Inspection support device, method for operating inspection support device, program product, recording medium, and medical imaging device

Abstract

The invention provides an inspection support device, an operation method of the inspection support device, a program product, a recording medium, and a medical image capturing device, which can reduce the burden of an operator related to the creation of an inspection protocol. The examination auxiliary device carries out the following processing: acquiring an examination order of a subject of medical image diagnosis examination; acquiring subject information relating to a subject (101); acquiring examination information (100) relating to a medical image diagnosis examination performed on a subject; and creating, on the basis of the subject information and the examination information, a first examination protocol (108) suitable for a medical image diagnostic examination performed on the basis of the examination order.

Description

Technical Field

[0001] The present invention relates to an inspection auxiliary device, a working method and a program of the inspection auxiliary device and a medical image photographing device. Background Art

[0002] When a medical imaging device is used for imaging, an examination order created in the hospital information system is sent to the image diagnosis department information management system. In the image diagnosis department information management system, various information related to the examination is input into the examination order and sent to the medical imaging device. In the medical imaging device, an examination protocol is set based on the examination order, and imaging of the subject is performed based on the set examination protocol.

[0003] In addition, medical imaging devices may be referred to as medical imaging equipment. Hospital information systems may be referred to as HIS, which is the abbreviation of Hospital Information System in English. Image diagnosis department information management system may be referred to as RIS, which is the abbreviation of Radiology Information System in English.

[0004] Patent document 1 describes a photography assisting device having the following functions: automatically determining a photography protocol based on an examination order, etc., and sending the determined photography protocol to a medical imaging device. When determining the photography protocol, the device described in the document uses a learned learning model. The learning model used when determining the photography protocol is a learned learning model that uses a set of patient information, examination orders, and change factors of examination instructions as learning data, and learns the photography protocol used in the learning data as correct data.

[0005] In the application of the learning model, a group of change factors extracted from patient information, examination orders, and examination instructions are input into the learning model from the image diagnosis department information management system, and an imaging protocol is output from the learning model. In the medical imaging device, imaging is performed using the imaging protocol output from the learning model.

[0006] Furthermore, in the device described in Patent Document 1, the imaging protocol sent from the image diagnosis department information management system is changed in the medical imaging device, and when the two are inconsistent, the correspondence between the imaging protocol and the patient information, examination order, examination instructions, etc. is updated.

[0007] Patent Document 1: Japanese Patent Application Publication No. 2020-187542

[0008] However, in medical imaging devices, when the examination protocol sent from the image diagnosis department information management system is changed, operators such as radiographers confirm the examination order, create the examination protocol, confirm the examination protocol, etc., thereby expecting to reduce the burden on the operator.

[0009] Patent Document 1 describes that the imaging protocol sent from the image diagnosis department information management system to the medical imaging device is changed in the medical imaging device, but does not specifically describe how the imaging protocol is changed in the medical imaging device. Summary of the invention

[0010] The present invention has been made in view of such circumstances, and an object of the present invention is to provide an examination assisting device, an operating method of the examination assisting device, a program, and a medical imaging device that can reduce the burden on an operator associated with the creation of an examination protocol.

[0011] The examination assisting device involved in the first embodiment of the present invention comprises: one or more processors; and one or more memories storing a program including one or more commands executed by the one or more processors, wherein the one or more processors execute the program stored in the one or more memories to perform the following processing: obtaining an examination order for a subject of a medical image diagnostic examination; obtaining subject information related to the subject; obtaining examination information related to the medical image diagnostic examination performed on the subject; and creating a first examination protocol suitable for the medical image diagnostic examination performed based on the examination order based on the subject information and the examination information.

[0012] According to the examination support device of the first aspect, the first examination protocol is generated based on the subject information related to the examination subject and the examination information related to the medical image diagnostic examination. This can reduce the burden on the operator in creating the examination protocol.

[0013] The first examination protocol can include a first imaging protocol suitable for imaging medical images of the examination subject. Furthermore, the first examination protocol can include a sequence related to processing of the medical images.

[0014] The inspection support device according to the second embodiment is a device according to the first embodiment, wherein one or more processors can perform the following processing: obtaining a second inspection protocol associated with the inspection order; and modifying the second inspection protocol based on the subject information and the inspection information to create the first inspection protocol.

[0015] According to this aspect, it is possible to generate the first inspection protocol in which defects of the inspection order are corrected.

[0016] An inspection support device according to a third aspect is the inspection support device according to the second aspect, wherein the one or more processors may display a comparison result obtained by comparing the first inspection protocol with the second inspection protocol on the display device.

[0017] According to this aspect, an operator or the like can visually recognize the difference between the first inspection protocol and the second inspection protocol.

[0018] The inspection support device according to the fourth aspect is the inspection support device according to the second aspect or the third aspect, wherein one or more processors can perform at least any one of permutation, order change, addition, and deletion of a sequence in the second inspection protocol when creating the first inspection protocol.

[0019] According to this aspect, it is possible to perform correction of the sequence unit constituting the inspection protocol.

[0020] The examination assisting device involved in the fifth aspect is an examination assisting device of any one of the first to fourth aspects, wherein one or more processors can perform the following processing: obtaining past examination information related to past medical image diagnostic examinations performed on a subject in the past; and creating a first examination protocol based on the subject information, the examination information, and the past examination information.

[0021] According to this aspect, it is possible to create the first inspection protocol reflecting past inspection information.

[0022] An inspection support device according to a sixth aspect is the inspection support device according to any one of the first to fifth aspects, wherein the one or more processors may display, on the display device, an authentication screen for the operator to input whether or not to approve the first inspection protocol.

[0023] According to this aspect, the operator who visually recognizes the authentication screen can input approval or disapproval of the first inspection protocol.

[0024] An inspection support device according to a seventh aspect is the inspection support device according to any one of the first to sixth aspects, wherein the one or more processors can receive a correction of the created first inspection protocol.

[0025] According to this method, the defects of the first inspection protocol can be corrected.

[0026] An inspection support device according to an eighth aspect is the inspection support device according to the seventh aspect, wherein the one or more processors may store a revision history of the first inspection protocol.

[0027] According to this aspect, the revision history of the first inspection protocol can be used.

[0028] The working method of the examination assisting device involved in the 9th mode of the present invention includes the following steps: obtaining an examination order for a subject of a medical image diagnostic examination; obtaining subject information related to the subject; obtaining examination information related to the medical image diagnostic examination performed on the subject; and creating a first examination protocol suitable for the medical image diagnostic examination performed based on the examination order based on the subject information and the examination information.

[0029] According to the operating method of the inspection support device of the ninth aspect of the present invention, the same effects as those of the inspection support device of the first aspect can be obtained. The components of the inspection support devices of the second to eighth aspects can be applied as the components of the operating methods of the inspection support devices of the other aspects.

[0030] The program involved in the tenth mode of the present invention enables a computer to implement the following functions: obtaining an examination order for a subject of a medical image diagnostic examination; obtaining subject information related to the subject; obtaining examination information related to the medical image diagnostic examination performed on the subject; and creating a first examination protocol suitable for the medical image diagnostic examination performed based on the examination order based on the subject information and the examination information.

[0031] According to the program of the tenth aspect of the present invention, the same effects as those of the inspection support device of the first aspect can be obtained. The components of the inspection support devices of the second to eighth aspects can be applied as the components of the program of the other aspects.

