Turnover type semiconductor light source detection jig capable of stably limiting

Abstract

The invention discloses a turnover type semiconductor light source detection jig capable of stably limiting, which comprises a bottom plate in a horizontal state, a side plate in a vertical state and a detection table for supporting, and is characterized in that a clamping mechanism consists of an auxiliary plate, an auxiliary rod, a first spring, a fixed clamping plate, a soft rubber mat and a pressure sensor; the clamping mechanisms are symmetrically arranged on the left side and the right side of the detection table, the adjusting mechanism is composed of an adjusting column, a movable column and an adjusting plate of an arc-shaped structure, and the moving mechanism is composed of a fixed cylinder, a lead screw, a rotating handle, a moving block and a linear guide rail. According to the turnover type semiconductor light source detection jig capable of stably limiting, a detected semiconductor chip can be stably clamped, a good buffer protection effect can be achieved in the clamping process, the clamping force can be observed, the chip is prevented from being damaged by clamping, and the detection efficiency is improved. And the detection angle and position of the semiconductor chip can be conveniently adjusted.

Description

Technical Field

[0001] The present invention relates to the technical field related to semiconductor detection fixtures, and in particular to a flip-type semiconductor light source detection fixture capable of stable limiting. Background Art

[0002] Semiconductor refers to an integrated circuit made of semiconductor materials, which has conductivity between conductors and insulators. By integrating multiple electronic components on a chip, the performance and reliability of electronic equipment can be improved, and the circuit logic operation, arithmetic operation, data transmission and storage functions can be realized. It is widely used in electronic equipment. During the production and processing of semiconductor chips, in order to ensure the quality and performance of the chips, the semiconductor chips need to be tested by light source, and during the test, the semiconductor chips need to be supported and limited by light source detection fixtures;

[0003] As disclosed in announcement number CN214278360U, a semiconductor inspection fixture is provided, including a placement frame, a square groove is provided on the front of the placement frame, a vertical groove is provided on the front of the placement frame, a connecting pin is movably connected to the inner wall of the vertical groove, a partition block is movably connected to the outer wall of the connecting pin, a gasket is provided on the outer wall of the partition block, a stopper is fixedly connected to the top of the placement frame, a slide groove is provided on the front of the placement frame, a screw is movably connected to one side of the placement frame, a handle is fixedly connected to one end of the screw, and a connecting rod is fixedly connected to the outer wall of the screw. Compared with general semiconductor inspection fixtures, this semiconductor inspection fixture saves a lot of time and energy for comparing standard circuit boards when performing semiconductor circuit board inspections, making people's semiconductor inspection work more convenient and quick, and improving semiconductor inspection;

[0004] For example, announcement number CN111975671A discloses a semiconductor material detection jig, including a base, a fixed block is symmetrically fixedly installed on the top of the base, a Reel support arm is rotatably installed on the inner side of the fixed block, and a Reel bearing shaft is rotatably installed on the top of the Reel support arm, and a placement plate is fixedly installed on the top of the base. When the Reel support arm is flipped, the detection jig for semiconductor materials is used to fix the Reel support arm after flipping and folding through the clamping connection between the clamping slot and the clamping block, and the use of the first torsion first spring. In the flipping process of the Reel support arm, the extrusion groove presses and flips the standard detection plate, thereby realizing the folding and fixing of the device. Since a plurality of placement slots are provided on the Reel bearing shaft, multiple Reels can be detected at the same time. The device is foldable, so that the device is easy to carry, and the Reel is positioned during the detection, thereby improving the accuracy of the Reel detection.

