends the read signal strength to the bare metal test software.

[0310] Test standard: signal strength ≥-70, bit error rate ≥0.

[0311] When the test criteria are met, the signal strength test passes, otherwise the signal strength test fails.

[0312] 13. Test item: Real-time clock test.

[0313] Purpose of the test: To check whether the real-time clock can calibrate time and run normally.

[0314] Test method: The bare metal test software sends a time calibration command to the bare metal to calibrate the current real-time time of the bare metal test software to the bare metal. The bare metal test software then sends a real-time clock read instruction to the bare metal to read the time data of the bare metal's real-time clock, and compares the time data of the bare metal's real-time clock with the current time of the bare metal test software. If the error is within 2 seconds, the test is considered to have passed.

[0315] Test standard: The time data of the bare metal real-time clock and the time error of the current bare metal test software shall not exceed 2s.

[0316] When the time data of the bare metal real-time clock and the time error of the current bare metal test software do not exceed 2s, the real-time clock test passes, otherwise the real-time clock test fails.

[0317] 14. Test item: Power-off capacitor function test.

[0318] Test purpose: To check whether the power-off capacitor can work normally and whether it has enough capacity to support the equipment to continue working after power failure.

[0319] Test method: The bare metal test software controls the 220V AC programmable power supply to stop output. After 2 seconds, the bare metal test software sends a hardware information read instruction to the bare metal through the production test serial port. The bare metal sends the read hardware information (including hardware version) to the bare metal test software through the production test serial port.

[0320] Test standard: The bare metal test software can normally receive the bare metal response content, and the hardware version sent by the bare metal is consistent with the set hardware version.

[0321] When the test standard is met, the power-off capacitor function test passes, otherwise the power-off capacitor function test fails.

[0322] 15. Test item: QR code printing test.

[0323] Test purpose: Print key product information to facilitate testing and identification of the entire machine after packaging and input into the system after on-site installation by customers.

[0324] Test method: After all the above test items are passed, 4 QR codes are printed and generated. The QR code content is the IMEI number, and the IMEI number is displayed below the QR code.

[0325] Test standard: The printed QR code is clear and scannable.

[0326] When the test criteria are met, the QR code printing test passes, otherwise the QR code printing test fails.

[0327] The bare metal test is carried out in sequence according to the steps of the above test items. One test can screen out multiple defects, which is convenient for maintenance.

[0328] In step S106, after the aging test is completed, the whole machine is tested by the whole machine testing system, and the whole machine is obtained by casing and filling the bare machine after passing the test;

[0329] In step S107, when the whole machine test fails, the reason why the whole machine test fails is output;

[0330] In step S108, when the whole machine test passes, a prompt message indicating that the test is completed is output.

[0331] When the overall test passes, it indicates that all tests are qualified, which means that the product at this time is a qualified product and can be put into storage.

[0332] Among them, the whole machine testing system is used to test whether there is a cold solder joint or a malfunctioning device in the whole machine.

[0333] The test items for the whole machine test system to perform whole machine test include at least one of the following test items: When the test system is a whole machine test system, the test items include at least one of the following tests: device information reading, temperature sensor test, light sensor test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading, ICCID reading, communication module network attachment test, signal strength test, real-time clock test, power-off capacitor function test, and power reset setting.

[0334] The whole machine test system mainly tests whether the product runs normally after bare metal aging and glue filling, so as to prevent defective devices caused by glue filling and aging from entering the market. Figure 4 As shown, the whole machine test system includes a whole machine test fixture and a whole machine test software, wherein the whole machine test fixture is used to fix the whole machine to be tested, supply power to it, and connect power meter 1 and power meter 2. Power meter 1 provides standard input voltage, input current, and input power to the whole machine for comparison with the input data collected by the whole machine. Power meter 2 provides standard output voltage and output current to the whole machine for comparison with the output data collected by the whole machine. The whole machine test software is responsible for communicating with the whole machine, sending test commands, collecting test results and displaying them.

