Metrology device and production apparatus

Abstract

The application relates to a measuring device and a production device, the measuring device comprising a measuring module, a driving platform, a transfer structure and an illumination assembly, the measuring module comprising a camera; the driving platform being provided with a measuring area corresponding to the detection range of the camera; the transfer structure being movably arranged on the driving platform and capable of moving to the measuring area, the transfer structure comprising a support, a load beam arranged on the support and a jig arranged on the load beam, the jig being used for picking up a workpiece; the illumination assembly comprising a first backlight assembly and a second backlight assembly, the first backlight assembly being arranged on the load beam and facing the jig, the second backlight assembly being located in the measuring area at least when the transfer structure is in the measuring area, along the optical axis of the camera, the second backlight assembly being located at a position away from the camera relative to the load beam; wherein the load beam is rotationally connected with the support, the load beam being capable of rotating to a position where the first backlight assembly faces the camera, and the load beam being capable of rotating to a position where the jig and the workpiece are suspended between the camera and the second backlight assembly.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of measurement, in particular to a measuring device and a production equipment. BACKGROUND

[0002] With the development of science and technology, in order to realize specific and complex functions, the precision requirements of various devices and equipment for their constituent elements are also increasing. Therefore, at present, the product is usually detected for flaws and measured for size before it is shipped, so as to exclude defective products. In the traditional technology, the way of detecting flaws and measuring of the product is similar, that is, a camera is matched with a light source to obtain the image of the product to be detected, and whether the product meets the requirements is determined by analyzing the image. For the way of detecting flaws and measuring in the traditional technology, the light source illumination mode is an important factor affecting the quality of the image obtained by the camera.

[0003] However, in the current flaw detection and measurement mode, there is a problem that the image obtained is not convenient to process due to insufficient illumination. SUMMARY

[0004] Therefore, it is necessary to provide a measuring device and a production equipment to solve the problem that the product detection and measurement are not convenient due to insufficient illumination.

[0005] In one aspect, the present application provides a measuring device, which comprises a measuring module, a driving platform, a transfer structure and an illumination assembly. The measuring module comprises a camera. The driving platform is provided with a measuring area corresponding to the detection range of the camera. The transfer structure is movably arranged on the driving platform, and the transfer structure can move to the measuring area. The transfer structure comprises a support, a load beam arranged on the support, and a jig arranged on the load beam, wherein the jig is used to pick up a workpiece. The illumination assembly comprises a first backlight assembly and a second backlight assembly. The first backlight assembly is arranged on the load beam and faces the jig. The second backlight assembly is located in the measuring area at least when the transfer structure is in the measuring area, and is located along the optical axis of the camera. The second backlight assembly is located at a position away from the camera relative to the load beam. The load beam is rotationally connected with the support. The load beam can be rotated to a position where the first backlight assembly faces the camera, and the load beam can be rotated to a position where the jig and the workpiece are suspended between the camera and the second backlight assembly.

[0006] In one embodiment, the first backlight assembly and the jig are arranged on the same side of the load beam.

[0007] In one embodiment, the orthographic projection of the jig on the first backlight assembly is located within the orthographic projection of the workpiece picked up by the jig on the first backlight assembly.

[0008] In one of the embodiments, the jig is configured as a light-transmissive or partially light-transmissive member, and the first backlight assembly is configured to provide the illumination light to the workpiece through the jig.

[0009] In one of the embodiments, the plurality of jigs are arranged along a reference direction, and the first backlight assembly and / or the second backlight assembly are arranged in a strip shape along the reference direction to provide the illumination light to the area where the jigs are located.

[0010] In one of the embodiments, the plurality of jigs are arranged along a reference direction, and the first backlight assembly and / or the second backlight assembly include a plurality of illumination portions arranged along the reference direction, and the plurality of illumination portions correspond to the plurality of jigs to provide the illumination.

[0011] In one of the embodiments, the transfer structure further includes a driving member, the load beam is hollow and rotates relative to the support around a first axis, the first backlight assembly is provided with a plurality of through holes, and the plurality of driving members are arranged in the load beam and partially extend outside the load beam through the through holes, and the plurality of driving members are respectively connected to the plurality of jigs to drive the plurality of jigs to rotate synchronously around a second axis and rotate independently.

[0012] In one of the embodiments, the first axis is perpendicular to the second axis.

[0013] In one of the embodiments, the first backlight assembly is configured as a plate, and the second axis is perpendicular to the first backlight assembly.

[0014] In one of the embodiments, the driving platform is connected to the support to drive the transfer structure to move to the measurement area, and the second backlight assembly is arranged in the measurement area and faces the camera.

[0015] In one of the embodiments, the driving platform includes a driving component and a panel covering the driving component, and part of the structure of the support extends between the driving component and the panel to be connected to the driving component, and the second backlight assembly is fixed to one side of the panel facing the camera.

[0016] In one of the embodiments, the second backlight assembly is arranged at a position of the support away from the load beam and facing the side where the camera is located.

[0017] In one of the embodiments, the support includes two uprights and a connecting plate, the two uprights are spaced apart, the connecting plate is connected between the two uprights, the connecting plate is connected with the driving platform, two ends of the load beam are rotatably connected with the two uprights respectively, and the load beam is closer to the side where the camera is located relative to the connecting plate; the second backlight assembly is arranged on the support in the region between the load beam and the connecting plate and extends laterally outward to the space outside the load beam and the connecting plate.