[0032] The medical image photographing device involved in the 11th embodiment of the present invention has an inspection auxiliary device for assisting the photography of medical images. In the medical image photographing device, the inspection auxiliary device has: one or more processors; and one or more memories storing a program including one or more commands executed by the one or more processors, and the one or more processors execute the program stored in the one or more memories to perform the following processing: obtaining an inspection order for a subject of a medical image diagnostic inspection; obtaining subject information related to the subject; obtaining inspection information related to the medical image diagnostic inspection performed on the subject; and creating a first inspection protocol suitable for the medical image diagnostic inspection performed based on the inspection order based on the subject information and the inspection information.

[0033] According to the medical imaging device of the eleventh aspect of the present invention, the same effects as those of the examination support device of the first aspect can be obtained. The components of the examination support devices of the second to eighth aspects can be applied as the components of the medical imaging devices of the other aspects.

[0034] Effects of the Invention

[0035] According to the present invention, the first examination protocol is generated based on the subject information related to the examination subject and the examination information related to the medical image diagnostic examination. This can reduce the burden on the operator in creating the examination protocol. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 This is a block diagram showing a configuration example of a medical information system.

[0037] Figure 2 Is applicable to Figure 1 The overall structure diagram of the MRI device of the medical information system shown.

[0038] Figure 3 This is a functional block diagram showing the electrical configuration of the inspection support device according to the first embodiment.

[0039] Figure 4 Yes means Figure 3 The block diagram of the hardware structure of the electrical structure of the inspection auxiliary device shown.

[0040] Figure 5 This is a flowchart showing the steps of the inspection support method according to the first embodiment.

[0041] Figure 6 This is a table showing the correspondence between inspection information and the contents of changes to the inspection protocol.

[0042] Figure 7 This is a table showing the correspondence between the subject information and the changed contents of the examination protocol.

[0043] Figure 8 It is a schematic diagram showing a configuration example of a user interface.

[0044] Fig. 9 This is a functional block diagram showing the electrical configuration of the inspection support device according to the second embodiment.

[0045] Fig.10 This is a flowchart showing the steps of the inspection support method according to the second embodiment.

[0046] Explanation of symbols

[0047] 1-medical information system, 3-hospital information system, 4-image diagnosis department information management system, 5-medical imaging device, 5A-MRI device, 6-medical image management system, 20-examination auxiliary device, 30-output device, 40-input device, 100-examination information receiving unit, 101-subject information receiving unit, 102-examination agreement receiving unit, 104-notification unit, 106-examination agreement setting unit, 108-examination agreement creation unit, 112-examination information analysis unit, 113-subject information analysis unit, 120-first approval information acquisition unit. DETAILED DESCRIPTION

[0048] Hereinafter, the preferred embodiments of the present invention will be described in detail according to the accompanying drawings. In addition, in the following description and the accompanying drawings, the same symbols are marked on the same components, and repeated descriptions are omitted. Furthermore, when multiple components are listed in the following embodiments, it can be interpreted as including at least one of the multiple components.

[0049] [Structure example of medical information system]

[0050] Figure 1 This is a block diagram showing a configuration example of a medical information system. Figure 1 The medical information system 1 shown is an information processing system introduced into a medical facility such as a hospital. The medical information system 1 includes a hospital information system 3, an image diagnosis department information management system 4, a medical imaging device 5, and a medical image management system 6. The medical image management system can be referred to as PACS using the abbreviation of Picture Archiving and Communication Systems.

[0051] The hospital information system 3 is a system for managing various operations in the entire medical facility. The hospital information system 3 can be configured to include a plurality of systems such as an electronic medical record system, an order system, and a medical accounting system.

[0052] The image diagnosis department information management system 4 is a system for managing the work of image diagnosis departments such as the radiology department. The image diagnosis department information management system 4 cooperates with the hospital information system 3 to perform processes such as examination reservations for image diagnosis examinations, creation of examination orders, and management of examination results.

[0053] The medical imaging device 5 is a medical imaging device for capturing medical images of a subject. The medical imaging device 5 captures medical images based on the examination order sent from the hospital information system 3. The examination protocol is associated with the examination order sent from the hospital information system 3 to the medical imaging device 5. The medical imaging device 5 captures medical images according to the examination protocol associated with the examination order.

[0054] exist Figure 1 In the figure, an MRI device is illustrated as the medical imaging device 5. Examples of the medical imaging device 5 include a CT device, an ultrasonic diagnostic device, a PET device, a mammography device, an X-ray diagnostic device, an X-ray fluoroscopic diagnostic device, and an endoscope device.

[0055] In addition, MRI is the abbreviation of Magnetic Resonance Imaging, which is the English expression of magnetic resonance image. CT is the abbreviation of Computed Tomography. PET is the abbreviation of Positron Emission Tomography. The subject described in the embodiment is an example of a subject of a medical image diagnosis examination.

[0056] The medical information system 1 may include a plurality of medical imaging devices 5. The plurality of medical imaging devices 5 may be of the same type or of different types. The number and type of the medical imaging devices 5 are appropriately determined for each medical facility.

[0057] The medical image management system 6 is a computer system that stores and manages examination data including medical images captured and generated using the medical imaging device 5. The medical image management system 6 has a large-capacity external storage device and a database management program. The medical image management system 6 can be configured to include a DICOM server that operates based on the DICOM specification. In addition, DICOM is an abbreviation for Digital Imaging and Communications in Medicine.

[0058] The hospital information system 3, the image diagnosis department information management system 4, the medical imaging device 5 and the medical image management system 6 are electrically connected to each other via a network. The network may be a local area network within a medical facility. A part of the network may be a wide area network. Figure 1 In the figure, the network is omitted.

[0059] The medical image management system 6 receives various data including images generated by the medical imaging device 5 via the network. The medical image management system 6 stores the received various data in a storage medium such as a large-capacity external storage device. The medical image management system 6 manages the various data stored in the storage medium.

[0060] The medical image management system 6 communicates with the hospital information system 3 and the image diagnosis department information management system 4 via the network. The medical image management system 6 sends and receives various data including inspection images with the hospital information system 3. The storage format of image data in the medical image management system 6 and the communication between devices via the network can apply the DICOM protocol.

[0061] [Configuration example of MRI apparatus]

[0062] Figure 2 Is applicable to Figure 1 The overall structure diagram of the MRI device of the medical information system shown. Figure 2 The MRI apparatus 5A shown is Figure 1 An example of a medical imaging device 5 is shown.

[0063] Figure 2 The MRI apparatus 5A shown in the figure includes a measuring device 10, an inspection auxiliary device 20, an output device 30, an input device 40, and an external storage device 50. The measuring device 10 includes a static magnetic field coil 11, a gradient magnetic field coil 12, and a gradient magnetic field power supply 15. The static magnetic field coil 11 generates a static magnetic field in a space where a subject is placed. The gradient magnetic field coil 12 gives a magnetic field gradient to the static magnetic field generated by the static magnetic field coil 11. The gradient magnetic field power supply 15 is a driving power supply for the gradient magnetic field coil 12.

[0064] The measuring device 10 includes a transmitting coil 13, a receiving coil 14, a transmitter 16, and a receiver 17. The transmitting coil 13 generates a high-frequency magnetic field in a measurement region of a subject. The transmitter 16 supplies a pulse current as an excitation current to the transmitting coil 13. The receiving coil 14 receives a nuclear magnetic resonance signal from the subject. The receiver 17 transmits the nuclear magnetic resonance signal received by the receiving coil 14 to the inspection auxiliary device 20. In addition, the nuclear magnetic resonance signal can be called an echo signal.

