Embedded multimedia memory card test method and system, equipment and storage medium

Abstract

The invention discloses an embedded multimedia memory card test method and system, electronic equipment and a storage medium, which are applied to the test of an eMMC (embedded multimedia card), and the method comprises the following steps: obtaining operation information in an eMMC information interaction process of a control terminal and target equipment in a target scene; therefore, a plurality of first operation commands, the initiation time of the first operation commands and the response time of the first operation commands required by the eMMC to complete the target scene function can be obtained, and the expected operation interval of each first operation command is determined based on the initiation time and the response time of each first operation command. According to the method, the eMMC to be tested is tested, the corresponding first operation commands are packaged based on the expected operation interval, the test units in one-to-one correspondence with the first operation commands are formed, the target test case is obtained through combination based on the test units, the eMMC to be tested is tested, at the moment, the generation efficiency of the target test case is higher, and the test efficiency is improved. And the generated target test case is closer to an actual application scene, so that the test accuracy and efficiency are improved.

Description

Technical Field

[0001] The present application relates to the field of chip technology, and in particular to an embedded multimedia memory card testing method and system, device and storage medium. Background Art

[0002] eMMC is an embedded memory that integrates high-density NAND flash memory and controllers. It has the characteristics of small packaging, low power consumption and high performance. With the widespread application of eMMC in different master control devices and various terminal products, higher requirements are put forward for the development, design and testing of eMMC. However, there are currently three main types of eMMC tests: one is to connect the eMMC to the PC through USB to verify the read and write characteristics of IO; the second is to replace the eMMC on the Android phone and issue operation instructions to the eMMC through the Android operating system; the third is to use a specific platform for test case development. However, the above three traditional eMMC testing methods are either lacking in flexibility or lacking in accuracy. For example, the first method only tests the eMMC through the file system, which can be used as an aging test tool for read and write operations, but cannot implement more complex operations and cannot accurately locate the address of data errors; the second method needs to go through many layers from Android to sending commands to the eMMC, and it is difficult to retain the problem site when a problem occurs; although the third method can directly call the eMMC interface for read and write operations, in actual applications, test case developers need to continuously add new test cases for testing based on the eMMC test requirements, resulting in a long test time and low test efficiency. Therefore, the existing test methods for eMMC cannot take into account both test efficiency and test accuracy. Summary of the invention

[0003] The purpose of the present application is to solve one of the technical problems existing in the prior art to at least a certain extent. To this end, the embodiments of the present application provide an embedded multimedia memory card testing method and system, device and storage medium, which improves the testing efficiency and testing accuracy.

[0004] To achieve the above object, a first aspect of an embodiment of the present application provides a testing method, comprising:

[0005] Controlling the processor of the control terminal to exchange information with the embedded multimedia storage card eMMC according to the target scenario; the eMMC is integrated on the control terminal;

[0006] Acquire operation information generated during information interaction between the control terminal and the eMMC, the operation information including a plurality of first operation commands, an initiation time of each of the first operation commands, and a response time of each of the first operation commands;

[0007] determining, according to the initiation time and the response time of each of the first operation commands, an expected operation interval of each of the first operation commands;

[0008] In response to a test case generation request, encapsulate each of the first operation commands with the corresponding expected operation interval to obtain test units corresponding to the first operation commands one by one, and combine each of the test units to obtain a target test case;

[0009] According to the target test case, the preset SOC interface is called to test the eMMC to be tested.

[0010] To achieve the above object, a second aspect of an embodiment of the present application provides a testing system, including:

[0011] an information acquisition module, configured to control a processor of a control terminal to perform information interaction with an embedded multimedia storage card eMMC according to a target scenario, the eMMC being integrated on the control terminal, and to obtain operation information during the information interaction between the control terminal and the target device, the operation information comprising a plurality of first operation commands and an initiation time of each of the first operation commands and a response time of each of the first operation commands, and to determine an expected operation interval of each of the first operation commands according to the initiation time and the response time of each of the first operation commands;

[0012] A test case generation module encapsulates each of the first operation commands and the corresponding expected operation intervals to form test units corresponding to the first operation commands one by one, and combines each of the test units to obtain a target test case;

[0013] The test execution module is used to call a preset SOC interface to test the eMMC to be tested according to the target test case.