[0005] However, the existing semiconductor light source detection fixture still has the following shortcomings:

[0006] 1. The existing semiconductor light source detection fixture lacks buffer protection components when clamping semiconductor chips, and it is not convenient to observe the clamping force of the chip, which is easy to cause damage to the chip due to excessive clamping;

[0007] 2. In the existing semiconductor light source detection fixture, the angle of the semiconductor chip is mostly fixed during the detection process, which is inconvenient to adjust the detection angle of the semiconductor chip according to actual detection requirements;

[0008] 3. In the existing semiconductor light source detection fixture, the position of the semiconductor chip is mostly fixed during the detection process, which makes it inconvenient to adjust the detection position of the chip according to the position of the detection equipment. In many cases, the chip needs to be removed for adjustment and then re-fixed. The operation steps are relatively cumbersome, affecting the actual detection efficiency.

[0009] Therefore, we propose a flip-type semiconductor light source detection fixture that can stably limit the position in order to solve the above-mentioned problems. Summary of the invention

[0010] The object of the present invention is to provide a flip-type semiconductor light source detection fixture that can stably limit the position, so as to solve the problems proposed in the above-mentioned background technology that when clamping the semiconductor chip, there is a lack of buffer protection components, and it is inconvenient to observe the clamping force of the chip, and it is easy to clamp the chip too hard and cause damage to it. During the detection process, the angle of the semiconductor chip is mostly fixed, which is inconvenient to adjust the detection angle of the semiconductor chip according to actual detection needs. Moreover, the position of the semiconductor chip is mostly fixed, which is inconvenient to adjust the detection position of the chip accordingly with the position of the detection equipment. In many cases, the chip needs to be removed for adjustment and then re-fixed, and the operation steps are relatively cumbersome, affecting the actual detection efficiency.

[0011] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a flip-type semiconductor light source detection fixture capable of stable limiting, comprising a bottom plate in a horizontal state, a side plate in a vertical state and a detection table for support;

[0012] The left and right ends of the testing platform are fixedly connected with connecting plates;

[0013] Also includes:

[0014] A clamping mechanism, which is composed of an auxiliary plate, an auxiliary rod, a first spring, a fixed clamping plate, a soft rubber pad and a pressure sensor, and is symmetrically arranged on the left and right sides of the test platform, and is used to clamp the semiconductor chip to be tested;

[0015] An adjustment mechanism, wherein the adjustment mechanism is composed of an adjustment column, a movable column and an adjustment plate with an arc-shaped structure, and the adjustment mechanism together with the detection platform and the connecting plate drives the semiconductor chip to form a flip structure at the upper end of the bottom plate;

[0016] The moving mechanism is composed of a fixed cylinder, a screw rod, a turning handle, a moving block and a linear guide rail.

[0017] Preferably, the side panel is fitted on the upper end of the bottom plate, and a connecting plate is provided on the inner side of the upper end of the side panel, a connecting rod is fixedly connected to the lower end of the connecting plate, and a connecting cap for limiting is threadedly connected to the outer surface of the connecting rod.

[0018] Preferably, the connecting cap is fitted on the lower end of the movable plate, a connecting rod is penetrated through the lower end of the movable plate, and the movable plate slot is connected to the middle of the connecting plate, the upper end of the movable plate is fixedly connected to the auxiliary plate, and the front and rear ends of the auxiliary plate are slidably connected to the auxiliary rod in a "T" shape.

[0019] Preferably, a first spring is sleeved on the outer surface of the auxiliary rod, and a fixing clamp is fixedly connected to one end of the auxiliary rod close to the detection platform.

[0020] Preferably, a soft rubber pad is provided on the inner side of the fixed splint, and a pressure sensor is provided in close contact with the middle part of the fixed splint;

[0021] Meanwhile, the pressure sensor is fixedly installed in the middle of the auxiliary plate.

[0022] Preferably, the adjustment column is rotatably connected to the upper end of the side plate.

[0023] Preferably, the adjusting column is fixedly connected to one end of the connecting plate away from the detection platform, and a movable column is fixedly connected to the outer side of the lower end of the adjusting column, a sliding structure is formed between the movable column and the adjusting plate, and the adjusting plate is fixedly connected to the outer side of the upper end of the side plate, and a fixing groove is opened at an equal angle at the lower end of the adjusting plate.

