Embedded multimedia memory card testing method and system, device and storage medium

Abstract

The application discloses an embedded multimedia memory card test method and system, an electronic device and a storage medium, which are applied to the test of eMMC. Operation information in the information interaction process between a control terminal and a target device eMMC is acquired under a target scene, so that a plurality of first operation commands required by the eMMC to complete a target scene function, the initiation time of the first operation commands and the response time of the first operation commands can be obtained. The expected operation interval of each first operation command is determined based on the initiation time and the response time of each first operation command. Each first operation command is encapsulated based on the expected operation interval, a test unit corresponding to the first operation command is formed, each test unit is combined to obtain a target test case, and the to-be-tested eMMC is tested. At this time, the generation efficiency of the target test case is higher, the generated target test case is closer to an actual application scene, and the accuracy and efficiency of the test are improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the chip technical field, especially to an embedded multimedia memory card testing method and system, equipment and storage medium. BACKGROUND

[0002] The eMMC is an embedded memory integrating high-density NAND flash memory and a controller, and has the characteristics of small package, low power consumption and high performance. With the wide application of eMMC in different host devices and various terminal products, higher requirements are put forward for the development, design and testing of eMMC. However, the current eMMC testing mainly has three methods: one is to access PC through eMMC to USB to verify the IO read-write characteristics; the second is to replace the eMMC on the Android phone to test the eMMC through the operation instruction issued by the Android operating system; the third is to use a specific platform to develop test cases. However, the above three traditional eMMC testing methods lack flexibility or have insufficient accuracy. For example, the first method only tests the eMMC through the file system, can perform read-write operations as an aging test tool, cannot realize more complex operations, and cannot accurately locate the address of data error; the second method needs to pass through many layers from Android to send commands to eMMC, and it is difficult to preserve the problem site when problems occur; the third method can directly call the interface of eMMC to perform read-write operations, but in actual application, the test case developers need to continuously increase new test cases based on the testing requirements of eMMC, which leads to a long testing time and low testing efficiency. Therefore, the existing eMMC testing method cannot balance the testing efficiency and testing accuracy. SUMMARY

[0003] The present application aims to at least partly solve one of the problems in the prior art. To this end, the embodiments of the present application provide an embedded multimedia memory card testing method and system, equipment and storage medium, which improve the testing efficiency and testing accuracy.

[0004] To achieve the above-mentioned purpose, the first aspect of the embodiments of the present application provides a testing method, comprising:

[0005] According to the target scene, the processor of the control terminal controls the information interaction with the embedded multimedia memory card eMMC; the eMMC is integrated on the control terminal;

[0006] Obtain the operation information generated in the information interaction process of the control terminal and the eMMC, the operation information comprising a plurality of first operation commands, the initiation time of each first operation command and the response time of each first operation command;

[0007] Based on the initiation time and response time of each of the first operation commands, the expected operation interval of each of the first operation commands is determined;

[0008] In response to the test case generation request, each of the first operation commands and the corresponding expected operation interval are encapsulated to obtain test units that correspond one-to-one with the first operation commands, and the test units are combined to obtain the target test cases;

[0009] Based on the target test case, the preset SOC interface is called to test the eMMC under test.

[0010] To achieve the above objectives, a second aspect of this application provides a testing system, comprising:

[0011] The information acquisition module is used to control the processor of the control terminal to interact with the embedded multimedia memory card (eMMC) according to the target scenario. The eMMC is integrated on the control terminal. The module acquires operation information during the information interaction between the control terminal and the eMMC. The operation information includes multiple first operation commands and the initiation time and response time of each first operation command. The module determines the expected operation interval of each first operation command based on the initiation time and response time of each first operation command.

[0012] The test case generation module encapsulates each of the first operation commands and the corresponding expected operation interval to form a test unit that corresponds one-to-one with the first operation command. The test units are combined to obtain the target test case.

[0013] The test execution module is used to call the preset SOC interface to test the eMMC under test according to the target test case.