[0014] To achieve the above objectives, a third aspect of an embodiment of the present application proposes an electronic device, which includes a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the method described in the first aspect is implemented.

[0015] To achieve the above-mentioned purpose, the fourth aspect of an embodiment of the present application proposes a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method described in the first aspect is implemented.

[0016] The embodiment of the present application has the following beneficial effects: by obtaining the operation information in the process of information interaction between the control terminal and the eMMC under the target scenario, multiple first operation commands, the initiation time of the first operation command and the response time of the first operation command required by the eMMC to complete the target scenario function can be obtained, and the expected operation interval of each first operation command is determined based on the initiation time and response time of each first operation command, and the corresponding first operation commands are encapsulated based on the expected operation interval to form a test unit corresponding to the first operation command, and the target test case is obtained by combining each test unit. At this time, since the test unit in each target test case contains the expected operation interval, it can be ensured that the issuance of two adjacent second operation commands in each target test case does not affect each other. And for the tester, it only needs to pay attention to the function of the specific target test case without considering the issuance time of the second operation command, and the generation efficiency of the target test case is higher. And because the expected operation interval is obtained based on the operation information exchanged between the control terminal and the target device, the target test case obtained is closer to the actual use scenario when issuing each second operation command, which improves the accuracy of the test. Therefore, compared with the related art, the test accuracy and test efficiency of the embodiment of the present application are higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present application is further described below with reference to the accompanying drawings and embodiments, wherein:

[0018] Figure 1 A schematic diagram of a flow chart of an embodiment of a testing method provided in the present application;

[0019] Figure 2 A schematic diagram of a basic command information interface of an embodiment of a test method provided by the present application;

[0020] Figure 3 A schematic diagram of a test interface of an embodiment of a test method provided by the present application;

[0021] Figure 4 A behavior simulation example diagram of an embodiment of a test method provided by the present application;

[0022] Figure 5 A schematic diagram of the structure of an embodiment of a test system provided by the present application;

[0023] Figure 6 A schematic diagram of the hardware structure of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical scheme and advantages of the present application clearer, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application. For the step numbers in the following embodiments, they are only provided for the convenience of explanation and description, and the order between the steps is not limited in any way. The execution order of each step in the embodiment can be adaptively adjusted according to the understanding of those skilled in the art.

[0025] It should be noted that, although the functional modules are divided in the device schematic diagram and the logical order is shown in the flow chart, in some cases, the steps shown or described can be performed in a different order than the module division in the device or the order in the flow chart. The terms "first", "second", etc. in the specification and claims and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally also includes steps or units that are not listed, or optionally also includes other steps or units inherent to these processes, methods, products or devices.

[0026] Reference to "embodiments" in the present invention means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present invention. The appearance of the phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0027] Traditional eMMC testing methods lack flexibility and high accuracy. Currently, there are three main methods for testing eMMC: one is to connect the eMMC to the PC via USB to perform IO verification of read and write characteristics; the second is to replace the eMMC on the Android phone and test the eMMC through the Android operating system by issuing operation instructions; the third is to use a specific platform for test case development. However, the above three traditional eMMC testing methods are either inflexible or inaccurate. For example, the first method only tests the eMMC through the file system, which can be used as an aging test tool for read and write operations, but cannot perform more complex operations and cannot accurately locate the address of data errors; the second method requires many layers from Android to sending commands to the eMMC, and it is difficult to retain the problem site when problems occur; although the third method can directly call the eMMC interface for read and write operations, in actual applications, test case developers need to continuously add new test cases to test based on the eMMC test requirements, resulting in a long test time and low test efficiency. Therefore, the existing test methods for eMMC cannot take into account both test efficiency and test accuracy. Based on this, the embodiments of the present application provide an embedded multimedia memory card testing method and system, device and storage medium, aiming to improve the testing efficiency and testing accuracy of eMMC.

[0028] An embedded multimedia memory card testing method and system, electronic device and storage medium provided in the embodiments of the present application are specifically described by the following embodiments. First, the testing method in the embodiments of the present application is described. A testing method in the embodiments of the present application can be applied to a terminal, a server, or software running in a terminal or a server. The terminal can be a tablet computer, a laptop computer, a desktop computer, etc., but is not limited to this. The server can be an independent physical server, a server cluster or a distributed system composed of multiple physical servers, or a cloud server that provides basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communications, middleware services, domain name services, security services, content distribution networks (CDNs), and big data and artificial intelligence platforms.