[0018] In one of the embodiments, the measurement device further includes a base and a frame arranged on the base, the driving platform and the illumination assembly are arranged on the base, and the measurement module further includes a light source, the light source provides illumination for the shooting of the camera, and the camera and the light source are arranged on the frame.

[0019] Another aspect of the present application provides another production equipment, which includes the measurement device as described above.

[0020] In the measurement device, the first backlight assembly and the jig are arranged on the load beam, and the first backlight assembly faces the jig. When the load beam is rotated relative to the support to a position where the first backlight assembly faces the camera, the first backlight assembly faces the jig and the camera, and thus the illumination light provided by the first backlight assembly can highlight the outer contour of the workpiece picked up by the jig, i.e. provide backlight effect, so that the camera can obtain an image with high contrast, facilitating measurement analysis. Further, the second backlight assembly is located in the measurement area. In the direction indicated by the optical axis of the camera, the second backlight assembly is located at a position away from the camera relative to the load beam, so that the load beam can be conveniently rotated to a position where the jig and the workpiece are suspended between the camera and the second backlight assembly. At this time, the illumination light of the second backlight assembly can also highlight the outer contour of the workpiece picked up by the jig, i.e. provide backlight effect to facilitate measurement analysis. It is easy to understand that the load beam is switched between the position where the first backlight assembly provides illumination and the position where the second backlight assembly provides illumination by rotation. With the rotation of the load beam, the posture of the workpiece located on the load beam also changes. That is, the posture of the workpiece under the illumination of the first backlight assembly is different from the posture of the workpiece under the illumination of the second backlight assembly, and the posture of the workpiece can be switched by rotating the load beam, so that the first backlight assembly and the second backlight assembly can provide backlight illumination respectively, and the dimensions of the workpiece in all directions can be fully measured. BRIEF DESCRIPTION OF DRAWINGS

[0021] Figure 1a A side view of an exemplary detection device provided by an embodiment of the present application.

[0022] Figure 1b A side view of the exemplary detection device shown. Figure 1a A side view of the exemplary detection device shown.

[0023] Figure 2 A side view of the measuring device provided by an embodiment of the present application.

[0024] Figure 3 For Figure 2 A distribution diagram of the moving structure, the lighting assembly and the measuring module in the measuring device shown in FIG. 1 when the load beam is in the first detection position.

[0025] Figure 4 For Figure 2 A distribution diagram of the moving structure, the lighting assembly and the measuring module in the measuring device shown in FIG. 1 when the load beam is in the second detection position.

[0026] Figure 5 For Figure 2 A perspective view of the moving structure and the driving platform in the measuring device shown in FIG. 1.

[0027] Figure 6 For Figure 2 A perspective view of the moving structure in the measuring device shown in FIG. 1.

[0028] Figure 7 A front view of the moving structure provided by a second aspect of an embodiment of the present application.

[0029] Figure 8 A top view of the first backlight assembly provided by a third aspect of an embodiment of the present application.

[0030] Reference signs: 10, measuring device; 100, measuring module; 110, camera; 120, light source; 200, moving structure; 210, support; 211, column; 212, connecting plate; 220, load beam; 230, jig; 240, driving member; 300, lighting assembly; 301, lighting part; 310, first backlight assembly; 311, through hole; 320, second backlight assembly; 400, driving platform; 401, measuring area; 410, driving part; 420, panel; 500, rack; 20, workpiece; 30, carrier; 31, support structure; 32, rotating structure; 33, picking structure; 40, product; 41, top surface; 42, side surface; U, first rotating shaft; O1, first axis; O2, second axis; L, optical axis; L0, lighting light; K, reference direction; S, distribution direction. DETAILED DESCRIPTION

[0031] In order to make the above objectives, features and advantages of the present application more clear and comprehensible, the specific embodiments of the present application will be described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. However, the present application can be practiced in a number of different ways beyond the specific embodiments described herein and by one of ordinary skill in the art without departing from the spirit and scope of the present application, and it is therefore intended that all such variations be considered as falling within the scope of the present application. It should be understood that the use of the terms "include", "comprise" or "contain" herein should not be understood as limiting the present application to the features or steps described herein, but rather the use of these terms is intended to cover the presence of the features or steps described herein as well as the presence of other features or steps not described herein.

[0032] In the description of the present application, it should be understood that, if these terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the purpose of facilitating the description of the present application and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application.

[0033] In addition, if these terms "first", "second" appear, these terms are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features referred to. Therefore, the features defined with "first", "second" can include at least one of the features explicitly or implicitly. In the description of the present application, if the term "a plurality of" appears, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise explicitly specified.

[0034] In the present application, unless otherwise explicitly specified and limited, if the terms "mount", "connect", "connect", "fix" and the like appear, these terms should be interpreted broadly. For example, it can be fixedly connected, or it can be detachably connected, or it can be integrated; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the internal communication or interaction relationship of two elements, unless otherwise explicitly limited. For those of ordinary skill in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0035] In the present application, unless specifically stated and limited otherwise, if there is a description of a first feature "on" or "under" a second feature, etc., it can mean that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature "over", "above" and "on top of" the second feature can be that the first feature is directly above or obliquely above the second feature, or only means that the first feature is higher in horizontal height than the second feature. The first feature "under", "below" and "underneath" the second feature can be that the first feature is directly below or obliquely below the second feature, or only means that the first feature is lower in horizontal height than the second feature.

