Chip sorting dislocation processing method, terminal, device and storage medium
By recording and filtering the original wafer identity number information of Mini LED chips, the problem of Mini LED chip sorting and misalignment is solved, and efficient grain processing and production efficiency are achieved.
CN119694945APending Publication Date: 2025-03-25JIANGXI YAOCHI TECH CO LTD +1
0 Cites 0 Cited by
Patent Information
- Application Number
- CN202411880534.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-19
- Publication Date
- 2025-03-25
AI Technical Summary
Technical Problem
During the sorting process, Mini LED chips are prone to sorting misalignment, resulting in misallocation of chips of one level to other level squares, which require retesting and sorting, wasting resources and increasing costs.
Method used
By recording the original wafer identity number information of the grains, confirm the sorting of the misaligned original wafers, filter out the abnormal squares, and sort them on the same transit blue film for performance testing and sorting.
Benefits of technology
It effectively reduces the grain processing volume, improves production efficiency, reduces costs, simplifies processing methods, and improves operability.
✦ Generated by Eureka AI based on patent content.
Abstract
The invention relates to the technical field of semiconductors, and particularly discloses a chip sorting dislocation processing method, terminal and device and a storage medium, and the processing method comprises the steps: recording the identity number information of an original wafer from which a crystal grain is sourced in the operation of sorting the crystal grain on the original wafer into a square wafer; abnormal original wafers with sorting dislocation abnormity are confirmed, and identity number information of the abnormal original wafers is obtained; abnormal square wafers are screened out according to the identity number information of the abnormal original wafers, wherein the abnormal square wafers are square wafers with crystal grains from the abnormal original wafers; crystal grains, from the abnormal original wafer, in each abnormal square piece are sorted to the same transfer blue film; performing performance testing on the crystal grains on the transfer blue film to obtain performance information of the crystal grains; and the crystal grains on the transfer blue film are sorted according to the performance information. The treatment method can effectively reduce the grain treatment capacity, remarkably improve the production efficiency and reduce the cost, and is simple, easy to implement and high in operability.
Need to check novelty before this filing date? Find Prior Art