[0029] Figure 1 This is an optional flowchart of a test method provided in an embodiment of the present application, referring to Figure 1 As shown, the method provided in the embodiment of the present application may include but is not limited to S101 to S105.

[0030] S101, controlling the processor of the control terminal to perform information interaction with the embedded multimedia storage card eMMC according to the target scenario; the eMMC is integrated on the control terminal;

[0031] S102, obtaining operation information generated during the information interaction between the control terminal and the eMMC, where the operation information includes a plurality of first operation commands, an initiation time of each first operation command, and a response time of each first operation command;

[0032] S103, determining an expected operation interval of each first operation command according to the initiation time and response time of each first operation command;

[0033] S104, in response to the test case generation request, encapsulate each first operation command with the corresponding expected operation interval to obtain a test unit corresponding to the first operation command one by one, and combine each test unit to obtain a target test case;

[0034] S105, calling a preset SOC interface to test the eMMC to be tested according to the target test case.

[0035] In S101 of some embodiments, the target device is an embedded multimedia storage card eMMC, and the target scenario can be defined according to different application scenarios of the eMMC. In some embodiments, the target scenario includes flashing, booting, restoring factory settings, stress testing and other scenarios. Those skilled in the art can expand according to actual needs, and the embodiments of the present application are not limited.

[0036] In S102 of some embodiments, the transmission path between the control terminal and the target device can be monitored by a dedicated device, such as monitoring a specific network port or using a mirror port technology, so that the data packets passing through the network can be captured, and the complete operation information can be obtained and recorded to obtain the operation information in step S102. In other embodiments, the execution result of the eMMC can also be read on the control terminal side by setting a hook function. Since the operation information is obtained based on the actual control terminal and eMMC information interaction process in the target scenario, it is a reflection of the internal process of the actual use scenario. Therefore, the test cases generated by this application are closer to the actual application scenarios of the product.

[0037] The first operation command is an operation command extracted based on the target scenario. In S102 of some embodiments, the operation information includes multiple first operation commands, such as read commands, write commands, erase commands, switch commands, initialization commands, and upgrade commands.

[0038] The expected operation interval is used to ensure that two adjacent operation commands do not affect each other. In actual applications, the response to each operation command takes time. If the eMMC immediately sends the next operation command before completing the previous operation command, the operation command will fail to be sent. If the waiting time after the operation command is sent is too long, the actual test efficiency will be low and the similarity with the actual operation command will be low. Therefore, the accuracy of the expected operation interval setting will affect the test efficiency and accuracy.

[0039] Since each test unit encapsulates the expected operation interval, when performing target test cases, testers do not need to consider the operation interval between operation commands, but only need to focus on the actual functional scenarios, which makes the generation of target test cases more efficient.

[0040] In S103 of some embodiments, the expected operation interval can be calculated based on the corresponding initiation time and response time; if the time intervals calculated based on the initiation time and response time are different for the same first operation command, then an average calculation can be performed based on multiple calculated time intervals, or a time interval within an interval with a maximum probability can be selected based on the probability distribution as the expected operation interval of the first operation command.

[0041] In some embodiments, each operation command has a corresponding command response, and when packaging the test unit, the operation command, the response corresponding to the operation command, and the expected operation interval are packaged together.

[0042] For example, the operation information includes CMD06 SWITCH and CMD13. In some embodiments, each operation command in the operation information and the response corresponding to each operation command are displayed in chronological order, such as Figure 2 As shown, the following are displayed in chronological order: CMD06 SWITCH command, the response Resp06R1b corresponding to the CMD06 SWITCH command, and CMD13 command. Figure 2 The response of CMD13 command is not listed, but there is a corresponding response after CMD13 command; among them, CMD06 SWITCH command is a switch command, 13:54:28.109.101.104 (h:m:s.ms.us.ns) is the initiation time of the command, 020.735 microseconds is the time interval between the initiation time of CMD06SWITCH command and the operation response time of the previous command, and the parameter of CMD06 SWITCH command can be composed of multiple bits, including command type, access mode, register index, Value, and command set information. The specific functional operation of CMD06 SWITCH command is realized by setting different values ​​in different bits;