[0335] After the bare metal test is qualified, the aging test is carried out. After the aging is completed, the shell is installed and glue is filled. After the glue is dried, the following tests are carried out to further screen whether there is any device solder joint or component failure. The following is a detailed introduction to the various test items in the whole machine test system:

[0336] 1. Test item: device information reading test.

[0337] Test purpose: Check the software version number to prevent burning the wrong version of software or taking the wrong hardware.

[0338] Test method: The whole machine test software sends a command to read the hardware version number, software version number and CLASS to the whole machine through the network. The whole machine returns the hardware version number, software version number and CLASS through the communication module. The subsequent sending and returning communication processes are referred to as the whole machine test software sending commands to the whole machine through the network.

[0339] Test criteria: Hardware, software version numbers and CLAS are the same as the configuration items.

[0340] When the hardware, software version numbers and CLAS are the same as the configuration items, the device information reading test passes, otherwise the device information reading test fails.

[0341] 2. Test item: temperature sensor test.

[0342] Test purpose: Check whether the temperature and humidity sensor chip is well soldered and whether the communication with the microcontroller MCU is normal.

[0343] Test method: The whole machine test software sends a temperature reading command to the whole machine through the network. The whole machine returns the temperature measurement value to the whole machine test software. The whole machine test software compares the measurement value with the reference value of the standard thermometer. If the deviation is less than 3.0℃, it is considered normal.

[0344] Test standard: Temperature deviation is less than 3.0℃.

[0345] When the temperature deviation is less than 3.0°C, the temperature sensor test passes, otherwise the temperature sensor test fails.

[0346] 3. Test item: light sensor test.

[0347] Test purpose: Check whether the light sensor interface in the whole machine is in good condition and whether it can receive light normally.

[0348] Test method:

[0349] 1) The whole machine test software controls the small test light on the whole machine fixture to turn on, and the whole machine test software sends a light reading instruction to the whole machine through the network. After receiving the light reading instruction, the whole machine sends the light to the whole machine test software.

[0350] 2) The whole machine test software controls the small test light on the whole machine fixture to turn off, and the whole machine test software sends a light reading instruction to the whole machine through the network. After receiving the light reading instruction, the whole machine sends the light to the whole machine test software.

[0351] Test standard:

[0352] The illuminance read when the light is on low is less than 10 Lux from the standard illuminance when the light is on low.

[0353] The illuminance read when the light is turned down should deviate from the standard illuminance when the light is turned down by less than 10 Lux.

[0354] When the above test criteria are met, the light sensor test passes, otherwise the light sensor test fails.

[0355] 4. Test item: dimming output test.

[0356] Test purpose: Check whether the dimming output function is normal.

[0357] Test method:

[0358] 1) Adjust the full power input voltage of the electronic load according to the product type.

[0359] 2) The whole machine test software sends dimming commands of 100% and 50% to the whole machine through the network, and then sends input and output voltage and current reading instructions to the whole machine through the network. The whole machine test software reads the voltage and current values ​​of power meter 1, as well as the voltage and current values ​​of power meter 2, and compares them to see whether the following conditions are met.

[0360] Test standard:

[0361] When dimming at 100%, the input voltage collected by the bare metal metering module deviates from the actual voltage of the power meter 1 by ±0.5%, and the input current collected by the bare metal metering module deviates from the actual current of the power meter 1 by ±0.5% when dimming at 100%.

[0362] When dimming at 100%, the output voltage collected by the bare machine deviates from the actual voltage of the power meter 2 by ±0.5%, and the output current collected by the bare machine deviates from the actual current of the power meter 2 by ±0.5% when dimming at 100%.

[0363] When dimming at 50%, the input voltage collected by the bare metal metering module deviates from the actual voltage of the power meter 1 by ±0.5%, and when dimming at 50%, the input current collected by the bare metal metering module deviates from the actual current of the power meter 1 by ±0.5%.

[0364] When dimming at 50%, the output voltage collected by the bare machine deviates from the actual voltage of the power meter 2 by ±0.5%, and the output current collected by the bare machine deviates from the actual current of the power meter 2 by ±0.5% when dimming at 50%.

