Mechanical arm for chip testing

Abstract

A chip testing mechanical arm disclosed by the present invention comprises a bottom plate, a column and a guide rail connecting plate, the guide rail connecting plate is rotatably connected with a first segment arm, the first segment arm is rotatably connected with a second segment arm, the second segment arm is rotatably connected with a third segment arm, the third segment arm is rotatably connected with an index plate, and the index plate is connected with a testing head fixing arm. The two side arms of the testing head fixing arm are each rotationally connected with a testing head fixing plate, the two side walls of each testing head fixing arm are each provided with a first adjusting hole, and a first locking handle is inserted into each first adjusting hole. The mechanical arm has the beneficial effects that the mechanical arm can realize height, front-back, left-right and any-angle adjustment of the test head of the chip tester in a specific range, so that the test head can test chips at different positions and angles conveniently, the application range is wider, and the manual test requirement of the chips can be met; the mechanical arm is low in manufacturing cost and beneficial to use and development of small and medium-sized enterprises.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and specifically provides a robotic arm for chip testing. Background Art

[0002] With the development of technology, the chip industry is developing faster and faster. The miniaturization and multi-functionality of chips are the development trends of the modern chip industry. The testing of chips during the manufacturing process is an important part of the entire chip processing process. Chip testing requires a tester. During the testing process, the chip needs to be placed between the chip testing head of the tester and the machine table, and the testing head is driven to move by a robotic arm to test the chip. Most of the existing robotic arms are intelligent robot arms, which are expensive and not conducive to the development of small and medium-sized enterprises. There are also some manual testing arms, but their structures are simple and they can only move horizontally or vertically in a limited space, and cannot perform chip testing at specific angles. For example, a manually adjustable robotic arm for chip testing disclosed in the patent publication number CN115194818A discloses that the movement of the testing head is realized by manually adjusting the rotation of three section arms to achieve displacement in the horizontal direction. Although it can also drive the testing head to rotate a certain angle, it cannot achieve chip testing at some special angles, such as the chip testing angles of left and right inclination or front and back inclination. Therefore, the research on the robotic arm for the chip testing head remains the key research object in current chip testing. Summary of the Invention

[0003] The purpose of the present invention is to provide a robotic arm for chip testing to solve the problems raised in the above background art.

[0004] To achieve the above purpose, the present invention provides the following technical solution: A robotic arm for chip testing, including a bottom plate, a column is provided on the bottom plate, a guide rail connecting plate is connected to the column, a first section arm is rotatably connected to the guide rail connecting plate, a second section arm is rotatably connected to the first section arm, a third section arm is rotatably connected to the second section arm, a dividing plate is rotatably connected to the third section arm, the dividing plate is connected to a testing head fixing arm, the testing head fixing arm is in a U shape, and a testing head fixing plate is rotatably connected to the end of each of the two side arms away from the third section arm. A first adjustment hole is provided on each of the two side walls of the testing head fixing arm, the first adjustment hole is semi-circular arc-shaped, and a first locking handle is inserted into each of the two first adjustment holes, and the two first locking handles are respectively screwed to the two testing head fixing plates.

[0005] Further preferably, a rotating shaft is inserted in the third arm section, the rotating shaft is inserted in the center of the indexing plate and is fixedly connected to the indexing plate, and a second locking handle for locking the rotating shaft is provided on the third arm section. The rotating shaft is used for rotating the indexing plate, and when the second locking handle is turned, the rotating shaft can be fixed, and finally the indexing plate is fixed.

[0006] Further preferably, the third arm section is provided with a positioning assembly for positioning and fixing the indexing plate, so as to realize the positioning and fixing of the connected test head; the positioning assembly comprises a fixing block and a positioning pin, the fixing block is fixed on the third arm section, the positioning pin is rotatably mounted on the fixing block, the indexing plate is provided with a plurality of positioning holes arranged in a circle, and the positioning pin is arranged in coordination with the positioning hole. By rotating the positioning pin and inserting it into the positioning hole on the indexing plate, the indexing plate is fixed, and finally the test head fixing arm and the connected test head are fixed.