[0065] In the MRI apparatus 5A, either a vertical magnetic field method or a horizontal magnetic field method is applied according to the direction of the static magnetic field generated. The static magnetic field coil 11 adopts various forms according to the above magnetic field method. The gradient magnetic field coil 12 has a plurality of coils that respectively generate gradient magnetic fields in three mutually orthogonal axial directions. The plurality of coils in the gradient magnetic field coil 12 are driven by a gradient magnetic field power supply 15. Due to the application of the gradient magnetic field, position information is added to the nuclear magnetic resonance signal generated from the subject.

[0066] In addition, Figure 2 In the embodiment, the transmission coil 13 and the reception coil 14 are provided separately, but there may be a embodiment in which one coil having the function of the transmission coil 13 and the function of the reception coil 14 is provided.

[0067] The measuring device 10 includes a sequence control device 18. The sequence control device 18 controls the generation timing of the gradient magnetic field and the high-frequency magnetic field by controlling the operation of the gradient magnetic field power supply 15 and the transmitter 16. The sequence control device 18 controls the reception timing of the nuclear magnetic resonance signal by controlling the operation of the receiver 17, and performs measurement. The timing diagram applied to the control of the sequence control device 18 is called an imaging sequence, which is pre-set according to the measurement and stored in a storage device or the like provided in the inspection auxiliary device 20.

[0068] The inspection auxiliary device 20 is suitable for a computer having one or more processors such as a CPU (Central Processing Unit), one or more memories and storage devices, etc. The inspection auxiliary device 20 functions as a control device that controls the operation of each part of the measurement device 10 via the sequence control device 18. In addition, the inspection auxiliary device 20 performs arithmetic processing on the nuclear magnetic resonance signal received via the receiver 17 and the sequence control device 18, and functions as a computing device that obtains an image signal of a predetermined imaging area. The inspection auxiliary device 20 can be a device that constitutes the MRI device 5A, or it can be an external device independent of the MRI device 5A.

[0069] In the inspection auxiliary device 20, the output device 30, the input device 40, and the external storage device 50 are electrically connected so as to enable data communication. The output device 30 can be applied to a display for displaying the result of the operation processing performed using the inspection auxiliary device 20. For example, the output device 30 can display a reconstructed image reconstructed based on the nuclear magnetic resonance signal transmitted from the measurement device 10. In addition, the nuclear magnetic resonance signal can be referred to as an NMR signal using the abbreviation of Nuclear Magnetic Resonance, which is the English expression for nuclear magnetism.

[0070] The output device 30 can be a liquid crystal display, an organic EL display, a projector, etc. The output device 30 can also be a suitable combination of them. In addition, organic EL can be referred to as OEL using the abbreviation of Organic Electro-Luminescence. The display in the following description is assumed to be Figure 2 The output device 30 shown functions as a display.

[0071] The input device 40 is an interface for the operator to input conditions applicable to measurement, conditions applicable to calculation processing, parameters, etc. Examples of the input device 40 include a keyboard and a mouse. A display of a touch panel type may also be used to form an integrated structure of the display device that functions as the output device 30 and the input device 40. The operator can use the input device 40 to input parameters such as the number of echoes to be measured, the echo time, and the echo interval.

[0072] The external storage device 50 stores data used in various calculation processes performed by the inspection support device 20, data derived as calculation process results, conditions and parameters applied to calculation processes, and programs for executing calculation processes, etc. The external storage device 50 may implement a part of the functions of the internal storage device of the inspection support device 20, or the internal storage device of the inspection support device 20 may implement a part of the functions of the external storage device 50.

[0073] The MRI apparatus 5A includes a bed 60, a bed driving device 62, and a bed driving control device 64. The bed 60 has a structure for placing a subject, and is movable by the bed driving device 62 in the vertical direction, the direction of entering the imaging region, and the direction of retreating from the imaging region.

[0074] The bed driving device 62 includes a driving mechanism connected to the bed 60 and a driving source such as a motor connected to the driving mechanism. In addition, illustration of the driving mechanism and the driving source is omitted.

[0075] The bed drive control device 64 applies a predetermined driving condition to control the operation of the bed drive device 62, so that the bed 60 moves in a predetermined direction and stops at a predetermined position. The bed drive control device 64 is preferably a computer. The bed drive control device 64 may include an input device such as a keyboard and an output device such as a display.

[0076] The examination support device 20 and the bed drive control device 64 can be configured as a console unit. The console unit functions as various control devices in the MRI apparatus 5A. The console unit is implemented using one or more computers.

[0077] [Configuration Example of Inspection Support Device According to First Embodiment]

[0078] Figure 3 1 is a functional block diagram showing the electrical structure of the inspection support device according to the first embodiment. The inspection support device 20 includes an inspection information receiving unit 100. The inspection information receiving unit 100 receives the inspection information from Figure 1 The examination information included in the examination order sent by the image diagnosis department information management system 4 is shown. In addition, the meaning of receiving the examination order is the same as the meaning of receiving the examination order and obtaining the examination order. The entity of the information in the following description is the electrical signal representing the information.

[0079] Examination information may include examination site, examination type, examination purpose, and whether or not an examination has been requested from other medical imaging equipment. Examples of examination information include examination site being brain, examination type being non-contrast MRI examination, and examination purpose being suspected cerebral infarction.

[0080] The examination auxiliary device 20 includes a subject information receiving unit 101. The subject information receiving unit 101 receives the subject information included in the examination order. The subject information includes the subject's physique, height, whether a prior examination is required, and physical characteristics. The subject's physique can be information indicating the subject's physical characteristics such as tall and thin.

[0081] As an example of whether a prior examination is required, information indicating whether a prior examination such as an electrocardiogram and a cognitive function test is required before an MRI examination can be cited. As an example of physical characteristics, whether there is metal in the body, whether there is allergy, whether it is difficult to hold the breath, and whether it is difficult to keep still can be cited. As an example of metal in the body, metal used to fix a fractured bone can be cited. In addition, the subject recorded in the embodiment is an example of the subject of the examination, and the subject information recorded in the embodiment is an example of the subject information.

[0082] The examination information receiving unit 100 and the subject information receiving unit 101 function as components of an examination order receiving unit that receives an examination order transmitted from the image diagnosis department information management system 4 .

[0083] The examination support device 20 includes an examination protocol receiving unit 102. The examination protocol receiving unit 102 receives the second examination protocol selected when the examination order is created in the image diagnosis department information management system 4. For example, the examination protocol receiving unit 102 can receive the examination protocol selected by the doctor when the examination order is created as the second examination protocol. In addition, the examination protocol can include an imaging protocol suitable for imaging medical images. The examination protocol can be simply referred to as a protocol.

[0084] The second inspection protocol is preliminarily associated with the inspection order containing the inspection information. That is, one or more second inspection protocols are specified according to the inspection part, inspection method and inspection purpose. The correspondence between the second inspection protocol and the inspection order is shared between the image diagnosis department information management system 4 and the medical imaging device 5.

[0085] Here, the examination protocol includes more than one sequence. The sequence includes the photography sequence described previously. For example, when multiple examination protocols with different sequences and multiple examination protocols with different combinations of sequences are stored in the medical imaging device 5, it is possible to assign separate identification information to each of the multiple examination protocols and manage them. The identification information of each examination protocol in the medical imaging device 5 can be shared between the image diagnosis department information management system 4 and the medical imaging device 5.

[0086] The second inspection agreement may be included in the inspection order. That is, the inspection agreement receiving unit 102 may receive the second inspection agreement included in the inspection order. The inspection agreement receiving unit 102 may function as a component of the inspection order receiving unit.

[0087] The examination support device 20 includes a notification unit 104. The notification unit 104 may include a notification creation unit that creates a notification and a notification display control unit that generates a display signal indicating the notification and transmits the display signal to a display.