[0365] When the above test standards are met, the dimming output test passes, otherwise the dimming output test fails.

[0366] 5. Test item: three-axis sensor test.

[0367] Test purpose: Check whether the three-axis sensor functions normally.

[0368] Test method: Place the whole machine flat, and the whole machine test software sends an angle reading command to the whole machine through the network. After receiving the angle reading command, the whole machine sends the read angle value to the whole machine test software.

[0369] Test standard: Abs(x)<=5, Abs(y)<=90, Abs(z)<=5 and the sum of the absolute values ​​of the three angles is greater than 85.

[0370] When the above test standards are met, the three-axis sensor test passes, otherwise the three-axis sensor test fails.

[0371] 6. Test item: human body induction test.

[0372] Test purpose: To check whether the human body sensor port can work normally.

[0373] Test method:

[0374] 1) The whole machine test software sends instructions to the analog quantity acquisition card through the analog quantity communication serial port to disconnect the relay dry node corresponding to the analog quantity acquisition card. Then the whole machine test software sends a human body sensing port reading notification to the whole machine through the network, and the whole machine returns the read human body sensing port level value to the whole machine test software.

[0375] 2) The whole machine test software sends instructions to the analog quantity acquisition card through the analog quantity communication serial port, so that the corresponding relay dry node of the analog quantity acquisition card is closed, and then the whole machine test software sends a human body sensing port reading notification to the whole machine through the network, and the whole machine returns the read human body sensing port level value to the whole machine test software.

[0376] Test standard: When the relay is open, a low level is read; when the relay is closed, a high level is read.

[0377] When the above test standards are met, the human body induction test passes, otherwise the human body induction test fails.

[0378] 7. Test item: IMEI reading.

[0379] Test purpose: Read the IMEI number of the communication module to ensure that the communication module is powered normally and the communication is normal.

[0380] Test method: The whole machine test software sends a read IMEI instruction to the whole machine through the network, and the whole machine sends a 15-byte string of IMEI to the whole machine test software.

[0381] Test standard: The 15-byte string range of IMEI is 0-9, AF.

[0382] When the 15-byte string range of IMEI is all 0-9, AF, the IMEI reading test passes, otherwise the IMEI reading test fails.

[0383] 8. Test item: ICCID reading test.

[0384] Test purpose: Whether the communication module can detect the SIM card and ensure that the communication module can correctly identify the SIM card.

[0385] Test method: The whole machine test software sends an ICCID read instruction to the whole machine through the network, and the whole machine sends the 20-byte string of ICCID to the whole machine test software.

[0386] Test standard: The 20-byte string range of ICCID is 0-9, AF.

[0387] When the 20-byte character string range of ICCID is all 0-9, AF, the ICCID read test passes, otherwise the ICCID read test fails.

[0388] 9. Test item: Communication module network attachment test.

[0389] Test purpose: Check whether the communication module can attach to the network normally.

[0390] Testing method: The whole machine testing software sends a communication module network attachment status reading instruction to the whole machine through the network, and the whole machine sends the communication module network attachment status to the whole machine testing software.

[0391] Test standard: The network attachment status of the communication module returned by the whole device is 1 or 5.

[0392] When the communication module network attachment status returned by the whole machine is 1 or 5, the communication module network attachment test passes, otherwise the communication module network attachment test fails.

[0393] 10. Test item: signal strength test.

[0394] Test purpose: Test the communication signal strength of the communication module to determine whether the antenna is welded normally.

[0395] Test method: The whole machine test software sends a "read signal strength" command to the whole machine through the network, and the whole machine sends the read signal strength to the whole machine test software.

[0396] Test standard: signal strength ≥-70, bit error rate ≥0.

[0397] When the above test criteria are met, the signal strength test passes, otherwise the signal strength test fails.

[0398] 11. Test item: Real-time clock test.

[0399] Purpose of the test: To check whether the real-time clock can calibrate time and run numbers normally.