[0014] To achieve the above objectives, a third aspect of this application provides an electronic device, which includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the method described in the first aspect.

[0015] To achieve the above objectives, a fourth aspect of the present application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the method described in the first aspect.

[0016] The embodiments of this application have the following beneficial effects: By acquiring the operation information during the information interaction between the control terminal and the eMMC in the target scenario, multiple first operation commands required for the eMMC to complete the target scenario function, the initiation time of the first operation commands, and the response time of the first operation commands can be obtained. Based on the initiation time and response time of each first operation command, the expected operation interval of each first operation command is determined. Based on the expected operation interval, each corresponding first operation command is encapsulated to form a test unit corresponding to each first operation command. The target test cases are obtained by combining these test units. Since each test unit in the target test case includes the expected operation interval, it can be ensured that the issuance of two adjacent second operation commands in each target test case does not affect each other. Furthermore, for testers, they only need to focus on the function of the specific target test case without considering the timing of the issuance of the second operation commands, resulting in higher efficiency in generating target test cases. Since the expected operation interval is obtained based on the operation information exchanged between the control terminal and the target device, the timing of the issuance of each second operation command in the obtained target test cases is closer to the actual usage scenario, improving the accuracy of the test. Therefore, compared with related technologies, the embodiments of this application have higher test accuracy and test efficiency. Attached Figure Description

[0017] The present application will be further described below with reference to the accompanying drawings and embodiments, wherein:

[0018] Figure 1 A flowchart illustrating an embodiment of a testing method provided in this application;

[0019] Figure 2 A schematic diagram of the basic command information interface of an embodiment of a testing method provided in this application;

[0020] Figure 3 A schematic diagram of the test interface of one embodiment of the test method provided in this application;

[0021] Figure 4 A behavioral simulation example diagram of an embodiment of the testing method provided in this application;

[0022] Figure 5 A schematic diagram of the structure of one embodiment of the testing system provided in this application;

[0023] Figure 6 This is a schematic diagram of the hardware structure of an electronic device according to an embodiment of this application. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application. The step numbers in the following embodiments are for ease of explanation only, and the order of the steps is not limited. The execution order of each step in the embodiments can be adaptively adjusted according to the understanding of those skilled in the art.

[0025] It should be noted that although functional modules are divided in the device schematic diagram and a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the device or the order in the flowchart. The terms "first," "second," etc., in the specification, claims, and the aforementioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or devices.

[0026] In this invention, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0027] Traditional eMMC testing methods lack flexibility and accuracy. Currently, there are three main types of eMMC testing: 1) verifying read / write characteristics by connecting the eMMC to a PC via a USB adapter; 2) testing the eMMC by sending operation commands from the Android operating system to the eMMC; and 3) developing test cases using a specific platform. However, these three traditional eMMC testing methods either lack flexibility or accuracy. For example, the first method only tests the eMMC through the file system, which can be used as an aging test tool for read / write operations but cannot handle more complex operations or accurately locate the address where data errors occur. The second method involves many layers from Android to the eMMC, making it difficult to preserve the problem context when issues arise. Although the third method can directly call the eMMC interface for read / write operations, in practice, test case developers need to continuously add new test cases based on the eMMC testing requirements, resulting in long testing times and low efficiency. Therefore, existing eMMC testing methods cannot balance testing efficiency and testing accuracy. Based on this, embodiments of this application provide an embedded multimedia memory card testing method, system, device, and storage medium, aiming to improve the testing efficiency and accuracy of eMMC.

[0028] This application provides an embedded multimedia memory card testing method and system, electronic device, and storage medium, which are specifically described through the following embodiments. First, the testing method in this application embodiment is described. The testing method in this application embodiment can be applied to a terminal, a server, or software running on a terminal or server. The terminal can be a tablet computer, a laptop computer, a desktop computer, etc., but is not limited to these. The server can be an independent physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, content delivery networks (CDN), and big data and artificial intelligence platforms.

[0029] Figure 1 This is an optional flowchart of a testing method provided in an embodiment of this application, see below. Figure 1 As shown, the method provided in the embodiments of this application may include, but is not limited to, S101 to S105.