[0024] Preferably, an upper connecting hook is fixedly connected to the outer side of the upper end of the adjusting column, and a second spring is arranged inside the adjusting column, a movable end of the second spring is fixedly connected to a movable pin, and the movable pin is telescopically connected to the lower end of the adjusting column;

[0025] Wherein, the outer side of the upper end of the movable pin is fixedly connected with a lower connecting hook, and an up-and-down sliding structure is formed between the lower connecting hook and the adjusting column.

[0026] Preferably, the fixed cylinder is fixedly connected to the upper end of the base plate, and the middle part of the fixed cylinder is rotatably connected to a screw rod, the left and right ends of the screw rod are fixedly connected to a turning handle, the left and right ends of the screw rod are threadedly connected to a moving block, and a left-right sliding structure is formed between the moving block and the fixed cylinder.

[0027] Preferably, the moving block is fixedly connected to the middle part of the side plate, and a fixed cylinder is provided through the middle part of the side plate, a left-right sliding structure is formed between the lower end of the side plate and the linear guide rail, and the linear guide rail is fixedly connected to the left and right sides of the upper end of the bottom plate respectively.

[0028] Compared with the prior art, the beneficial effects of the present invention are as follows: the flip-type semiconductor light source detection fixture capable of stable limiting can stably clamp the semiconductor chip to be detected through the arrangement of the connecting rod, the connecting cap, the movable plate and the clamping mechanism, and can play a good role of buffer protection during the clamping process, and can also observe the magnitude of the clamping force to avoid clamping damage to the chip, and the semiconductor chip is driven to flip at the upper end of the bottom plate through the adjustment mechanism together with the detection table, and the semiconductor chip is driven to move left and right at the upper end of the bottom plate in combination with the moving mechanism together with the side plate and the detection table, so as to facilitate the adjustment of the detection angle and position of the semiconductor chip, without the need to remove the semiconductor chip for adjustment, the operation is relatively convenient, and the operation steps are saved, thereby improving the detection efficiency of the semiconductor chip;

[0029] 1. It is equipped with a connecting rod, a connecting cap, a movable plate and a clamping mechanism, and the clamping mechanism includes an auxiliary plate, an auxiliary rod, a first spring, a fixed clamping plate, a soft rubber pad and a pressure sensor. Through the arrangement of the connecting rod, the connecting cap, the movable plate and the clamping mechanism, it is convenient to stably clamp the semiconductor chip, and it can prevent the chip from being clamped during clamping, and the protective effect is good;

[0030] 2. An adjustment mechanism is provided, which is arranged at the upper end of the side plate. The adjustment mechanism includes an adjustment column, a movable column and an adjustment plate. Through the setting of the adjustment mechanism, together with the connecting plate and the detection table, the semiconductor chip is driven to flip at the upper end of the bottom plate, so as to facilitate the flip adjustment of the detection angle of the semiconductor chip;

[0031] 3. A moving mechanism is provided, which includes a fixed cylinder, a screw rod, a turning handle, a moving block and a linear guide rail. Through the setting of the moving mechanism, together with the side plate, the connecting plate and the detection table, the semiconductor chip is driven to move left and right at the upper end of the bottom plate, so as to facilitate the left and right adjustment of the detection position of the semiconductor chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0033] Figure 2 It is a schematic diagram of the top view structure of the present invention;

[0034] Figure 3 It is a front view structural schematic diagram of the present invention;

[0035] Figure 4It is a schematic diagram of the overall structure of the testing platform, connecting plate, movable plate, auxiliary plate and fixed clamping plate of the present invention;

[0036] Figure 5 It is a schematic diagram of the overall structure of the connecting rod, the connecting cap, the movable plate and the clamping mechanism of the present invention;

[0037] Figure 6 It is a schematic diagram of the front view cross-section structure of the connecting plate, the movable plate, the adjusting column and the adjusting plate of the present invention;