[0036] It should be noted that if an element is referred to as being "fixed" or "set" on another element, it can be directly on the other element or there can be an intermediate element. If an element is considered to be "connected" to another element, it can be directly connected to the other element or there can be an intermediate element. If present, the terms "vertical", "horizontal", "up", "down", "left", "right" and similar expressions used in the present application are only for illustrative purposes and do not represent the only implementation.

[0037] The detection device in the prior art generally comprises a base, a detection module and a carrier 30, and the carrier 30 and the detection module are arranged on the base. The detection module comprises a camera and a light source, and the detection module is usually erected by the base so that the camera and the light source have a higher position relative to the carrier 30, facilitating detection. In combination with Figure 1a and Figure 1b , the carrier 30 generally comprises a support structure 31, a rotating structure 32 and a picking structure 33, the support structure 31 is connected with the base, the rotating structure 32 is arranged on the support structure 31, and the rotating structure 32 can rotate relative to the support structure 31 about a first rotation axis U. The picking structure 33 is used for picking a product 40, and the picking structure 33 is arranged on the top surface of the rotating structure 32. Thus, as shown in Figure 1a , when the picking structure 33 rotates with the rotating structure 32 to a top surface 41 of the product 40 facing the detection module, the detection module can detect the top surface 41 of the product 40. Similarly, as shown in Figure 1b , when the picking structure 33 rotates with the rotating structure 32 to a side surface 42 of the product 40 facing the detection module, the detection module can detect the side surface 42 of the product 40. However, as described above, since the light source 120 is erected together with the camera to be located at a high position relative to the carrier 30, when the detection device needs to measure the size of the product 40, the illumination is often insufficient, and it is difficult to effectively distinguish the edge contour of the product 40 from the background, resulting in that the image processing is difficult to obtain.

[0038] To solve the above problems, the present application provides a measuring device, which comprises a measuring module, a transfer structure and an illumination assembly. The measuring module is used for detecting and measuring a workpiece picked up by the transfer structure. The transfer structure comprises a support, a load beam and a jig. The load beam is rotatably arranged on the support, and the jig is arranged on the load beam and used for picking up the workpiece. The illumination assembly comprises a first backlight assembly and a second backlight assembly. The first backlight assembly is arranged on the load beam and faces the jig. Therefore, when the load beam is rotated to the side of the jig facing the measuring module, the top surface of the workpiece faces the measuring module, and the first backlight assembly can provide backlight effect to highlight the outer contour of the workpiece. The second backlight assembly can be opposite to the measuring module. When the side surface of the workpiece needs to be detected, the load beam can be driven to overturn relative to the support, so that the workpiece extends into the space sandwiched by the second backlight assembly and the measuring module from the side and is arranged in a suspended manner. Therefore, the second backlight assembly can provide backlight effect when the side surface of the workpiece is detected, highlighting the outer contour in another direction of the workpiece. Therefore, the measuring device provided by the present application can simultaneously measure the size of at least two surfaces of the workpiece. The measuring module provided by each embodiment of the present application will be described in detail below in combination with the accompanying drawings and specific embodiments.

[0039] Referring to Figure 2 , Figure 2 FIG. 1 is a side view of a measuring device provided by an embodiment of the present application. The measuring device 10 provided by an embodiment of the present application can detect and measure a workpiece 20. Each embodiment is described by taking measurement as an example. It should be understood that the measuring device 10 also detects the workpiece 20 for defects, and thus will not be described separately.

[0040] Referring to Figures 2 to 4In one embodiment, the measurement device 10 comprises a measurement module 100, a transfer structure 200, an illumination assembly 300, and a driving platform 400. The transfer structure 200 is configured to pick up the workpiece 20. The measurement module 100 comprises a camera 110 configured to detect and measure the appearance of the workpiece 20 within the detection range of the camera 110. The driving platform 400 is provided with a measurement area 401 corresponding to the detection range of the camera 110. The transfer structure 200 is movably arranged on the driving platform 400, and is configured to move to the measurement area 401. When the transfer structure 200 is within the measurement area 401, the workpiece 20 picked up by the transfer structure 200 can be measured. The transfer structure 200 comprises a support 210, a load beam 220 arranged on the support 210, and a jig 230 arranged on the load beam 220, and the jig 230 is configured to pick up the workpiece 20. The illumination assembly 300 comprises a first backlight assembly 310 and a second backlight assembly 320. The first backlight assembly 310 is arranged on the load beam 220 and faces the jig 230. The second backlight assembly 320 is arranged in the measurement area 401 at least when the transfer structure 200 is in the measurement area 401. Moreover, along the optical axis L of the camera 110, the second backlight assembly 320 is arranged at a position away from the camera 110 relative to the load beam 220. The load beam 220 is rotatably connected to the support 210, and the load beam 220 is configured to rotate to a position in which the first backlight assembly 310 faces the camera 110, and the load beam 220 is configured to rotate to a position in which the jig 230 and the workpiece 20 are suspended between the camera 110 and the second backlight assembly 320.

