A fully automatic performance testing method and device for inductors

Abstract

The present invention relates to the field of inductance performance testing, and specifically to a fully automatic performance testing method and equipment for inductance. The method first obtains the quality factor and temperature data of the inductance element to be tested at each moment at different test frequencies, obtains the temperature influence of each test frequency according to the changes in the quality factor and temperature data at each moment of the same test frequency, screens out the reference resonant frequency at each moment according to the changes in the quality factor at the same moment of different test frequencies, obtains the authenticity of the quality factor at each moment according to the difference in the reference resonant frequency at adjacent moments and the difference in the quality factor of the reference resonant frequency, and the temperature influence of each test frequency between the reference resonant frequencies, and adjusts the quality factor of the reference resonant frequency at each moment, and performs performance testing on the inductance element to be tested based on the actual quality factor obtained. The present invention can reduce the influence of temperature on the performance test of the inductance element and improve the accuracy of the performance test of the inductance element.

Description

Technical Field

[0001] The present invention relates to the field of inductance performance testing, and in particular to a fully automatic performance testing method and equipment for an inductance. Background Art

[0002] In the field of modern electronics and electrical engineering, inductors, as one of the most important circuit components, are widely used in power management, filtering, oscillation, signal processing and other fields. The performance of inductors directly affects the stability and reliability of the circuit system. Therefore, performance testing of inductors is particularly important.

[0003] In the related art, a bridge test is usually performed on an inductor element to measure the quality factor of the inductor element, thereby achieving a performance test of the inductor element. However, during the bridge test, the inductor element is in a continuous working state. As its internal temperature increases, it will affect the accuracy of the quality factor measurement. In actual scenarios, alternating currents of different frequencies are usually used for bridge testing. The influence of temperature will cause the peak point of the quality factor measured in practice to shift, resulting in the existing quality factor measurement results being unable to reflect the actual performance of the inductor element, thereby reducing the accuracy of the performance test of the inductor element. Summary of the invention

[0004] In order to solve the technical problem that the existing quality factor measurement results cannot reflect the actual performance of the inductor component and reduce the accuracy of the performance test of the inductor component, the purpose of the present invention is to provide a fully automatic performance test method and equipment for inductors. The technical solutions adopted are as follows:

[0005] The present invention provides a fully automatic performance testing method for an inductor, the method comprising:

[0006] Obtaining quality factor and temperature data of the inductor component to be tested at each moment at different test frequencies within a preset time period;

[0007] Taking any test frequency as the target test frequency, obtaining the quality factor variation degree of the target test frequency at each moment according to the change of the quality factor at each moment of the target test frequency and the change of the quality factor at each moment in the preset time domain of each moment; analyzing the correlation between the quality factor variation degree and the temperature data at all moments of the target test frequency to obtain the temperature influence degree of the target test frequency;

[0008] According to the change of the quality factor at the same moment of different test frequencies, the reference resonant frequency at each moment is screened out from all test frequencies; according to the difference of the reference resonant frequencies at adjacent moments and the difference of the quality factors of the reference resonant frequencies at adjacent moments, and the temperature influence of each test frequency between the reference resonant frequencies at adjacent moments, the authenticity of the quality factor at each moment is obtained; according to the authenticity of the quality factor at each moment and the quality factor of the reference resonant frequency at each moment, the actual quality factor of the inductor element to be tested is obtained;

[0009] Based on the actual quality factor, a performance test is performed on the inductor component to be tested.

[0010] Further, the step of obtaining the quality factor variation at each moment of the target test frequency includes:

[0011] Mapping data points formed by each moment of the target test frequency and the quality factor at each moment into a first coordinate system, and performing curve fitting on all data points in the first coordinate system to obtain a first fitting curve of the target test frequency, wherein the horizontal axis of the first coordinate system is time and the vertical axis is the quality factor;

[0012] Using the slope of the first fitting curve of the target test frequency at each moment as the quality factor trend value of the target test frequency at each moment;

[0013] Taking any moment as the target moment, obtaining the local trend similarity of the target moment of the target test frequency according to the distribution of the quality factor trend values ​​at each moment in the preset time domain of the target moment of the target test frequency;

[0014] The product value of the local trend similarity and the quality factor trend value at the target moment of the target test frequency is used as the quality factor change degree at the target moment of the target test frequency.

[0015] Further, the obtaining of the local trend similarity of the target time of the target test frequency includes:

[0016] Any two adjacent moments within the preset time domain of the target moment are taken as an adjacent moment group, and the absolute value of the difference between the quality factor trend values ​​of the two moments in each adjacent moment group within the preset time domain of the target moment of the target test frequency is taken as the trend difference degree of each adjacent moment group;

[0017] A negative correlation normalization process is performed on the average values ​​of the trend differences of all adjacent moment groups within a preset time domain of the target moment of the target test frequency to obtain the local trend similarity of the target moment of the target test frequency.