[0043] Among them, Resp06 R1b represents the response of the CMD06 SWITCH command, including the parameters returned by the CMD06 SWITCH command execution response, which include status information, etc., and provide important information about the eMMC device status and command execution status; 13:54:28.109.241.090 (h:m:s.ms.us.ns) is the response time of the CMD06 SWITCH command, and 139.986 microseconds is the expected operation interval of the CMD06 SWITCH command; assuming that there is only one record of the CMD06 SWITCH command, the CMD06 SWITCH command and the response Resp06 R1b corresponding to the CMD06 SWITCH command and the expected operation interval 139.986 microseconds are packaged together to obtain a test unit. Assuming that there are two records of the CMD06 SWITCH command, the expected operation intervals of the CMD06 SWITCH command are calculated as the average value to obtain a new expected operation interval.

[0044] In some embodiments, based on different types of control terminals, the test units under different control terminals are determined, so that accurate testing can be performed on the eMMC applied to each type of control terminal, further improving the accuracy of the test.

[0045] As reference Figure 2 As shown, each control terminal generates the following target scenario: Figure 2 The list shown in FIG. 1 is shown, and the expected operation interval of each first operation command in each list is calculated respectively. At this time, multiple test units under each control terminal can be obtained. When generating a test case, the type of control terminal to be tested is selected in a preset view, and a test case is generated based on each test unit under the selected control terminal.

[0046] By directly calling the preset SOC interface for testing, the testing efficiency is higher than that based on the control terminal testing method, and the preset SOC interface directly issues the second operation command, the test path is shorter, and the efficiency of locating the fault after a problem occurs is higher.

[0047] In S104 of some embodiments, the target test case includes a first target test case, and each test unit is combined to obtain the target test case, including:

[0048] Determine the execution order of the test units corresponding to the following first operation commands in the same target scenario according to the initiation time and the response time of the first operation command;

[0049] According to the execution order, the test units under the same target scenario are combined to obtain at least one first target test case.

[0050] By constructing first-target test cases that are closer to actual application scenarios, the accuracy of test case generation can be improved.

[0051] For example, there are two types of functional tests in the target test scenario, one is command 1->command 2->command 3; the other is command 4->command 1->command 5. The test unit corresponding to command 1 is test unit 1, the test unit corresponding to command 2 is test unit 2; the test unit corresponding to command 3 is test unit 3; the test unit corresponding to command 4 is test unit 4; the test unit corresponding to command 5 is test unit 5; then the two target test cases are: target case 1: test unit 1->test unit 2->test unit 3; target case 2: test unit 4->test unit 1->test unit 5.

[0052] In S104 of some embodiments, the target test case includes a second target test case, and each test unit is combined to obtain the target test case, further comprising:

[0053] Displaying each test unit on a preset operation interface, wherein each test unit displays a corresponding first operation command and an expected operation interval;

[0054] In response to a test unit operation request, a plurality of target test units are parsed from the test unit operation request; wherein the test unit operation request is triggered by clicking or dragging the target test unit on the operation interface;

[0055] The target test units are randomly combined to obtain a second target test case.

[0056] In some embodiments, the test unit operation request also limits the number of second target test cases generated based on the target test unit. For example, assuming that there are multiple target test units parsed from the test unit operation request, and the number of cases is set to 3; then the second target test cases obtained by random combination are target test case 1: test unit 2->test unit 1->test unit 3->test unit 5, target test case 2: test unit 1->test unit 3->test unit 5->test unit 2 and target test case 3: test unit 4->test unit 2->test unit 3->test unit 1.

[0057] By providing interface-based operations to achieve the generation of target test cases, the efficiency of test case generation can be improved.

[0058] In S105 of some embodiments, testing the eMMC to be tested according to the target test case includes:

[0059] Generate test processes and execution controls based on target test cases;

[0060] Display the test process and corresponding execution controls in the preset test interface;

[0061] In response to the execution request of the execution control, the first operation commands in the corresponding target test case are sequentially sent to the eMMC to be tested;

[0062] Acquire execution response information corresponding to the issued first operation command from the eMMC to be tested;

[0063] According to the test process, the corresponding progress information and execution response information are displayed on the test interface.