[0041] In the measurement device 10 described above, the first backlight assembly 310 and the jig 230 are both arranged on the load beam 220, and the first backlight assembly 310 faces the jig 230. As shown in Figure 3 When the load beam 220 is rotated relative to the support 210 to the position in which the first backlight assembly 310 faces the camera 110, the first backlight assembly 310 faces the jig 230 and the camera 110, and thus the illumination light provided by the first backlight assembly 310 can highlight the outer contour of the workpiece 20 picked up by the jig 230, i.e., provide a backlight effect, so that the camera 110 can acquire an image with high contrast, facilitating measurement and analysis. As shown in Figure 4, further, the second backlight assembly 320 is located in the measurement area 401. And, in the direction indicated by the optical axis L of the camera 110, the second backlight assembly 320 is located at a position away from the camera 110 relative to the carrier beam 220, so that the carrier beam 220 can be conveniently rotated to a position where the workpiece 20 held by the jig 230 is suspended between the camera 110 and the second backlight assembly 320. At this time, the illumination light of the second backlight assembly 320 can also highlight the outer contour of the workpiece 20 held by the jig 230, i.e. provide a backlight effect to facilitate measurement analysis. It is easy to understand that the carrier beam 220 is switched between a position where the first backlight assembly 310 provides illumination and a position where the second backlight assembly 320 provides illumination by rotating. With the rotation of the carrier beam 220, the posture of the workpiece 20 held by the carrier beam 220 also changes. That is, the posture of the workpiece 20 when illuminated by the first backlight assembly 310 is different from the posture of the workpiece 20 when illuminated by the second backlight assembly 320. By rotating the carrier beam 220, the posture of the workpiece 20 can be switched, so that the first backlight assembly 310 and the second backlight assembly 320 can provide backlight illumination respectively, and the dimensions of the workpiece 20 in all directions can be fully measured.

[0042] As shown in Figure 4 , the workpiece 20 is suspended between the camera 110 and the second backlight assembly 320, which means that the illumination light L0 provided by the second backlight assembly 320 and directed to the workpiece 20 is not blocked by other structures except the workpiece 20, so that the outer contour of the workpiece 20 can be highlighted.

[0043] Regarding the above-mentioned second backlight assembly 320, at least when the transfer structure 200 is located in the measurement area 401, the second backlight assembly 320 is located in the measurement area 401, as shown in Figure 2 , in a first aspect, the second backlight assembly 320 can be directly arranged in the measurement area 401 and face the camera 110, so that when the carrier beam 220 is rotated to a position where the workpiece 20 is located between the second backlight assembly 320 and the camera 110, the second backlight assembly 320 can provide a backlight effect to facilitate measurement. As shown in Figure 7 , in a second aspect, the second backlight assembly 320 can also be arranged on the support 210 at a position away from the camera 110 relative to the carrier beam 220, so that the second backlight assembly 320 can move with the transfer structure 200 as a whole to the measurement area 401. At this time, the carrier beam 220 can also be rotated to a position where the workpiece 20 is located between the second backlight assembly 320 and the camera 110. The following embodiments will describe two different arrangement modes of the second backlight assembly 320 in combination with specific components of the transfer structure 200.

[0044] It is understood that the first backlight assembly 310 is closer to the support beam 220 relative to the fixture 230 in order to provide backlight illumination. The aforementioned orientation of the first backlight assembly 310 toward the measurement module 100 refers to the light-emitting side of the first backlight assembly 310 facing the camera 110. For ease of explanation in various embodiments, the position of the support beam 220 relative to the bracket 210 when the first backlight assembly 310 faces the camera 110 is recorded as the first detection position. The position of the support beam 220 relative to the bracket 210 when the fixture 230 and the workpiece 20 are suspended between the second backlight assembly 320 and the camera 110 is recorded as the second detection position. The angle through which the support beam 220 rotates from the first detection position to the second detection position relative to the bracket 210 is recorded as the switching angle.

[0045] like Figure 3 As shown, beam 220 is in the first detection position. Figure 4 As shown, the support beam 220 is in the second detection position. When the support beam 220 is in the first detection position, in the image acquired by the camera 110, the area of ​​the first backlight assembly 310 not obscured by the workpiece 20 is relatively bright, while the area of ​​the first backlight assembly 310 obscured by the workpiece 20 is relatively dark. The comparison between the bright and dark areas facilitates the determination of the outline of the workpiece 20, making it easier to analyze and obtain the dimensions of the workpiece 20. The same principle applies when the support beam 220 is in the second detection position, so it will not be described further.

[0046] Please see Figures 2 to 4 Furthermore, taking the first backlight assembly 310 and fixture 230 located on the top surface of the support beam 220 as an example. Figure 3 When the top surface of the support beam 220 faces the camera 110 (i.e., when the support beam 220 is in the first detection position), the upper surface of the workpiece 20 picked up by the fixture 230 also faces the camera 110. Under the backlighting effect of the first backlight assembly 310, the camera 110 can easily obtain the relevant dimensions (e.g., length and width) of the upper surface of the workpiece 20. Figure 4 When the support beam 220 rotates relative to the bracket 210 through the aforementioned switching angle, so that the top surface of the support beam 220 faces to the side, one side circumferential surface of the workpiece 20 picked up by the fixture 230 will face the camera 110. Under the backlighting effect of the second backlight assembly 320, the camera 110 can easily acquire the relevant dimensions (e.g., thickness, width, or length) of the side circumferential surface of the workpiece 20. For a workpiece 20 that is generally plate-shaped, after being detected at the first detection position and the second detection position respectively, the dimensions of the workpiece 20 in each direction can be determined. Of course, the measurement module 100 is not limited to measuring the overall dimensions of the workpiece 20. For example, in some embodiments, the dimensions of local structures on the workpiece 20 can also be measured, which can be set according to actual needs.