[0088] The notification unit 104 notifies the receipt of the inspection order. That is, the notification unit 104 notifies the receipt of the inspection information and the receipt of the subject information. The notification unit 104 may display character information indicating the receipt of the inspection order on the display as a notification of the receipt of the inspection order. The notification unit 104 may use the character information to notify the content of the inspection information. The notification unit 104 may use the character information to notify the content of the subject information.

[0089] The notification unit 104 notifies the receipt of the second inspection agreement. The notification unit 104 may display character information indicating the receipt of the second inspection agreement on the display as a notification of the receipt of the second inspection agreement. The notification unit 104 may display character information indicating the content of the second inspection agreement on the display as a notification of the content of the second inspection agreement.

[0090] The examination support device 20 includes an examination protocol setting unit 106. The examination protocol setting unit 106 sets an examination protocol applicable to the examination, such as the setting of an imaging protocol applicable to imaging of medical images in the medical imaging device 5. For example, the examination protocol setting unit 106 may set the second examination protocol received by the examination protocol receiving unit 102, that is, the second examination protocol notified by the notifying unit 104 as the examination protocol.

[0091] The examination support device 20 includes an examination protocol creation unit 108. When the second examination protocol is not approved as the examination protocol, the examination protocol creation unit 108 creates a first examination protocol that replaces the second examination protocol.

[0092] The inspection order containing the inspection information is pre-associated with the second inspection agreement, but the second inspection agreement may need to be customized according to the inspectee. For example, if the inspection order is wrong or the inspection order is created without the required inspection conditions, and the second inspection agreement is not approved, the first inspection agreement is automatically created.

[0093] As the creation of the first inspection protocol, the second inspection protocol may be modified. The modification of the second inspection protocol includes at least one of changing, adding, and deleting the sequence constituting the second inspection protocol. Hereinafter, the term creation of the inspection protocol may include concepts such as modification and change of the inspection protocol.

[0094] The examination support device 20 includes a second approval information acquisition unit 110. The second approval information acquisition unit 110 acquires approval information indicating approval or disapproval of the notified second examination protocol. The approval information can be used by an operator such as a radiographer who has confirmed the correspondence between the examination order and the second examination protocol. Figure 2 The input device 40 shown is sent.

[0095] When acquiring approval information indicating approval of the second inspection protocol, the second approval information acquisition unit 110 transmits the approval information to the inspection protocol setting unit 106. The inspection protocol setting unit 106 sets the second inspection protocol as the inspection protocol based on the approval information.

[0096] When the disapproval information indicating the disapproval of the second inspection protocol is obtained, the second approval information acquisition unit 110 sends the disapproval information to the inspection protocol creation unit 108. The inspection protocol creation unit 108 creates the first inspection protocol based on the disapproval information. For example, when the second inspection protocol needs to be re-evaluated, the operator can operate Figure 2 The input device 40 shown in the figure transmits the disapproval information of the second inspection protocol to the second approval information acquisition unit 110 .

[0097] The inspection support device 20 includes an inspection information analysis unit 112. The inspection information analysis unit 112 analyzes the inspection information. The inspection information analysis unit 112 sends the inspection information analysis result to the inspection protocol creation unit 108. Examples of the inspection information analysis include processing to extract inspection parts, inspection methods, and inspection purposes.

[0098] The examination support device 20 includes a subject information analysis unit 113. The subject information analysis unit 113 analyzes the subject information. The subject information analysis unit 113 sends the analysis result of the subject information to the examination protocol creation unit 108. As an example of the analysis of the subject information, there can be cited a process of extracting the subject's physique, height, weight, whether or not there has been a prior examination, and physical characteristics from the examination order.

[0099] The examination support device 20 includes a past examination information acquisition unit 114 and a past examination information analysis unit 116. The past examination information acquisition unit 114 acquires past examination information related to past examinations performed on the examinee recorded in the examination order. The past examination information analysis unit 116 analyzes the past examination information. The past examination information analysis unit 116 sends the analysis result of the past examination information to the examination protocol creation unit 108.

[0100] Past inspection information can be found at Figure 1The medical records may be obtained from the electronic medical record system of the hospital information system 3 shown in the figure, or from the medical image storage device of the medical image management system 6. The past examination information may be information stored in the medical imaging device 5.

[0101] Examples of analysis of past examination information include extraction of examination protocols applied to past examinations, remarks in past examinations, past images acquired in past examinations, and the presence or absence of a request for interpretation.

[0102] The past inspection information may include past similar inspection information of past similar inspections similar to past inspections performed in the past. Examples of past similar inspections include inspections of different inspection parts of the subject recorded in the inspection order and inspections of the same inspection parts but different inspection conditions.

[0103] Examples of the past similar inspection information include a record of the creation of an inspection protocol in a similar inspection and a record of the revision of the inspection protocol. The past inspection information analysis unit 116 may analyze the past similar inspection information.

[0104] The examination protocol creation unit 108 creates a first examination protocol using the analysis results of the examination information and the analysis results of the subject information. When creating the first examination protocol, the examination protocol creation unit 108 may use the analysis results of the past examination information.

[0105] Examples of creating the first examination protocol include adding precautions before an examination, changing the order of imaging for specific diseases, implementing left-right determination of limbs based on past examination images, implementing imaging positioning based on past examination images, adding post-processing after shooting, adding a sending destination for examination images based on whether or not an examination reading request is requested, and adding a sending destination for past examination images based on whether or not an examination reading request is requested.

[0106] For example, when metal exists in the body of the subject, an additional output of a warning message indicating that the MRI examination cannot be performed or an additional output of a warning message indicating that the imaging task is changed is performed.

[0107] If the subject is allergic to contrast media, a message indicating that the contrast media cannot be used is additionally outputted. If the subject needs assistance for bed rest, a message indicating that the subject needs assistance for bed rest is outputted.

[0108] When the purpose of the examination is suspected cerebral infarction, the sequence order is replaced and the DWI sequence is performed first. In addition, DWI is the abbreviation of Diffusion-Weighted Imaging, which is an English expression for diffusion-weighted imaging. That is, a specific imaging is performed first according to the examination site and the purpose of the examination.

[0109] If the inspection part is not specified in the inspection order, the inspection part is specified by referring to the past inspection images. If the processing implemented in the past inspection, such as 3D analysis, lesion detection and report creation, is not included, the processing implemented in the past inspection is added. If the destination for sending the inspection image is not included, the destination for sending the past inspection image is added as the destination for sending the inspection image.

[0110] The notification unit 104 notifies the first inspection protocol. That is, the notification unit 104 can display a GUI on the display for confirming whether the first inspection protocol is approved. The operator can operate the input device 40 to input approval or disapproval of the first inspection protocol.

[0111] The notification unit 104 may display the second inspection protocol on the GUI while displaying the GUI for confirming approval of the first inspection protocol. GUI is an abbreviation of Graphical User Interface.

[0112] The inspection support device 20 includes a comparison unit 118. The comparison unit 118 compares the second inspection protocol with the first inspection protocol to determine whether the first inspection protocol is appropriate. The notification unit 104 displays the comparison result between the second inspection protocol and the first inspection protocol on the display.

[0113] The inspection support device 20 includes a first approval information acquisition unit 120. The first approval information acquisition unit 120 acquires information indicating approval or disapproval of the first inspection protocol. When the first approval information acquisition unit 120 acquires approval information indicating approval of the first inspection protocol, the inspection protocol setting unit 106 sets the first inspection protocol as the inspection protocol.

