Sample analysis system and control method thereof

Abstract

The invention discloses a sample analysis system and a control method thereof.The sample analysis system comprises a first buffer unit, at least one second buffer unit, a sample injection unit and a control unit, the control unit is used for controlling the first buffer unit to push a first test tube rack in a first buffer area to a first conveying mechanism, and controlling the second buffer unit to push a second test tube rack in a second buffer area to a second conveying mechanism; the first conveying mechanism is controlled to move the first test tube rack to the avoiding area in the direction opposite to the sample injection direction; the second test tube rack is pushed to the first conveying mechanism, the first conveying mechanism is controlled to drive the second test tube rack to move in the sample injection direction, so that the second test tube rack is moved to a third conveying mechanism corresponding to the sample analyzer capable of supporting detection, and the sample analyzer capable of supporting detection is used for detecting and analyzing a sample in the second test tube rack. According to the sample analysis system, the problem that the sequence of the test tube racks in the first buffer unit is inconsistent with the delivery sequence of the test tube racks can be effectively solved, and avoiding time can be saved through nearby avoiding of the track.

Description

Technical Field

[0001] The present application relates to the technical field of in vitro diagnosis, and in particular to a sample analysis system and a control method thereof. Background Art

[0002] The analyzers connected to the assembly line may have multiple combinations of configurations, which have a great impact on the execution and scheduling efficiency of the assembly line's test tube rack scheduling strategy. When the analyzers on the assembly line have the same configuration, the same allocation strategy is used for various types of test tube racks. However, when the analyzers have different configurations, different types of test tube racks have different matching degrees with analyzers with different configurations.

[0003] Currently, it often happens that among the test tube racks queued in the buffer, the test tube rack at the front does not match the configuration of the analyzer that can currently support detection, while the test tube rack at the back has a high matching degree for the analyzer that can currently support detection. However, due to the order of the test tube racks arranged in front and behind, the analyzer with a low matching degree receives the test tube rack for analysis and processing. Or when the analyzer and the test tube rack do not match and cannot be dispatched, the analyzer or the test tube rack is forced to wait.

[0004] Therefore, in the current sample analysis system, the arrangement order of the test tube racks in the buffer zone is inconsistent with the test tube rack delivery order planned by the assembly line scheduling system, resulting in low scheduling efficiency of the test tube racks. Summary of the invention

[0005] The present application provides a sample analysis system and a control method thereof to solve the technical problem in the prior art that the arrangement order of test tube racks in a buffer zone is inconsistent with the test tube rack dispatching order planned by a pipeline scheduling system, resulting in low scheduling efficiency of the test tube racks.

[0006] In order to solve the above technical problems, a technical solution adopted by the present application is: to provide a sample analysis system, which includes: a first buffer unit, including a first buffer zone and a first transport mechanism, a plurality of test tube racks arranged side by side are stacked in the first buffer zone, and the first transport mechanism is arranged on one side of the first buffer zone; at least one second buffer unit, arranged on one side of the first buffer unit, each second buffer unit includes a second buffer zone and an avoidance zone, the avoidance zone is arranged on one side of the second buffer zone, the avoidance zone is used to temporarily park the test tube racks in the first buffer zone, and the avoidance zone is arranged in the second transport mechanism; a sample injection unit, arranged on the other side of the first buffer unit, at least one sample analyzer is placed in the sample injection unit, and the sample injection unit includes a third transport mechanism; a control unit , connecting the first buffer unit, the second buffer unit and the injection unit, the control unit is used to: control the first buffer unit to push the first test tube rack in the first buffer zone to the first transport mechanism, control the first transport mechanism to move the first test tube rack to the avoidance zone in the opposite direction of the injection direction, wherein, in the first buffer zone, the second test tube rack is arranged later than the first test tube rack, and the dispatching priority of the second test tube rack is higher than that of the first test tube rack; control the first buffer unit to push the second test tube rack to the first transport mechanism, control the first transport mechanism to drive the second test tube rack to move along the injection direction, so as to move the second test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the second test tube rack.