[0030] S101, according to the target scenario, the processor of the control terminal interacts with the embedded multimedia storage card eMMC; the eMMC is integrated on the control terminal;

[0031] S102, acquire the operation information generated during the information interaction between the control terminal and the eMMC. The operation information includes multiple first operation commands, the initiation time of each first operation command, and the response time of each first operation command.

[0032] S103, determine the expected operation interval of each first operation command based on the initiation time and response time of each first operation command;

[0033] S104, in response to the test case generation request, encapsulate each first operation command and its corresponding expected operation interval to obtain test units that correspond one-to-one with the first operation commands, and combine the test units to obtain the target test cases;

[0034] S105, based on the target test case, calls the preset SOC interface to test the eMMC under test.

[0035] In some embodiments, S101, the target device is an embedded multimedia storage card (eMMC), and the target scenario can be defined according to different application scenarios of eMMC. In some embodiments, the target scenario includes scenarios such as flashing, booting, restoring factory settings, and stress testing. Those skilled in the art can expand upon this according to actual needs, and the embodiments in this application are not limited thereto.

[0036] In some embodiments, S102 can be performed using dedicated equipment to monitor the transmission path between the control terminal and the target device, such as by monitoring a specific network port or using port mirroring technology. This allows for the capture of data packets passing through the network, obtaining and recording complete operation information to achieve the operation information in step S102. In other embodiments, hook functions can be set to read the execution results of the eMMC on the control terminal side. Since the operation information is obtained based on the actual information interaction between the control terminal and the eMMC in the target scenario, it reflects the internal process of the actual use scenario. Therefore, the test cases generated in this application are closer to the actual application scenario of the product.

[0037] The first operation command is an operation command extracted based on the target scenario. In S102 of some embodiments, the operation information includes multiple first operation commands, such as read commands, write commands, erase commands, switch commands, initialization commands, and upgrade commands.

[0038] The expected operation interval is used to ensure that two adjacent operation commands do not interfere with each other. In practical applications, each operation command requires a response time. If the eMMC issues the next operation command before the previous one has completed, the operation command issuance will fail. Conversely, if the waiting time after an operation command is issued is too long, the actual test efficiency will be low, and the results will not closely resemble the actual operation command issuance situation. Therefore, the accuracy of the expected operation interval setting affects both test efficiency and test accuracy.

[0039] Since each test unit encapsulates the expected operation interval, when generating target test cases, testers do not need to consider the operation interval between operation commands, but only need to focus on the actual functional scenario, resulting in higher efficiency in generating target test cases.

[0040] In some embodiments, in S103, the expected operation interval can be calculated based on the corresponding initiation time and response time. If the same first operation command has different time intervals calculated based on the initiation time and response time, the average of multiple calculated time intervals can be calculated or the time interval within the interval with the highest probability can be selected as the expected operation interval of the first operation command based on the probability distribution.

[0041] In some embodiments, each operation command has a corresponding command response. When encapsulating the test unit, the operation command, the response corresponding to the operation command, and the expected operation interval are encapsulated together.

[0042] For example, taking operation information including CMD06 SWITCH and CMD13 as an example; in some embodiments, the operation commands and their corresponding responses in the operation information are displayed in chronological order, such as... Figure 2 As shown, the following commands are displayed in chronological order: the CMD06 SWITCH command, the corresponding response Resp06 R1b, and the CMD13 command. Although... Figure 2 The response to the CMD13 command is not listed, but a corresponding response exists after the CMD13 command. The CMD06 SWITCH command is a switching command. 13:54:28.109.101.104 (h:m:s.ms.us.ns) represents the command initiation time, and 020.735 microseconds represents the time interval between the initiation time of the CMD06 SWITCH command and the response time of the previous command. The parameters of the CMD06 SWITCH command can consist of multiple bits, including command type, access mode, register index, value, and command set information. The specific function of the CMD06 SWITCH command is achieved by setting different values ​​for different bits.