[0018] Further, obtaining the temperature influence of the target test frequency includes:

[0019] Sorting the quality factor variation degrees at all moments of the target test frequency in time sequence to obtain a quality factor variation degree sequence of the target test frequency, and sorting the temperature data at all moments of the target test frequency to obtain a temperature sequence of the target test frequency;

[0020] The absolute value of the Pearson correlation coefficient between the quality factor variation sequence and the temperature sequence is used as the temperature influence of the target test frequency.

[0021] Further, the step of selecting a reference resonant frequency at each moment from all test frequencies includes:

[0022] Taking any moment as the moment to be tested, mapping the data points consisting of each test frequency and the quality factor at the moment to be tested of each test frequency into a second coordinate system, and performing curve fitting on all the data points in the second coordinate system to obtain a second fitting curve at the moment to be tested, wherein the horizontal axis of the second coordinate system is the test frequency, and the vertical axis is the quality factor;

[0023] The absolute value of the slope of the second fitting curve at each test frequency at the time to be tested is negatively correlated and mapped as the initial judgment value at the time to be tested at each test frequency; the product value of the quality factor at the time to be tested at each test frequency and the initial judgment value is used as the peak judgment value at the time to be tested at each test frequency;

[0024] Based on the peak value judgment value, a reference resonant frequency at the time to be tested is screened out from all test frequencies.

[0025] Further, the step of selecting a reference resonant frequency at the time to be tested from all test frequencies includes:

[0026] At the time to be tested, the test frequency corresponding to the maximum value of the peak judgment value is used as the reference resonant frequency at the time to be tested.

[0027] Further, obtaining the authenticity of the quality factor at each moment includes:

[0028] Using the reference resonant frequency at each moment and the data point formed by the quality factor of the reference resonant frequency at each moment as the reference data point at each moment;

[0029] Taking any moment as the moment to be analyzed, performing negative correlation mapping on the Euclidean distance of the reference data point between the moment to be analyzed and the next adjacent moment, and obtaining a first truthfulness evaluation value of the moment to be analyzed;

[0030] Taking the accumulated value of the temperature influence of all test frequencies between the reference resonant frequency at the time to be analyzed and the reference resonant frequency at the next adjacent time as the second authenticity evaluation value at the time to be analyzed;

[0031] The product value of the first authenticity evaluation value, the second authenticity evaluation value and the value at the time to be analyzed is normalized to obtain the authenticity of the quality factor at the time to be analyzed.

[0032] Further, obtaining the actual quality factor of the inductor element to be measured includes:

[0033] Taking the product value of the quality factor authenticity at each moment and the quality factor of the reference resonant frequency at each moment as the adjusted quality factor at each moment;

[0034] The average value of the adjusted quality factors at all times is used as the actual quality factor of the inductor element to be measured.

[0035] Furthermore, the performance test of the inductor component to be tested includes:

[0036] The actual quality factor of the inductor component to be tested is transmitted to the remote test terminal using the Internet of Things, and the remote test terminal performs a fully automatic performance test on the inductor component to be tested.

[0037] The present invention also proposes a computer electronic device, which includes a memory and a processor. The memory stores a computer program, and the processor implements any one of the steps of a fully automatic performance testing method for an inductor when executing the computer program.

[0038] The present invention has the following beneficial effects:

[0039] The present invention takes into account that the existing quality factor measurement results cannot reflect the actual performance of the inductor component, which reduces the accuracy of the performance test of the inductor component. Therefore, the quality factor and temperature data of the inductor component to be tested at each moment of different test frequencies within a preset time period are first obtained. Subsequently, based on the change characteristics of the quality factor and temperature data at each moment of the same test frequency and the change characteristics of the quality factor at the same moment of different test frequencies, the interference of temperature change on the quality factor measurement of the inductor component to be tested can be eliminated. Since the temperature of the inductor component to be tested will rise in the bridge test at the same test frequency, the resistivity of the conductor inside the inductor component to be tested will increase, which will eventually lead to a downward trend in the quality factor. Therefore, the quality factor change degree obtained first reflects the change of the quality factor. The trend of the quality factor change of the inductor component to be tested at each moment under the target test frequency is then reflected through the obtained temperature influence degree, and the degree of influence of temperature change on the quality factor change of the inductor component to be tested at the target test frequency, providing a data basis for the subsequent elimination of temperature interference. Due to the influence of temperature, the peak point of the quality factor measured in practice shifts. Therefore, the reference resonant frequency at each moment is firstly selected from all test frequencies, and the quality factor authenticity is used to reflect the degree to which the quality factor of the inductor component to be tested at the reference resonant frequency at each moment conforms to the actual situation, and then the actual quality factor is used to perform a performance test on the inductor component to be tested that is more in line with the actual situation, thereby improving the accuracy of the performance test of the inductor component to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0041] Figure 1 A flow chart of a fully automatic performance testing method for an inductor provided by an embodiment of the present invention;