[0007] Further preferably, a connecting shaft is connected between the guide rail connecting plate and the first arm section, the first arm section and the second arm section, and the second arm section and the third arm section, a first locking member is provided at the end of the first arm section close to the second arm section and at the end of the second arm section close to the third arm section, and a connecting seat connected to the connecting shaft is provided on the guide rail connecting plate. The connecting shaft is used for the relative connection and rotation of the first arm section, the second arm section and the third arm section, and the first locking member can lock the connecting shaft to fix the second arm section and the third arm section.

[0008] Further preferably, the first locking member comprises a first locking block and a third locking handle, the first locking block is sleeved on the end of the corresponding connecting shaft, and the third locking handle is screwed on the first locking block. The first locking member is used to fix the connecting shaft, and the perforation of the connecting shaft on the first locking block can be squeezed, deformed and changed in direction by rotating the third locking handle, so that the first locking block locks the connecting shaft and fixes the connecting shaft, thereby realizing the positioning of the second arm section and the third arm section after rotation.

[0009] Further preferably, there are two connecting seats and they are arranged at the two ends of the corresponding connecting shafts, and one of the two connecting seats is provided with a joint adjustment positioning plate on the side corresponding to the first arm section, and the joint adjustment positioning plate is provided with a second semicircular adjustment hole, and a fourth locking handle is inserted in the second adjustment hole, and the fourth locking handle is screwed with the first arm section. The joint adjustment positioning plate is used for positioning the first arm section after rotation. After rotating the first arm section, by rotating the fourth locking handle, the joint adjustment positioning plate, the first arm section and the fourth locking handle are relatively locked, so that the joint adjustment positioning plate is locked relative to the first arm section, and the first arm section is positioned after rotation.

[0010] Further preferably, the column is provided with two vertically arranged fuselage guide rods, a slider is connected between the guide rail connecting plate and the fuselage guide rod, and the column is provided with two rubber chains for vertical transmission, the two rubber chains are connected to the guide rail connecting plate, and the two rubber chains are connected to a driving motor. The fuselage guide rod is used for connecting and height adjustment of the guide rail connecting plate, and the driving motor can drive the rubber chain to transmit up and down, so as to pull the guide rail connecting plate to rise and fall along the fuselage guide rod, thereby realizing the height adjustment of the guide rail connecting plate.

[0011] Further preferably, the slider is connected with a second locking member, the second locking member includes a second locking block fixed on the slider, the second locking block is sleeved on the fuselage guide rod, and the second locking block is screwed with a fifth locking handle. The second locking member is used to fix the slider relative to the fuselage guide rod, and by rotating the fifth locking handle, the aperture of the insertion hole of the fuselage guide rod on the second locking block can be deformed and deformed to achieve locking of the fuselage guide rod, and then the second locking block is fixed to the fuselage guide rod, thereby achieving fixing of the slider and the guide rail connecting plate relative to the fuselage guide rod.

[0012] Further preferably, a plurality of positioning rods are provided on the test head fixing plate for installing and positioning the test head of the chip tester.

[0013] Further preferably, the side of the column is provided with a connecting rod arranged up and down, the connecting rod is a smooth rod, on which a monitor seat and a keyboard seat are rotatably connected, the monitor seat and the keyboard seat are used for installing a computer monitor and a computer keyboard respectively, and the monitor seat and the keyboard seat can be adjusted up and down along the connecting rod and rotated circumferentially along the connecting rod to achieve height and position adjustment of the monitor and the computer keyboard for easy operation; a chassis seat is provided on the bottom plate for installing a computer chassis; universal wheels and feet are provided under the bottom plate, the universal wheels can facilitate the movement of the mechanical arm, and the feet are used to fix the position of the mechanical arm after movement.

[0014] Beneficial effects: The chip testing mechanical arm of the present invention realizes position adjustment of the indexing plate through relative rotation of the first arm section, the second arm section and the third arm section, and can adjust the indexing plate to a set angle through the rotating shaft and the positioning assembly, i.e., the second locking handle, to realize rotation angle adjustment of the connected test head fixing arm, and then realize left and right rotation adjustment of the connected test head, so as to meet the chip testing at different angles; through the setting of the test head fixing plate, the first adjustment hole and the first locking handle, the connected test head can be rotated back and forth to realize chip testing at different front and back test angles; the setting of the rotating shaft and the test head fixing plate; through The setting of the body guide rod, rubber chain and driving motor facilitates the height adjustment of the test head connected to the robotic arm; the robotic arm can realize the height, front and back, left and right and any angle adjustment of the test head of the chip tester within a specific range, including left and right rotation and front and back rotation adjustment of the test head, which is convenient for the test head to test chips at different positions and angles, and has a wider range of applications and can meet the needs of manual chip testing; the manual robotic arm has an ingenious structural design, is simple and convenient to operate, can detect a small number of chips, has low detection cost, and the manufacturing cost of the robotic arm is low, which is conducive to the use and development of small and medium-sized enterprises. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the isometric structure of a chip testing mechanical arm disclosed in an embodiment of the present invention;