[0047] In one embodiment, the switching angle can be between 0-180°, and can be 15°, 30°, 45°, 60°, 75°, 90°, 120°, 150°, etc. The switching angle can be designed according to the shape of the workpiece 20 and the specific shape of the part to be inspected. For example, the switching angle can be configured to 90° for measuring the workpiece 20 with the upper end surface perpendicular to the side surface.

[0048] Referring to Figure 3 and Figure 4 In one embodiment, the direction in which the jig 230 points to the load beam 220 is referred to as the distribution direction S. As Figure 3 When the load beam 220 is in the first detection position, the distribution direction S can be parallel to the optical axis L of the camera 110. As Figure 4 When the load beam 220 is in the second detection position, the distribution direction S can be perpendicular to the optical axis L of the camera 110. That is, when the load beam 220 is in the second detection position, the jig 230 is distributed transversely to the load beam 220 relative to the substantially vertical optical axis L of the camera 110. Thus, the support 210 and the load beam 220 can stably support the jig 230 and the workpiece 20 picked up by the jig 230 between the second backlight assembly 320 and the camera 110 without blocking the illumination light L0 of the second backlight assembly 320 toward the jig 230 and the workpiece 20, i.e., so that the jig 230 and the workpiece 20 picked up by the jig 230 are in the suspended state as described in the embodiments.

[0049] Referring to Figure 3 and Figure 4 In one embodiment, the first backlight assembly 310 and the jig 230 are arranged on the same side of the load beam 220, so that the first backlight assembly 310 can more directly and sufficiently provide illumination to the jig 230 and the workpiece 20 picked up by the jig 230. Of course, when the workpiece 20 has a large size, the first backlight assembly 310 can also be arranged on the circumferential side of the load beam 220 to sufficiently provide illumination to the workpiece 20.

[0050] Referring to Figure 3 In one embodiment, the orthographic projection of the jig 230 on the first backlight assembly 310 is located within the orthographic projection of the workpiece 20 picked up by the jig 230 on the first backlight assembly 310. In other words, the jig 230 can be constructed to be small enough relative to the workpiece 20 to reduce the probability of the jig 230 being mistaken for the outer contour of the workpiece 20 due to blocking the illumination light of the first backlight assembly 310, thereby improving the accuracy and effectiveness of the measurement. The orthographic projection described in this embodiment can be the orthographic projection in the direction of the optical axis L of the camera 110 when the load beam 220 is in the first detection position.

[0051] Referring to Figure 3In one embodiment, the jigs 230 are configured to be light-transmissive or partially light-transmissive, i.e. the illumination light provided by the first backlight assembly 310 can pass through the jigs 230 to provide illumination to the workpiece 20, so as to reduce the probability of the jigs 230 being misjudged as the outer contour of the workpiece 20 due to blocking the illumination light of the first backlight assembly 310, and to improve the measurement accuracy and effectiveness. In short, the part of the jigs 230 that has a risk of blocking the workpiece can be configured to have light-transmissive properties.

[0052] Please refer to Figure 5 and Figure 6 In one embodiment, the carrier beam 220 is rotatable relative to the support 210 about a first axis O1, and the jigs 230 are rotatable relative to the carrier beam 220 about a second axis O2. The second axis O2 intersects the first axis O1. In this embodiment, the jigs 230 are further configured to be rotatable relative to the carrier beam 220, which can enrich the poses of the jigs 230 in the measurement area 401, so that different sides of the workpiece 20 can be rotated to positions facing the camera 110, thereby improving the measurement comprehensiveness and efficiency.

[0053] Further, the workpiece transfer structure 200 further comprises driving members 240 and a driver (not shown). The carrier beam 220 is hollow. The first backlight assembly 310 is provided with a plurality of through holes 311, and the plurality of driving members 240 are arranged in the carrier beam 220 and pass through the through holes 311 to partially extend outside the carrier beam 220. The plurality of driving members 240 are respectively connected to the plurality of jigs 230 to drive the plurality of jigs 230 to rotate about the second axis O2. In combination Figure 4 For example, when the carrier beam 220 is located at the second detection position and the workpiece 20 is substantially plate-shaped, and one side of the workpiece 20 faces the camera 110, as described above, the driving of the jigs 230 to rotate can make different sides of the workpiece 20 face the camera 110, respectively. In this way, on the one hand, the specific structural features on different sides of the workpiece 20 can be measured. On the other hand, different outer contour dimensions of the workpiece 20 can also be measured, for example, the length of the workpiece 20 when the long side faces the camera 110, and the width of the workpiece 20 when the wide side faces the camera 110.

[0054] Further, the driver can be arranged in the carrier beam 220 and connected to the carrier beam 220 and the support 210 to drive the carrier beam 220 to rotate relative to the support 210.

[0055] In one embodiment, the plurality of driving members 240 can drive the plurality of jigs 230 to rotate synchronously about the second axis O2, so as to perform batch measurement.

