Graphic chip test sorting machine

Abstract

The invention relates to a graphic chip testing and sorting machine, which comprises a loading part for carrying out a loading process of loading a graphic chip to be tested; the unloading part is used for carrying out an unloading process of unloading the tested graphic chip; the testing part is used for testing the graphic chip to be tested; the loading part is used for loading a graphic chip, the unloading part is used for unloading the graphic chip, the caching part is used for transferring the graphic chip between the loading part and the testing part and transferring the graphic chip between the unloading part and the testing part, and the testing part comprises a commercial graphic card which is the same as an actually used graphic card; and the contact unit is used for connecting the graphic chip to be tested to the commercial graphic card.

Description

Technical Field

[0001] The present invention relates to a graphics chip test sorting machine which tests chips for mounting on a graphics card to classify them according to grades. Background Art

[0002] A chip for mounting on a graphics card (hereinafter referred to as a "graphics chip") is manufactured through various processes. For example, the graphics chip undergoes various processes such as a test process by a sorting machine such as a test sorter and is sorted by grade.

[0003] The test sorter is used to perform a loading process, a testing process, and an unloading process of a graphics chip. The loading process is a process in which the test sorter loads a graphics chip from a user tray to a testing section. The testing process is a process in which the test sorter connects a graphics chip stored in a test tray to a testing section. The testing section is used to perform a predetermined test on the graphics chip. The unloading process is a process in which the test sorter unloads the graphics chip from the testing section to the user tray. At this time, the test sorter classifies the graphics chips according to the level based on the test results.

[0004] A graphics chip test handler in the prior art connects a graphics chip to a test graphics card that simulates a graphics card actually used (hereinafter referred to as a "commercial graphics card") to perform a test process of the graphics chip. Therefore, when a graphics chip tested by a graphics chip test handler in the prior art is mounted on a commercial graphics card for use, there is a difference between the actual performance of the graphics chip and the test result of the test process. Summary of the invention

[0005] Technical issues

[0006] The present invention aims to solve the above-mentioned problems, and its purpose is to provide a graphics chip test sorting machine that can reduce the performance deviation between the graphics chip installed in a commercial graphics card and the graphics chip under test.

[0007] Technical Solution

[0008] In order to solve the above-mentioned technical problems, the present invention may include the following configurations.

[0009] The present invention comprises: a loading part for performing a loading process of loading a graphics chip to be tested; an unloading part for performing an unloading process of unloading a tested graphics chip; a testing part for testing the graphics chip to be tested; and a buffer part for transferring the graphics chip between the loading part and the testing part and between the unloading part and the testing part. The testing part may comprise: a commercial graphics card, which is the same as the graphics card actually used; and a contact unit for connecting the graphics chip to be tested to the commercial graphics card.

[0010] Beneficial Effects

[0011] According to the present invention, the following effects can be achieved.

[0012] The present invention can use the commercial graphics card and the contact unit that are the same as the graphics card actually used to test the graphics chip. Therefore, the present invention can test the graphics chip in the same environment as the actual use environment, thereby reducing the performance deviation between the graphics chip when installed in the commercial graphics card and the graphics chip when tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a schematic block diagram of the graphics chip test sorting machine of the present invention.

[0014] Figure 2 It is a schematic top view of the graphics chip testing and sorting machine of the present invention.

[0015] Figure 3 It is a schematic top view of the test section in the graphics chip test handler of the present invention.

[0016] Figure 4 It is a schematic top view of a commercial graphics card installed in a test section of a graphics chip test and sorting machine according to the present invention.

[0017] Figure 5 It is a schematic cross-sectional view of a test section in a graphics chip test handler according to the present invention.

[0018] Figure 6 yes Figure 5 Magnified view of part A in FIG.

[0019] Figure 7 yes Figure 5 Magnified view of part B.

[0020] Figure 8 This is a schematic cross-sectional view showing a state in which an opening and closing portion of a test pickup in a graphics chip test handler according to the present invention is located at a closed position.

[0021] Fig. 9 This is a schematic cross-sectional view showing a state in which the opening and closing portion of the test pickup in the graphics chip test handler of the present invention is located at an open position.

[0022] Fig.10 This is a schematic cross-sectional view showing a state where a moving unit in the graphic chip test handler of the present invention is located at a contact position.

[0023] Fig.11 This is a schematic cross-sectional view showing a state in which a moving unit in a graphics chip test handler according to the present invention is located at a standby position.

[0024] Fig.12 It is a schematic cross-sectional view of a sealing member disposed on the upper surface of a test body and the lower surface of a moving unit in a graphic chip test handler of the present invention.

[0025] Fig.13 It is a schematic top view of a plurality of test slots in the graphics chip test handler of the present invention.

[0026] Fig.14 It is a schematic top view of multiple cache slots in the graphics chip test sorting machine of the present invention.