[0400] Test method: The whole machine test software sends a time calibration command to the whole machine to calibrate the current real-time time of the whole machine test software to the whole machine. The whole machine test software then sends a real-time clock reading instruction to the whole machine to read the time data of the real-time clock of the whole machine, and compares the time data of the real-time clock of the whole machine with the current time of the whole machine test software. If the error is within 2 seconds, the test is considered to have passed.

[0401] Test standard: The time data of the real-time clock of the whole machine and the time error of the current whole machine test software shall not exceed 2s.

[0402] When the time data of the real-time clock of the whole machine and the time error of the current whole machine test software do not exceed 2s, the real-time clock test passes, otherwise the real-time clock test fails.

[0403] 12. Test item: Power-off capacitor function test.

[0404] Test purpose: To check whether the power-off capacitor can work normally and whether it has enough capacity to support the equipment to continue working after power failure.

[0405] Test method: The whole machine test software controls the 220V AC programmable power supply to stop output. After 2s, the whole machine test software sends a hardware information read instruction to the whole machine through the network. The whole machine sends the read hardware information (including hardware version) to the whole machine test software through the network.

[0406] Test standard: The whole machine test software can normally receive the content responded by the whole machine, and the hardware version sent by the whole machine is consistent with the set hardware version.

[0407] When the above test standards are met, the power-off capacitor function test passes, otherwise the power-off capacitor function test fails.

[0408] 13. Test item: Power reset setting test.

[0409] Test purpose: To clear the energy consumption and light-on time generated during the test.

[0410] Test method: The whole machine test software sends a power reset command to the whole machine through the network. After receiving the command, the whole machine resets the power and running time and stores them in Flash, and returns the storage result.

[0411] Test standard: Storage results OK.

[0412] When the storage result is OK, the power clearing setting test passes, otherwise the power clearing setting test fails.

[0413] In the present disclosure, there are overlapping test items with the same test purpose in FCT testing, bare metal testing and whole machine testing, so that defects caused by welding, stress, static electricity, etc. can be eliminated through multiple tests at different levels.

[0414] Each test system in the present disclosure is independent of each other and can operate in parallel, thereby forming an assembly line business and ensuring product output.

[0415] After each test system is tested, the reasons for the failure of the test will be output. In this way, the technicians can perform corresponding repair work based on the reasons for the failure of the test, without having to find the reasons for the failure themselves, which improves the repair efficiency.

[0416] In the present disclosure, the control board peripheral test and the power board single board test are first performed to ensure that the process, welding, and hardware defects are discovered in time, and the problematic equipment will not flow into the next link. The control board and power board that have passed the test are welded together, and the bare metal test is performed after the welding is completed to further test the hardware defects, whether the communication between the test boards is normal, and whether the collected quantity is accurate. The bare metal that has passed the test is aged, and after the aging is completed, it is glued and assembled into a complete machine, and then the whole machine test is performed again to further intercept the defects caused by problems generated during the assembly and glue filling process, and ensure that the products shipped are qualified. The equipment is easy to operate and does not require too much manual intervention. After starting the test with one button, you only need to wait for the test results. No manual intervention is required in the middle, and there are clear prompts for unqualified items, which is convenient for maintenance. The communication is reliable and can protect the safety of operators.

[0417] In the present disclosure, a multi-layer testing method is used to screen out unqualified products layer by layer, and defective products can be screened out at each step, which greatly improves the pass rate and ensures that the final product is a qualified product.

[0418] Furthermore, the convenience of operation in the present disclosure: one-click testing, without too much manual intervention, the test results are automatically output after the test is completed, and the corresponding information is provided for unqualified items, which is convenient for maintenance personnel to locate the problem. In addition, the maintenance efficiency is improved and the loss is reduced. Accurate error information will be provided for each step of the test failure, and maintenance personnel can quickly locate the problem and improve maintenance efficiency. The repaired equipment continues to be tested, which greatly reduces the loss of defective products. In summary, the method and fixture adopted in the present disclosure can greatly improve the factory qualified rate of IoT power supplies, and can provide accurate unqualified information, which is convenient for maintenance personnel to quickly locate problems, improve maintenance efficiency, and reduce the loss of defective products. Through multi-layer testing, the qualified rate of equipment is improved layer by layer, and defects caused by various reasons in the production link can be discovered in time to ensure that the equipment finally shipped is qualified and can be used directly by customers after they receive it.

