Circuit board assembly test fixture

Abstract

The invention relates to a circuit board assembly test fixture, which comprises a test board, a positioning base, a cover plate assembly and a probe assembly, and is characterized in that the test board comprises a horizontally arranged table board; the positioning base is fixed to the top surface of the table plate; the positioning base is used for fixing a circuit board assembly; the cover plate assembly is fixed to the top face of the table plate. The probe assembly is fixed on the top surface of the table plate; the probe assembly comprises a probe substrate capable of translating in the horizontal direction, and more than two test probes are arranged at one end, facing the positioning base, of the probe substrate; and one end, provided with the test probe, of the probe substrate can be translated into the positioning base. According to the circuit board assembly test fixture provided by the invention, a fixed structure of the test probe is changed into a translation structure, and the test probe is translated into the shell of the circuit board assembly, so that the test contact on the circuit board is in contact with the test probe on the probe substrate, and the circuit board is effectively and electrically connected with electronic test equipment; therefore, the function test of the circuit board is completed.

Description

Technical Field

[0001] The invention relates to the field of circuit board processing, in particular to a circuit board component testing fixture. Background Art

[0002] A printed circuit board assembly is a printed circuit board assembly, or PCBA for short. It usually refers to a PCB blank board that is assembled through the entire process of SMT (Surface Mount Technology) mounting and DIP (Dual In-line Package) plug-in. Furthermore, in this field, finished circuit boards, power supplies and other components are installed in a housing, and the assembled electronic products can also be called circuit board assemblies.

[0003] When testing a circuit board assembly, the finished circuit board needs to be placed on a burn-in test fixture, and the electrical signals of the circuit board test points are exported to the electronic testing equipment through the electrical connection device for circuit board testing. Electronic test equipment It is a data processing device, which can be an embedded system composed of a single-chip microcomputer, or a PC, etc. This electronic testing equipment can usually also be used as a burner to write the written program code into the chip on the circuit board so that the chip can perform operations according to the designed functions.

[0004] In the prior art, the burning test fixture can usually only test the exposed circuit board. Since the test contacts on the circuit board are exposed, the electronic testing equipment can contact the test contacts on the circuit board through the test probe module to obtain the electrical signal for testing the circuit board.

[0005] However, during the assembly process of electronic products, circuit board failures may occur, so the assembled electronic products also need to be tested. Traditional electronic product burning test tools are used to test circuit boards, so the test probes are vertically set on the test bench, and the circuit board is moved up and down to allow the test contacts of the circuit board to contact the test probes. The assembled circuit board assembly is usually provided with a fully enclosed shell, and the circuit board is arranged in the shell. The test contacts on the circuit board cannot be exposed, and the test contacts on the circuit board in the shell cannot contact the test probes on the test bench, so the test cannot be completed.

[0006] In addition, in some scenarios, due to factors such as the irregular shape or large size of the circuit board, and the small accommodation space of the fixture positioning base, even if the circuit board assembly does not have a shell, moving straight up and down on the fixture cannot ensure that the test contacts can touch the test probes, and the test cannot be completed.

[0007] There is a need in the market for a new type of burn-in test fixture that can effectively test circuit boards in circuit board assemblies with irregular shapes or with shells. Summary of the invention

[0008] The present application provides a circuit board assembly test fixture to solve the technical problem in the prior art that circuit board test contacts in a circuit board assembly with a housing are difficult to contact with a test probe.

[0009] The present application provides a circuit board assembly test fixture, including a test bench, a positioning base, a cover assembly and a probe assembly, wherein the test bench includes a horizontally arranged table top; the positioning base is fixed to the top surface of the table top; the positioning base is used to fix the circuit board assembly; the cover assembly is fixed to the top surface of the table top; the probe assembly is fixed to the top surface of the table top; the probe assembly includes a probe substrate that can be translated in the horizontal direction, and one end of the probe substrate facing the positioning base is provided with more than two test probes; the end of the probe substrate provided with the test probe can be translated into the positioning base.