[0027] Reference numerals:

[0028] 1: Graphics chip test sorting machine 10: Graphics chip

[0029] 11: Fixed rail 12: Test fixed rail

[0030] 2: Loading unit 21: Loading stacker

[0031] 22: Loading Picker 23: Loading Guide

[0032] 3: Unloading unit 31: Unloading stacker

[0033] 32: Uninstall Picker 33: Uninstall Cache

[0034] 34: Unloading guide rail 4: Testing department

[0035] 41: Commercial Graphics Card 411: Chip Installation

[0036] 4111: first chip mounting portion 4112: second chip mounting portion

[0037] 4113: Third chip mounting portion 42: Contact unit

[0038] 421: Pressurizing component 422: Limiting component

[0039] 43: Test body 431: Boss component

[0040] 44: Test slot 441: First test slot

[0041] 442: Second test slot 443: Third test slot

[0042] 45: Test hole 46: Test lock

[0043] 47: Lock button 48: Mobile unit

[0044] 49: Sealing component 5: Buffer

[0045] 51: Socket cache 52: Cache slot

[0046] 521: First cache slot 522: Second cache slot

[0047] 523: Third cache slot 53: Test picker

[0048] 531: Opening and closing part 54: Cache rail

[0049] 55: Test rail 100: User tray DETAILED DESCRIPTION

[0050] Hereinafter, an embodiment of a graphics chip test and sorting machine according to the present invention will be described in detail with reference to the accompanying drawings.

[0051] refer to Figure 1 and Figure 2 The graphics chip test sorting machine 1 of the present invention tests the graphics chip (Graphic Chip) 10 for installation on the graphics card, and classifies them according to the test results.

[0052] The graphics chip test and sorting machine 1 of the present invention comprises: a loading part 2 for performing a loading process of loading a graphics chip 10 to be tested; an unloading part 3 for performing an unloading process of unloading a tested graphics chip 10; a testing part 4 for testing the graphics chip 10 to be tested; and a buffer part 5 for transferring the graphics chip 10 between the loading part 2 and the testing part 4 and transferring the graphics chip 10 between the unloading part 3 and the testing part 4. The testing part 4 comprises: a commercial graphics card 41, which is the same as the graphics card actually used; and a contact unit 42, which is used to connect the graphics chip 10 to be tested to the commercial graphics card 41. Therefore, the graphics chip test and sorting machine 1 of the present invention can use the commercial graphics card 41 and the contact unit 42, which are the same as the graphics card actually used, to inspect the graphics chip 10. Therefore, the graphics chip test and sorting machine 1 of the present invention can test the graphics chip 10 in the same environment as the actual use environment, thereby reducing the performance deviation between the graphics chip 10 when installed on the commercial graphics card 41 and the graphics chip 10 when tested.

[0053] Hereinafter, the loading unit 2, the unloading unit 3, the testing unit 4 and the buffer unit 5 will be described in detail with reference to the accompanying drawings. Figure 5 .

[0054] refer to Figure 1 and Figure 2 The graphic chip testing and sorting machine 1 of the present invention may include the loading part 2 .

[0055] refer to Figure 1 and Figure 2 The loading unit 2 is used to perform a loading process of the graphics chip 10. The loading unit 2 can perform the loading process of loading the graphics chip 10 to be tested into the cache unit 5.

[0056] refer to Figure 1 and Figure 2 The loading portion 2 may include a loading stacker 21 and a loading picker 22 .

[0057] The loading stacker 21 is provided with a user tray 100 for storing the graphics chip 10 to be tested. The user tray 100 can carry a plurality of graphics chips 10. The loading stacker 21 can store a plurality of the user trays 100.

[0058] The loading picker 22 is used to pick up the graphics chip 10 to be tested from the user tray 100 located in the loading stacker 21 and store it in the cache unit 5. The loading picker 22 can pick up multiple graphics chips 10 at one time. The loading picker 22 can move along the first axis direction (X axis direction) and the second axis direction (Y axis direction). The first axis direction (X axis direction) and the second axis direction (Y axis direction) are axis directions orthogonal to each other. To this end, the graphics chip test sorting machine 1 of the present invention may include a fixed guide rail 11 and a loading guide rail 23. The fixed guide rail 11 is configured along the first axis direction (X axis direction). The loading guide rail 23 is configured along the second axis direction (Y axis direction) in a manner that crosses the fixed guide rail 11. The loading guide rail 23 and the fixed guide rail 11 may be orthogonal to each other. At this time, as the loading guide rail 23 moves along the first axis direction (X axis direction) along the fixed guide rail 11, the loading picker 22 can move back and forth along the first axis direction (X axis direction). In addition, the loading picker 22 can move back and forth along the second axis direction (Y axis direction) along the loading rail 23. The loading picker 22 can be lifted and lowered in a vertical direction. The vertical direction is an axis direction perpendicular to the first axis direction (X axis direction) and the second axis direction (Y axis direction). In addition, the loading picker 22 may include a rotating part (not shown) with a rotating function. The rotating part can rotate the loading picker 22 to a direction in which the graphics chip 10 can be received by the cache unit 5 after picking up the graphics chip 10.

[0059] refer to Figure 1 and Figure 2The unloading section 3 is used to perform an unloading process of the tested graphics chip 10. The unloading section 3 can perform the unloading process in a manner of unloading the tested graphics chip 10 from the cache section 5. The unloading section 3 can be spaced apart from the loading section 2 along the first axis direction (X axis direction).