[0114] When the first approval information acquisition unit 120 acquires disapproval information indicating disapproval of the first examination protocol, the examination protocol creation unit 108 can revise the first examination protocol. When the first approval information acquisition unit 120 acquires disapproval information indicating disapproval of the first examination protocol, the examination protocol setting unit 106 can return the second examination protocol to the image diagnosis department information management system 4.

[0115] The examination support device 20 includes a correction instruction receiving unit 122. The correction instruction receiving unit 122 receives a correction instruction of the first examination protocol. For example, the correction instruction receiving unit 122 acquires a correction instruction of the first examination protocol input by the operator operating the input device 40.

[0116] The modification instruction receiving unit 122 sends a modification instruction of the first inspection protocol to the inspection protocol creating unit 108. The inspection protocol creating unit 108 modifies the first inspection protocol based on the received modification instruction. The notification unit 104 may display a GUI on the display for confirming whether the modified inspection protocol of the first inspection protocol is approved.

[0117] The examination support device 20 includes a correction history storage unit 124 . The correction history storage unit 124 stores the correction history of the examination protocol executed by the examination protocol creation unit 108 .

[0118] The correction history storage unit 124 can store, as the correction history, the operator who has approved or disapproved the examination protocol, the correction site of the examination protocol, the correction site of the captured medical image, comments during the correction, the number of corrections, and the like.

[0119] The examination support device 20 includes a return processing unit 126. When the first approval information acquisition unit 120 acquires disapproval information indicating disapproval of the first examination protocol and a predetermined return condition is satisfied, the return processing unit 126 returns the second examination protocol to the image diagnosis department information management system 4. Examples of the return condition include a case where the revised examination protocol is not approved even after a predetermined number of revisions.

[0120] Figure 4 Yes means Figure 3 The block diagram of the hardware structure of the electrical structure of the inspection auxiliary device shown in FIG. The computer suitable for the inspection auxiliary device 20 can be a personal computer or a workstation. The computer can also be a virtual machine. The inspection auxiliary device 20 can also be composed of multiple computers.

[0121] The inspection support device 20 includes a processor 202, a memory 204 as a main storage device, a storage device 206 as an auxiliary storage device, an input / output interface 208, and a bus 210. The processor 202 includes a CPU. The processor 202 may include a GPU. In addition, CPU is the abbreviation of Central Processing Unit. GPU is the abbreviation of Graphics Processing Unit.

[0122] The processor 202 is connected to the memory 204, the storage device 206, and the input / output interface 208 via the bus 210. The input device 40 and the output device 30 are connected to the inspection support device 20 via the input / output interface 208.

[0123] The processor 202 executes a program including one or more commands stored in the memory 204 to implement various functions. The input / output interface 208 includes a communication interface that can be connected to a network and a connection interface that can be connected to an external device. As a connection interface that can be connected to an external device, for example, a universal serial bus and HDMI can be used. In addition, the universal serial bus can be referred to as USB using the abbreviation of Universal Serial Bus. HDMI is the abbreviation of High-Definition Multimedia Interface. USB and HDMI are registered trademarks.

[0124] The processor 202 communicates with various external devices of the MRI apparatus 5A via the input / output interface 208 to transmit and receive necessary information. In addition, illustration of various external devices is omitted.

[0125] The output device 30 may include a display that displays various information in addition to the medical image captured by the medical imaging device 5. The output device 30 is used as a part of the GUI when receiving input from the input device 40. In addition, the output device 30 is not limited to one, and may be a multi-display having a plurality of displays.

[0126] [Steps of the inspection support method according to the first embodiment]

[0127] Figure 5 1 is a flowchart showing the steps of the inspection support method according to the first embodiment. In the inspection order receiving step S10, Figure 3 The examination information receiving unit 100 receives the examination information included in the examination order sent from the image diagnosis department information management system 4. In the examination order receiving step S10, the subject information receiving unit 101 receives the subject information included in the examination order sent from the image diagnosis department information management system 4.

[0128] The inspection order receiving step S10 includes an inspection information receiving step of receiving inspection information and an examinee information receiving step of receiving examinee information. After the inspection order receiving step S10, the steps of the inspection support method enter the inspection agreement receiving step S12.

[0129] In the examination agreement receiving step S12, the examination agreement receiving unit 102 receives the examination agreement sent from the image diagnosis department information management system 4. The order of the examination order receiving step S10 and the examination agreement receiving step S12 can be replaced or performed in parallel. After the examination agreement receiving step S12, the steps of the examination support method enter the notification display step S14.

[0130] In the notification display step S14, the notification unit 104 notifies the receipt of the inspection order and notifies the receipt of the inspection agreement. In the notification display step S14, the inspection order notification step of notifying the receipt of the inspection order and the inspection agreement notification step can be performed as different steps. After the notification display step S14, the steps of the inspection support method enter the second inspection agreement approval determination step S16.

[0131] The operator who has confirmed the receipt of the notified inspection order and the second inspection protocol in the notification display step S14 can confirm whether the second inspection protocol is appropriate for the inspection order.

[0132] In the second inspection agreement approval determination step S16 , the second approval information acquisition unit 110 determines whether to acquire approval information indicating approval of the second inspection agreement or to acquire disapproval information indicating disapproval of the second inspection agreement.

[0133] In the second inspection protocol approval determination step S16 , when it is determined that the approval information approving the second inspection protocol is acquired, the determination is “Yes” and the procedure of the inspection support method proceeds to the inspection protocol setting step S18 .

[0134] In the inspection protocol setting step S18, the inspection protocol setting unit 106 sets the second inspection protocol as the inspection protocol. In the inspection protocol setting step S18, when the inspection protocol suitable for the inspection is set, the steps of the inspection support method are terminated after a predetermined end process is executed.

[0135] On the other hand, in the second inspection agreement approval determination step S16 , when it is determined that disapproval information of disapproving the second inspection agreement is acquired, the determination is “No” and the procedure of the inspection support method proceeds to the inspection information analysis step S20 .

[0136] That is, the operator who has confirmed whether the second inspection agreement is appropriate for the inspection order can set the received second inspection agreement as the inspection agreement applicable to the inspection, or can modify the second inspection agreement. When modification of the second inspection agreement is selected, the following steps are applied to automatically generate the first inspection agreement with the modified second inspection agreement.

[0137] In the examination information analysis step S20, the examination information analysis unit 112 analyzes the examination information. The analysis result of the examination information in the examination information analysis step S20 is sent to the examination protocol creation unit 108. After the examination information analysis step S20, the steps of the examination support method proceed to the subject information analysis step S21.

[0138] In the subject information analysis step S21, the subject information analysis unit 113 analyzes the subject information. The analysis result of the subject information in the subject information analysis step S21 is sent to the examination protocol creation unit 108. After the subject information analysis step S21, the steps of the examination auxiliary method enter the past examination information analysis step S22. In addition, the order of the examination information analysis step S20 and the subject information analysis step S21 can be replaced or performed in parallel.

[0139] In the past inspection information analysis step S22, the past inspection information analysis unit 116 acquires past inspection information and analyzes the past inspection information. The analysis result of the past inspection information in the past inspection information analysis step S22 is sent to the inspection protocol creation unit 108. The past inspection information analysis step S22 can include a past inspection information acquisition step of acquiring past inspection information. After the past inspection information analysis step S22, the steps of the inspection assistance method enter the inspection protocol creation step S24.

[0140] In the examination protocol creation step S24, the examination protocol creation unit 108 creates a first examination protocol in which at least a portion of the second examination protocol is changed based on the analysis results of the examination information and the analysis results of the subject information. When creating the first examination protocol, the analysis results of the past examination information can be used. After the examination protocol creation step S24, the steps of the examination support method enter the first examination protocol notification step S26.