[0010] Furthermore, the probe assembly includes a linear guide, a first slider and a first slider, the linear guide is fixed to the top surface of the table top, and the extension direction of the linear guide is consistent with the direction of a central axis of the positioning base; the first slider can be slidably installed on the linear guide; the first slider is fixed to the top surface of the table top; the first pressure clamp includes a first wrench and a first connecting rod, one end of the first connecting rod is connected to the first slider, and the other end is hinged to the first wrench.

[0011] Furthermore, the probe assembly includes a second slider and a third slider, the second slider is fixed to the top surface of the first slider; the third slider is detachably fixed to the side of the second slider facing the positioning base.

[0012] Furthermore, the probe assembly also includes a strip hole, a blind hole and a fastener, the strip hole passes through the second slider and extends in the vertical direction; the blind hole is recessed on the surface of the third slider facing the second slider; one end of the fastener passes through the strip hole, and the other end is connected to the blind hole, and the third slider is fixed to the second slider by the fastener.

[0013] Further, the probe substrate is fixed to the top surface or the bottom surface of the third sliding block, and one end of the probe substrate provided with the test probe extends toward the positioning base.

[0014] Furthermore, the probe substrate comprises a horizontally arranged substrate body, and the test probe is vertically arranged on the top surface or the bottom surface of the substrate body; the substrate body is electrically connected to a data processing device through a data interface.

[0015] Furthermore, the positioning base includes a positioning substrate and four card blocks, the positioning substrate is detachably mounted to the top surface of the table top; the four card blocks are detachably mounted to the top surface of the positioning substrate; a gap is formed between any two adjacent card blocks; the four card blocks enclose a accommodating space for accommodating a circuit board assembly, and the shape and size of the accommodating space match the shape and size of the circuit board assembly.

[0016] Furthermore, the cover plate assembly comprises a liftable cover plate, and at least one strip block extending in a horizontal direction is provided at an edge of the cover plate, and the strip block is located above the positioning base.

[0017] Furthermore, the cover plate assembly includes a back plate bracket, a second pressure clamp and a guide column, the back plate bracket is fixed to the top surface of the table plate; the second pressure clamp is fixed to the back plate bracket; the second pressure clamp includes a second wrench and a second connecting rod, one end of the second connecting rod is connected to the cover plate, and the other end is hinged to the second wrench; one end of the guide column is vertically connected to the top surface of the table plate, and the other end is connected to the back plate bracket; the cover plate is provided with cover plate through holes, and each guide column passes through a cover plate through hole; when the second wrench is pulled, the cover plate is driven by the second connecting rod to move up and down along the guide column.

[0018] Furthermore, the cover plate assembly includes a limiting block, one end of which is fixed to the top surface of the cover plate, and the other end of which extends vertically downward.

[0019] Furthermore, the circuit board assembly includes a circuit board, and more than two test points are provided on the surface of the circuit board; when a circuit board assembly is installed on the positioning base, the probe substrate is provided with one end of a test probe which can be translated to the top or bottom of the circuit board, and each test probe can be arranged opposite to a test point.

[0020] The advantage of the present invention is that it provides a circuit board assembly test fixture, which changes the test probe from a traditional fixed structure to a translational structure, and translates the test probe into the housing of the circuit board assembly. By slightly pressing down the housing of the circuit board assembly, the test contacts on the circuit board are brought into contact with the test probes on the probe substrate, thereby achieving effective electrical connection between the circuit board and the electronic testing equipment, thereby completing the functional test of the circuit board.