[0060] The unloading portion 3 may include an unloading stacker 31 , an unloading buffer 33 , and an unloading picker 32 .

[0061] The unloading stacker 31 is provided with a user tray 100 for storing the tested graphics chips 10. The unloading stacker 31 can be provided with a plurality of the user trays 100. The tested graphics chips 10 can be carried to the user trays 100 located at different positions in the unloading stacker 31 according to the test results and the grade. At this time, the tested graphics chips 10 can be stored in the user trays 100 configured in the unloading stacker 31 facing a preset reference direction.

[0062] The unloading buffer 33 is arranged between the buffer section 5 and the unloading stacker 31. The unloading buffer 33 may include an unloading buffer slot (not shown), and the unloading buffer slot is used to receive the graphics chip 10 according to the reference direction. The unloading buffer slot can temporarily receive the graphics chip 10 moved from the buffer section 5 to the unloading stacker 31.

[0063] The unloading picker 32 is used to transfer the tested graphics chip 10 from the buffer section 5 to the user tray 100 of the unloading stacker 31 via the unloading buffer 33. The unloading picker 32 can pick up and transfer multiple graphics chips 10 at one time. The unloading picker 32 can move along the first axis direction (X axis direction) and the second axis direction (Y axis direction). To this end, the graphics chip test sorting machine 1 of the present invention may include an unloading guide rail 34. The unloading guide rail 34 is configured along the second axis direction (Y axis direction) in a manner that crosses the fixed guide rail 11. The unloading guide rail 34 can be orthogonal to the fixed guide rail 11. At this time, as the unloading guide rail 34 moves along the fixed guide rail 11 along the first axis direction (X axis direction), the unloading picker 32 can move back and forth along the first axis direction (X axis direction). In addition, the unloading picker 32 can move back and forth along the unloading guide rail 34 along the second axis direction (Y axis direction). The unloading picker 32 can be lifted and lowered along the vertical direction. In addition, the unloading picker 32 may include a rotating part (not shown) having a rotating function. The rotating part enables the unloading picker 32 to rotate to a direction in which the graphics chip 10 can be received by the unloading buffer 33 after picking up the graphics chip 10. Therefore, the unloading picker 32 can selectively rotate the graphics chip 10 picked up from the buffer 5 in a manner that makes the direction of the graphics chip 10 consistent with the reference direction, and then receive it in the unloading buffer slot. Therefore, the graphics chip test sorting machine 1 of the present invention can receive the graphics chip 10 in the unloading buffer 33 in a manner that is arranged in the same direction as the reference direction before receiving the graphics chip 10 in the user tray 100 through the unloading picker 32. Therefore, the graphics chip test sorting machine 1 of the present invention can receive the tested graphics chip 10 in the unloading buffer 33 according to the reference direction, thereby quickly storing the graphics chip 10 in the user tray 100. In addition, the graphics chip test sorting machine 1 of the present invention can move the tested graphics chip 10 from the buffer 5 to the unloading buffer 33 for receiving. Therefore, the graphics chip test handler 1 of the present invention can prevent the tested graphics chip 10 from being left in the test section 4, thereby preventing the test process from being delayed.

[0064] refer to Figure 1 and Figure 2 The graphic chip testing and sorting machine 1 of the present invention may include the testing unit 4 .

[0065] The testing section 4 is used to test the graphics chip 10 to be tested. That is, the testing section 4 can perform a testing process of the graphics chip 10. The testing section 4 can connect the graphics chip 10 to the commercial graphics card 41 through the contact unit 42 to perform the testing process.

[0066] refer to Figures 1 to 3 , the testing part 4 may include the commercial graphic card 41 and the contact unit 42 .

[0067] The commercial graphics card 41 is the same as the graphics card actually used. The commercial graphics card 41 may have the same performance and function as the graphics card actually used in a personal computer (PC) or the like. Therefore, the graphics chip test sorting machine 1 of the present invention enables the graphics chip 10 to be connected to the commercial graphics card 41 for testing, thereby reducing the performance deviation that may occur when testing is performed by a test graphics card that simulates the commercial graphics card 41. On the other hand, the commercial graphics card 41 may be provided with a chip mounting portion 411 for connecting to the graphics chip 10.

[0068] The contact unit 42 is used to connect the graphics chip 10 to be tested to the commercial graphics card 41. The contact unit 42 can pressurize the graphics chip 10 to connect it to the chip mounting portion 411. The contact unit 42 can move in a vertical direction.

[0069] refer to Figures 1 to 3 , the testing part 4 may include a testing body 43.

[0070] The test body 43 may be formed with a test slot 44. The commercial graphics card 41 may be disposed in the test body 43. At this time, based on the vertical direction, the commercial graphics card 41 may be disposed at the lower side of the test body 43. The test body 43 may be combined with parts for performing the test process.

[0071] refer to Figures 1 to 3 , Figure 5 as well as Figure 6 The contact unit 42 may include a pressurizing component 421 and a limiting component 422 . At this time, the test body 43 may include a boss component 431 .