[0007] Furthermore, the control unit is also used to: control the second transport mechanism to move the first test tube rack in the avoidance area directly along the injection direction to the first transport mechanism; control the first transport mechanism to drive the first test tube rack to continue to move along the injection direction, so as to move the first test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the first test tube rack.

[0008] Furthermore, other test tube racks are placed in the first buffer zone, and the order of the other test tube racks is later than that of the second test tube rack. The control unit is also used to: when it is confirmed that the dispatching priority of the other test tube racks is higher than that of the first test tube rack, control the first buffer unit to preferentially push the other test tube racks to the first transport mechanism, and control the first transport mechanism to drive the other test tube racks to move along the injection direction, so that the other test tube racks are moved to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the corresponding sample analyzer that can support detection can perform detection and analysis on the samples in the other test tube racks.

[0009] Furthermore, the control unit is also used to: when it is confirmed that the dispatch priority of other test tube racks is lower than that of the first test tube rack, control the second transport mechanism to move the first test tube rack directly to the first transport mechanism along the injection direction; control the first transport mechanism to drive the first test tube rack to continue to move along the injection direction, so that the first test tube rack is moved to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the first test tube rack.

[0010] Furthermore, the first buffer unit is a sample scanning buffer unit, the first buffer unit is used to scan the test tube rack, and the second buffer unit is a sample loading unit.

[0011] Furthermore, the control unit is also used to: determine whether the avoidance zone is in an idle state; when it is confirmed that the avoidance zone is in an idle state, execute the step of controlling the first buffer unit to push the first test tube rack in the first buffer zone onto the first transport mechanism.

[0012] Furthermore, the control unit is also used to: obtain the dispatch priority of all test tube racks in the first buffer zone; search for the test tube rack with the highest dispatch priority in the first buffer zone to obtain the second test tube rack; based on a preset algorithm, determine the avoidance test tube rack of the second test tube rack from the test tube racks arranged in front of the second test tube rack to obtain the first test tube rack, and then push the first test tube rack to the avoidance zone for avoidance.

[0013] Furthermore, the control unit is also used to: obtain scanning information of all test tube racks in the first buffer; calculate the matching degree between the scanning information of all test tube racks in the first buffer and the detection information of the sample analyzer that can support detection, so as to obtain the dispatch priority of all test tube racks in the first buffer.

[0014] Further, the sample is a blood sample and / or a body fluid sample.

[0015] To solve the above technical problems, another technical solution adopted in the present application is: to provide a control method for a sample analysis system, based on the sample analysis system of any of the above embodiments, the control method includes: controlling the first buffer unit to push the first test tube rack in the first buffer zone to the first transport mechanism, controlling the first transport mechanism to move the first test tube rack to the avoidance zone in the opposite direction of the injection direction, wherein, in the first buffer zone, the second test tube rack is arranged later than the first test tube rack, and the dispatching priority of the second test tube rack is higher than that of the first test tube rack; controlling the first buffer unit to push the second test tube rack to the first transport mechanism, controlling the first transport mechanism to drive the second test tube rack to move along the injection direction, so as to move the second test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the second test tube rack.

[0016] Beneficial effects of the present application: Different from the prior art, in the present application, when the test tube racks in the first buffer unit are being dispatched, if the test tube racks with a higher dispatch priority are not arranged at the front, the test tube racks arranged in the front can be moved to the avoidance area for temporary parking, so that the test tube racks arranged in the back can be dispatched first. In this way, the problem of the inconsistency between the order of the test tube racks in the first buffer unit and the dispatch order of the test tube racks can be effectively solved, so that the sample analyzer that can support detection can give priority to detecting the samples in the test tube racks with better matching degree. Moreover, by avoiding the track nearby, the transmission distance of the avoidance scheduling can also be shortened, saving avoidance time. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 It is a schematic diagram of a framework of an embodiment of a sample analysis system provided by the present application;

[0019] Figure 2 It is a structural schematic diagram of an embodiment of a sample analysis system provided by the present application;

[0020] Figure 3 is a structural schematic diagram of another embodiment of the sample analysis system provided by the present application;

[0021] Figure 4 yes Figure 2 A schematic diagram of the structure of another state of the sample analysis system;

[0022] Figure 5 yes Figure 2 A schematic diagram of the structure of another state of the sample analysis system;