[0056] In another embodiment, the plurality of driving members 240 are further capable of driving the plurality of jigs 230 to rotate independently around the second axis O2. Thus, the posture of the workpieces 20 picked up by any of the jigs 230 can be adjusted accordingly to improve the consistency of the postures of the workpieces 20. That is, when the postures of one or some of the workpieces 20 are different from the postures of the other workpieces 20, the workpieces 20 can be driven to rotate by a certain angle so that the postures of all the workpieces 20 tend to be consistent, facilitating batch measurement. It is noted that the inconsistency of the postures of the workpieces 20 will not only cause the regions of the workpieces 20 required to be measured to fail to be correctly exposed to the measurement module, but also means that at least some of the workpieces 20 are not in the expected postures to be measured when measurement is performed, so that the results obtained by measuring the workpieces 20 cannot reflect the actual physical quantities of the workpieces 20, resulting in low reliability of the measurement results.

[0057] Referring to Figure 5 and Figure 6 In one embodiment, the driving member 240 comprises an output shaft, and the output shaft of the driving member 240 passes through the through hole 311 to be connected with the jig 230. The first axis O1 can be perpendicular to the second axis O2.

[0058] Referring to Figure 6 In one embodiment, the first backlight assembly 310 is configured in a plate shape, and the second axis O2 can be perpendicular to the first backlight assembly 310.

[0059] Referring to Figure 2 In one embodiment, the measurement device 10 further comprises a base (not shown in the figure, the same below) and a rack 500, the rack 500 is erected on the base, and the driving platform 400 and the illumination assembly 300 are arranged on the base. The measurement module 100 is arranged on the rack 500. Further, the camera 110 is arranged on the rack 500, so that the camera 110 has a higher position relative to the transfer structure 200 and the illumination assembly 300, facilitating measurement.

[0060] Referring to Figure 2 , in combination with Figure 5 In one embodiment, the driving platform 400 is arranged on the base, and the driving platform 400 is connected with the support 210 to drive the transfer structure 200 to move relative to the base. That is, the transfer structure 200 can have the ability to move under the driving action of the driving platform 400, for example, the driving platform 400 drives the transfer structure 200 to move to the measurement area 401 and other positions (for example, a feeding position, a discharging position, etc.) outside the measurement area 401. As described above, the second backlight assembly 320 can be arranged in the measurement area 401 and faces the camera 110. In this way, when the second backlight assembly 320 is required to provide illumination for measurement, the load beam 220 can be driven to laterally flip over, so that the jig 230 and the workpiece 20 are suspended between the camera 110 and the second backlight assembly 320.

[0061] As Figure 6 and Figure 7 Further, the carrier beam 220 can be arranged with a spacing from the driving platform 400, and the spacing is configured to accommodate the second backlight assembly 320. Thus, the carrier beam 220 can pass through and remain at the position of the driving platform 400 where the second backlight assembly 320 is located without any obstacle. For example, when the carrier beam 220 is at the first detection position, the first backlight assembly 310 needs to be directed towards the camera 110 and aligned with the camera 110. That is, as shown in Figure 2 , at this time, the carrier beam 220, the first backlight assembly 310, the jig 230 and the workpiece 20 will be located between the camera 110 and the second backlight assembly 320. By configuring the spacing to accommodate the second backlight assembly 320, the probability of collision or interference when the transfer structure 200 moves to the position of the second backlight assembly 320 can be reduced.

[0062] Please refer to Figures 2 to 4 In one embodiment, when the carrier beam 220 is switched from the first detection position to the second detection position, the support 210 can also be driven to move laterally by a certain distance at the same time, so that the workpiece 20 can be more accurately located between the camera 110 and the second backlight assembly 320. Of course, in another embodiment, the second backlight assembly 320 can also be directly configured to have a large enough size, and at this time the transfer structure 200 can not need to move.

[0063] Please refer to Figure 5 In one embodiment, the driving platform 400 includes a driving component 410 and a panel 420, and the panel 420 covers the driving component 410. Part of the structure of the support 210 extends between the driving component 410 and the panel 420 and is connected with the driving component 410. The second backlight assembly 320 is fixedly arranged on the side of the panel 420 facing the camera 110. The driving component 410 can be configured to be driven by a gear transmission, a belt transmission, a chain transmission, a pneumatic transmission or a hydraulic transmission, etc. The driving mode can be selected according to actual needs, and the present application is not limited. It can be understood that no matter which driving mode is used, it is predictable that there will be a part of the driving component 410 that moves. Therefore, the present application configures the driving platform 400 to further include the panel 420 covering the driving component 410, and the panel 420 can provide a mounting basis for the second backlight assembly 320, so as to facilitate the stable mounting of the second backlight assembly 320 on the driving platform 400.

[0064] As Figure 7As shown, in one embodiment, the second backlight assembly 320 can also be disposed on the support 210 at a position opposite the load beam 220 and away from the camera 110, and towards the side where the camera 110 is located. Thus, when the load beam 220 is rotated to the second inspection position, the jig 230 and the workpiece 20 can be suspended between the second backlight assembly 320 and the camera 110.

[0065] Further, since the second backlight assembly 320 disposed on the support 210 can move synchronously with the transfer structure 200 into the measurement area 401, that is, the second backlight assembly 320 can be in the measurement area 401 at the same time as the transfer structure 200 to provide illumination. That is, for the second backlight assembly 320 provided in each embodiment, when it is fixed in the measurement area 401, it is obviously always kept in the measurement area 401. When the second backlight assembly 320 is fixed on the support 210, the second backlight assembly 320 can move into the measurement area 401 together with the transfer structure 200. Therefore, the second backlight assembly 320 is located in the measurement area 401 at least when the transfer structure 200 is in the measurement area 401.