[0072] The pressurizing member 421 is used to pressurize the graphics chip 10. The pressurizing member 421 can pressurize the graphics chip 10 to connect it to the chip mounting portion 411. The pressurizing member 421 can move downward to pressurize the graphics chip 10. The pressurizing member 421 can be formed of a material with higher rigidity than the test body 43.

[0073] The limiting component 422 protrudes from the pressurizing component 421. The limiting component 422 may protrude from the side of the pressurizing component 421. The limiting component 422 may have a height lower than the pressurizing component 421, with the third axis direction (Z axis direction) being perpendicular to the first axis direction (X axis direction) and the second axis direction (Y axis direction) respectively as a reference. The third axis direction (Z axis direction) may represent the same direction as the vertical direction. The limiting component 422 may be configured to overlap with the boss component 431 to limit the distance that the contact unit 42 moves toward the graphics chip 10. Therefore, the graphics chip test sorting machine 1 of the present invention is able to maintain a specified pressurizing force, which is the pressurizing force of the contact unit 42 on the graphics chip 10. Therefore, the graphics chip test sorting machine 1 of the present invention can prevent the contact unit 42 from pressing the graphics chip 10 with a strong pressure through the limiting component 422, thereby preventing the graphics chip 10 from being damaged during the process of the contact unit 42 pressing the graphics chip 10.

[0074] The boss part 431 is used to support the contact unit 42. The boss part 431 may be formed on the test body 43. At this time, the boss part 431 may be formed on the upper surface of the test body 43. The boss part 431 may be configured so that at least a portion thereof overlaps with the stop part 422 along the third axis direction (Z axis direction).

[0075] refer to Figures 1 to 3 , the testing section 4 may include a testing slot 44 .

[0076] The test socket 44 is used to receive the graphics chip 10. The test socket 44 enables the received graphics chip 10 to be connected to the commercial graphics card 41. At this time, the test socket 44 can connect the graphics chip 10 to the chip mounting portion 411 configured on the commercial graphics card 41. The test socket 44 can receive the graphics chip 10 from the cache portion 5. The test socket 44 can be formed recessed in the test body 43.

[0077] refer to Figure 1 , Figure 2 , Figure 5 as well as Figure 7 , the testing portion 4 may include a testing hole 45 .

[0078] The test hole 45 penetrates the test body 43 in a manner of being connected to the test socket 44. The test hole 45 can connect the test socket 44 with the commercial graphics card 41. At this time, the chip mounting portion 411 can be connected to the graphics chip 10 through the test hole 45 to test the graphics chip 10.

[0079] refer to Figure 1 , Figure 2 , Figure 8 as well as Fig. 9 , the testing part 4 may include a testing lock 46 .

[0080] The test card lock 46 is used to support the graphics chip 10 received in the test slot 44. The test card lock 46 can support the graphics chip 10 after the graphics chip 10 is received in the test slot 44. At this time, the contact unit 42 is detached after the graphics chip 10 supported by the test card lock 46 is connected to the chip mounting portion 411. When the contact unit 42 is detached from the graphics chip 10, the test card lock 46 can support the graphics chip 10 in a manner that the graphics chip 10 remains received in the test slot 44. Therefore, the graphics chip test sorting machine 1 of the present invention can prevent the contact unit 42 from being detached from the test slot 44 together with the graphics chip 10 when the contact unit 42 is detached from the graphics chip 10. Therefore, the graphics chip test sorting machine 1 of the present invention can prevent the graphics chip 10 from being stuck to the contact unit 42 and moving together through the test card lock 46, thereby preventing erroneous operation that may occur in the process of picking up the tested graphics chip 10. On the other hand, the test card lock 46 can contact and support the multiple graphics chips 10 at multiple different positions to prevent interference with the commercial graphics card 41 .

[0081] refer to Figures 1 to 3 , Fig.10 as well as Fig.11 , the testing part 4 may include a moving unit 48 .

[0082] The moving unit 48 is used to move the contact unit 42 between a contact position TP and a standby position SP. The contact position TP is a position where the contact unit 42 is disposed on the upper side of the test slot 44. The standby position SP is a position separated from the contact position TP. The moving unit 48 can move from the standby position SP to the contact position TP after the graphics chip 10 to be tested is received in the test slot 44. At this time, the contact unit 42 can pressurize the graphics chip 10 to keep the graphics chip 10 and the chip mounting portion 411 (shown in FIG. 1 ) in contact with each other. Figure 4 ) connected. On the contrary, the moving unit 48 can move from the contact position TP to the standby position SP after the test of the graphics chip 10 is completed. At this time, the graphics chip 10 is picked up and moved from the test section 4 to the cache section 5 in a state where the upper side of the test slot 44 is open. The moving unit 48 can move between the contact position TP and the standby position SP by a guide rail (not shown) coupled to the test section 4.

[0083] refer to Figures 1 to 3 as well as Fig.12 , the testing part 4 may include a sealing component 49.