[0043] In this context, Resp06 R1b represents the response to the CMD06 SWITCH command, containing parameters returned by the CMD06 SWITCH command execution response. These parameters include status information, providing crucial information about the eMMC device status and command execution. 13:54:28.109.241.090 (h:m:s.ms.us.ns) is the response time of the CMD06 SWITCH command, and 139.986 microseconds is the expected operation interval of the CMD06 SWITCH command. Assuming there is only one record for the CMD06 SWITCH command, the CMD06 SWITCH command, its corresponding response Resp06 R1b, and the expected operation interval of 139.986 microseconds are encapsulated together to obtain a test unit. If there are two records for the CMD06 SWITCH command, the expected operation intervals of the CMD06 SWITCH command are calculated by averaging them to obtain a new expected operation interval.

[0044] In some embodiments, test units under different control terminals are determined based on different types of control terminals, thereby enabling precise testing of eMMC applied to each type of control terminal and further improving the accuracy of the test.

[0045] For reference Figure 2 As shown, each control terminal generates the target scene as follows: Figure 2 The list is shown, and the expected operation interval for each first operation command in each list is calculated. At this point, multiple test units under each control terminal can be obtained. When generating test cases, the type of control terminal to be tested is selected in a preset view, and test cases are generated based on each test unit under the selected control terminal.

[0046] Testing by directly calling the preset SOC interface is more efficient than testing based on the control terminal. Furthermore, the preset SOC interface directly issues the second operation command, resulting in a shorter test path and more efficient fault location after a problem occurs.

[0047] In S104 of some embodiments, the target test case includes a first target test case, which is obtained by combining various test units, including:

[0048] Based on the initiation time and response time of the first operation command, determine the execution order of the test units corresponding to the first operation command under the same target scenario;

[0049] Based on the execution order, the test cases will be combined with the test units under the same target scenario to obtain at least one first target test case.

[0050] By constructing primary target test cases that are closer to real-world application scenarios, the accuracy of test case generation can be improved.

[0051] For example, if there are two types of functional tests in the target test scenario, one is command 1 -> command 2 -> command 3; the other is command 4 -> command 1 -> command 5. The test unit corresponding to command 1 is test unit 1, the test unit corresponding to command 2 is test unit 2, the test unit corresponding to command 3 is test unit 3, the test unit corresponding to command 4 is test unit 4, and the test unit corresponding to command 5 is test unit 5; then the two target test cases are: Target Test Case 1: Test Unit 1 -> Test Unit 2 -> Test Unit 3; Target Test Case 2: Test Unit 4 -> Test Unit 1 -> Test Unit 5.

[0052] In some embodiments, S104, the target test case includes a second target test case, which combines various test units to obtain the target test case, and further includes:

[0053] Each test unit is displayed on a preset operation interface, where each test unit displays the corresponding first operation command and the expected operation interval.

[0054] In response to a test unit operation request, multiple target test units are parsed from the test unit operation request; wherein, the test unit operation request is triggered by clicking or dragging the target test unit on the operation interface;

[0055] The target test units are randomly combined to obtain the second target test cases.

[0056] In some embodiments, the test unit operation request further specifies the number of test cases for the second target test cases generated based on the target test unit. For example, assuming there are multiple target test units parsed from the test unit operation request, and the number of test cases is set to 3, then the second target test cases can be obtained by random combination as follows: Target test case 1: test unit 2-> test unit 1-> test unit 3-> test unit 5, Target test case 2: test unit 1-> test unit 3-> test unit 5-> test unit 2, and Target test case 3: test unit 4-> test unit 2-> test unit 3-> test unit 1.

[0057] By providing a graphical interface for generating target test cases, the efficiency of test case generation can be improved.

[0058] In S105 of some embodiments, the eMMC under test is tested according to the target test cases, including:

[0059] Based on the target test cases, generate the test flow and execution controls;

[0060] The test process and corresponding execution controls are displayed in the preset test interface;

[0061] In response to the execution request from the execution control, the first operation commands in the corresponding target test case are sequentially sent to the eMMC under test;

[0062] Obtain the execution response information from the eMMC under test that corresponds one-to-one with the first operation command issued;

[0063] According to the testing process, the corresponding progress information and execution response information are displayed on the testing interface.