[0419] Based on the same inventive concept, the embodiment of the present application also provides an IoT power supply test device for implementing the IoT power supply test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more IoT power supply test device embodiments provided below can refer to the limitations of the IoT power supply test method above, and will not be repeated here.

[0420] In an exemplary embodiment, Figure 5 As shown, an IoT power supply testing device is provided, comprising:

[0421] The first test module 11 is used to perform a power board test on the power board in the IoT power supply through an ATE test system, and to perform a control board test on the control board in the IoT power supply through an FCT test system;

[0422] The first output module 12 is used to output the reason why the power board test fails when the power board test fails; and to output the reason why the control board test fails when the control board test fails;

[0423] A second testing module 13 is used to perform a bare metal test on a bare metal through a bare metal testing system after both the power board and the control board have passed the test, wherein the bare metal is obtained by splicing the power board and the control board that have passed the test;

[0424] A second output module 14 is used to output the reason why the bare metal test fails when the bare metal test fails;

[0425] A third testing module 15 is used to perform an aging test on the bare metal after the bare metal test passes;

[0426] The third output module 16 is used to perform a whole machine test on the whole machine through a whole machine test system after the aging test is completed, wherein the whole machine is obtained after the bare machine that has passed the test is packaged and glued;

[0427] The fourth test module 17 is used to output the reason why the whole machine test fails when the whole machine test fails;

[0428] The fourth output module 18 is used to output a prompt message indicating that the test is completed when the whole machine test passes.

[0429] As an optional implementation, the ATE test system is used to test whether the power board can perform AC / DC conversion normally, and to test whether the output of the power board is normal under different input voltages.

[0430] As an optional embodiment, the test items for the power board test performed by the ATE test system include at least one of the following test items: input current test, low voltage loading test, normal voltage loading test, normal voltage no-load test, normal voltage loading test and high voltage loading test.

[0431] As an optional implementation, the FCT test system is used to test whether there is a local short circuit on the control board and whether the chips in the control board operate normally.

[0432] As an optional implementation, the test items of the control board test performed by the FCT test system include at least one of the following test items: 5V loop input total current test, voltage test, device information reading test, FLASH storage test, real-time clock test, temperature sensor test, light sensor test, metering module communication status test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, watchdog test, RTC supercapacitor voltage test, real-time clock reading test after power off and restart, parameter configuration test and parameter reading test.

[0433] As an optional implementation, the bare metal testing system is used to test abnormal operation of the hardware in the control board after the power board in the bare metal supplies power to the control board.

[0434] As an optional implementation, the test items for bare metal testing performed by the bare metal testing system include at least one of the following test items: device information reading test, temperature sensor test, light sensor test, measurement calibration and test, output voltage and current calibration and test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, real-time clock test, power-off capacitor function test and QR code printing test.

[0435] As an optional implementation, the whole machine testing system is used to test whether there is a cold solder joint or a malfunctioning device in the whole machine.

[0436] As an optional implementation, the test items for the whole machine test performed by the whole machine test system include at least one of the following test items: device information reading, temperature sensor test, light sensor test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, real-time clock test, power-off capacitor function test and power reset setting test.

[0437] In an exemplary embodiment, a computer device is provided. The computer device may be a server or a terminal. The internal structure diagram thereof may be as follows: Figure 6 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store data required for the Internet of Things power supply test. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a method for testing the power supply of the Internet of Things is implemented.

[0438] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0439] In an exemplary embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0440] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0441] In an exemplary embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0442] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0443] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0444] The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., but is not limited thereto. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but is not limited thereto.