[0038] Figure 7 It is a schematic diagram of the explosion structure of the auxiliary plate, the auxiliary rod, the fixing clamp plate and the pressure sensor of the present invention;

[0039] Figure 8 For the present invention Figure 1 The enlarged structural diagram at A in the middle;

[0040] Fig. 9 This is a schematic diagram of the exploded structure of the adjustment column and the adjustment plate of the present invention;

[0041] Fig.10 This is a schematic diagram of the exploded structure of the adjusting column and the movable pin of the present invention;

[0042] Fig.11 It is a bottom view structural schematic diagram of the present invention;

[0043] Fig.12 It is a schematic diagram of the front view and cross-section structure of the side plate, the fixed cylinder and the moving block of the present invention;

[0044] Fig.13 This is a schematic diagram of the exploded structure of the fixed cylinder, the screw rod and the moving block of the present invention;

[0045] Fig.14 It is a schematic diagram of the exploded structure of the side plate and the moving block of the present invention when viewed from above.

[0046] In the figure: 1. bottom plate; 2. side plate; 3. test table; 4. connecting plate; 5. connecting rod; 6. connecting cap; 7. movable plate; 8. clamping mechanism; 9. auxiliary plate; 10. auxiliary rod; 11. first spring; 12. fixed clamping plate; 13. soft rubber pad; 14. pressure sensor; 15. adjustment mechanism; 16. adjustment column; 17. movable column; 18. adjustment plate; 19. fixing groove; 20. upper connecting hook; 21. second spring; 22. movable pin; 23. lower connecting hook; 24. fixing cylinder; 25. screw rod; 26. turning handle; 27. moving block; 28. linear guide. DETAILED DESCRIPTION

[0047] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0048] See also Figure 1-Figure 14 , the present invention provides the following technical solutions:

[0049] Embodiment 1: In order to solve the problems in the prior art that when clamping a semiconductor chip, there is a lack of buffer protection components, it is inconvenient to observe the clamping force of the chip, and it is easy to clamp the chip too hard and cause damage, so this embodiment adopts the following technical scheme, a flip-type semiconductor light source detection fixture capable of stable limiting, provided with a bottom plate 1, a side plate 2, a detection table 3, a connecting plate 4, a connecting rod 5, a connecting cap 6, a movable plate 7 and a clamping mechanism 8, the side plate 2 is fitted on the upper end of the bottom plate 1, and a connecting plate 4 is provided on the inner side of the upper end of the side plate 2, the lower end of the connecting plate 4 is fixedly connected to the connecting rod 5, and the outer surface of the connecting rod 5 is threadedly connected to the connecting cap 6 for limiting, the clamping mechanism 8 is composed of an auxiliary plate 9, an auxiliary rod 10, a first spring 11, a fixed clamping plate 12, a soft rubber pad 13 and a pressure sensor 14, and the clamping mechanism 8 is It is said that it is arranged on the left and right sides of the detection platform 3, and the clamping mechanism 8 is used to clamp the semiconductor chip to be detected. 3. According to claim 2, a flip-type semiconductor light source detection fixture capable of stable limiting is characterized in that: the connecting cap 6 is fitted on the lower end of the movable plate 7, the lower end of the movable plate 7 is penetrated by a connecting rod 5, and the movable plate 7 is connected to the middle of the connecting plate 4 by a slot, the upper end of the movable plate 7 is fixedly connected to an auxiliary plate 9, and the front and rear ends of the auxiliary plate 9 are slidably connected to an auxiliary rod 10 in a "T"-shaped structure, the outer surface of the auxiliary rod 10 is sleeved with a first spring 11, and the end of the auxiliary rod 10 close to the detection platform 3 is fixedly connected to a fixed clamping plate 12, the inner side of the fixed clamping plate 12 is provided with a soft rubber pad 13, and the middle part of the fixed clamping plate 12 is fitted with a pressure sensor 14, and the pressure sensor 14 is fixedly installed in the middle of the auxiliary plate 9;