[0141] In the first inspection protocol notification step S26, the notification unit 104 displays a notification of the first inspection protocol created in the inspection protocol creation step S24. That is, in the first inspection protocol notification step S26, the first inspection protocol is displayed on the display.

[0142] In the first inspection protocol notification step S26, the first inspection protocol and the second inspection protocol may also be displayed. When the first inspection protocol is displayed, a comparison step of comparing the second inspection protocol with the first inspection protocol may be performed, and the comparison result of the second inspection protocol with the first inspection protocol may be displayed. After the first inspection protocol notification step S26, the steps of the inspection support method enter the first inspection protocol approval determination step S28.

[0143] That is, the operator who has confirmed the first inspection protocol displayed on the display can set the first inspection protocol as an inspection protocol to be applied to the inspection, and can further modify the first inspection protocol.

[0144] In the first inspection agreement approval determination step S28 , the first approval information acquisition unit 120 determines whether to acquire approval information indicating approval of the first inspection agreement or to acquire disapproval information indicating disapproval of the first inspection agreement.

[0145] In the first inspection protocol approval judgment step S28, when it is determined that the approval information approving the first inspection protocol is obtained, it is judged as "yes", and the steps of the inspection auxiliary method enter the inspection protocol setting step S18. In the inspection protocol setting step S18, the first inspection protocol is set as the inspection protocol applicable to the inspection.

[0146] On the other hand, in the first inspection agreement approval determination step S28, when it is determined that disapproval information that disapproves the second inspection agreement is acquired, the determination is "No", and the procedure of the inspection support method proceeds to the correction determination step S30.

[0147] That is, in the first inspection protocol approval determination step S28, the received second inspection protocol is compared with the created first inspection protocol, and the operator determines whether the created first inspection protocol is appropriate. The inspection support device 20 displays a GUI on the display for confirming whether the first inspection protocol is appropriate.

[0148] The inspection support device 20 causes the GUI to display the first inspection protocol and the second inspection protocol side by side. When the sequence of the first inspection protocol is different from the sequence of the second inspection protocol, the inspection support device 20 causes the GUI to display information included in the inspection order and the reason for the change in the sequence. The display method of the changed part and the reason for the change may be different from that of other information. Examples of display method changes include color changes and the use of emphasized characters.

[0149] For example, when metal in the body is omitted in the examination order and replaced with an imaging sequence that relatively reduces metal artifacts in the first examination protocol, the examination support device 20 can display the text information "metal in the body" in the examination information on the GUI, thereby allowing the operator of the medical imaging device 5 to confirm the reason for the sequence change.

[0150] In the correction determination step S30, the examination protocol setting unit 106 determines whether to implement the correction of the first examination protocol or to return the second examination protocol to the image diagnosis department information management system 4. In the correction determination step S30, if it is determined that the second examination protocol is to be returned to the image diagnosis department information management system 4, the determination is "No" and the process proceeds to the second examination protocol return step S32.

[0151] In the second examination protocol return step S32, the second examination protocol is returned to the image diagnosis department information management system 4. When the second examination protocol is returned, the examination order can be returned. In the second examination protocol return step S32, if the second examination protocol is returned, the steps of the examination assisting method are terminated after executing the prescribed end processing.

[0152] On the other hand, in the correction determination step S30, when it is determined that the correction of the first inspection protocol is to be executed, it is determined as "yes" and the correction instruction receiving step S34 is entered. In the correction instruction receiving step S34, the correction instruction receiving unit 122 receives the correction instruction of the first inspection protocol. The correction instruction of the first inspection protocol is sent to the inspection protocol creation unit 108. After the correction instruction receiving step S34, the inspection protocol creation step S24 is entered to execute the correction of the first inspection protocol until the corrected first inspection protocol is approved or the second inspection protocol is returned.

[0153] In the inspection protocol creation step S24, when the first inspection protocol is revised, a revision history storage step of storing the revision history of the first inspection protocol may be performed, and a revision history notification step of notifying the revision history of the first inspection protocol may be performed. Figure 6 The inspection support method of the steps shown in FIG. 1 is an example of an operating method of the inspection support device.

[0154] [Concrete example of checking protocol creation]

[0155] Figure 6 It is a table showing the correspondence between the inspection information and the changes in the inspection protocol. Figure 5 In the inspection information analysis step S20 shown in FIG. Figure 6 In the case of inspection information corresponding to the left column of the table shown in Figure 5 In the correction instruction receiving step S34 shown in FIG. Figure 6 The right column of the table contains revision instructions corresponding to the changes in the inspection agreement.

[0156] For example, when it is difficult to determine the range of a disease or when it is desired to perform wide-range imaging, the imaging conditions set in the examination protocol are changed to imaging conditions that enable relatively wide-range imaging.

[0157] Furthermore, when the purpose is to examine a specific structure in detail, such as when a relatively thin slice is used to image a specific structure of the inspection site, an imaging task consisting of relatively thin slices is added for each site or structure of each site.

[0158] When the second examination protocol includes an instruction for comparative reading with the past examination, the first examination protocol is proposed, in which the imaging conditions such as the positioning of the imaging position and the slice thickness of the past examination image are consistent with the imaging conditions of the past examination image. In addition, the past examination image is sent together with the examination image.

[0159] If the object of the photograph is a left or right part such as the limbs, the left or right part is reminded before shooting. If the left or right part is not specified, if there is a past inspection image, the information of the left or right part is obtained from the past inspection image.

[0160] In the case of post-processing after shooting, such as analysis and processing of the inspection image, the post-processing after shooting is added. In the case of including a disease name, the sequence is reordered according to the disease name. In addition, the meaning of the disease name mentioned here is the same as the meaning of the inspection purpose. For example, in the case of suspected cerebral infarction, the sequence order is changed and the DWI sequence is initially implemented.

[0161] When requesting the creation of an analysis report, lesion detection, or image interpretation assistance is instructed, the analysis process performed in the past examination is added with reference to the contents of the past analysis report, and the analysis conditions set in the past examination are applied as the current analysis conditions.

[0162] Figure 7 is a table showing the correspondence between the subject information and the changes in the examination protocol. Figure 5 In the subject information analysis step S21 shown in FIG. Figure 7 In the case of the subject information corresponding to the left column of the table shown in Figure 5 In the correction instruction receiving step S34 shown in FIG. Figure 7 The right column of the table contains revision instructions corresponding to the changes in the inspection agreement.

[0163] When the subject information includes the presence or absence of metal in the subject's body, the implantation period of the metal in the body, and the material of the metal in the body, a change is made to the shooting task of reducing metal images in the MRI examination corresponding to the metal in the body. In addition, in the MRI examination that does not correspond to the metal in the body, a reminder is given before the examination that it is an MRI examination that does not correspond to the metal in the body. The reminder of the MRI examination that does not correspond to the metal in the body can be understood as a reminder that the MRI examination cannot be performed.

[0164] If the subject information contains risk factors for contrast agent allergy and contrast agent side effects, a reminder will be given before the examination to prevent contrast agent allergy, etc. If the subject information contains information about difficulty in holding breath, such as poor breath holding in the past, only being able to hold breath for a relatively short time, or being unable to hold breath at all, a body motion correction task will be proposed.

[0165] In addition, Figure 6 The inspection information shown corresponds to the inspection protocol modification instructions and Figure 7 The correction instructions corresponding to the subject information shown are examples, and they can be added, deleted, or corrected as appropriate.

[0166] [User interface structure example]

[0167] Figure 8 It is a schematic diagram showing a configuration example of a user interface. Figure 8 The screen 300 shown is displayed as Figure 1 The output device 30 shown functions on the display. That is, Figure 3 The notifying unit 104 shown transmits a display signal showing the screen 300 to the display.