[0042] Figure 2 A schematic diagram of a first fitting curve of a target test frequency provided by an embodiment of the present invention;

[0043] Figure 3 A graph showing the variation of the quality factor of a target test frequency at different times provided by an embodiment of the present invention;

[0044] Figure 4 A schematic diagram of a second fitting curve at a time to be measured provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0045] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of the fully automatic performance testing method and equipment of an inductor proposed by the present invention, its specific implementation method, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0046] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0047] The following is a detailed description of a method and device for fully automatic performance testing of an inductor provided by the present invention in conjunction with the accompanying drawings.

[0048] See also Figure 1 , which shows a flow chart of a fully automatic performance testing method for an inductor provided by an embodiment of the present invention, the method comprising:

[0049] Step S1: obtaining the quality factor and temperature data of the inductor component to be tested at each moment at different test frequencies within a preset time period.

[0050] The quality factor is an important indicator for measuring the performance of an inductor component and is used to describe the characteristics of the inductor component in terms of energy loss. Therefore, the embodiment of the present invention measures the quality factor of the inductor component to be tested to achieve a test of the performance of the inductor component to be tested. Since the liquid-cooled heat dissipation structure inductor component can detect the temperature of the inductor component in real time, the embodiment of the present invention selects the liquid-cooled heat dissipation structure inductor component as the inductor component to be tested, and then connects the inductor component to be tested to the test port of the LCR bridge, selects the measurement mode on the LCR bridge, starts the LCR bridge to start the test, and during the test, the LCR bridge applies a sinusoidal alternating current signal of a specific frequency to the inductor component to be tested, and then the LCR bridge responds to the sinusoidal alternating current signal and calculates the quality factor of the inductor component to be tested. Since the inductor component needs to respond to current signals of different frequencies in actual application scenarios, the quality factor of the inductor component to be tested is calculated. When a component is subjected to a bridge test, a plurality of sinusoidal alternating current signals of different test frequencies are usually applied to the inductor component, wherein the test frequency is the frequency of the sinusoidal alternating current signal applied by the bridge test. Therefore, the embodiment of the present invention needs to perform multiple LCR bridge tests on the inductor component to be tested, and the test frequency used in each LCR bridge test is different, and it is ensured that the test frequency is within the rated frequency range of the inductor component to be tested, so as to obtain the quality factor of the inductor component to be tested at each moment at different test frequencies within a preset time period, wherein the preset time period is set to 1 minute, and the sampling time interval of the quality factor of each bridge test is 0.1 second, that is, in each bridge test, the quality factor of the inductor component to be tested is collected every 0.1 second, and the specific values ​​of the preset time period and the sampling time interval can also be set by the implementer according to the specific real-time scenario, which is not limited here.

[0051] Since temperature is a key factor affecting the quality factor measurement, the embodiment of the present invention needs to use a temperature sensor installed on the inductor element to be tested to collect temperature data of the inductor element to be tested within a preset time period while performing the bridge test at each test frequency, so as to obtain the temperature data of the inductor element to be tested at each moment at different test frequencies, wherein the sampling time interval of the temperature data is the same as the sampling time interval of the quality factor to ensure the synchronization of the two data collections.

[0052] Step S2: Take any test frequency as the target test frequency, and obtain the quality factor variation degree of the target test frequency at each moment according to the change of the quality factor at each moment of the target test frequency and the change of the quality factor at each moment in the preset time domain of each moment; analyze the correlation between the quality factor variation degree and temperature data at all moments of the target test frequency to obtain the temperature influence degree of the target test frequency.