[0064] The test process records the execution order of each second operation command in the corresponding target test case. Figure 3 As shown in the figure, take the target test case containing three operation commands A, B, and C as an example. Figure 3 The logical relationship of the three test units A, B, and C in the test case 1 shown is "A→B→A→C", and the logical relationship of the three test units A, B, and C in the test case 2 is A→C→B→A. When test case 1 is selected and executed, A, B, A, and C will be issued one by one according to "A→B→A→C". Correspondingly, after each second operation command is issued, the corresponding execution response information can be obtained based on the eMMC to be tested after receiving and executing each second operation command. The execution response information includes whether the second operation command is successfully issued, or includes the data block storage status after the second operation command is issued. The embodiment of the present application does not limit how the progress information is displayed. For example, when the first "A" in test case 1 is issued, the node "A" will be displayed in different colors in the test process. For example, when the first "A" in test case 1 is issued, the node "A" will be displayed in different colors in the test process and the percentage number will be displayed when the test process of test case 1 is issued. Correspondingly, the execution response information is displayed on one side of the node "A" of the test process. By sending test cases in sequence to test the eMMC to be tested and displaying the test process on the interface, the process and results of the test execution can be monitored in real time with a high degree of visualization.

[0065] In some embodiments, Figure 4 As shown, the eMMC to be tested is tested according to the target test case, and also includes:

[0066] With the operation time as the horizontal axis and the starting address as the vertical axis, a simulation graph coordinate system is constructed;

[0067] Obtaining the starting address, operation time, and rendering color of each second operation command in each target test case corresponding to the target test case;

[0068] The starting address of each second operation command is used as the horizontal coordinate; the operation time of each second operation command is used as the vertical coordinate, and a plurality of operation coordinates corresponding to the target test case are generated according to the horizontal coordinate, the vertical coordinate and the corresponding rendering color of the same second operation command;

[0069] The operation coordinates of each target test case that meets the same preset use case classification condition are displayed in the same simulation diagram coordinate system to obtain a behavior simulation diagram.

[0070] By intuitively displaying the temporal and spatial distribution of the operation commands corresponding to each test case in the behavior simulation diagram, the similarities and differences between test cases can be quickly identified, thus improving the visualization of the test process.

[0071] By setting the use case classification conditions, test cases can be classified according to different needs, and corresponding behavior simulation diagrams can be generated, which helps to display and analyze specific types of test cases in a targeted manner. The use case classification conditions can be set to test function classification, or they can be set to be classified by type of embedded multimedia storage card. For example, if different types of test functions are classified according to the target test scenario, the test cases that need to be optimized can be quickly screened out based on various types of behavior simulation diagrams to improve the overall test efficiency. For a specific function, when a problem occurs in a corresponding test case of a category, the specific location and time point of the problem can be quickly located based on the corresponding behavior simulation diagram to improve the efficiency and accuracy of the test.

[0072] In some embodiments, the method further comprises:

[0073] Acquire the data block storage state of the eMMC after completing each first operation command in the target scenario, and obtain the expected snapshot corresponding to the first operation command one by one;

[0074] S105, testing the eMMC to be tested according to the target test case, including:

[0075] Obtain the data block storage status after the eMMC to be tested completes each second operation command in the target test case, and obtain a target snapshot corresponding to each second operation command one by one; each second operation command corresponds to a first operation command;

[0076] Output the test results based on the target snapshot and the corresponding expected snapshot.

[0077] The expected snapshot and the target snapshot may record the storage status of each data block in the eMMC, and may also include the status of the issuance of the operation command, etc. The second operation command is the operation command in the target test case. The expected snapshot represents the execution status of the eMMC for each first operation command in the actual application scenario.

[0078] By obtaining the target snapshot and the corresponding expected snapshot, the test results can be ensured to be consistent with expectations, thereby ensuring the accuracy of the test cases. At the same time, problems and performance bottlenecks can be quickly located to improve test efficiency. The target snapshot and the corresponding expected snapshot are displayed on a preset visual interface, making the test results more intuitive and easy to understand, and convenient for analysis and understanding.