[0023] Figure 6 yes Figure 2 A schematic diagram of the structure of another state of the sample analysis system;

[0024] Figure 7 It is a flow chart of an embodiment of a control method of a sample analysis system provided by the present application;

[0025] Figure 8 is a flow chart of another embodiment of the control method of the sample analysis system provided by the present application;

[0026] Fig. 9 is a flow chart of another embodiment of the control method of the sample analysis system provided by the present application;

[0027] Fig.10 yes Fig. 9 Schematic diagram of a flow chart of an embodiment of step S31 in FIG. DETAILED DESCRIPTION

[0028] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It is to be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some structures related to the present application are shown in the accompanying drawings, rather than all structures. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0029] The terms "first", "second", etc. in this application are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0030] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0031] See also Figure 1 and Figure 2 As shown, Figure 1 is a schematic diagram of a framework of an embodiment of a sample analysis system provided by the present application. Figure 2 1 is a schematic diagram of the structure of an embodiment of a sample analysis system provided in the present application. Specifically, the sample analysis system includes: a control unit 10 , a first buffer unit 11 , at least one second buffer unit 12 and a sample injection unit 13 .

[0032] At least one second buffer unit 12 is disposed on one side of the first buffer unit 11, and the injection unit 13 is disposed on the other side of the first buffer unit 11. Figure 2 As shown, at least one second buffer unit 12, the first buffer unit 11 and the injection unit 13 are arranged along the injection direction A.

[0033] The first buffer unit 11 includes a first buffer area 112 and a first transport mechanism 111. The first transport mechanism 111 is disposed at one side of the first buffer area 112. A plurality of test tube racks 20 to be dispatched are stacked in parallel in the first buffer area 112, that is, the test tube racks 20 to be dispatched are arranged in sequence along the conveying direction of the first buffer area 112. The first transport mechanism 111 is used to drive the test tube racks 20 to move along the injection direction A or in the opposite direction of the injection direction A. The first buffer unit 11 may be a sample scanning buffer unit in a sample analysis system.

[0034] The second buffer unit 12 is located at one side of the first buffer unit 11. The second buffer unit 12 includes a second buffer zone 122 and a avoidance zone 30 located at one side of the second buffer zone 122. A second transport mechanism 121 is provided in the avoidance zone 30. The avoidance zone 30 is used to temporarily park the test tube racks 20 in the first buffer zone 112. That is, the test tube racks 20 arranged in front of the first buffer unit 11 can be moved to the avoidance zone 30 for temporary parking to avoid the test tube racks 20 arranged behind them, so that the test tube racks 20 arranged behind them can be dispatched first.

[0035] Specifically, a second buffer unit 12 on one side of the first buffer unit 11 may be provided with an avoidance zone 30. For example, the first buffer unit 11 may be a sample scanning buffer unit. The second buffer unit 12 is a sample loading unit adjacent to the sample scanning buffer unit, and the sample loading unit is used to load the test tube rack 20. A second transport mechanism 121 may be provided in the sample loading unit as the avoidance zone 30. In this way, the normal operation of other modules of the sample analysis system is not affected, and the test tube rack 20 with a higher dispatch priority is given priority. Moreover, by avoiding nearby, the transmission distance of the avoidance scheduling can be shortened, saving the avoidance time and improving the detection efficiency.

[0036] In other embodiments, Figure 3 As shown, when there are multiple second buffer units 12 on one side of the first buffer unit 11, the avoidance area 30 can be set in the multiple second buffer units 12. For example, the first buffer unit 11 is a sample scanning buffer unit, and multiple sample loading units are arranged on one side of the first buffer unit 11. The avoidance area 30 can be set in the multiple sample loading units, which can be set according to actual needs and is not specifically limited here.

[0037] The sample injection unit 13 is disposed at the other side of the first buffer unit 11 . The sample injection unit 13 includes at least one sample analyzer, which is used to detect and analyze the samples in the test tube rack 20 . The sample injection unit 13 also includes a third transport mechanism 131 .