[0064] The test process records the execution order of each second operation command in the corresponding target test case. For example, such as... Figure 3 As shown, taking a target test case containing three operation commands, A, B, and C, as an example, Figure 3 In test case 1, the logical relationship between test units A, B, and C is "A→B→A→C", while in test case 2, the logical relationship is "A→C→B→A". When test case 1 is selected and executed, A, B, A, and C are issued sequentially in the order "A→B→A→C". Correspondingly, after each second operation command is issued, the corresponding execution response information can be obtained based on the eMMC under test receiving and executing each second operation command. The execution response information includes whether the second operation command was successfully issued, or the data block storage status after the second operation command was issued. This application embodiment does not limit how progress information is displayed. For example, after the first "A" in test case 1 is issued, node "A" will be displayed in a different color during the test flow. For example, after the first "A" in test case 1 is issued, node "A" will be displayed in a different color during the test flow, and a percentage number will be displayed during the test flow of test case 1. Correspondingly, execution response information is displayed on one side of node "A" in the test process. By sequentially issuing test cases to test the eMMC under test and displaying the test process on the interface, the execution process and results of the test can be monitored in real time, providing a high degree of visualization.

[0065] In some embodiments, such as Figure 4 As shown, testing the eMMC under test according to the target test cases also includes:

[0066] Construct a simulation graph coordinate system with operation time as the horizontal axis and starting address as the vertical axis;

[0067] Obtain the starting address, operation time, and rendering color corresponding to each second operation command in each target test case;

[0068] The starting address of each second operation command is used as the ordinate; the operation time of each second operation command is used as the abscissa. Based on the abscissa, ordinate and corresponding rendering color of the same second operation command, multiple operation coordinates corresponding to the target test case are generated.

[0069] The operation coordinates of each target test case that meets the same preset test case classification conditions are displayed in the same simulation graph coordinate system to obtain a behavior simulation graph.

[0070] By visually displaying the distribution of operation commands corresponding to each test case in time and space in the behavior simulation diagram, the similarities and differences between test cases can be quickly identified, improving the visualization of the testing process.

[0071] By setting test case classification conditions, test cases can be categorized according to different needs, and corresponding behavioral simulation diagrams can be generated. This facilitates targeted analysis of specific types of test cases. Test case classification conditions can be set by test function or by embedded multimedia storage card type. For example, classifying test cases according to different types of test functions in the target test scenario allows for quick filtering of test cases requiring optimization based on the behavioral simulation diagrams of each category, improving overall testing efficiency. Furthermore, for specific functions, when a problem occurs in a corresponding category of test cases, the specific location and time of the problem can be quickly pinpointed based on the corresponding behavioral simulation diagram, improving testing efficiency and accuracy.

[0072] In some embodiments, the method further includes:

[0073] Obtain the data block storage status of eMMC after completing each first operation command in the target scenario, and obtain the expected snapshot corresponding to each first operation command;

[0074] S105, Based on the target test cases, perform tests on the eMMC under test, including:

[0075] Obtain the data block storage status of the eMMC under test after completing each second operation command in the target test case, and obtain the target snapshot corresponding to each second operation command; each second operation command corresponds to a first operation command.

[0076] Output the test results based on the target snapshot and the corresponding expected snapshot.

[0077] Both the expected snapshot and the target snapshot can record the storage status of various data blocks within the eMMC, as well as the issuance status of operation commands. The second operation command is the operation command in the target test case. The expected snapshot represents the execution status of each first operation command by the eMMC in the actual application scenario.

[0078] By acquiring the target snapshot and the corresponding expected snapshot, we can ensure that the test results are consistent with expectations, thereby guaranteeing the accuracy of test cases. At the same time, we can quickly locate problems and performance bottlenecks, improve testing efficiency, and display the target snapshot and the corresponding expected snapshot on a preset visualization interface, making the test results more intuitive and easy to understand, and facilitating analysis and comprehension.