[0079] In some embodiments, outputting a test result according to the target snapshot and the corresponding expected snapshot includes:

[0080] Displaying the target snapshot and the corresponding expected snapshot on a preset visualization interface;

[0081] Compare the state information in the target snapshot and the corresponding expected snapshot one by one to obtain a comparison result;

[0082] Output the test result verification report based on the target snapshot, expected snapshot and comparison results.

[0083] Among them, the status information recorded in the expected snapshot and the target snapshot may include the current operation write status, the current operation read status, the written status, the read verification status, etc., and the second operation command status recorded in the target snapshot is compared with the first operation command status recorded in the corresponding expected snapshot to determine whether the verification test is passed. Exemplarily, such as comparing whether the read command status recorded in the target snapshot is consistent with the read command status recorded in the corresponding expected snapshot, if the target snapshot shows that the read operation failed or was not executed, and the corresponding expected snapshot shows that the read operation was successful, then the verification fails, and any operation command is displayed as failed or not executed in the target snapshot, and the command is successfully executed in the corresponding expected snapshot, which indicates that the verification fails; Exemplarily, such as checking whether the operation command recorded in the target snapshot has been correctly issued to the eMMC to be tested, if the target snapshot shows that the operation command is not correctly issued or the execution order is inconsistent with the corresponding expected snapshot, it also indicates that the verification fails. Comparing the expected snapshot with the target snapshot and displaying it in a visual interface can further ensure the accuracy of the test case.

[0084] In combination with a test method described in S101-S105, it can be known that by obtaining the operation information in the process of information interaction between the control terminal and the target device eMMC in the target scenario, multiple first operation commands, the initiation time of the first operation command and the response time of the first operation command required for the eMMC to complete the target scenario function can be obtained, and the expected operation interval of each first operation command is determined based on the initiation time and response time of each first operation command, and the corresponding first operation commands are encapsulated based on the expected operation interval to form a test unit corresponding to the first operation command, and the target test case is obtained by combining each test unit. At this time, since the test unit in each target test case contains the expected operation interval, it can be ensured that the issuance of two adjacent second operation commands in each target test case does not affect each other. And for the tester, it only needs to pay attention to the function of the specific target test case, without considering whether the issuance of the second operation command is successful, and the generation efficiency of the target test case is higher. And since the expected operation interval and the execution order of the test unit are obtained based on the operation information interacted between the control terminal and the target device, the obtained target test case is closer to the actual application scenario, and the accuracy of the test is improved. At the same time, the test interface displays the progress information and execution response information of the test process, and can also generate behavior simulation diagrams, status snapshots, and test result verification reports, which improves the intuitiveness of the test process and results and has a high degree of visualization.

[0085] Figure 5 This is a schematic diagram of a test system structure of an embodiment of the present application. The test system includes:

[0086] The information acquisition module S501 is used to control the processor of the control terminal to perform information interaction with the embedded multimedia storage card eMMC according to the target scenario, where the eMMC is integrated on the control terminal, and to obtain operation information during the information interaction between the control terminal and the target device, where the operation information includes multiple first operation commands and the initiation time of each first operation command and the response time of each first operation command, and to determine the expected operation interval of each first operation command according to the initiation time and the response time of each first operation command;

[0087] The test case generation module S502 is used to encapsulate each first operation command with the corresponding expected operation interval to form a test unit corresponding to the first operation command one by one, and combine the test units to obtain a target test case;

[0088] The test execution module S503 is used to call a preset SOC interface to test the eMMC to be tested according to a target test case.

[0089] The contents of the above method embodiments are all applicable to the present system embodiments. The functions specifically implemented by the present system embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0090] An embodiment of the present application further provides an electronic device, which includes a memory and a processor, wherein the memory stores a computer program, and the above-mentioned test method is implemented when the processor executes the computer program.