[0038] Among them, the second buffer unit 12, the first buffer unit 11 and the injection unit 13 are arranged along the injection direction A, and the first transport mechanism 111, the second transport mechanism 121 and the third transport mechanism 131 are arranged side by side, so that the tracks in each transport mechanism can be connected to form a sample transmission channel.

[0039] The control unit 10 is connected to the second buffer unit 12, the first buffer unit 11 and the sample injection unit 13. The control unit 10 can be used to implement the control method of the sample analysis system of any of the following embodiments. Specifically, in some embodiments, Figure 7 As shown, the control method includes:

[0040] S11: Control the first buffer unit to push the first test tube rack in the first buffer zone onto the first transport mechanism, and control the first transport mechanism to move the first test tube rack to the avoidance zone in the opposite direction of the injection direction, wherein, in the first buffer zone, the second test tube rack is arranged later than the first test tube rack, and the dispatching priority of the second test tube rack is higher than that of the first test tube rack.

[0041] like Figure 2 As shown, a plurality of test tube racks 20 are arranged in the first buffer 112, and the plurality of test tube racks 20 include a first test tube rack 21 and a second test tube rack 22. The second test tube rack 22 is arranged later than the first test tube rack 21 in the first buffer 112, but the dispatching priority of the second test tube rack 22 is higher than that of the first test tube rack 21. The dispatching priority of the second test tube rack 22 is higher than that of the first test tube rack 21, which means that the matching degree between the detection items of the samples in the second test tube rack 22 and the detection mode of the sample analyzer that can support the detection is higher than the matching degree between the first test tube rack 21 and the sample analyzer; in this embodiment, the first test tube rack 21 includes the test tube rack closest to the first transport mechanism 111 in the first buffer 112.

[0042] When scheduling the test tube rack 20, the control unit 10 can control the first buffer unit 11 to push the first test tube rack 21 in the first buffer zone 112 onto the first transport mechanism 111. Specifically, a pushing member (not shown) can be provided in the first buffer zone 112. The control unit 10 connects the pushing member and controls the pushing member to move the first test tube rack 21 onto the first transport mechanism 111.

[0043] like Figure 4 As shown, after the first test tube rack 21 is pushed onto the first transport mechanism 111, the control unit 10 controls the first transport mechanism 111 to move the first test tube rack 21 in the opposite direction of the injection direction A to the avoidance zone 30 on one side of the first transport mechanism 111, so that the first test tube rack 21 temporarily stops in the avoidance zone 30. In this way, the second test tube rack 22 that needs to be dispatched first can be located at the front position in the first buffer zone 112.

[0044] Optionally, in some embodiments, when there are multiple test tube racks 20 in front of the second test tube rack 22, an avoidance test tube rack 20 can be obtained as the first test tube rack 21 according to a preset algorithm. When avoiding, the obtained avoidance test tube rack 20 is moved to the avoidance area 30 for avoidance. For details of this embodiment, please refer to the introduction of the following embodiment, which will not be repeated here.

[0045] Optionally, in other embodiments, multiple test tube racks 20 are arranged in front of the second test tube rack 22 with a higher dispatch priority. When the space in the avoidance zone 30 is sufficient, all the test tube racks 20 arranged in front of the second test tube rack 22 can be used as the first test tube rack 21, that is, when avoiding, the multiple first test tube racks 21 in front of the second test tube rack 22 can be moved to the avoidance zone 30 for avoidance. In this way, the test tube racks 20 arranged at the back can be dispatched faster and with priority, thereby improving the detection efficiency.

[0046] S12: Control the first buffer unit to push the second test tube rack onto the first transport mechanism, control the first transport mechanism to drive the second test tube rack to move along the injection direction, so as to move the second test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the second test tube rack.

[0047] like Figure 5 As shown, after the first test tube rack 21 is moved to the avoidance area 30, the control unit 10 controls the pushing member in the first buffer zone 112 to push the second test tube rack 22 onto the first transport mechanism 111, and the control unit 10 controls the first transport mechanism 111 to drive the second test tube rack 22 to move along the injection direction A, so that the second test tube rack 22 moves to the third moving mechanism 131 corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can give priority to the second test tube rack 22 that has a higher matching degree with it.