[0066] Please refer to Figure 6 and Figure 7 Further, the support 210 includes two uprights 211 and a connecting plate 212, the two uprights 211 are spaced apart, and the connecting plate 212 is connected between the two uprights 211, and the connecting plate 212 can be used to connect with the driving platform 400. The two ends of the load beam 220 are rotatably connected with the two uprights 211, respectively. And, the load beam 220 is closer to the side where the camera 110 is located relative to the connecting plate 212. The second backlight assembly 320 can be disposed on the support 210 at a region between the load beam 220 and the connecting plate 212, so as to still be able to provide backlight for the measurement of the workpiece in the case of moving together with the transfer structure 200 as a whole.

[0067] As Figure 7 Further, the second backlight assembly 320 can be disposed on the side of the connecting plate 212 facing the load beam 220, that is, the side of the connecting plate 212 facing the camera 110. Alternatively, the second backlight assembly 320 can be connected with the region of the upright 211 between the load beam 220 and the connecting plate 212, so that the second backlight assembly 320 is further away from the camera 110 relative to the load beam 220.

[0068] It should be noted that the second backlight assembly 320 is arranged on the connecting plate 212 without affecting the transmission connection between the connecting plate 212 and the driving platform 400. For example, the side of the connecting plate 212 away from the camera 110 can be transmission connected with the driving platform 400. Alternatively, in the case that the driving platform 400 is driven in the transmission mode of a screw nut, the connecting plate 212 can be provided with a threaded transmission hole (not shown in the figure, the same below), and the screw rod of the driving platform 400 is arranged through the threaded transmission hole and is in threaded transmission cooperation with the threaded transmission hole, so as to drive the movement of the transfer structure 200. Since the components included in the driving platform 400 are located on the side away from the camera 110 relative to the second backlight assembly 320, they will not block the illumination light of the second backlight assembly 320.

[0069] In one embodiment, when the second backlight assembly 320 is arranged on the bracket 210, the second backlight assembly 320 can be configured to have an illumination size large enough so that the orthographic projection of the workpiece 20 along the optical axis L of the camera 110 can be located on the second backlight assembly 320 when the load beam 220 is rotated to the second detection position. In other words, the second backlight assembly 320 can be configured to have a size large enough so that the workpiece 20 can be located between the second backlight assembly 320 and the camera 110 when the load beam 220 is rotated to the second detection position. For example, the second backlight assembly 320 can be configured to extend laterally outward to the space outside the clamping of the load beam 220 and the bracket 210.

[0070] In one embodiment, the second backlight assembly 320 can also be configured in a plate shape. In addition, the second backlight assembly 320 can be arranged in parallel with the first backlight assembly 310. The plate-shaped first backlight assembly 310 and the second backlight assembly 320 facilitate the provision of a range of illumination effects to cover the area where the jig 230 and the workpiece 20 picked up by the jig 230 are located.

[0071] Referring to Figure 5 In one embodiment, the plurality of jigs 230 are arranged at intervals along the reference direction K. The first backlight assembly 310 and / or the second backlight assembly 320 are arranged in a long strip shape along the reference direction K, so that the illumination light provided can cover the area where the jigs 230 are located.

[0072] Referring to Figure 8 In another embodiment, the first backlight assembly 310 and / or the second backlight assembly 320 include a plurality of illumination parts 301 arranged at intervals along the reference direction K, and the plurality of illumination parts 301 correspond to the plurality of jigs 230 to provide illumination to the workpiece 20 picked up by the corresponding jig 230. The number of illumination parts 301 can be the same as the number of jigs 230, and in this case, the illumination parts 301 can one-to-one correspondingly provide illumination to the jigs 230.

[0073] Referring to Figure 8, the illuminating parts 301 and the jigs 230 are not limited to one-to-one correspondence. In combination with the foregoing, the output shaft of the driving member 240 passes through the perforation 311 of the first backlight assembly 310 and is connected with the jigs 230. At this time, the perforation 311 can be formed by the adjacent two illuminating parts 301. That is, one illuminating part 301 can correspond to the half areas of the two workpieces 20 close to each other. That is, the illuminating part 301 located between the two jigs 230 is used to correspond to the right half of the workpiece 20 located on the left side and the left half of the workpiece 20 located on the right side, and provides backlight illumination for them. Of course, the illuminating part 301 can also have other correspondence with the jigs 230, which will not be described one by one here, and can be designed according to actual needs. It can be understood that when the second backlight assembly 320 includes the above-mentioned illuminating part 301, and when the first backlight assembly 310 and the second backlight assembly 320 both include the above-mentioned illuminating part 301, the same as the above, and therefore will not be described again.

[0074] It needs to be emphasized that although the first backlight assembly 310 and the second backlight assembly 320 are taken as examples to illustrate the illumination effect in the measurement device 10 in the embodiments of the present application, the measurement device 10 provided by the embodiments of the present application is not limited to providing the illumination effect only through the first backlight assembly 310 and the second backlight assembly 320. Please refer again to Figure 2 In one embodiment, the measurement module 100 further includes a light source 120, and the light source 120 and the camera 110 are both arranged on the rack 500. The light source 120 provides illumination for the shooting of the camera 110 to improve the shooting clarity of the camera 110.