[0053] During the bridge test of the inductor component to be tested, since the inductor component to be tested is in a continuous working state, its internal temperature rises, causing the impedance and inductance of the inductor component to be tested to change, which will eventually cause the quality factor of the inductor component to be tested to show a downward trend. In addition, under the bridge test of different test frequencies, the temperature change of the inductor component to be tested and the influence of temperature on the quality factor are different. Therefore, it is necessary to analyze the specific test frequency. First, any test frequency is taken as the target test frequency, and then the change of the quality factor at each moment of the target test frequency is analyzed. At the same time, the change of the quality factor at each moment in the local range of a certain moment of the target test frequency is the greater the change of the quality factor. The closer the change of the quality factor at each moment is, the stronger the authenticity of the change of the quality factor at that moment is. Therefore, the change of the quality factor at each moment in the preset time domain of each moment can be combined, and the obtained quality factor change degree can be reflected in the bridge test of the target test frequency. The trend of the change of the quality factor of the inductor component to be tested at each moment provides a data basis for the subsequent analysis of the influence of temperature on the quality factor of the inductor component to be tested under the bridge test of the target test frequency. Among them, the length of the preset time domain at a certain moment is set to 11, that is, the preset time domain includes the moment and the 10 other moments closest to the moment. The specific value of the length of the preset time domain can also be set by the implementer according to the specific implementation scenario, which is not limited here.

[0054] Preferably, in one embodiment of the present invention, the method for obtaining the quality factor variation degree at each moment of the target test frequency specifically includes:

[0055] Map the data points consisting of each moment of the target test frequency and the quality factor at each moment into the first coordinate system, and perform curve fitting on all the data points in the first coordinate system to obtain the first fitting curve of the target test frequency. The horizontal axis of the first coordinate system is time, and the vertical axis is the quality factor. The curve fitting method can be selected from the least square method or other methods, which are not limited here. Please refer to Figure 2 , which shows a schematic diagram of a first fitting curve of a target test frequency provided by an embodiment of the present invention, wherein Q3 and Q4 are two data points on the first fitting curve respectively.

[0056] The slope of the first fitting curve of the target test frequency at each moment is used as the quality factor trend value of the target test frequency at each moment. The quality factor trend value is used to reflect the trend change of the quality factor of the inductor component to be tested at each moment under the target test frequency. The slope of the first fitting curve at each moment can be calculated by taking the first-order derivative of the first fitting curve at each moment.

[0057] Take any moment as the target moment. The more consistent the quality factor trend values ​​of each moment within the local short-time range of the target moment of the target test frequency are, the more real the change of the quality factor at the target moment is. Therefore, according to the distribution of the quality factor trend values ​​of each moment within the preset time domain of the target moment of the target test frequency, the local trend similarity of the target moment of the target test frequency can be obtained. Subsequently, the quality factor trend value can be adjusted based on the local trend similarity to improve the calculation accuracy of the quality factor change degree at the target moment.

[0058] Preferably, in one embodiment of the present invention, the method for obtaining the local trend similarity of the target test frequency at the target moment specifically includes:

[0059] Any two adjacent moments within the preset time domain of the target moment are taken as an adjacent moment group, and the absolute value of the difference between the quality factor trend values ​​of the two moments in each adjacent moment group within the preset time domain of the target moment of the target test frequency is taken as the trend difference of each adjacent moment group. The smaller the trend difference, the more similar the quality factor trend values ​​of the two adjacent moments are. Therefore, the average value of the trend difference of all adjacent moment groups within the preset time domain of the target moment of the target test frequency can be normalized by negative correlation, and the calculation result is limited to range, thereby obtaining the local trend similarity of the target moment of the target test frequency.

[0060] In the embodiment of the present invention, the natural constant A negative exponential function with base The normalization of negative correlation is realized by the functional form of , which is not limited here, where Represents a normalization function, which is used for normalization processing. In one embodiment of the present invention, the normalization processing can be specifically, for example, maximum and minimum value normalization processing, and the normalization in subsequent steps can adopt maximum and minimum value normalization processing. In other embodiments of the present invention, other normalization methods can be selected according to the specific range of values, which will not be described in detail.

[0061] As an example, in one embodiment of the present invention, the expression of the local trend similarity of the target test frequency at the target time can be specifically, for example, as follows:

[0062]

[0063] in, The local trend similarity of the target moment representing the target test frequency; and The first and second time periods of the target test frequency in the preset time domain are represented respectively. The quality factor trend value of two moments in a group of adjacent moments; The first time in the preset time domain indicating the target time of the target test frequency The trend difference of adjacent time groups; The number of adjacent time groups within a preset time domain representing the target time of the target test frequency.

[0064] Then, the product value of the local trend similarity and the quality factor trend value at the target time of the target test frequency can be used as the quality factor variation degree at the target time of the target test frequency.

[0065] As an example, in one embodiment of the present invention, the expression of the quality factor variation degree at the target time of the target test frequency may be specifically, for example, as follows:

[0066]

[0067] in, The quality factor variation at the target time representing the target test frequency; The local trend similarity of the target moment representing the target test frequency; Indicates the quality factor trend value at the target moment for the target test frequency.