[0084] The sealing member 49 is disposed between the lower surface of the moving unit 48 and the upper surface of the test body 43. The sealing member 49 can seal the lower surface of the moving unit 48 and the upper surface of the test body 43 in a manner that the plurality of test slots 44 are completely surrounded. Therefore, the graphics chip test sorting machine 1 of the present invention can seal the test slots 44 from the outside during the process in which the contact unit 42 pressurizes the graphics chip so that the graphics chip is connected to the chip mounting portion 411. Therefore, the graphics chip test sorting machine 1 of the present invention can keep the test slots 44 in a sealed state through the sealing member 49 during the process of testing the graphics chip 10, so as to accurately perform the test process on the graphics chip 10.

[0085] refer to Figure 1 and Figure 2 The graphics chip test sorting machine 1 of the present invention may include the cache unit 5.

[0086] The buffer section 5 is used to transfer the graphics chip 10 between the loading section 2 and the testing section 4 and to transfer the graphics chip 10 between the unloading section 3 and the testing section 4. The buffer section 5 can transfer the graphics chip 10 to be tested from the loading section 2 to the testing section 4. In addition, the buffer section 5 can transfer the tested graphics chip 10 from the testing section 4 to the unloading section 3.

[0087] refer to Figure 1 , Figure 2 as well as Fig.14 The cache unit 5 may include a socket-type cache 51 and a cache slot 52.

[0088] The socket-type cache 51 is used to temporarily store the graphics chip 10. A plurality of cache slots 52 for accommodating the graphics chip 10 may be formed in the socket-type cache 51. Therefore, the socket-type cache 51 can accommodate the graphics chip 10 in the plurality of cache slots 52 for temporary storage. The socket-type cache can move along the cache guide 54. The cache guide 54 can be configured along the second axis direction (Y axis direction). Therefore, the socket-type cache 51 can move back and forth along the cache guide 54 along the second axis direction (Y axis direction). The socket-type cache 51 can move back and forth along the cache guide 54 in a state where the graphics chip 10 is accommodated in the plurality of cache slots 52, so as to move to a position close to the test section 4.

[0089] refer to Figure 1 and Figure 2 , the cache unit 5 may include a test pickup 53.

[0090] The test picker 53 is used to transfer the graphics chip 10. The test picker 53 can pick up the graphics chips 10 stored in the plurality of cache slots 52 in sequence or simultaneously to be stored in the plurality of test slots 44. The test picker 53 can move along the first axis direction (X axis direction) and the second axis direction (Y axis direction). To this end, the graphics chip test sorting machine 1 of the present invention may include a test fixed rail 12 and a test rail 55. The test fixed rail 12 is configured along the first axis direction (X axis direction). The test rail 55 is configured along the second axis direction (Y axis direction) in a manner that crosses the test fixed rail 12. The test rail 55 and the test fixed rail 12 may be orthogonal to each other. At this time, as the test rail 55 moves along the test fixed rail 12 along the first axis direction (X axis direction), the test picker 53 can move back and forth along the first axis direction (X axis direction). In addition, the test picker 53 can move back and forth along the test rail 55 along the second axis direction (Y axis direction). The test picker 53 can be raised and lowered in the vertical direction. Therefore, the graphics chip 10 can be arranged at a position close to the plurality of test slots 44 received by the socket-type buffer 51, thereby minimizing the moving distance of the test picker 53. Therefore, the graphics chip test sorting machine 1 of the present invention can make the graphics chip 10 wait in advance through the socket-type buffer 51, thereby shortening the process time of receiving the graphics chip 10 in the plurality of test slots 44.

[0091] refer to Figure 1 , Figure 2 , Figure 8 , Fig. 9 as well as Fig.14 , the test pickup 53 may include an opening and closing portion 531 .

[0092] The opening and closing part 531 is used to pressurize the latch button 47. The opening and closing part 531 can press the latch button 47 as the test pickup 53 descends. Conversely, it can be disengaged from the latch button 47 as the test pickup 53 rises. Therefore, as the test pickup 53 descends, when the opening and closing part 531 presses the latch button 47, the test latch 46 can be rotated to the open position OP that opens the test slot 44. In addition, as the test pickup 53 rises, when the opening and closing part 531 disengages from the latch button 47, the test latch 46 can be rotated to the closed position CP that closes the test slot 44. Therefore, in the graphics chip test sorting machine 1 of the present invention, when the test latch 46 moves to the open position OP, the graphics chip 10 picked up by the test pickup 53 can be stored in the test slot 44. In addition, in the graphics chip test handler 1 of the present invention, when the test card lock 46 moves to the open position OP, the graphics chip 10 can be picked up by the test picker 53 and detached from the test slot 44. The opening and closing portion 531 can be coupled to the test picker 53 in a manner facing downward of the test picker 53.

[0093] On the other hand, the following describes in detail an embodiment in which the chip mounting portion 411 , the test slot 44 , and the cache slot 52 in the graphics chip test handler 1 of the present invention are multiple.