[0048] Alternatively, if Figure 6 As shown, when the first test tube rack 21 in the avoidance zone 30 is dispatched, the first test tube rack 21 can be dispatched directly from the avoidance zone 30 along the injection direction, without returning the first test tube rack 21 to the first buffer zone 112. Specifically, the control unit 10 controls the second transport mechanism 121 to move the first test tube rack 21 from the avoidance zone 30 to the first transport mechanism 111, and the control unit 10 controls the first transport mechanism 111 to continue to move the first test tube rack 21 along the injection direction A to the third transport mechanism 131 corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can detect the sample in the first test tube rack 21.

[0049] In the above embodiment, when the test tube racks 20 in the first buffer unit 11 are dispatched, if the test tube rack 20 with a higher dispatch priority is not arranged at the front, the test tube rack 20 arranged in the front can be moved to the avoidance area 30 for temporary parking, so that the test tube rack 20 arranged at the back can be dispatched first. In this way, the problem of the inconsistency between the order of the test tube racks 20 in the first buffer unit 11 and the dispatch order of the test tube racks 20 can be effectively solved, so that the sample analyzer that can support detection can give priority to detecting the samples in the test tube rack 20 with a better matching degree. In addition, by avoiding the nearest track, the transmission distance of the avoidance scheduling can also be shortened, saving the avoidance time.

[0050] In another implementation, Figure 8 As shown, the control method may also include:

[0051] S21: Determine whether the avoidance zone is in an idle state.

[0052] Before performing the avoidance operation of the test tube rack 20, the control unit 10 first determines whether the avoidance zone 30 is in an idle state, where the idle state means that there is no test tube rack 20 in the avoidance zone 30 or the remaining space in the avoidance zone 30 is sufficient to accommodate a new test tube rack 20. When the control unit 10 confirms that the avoidance zone 30 is not in an idle state, the avoidance operation of the test tube rack 20 is not performed. When the control unit 10 confirms that the avoidance zone 30 is in an idle state, the following step S22 can be performed. In this way, the avoidance operation can be performed only when the avoidance zone 30 is idle, thereby improving the reliability of the operation of the sample analysis system.

[0053] S22: If yes, control the first buffer unit to push the first test tube rack in the first buffer zone onto the first transport mechanism, and control the first transport mechanism to move the first test tube rack to the avoidance zone in the opposite direction of the injection direction, wherein, in the first buffer zone, the second test tube rack is arranged later than the first test tube rack, and the dispatching priority of the second test tube rack is higher than that of the first test tube rack.

[0054] Step S22 is the same as step S11 and will not be described again.

[0055] S23: Control the first buffer unit to push the second test tube rack onto the first transport mechanism, control the first transport mechanism to drive the second test tube rack to move along the injection direction, so as to move the second test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the second test tube rack.

[0056] Step S23 is the same as step S12 and will not be described again.

[0057] S24: When it is confirmed that the dispatching priority of other test tube racks is higher than that of the first test tube rack, the first buffer unit is controlled to push the other test tube racks to the first transport mechanism first, and the first transport mechanism is controlled to drive the other test tube racks to move along the injection direction, so that the other test tube racks are moved to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the samples in the other test tube racks.

[0058] After the second test tube rack 22 is dispatched, the control unit 10 can prioritize the dispatch of other test tube racks 20 in the first buffer zone 112 as needed. When the control unit 10 confirms that the dispatch priority of other test tube racks 20 is higher than that of the first test tube rack 21, the first test tube rack 21 can continue to be docked in the avoidance zone 30, and the control unit 10 controls the pusher in the first buffer zone 112 to push other test tube racks 20 onto the first transport mechanism 111, and controls the first transport mechanism 111 to drive other test tube racks 20 to move along the injection direction A, so that other test tube racks 20 move to the third transport mechanism 131 corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can detect and analyze the samples in other test tube racks 20.

[0059] S25: When it is confirmed that the dispatching priority of other test tube racks is lower than that of the first test tube rack, the second transport mechanism is controlled to move the first test tube rack directly onto the first transport mechanism along the injection direction; the first transport mechanism is controlled to drive the first test tube rack to continue to move along the injection direction, so that the first test tube rack is moved to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the first test tube rack.