[0075] In one embodiment, the camera 110 and the light source 120 are recorded as a measurement component, and the measurement module 100 can include a plurality of measurement components. For example, the number of measurement components is the same as the number of jigs 230 of the transfer structure 200, and each jig 230 picks up the workpiece 20 to be measured one by one. The transfer structure 200 and the measurement module 100 corresponding to the workpiece 20 picked up by the transfer structure 200 are recorded as the same measurement group. The measurement device 10 can include a plurality of measurement groups, that is, the measurement device 10 includes a plurality of transfer structures 200 and a plurality of measurement modules 100. For example Figure 2 As shown, the measurement device 10 includes two measurement groups, and the measurement modules 100 included in the two measurement groups can be arranged on opposite sides of the rack 500. It needs to be explained that in another embodiment, a plurality of transfer structures 200 can also share one measurement module 100, and the plurality of transfer structures 200 can be driven by the driving platform 400 to move alternately into the measurement area 401 of the measurement module 100.

[0076] An embodiment of the present application also provides a production device, which comprises the metrology device 10 as described in each embodiment. Since the production device comprises all features of the metrology device 10, the production device also comprises all technical effects of the metrology device 10 as described above.

[0077] Further, the production device can further comprise a feeding device and a discharging device. The feeding device is used to transport the workpiece 20 to the metrology device 10, and the discharging device is used to receive the workpiece 20 which has been measured by the metrology device 10 and classify the workpiece 20 according to the measurement result.

[0078] The technical features of the above embodiments can be combined in any manner. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combinations of the technical features do not exist contradictory, they should be considered as the scope of the present application.

[0079] The above embodiments only express several implementation manners of the present application, and the description is relatively specific and detailed, however, it should not be understood as the limitation to the patent application scope. It should be pointed out that, for the ordinary skilled in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the patent protection scope of the present application should be subject to the appended claims.

Claims

1. A measuring device, characterized in that, The measuring device includes: Measurement module, including camera; The driving platform is equipped with a measurement area corresponding to the detection range of the camera; A transfer structure is movably mounted on the drive platform. The transfer structure can move to the measurement area. The transfer structure includes a support, a load beam mounted on the support, and a fixture mounted on the load beam. The fixture is used to pick up the workpiece. The lighting assembly includes a first backlight assembly and a second backlight assembly. The first backlight assembly is disposed on the carrier beam and faces the fixture. The second backlight assembly is located in the measurement area at least when the transfer structure is in the measurement area and is along the optical axis of the camera. The second backlight assembly is located at a position away from the camera relative to the carrier beam. The first backlight assembly and the fixture are located on the same side of the support beam, and the second backlight assembly is located on the bracket at a position away from the camera relative to the support beam and facing the side where the camera is located. The carrier beam is rotatably connected to the bracket. The carrier beam can be rotated to a position where the first backlight assembly faces the camera, and the carrier beam can be rotated to a position where the fixture and the workpiece are suspended between the camera and the second backlight assembly.

2. The measuring device according to claim 1, characterized in that, The orthographic projection of the fixture onto the first backlight assembly is located within the orthographic projection of the workpiece picked up by the fixture onto the first backlight assembly.

3. The measuring device according to claim 1, characterized in that, The fixture is configured as a light-transmitting element or a partially light-transmitting element, and the illumination light provided by the first backlight assembly can illuminate the workpiece through the fixture.

4. The measuring device according to claim 1, characterized in that, Multiple fixtures are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly extend in an elongated shape along the reference direction, so that the provided illumination can cover the area where the fixtures are located.

5. The measuring device according to claim 1, characterized in that, The plurality of fixtures are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly includes a plurality of illumination portions arranged at intervals along the reference direction, the plurality of illumination portions corresponding to the plurality of fixtures to provide illumination.

6. The measuring device according to claim 1, characterized in that, The transfer structure further includes a driving component. The load beam is hollow and rotates relative to the bracket around a first axis. The first backlight assembly has multiple through holes. Multiple driving components are disposed inside the load beam and pass through the through holes to partially extend out of the load beam. The multiple driving components are respectively connected to multiple fixtures to drive the multiple fixtures to rotate synchronously and independently around a second axis. The second axis intersects with the first axis.

7. The measuring device according to claim 6, characterized in that, The first axis is perpendicular to the second axis.

8. The measuring device according to claim 6, characterized in that, The first backlight assembly is constructed in a plate shape, and the second axis is perpendicular to the first backlight assembly.

9. The measuring device according to claim 1, characterized in that, The drive platform includes a drive component and a panel covering the drive component. A portion of the bracket extends into the space between the drive component and the panel and is connected to the drive component. The second backlight assembly is fixed to the side of the panel facing the camera.

10. The measuring device according to claim 9, characterized in that, The support includes columns and connecting plates. The two columns are spaced apart, and the connecting plate is connected between the two columns. The connecting plate is connected to the drive platform. The two ends of the load beam are rotatably connected to the two columns respectively, and the load beam is closer to the side where the camera is located relative to the connecting plate. The second backlight assembly is located on the bracket in the area between the support beam and the connecting plate, and extends laterally outward into the space between the support beam and the connecting plate.

11. The measuring device according to claim 1, characterized in that, It also includes a base and a frame mounted on the base, the drive platform and the lighting components are both mounted on the base, the measurement module also includes a light source, the light source provides illumination for the camera to take pictures, and the camera and the light source are both mounted on the frame.

12. A production equipment, characterized in that, The production equipment includes the measuring device as described in any one of claims 1 to 11.

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