[0094] refer to Figures 1 to 4 as well as Figure 1 3. In the graphics chip test sorting machine 1 of the present invention, the commercial graphics card 41 may include a plurality of chip mounting parts 411, and the test part 4 may include a plurality of test slots 44. At this time, the plurality of chip mounting parts 411 and the plurality of test slots 44 may be configured according to the same configuration diagram as each other. Therefore, the graphics chip test sorting machine 1 of the present invention can accommodate a plurality of graphics chips 10 in the plurality of test slots 44 corresponding to the plurality of chip mounting parts 411 to perform a test process on the plurality of graphics chips 10. Therefore, the graphics chip test sorting machine 1 of the present invention can test the graphics chip 10 in the same environment as the actual use environment through the plurality of chip mounting parts 411 and the plurality of test slots 44.

[0095] Specifically, refer to Figure 4 and Figure 1 3. In the graphic chip test handler 1 of the present invention, the chip mounting portion 411 may include a first chip mounting portion 4111 and a second chip mounting portion 4112 , and the test socket 44 may include a first test socket 441 and a second test socket 442 .

[0096] The first chip mounting portion 4111 among the plurality of chip mounting portions 411 and the second chip mounting portion 4112 among the plurality of chip mounting portions 411 may be arranged in directions different from each other. At this time, the first test socket 441 among the plurality of test sockets 44 corresponding to the first chip mounting portion 4111 may be arranged in the same direction as the first chip mounting portion 4111. In addition, the second test socket 442 among the plurality of test sockets 44 corresponding to the second chip mounting portion 4112 may be arranged in the same direction as the second chip mounting portion 4112.

[0097] refer to Figure 4 and Figure 1 3. In the graphic chip test handler 1 of the present invention, the chip mounting portion 411 may include a third chip mounting portion 4113 , and the test socket 44 may include a third test socket 443 .

[0098] A first chip mounting portion 4111 among the plurality of chip mounting portions 411 and a second chip mounting portion 4112 among the plurality of chip mounting portions 411 may be separated by a first distance. The second chip mounting portion 4112 and a third chip mounting portion 4113 among the plurality of chip mounting portions 411 may be separated by a second distance different from the first distance. At this time, a first test socket 441 among the plurality of test sockets 44 corresponding to the first chip mounting portion 4111 and a second test socket 442 among the plurality of test sockets 44 corresponding to the second chip mounting portion 4112 may be separated by the first distance. In addition, the second test socket 442 and a third test socket 443 among the plurality of test sockets 44 corresponding to the third chip mounting portion 4113 may be separated by the second distance.

[0099] refer to Figure 1 , Figure 2 as well as Fig.14 In the graphics chip test sorting machine 1 of the present invention, the cache unit 5 may include a plurality of cache slots 52. At this time, the plurality of cache slots 52 may be configured according to the configuration diagram. Therefore, in the graphics chip test sorting machine 1 of the present invention, the plurality of cache slots 52 can store the graphics chip 10 in advance according to the configuration diagram, so that the graphics chip 10 can be stored in the plurality of test slots 44 without adjusting the spacing by the test picker 53. Therefore, the graphics chip test sorting machine 1 of the present invention can quickly store the plurality of graphics chips 10 in the plurality of test slots 44 through the plurality of cache slots 52, thereby shortening the time of the test process.

[0100] Specifically, refer to Fig.14 In the graphics chip test and sorting machine 1 of the present invention, the cache unit 5 may include a first cache slot 521 and a second cache slot 522 .

[0101] A first cache slot 521 corresponding to the first chip mounting portion 4111 among the plurality of cache slots 52 may be arranged in the same direction as the first chip mounting portion 4111. In addition, a second cache slot 522 corresponding to the second chip mounting portion 4112 among the plurality of cache slots 52 may be arranged in the same direction as the second chip mounting portion 4112.

[0102] refer to Fig.14 In the graphics chip test and sorting machine 1 of the present invention, the cache slot 52 may include a third cache slot 523 .

[0103] A first cache slot 521 among the plurality of cache slots 52 corresponding to the first chip mounting portion 4111 is separated from a second cache slot 522 among the plurality of cache slots 52 corresponding to the second chip mounting portion 4112 by the first distance. In addition, the second cache slot 522 and the third cache slot 523 among the plurality of cache slots 52 corresponding to the third chip mounting portion 4113 may be separated from each other by the second distance.

[0104] On the other hand, reference Fig.14 The cache slots 52 constitute a first cache group 52a, a second cache group 52b, and a third cache group 52c. The first cache group 52a, the second cache group 52b, and the third cache group 52c may include more than two cache slots 52.

[0105] The first cache group 52a may be configured in a direction different from the configuration direction of the second cache group 52b or the third cache group 52c. In this case, the second cache group 52b may be configured to be separated from the first cache group 52a. In addition, the third cache group 52c may be configured to be separated from the second cache group 52b along the second axis direction (Y axis direction). In this case, the third cache group 52c may be opposite to the second cache group 52b along the second axis direction (Y axis direction). The third cache group 52c may be configured to be separated from the first cache group 52a in a direction different from the direction in which the second cache group 52b is separated from the first cache group 52a. On the other hand, the plurality of chip mounting portions 411 and the plurality of test slots 44 may be configured to be substantially the same as the plurality of cache slots 52, and therefore, a detailed description thereof is omitted.