[0021] In some scenarios, due to factors such as the irregular shape or large size of the circuit board, and the small accommodation space of the jig positioning base, even if the circuit board assembly does not have a shell, moving straight up and down on the jig cannot ensure that the test contacts can touch the test probes. The jig of the present invention can also be used to translate the test probes from the side to under the test contacts of the circuit board, thereby completing the functional test of the circuit board. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0023] Figure 1 is a schematic diagram of the overall structure of the circuit board assembly described in the embodiment of the present application; Figure 2 is a schematic diagram of the structure of the circuit board assembly according to the embodiment of the present application after the bottom housing is removed; Figure 3 It is a schematic diagram of the overall structure of the circuit board assembly test fixture described in an embodiment of the present application; Figure 4 is a schematic diagram of the structure of the test bench described in the embodiment of the present application; Figure 5 is a structural schematic diagram of a positioning base described in an embodiment of the present application; Figure 6 is a schematic diagram of the structure of the probe assembly described in an embodiment of the present application; Figure 7 is a schematic diagram of the exploded structure of three sliders in the probe assembly described in the embodiment of the present application; Figure 8 This is a schematic diagram of the use status of the circuit board assembly test fixture described in the embodiment of the present application; Fig. 9 It is a schematic diagram of the structure of the connection between the circuit board and the probe substrate described in the embodiment of the present application.

[0024] Description of reference numerals: 100 test bench, 110 support base, 120 support column, 130 table top; 200 positioning base, 210 positioning substrate, 220 clamping block, 221 second notch, 230 first notch, 240 accommodating space; 300 probe assembly, 310 first slider, 311 sliding connection, 320 second slider, 321 strip hole, 330 third slider, 331 blind hole, 340 linear guide, 350 first pressure clamp, 351 first wrench, 352 first connecting rod, 360 fastener, 370 probe substrate, 371 test probe, 372 substrate body, 380 pad; 400 cover plate assembly, 410 back plate bracket, 411 vertical plate, 412 back plate, 413 boss; 430 cover plate, 431 strip block, 440 second pressure clamp, 441 second wrench, 442 second connecting rod, 450 limit block, 451 horizontal block, 452 vertical block; 900 circuit board assembly, 910 housing, 911 housing opening, 920 circuit board, 921 test contact. DETAILED DESCRIPTION

[0025] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the present application. In addition, it should be understood that the specific implementation methods described herein are only used to illustrate and explain the present application and are not used to limit the present application. In the present application, unless otherwise stated, the directional words used, such as "up", "down", "left", and "right", generally refer to the up, down, left, and right of the device in actual use or working state, specifically the drawing direction in the accompanying drawings.

[0026] It should be noted that the description order of the following embodiments is not intended to limit the preferred order of the embodiments of the present application. In addition, in the following embodiments, the description of each embodiment has its own emphasis, and for parts not described in detail in one embodiment, please refer to the relevant description of other embodiments.

[0027] The present embodiment provides a circuit board assembly test fixture for testing a circuit board assembly with or without a housing.

[0028] like Figure 1~2 As shown, the circuit board assembly 900 of this embodiment includes a shell 910, and a detachable or switchable shell cover (not shown) is provided at one end of the shell 910. When the shell cover is opened or removed, a shell opening 911 is formed at one end of the shell 910.

[0029] A circuit board 920 is disposed in the housing 910. A contact module is disposed at one end of the circuit board 920 near the housing opening 911. Each contact module has a plurality of test contacts 921 arranged in an array. In this embodiment, a contact module is disposed on the lower surface of one end of the circuit board 920. The contact module includes eight test contacts 921 arranged in a 2*4 matrix. In other embodiments, the circuit board assembly 900 may also be a finished circuit board without a housing, and may also have more or fewer test contacts.

[0030] like Figure 3~4 As shown, the circuit board assembly test fixture of this embodiment includes a test bench 100, which includes a rectangular ring-shaped support base plate 110, four support columns 120 of the same length are arranged at the four corners of the support base plate, and a horizontally arranged table top 130 is arranged on the top of the support column 120. The test bench 100 has a stable structure and will not shake.

[0031] like Figure 3 As shown, the circuit board assembly test fixture further includes a positioning base 200 fixed to the top surface of the table 130 , a probe assembly 300 and a cover assembly 400 .