[0060] After the second test tube rack 22 is dispatched, the control unit 10 can compare the dispatch priority of the first test tube rack 21 with the dispatch priority of other test tube racks 20. When the control unit 10 confirms that the dispatch priority of other test tube racks 20 is lower than that of the first test tube rack 20, the control unit 10 starts to dispatch the first test tube rack 21.

[0061] Specifically, the control unit 10 controls the second transport mechanism 121 to move the first test tube rack 21 onto the first transport mechanism 111; controls the first transport mechanism 111 to drive the first test tube rack 21 to move along the injection direction A, so that the first test tube rack 21 moves to the third transport mechanism 131 corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the first test tube rack 21.

[0062] The control unit 10 is used to drive the first test tube rack 21 to move along the injection direction A through the first transport mechanism 111, so that the first test tube rack 21 moves to the third moving mechanism 131 corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can detect the first test tube rack 22 that has a higher matching degree with it.

[0063] In this embodiment, the control unit 10 determines whether to perform the avoidance operation according to the state of the avoidance zone 30, thereby improving the reliability of the sample analysis system. When the test tube rack 20 in the first buffer unit 11 is being dispatched, if the test tube rack 20 with a higher dispatch priority is not arranged at the front, the test tube rack 20 arranged in the front can be moved to the avoidance zone 30 for temporary parking, so that the test tube rack 20 arranged in the back can be dispatched first. Moreover, when the front test tube rack 20 is located in the avoidance zone 30, other test tube racks 20 can also be dispatched first as needed. When there is no test tube rack 20 that needs to be dispatched first, the test tube rack 20 in the avoidance zone 30 can be dispatched. In this way, the problem of inconsistency between the order of the test tube rack 20 in the first buffer unit 11 and the dispatch order of the test tube rack 20 can be effectively solved, so that the sample analyzer that can support detection can detect the sample in the test tube rack 20 with better matching degree. Moreover, by avoiding the track nearby, the transmission distance of the avoidance scheduling can also be shortened, saving the avoidance time.

[0064] In another implementation, Fig. 9 As shown, the control method may also include:

[0065] S31: Obtain the dispatching priorities of all test tube racks in the first buffer zone.

[0066] The control unit 10 obtains the dispatching priorities of all the test tube racks 20 in the first buffer zone 112. For example, there are 5 test tube racks 20 in the first buffer zone 112, and the control unit 10 obtains the dispatching priorities of the 5 test tube racks 20.

[0067] like Fig.10 As shown, in a specific embodiment, the step S31 of obtaining the dispatching priorities of all the test tube racks 20 in the first buffer zone 112 may further include:

[0068] S311: Obtain scanning information of all test tube racks in the first buffer zone.

[0069] The control unit 10 may control the first buffer unit 11 to scan all the test tube racks 20 entering the first buffer zone 112 to obtain scanning information of all the test tube racks 20. Specifically, the scanning information of the test tube racks 20 may include: the number of the test tube rack 20 and the corresponding items to be detected.

[0070] S312: Calculate the matching degree between the scanning information of all the test tube racks in the first buffer and the detection information of the sample analyzer that can support detection, so as to obtain the dispatching priority of all the test tube racks in the first buffer.

[0071] After obtaining the scanning information of all the test tube racks 20 in the first buffer 112 , the control unit 10 calculates the matching degree between the scanning information of all the test tube racks 20 in the first buffer 112 and the detection information of the sample analyzer that can support detection, so as to obtain the dispatching priority of all the test tube racks 20 in the first buffer 112 .

[0072] In the sample analysis system, different sample analyzers may have different detection information, and the detection information here refers to the item detection that the sample analyzer can perform. The test tube rack 20 arranged at the front in the first buffer 112 may have a low matching degree with the sample analyzer that can support the detection. In this way, the test tube rack 20 with the highest matching degree with the supported sample analysis can be obtained, so as to facilitate subsequent priority delivery.

[0073] S32: Searching for the test tube rack with the highest dispatch priority in the first buffer zone to obtain the second test tube rack.