[0050] like Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 , Figure 6 and Figure 7As shown, the bottom plate 1 is placed on the workbench, and then the semiconductor chip to be tested is placed on the upper end of the testing platform 3, and then the connecting cap 6 threadedly connected to the outer surface of the connecting rod 5 is rotated, and the connecting cap 6 pushes the movable plate 7 to slide between the connecting rod 5, and the movable plate 7 moves in the middle of the connecting plate 4. At this time, the movable plate 7 pushes the auxiliary plate 9 and the fixed clamping plate 12 to move to the side close to the testing platform 3, and the fixed clamping plate 12 drives the soft rubber pad 13 to contact the semiconductor chip, so as to stably clamp the semiconductor chip, and in the clamping process, the fixed clamping plate 12 drives the auxiliary rod 10 to slide between the auxiliary plate 9, and the fixed clamping plate 12 squeezes the first spring 11, so that the first spring 11 undergoes elastic deformation, thereby being able to play a good buffering role, and the fixed clamping plate 12 squeezes the pressure sensor 14, and the clamping force can be detected and observed through the pressure sensor 14 to prevent the clamping force from being too large to cause clamping damage to the semiconductor chip. After the semiconductor chip is clamped, the semiconductor chip is subjected to light source detection through external detection equipment;

[0051] Embodiment 2: In order to solve the problem in the prior art that the angle of the semiconductor chip is mostly fixed during the detection process, which makes it inconvenient to adjust the detection angle of the semiconductor chip according to the actual detection requirements, the present embodiment adopts the following technical scheme, a flip-type semiconductor light source detection fixture capable of stable limiting, provided with an adjustment mechanism 15, an adjustment column 16, a movable column 17, an adjustment plate 18, a fixing groove 19, an upper connecting hook 20, a second spring 21, a movable pin 22 and a lower connecting hook 23, the adjustment mechanism 15 is composed of an adjustment column 16, a movable column 17 and an adjustment plate 18 with an arc-shaped structure, and the adjustment mechanism 15 together with the detection table 3 and the connecting plate 4 drive the semiconductor chip to form a flip structure at the upper end of the base plate 1, and the adjustment column 16 rotates Connected to the upper end of the side plate 2, the adjusting column 16 is fixedly connected to the end of the connecting plate 4 away from the detection platform 3, and the outer side of the lower end of the adjusting column 16 is fixedly connected to a movable column 17, and a sliding structure is formed between the movable column 17 and the adjusting plate 18, and the adjusting plate 18 is fixedly connected to the outer side of the upper end of the side plate 2, and the lower end of the adjusting plate 18 is provided with a fixing groove 19 at an equal angle, and the outer side of the upper end of the adjusting column 16 is fixedly connected to an upper connecting hook 20, and a second spring 21 is arranged inside the adjusting column 16, and the movable end of the second spring 21 is fixedly connected to a movable pin 22, and the movable pin 22 is telescopically connected to the lower end of the adjusting column 16, and the outer side of the upper end of the movable pin 22 is fixedly connected to a lower connecting hook 23, and an up-and-down sliding structure is formed between the lower connecting hook 23 and the adjusting column 16;

[0052] like Figure 8 , Fig. 9 , Fig.10 and Fig.11As shown, during the detection process, the upper connecting hook 20 can also be held by hand and the lower connecting hook 23 can be pulled upward, and the lower connecting hook 23 can drive the movable pin 22 to slide at the lower end of the adjusting column 16, and the movable pin 22 can squeeze the second spring 21, so that the second spring 21 can be elastically deformed. At this time, the movable pin 22 moves upward and moves out of the fixing groove 19, thereby releasing the limit between the adjusting column 16 and the adjusting plate 18, and then slowly rotates the adjusting column 16, and the adjusting column 16 rotates at the upper end of the side plate 2, and the adjusting column 16 drives the movable column 17 and the adjusting plate 18 to move between The adjusting column 16 together with the connecting plate 4 and the detection platform 3 drives the semiconductor chip to flip over at the upper end of the bottom plate 1, so as to facilitate the adjustment of the detection angle of the semiconductor chip. When the angle adjustment is completed, the lower connecting hook 23 is directly released. At this time, the second spring 21 restores its elastic deformation, and the second spring 21 pushes the movable pin 22 to slide at the lower end of the adjusting column 16. The movable pin 22 is inserted downward into the fixing groove 19 at the corresponding position, so as to facilitate the limiting of the adjusting column 16 and the adjusting plate 18, and realize the fixation between the adjusting column 16 and the side plate 2.