[0079] In some embodiments, test results are output based on the target snapshot and the corresponding expected snapshot, including:

[0080] Display the target snapshot and the corresponding expected snapshot on a preset visualization interface;

[0081] The state information in the target snapshot and the corresponding expected snapshot are compared one by one to obtain the comparison results;

[0082] Based on the target snapshot, the expected snapshot, and the comparison results, a test result verification report is output.

[0083] The status information recorded in the expected and target snapshots can include the current operation write status, current operation read status, written status, and read verification status. Comparing the status of each second operation command recorded in the target snapshot with the status of each first operation command recorded in the corresponding expected snapshot determines whether the verification test passes. For example, comparing the read command status recorded in the target snapshot with the read command status recorded in the corresponding expected snapshot: if the target snapshot shows a read operation failed or not executed, while the corresponding expected snapshot shows a successful read operation, the verification fails. Any operation command that shows failure or not executed in the target snapshot but is successfully executed in the corresponding expected snapshot also indicates a verification failure. For example, checking whether the operation commands recorded in the target snapshot have been correctly sent to the eMMC under test: if the target snapshot shows that the operation commands were not correctly sent or the execution order is inconsistent with the corresponding expected snapshot, the verification also fails. Comparing the expected and target snapshots and displaying the results in a visual interface further ensures the accuracy of the test cases.

[0084] As described in S101-S105, a testing method can be obtained by acquiring operational information during the interaction between the control terminal and the target device's eMMC in the target scenario. This allows for the acquisition of multiple first operation commands required for the eMMC to complete the target scenario's function, their initiation time, and response time. Based on the initiation and response times of each first operation command, the expected operation interval for each command is determined. Each first operation command is then encapsulated based on its expected interval to form a test unit corresponding to each first operation command. These test units are then combined to obtain target test cases. Since each test unit in a target test case includes the expected operation interval, it ensures that the issuance of adjacent second operation commands within each target test case does not interfere with each other. Furthermore, testers only need to focus on the functionality of the specific target test case, without needing to consider whether the second operation command was successfully issued, resulting in higher efficiency in target test case generation. Moreover, because the expected operation interval and the execution order of the test units are derived from the operational information exchanged between the control terminal and the target device, the resulting target test cases are closer to actual application scenarios, improving testing accuracy. Meanwhile, the test interface displays the progress information and execution response information of the test process, and can also generate behavioral simulation diagrams, state snapshots, and test result verification reports, which improves the intuitiveness of the test process and results and has a high degree of visualization.

[0085] Figure 5 This is a schematic diagram of a test system structure according to an embodiment of this application. The test system includes:

[0086] The information acquisition module S501 is used to control the processor of the control terminal to interact with the embedded multimedia storage card eMMC according to the target scenario. The eMMC is integrated on the control terminal and acquires the operation information during the information interaction between the control terminal and the target device. The operation information includes multiple first operation commands and the initiation time and response time of each first operation command. Based on the initiation time and response time of each first operation command, the expected operation interval of each first operation command is determined.

[0087] The test case generation module S502 is used to encapsulate each first operation command and its corresponding expected operation interval to form a test unit that corresponds one-to-one with the first operation command. The test units are then combined to obtain the target test case.

[0088] The test execution module S503 is used to call the preset SOC interface to test the eMMC under test according to the target test cases.

[0089] The content of the above method embodiments is applicable to this system embodiment. The specific functions implemented in this system embodiment are the same as those in the above method embodiments, and the beneficial effects achieved are also the same as those achieved in the above method embodiments.

[0090] This application also provides an electronic device, which includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the above-described test method.

[0091] See Figure 6 , Figure 6 The hardware structure of an electronic device 600 according to another embodiment is illustrated. The electronic device 600 includes:

[0092] The processor 601 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs and interact with the embedded multimedia memory card eMMC to realize the technical solution provided in the embodiments of this application.