[0091] See also Figure 6 , Figure 6 The hardware structure of an electronic device of another embodiment is shown. The electronic device 600 includes:

[0092] The processor 601 may be implemented by a general-purpose CPU (Central Processing Unit), a microprocessor, an application-specific integrated circuit (Application Specific Integrated Circuit, ASIC), or one or more integrated circuits, and is used to execute relevant programs and interact with the embedded multimedia storage card eMMC to implement the technical solution provided in the embodiment of the present application;

[0093] The memory 602 can be implemented in the form of a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 902 can store an operating system and other application programs. When the technical solution provided in the embodiment of this specification is implemented by software or firmware, the relevant program code is stored in the memory 602, and the processor 601 calls and executes the information processing method of the embodiment of this application;

[0094] Input / output interface 603, used to implement information input and output;

[0095] Communication interface 604, used to realize communication interaction between the device and other devices, which can be realized by wired mode (such as USB, network cable, etc.) or wireless mode (such as mobile network, WIFI, Bluetooth, etc.);

[0096] Bus 605 , which transmits information between various components of the device (e.g., processor 601 , memory 602 , input / output interface 603 , and communication interface 604 );

[0097] The processor 601 , the memory 602 , the input / output interface 603 and the communication interface 604 are connected to each other in communication within the device via a bus 605 .

[0098] An embodiment of the present application also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the above-mentioned test method is implemented.

[0099] The memory is a non-transitory computer-readable storage medium that can be used to store non-transitory software programs and non-transitory computer executable programs. In addition, the memory can include a high-speed random access memory and can also include a non-transitory memory, such as at least one disk storage device, a flash memory device, or other non-transitory solid-state storage device.

[0100] The embodiments described in the embodiments of the present application are intended to more clearly illustrate the technical solutions of the embodiments of the present application and do not constitute a limitation on the technical solutions provided in the embodiments of the present application. Those skilled in the art will appreciate that with the evolution of technology and the emergence of new application scenarios, the technical solutions provided in the embodiments of the present application are also applicable to similar technical problems.

[0101] It will be appreciated by those skilled in the art that the technical solutions shown in the figures do not constitute a limitation on the embodiments of the present application, and may include more or fewer steps than shown, or combine certain steps, or different steps. In some optional embodiments, the functions / operations mentioned in the block diagram may not occur in the order mentioned in the operation diagram. For example, depending on the functions / operations involved, two boxes shown in succession may actually be executed substantially simultaneously or the boxes may sometimes be executed in the opposite order. In addition, the embodiments described in the flowcharts of the present application are provided by way of example, with the purpose of providing a more comprehensive understanding of the technology. The disclosed methods are not limited to the operations and logical flows presented herein. Optional embodiments are foreseeable, in which the order of various operations is changed and the sub-operations described as part of a larger operation are executed independently. In addition, although the present application is described in the context of functional modules, it should be understood that, unless otherwise stated to the contrary, one or more of the functions and / or features may be integrated in a single physical device and / or software module, or one or more functions and / or features may be implemented in a separate physical device or software module. It can also be understood that a detailed discussion of the actual implementation of each module is unnecessary for understanding the present application. More specifically, given the properties, functions, and internal relationships of the various functional modules in the devices disclosed herein, the actual implementation of the modules will be understood within the ordinary skill of an engineer. Therefore, those skilled in the art will be able to implement the present application set forth in the claims without undue experimentation using ordinary skills. It will also be understood that the specific concepts disclosed are merely illustrative and are not intended to limit the scope of the present application, which is determined by the full scope of the appended claims and their equivalents.

[0102] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including multiple instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the method of each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, referred to as ROM), random access memory (Random Access Memory, referred to as RAM), disk or optical disk and other media that can store programs.

[0103] In the above description of this specification, the description with reference to the terms "one embodiment / example", "another embodiment / example" or "certain embodiments / examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0104] Although the embodiments of the present application have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present application, and that the scope of the present application is defined by the claims and their equivalents.

[0105] The above is a specific description of the preferred implementation of the present application, but the present application is not limited to the described embodiments. Technical personnel familiar with the field may make various equivalent modifications or substitutions without violating the spirit of the present application. These equivalent modifications or substitutions are all included in the scope defined by the claims of the present application.

Claims

1. A method for testing an embedded multimedia memory card, characterized in that: include: Control the processor of the control terminal to exchange information with the embedded multimedia storage card eMMC according to the target scenario; The eMMC is integrated on the control terminal; Acquire operation information generated during information interaction between the control terminal and the eMMC, the operation information including a plurality of first operation commands, an initiation time of each of the first operation commands, and a response time of each of the first operation commands; determining, according to the initiation time and the response time of each of the first operation commands, an expected operation interval of each of the first operation commands; In response to a test case generation request, encapsulate each of the first operation commands with the corresponding expected operation interval to obtain test units corresponding to the first operation commands one by one, and combine each of the test units to obtain a target test case; According to the target test case, the preset SOC interface is called to test the eMMC to be tested.