[0068] The same method as above can be used to obtain the quality factor variation at each moment of the target test frequency. Figure 3 , which shows a curve diagram of the quality factor variation degree of the target test frequency at different moments provided by an embodiment of the present invention. Under the bridge test of the target test frequency, the stronger the correlation between the quality factor variation degree of the inductor element to be tested and the change in temperature data in time series, the greater the influence of temperature on the quality factor of the inductor element to be tested. Therefore, the correlation between the quality factor variation degree and temperature data at all moments of the target test frequency can be analyzed. The obtained temperature influence degree is reflected in the influence degree of temperature on the quality factor of the inductor element to be tested under the bridge test of the target test frequency. The greater the temperature influence degree, the greater the temperature influence degree, which indicates that under the bridge test of the target test frequency, the change in temperature will cause the quality factor of the inductor element to be tested to also change significantly, thereby providing a data basis for subsequently eliminating the influence of temperature.

[0069] Preferably, in one embodiment of the present invention, the method for obtaining the temperature influence of the target test frequency specifically includes:

[0070] According to the time sequence, the quality factor variation degrees of all moments of the target test frequency are sorted to obtain the quality factor variation degree sequence of the target test frequency, and the temperature data of all moments of the target test frequency are sorted to obtain the temperature sequence of the target test frequency. The stronger the correlation between the quality factor variation degree sequence and the temperature sequence, the greater the influence of temperature. Therefore, the absolute value of the Pearson correlation coefficient of the quality factor variation degree sequence and the temperature sequence can be used as the temperature influence of the target test frequency.

[0071] The temperature influence of each test frequency can be obtained by the same method as above.

[0072] Step S3: According to the change of the quality factor at the same moment of different test frequencies, the reference resonant frequency at each moment is screened out from all the test frequencies; according to the difference of the reference resonant frequencies at adjacent moments and the difference of the quality factors of the reference resonant frequencies at adjacent moments, and the temperature influence of each test frequency between the reference resonant frequencies at adjacent moments, the authenticity of the quality factor at each moment is obtained; according to the authenticity of the quality factor at each moment and the quality factor of the reference resonant frequency at each moment, the actual quality factor of the inductor component to be tested is obtained.

[0073] Since the inductor component to be tested needs to deal with more complex and changeable current frequencies in actual application scenarios, ideally, when using different test frequencies to perform bridge tests on the inductor component to be tested, at the same time, as the test frequency increases, the quality factor of the inductor component to be tested will usually increase. When the test frequency reaches the resonant frequency closest to the inductor component to be tested, the quality factor may peak. Then, as the test frequency continues to increase, the quality factor of the inductor component to be tested will decrease. Under the influence of temperature, the quality factor of the inductor component to be tested will shift at the peak point, that is, at a certain moment, the quality factor of a certain test frequency reaches its peak, and at the next moment, the quality factor of the test frequency reaches its peak. The quality factor of the test frequency did not reach the peak value, but the quality factor of another test frequency reached the peak value, that is, the quality factors reaching the peak values ​​at different moments correspond to different test frequencies. The main reason for this phenomenon is that the change in temperature causes the resonant frequency of the inductor element to be tested to change. Therefore, the embodiment of the present invention needs to screen out the reference resonant frequency at each moment from all test frequencies according to the change in the quality factor at the same moment of different test frequencies. Subsequently, based on the difference in the reference resonant frequency between adjacent moments and the difference in the quality factor of the reference resonant frequency, the peak point offset of the quality factor of the inductor element to be tested can be analyzed to reduce the influence of temperature on the performance test of the inductor element to be tested.

[0074] Preferably, in one embodiment of the present invention, the method of selecting the reference resonant frequency at each moment from all test frequencies specifically includes:

[0075] First, any moment is taken as the moment to be tested, and the data points consisting of each test frequency and the quality factor of each test frequency at the moment to be tested are mapped to the second coordinate system, and curve fitting is performed on all data points in the second coordinate system to obtain the second fitting curve at the moment to be tested. The horizontal axis of the second coordinate system is the test frequency, and the vertical axis is the quality factor. The least square method or other methods can be selected for the curve fitting method, which is not limited here. Please refer to Figure 4 , which shows a schematic diagram of a second fitting curve at a time to be measured provided by an embodiment of the present invention, wherein Q1 and Q2 are two data points on the second fitting curve respectively.