[0093] The memory 602 can be implemented as a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 902 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented through software or firmware, the relevant program code is stored in the memory 602 and is called and executed by the processor 601 using the information processing method of the embodiments of this application.

[0094] The input / output interface 603 is used to implement information input and output;

[0095] The communication interface 604 is used to enable communication and interaction between this device and other devices. Communication can be achieved through wired means (such as USB, network cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).

[0096] Bus 605 transmits information between various components of the device (e.g., processor 601, memory 602, input / output interface 603, and communication interface 604);

[0097] The processor 601, memory 602, input / output interface 603, and communication interface 604 are connected to each other within the device via bus 605.

[0098] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described test method.

[0099] Memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs and non-transitory computer-executable programs. Furthermore, memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device.

[0100] The embodiments described in this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems.

[0101] It will be understood by those skilled in the art that the technical solutions illustrated in the figures do not constitute a limitation on the embodiments of this application, and may include more or fewer steps than illustrated, or a combination of certain steps, or different steps. In some alternative embodiments, the functions / operations mentioned in the block diagrams may not occur in the order shown in the operation diagrams. For example, depending on the function / operation involved, two consecutively shown blocks may actually be executed substantially simultaneously, or the blocks may sometimes be executed in reverse order. Furthermore, the embodiments presented and described in the flowcharts of this application are provided by way of example to provide a more comprehensive understanding of the technology. The disclosed methods are not limited to the operations and logic flows presented herein. Alternative embodiments are contemplated in which the order of various operations is changed and sub-operations described as part of a larger operation are executed independently. Furthermore, although this application is described in the context of functional modules, it should be understood that, unless otherwise stated to the contrary, one or more of the functions and / or features may be integrated into a single physical device and / or software module, or one or more functions and / or features may be implemented in separate physical devices or software modules. It is also understood that a detailed discussion of the actual implementation of each module is unnecessary for understanding this application. More precisely, considering the properties, functions, and internal relationships of the various functional modules in the apparatus disclosed herein, the actual implementation of the module will be understood within the realm of conventional technology for an engineer. Therefore, those skilled in the art can implement the present application as set forth in the claims using ordinary techniques without excessive experimentation. It is also understood that the specific concepts disclosed are merely illustrative and not intended to limit the scope of the application, which is determined by the full scope of the appended claims and their equivalents.

[0102] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Similarly, if integrated units are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes multiple instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing programs, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0103] In the foregoing description of this specification, the references to terms such as "one embodiment," "another embodiment," or "some embodiments," etc., indicate that a specific feature, structure, material, or characteristic described in connection with an embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0104] Although embodiments of this application have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the claims and their equivalents.

[0105] The above is a detailed description of the preferred embodiments of this application, but this application is not limited to the embodiments described. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of this application, and these equivalent modifications or substitutions are all included within the scope defined by the claims of this application.

Claims

1. A testing method for an embedded multimedia memory card, characterized in that, include: The processor of the control terminal interacts with the embedded multimedia storage card (eMMC) according to the target scenario. The eMMC is integrated on the control terminal; The operation information generated during the information interaction between the control terminal and the eMMC is obtained. The operation information includes multiple first operation commands, the initiation time of each first operation command, and the response time of each first operation command. Based on the initiation time and response time of each of the first operation commands, the expected operation interval of each of the first operation commands is determined; In response to the test case generation request, each of the first operation commands and the corresponding expected operation interval are encapsulated to obtain test units that correspond one-to-one with the first operation commands, and the test units are combined to obtain the target test cases; According to the target test case, the preset SOC interface is called to test the eMMC under test; The step of testing the eMMC under test according to the target test cases further includes: Construct a simulation graph coordinate system with operation time as the horizontal axis and starting address as the vertical axis; Obtain the starting address, operation time, and rendering color corresponding to each second operation command in each target test case; Using the starting address of each second operation command as the ordinate and the operation time of each second operation command as the abscissa, multiple operation coordinates corresponding to the target test case are generated based on the abscissa, the ordinate, and the corresponding rendering color of the same second operation command. The operation coordinates of each target test case that meets the same preset test case classification conditions are displayed in the same simulation graph coordinate system to obtain a behavior simulation graph.