[0106] Although not shown, the plurality of cache slots 52 configured according to the configuration diagram may be grouped as one group, and multiple groups may be configured in the socket-type cache 51. In this case, one group may be composed of the first cache group 52a, the second cache group 52b, and the third cache group 52c. Therefore, the graphics chip test sorting machine 1 of the present invention can simultaneously store graphics chips 10 in multiple groups through the socket-type cache 51. Therefore, the graphics chip test sorting machine 1 of the present invention can increase the number of graphics chips 10 that can be tested per unit time.

[0107] On the other hand, refer to Figures 1 to 14 In the graphics chip test sorting machine 1 of the present invention, the graphics chip 10 can be transferred, stored and tested in the following order. In the graphics chip test sorting machine 1 of the present invention, the transfer, storage and testing of multiple graphics chips 10 can be performed simultaneously, but the following describes the transfer, storage and testing process of one graphics chip 10 in sequence.

[0108] First, the graphics chip 10 is stored in the loading stacker 21 in a state where it can be stored in the user tray 100. At this time, a plurality of graphics chips 10 can be stored in the user tray 100.

[0109] Next, the graphics chip 10 may be picked up by the loading picker 22 and transferred from the user tray 100 located at the loading stacker 21 to the cache slot 52 formed in the socket type cache 51. The graphics chip 10 may be moved along the first axis direction (X axis direction) or the second axis direction (Y axis direction) by the loading guide rail 23, thereby moving to the cache slot 52. At this time, the graphics chip 10 may be accommodated in the cache slot 52 configured according to the same configuration diagram as the chip mounting portion 411.

[0110] Next, the graphics chip 10 can be stored in the cache slot 52 and moved along the second axis direction (Y axis direction) together with the socket-type cache 51. The socket-type cache 51 can transfer the graphics chip 10 to a position close to the test section 4. At this time, the graphics chip 10 can be transferred to a position close to the test section 4 through the socket-type cache 51, wherein the test section 4 has no graphics chip 10 because the test of the graphics chip 10 is completed.

[0111] Next, the graphics chip 10 may be picked up by the test picker 53 and transferred from the socket buffer 51 to the test body 43. At this time, the graphics chip 10 may be transferred from the buffer slot 52 formed in the socket buffer 51 to the test slot 44 formed in the test body 43 for storage. At this time, the graphics chip 10 may be supported by the test card lock 46 moved to the closed position CP while being stored in the test slot 44.

[0112] Next, the graphics chip 10 may be pressed by the contact unit 42 to be connected to the chip mounting portion 411 formed on the commercial graphics card 41. At this time, after the moving unit 48 moves from the standby position SP to the contact position TP, the contact unit 42 may move in the vertical direction to pressurize the graphics chip 10.

[0113] Next, after the test of the graphics chip 10 is completed, the contact unit 42 may be detached from the graphics chip 10. At this time, as the moving unit 48 moves from the contact position TP to the standby position SP, the contact unit 42 may be detached from the graphics chip 10.

[0114] Next, the graphics chip 10 is picked up by the test pickup 53 and transferred from the test body 43 to the socket buffer 51. At this time, the graphics chip 10 can be transferred from the test slot 44 formed in the test body 43 to the buffer slot 52 formed in the socket buffer 51 for storage. At this time, the graphics chip 10 can be detached from the test card lock 46 moved to the open position OP.

[0115] Next, the graphics chip 10 may be picked up by the unloading picker 32 and transferred from the cache slot 52 formed in the socket cache 51 to the unloading cache slot formed in the unloading cache 33 for storage. At this time, the graphics chip 10 may be stored in a manner facing the reference direction.

[0116] Finally, the graphics chip 10 may be picked up by the unloading picker 32 and transferred from the unloading buffer slot to the user tray 100 located at the unloading stacker. At this time, the graphics chip 10 may be stored in the user tray 100 in a manner of being classified by grade according to the test results.

[0117] The present invention described above is not limited to the above-mentioned embodiments and drawings, and it is understood by those skilled in the art that various substitutions, modifications and changes can be made without departing from the technical concept of the present invention.

Claims

1. A graphics chip testing and sorting machine, characterized in that: include: A loading unit, used for performing a loading process of loading a graphics chip to be tested; An unloading unit, used for performing an unloading process of unloading the tested graphics chip; The testing section is used to test the graphics chip to be tested; as well as a cache unit, used for transferring graphics chips between the loading unit and the testing unit and between the unloading unit and the testing unit, The testing part comprises: a commercial graphics card which is the same as the graphics card actually used; and a contact unit which is used to connect the graphics chip to be tested to the commercial graphics card.

2. The graphics chip test sorting machine according to claim 1, characterized in that: The test section includes: a test slot for accommodating a graphics chip; and a test body, which is formed with the test slot. The commercial graphics card includes a chip mounting portion connected to a graphics chip received in the test socket.

3. The graphics chip testing and sorting machine according to claim 2, characterized in that: The testing part includes a testing hole, and the testing hole penetrates the testing body in a manner of being connected to the testing slot. The chip mounting portion is directly connected to the graphics chip through the test hole to test the graphics chip.

4. The graphics chip testing and sorting machine according to claim 2, characterized in that: The commercial graphics card includes a plurality of chip mounting parts. The testing section includes a plurality of the testing slots. The plurality of chip mounting portions and the plurality of test sockets are arranged according to the same arrangement diagram.