[0076] The absolute value of the slope of the second fitting curve at the time to be tested at each test frequency is negatively correlated and mapped as the initial judgment value of the time to be tested for each test frequency, wherein the slope of the first fitting curve at each time can be calculated by taking the first-order derivative of the second fitting curve at each test frequency. The larger the initial judgment value of the time to be tested for each test frequency, the closer the slope of the second fitting curve at each test frequency is to 0, and the more likely the quality factor of the time to be tested for each test frequency is to reach a peak value. At the same time, the larger the quality factor of each test frequency at the time to be tested, the more likely the quality factor of each test frequency at the time to be tested is to reach a peak value. Therefore, the product value of the quality factor at the time to be tested for each test frequency and the initial judgment value can be used as the peak judgment value of the time to be tested for each test frequency.

[0077] The larger the peak judgment value of a test frequency at the time to be tested, the more likely the test frequency is to be close to the resonant frequency of the inductor component to be tested. Therefore, based on the peak judgment value, the reference resonant frequency at the time to be tested can be screened out from all test frequencies.

[0078] Preferably, in an embodiment of the present invention, at the time to be tested, the test frequency corresponding to the maximum value of the peak judgment value can be used as the reference resonant frequency at the time to be tested.

[0079] As an example, in one embodiment of the present invention, the expression of the peak judgment value at the time to be tested of each test frequency can be specifically, for example, as follows:

[0080]

[0081] in, Indicates The peak value of the test frequency at the time of testing; The second fitting curve representing the time to be measured is The slope at the test frequency; Indicates The initial judgment value of the test frequency at the time to be tested; Indicates The quality factor of the test frequency at the time of test; Indicates the preset first adjustment parameter to prevent the denominator from being 0. The value range is In one embodiment of the present invention, Set to 0.01, The specific value of can also be set by the implementer according to the specific implementation scenario and is not limited here.

[0082] It should be noted that in other embodiments of the present invention, negative correlation mapping may be achieved through other basic mathematical operations, which will not be elaborated herein.

[0083] The reference resonant frequency at each moment can be obtained by the same method as above. In the deviation phenomenon caused by temperature, not only the reference resonant frequencies at different moments will be different, but also the quality factors of the reference resonant frequencies at different moments will be different. In the deviation process, if the deviation degree of the quality factor of the reference resonant frequency at a certain moment to the quality factor of the reference resonant frequency at the next moment is smaller, and the degree to which the change of each test frequency between the reference resonant frequencies at these two moments is affected by temperature is greater, it means that each test frequency between the reference resonant frequencies at these two moments can still maintain a small deviation degree when being affected by temperature to a greater extent, thereby This indicates that the better the quality factor of the reference resonant frequency at that moment is, the better it can reflect the actual operating performance of the inductor component to be tested. Therefore, the difference in the reference resonant frequencies at adjacent moments and the difference in the quality factors of the reference resonant frequencies at adjacent moments, as well as the temperature influence of each test frequency between the reference resonant frequencies at adjacent moments can be analyzed. The obtained quality factor authenticity reflects the degree to which the quality factor of the inductor component to be tested at the reference resonant frequency at each moment conforms to the actual operating conditions. Subsequently, the quality factor authenticity at each moment and the quality factor of the reference resonant frequency at each moment can be combined to accurately calculate and analyze the actual quality factor of the inductor component to be tested, thereby reducing the influence of temperature on the performance test of the inductor component to be tested.

[0084] Preferably, in one embodiment of the present invention, the method for obtaining the authenticity of the quality factor at each moment specifically includes:

[0085] First, a data point consisting of a reference resonant frequency at each moment and a quality factor of the reference resonant frequency at each moment is used as a reference data point at each moment.

[0086] Take any moment as the moment to be analyzed. The smaller the Euclidean distance of the reference data point between the moment to be analyzed and the next adjacent moment, the smaller the offset from the moment to be analyzed to the next adjacent moment. Therefore, the Euclidean distance of the reference data point between the moment to be analyzed and the next adjacent moment can be negatively correlated to obtain the first authenticity evaluation value of the moment to be analyzed.

[0087] Then, the accumulated value of the temperature influence of all test frequencies between the reference resonant frequency at the time to be analyzed and the reference resonant frequency at the next adjacent time is taken as the second authenticity evaluation value at the time to be analyzed, wherein the test frequency between the reference resonant frequency at the time to be analyzed and the reference resonant frequency at the next adjacent time refers to the temperature influence of all test frequencies between the reference resonant frequency at the time to be analyzed and the reference resonant frequency at the next adjacent time. The test frequency is within the range of represents the reference resonant frequency at the time to be analyzed, Indicates the reference resonant frequency of the next moment adjacent to the moment to be analyzed, represents the minimum value function, Represents the maximum value function.