[0074] After obtaining the dispatching priorities of all the test tube racks 20 in the first buffer 112 , the control unit 10 searches for the test tube rack 20 with the highest dispatching priority, and uses the test tube rack 20 as the second test tube rack 22 that needs to be dispatched first.

[0075] S33: Based on a preset algorithm, determine an avoidance test tube rack of the second test tube rack from the test tube racks arranged in front of the second test tube rack to obtain the first test tube rack, and then push the first test tube rack to the avoidance area for avoidance.

[0076] After obtaining the second test tube rack 22 with the highest dispatch priority, the control unit 10 determines the test tube rack 20 that needs to be avoided from the test tube racks 20 arranged in front of the second test tube rack 22 through a preset algorithm, and uses the test tube rack 20 that needs to be avoided as the first test tube rack 21 .

[0077] Specifically, the control unit 10 may select the test tube rack 20 with the lowest matching degree with the sample analyzer that can be supported for detection among the test tube racks 20 arranged in front of the second test tube rack as the first test tube rack 21, so that other test tube racks 20 can also be dispatched with priority. In other embodiments, the control unit 10 may select the test tube rack 20 with the matching degree with the sample analyzer that can be supported for detection second only to the second test tube rack 22 among the test tube racks 22 arranged in front of the second test tube rack 22 as the first test tube rack 21, so that after the second test tube rack 22 is dispatched, the first test tube rack 21 can be dispatched immediately from the avoidance area 30, thereby improving the detection efficiency of the sample analysis system.

[0078] S34: Control the first buffer unit to push the first test tube rack in the first buffer zone onto the first transport mechanism, and control the first transport mechanism to move the first test tube rack to the avoidance zone in the opposite direction of the injection direction, wherein, in the first buffer zone, the second test tube rack is arranged later than the first test tube rack, and the dispatching priority of the second test tube rack is higher than that of the first test tube rack.

[0079] Step S34 is the same as step S11 and will not be described again.

[0080] S35: Control the first buffer unit to push the second test tube rack onto the first transport mechanism, control the first transport mechanism to drive the second test tube rack to move along the injection direction, so as to move the second test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the second test tube rack.

[0081] Step S35 is the same as step S12 and will not be described again.

[0082] In this embodiment, the control unit 10 first determines the second test tube rack 22 with the highest dispatch priority. Since there may be more than one test tube rack 20 arranged in front of the second test tube rack 22, the control unit 10 selects the first test tube rack 21 that needs to be avoided from the test tube racks 20 in front of the second test tube rack 22 according to a preset algorithm. When dispatching the test tube rack 20, the control unit 10 moves the first test tube rack 21 to the avoidance area 30 for temporary parking, so that the second test tube rack 22 arranged behind is dispatched first. In this way, the problem of inconsistency between the order of the test tube racks 20 in the first buffer unit 11 and the dispatch order of the test tube racks 20 can be effectively solved, so that the sample analyzer that can support detection can give priority to detecting the samples in the test tube rack 20 with better matching degree. Moreover, by avoiding the nearest track, the transmission distance of the avoidance scheduling can also be shortened, saving the avoidance time.

[0083] The sample analysis system may be a blood sample analysis system, and the sample is a blood sample. In other embodiments, the sample analysis system may also be other body fluid analysis systems, and the sample is other body fluids, such as sweat, saliva, or urine, etc., which are not listed here one by one.

[0084] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A sample analysis system, characterized in that: The sample analysis system comprises: A first buffer unit includes a first buffer area and a first transport mechanism, wherein a plurality of test tube racks arranged side by side are stacked in the first buffer area, and the first transport mechanism is arranged at one side of the first buffer area; At least one second buffer unit is arranged at one side of the first buffer unit, each of the second buffer units includes a second buffer area and an avoidance area, the avoidance area is arranged at one side of the second buffer area, the avoidance area is used to temporarily park the test tube rack in the first buffer area, and a second transport mechanism is arranged in the avoidance area; A sample injection unit, disposed at the other side of the first buffer unit, the sample injection unit comprising at least one sample analyzer and a third transport mechanism; A control unit is connected to the first buffer unit, the second buffer unit and the injection unit, and the control unit is used for: Controlling the first buffer unit to push the first test tube rack in the first buffer area onto the first transport mechanism, and controlling the first transport mechanism to move the first test tube rack to the avoidance area in the opposite direction of the injection direction, wherein in the first buffer area, the second test tube rack is arranged later than the first test tube rack, and the dispatching priority of the second test tube rack is higher than that of the first test tube rack; Control the first buffer unit to push the second test tube rack onto the first transport mechanism, and control the first transport mechanism to drive the second test tube rack to move along the injection direction, so as to move the second test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the second test tube rack.