5. The graphics chip testing and sorting machine according to claim 4, characterized in that: The first chip mounting portion and the second chip mounting portion of the plurality of chip mounting portions are arranged to face different directions from each other. A first test socket corresponding to the first chip mounting portion among the plurality of test sockets is arranged to face the same direction as the first chip mounting portion, A second test socket corresponding to the second chip mounting portion among the plurality of test sockets is arranged to face the same direction as the second chip mounting portion.

6. The graphics chip testing and sorting machine according to claim 4, characterized in that: A first chip mounting portion and a second chip mounting portion among the plurality of chip mounting portions are separated by a first distance, The second chip mounting portion is spaced apart from a third chip mounting portion among the plurality of chip mounting portions by a second distance, the second distance being different from the first distance, Among the plurality of test sockets, a first test socket corresponding to the first chip mounting portion and a second test socket corresponding to the second chip mounting portion are separated by the first distance, The second test socket is spaced apart from a third test socket corresponding to the third chip mounting portion among the plurality of test sockets by the second distance.

7. The graphics chip testing and sorting machine according to claim 4, characterized in that: The cache unit includes: a plurality of cache slots for accommodating a graphics chip; and a socket-type cache, formed with the plurality of cache slots. The plurality of cache slots are configured according to the configuration diagram.

8. The graphics chip testing and sorting machine according to claim 5, characterized in that: The cache unit includes: a plurality of cache slots for accommodating a graphics chip; and a socket-type cache, formed with the plurality of cache slots. A first cache slot corresponding to the first chip mounting portion among the plurality of cache slots is arranged to face the same direction as the first chip mounting portion, A second cache slot corresponding to the second chip mounting portion among the plurality of cache slots is arranged to face the same direction as the second chip mounting portion.

9. The graphics chip testing and sorting machine according to claim 6, characterized in that: The cache unit includes: a plurality of cache slots for accommodating a graphics chip; and a socket-type cache, formed with the plurality of cache slots. A first cache slot corresponding to the first chip mounting portion and a second cache slot corresponding to the second chip mounting portion among the plurality of cache slots are separated by the first distance, The second cache slot is spaced apart from a third cache slot corresponding to the third chip mounting portion among the plurality of cache slots by the second distance.

10. The graphics chip testing and sorting machine according to claim 7, characterized in that: A plurality of cache slots configured according to the configuration diagram are grouped as one group, and a plurality of groups are configured in the socket-type cache.

11. The graphics chip testing and sorting machine according to claim 2, characterized in that: The testing unit includes a testing card lock, and the testing card lock is used to support the graphics chip received in the testing slot. The contact unit is disengaged after the graphics chip supported by the test card lock is connected to the chip mounting portion, When the contact unit is detached from the graphics chip, the test card lock supports the graphics chip so that the graphics chip remains in a state of being received in the test socket.

12. The graphics chip testing and sorting machine according to claim 2, characterized in that: The test unit includes: a test card lock for supporting the graphics chip received in the test slot; and a card lock button for rotating the test card lock. The cache unit includes a test pickup for transferring a graphics chip, The test pickup includes an opening and closing portion for pressurizing the locking button. As the test pickup descends, when the opening and closing portion presses the locking button, the test lock rotates to an open position to open the test slot. As the test pickup rises, when the opening and closing portion disengages from the locking button, the test lock rotates to a closed position to close the test slot.

13. The graphics chip testing and sorting machine according to claim 2, characterized in that: The test section includes a moving unit for moving the contact unit between a contact position located at an upper side of the test slot and a standby position spaced apart from the contact position.

14. The graphics chip testing and sorting machine according to claim 13, characterized in that: The test section includes a sealing member disposed between a lower surface of the moving unit and an upper surface of the test body to seal the lower surface of the moving unit and the upper surface of the test body in a manner of completely surrounding the plurality of test slots.

15. The graphics chip testing and sorting machine according to claim 2, characterized in that: The test body comprises a boss component for supporting the contact unit, The contact unit includes: a pressurizing component for pressurizing the graphics chip; and a limiting component protruding from the pressurizing component. The limiting component is configured to overlap with the boss component to limit the distance that the contact unit moves toward the graphics chip.

16. The graphics chip testing and sorting machine according to claim 15, characterized in that: The pressurizing member is made of a material having higher rigidity than the test body.

17. The graphics chip test sorting machine according to claim 1, characterized in that: The unloading unit comprises: an unloading stacker configured with a user tray for storing tested graphics chips; an unloading buffer, disposed between the buffer section and the unloading stacker; and an unloading picker, transferring the tested graphics chip from the buffer section via the unloading buffer to the user tray of the unloading stacker, The tested graphics chips are stored in a user tray arranged in the unloading stacker in a preset reference direction. The offload cache includes an offload cache slot, and the offload cache slot is used to receive a graphics chip according to the reference direction. The unloading picker stores the graphics chip in the unloading cache slot after selectively rotating the graphics chip picked up from the cache portion so that the direction of the graphics chip is consistent with the reference direction.

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