[0016] Figure 2 This is a schematic diagram of the main structure of a chip testing robot arm disclosed in an embodiment of the present invention;

[0017] Figure 3 A schematic diagram of a structure in which a first arm section, a second arm section, a third arm section and a test head fixed arm are connected to each other according to an embodiment of the present invention;

[0018] Figure 4 A schematic diagram of the matching structure between the first arm section and the connecting seat disclosed in an embodiment of the present invention;

[0019] Figure 5 A schematic diagram of the matching structure between the second arm section, the third arm section and the test head fixed arm disclosed in an embodiment of the present invention;

[0020] Figure 6 This is a schematic structural diagram of a first locking member disclosed in an embodiment of the present invention.

[0021] Figure markings: 1-base plate, 2-column, 3-guide rail connecting plate, 4-first section arm, 5-second section arm, 6-third section arm, 7-indexing plate, 701-positioning hole, 8-test head fixing arm, 801-first adjustment hole, 9-test head fixing plate, 901-positioning rod, 10-first locking handle, 11-rotating shaft, 12-positioning assembly, 1201-fixed block, 1202-positioning pin, 13-second locking handle, 14-connecting shaft, 15-first locking Parts, 1501-first locking block, 1502-third locking handle, 16-connecting seat, 17-joint adjustment positioning plate, 1701-second adjustment hole, 18-fourth locking handle, 19-body guide rod, 20-slider, 21-rubber chain, 22-second locking piece, 2201-second locking block, 2202-fifth locking handle, 23-connecting rod, 24-monitor seat, 25-keyboard seat, 26-chassis seat, 27-universal wheel, 28-foot. DETAILED DESCRIPTION

[0022] The following are specific embodiments of the present invention and the accompanying drawings to further describe the technical solution of the present invention, but the present invention is not limited to these embodiments.

[0023] like Figure 1-6As shown in the figure, a robotic arm for chip testing is used to connect the test head of a chip tester, drive the test head to move, and achieve manual control of the test head to test the chip. The robotic arm includes a base plate 1, on which a column 2 is provided. A guide rail connecting plate 3 is connected to the column 2. The guide rail connecting plate 3 is sequentially rotatably connected to a first section arm 4, a second section arm 5, and a third section arm 6. The third section arm 6 is rotatably connected to a dividing plate 7. Among them, the base plate 1 and the column 2 are used to support the guide rail connecting plate 3, the first section arm 4, the second section arm 5, and the third section arm 6. By lifting the guide rail connecting plate 3, the first section arm 4, the second section arm 5, and the third section arm 6 are lifted, realizing the height adjustment of the first section arm 4, the second section arm 5, and the third section arm 6. The first section arm 4, the second section arm 5, and the third section arm 6 are rotatably connected to each other, facilitating the adjustment of the position of the dividing plate 7 connected to the third section arm 6 in the corresponding horizontal plane. It can move forward and backward, left and right, or rotate in the corresponding horizontal plane, and can move the test head of the chip tester connected to the dividing plate 7 to any position, ensuring that the test head can accurately test the chip within the corresponding range and ensuring the test yield of the chip. The dividing plate 7 can rotate left and right, turning the test head to any angle left and right, meeting the requirements of different chip test angles. The dividing plate 7 is connected to a test head fixing arm 8. The test head fixing arm 8 is in a U shape. At the ends of its two side arms far from the third section arm 6, a test head fixing plate 9 is rotatably connected. On both side walls of the test head fixing arm 8, a first adjustment hole 801 is provided. The first adjustment hole 801 is semi-circular. A first locking handle 10 is inserted into each of the two first adjustment holes 801. The two first locking handles 10 are respectively screwed to the two test head fixing plates 9. The test head fixing arm 8 is used for the installation of the test head fixing plate 9. The U-shaped test head fixing arm 8 facilitates the installation of the test head between the two side arms, facilitating the installation of the test head. The first adjustment hole 801 on the test head fixing arm 9 is used for the forward and backward rotation adjustment of the test head fixing plate 9, and the rotated test head fixing plate 9 is fixed by the first locking handle 10, completing the drive of the test head to rotate forward and backward, meeting the requirements of different chip test angles. And the rotation axis of the test head fixing plate 9 forms a certain angle with the rotation axis of the dividing plate 7, so that the test head can rotate left and right and forward and backward within a certain range, that is, the rotation range is wide, the range of test angles that can be satisfied is larger, and the applicability is more extensive. At the same time, the operation is convenient, simple, and flexible.