2. The sample analysis system according to claim 1, characterized in that: The control unit is also used for: Controlling the second transport mechanism to move the first test tube rack in the avoidance area directly along the injection direction to the first transport mechanism; The first transport mechanism is controlled to drive the first test tube rack to continue to move along the injection direction, so as to move the first test tube rack to a third transport mechanism corresponding to a sample analyzer capable of supporting detection, so that the sample analyzer capable of supporting detection can perform detection and analysis on the sample in the first test tube rack.

3. The sample analysis system according to claim 1, characterized in that: Other test tube racks are placed in the first buffer area, and the order of the other test tube racks is later than that of the second test tube rack. The control unit is further used for: When it is confirmed that the dispatching priority of the other test tube racks is higher than that of the first test tube rack, the first buffer unit is controlled to preferentially push the other test tube racks to the first transport mechanism, and the first transport mechanism is controlled to drive the other test tube racks to move along the injection direction, so that the other test tube racks are moved to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the corresponding sample analyzer that can support detection can perform detection and analysis on the samples in the other test tube racks.

4. The sample analysis system according to claim 3, characterized in that: The control unit is also used for: When it is confirmed that the dispatching priority of the other test tube racks is lower than that of the first test tube rack, the second transport mechanism is controlled to move the first test tube rack directly onto the first transport mechanism along the injection direction; the first transport mechanism is controlled to drive the first test tube rack to continue to move along the injection direction, so that the first test tube rack is moved to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the first test tube rack.

5. The sample analysis system according to claim 1, characterized in that: The first buffer unit is a sample scanning buffer unit, and the first buffer unit is used to scan the test tube rack, and the second buffer unit is a sample loading unit.

6. The sample analysis system according to claim 1, characterized in that: The control unit is also used for: Determining whether the avoidance zone is in an idle state; When it is confirmed that the avoidance zone is in an idle state, the step of controlling the first buffer unit to push the first test tube rack in the first buffer zone onto the first transport mechanism is performed.

7. The sample analysis system according to claim 1, characterized in that: The control unit is also used for: Obtaining the dispatching priorities of all test tube racks in the first buffer zone; Searching for the test tube rack with the highest dispatch priority in the first buffer zone to obtain the second test tube rack; Based on a preset algorithm, an avoidance test tube rack is determined from the test tube racks arranged in front of the second test tube rack to obtain the first test tube rack, and then the first test tube rack is pushed to the avoidance area for avoidance.

8. The sample analysis system according to claim 7, characterized in that: The control unit is also used for: Obtaining scanning information of all test tube racks in the first buffer zone; The matching degree between the scanning information of all the test tube racks in the first buffer and the detection information of the sample analyzer that can support detection is calculated to obtain the dispatching priority of all the test tube racks in the first buffer.

9. The sample analysis system according to claim 1, characterized in that: The sample is a blood sample and / or a body fluid sample.

10. A control method for a sample analysis system, characterized in that: The sample analysis system according to any one of claims 1 to 9, wherein the control method comprises: Controlling the first buffer unit to push the first test tube rack in the first buffer zone onto the first transport mechanism, and controlling the first transport mechanism to move the first test tube rack to the avoidance zone in the opposite direction of the injection direction, wherein in the first buffer zone, the second test tube rack is arranged later than the first test tube rack, and the dispatching priority of the second test tube rack is higher than that of the first test tube rack; Control the first buffer unit to push the second test tube rack onto the first transport mechanism, and control the first transport mechanism to drive the second test tube rack to move along the injection direction, so as to move the second test tube rack to the third transport mechanism corresponding to the sample analyzer that can support detection, so that the sample analyzer that can support detection can perform detection and analysis on the sample in the second test tube rack.

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