[0032] like Figure 5 As shown, the positioning base 200 includes a positioning substrate 210 and four clamping blocks 220. The positioning substrate 210 is detachably mounted on the top surface of the table top 130. The positioning substrate 210 is rectangular and has two central axes perpendicular to each other. The four clamping blocks 220 are detachably mounted on the four corners of the top surface of the positioning substrate 210; a first notch 230 is formed between any two adjacent clamping blocks 220.

[0033] In this embodiment, the four blocks 220 of the positioning base 200 are all provided with an L-shaped second notch 221, and the second notches 221 of the four blocks 220 are opposite to each other, forming a rectangular accommodation space 240 for accommodating the circuit board assembly 900. The shape and size of the accommodation space 240 match the shape and size of the circuit board assembly 900. In this embodiment, the shell 910 is in the shape of a cuboid, so the shape of the accommodation space 240 is also a cuboid, and its size matches the size of the shell 910, and the shell 910 of the circuit board assembly 900 can just fit into the rectangular accommodation space 240. After the shell cover is opened or removed, a shell opening 911 is formed at one end of the shell 910, and when the circuit board assembly 900 is placed on the positioning base 200, the shell opening 911 is opposite to and adjacent to the first notch 230 of the positioning base 200 facing the probe assembly 300.

[0034] like Figure 3 , Figure 6 , Figure 7As shown, the probe assembly 300 includes at least one linear guide rail 340 fixed to the top surface of the table and a first clamp 350, and the extension direction of the linear guide rail 340 is consistent with the direction of a central axis of the positioning base 200. The probe assembly 300 also includes a first slider 310, a second slider 320 and a third slider 330.

[0035] The first slider 310 is slidably mounted on the linear guide rail 340 via a sliding connector 311 at its bottom. The second slider 320 is a straight plate, vertically fixed to the top surface of the first slider 310, and the third slider 330 is detachably fixed to the side of the second slider 320 facing the positioning base 300.

[0036] The second slider 320 is provided with a strip hole 321 extending in the vertical direction, and the surface of the third slider 330 facing the second slider 320 is provided with a concave blind hole 331. The probe assembly 300 further includes a fastener 360, preferably a bolt, the wider end of the bolt passes through the strip hole 321, and the other end is connected to the blind hole 331.

[0037] The first pressing clamp 350 includes a first wrench 351 and a first connecting rod 352, one end of the first connecting rod 352 is connected to the first slider 310, and the other end thereof is hinged to the first wrench 351. The first connecting rod 352 is horizontally arranged, and the central axis of the first connecting rod 352 is parallel to the extension direction of the linear guide rail 340. When the first wrench 351 is pulled, the first connecting rod 352 can drive the first slider 310 to move horizontally on the linear guide rail 340.

[0038] The probe assembly 300 further includes a probe substrate 370, one end of which is fixed to the bottom surface of the third slider 330 through a pad 380, and a test probe module is provided on the upper surface of the other end thereof, and the probe substrate 370 extends toward the positioning base 200. Each test probe module has a plurality of test probes 371 arranged in a matrix, extending vertically from bottom to top. In this embodiment, the test probe module includes eight test probes arranged in a 2*4 matrix.

[0039] The probe substrate 370 includes a horizontally arranged substrate body 372, and a test probe 371 is vertically arranged on the top surface of the substrate body 372; the substrate body 372 is electrically connected to an electronic test device (not shown) through a connecting circuit board or a data interface (not shown). The length of the probe substrate 370 in the extension direction is greater than the length of the third slider 330, and the test probe module composed of multiple test probes is exposed outside the coverage area of ​​the third slider 330.