[0088] Considering that the inductor to be tested is in a continuously powered state in actual application, the longer the test time is, the more realistic the performance of the inductor to be tested in actual application is. Therefore, the product of the first authenticity evaluation value and the second authenticity evaluation value and the value at the time to be analyzed can be normalized, and the calculation result can be limited to range, thereby obtaining the authenticity of the quality factor at the time to be analyzed.

[0089] As an example, in one embodiment of the present invention, the expression of the authenticity of the quality factor at the time to be analyzed can be specifically, for example, as follows:

[0090]

[0091] in, Indicates the authenticity of the quality factor at the moment to be analyzed; Represents the Euclidean distance of the reference data point between the moment to be analyzed and the next adjacent moment; represents the first truthfulness evaluation value at the time to be analyzed; The first resonant frequency between the reference resonant frequency at the time to be analyzed and the reference resonant frequency at the next adjacent time. Temperature influence of each test frequency; Indicates the number of test frequencies between the reference resonant frequency at the moment to be analyzed and the reference resonant frequency at the next adjacent moment; A second authenticity evaluation value representing the time to be analyzed; The value representing the time to be analyzed; Represents the normalization function.

[0092] It should be noted that in other embodiments of the present invention, negative correlation mapping may be achieved through other basic mathematical operations, which will not be elaborated herein.

[0093] The quality factor authenticity of each moment can be obtained by the same method as above. It should be noted that since there is no adjacent next moment to the last moment, the average value of the quality factor authenticity of all moments before the last moment can be used as the quality factor authenticity of the last moment.

[0094] Furthermore, the actual quality factor of the inductor element to be tested can be obtained according to the authenticity of the quality factor at each moment and the quality factor of the reference resonant frequency at each moment, and the performance of the inductor element to be tested in the actual operation process can be accurately tested based on the actual quality factor.

[0095] Preferably, in one embodiment of the present invention, the method for obtaining the actual quality factor of the inductor element to be measured specifically includes:

[0096] The product value of the quality factor authenticity at each moment and the quality factor of the reference resonant frequency at each moment is used as the adjusted quality factor at each moment, wherein the quality factor authenticity at a certain moment plays a role in adjusting the quality factor of the reference resonant frequency at that moment, so that the adjusted quality factor can more accurately reflect the actual operating performance of the inductor component to be tested at each moment, and the average value of the adjusted quality factors at all moments is used as the actual quality factor of the inductor component to be tested.

[0097] As an example, in one embodiment of the present invention, the expression of the actual quality factor of the inductor element to be measured may be specifically, for example, as follows:

[0098]

[0099] in, Indicates the actual quality factor of the inductor component to be tested; Indicates The quality factor authenticity at each moment; Indicates The quality factor of the reference resonant frequency at a certain moment; Indicates The adjusted quality factor at each moment; Indicates the number of all moments in the preset time period.

[0100] Step S4: Based on the actual quality factor, a performance test is performed on the inductor component to be tested.

[0101] Since the actual quality factor can more accurately reflect the performance of the inductor component to be tested in actual operation, the performance test of the inductor component to be tested can be performed based on the actual quality factor, thereby improving the accuracy of the performance test of the inductor component to be tested.

[0102] Preferably, in one embodiment of the present invention, the method for performing performance testing on an inductor component to be tested specifically includes:

[0103] In the automated performance testing of inductor components, indicators that can evaluate the performance are usually input into the test terminal, and the test terminal implements automated testing and evaluation of the performance of the inductor components. Therefore, the actual quality factor of the inductor component to be tested can be transmitted to the remote test terminal using the Internet of Things, and the remote test terminal can perform fully automated performance testing on the inductor component to be tested.

[0104] The present invention also proposes a computer electronic device, the electronic device includes a memory and a processor, the memory stores a computer program, and the processor implements the method described in steps S1 to S4 when executing the computer program.

[0105] It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0106] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