[0445] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0446] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A method for testing an Internet of Things power supply, characterized in that: The Internet of Things power supply testing method comprises: The power board in the IoT power supply is tested by the ATE test system, and the control board in the IoT power supply is tested by the FCT test system; When the power board test fails, the reason why the power board test fails is output; when the control board test fails, the reason why the control board test fails is output; After the power board and the control board are both tested and passed, a bare metal test is performed on the bare metal through a bare metal test system, wherein the bare metal is obtained by splicing the power board and the control board that have passed the test; When the bare metal test fails, outputting the reason why the bare metal test fails; After the bare metal test passes, performing an aging test on the bare metal; After the aging test is completed, the whole machine is tested by a whole machine testing system, wherein the whole machine is obtained by casing and filling the bare machine after passing the test; When the whole machine test fails, outputting the reason why the whole machine test fails; When the whole machine test passes, a prompt message indicating that the test is completed is output.

2. The Internet of Things power supply testing method according to claim 1, characterized in that: The ATE test system is used to test whether the power board can perform AC / DC conversion normally, and to test whether the output of the power board is normal under different input voltages.

3. The Internet of Things power supply testing method according to claim 2, characterized in that: The test items of the power board test performed by the ATE test system include at least one of the following test items: input current test, low voltage loading test, normal voltage loading test, normal voltage no-load test, normal voltage loading test and high voltage loading test.

4. The Internet of Things power supply testing method according to claim 1, characterized in that: The FCT test system is used to test whether there is a local short circuit on the control board and whether the chips in the control board operate normally.

5. The Internet of Things power supply testing method according to claim 4, characterized in that: The test items of the control board test performed by the FCT test system include at least one of the following test items: 5V loop input total current test, voltage test, device information reading test, FLASH storage test, real-time clock test, temperature sensor test, light sensor test, metering module communication status test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, watchdog test, RTC supercapacitor voltage test, real-time clock reading test after power off and restart, parameter configuration test and parameter reading test.

6. The Internet of Things power supply testing method according to claim 1, characterized in that: The bare metal testing system is used to test abnormal operation of the hardware in the control board after the power board in the bare metal supplies power to the control board.

7. The Internet of Things power supply testing method according to claim 6, characterized in that: The test items for bare metal testing performed by the bare metal testing system include at least one of the following test items: device information reading test, temperature sensor test, light sensor test, measurement calibration and test, output voltage and current calibration and test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, real-time clock test, power-off capacitor function test and QR code printing test.

8. The Internet of Things power supply testing method according to claim 1, characterized in that: The whole machine testing system is used to test whether there is a cold solder joint or a malfunction of a device in the whole machine.

9. The Internet of Things power supply testing method according to claim 8, characterized in that: The test items for the whole machine test system to perform whole machine test include at least one of the following test items: device information reading, temperature sensor test, light sensor test, dimming output test, three-axis sensor test, human body sensing test, IMEI reading test, ICCID reading test, communication module network attachment test, signal strength test, real-time clock test, power-off capacitor function test and power reset setting test.

10. An Internet of Things power supply testing device, characterized in that: The Internet of Things power supply testing device comprises: The first test module is used to perform a power board test on the power board in the IoT power supply through an ATE test system, and to perform a control board test on the control board in the IoT power supply through an FCT test system; A first output module, configured to output the reason why the power board test fails when the power board test fails; and to output the reason why the control board test fails when the control board test fails; A second testing module is used to perform a bare metal test on a bare metal through a bare metal testing system after both the power board and the control board have passed the test, wherein the bare metal is obtained by splicing the power board and the control board that have passed the test; A second output module, configured to output a reason why the bare metal test fails when the bare metal test fails; A third testing module is used to perform an aging test on the bare metal after the bare metal test passes; A third output module is used to perform a whole machine test on the whole machine through a whole machine test system after the aging test is completed, wherein the whole machine is obtained after the bare machine that has passed the test is packaged and glued; A fourth test module, configured to output a reason why the whole machine test fails when the whole machine test fails; The fourth output module is used to output a prompt message indicating that the test is completed when the whole machine test passes.

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