2. The embedded multimedia memory card testing method according to claim 1, characterized in that: The target test case includes a first target test case; The step of combining the test units to obtain a target test case includes: Determining, according to the initiation time and the response time of the first operation command, the execution order of the test units corresponding to the first operation commands in the same target scenario; According to the execution order, the test units under the same target scenario are combined to obtain at least one first target test case.

3. The embedded multimedia memory card testing method according to claim 2, characterized in that: The target test case includes a second target test case; The combining of the test units to obtain a target test case also includes: Displaying each of the test units on a preset operation interface, wherein each of the test units displays a corresponding first operation command and an expected operation interval; In response to a test unit operation request, a plurality of target test units are parsed from the test unit operation request; wherein the test unit operation request is triggered by clicking or dragging a target test unit on the operation interface; The target test units are randomly combined to obtain a second target test case.

4. The embedded multimedia memory card testing method according to claim 1, characterized in that: The testing of the eMMC to be tested according to the target test case includes: Generate a test process and an execution control according to the target test case; Displaying the test process and corresponding execution controls in a preset test interface; In response to the execution request of the execution control, sequentially sending each first operation command in the corresponding target test case to the eMMC to be tested; Acquire execution response information corresponding to the first operation command issued one by one from the eMMC to be tested; According to the test process, corresponding progress information and the execution response information are displayed on the test interface.

5. The embedded multimedia memory card testing method according to claim 4, characterized in that: The testing of the eMMC to be tested according to the target test case also includes: With the operation time as the horizontal axis and the starting address as the vertical axis, a simulation graph coordinate system is constructed; Obtaining the starting address, operation time, and rendering color of each second operation command in each target test case corresponding to the target test case; Using the starting address of each second operation command as the abscissa and the operation time of each second operation command as the ordinate, generating a plurality of operation coordinates corresponding to the target test case according to the abscissa, the ordinate and the corresponding rendering color of the same second operation command; The operation coordinates of each of the target test cases that meet the same preset use case classification condition are displayed in the same simulation diagram coordinate system to obtain a behavior simulation diagram.

6. The embedded multimedia memory card testing method according to claim 1, characterized in that: The method further comprises: Acquire the data block storage state of the eMMC after completing each first operation command in the target scenario, and obtain expected snapshots corresponding to the first operation commands one by one; The testing of the eMMC to be tested according to the target test case includes: Acquire the data block storage state of the eMMC to be tested after completing each second operation command in the target test case, and obtain a target snapshot corresponding to each second operation command one by one; each second operation command corresponds to one first operation command; A test result is output according to the target snapshot and the corresponding expected snapshot.

7. The embedded multimedia memory card testing method according to claim 6, characterized in that: The outputting the test result according to the target snapshot and the corresponding expected snapshot includes: Displaying the target snapshot and the corresponding expected snapshot on a preset visualization interface; Compare the state information in the target snapshot and the corresponding expected snapshot one by one to obtain a comparison result; A test result verification report is outputted according to the target snapshot, the expected snapshot and the comparison result.

8. An embedded multimedia memory card testing system, characterized in that: include: an information acquisition module, configured to control a processor of a control terminal to perform information interaction with an embedded multimedia storage card eMMC according to a target scenario, the eMMC being integrated on the control terminal, and to obtain operation information during the information interaction between the control terminal and the target device, the operation information comprising a plurality of first operation commands and an initiation time of each of the first operation commands and a response time of each of the first operation commands, and to determine an expected operation interval of each of the first operation commands according to the initiation time and the response time of each of the first operation commands; A test case generation module encapsulates each of the first operation commands and the corresponding expected operation intervals to form test units corresponding to the first operation commands one by one, and combines each of the test units to obtain a target test case; The test execution module is used to call a preset SOC interface to test the eMMC to be tested according to the target test case.

9. An electronic device, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program, and the processor implements a testing method according to any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, a testing method according to any one of claims 1 to 7 is implemented.

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