[0024] In one solution of the present application, a rotating shaft 11 is inserted in the third arm section 6, the rotating shaft 11 is inserted in the center of the indexing plate 7 and is fixedly connected to the indexing plate 7, and a second locking handle 13 for locking the rotating shaft 11 is provided on the third arm section 6. That is, by setting the rotating shaft 11, the indexing plate 7 can be rotated left and right, and the rotating shaft 11 can be fixed by the second locking handle 13 to prevent the rotating shaft 11 from rotating due to factors such as gravity, so that the indexing plate 7 can be fixed after being rotated to a certain angle, and then the test head of the chip tester can be fixed after being rotated to a certain angle, so that the test head is at a specific angle to meet the requirements of a specific test angle.

[0025] In another embodiment of the present application, a positioning assembly 12 is provided on the third arm section 6 for fixing the indexing disk after rotation. The positioning assembly 12 comprises a fixing block 1201 and a positioning pin 1202, wherein the fixing block 1201 is fixed on the third arm section 6, and the positioning pin 1202 is rotatably mounted on the fixing block 1201. A plurality of positioning holes 701 arranged in a circumference are provided on the indexing disk 7, and the positioning pin 1202 is arranged in coordination with the positioning hole 701. By rotating the positioning pin 1202, the positioning pin 1202 can be inserted into the positioning hole 701 to fix the indexing disk 7 and prevent the indexing disk 7 from rotating. Since the positioning hole 701 is fixed on the indexing disk 7, only the indexing disk 7 rotated at a specific angle can be positioned. In this embodiment, the positioning holes 701 are evenly arranged along the circumferential direction, and the positioning holes 701 can be 4, 6, 8 or other numbers to meet the requirement of rotating the indexing disk 7 at a specific angle, thereby enabling the connected test head to test the chip at a specific angle.

[0026] In the next scheme of the present application, a connecting shaft 14 is connected between the guide rail connecting plate 3 and the first arm section 4, the first arm section 4 and the second arm section 5, and the second arm section 5 and the third arm section 6. A first locking member 15 is provided at the end of the first arm section 4 close to the second arm section 5 and the end of the second arm section 5 close to the third arm section 6. A connecting seat 16 connected to the connecting shaft 14 is provided on the guide rail connecting plate 3. The setting of the connecting shaft 14 facilitates the connection and relative rotation between the guide rail connecting plate 3 and the first arm section 4, the first arm section 4 and the second arm section 5, and the second arm section 5 and the third arm section 6. The first locking member 15 is used to fix the connecting shaft 14 to prevent the connecting shaft 14 from continuing to rotate, so as to achieve the positioning and fixation of the second arm section 5 and the third arm section 6 after rotation, and then achieve the fixation of the connected dividing plate 7 and the test head after the position adjustment, that is, to meet the position adjustment of the test head within a certain horizontal plane range. The connecting seat 16 facilitates the connection between the first arm section 4 and the guide rail connecting plate 3.

[0027] Based on the above solution, the first locking member 15 includes a first locking block 1501 and a third locking handle 1502. The first locking block 1501 is sleeved on the end of the corresponding connecting shaft 14, and the third locking handle 1502 is screwed on the first locking block 1501. The first locking block 1501 is provided with a hole for the connecting shaft 14 to pass through, and the third locking handle 1502 is screwed on the first locking block 1501. By rotating the first locking block 1501, the aperture of the first locking block 1501 can be deformed and reduced, and the connecting shaft 14 can be locked to fix the connecting shaft 14 and prevent it from rotating, that is, to achieve the locking function.