[0040] like Figure 8As shown, in this embodiment, the fastener 360 passes through the strip hole 321 to fix the third slider 330 to the second slider 320, and the height of the fastener 360 on the strip hole 321 can be freely adjusted, so that the height of the third slider 330 and the probe substrate 370 can be adjusted. The probe substrate 370 is fixed to the bottom surface of the third slider 330 through the pad 380. After the third slider 330 is fixed by the fastener, the user can select pads 380 of different heights or do not use the pad 380 to adjust the height of the probe substrate 370. The user can determine the appropriate height of the probe substrate 370 according to the height of the circuit board 920 on the positioning base 200, so as to adjust the height.

[0041] like Figure 8 , Fig. 9 As shown, after the first wrench 351 is pulled inward, one end of the test probe provided on the probe substrate 370 can pass through the first notch 230 of the positioning base 200, pass through the housing opening 911 of the circuit board assembly 900, and extend into the housing 910 of the circuit board assembly 900, so that each test probe 371 is arranged opposite to a test contact 921 on the bottom surface of the circuit board 920. The third slider 330 and the pad 380 abut against the surface of the housing 910 of the circuit board assembly 900, playing a limiting role, to prevent the components in the circuit board assembly from being damaged due to the probe substrate 370 extending too far into the housing 910.

[0042] like Figure 3 , Figure 8 As shown, the cover plate assembly 400 includes a back plate bracket 410 fixed to the top surface of the table top 130 , two guide posts 420 , a liftable cover plate 430 , and a second pressing clamp 440 .

[0043] The backboard bracket 410 is a vertical frame, including two parallel vertical boards 411, and a vertically arranged backboard 412 is arranged on the top of the vertical board 411 facing the positioning base 200, and the two side surfaces of the backboard 412 are perpendicular to the top surface of the table board 130. A horizontal boss 413 is respectively arranged at both ends of the bottom of the surface of the backboard 412 facing the positioning base 200; one end of each guide column 420 is vertically connected to the top surface of the table board 130, and the other end thereof is connected to a boss 413 of the backboard bracket 410.

[0044] The cover plate 430 is provided with two cover plate through holes 431 , and each guide column 420 can slide through a cover plate through hole (not shown); two strip blocks 431 extending in the horizontal direction are provided at the edge of the cover plate 430 , and the two strip blocks 431 are located above the positioning base 200 .

[0045] The second pressing clamp 440 is fixed to the top of the back plate bracket 410, and the second pressing clamp 440 includes a second wrench 441 and a second connecting rod 442. The second wrench 441 is fixed to the top center of the surface of the back plate 412 facing the positioning base 200. The second connecting rod 442 is vertically arranged, one end of which is vertically connected to the top of the cover plate 430, and the other end is hinged to the second wrench 441.

[0046] like Figure 8 , Fig. 9 As shown, when the second wrench 441 is pulled, the cover plate 430 is driven by the second connecting rod 442 to move up and down along the two guide pillars 420. When the circuit board assembly 900 is placed on the positioning base 200, the second wrench 441 is pulled downward, the second connecting rod 442 pushes the cover plate 430 to the top of the housing 910 of the circuit board assembly 900, and the two bar blocks 431 slightly press the circuit board assembly 900 downward. If one end of the probe substrate 370 has been inserted into the housing 910 of the circuit board assembly 900 before, and each test probe 371 is arranged opposite to a test contact 921 on the bottom surface of the circuit board 920, after the circuit board assembly 900 is slightly pressed downward, each test probe 371 contacts a test contact 921 on the bottom surface of the circuit board 920. Since the substrate body 373 is electrically connected to an electronic testing device through a connecting circuit board or a data interface (not shown), when multiple test probes 371 abut against multiple test contacts 921, the circuit board 920 in the circuit board assembly 900 is effectively electrically connected to the electronic testing device, and various tests can be completed.

[0047] The cover assembly 400 further includes an L-shaped stopper 450, including a horizontal block 451 and a vertical block 452. One end of the horizontal block 451 is fixed to the top surface of the cover 430, and the other end thereof is connected to the top of the vertical block 452. The vertical block 452 extends vertically downward. When the first wrench 351 is pulled inward, the second slider 320 is also driven to slide inward and is located directly below the stopper 450; when the second wrench 441 is pulled downward, the lower surface of the horizontal block 451 abuts against the upper surface of the second slider 320. The stopper 450 can effectively prevent the cover 430 from being pressed down too low, causing the housing 910 of the circuit board assembly 900 to be crushed.