[0168] The screen 300 includes an examination order information area 302 , a subject information area 304 , an examination site area 306 , an examination protocol area 308 , an examination information area 310 , a medical imaging device information area 312 , and a character input area 314 .

[0169] The inspection order information area 302 displays various information of the inspection order, such as the inspection ID and the creator of the inspection order. ID is an abbreviation of IDentification. The subject information area 304 displays various information of the subject, such as the subject's name, subject ID, height, and weight. Figure 7 The displayed information of the subject, such as the presence or absence of metal in the body, is used for creating an inspection protocol.

[0170] The inspection part area 306 displays information on the inspection object area. As the inspection object area, anatomical structures such as organs and partial structures included in the anatomical structures can be displayed. The inspection part area 306 can display information indicating the designation of left and right areas as the inspection object area.

[0171] The second inspection agreement associated with the inspection order is displayed in the inspection agreement area 308. The inspection agreement area 308 may display identification information for identifying the type of the second inspection agreement as the inspection agreement.

[0172] Check information area 310 displays Figure 6 The difficult-to-determine disease range shown in the figure is used for the creation of the examination protocol. The medical imaging device information area 312 displays the medical imaging device information related to the medical imaging device 5, such as the settings of the medical imaging device 5. The character input area 314 displays the operator's input information. Figure 2 The character information is inputted by the input device 40 shown.

[0173] Screen 300 displays a first button 320 , a second button 322 , a third button 324 , a fourth button 326 , a fifth button 328 , and a sixth button 330 . Figure 8 Six buttons are shown, but there can be more than one button.

[0174] Various information input to the medical imaging device 5 is allocated to the first button 320 and the like. For example, information input indicating that the operator approves the examination protocol displayed in the examination protocol area 308 may be allocated to the first button 320.

[0175] Similarly, the second button 322 may be assigned to input information indicating a revision of the inspection agreement displayed in the inspection agreement area 308. The third button 324 may be assigned to information indicating a rejection of the second inspection agreement. That is, the first button 320 may function as an approval button, and the second button 322 may function as a revision instruction button. Furthermore, the third button 324 may function as a rejection button.

[0176] For example, in Figure 5 In the notification display step S14 shown in FIG. Figure 8 The second inspection agreement is displayed in the inspection agreement area 308 of the screen 300 shown in FIG. When the operator approves the second inspection agreement, he can click the first button 320 to send information indicating approval of the second inspection agreement to the operator. Figure 3 The inspection protocol setting unit 106 is shown.

[0177] On the other hand, when the second examination protocol is to be revised, the operator clicks the second button 322 to transmit disapproval information of the second examination protocol, that is, revision instruction information of the second examination protocol, to the examination protocol setting unit 106 .

[0178] In the first inspection agreement notification step S26, the first inspection agreement is displayed in the inspection agreement area 308 of the screen 300. When the operator approves the first inspection agreement, the operator clicks the first button 320 to send information indicating approval of the first inspection agreement to the user. Figure 3 The inspection protocol setting unit 106 is shown.

[0179] On the other hand, when the first inspection protocol is to be modified, the operator clicks the second button 322, and information indicating the modification of the first inspection protocol is sent to the inspection protocol creation unit 108. Furthermore, when the second inspection protocol is to be rolled back without modifying the first inspection protocol, the operator clicks the third button 324, and information indicating the rollback of the second inspection protocol is sent to the inspection protocol setting unit 106. The inspection protocol setting unit 106 sends a signal indicating the rollback of the second inspection protocol to the rollback processing unit 126.

[0180] The screen 300 may display the comparison result of the second inspection protocol and the first inspection protocol. The inspection protocol area 308 may be used to display the comparison result of the second inspection protocol and the first inspection protocol.

[0181] In addition, the functions of the first button 320, the second button 322, and the third button 324 are examples, and the functions of the first button 320 and the like can be appropriately set. Examples of functions that can be assigned to the first button 320 and the like include a function of advancing a screen, a function of returning to a screen, a function of confirming input such as character input, and a function of canceling input. Figure 8 The screen 300 shown is an example of an authentication screen for the operator to input whether or not to approve the first inspection protocol.

[0182] [Effects of the First Embodiment]

[0183] The inspection supporting device 20 and the inspection supporting method according to the first embodiment can obtain the following effects.

[0184] [1]

[0185] The examination auxiliary device 20 receives an examination order including the subject information and the examination information, receives a second examination protocol corresponding to the examination order, and notifies the receipt of the examination order and the receipt of the second examination protocol. When the disapproval information of the second examination protocol is obtained, the second examination protocol is corrected based on the analysis results of the subject information and the analysis results of the examination information, thereby creating the first examination protocol. The medical imaging device 5 applies the first examination protocol to perform the examination of the subject. In this way, the operator can avoid the need to correct the second examination protocol corresponding to the examination order, thereby reducing the burden on the operator.

[0186] [2]

[0187] The examination support device 20 acquires and analyzes past examination information. The examination support device 20 refers to the analysis result of the past examination information to correct the second examination protocol and create the first examination protocol. Thus, information required for creating the first examination protocol can be acquired from the analysis result of the past examination information.

[0188] 〔3〕

[0189] The examination support device 20 displays the first examination protocol created based on the second examination protocol on the display functioning as the output device 30. Thereby, the operator can confirm the content of the first examination protocol.

[0190] That is, it is preferred to implement the imaging determined by the operator as appropriate in the medical imaging device 5, but it is not preferred to automatically change the instructions sent from the image diagnosis department information management system 4. Therefore, it is set as follows: the first examination protocol created based on the second examination protocol is displayed, and the operator can confirm the revised content of the second examination protocol. And, if necessary, the second examination protocol can be returned to the image diagnosis department information management system 4.

[0191] [4]

[0192] The screen 300 displaying the first examination protocol displays a first button 320 for outputting a signal indicating approval of the first examination protocol. Thus, the operator can operate the first button 320 to input a signal indicating approval of the first examination protocol.

[0193] 〔5〕

[0194] The first inspection protocol is created by performing at least one of replacement, order change, and addition of the sequence on the second inspection protocol. Thus, the inspection protocol is changed in units of sequences, and the burden on the operator when changing the inspection protocol can be reduced.

[0195] [6]

[0196] The examination support device 20 receives the correction of the first examination protocol. Thus, the correction of the first examination protocol suitable for the examination is performed, and the burden on the operator when correcting the examination protocol can be reduced.

[0197] 〔7〕

[0198] The examination support device 20 notifies the operator of the comparison result between the first examination protocol created based on the second examination protocol and the second examination protocol. This allows the operator to determine whether the first examination protocol is appropriate.

[0199] [8]

[0200] The examination support device 20 returns the second examination protocol associated with the examination order to the image diagnosis department information management system 4. Thus, the image diagnosis department information management system 4 can be notified that there is a problem in the association between the examination order and the second examination protocol.

[0201] [Configuration Example of Inspection Support Device According to Second Embodiment]

[0202] Fig. 9 This is a functional block diagram showing the electrical structure of the inspection support device according to the second embodiment. The inspection support device 20A receives the inspection order from the image diagnosis department information management system 4, but does not receive the second inspection protocol. The inspection support device 20A creates the first inspection protocol based on the inspection information and the examinee information, referring to the past inspection information as needed.