[0028] Based on the above scheme, there are two connecting seats 16 and they are arranged at the upper and lower ends of the corresponding connecting shaft 14. One of the two connecting seats 16 is provided with a joint adjustment positioning plate 17 corresponding to the side of the first arm section 4. The joint adjustment positioning plate 17 is provided with a semicircular second adjustment hole 1701. The second adjustment hole 1701 is inserted with a fourth locking handle 18, and the fourth locking handle 18 is screwed with the first arm section 4. The joint adjustment positioning plate 17 and the second adjustment hole 1701 thereon are provided for the rotational positioning of the first arm section 4. By rotating the fourth locking handle 18, the fourth locking handle 18 and the joint adjustment positioning plate 17 are abutted against and tightly pressed against the first arm section 4, so as to fix the first arm section 4 relative to the joint adjustment positioning plate 17, that is, to lock and fix the first arm section 4. The second adjustment hole 1701 is semicircular, so as to ensure that the fourth locking handle 18 can move in the second adjustment hole 1701 as the first arm section 4 rotates.

[0029] In the next scheme of the present application, two fuselage guide rods 19 are arranged vertically on the column 2, a slider 20 is connected between the guide rail connecting plate 3 and the fuselage guide rod 19, and two rubber chains 21 are arranged vertically on the column 2, the two rubber chains 21 are connected to the guide rail connecting plate 3, and the two rubber chains 21 are connected to a driving motor. The fuselage guide rod 19 facilitates the height adjustment of the guide rail connecting plate 3, and the slider 20 is lifted and lowered along the fuselage guide rod 19 to achieve the lifting and lowering adjustment of the guide rail connecting plate 3, and finally achieves the height adjustment of the first section arm 4, the second section arm 5, the third section arm 6, the test head fixed arm 8 and the connected test head. The rubber chain 21 is driven up and down by the driving motor to pull the guide rail connecting plate 3 up and down along the fuselage guide rod 19.

[0030] Based on the above scheme, the slider 20 is connected with a second locking member 22, and the second locking member 22 includes a second locking block 2201 fixed on the slider 20, the second locking block 2201 is sleeved on the fuselage guide rod 19, and the second locking block 2201 is screwed with a fifth locking handle 2202. In this scheme, the second locking member 22 has the same structure as the first locking member 15, and both are used for locking. By rotating the fifth locking handle 2202, the hole on the second locking block 2201 for the fuselage guide rod 19 to pass through can be squeezed and deformed, so that the hole wall on the second locking block 2201 presses the fuselage guide rod 19, and the second locking block 2201 is fixed to the fuselage guide rod 19, thereby fixing the guide rail connecting plate 3, and realizing the positioning and fixing of the guide rail connecting plate 3 after the height adjustment.

[0031] In the solution of the present application, a plurality of positioning rods 901 are provided on the test head fixing plate 9 for installing and positioning the test head of the chip tester.

[0032] In the scheme of the present application, the side of the column 2 is provided with a connecting rod 23 arranged up and down, and the connecting rod 23 is a bare rod, on which a display seat 24 and a keyboard seat 25 are rotatably connected, a chassis seat 26 is provided on the bottom plate 1, and a universal wheel 27 and a foot 28 are provided below the bottom plate 1. The setting of the connecting rod 23 facilitates the installation of the display seat 24 and the keyboard seat 25, and the display seat 24 and the keyboard seat 25 can be raised and lowered along the connecting rod 23, and rotated around the connecting rod 23 to adjust the height and position of the display seat 24 and the keyboard seat 25. The chassis seat 26 is used to place the computer case, the display seat 24 is used to install the computer display, and the keyboard seat 25 is used to place the computer keyboard. By configuring the computer, data input, detection parameter setting, etc. are realized. The universal wheel 27 is used to move the bottom plate 1, and the universal wheel 27 is used to move the test head connected to the test arm to the corresponding position. By adjusting the height of the foot 28, the universal wheel 27 touches the ground or forms a support for the bottom plate 1, and the position of the test arm after the position adjustment is fixed.

[0033] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein with equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the invention content within the protection scope of the present invention.

