Chip electrical property detection device and manufacturing method thereof
By designing a chip electrical detection device including a flexible circuit substrate and a movable carrier substrate, the problem of slow lighting test speed of micro LED grains or mini LED grains in the prior art is solved, and a more efficient detection speed and lower production costs are achieved.
Patent Information
- Application Number
- CN202411013335.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2023-09-26
- Filing Date
- 2024-07-26
- Publication Date
- 2025-03-28
AI Technical Summary
In the prior art, micro LED grains or mini LED grains are slower in lighting tests, resulting in high production costs and low production efficiency.
A chip electrical properties detection device is provided, including a circuit control module and an electrical properties detection module. The circuit control module consists of a flexible circuit substrate and a plurality of electrical conduction structures, and the electrical detection module consists of a plurality of movable bearing substrates, an electrical detection structure and an electrical connection structure. These modules cooperate with each other, allowing each movable carrier substrate and electrical detection structure to adjust the position through the flexible circuit substrate to increase the detection speed.
Through the chip electrical properties detection device, the lighting test speed of micro LED grains or mini LED grains can be significantly improved, production costs can be reduced, and production efficiency can be improved.