[0203] and Figure 3 Compared with the inspection support device 20 shown in FIG. 1 , the inspection support device 20A does not include the inspection agreement receiving unit 102, the second approval information acquiring unit 110, and the comparing unit 118. Furthermore, when the first inspection agreement is not approved and the correction is not performed, the return processing unit 126A included in the inspection support device 20A returns the inspection order to the image diagnosis department information management system 4.

[0204] [Steps of the inspection support method according to the second embodiment]

[0205] Fig.10 : is a flowchart showing the steps of the inspection support method involved in the second embodiment. Fig.10 The flowchart shown does not include Figure 5 The inspection agreement receiving step S12, the notification display step S14, and the second inspection agreement approval determination step S16 are shown. Figure 5 The second inspection agreement return step S32 for returning the second inspection agreement includes an inspection order return step S33 for returning the inspection order. Fig.10 The inspection support method of the steps shown in FIG. 1 is an example of an operating method of the inspection support device.

[0206] [Effects of the Second Embodiment]

[0207] In the inspection support device and the inspection support method according to the second embodiment, even when the inspection protocol is not sent when the inspection order is sent, the first inspection protocol is automatically created based on the analysis result of the inspection order. Thus, the operator does not need to analyze the inspection order and create the inspection protocol based on the analysis result, thereby reducing the burden on the operator.

[0208] [About the hardware structure of each processing unit]

[0209] Figure 3 The inspection auxiliary device 20 shown and Fig. 9 The hardware configuration of processing units that execute various processes, such as the examination information receiving unit 100 , the subject information receiving unit 101 , and the examination agreement receiving unit 102 in the examination supporting device 20A shown in the figure, is, for example, various processors as shown below.

[0210] Various processors include general-purpose processors such as CPUs, GPUs, and FPGAs (Field Programmable Gate Arrays) that execute programs and function as various processing units; processors whose circuit structures can be changed after manufacturing, such as programmable logic devices (PLDs) and ASICs (Application Specific Integrated Circuits); and processors with circuit structures specifically designed to perform specific processing, such as dedicated circuits.

[0211] A processing unit may be composed of one of these various processors, or may be composed of two or more processors of the same type or different types. For example, a processing unit may also be composed of multiple FPGAs, or a combination of a CPU and an FPGA, or a combination of a CPU and a GPU. In addition, multiple processing units may also be composed of one processor. As an example of a plurality of processing units composed of one processor, first, there is the following method: as represented by computers such as clients or servers, a processor is composed of a combination of one or more CPUs and software, and the processor functions as multiple processing units. Second, there is the following method: as represented by a system on chip (System On Chip: SoC), a processor that implements the functions of the entire system including multiple processing units is used by one IC (Integrated Circuit: Integrated Circuit) chip. In this way, as a hardware structure, various processing units are composed of more than one of the above-mentioned various processors.

[0212] Furthermore, more specifically, the hardware structure of these various processors is a circuit (circuitry) formed by combining circuit elements such as semiconductor elements.

[0213] [About the program that makes the computer operate]

[0214] A program that enables a computer to implement part or all of the processing functions of the inspection support device 20 and the like in the embodiment can be recorded in a computer-readable medium such as an optical disk, a magnetic disk, or other tangible non-transitory information storage medium, and provided via the information storage medium.

[0215] Furthermore, instead of providing the program by storing it in a tangible non-transitory computer-readable medium, the program signal may be provided as a download service using telecommunication lines such as the Internet.

[0216] Furthermore, part or all of the processing functions in the inspection support device 20 and the like may be realized by cloud computing, and may be provided as SaaS (Software as a Service).

[0217] [Application example of medical image diagnosis and examination system]

[0218] Can make Figure 2 The measuring device 10 and the inspection auxiliary device 20 shown in the figure are electrically connected to each other via an arbitrary network so as to freely communicate data, thereby forming a medical image diagnosis inspection system. The data communication between the measuring device 10 and the inspection auxiliary device 20 may be wired communication or wireless communication. Figure 3The computer shown as a processing unit related to the creation of the first inspection protocol and the computer acting as a control device of the measuring device 10 are independent from the inspection auxiliary device 20, so that the computer acting as the processing unit and the computer acting as the control device of the measuring device 10 are electrically connected freely for data communication via any network.

[0219] The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the gist of the technical concept of the present invention.

Claims

1. An inspection auxiliary device, comprising: More than one processor; and one or more memories storing a program including one or more instructions executed by the one or more processors, The one or more processors execute the program stored in the one or more memories to perform the following processing: Obtaining an examination order from a subject of a medical image diagnostic examination; Acquiring subject information related to the subject; Acquiring examination information related to a medical image diagnostic examination performed on the subject; and Based on the subject information and the examination information, a first examination protocol suitable for the medical image diagnostic examination to be performed based on the examination order is created.

2. The inspection auxiliary device according to claim 1, wherein: The one or more processors perform the following processing: Obtaining a second inspection agreement corresponding to the inspection order; and The second examination protocol is modified based on the subject information and the examination information, thereby creating the first examination protocol.

3. The inspection auxiliary device according to claim 2, wherein: The one or more processors display a comparison result obtained by comparing the first inspection protocol with the second inspection protocol on a display device.

4. The inspection auxiliary device according to claim 2, wherein: The one or more processors perform at least any one of permutation of a sequence, change of order of a sequence, addition of a sequence, and deletion of a sequence in the second inspection protocol when creating the first inspection protocol.

5. The inspection auxiliary device according to any one of claims 1 to 4, wherein: The one or more processors perform the following processing: acquiring past examination information related to past medical image diagnostic examinations performed on the subject in the past; and The first examination protocol is created based on the subject information, the examination information, and the past examination information.

6. The inspection assisting device according to claim 1, wherein: The one or more processors display, on a display device, an authentication screen for an operator to input whether or not to approve the first inspection protocol.

7. The inspection assisting device according to claim 1, wherein: The one or more processors receive a modification of the created first inspection protocol.

8. The inspection auxiliary device according to claim 7, wherein: The one or more processors store a revision history of the first inspection protocol.

9. A working method of an inspection auxiliary device, comprising the following steps: Obtaining an examination order from a subject of a medical image diagnostic examination; Acquiring subject information related to the subject; Acquiring examination information related to a medical image diagnostic examination performed on the subject; and Based on the subject information and the examination information, a first examination protocol suitable for the medical image diagnostic examination to be performed based on the examination order is created.

10. A program product, comprising a program, which, when read by a computer, enables the computer to implement the following functions: Obtaining an examination order from a subject of a medical image diagnostic examination; Acquiring subject information related to the subject; Acquiring examination information related to a medical image diagnostic examination performed on the subject; and Based on the subject information and the examination information, a first examination protocol suitable for the medical image diagnostic examination to be performed based on the examination order is created.

11. A non-transitory computer-readable recording medium having a program recorded thereon, which, when read by a computer, causes the computer to implement the following functions: Obtaining an examination order from a subject of a medical image diagnostic examination; Acquiring subject information related to the subject; Acquiring examination information related to a medical image diagnostic examination performed on the subject; and Based on the subject information and the examination information, a first examination protocol suitable for the medical image diagnostic examination to be performed based on the examination order is created.

12. A medical imaging device comprising an inspection assisting device for assisting in imaging of medical images, wherein: The inspection auxiliary device comprises: More than one processor; and one or more memories storing a program including one or more instructions executed by the one or more processors, The one or more processors execute the program stored in the one or more memories to perform the following processing: Obtaining an examination order from a subject of a medical image diagnostic examination; Acquiring subject information related to the subject; Acquiring examination information related to a medical image diagnostic examination performed on the subject; and Based on the subject information and the examination information, a first examination protocol suitable for the medical image diagnostic examination to be performed based on the examination order is created.

Images