Claims

1. A chip testing robot arm, comprising a base plate (1), a column (2) being provided on the base plate (1), a guide rail connecting plate (3) being connected to the column (2), a first arm section (4) being rotatably connected to the guide rail connecting plate (3), the first arm section (4) being rotatably connected to the second arm section (5), the second arm section (5) being rotatably connected to the third arm section (6), the third arm section (6) being rotatably connected to a dividing plate (7), characterized in that: The indexing plate (7) is connected with a test head fixing arm (8). The test head fixing arm (8) is in a U shape. A test head fixing plate (9) is rotatably connected to the end of each of the two side arms of the test head fixing arm (8) that is far away from the third section arm (6). A first adjustment hole (801) is provided on each of the two side walls of the test head fixing arm (8). The first adjustment hole (801) is semi-circular arc-shaped. A first locking handle (10) is inserted into each of the two first adjustment holes (801). The two first locking handles (10) are respectively screwed to the two test head fixing plates (9).

2. A chip testing robot according to claim 1, characterized in that: A rotating shaft (11) is inserted into the third section arm (6). The rotating shaft (11) penetrates through the center of the indexing plate (7) and is fixedly connected to the indexing plate (7). A second locking handle (13) for locking the rotating shaft (11) is provided on the third section arm (6).

3. A chip testing robot according to claim 1, characterized in that: A positioning assembly (12) is provided on the third section arm (6). The positioning assembly (12) includes a fixing block (1201) and a positioning pin (1202). The fixing block (1201) is fixed on the third section arm (6). The positioning pin (1202) is rotatably installed on the fixing block (1201). A plurality of positioning holes (701) arranged in a circular pattern are provided on the indexing plate (7). The positioning pin (1202) is arranged in cooperation with the positioning holes (701).

4. The chip testing robot according to claim 1, characterized in that: A connecting shaft (14) is connected between the guide rail connecting plate (3) and the first section arm (4), between the first section arm (4) and the second section arm (5), and between the second section arm (5) and the third section arm (6). A first locking member (15) is provided at the end of the first section arm (4) close to the second section arm (5) and at the end of the second section arm (5) close to the third section arm (6). A connecting seat (16) connected to the connecting shaft (14) is provided on the guide rail connecting plate (3).

5. A chip testing robot according to claim 4, characterized in that: The first locking member (15) includes a first locking block (1501) and a third locking handle (1502). The first locking block (1501) is sleeved on the end of the corresponding connecting shaft (14). The third locking handle (1502) is screwed to the first locking block (1501).

6. A chip testing robot according to claim 4, characterized in that: There are two connecting seats (16) and they are arranged at both ends of the corresponding connecting shaft (14). An articulation adjustment positioning disc (17) is provided on the side of one of the two connecting seats (16) corresponding to the first section arm (4). A semi-circular arc-shaped second adjustment hole (1701) is provided on the articulation adjustment positioning disc (17). A fourth locking handle (18) is inserted into the second adjustment hole (1701). The fourth locking handle (18) is screwed to the first section arm (4).

7. The chip testing robot according to claim 1, characterized in that: Two machine body guide rods (19) are arranged up and down on the column (2). A slider (20) is connected between the guide rail connecting plate (3) and the machine body guide rods (19). Two rubber chains (21) are arranged for up and down transmission on the column (2). The two rubber chains (21) are connected to the guide rail connecting plate (3). The two rubber chains (21) are connected to a driving motor.

8. The chip testing robot according to claim 7, characterized in that: The slider (20) is connected to a second locking member (22), the second locking member (22) comprises a second locking block (2201) fixed on the slider (20), the second locking block (2201) is sleeved on the fuselage guide rod (19), and the second locking block (2201) is threadedly connected to a fifth locking handle (2202).

9. The chip testing robot according to claim 1, characterized in that: A plurality of positioning rods (901) are provided on the test head fixing plate (9).

10. The chip testing robot according to claim 1, characterized in that: The side of the column (2) is provided with a connecting rod (23) arranged up and down, the connecting rod (23) is a bare rod, and a display seat (24) and a keyboard seat (25) are rotatably connected thereto, a chassis seat (26) is provided on the bottom plate (1), and a universal wheel (27) and a foot (28) are provided below the bottom plate (1).

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