[0048] The operation process and usage of this embodiment are as follows.

[0049] like Figure 3 , Figure 5 , Figure 6As shown, in the initial state, the first wrench 351 of the first pressure clamp 350 is pulled outward, the first wrench 351 of the first pressure clamp 350 is pulled upward, and the probe substrate 370 is arranged opposite to the notch 230 at one end of the positioning base 200. The user places the circuit board assembly 900 in the accommodating space 240 of the positioning base 200, and adjusts the height of the probe substrate 370 so that the probe substrate 370 is arranged opposite to the housing opening 911 of the circuit board assembly 900, and the height of the probe substrate 370 is slightly lower than the height of the circuit board 920, and the height difference between the two is slightly longer than the length of the test probe.

[0050] like Figure 1~2 , Figures 5 to 8 As shown, the tester pulls the first wrench 351 of the first pressure clamp 350 inward, and the first connecting rod 352 pushes the first slider 310, the second slider 320 and the third slider 330 to translate along the linear guide 340 toward the positioning base 200. When the first wrench 351 is pulled to the bottom, one end of the test probe provided on the probe substrate 370 passes through the first notch 230 of the positioning base 200, passes through the housing opening 911 of the circuit board assembly 900, and extends into the housing 910 of the circuit board assembly 900, and each test probe 371 is arranged opposite to a test contact 921 on the bottom surface of the circuit board. The distance between each test probe 371 and the test contact 921 is very small, preferably less than 3mm.

[0051] like Figure 8 As shown, the tester moves the second wrench 441 of the second pressing clamp 440 downward, and the second connecting rod 442 pushes the cover 430 to move downward. The two bar blocks 431 of the cover 430 are pressed down to the top of the shell 910 of the circuit board assembly 900, and the shell 910 is slightly pressed down.

[0052] like Fig. 9 As shown, since one end of the probe substrate 370 has been inserted into the housing 910 of the circuit board assembly 900 before, and each test probe 371 is arranged opposite to a test contact 921 on the bottom surface of the circuit board 920, after the circuit board assembly 900 is slightly pressed down, each test probe 371 contacts a test contact 921 on the bottom surface of the circuit board 920. Since the substrate body 372 is electrically connected to an electronic test device through a connecting circuit board or a data interface (not shown in the figure), therefore, when multiple test probes 371 abut against multiple test contacts 921, the circuit board 920 in the circuit board assembly 900 is effectively electrically connected to the electronic test device, and various tests can be completed.

[0053] After the test is completed, the tester first pulls the second wrench 441 of the second pressure clamp 440 upward to separate the multiple test probes 371 from the multiple test contacts 921; then pulls the first wrench 351 of the first pressure clamp 350 outward, and the first connecting rod 352 pulls the first slider 310, the second slider 320 and the third slider 330 to move along the linear guide 340 away from the positioning base 200, driving the probe substrate 370 to move out of the housing 910. The tester removes the circuit board assembly 900 that has been tested from the positioning base 200, places another circuit board assembly 900 that needs to be tested on the positioning base 200, and repeats the above steps to complete the test of multiple similar circuit board assemblies.

[0054] The present invention provides a circuit board assembly test fixture, which changes a test probe from a fixed structure to a translational structure, and translates the test probe into a housing of the circuit board assembly. By slightly pressing down the housing of the circuit board assembly, a test contact on the circuit board is brought into contact with the test probe on a probe substrate, thereby achieving effective electrical connection between the circuit board and an electronic test device, thereby completing a functional test of the circuit board.