2. The embedded multimedia memory card testing method according to claim 1, characterized in that, The target test case includes the first target test case; The step of combining the various test units to obtain the target test cases includes: Based on the initiation time and response time of the first operation command, determine the execution order of the test units corresponding to each of the first operation commands in the same target scenario; According to the execution order, the test units under the same target scenario will be combined to obtain at least one first target test case.

3. The embedded multimedia memory card testing method according to claim 2, characterized in that, The target test case includes a second target test case; The step of combining the various test units to obtain the target test case further includes: Each of the test units is displayed on a preset operation interface, wherein each test unit displays the corresponding first operation command and the expected operation interval; In response to a test unit operation request, multiple target test units are parsed from the test unit operation request; wherein the test unit operation request is triggered by clicking or dragging a target test unit on the operation interface; The target test units are randomly combined to obtain the second target test cases.

4. The embedded multimedia memory card testing method according to claim 1, characterized in that, The testing of the eMMC under test according to the target test cases includes: Based on the target test cases, generate the test flow and execution controls; The test process and corresponding execution controls are displayed in a preset test interface; In response to the execution request of the execution control, the first operation commands in the corresponding target test case are sequentially sent to the eMMC under test; Obtain the execution response information corresponding to the first operation command issued from the eMMC under test; According to the test process, the corresponding progress information and execution response information are displayed on the test interface.

5. The embedded multimedia memory card testing method according to claim 1, characterized in that, The method further includes: Obtain the data block storage status of the eMMC after completing each first operation command in the target scenario, and obtain the expected snapshot corresponding to each of the first operation commands; The step of testing the eMMC under test according to the target test cases includes: Obtain the data block storage status of the eMMC under test after completing each of the second operation commands in the target test case, and obtain a target snapshot that corresponds one-to-one with the second operation command; each second operation command corresponds to one first operation command. Based on the target snapshot and the corresponding expected snapshot, output the test results.

6. The embedded multimedia memory card testing method according to claim 5, characterized in that, The step of outputting test results based on the target snapshot and the corresponding expected snapshot includes: The target snapshot and the corresponding expected snapshot are displayed on a preset visualization interface; The state information in the target snapshot and the corresponding expected snapshot are compared one by one to obtain the comparison results; Based on the target snapshot, the expected snapshot, and the comparison results, a test result verification report is output.

7. An embedded multimedia memory card testing system, characterized in that, include: The information acquisition module is used to control the processor of the control terminal to interact with the embedded multimedia memory card (eMMC) according to the target scenario. The eMMC is integrated on the control terminal. The module acquires operation information during the information interaction between the control terminal and the eMMC. The operation information includes multiple first operation commands and the initiation time and response time of each first operation command. The module determines the expected operation interval of each first operation command based on the initiation time and response time of each first operation command. The test case generation module encapsulates each of the first operation commands and the corresponding expected operation interval to form a test unit that corresponds one-to-one with the first operation command. The test units are combined to obtain the target test case. The test execution module is used to call the preset SOC interface to test the eMMC under test according to the target test case; The step of testing the eMMC under test according to the target test cases further includes: Construct a simulation graph coordinate system with operation time as the horizontal axis and starting address as the vertical axis; Obtain the starting address, operation time, and rendering color corresponding to each second operation command in each target test case; Using the starting address of each second operation command as the ordinate and the operation time of each second operation command as the abscissa, multiple operation coordinates corresponding to the target test case are generated based on the abscissa, the ordinate, and the corresponding rendering color of the same second operation command. The operation coordinates of each target test case that meets the same preset test case classification conditions are displayed in the same simulation graph coordinate system to obtain a behavior simulation graph.

8. An electronic device, characterized in that, It includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement a test method as described in any one of claims 1-6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements a test method as described in any one of claims 1 to 6.

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