[0053] Embodiment 3: In order to solve the problem that the positions of semiconductor chips in the prior art are mostly fixed, it is inconvenient to adjust the detection position of the chip corresponding to the position of the detection equipment, and the chip needs to be removed for adjustment and then re-fixed in many cases, and the operation steps are cumbersome, which affects the actual detection efficiency. Therefore, this embodiment adopts the following technical scheme, a flip-type semiconductor light source detection fixture capable of stable limiting is provided with a moving mechanism, which is composed of a fixed cylinder 24, a screw rod 25, a turning handle 26, a moving block 27 and a linear guide rail 28, fixed The fixed cylinder 24 is fixedly connected to the upper end of the bottom plate 1, and the middle part of the fixed cylinder 24 is rotatably connected with a screw rod 25, and the left and right ends of the screw rod 25 are fixedly connected with a turning handle 26, and the left and right ends of the screw rod 25 are threadedly connected with a moving block 27, and a left-right sliding structure is formed between the moving block 27 and the fixed cylinder 24, and the moving block 27 is fixedly connected to the middle part of the side plate 2, and the middle part of the side plate 2 is penetrated by the fixed cylinder 24, and a left-right sliding structure is formed between the lower end of the side plate 2 and the linear guide rail 28, and the linear guide rail 28 is respectively fixedly connected to the left and right sides of the upper end of the bottom plate 1;

[0054] like Figure 1 , Figure 3 , Fig.12 , Fig.13 and Fig.14As shown, during detection, the screw rod 25 can also be driven to rotate in the middle of the fixed cylinder 24 by turning the handle 26, and the screw rod 25 drives the moving block 27 to slide in the fixed cylinder 24. At this time, the moving block 27 drives the side plate 2 to slide between the fixed cylinder 24, and at the same time, the lower end of the side plate 2 slides left and right between the linear guide rail 28. The side plate 2 together with the connecting plate 4 and the detection table 3 drives the semiconductor chip to move left and right at the upper end of the base plate 1, so as to facilitate the adjustment of the detection position of the semiconductor chip.

[0055] The contents not described in detail in this specification belong to the prior art known to professional and technical personnel in the field. The standard parts used in the present invention can be purchased from the market, and special-shaped parts can be customized according to the description in the specification and the drawings. The specific connection methods of each part adopt the conventional means such as mature bolts, rivets, welding, etc. in the prior art. The machinery, parts and equipment adopt the conventional models in the prior art, and the circuit connection adopts the conventional connection method in the prior art, which will not be described in detail here.

[0056] Although the present invention has been described in detail with reference to the aforementioned embodiments, it is still possible for those skilled in the art to modify the technical solutions described in the aforementioned embodiments, or to make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A flip-type semiconductor light source detection fixture capable of stable limiting, comprising a bottom plate (1) in a horizontal state, a side plate (2) in a vertical state, and a detection table (3) for supporting; The left and right ends of the detection platform (3) are both fixedly connected with connecting plates (4); It is characterized in that Also includes: A clamping mechanism (8), the clamping mechanism (8) comprising an auxiliary plate (9), an auxiliary rod (10), a first spring (11), a fixed clamping plate (12), a soft rubber pad (13) and a pressure sensor (14), and the clamping mechanism (8) is symmetrically arranged on the left and right sides of the testing platform (3), and the clamping mechanism (8) is used to clamp the semiconductor chip to be tested; An adjustment mechanism (15), the adjustment mechanism (15) being composed of an adjustment column (16), a movable column (17) and an adjustment plate (18) having an arc-shaped structure, and the adjustment mechanism (15) together with the detection platform (3) and the connecting plate (4) drives the semiconductor chip to form a flip structure at the upper end of the bottom plate (1); The moving mechanism is composed of a fixed cylinder (24), a screw rod (25), a turning handle (26), a moving block (27) and a linear guide rail (28).

2. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 1 is characterized in that: The side plate (2) is fitted on the upper end of the bottom plate (1), and a connecting plate (4) is provided on the inner side of the upper end of the side plate (2). The lower end of the connecting plate (4) is fixedly connected to a connecting rod (5), and the outer surface of the connecting rod (5) is threadedly connected to a connecting cap (6) for limiting position.

3. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 2 is characterized in that: The connecting cap (6) is fitted on the lower end of the movable plate (7), a connecting rod (5) is provided through the lower end of the movable plate (7), and a slot of the movable plate (7) is connected to the middle of the connecting plate (4), an auxiliary plate (9) is fixedly connected to the upper end of the movable plate (7), and both front and rear ends of the auxiliary plate (9) are slidably connected to auxiliary rods (10) in a "T"-shaped structure.

4. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 3 is characterized in that: The outer surface of the auxiliary rod (10) is sleeved with a first spring (11), and one end of the auxiliary rod (10) close to the detection platform (3) is fixedly connected to a fixed clamping plate (12).

5. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 4 is characterized in that: A soft rubber pad (13) is arranged on the inner side of the fixed splint (12), and a pressure sensor (14) is arranged in close contact with the middle part of the fixed splint (12); At the same time, the pressure sensor (14) is fixedly installed in the middle of the auxiliary plate (9).

6. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 1, characterized in that: The adjusting column (16) is rotatably connected to the upper end of the side plate (2).

7. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 6, characterized in that: The adjusting column (16) is fixedly connected to one end of the connecting plate (4) away from the detection platform (3), and a movable column (17) is fixedly connected to the outer side of the lower end of the adjusting column (16), a sliding structure is formed between the movable column (17) and the adjusting plate (18), and the adjusting plate (18) is fixedly connected to the outer side of the upper end of the side plate (2), and a fixing groove (19) is provided at an equal angle at the lower end of the adjusting plate (18).

8. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 7, characterized in that: An upper connecting hook (20) is fixedly connected to the outer side of the upper end of the adjusting column (16), and a second spring (21) is arranged inside the adjusting column (16), a movable end of the second spring (21) is fixedly connected to a movable pin (22), and the movable pin (22) is telescopically connected to the lower end of the adjusting column (16); The outer side of the upper end of the movable pin (22) is fixedly connected with a lower connecting hook (23), and an up-and-down sliding structure is formed between the lower connecting hook (23) and the adjusting column (16).

9. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 1, characterized in that: The fixed cylinder (24) is fixedly connected to the upper end of the bottom plate (1), and the middle part of the fixed cylinder (24) is rotatably connected to a screw rod (25), the left and right ends of the screw rod (25) are fixedly connected to a turning handle (26), the left and right ends of the screw rod (25) are threadedly connected to a moving block (27), and a left-right sliding structure is formed between the moving block (27) and the fixed cylinder (24).

10. The flip-type semiconductor light source detection fixture capable of stable limiting according to claim 9, characterized in that: The moving block (27) is fixedly connected to the middle part of the side plate (2), and a fixed cylinder (24) is provided through the middle part of the side plate (2). A left-right sliding structure is formed between the lower end of the side plate (2) and the linear guide rail (28), and the linear guide rail (28) is respectively fixedly connected to the left and right sides of the upper end of the bottom plate (1).

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