[0055] In some scenarios, due to factors such as the irregular shape or large size of the circuit board, and the small accommodation space of the jig positioning base, even if the circuit board assembly does not have a shell, moving straight up and down on the jig cannot ensure that the test contacts can touch the test probes. The jig of the present invention can also be used to translate the test probes from the side to under the test contacts of the circuit board, thereby completing the functional test of the circuit board.

[0056] The above is a detailed introduction to a circuit board assembly test fixture described in the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea; at the same time, for general technical personnel in this field, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A circuit board assembly test fixture, characterized in that: include: A test bench, comprising a horizontally arranged table top; A positioning base, fixed to the top surface of the table top; A cover plate assembly, fixed to the top surface of the table top; as well as The probe assembly is fixed to the top surface of the table top; the probe assembly includes a probe substrate that can be translated in the horizontal direction, and one end of the probe substrate facing the positioning base is provided with more than two test probes; the end of the probe substrate provided with the test probes can be translated into the positioning base.

2. The circuit board assembly test fixture as claimed in claim 1, characterized in that: The probe assembly comprises: A linear guide rail is fixed to the top surface of the table top, and the extension direction of the linear guide rail is consistent with the direction of a central axis of the positioning base; A first slider slidably mounted on the linear guide rail; and The first pressing clamp is fixed to the top surface of the table top; the first pressing clamp includes a first wrench and a first connecting rod, one end of the first connecting rod is connected to the first sliding block, and the other end is hinged to the first wrench.

3. The circuit board assembly test fixture as claimed in claim 2, characterized in that: The probe assembly includes A second slider is fixed to the top surface of the first slider; and The third sliding block is detachably fixed to the side surface of the second sliding block facing the positioning base.

4. The circuit board assembly test fixture as claimed in claim 3, characterized in that: The probe assembly also includes: a strip-shaped hole, penetrating the second sliding block and extending in a vertical direction; and a blind hole, recessed in a surface of the third slider facing the second slider; A fastener, one end of which passes through the strip hole and the other end of which is connected to the blind hole, and the third slider is fixed to the second slider by the fastener.

5. The circuit board assembly test fixture as claimed in claim 3, characterized in that: The probe substrate is fixed to the top surface or the bottom surface of the third slider, The probe substrate is provided with an end of the test probe extending toward the positioning base.

6. The circuit board assembly test fixture as claimed in claim 1, characterized in that: The probe substrate comprises a substrate body arranged horizontally, The test probe is vertically arranged on the top surface or the bottom surface of the substrate body; The substrate body is electrically connected to a data processing device through a data interface.

7. The circuit board assembly test fixture as claimed in claim 1, characterized in that: The positioning base comprises: A positioning substrate, detachably mounted to the top surface of the table top; and Four card blocks are detachably mounted on the top surface of the positioning substrate; a gap is formed between any two adjacent card blocks; the four card blocks enclose a receiving space for receiving the circuit board assembly, and the shape and size of the receiving space match the shape and size of the circuit board assembly.

8. The circuit board assembly test fixture as claimed in claim 1, characterized in that: The cover plate assembly comprises a liftable cover plate, At least one strip block extending in the horizontal direction is provided at the edge of the cover plate. The bar block is located above the positioning base.

9. The circuit board assembly test fixture as claimed in claim 8, characterized in that: The cover plate assembly comprises: A back panel bracket, fixed to the top surface of the table top; A second pressing clamp fixed to the back plate bracket; the second pressing clamp comprises a second wrench and a second connecting rod, one end of the second connecting rod is connected to the cover plate, and the other end is hinged to the second wrench; and A guide column, one end of which is vertically connected to the top surface of the table top, and the other end of which is connected to the back panel bracket; The cover plate is provided with a cover plate through hole, and each guide column passes through a cover plate through hole; when the second wrench is pulled, the cover plate is driven by the second connecting rod to move up and down along the guide column.

10. The circuit board assembly test fixture as claimed in claim 1, characterized in that: The cover plate assembly includes The limiting block has one end fixed to the top surface of the cover plate and the other end extending vertically downward.

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