Claims

1. A fully automatic performance testing method for inductors, characterized in that: The method comprises: Obtaining quality factor and temperature data of the inductor component to be tested at each moment at different test frequencies within a preset time period; Taking any test frequency as the target test frequency, obtaining the quality factor variation degree of the target test frequency at each moment according to the change of the quality factor at each moment of the target test frequency and the change of the quality factor at each moment in the preset time domain of each moment; analyzing the correlation between the quality factor variation degree and the temperature data at all moments of the target test frequency to obtain the temperature influence degree of the target test frequency; According to the change of the quality factor at the same moment of different test frequencies, the reference resonant frequency at each moment is screened out from all test frequencies; according to the difference of the reference resonant frequencies at adjacent moments and the difference of the quality factors of the reference resonant frequencies at adjacent moments, and the temperature influence of each test frequency between the reference resonant frequencies at adjacent moments, the authenticity of the quality factor at each moment is obtained; according to the authenticity of the quality factor at each moment and the quality factor of the reference resonant frequency at each moment, the actual quality factor of the inductor element to be tested is obtained; Based on the actual quality factor, performing a performance test on the inductor component to be tested; The step of obtaining the quality factor variation at each moment of the target test frequency includes: Mapping data points formed by each moment of the target test frequency and the quality factor at each moment into a first coordinate system, and performing curve fitting on all data points in the first coordinate system to obtain a first fitting curve of the target test frequency, wherein the horizontal axis of the first coordinate system is time and the vertical axis is the quality factor; Using the slope of the first fitting curve of the target test frequency at each moment as the quality factor trend value of the target test frequency at each moment; Taking any moment as the target moment, obtaining the local trend similarity of the target moment of the target test frequency according to the distribution of the quality factor trend values ​​at each moment in the preset time domain of the target moment of the target test frequency; The product value of the local trend similarity and the quality factor trend value at the target time of the target test frequency is used as the quality factor change degree at the target time of the target test frequency; The local trend similarity of the target time at which the target test frequency is obtained includes: Any two adjacent moments within the preset time domain of the target moment are taken as an adjacent moment group, and the absolute value of the difference between the quality factor trend values ​​of the two moments in each adjacent moment group within the preset time domain of the target moment of the target test frequency is taken as the trend difference degree of each adjacent moment group; Performing negative correlation normalization processing on the average values ​​of the trend differences of all adjacent time groups within a preset time domain of the target moment of the target test frequency to obtain the local trend similarity of the target moment of the target test frequency; The step of obtaining the temperature influence of the target test frequency includes: Sorting the quality factor variation degrees at all moments of the target test frequency in time sequence to obtain a quality factor variation degree sequence of the target test frequency, and sorting the temperature data at all moments of the target test frequency to obtain a temperature sequence of the target test frequency; The absolute value of the Pearson correlation coefficient between the quality factor variation sequence and the temperature sequence is used as the temperature influence of the target test frequency; The obtaining of the quality factor authenticity at each moment includes: Using the reference resonant frequency at each moment and the data point formed by the quality factor of the reference resonant frequency at each moment as the reference data point at each moment; Taking any moment as the moment to be analyzed, performing negative correlation mapping on the Euclidean distance of the reference data point between the moment to be analyzed and the next adjacent moment, and obtaining a first truthfulness evaluation value of the moment to be analyzed; Taking the accumulated value of the temperature influence of all test frequencies between the reference resonant frequency at the time to be analyzed and the reference resonant frequency at the next adjacent time as the second authenticity evaluation value at the time to be analyzed; Normalizing the product of the first authenticity evaluation value, the second authenticity evaluation value and the value at the time to be analyzed to obtain the authenticity of the quality factor at the time to be analyzed; The obtaining of the actual quality factor of the inductor element to be measured comprises: Taking the product value of the quality factor authenticity at each moment and the quality factor of the reference resonant frequency at each moment as the adjusted quality factor at each moment; The average value of the adjusted quality factors at all times is used as the actual quality factor of the inductor element to be measured.

2. The fully automatic performance testing method of an inductor according to claim 1, characterized in that: The step of selecting the reference resonant frequency at each moment from all the test frequencies comprises: Taking any moment as the moment to be tested, mapping the data points consisting of each test frequency and the quality factor at the moment to be tested of each test frequency into a second coordinate system, and performing curve fitting on all the data points in the second coordinate system to obtain a second fitting curve at the moment to be tested, wherein the horizontal axis of the second coordinate system is the test frequency, and the vertical axis is the quality factor; The absolute value of the slope of the second fitting curve at each test frequency at the time to be tested is negatively correlated and mapped as the initial judgment value at the time to be tested at each test frequency; the product value of the quality factor at the time to be tested at each test frequency and the initial judgment value is used as the peak judgment value at the time to be tested at each test frequency; Based on the peak value judgment value, a reference resonant frequency at the time to be tested is screened out from all test frequencies.

3. The fully automatic performance testing method of an inductor according to claim 2, characterized in that: The step of selecting the reference resonant frequency at the time to be tested from all test frequencies comprises: At the time to be tested, the test frequency corresponding to the maximum value of the peak judgment value is used as the reference resonant frequency at the time to be tested.

4. The fully automatic performance testing method of an inductor according to claim 1, characterized in that: The performance test of the inductor component to be tested includes: The actual quality factor of the inductor component to be tested is transmitted to the remote test terminal using the Internet of Things, and the remote test terminal performs a fully automatic performance test on the inductor component to be tested.

5. A computer electronic device, comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 4 are implemented.

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