Storage particle identification method and device, terminal equipment and readable storage medium

Abstract

The invention is suitable for the technical field of storage, and provides a storage particle identification method and device, terminal equipment and a readable storage medium. The storage particle identification method comprises the following steps: in response to a special type scanning instruction, carrying out special type scanning on a storage particle to obtain an LUN unit packaging type of the storage particle; according to the embodiment of the invention, through the preset scanning strategy and special type scanning, the special LUN particle type can be accurately identified, so that more comprehensive support is provided for subsequent firmware development.

Description

Technical Field

[0001] The present application belongs to the field of storage technology, and in particular, relates to a storage particle identification method, device, terminal device and readable storage medium. Background Art

[0002] In the manufacturing process of storage particles, it is often necessary to encapsulate special types of storage particles. Since there are multiple LUN (logical unit) particle types for storage particles with the same ID, it is impossible to determine which LUN particle type the storage particle belongs to based on the particle ID and particle appearance alone. If the LUN particle type of the storage particle cannot be identified, support cannot be provided for subsequent firmware development, resulting in the inability to support special LUN particle types. In related technologies, usually only conventional LUN particle types can be identified, and special LUN particle types of storage particles cannot be identified. Summary of the invention

[0003] The embodiments of the present application provide a storage particle identification method, apparatus, terminal device, and readable storage medium, which can solve the problem that the related art cannot identify the special LUN particle type of the storage particle.

[0004] In a first aspect, an embodiment of the present application provides a method for identifying storage particles, comprising:

[0005] In response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

[0006] In some implementations of the first aspect, performing a special type scan on a storage particle to obtain a LUN unit encapsulation type of the storage particle includes:

[0007] Get multiple preset special LUN combinations;

[0008] Traverse all special LUN combinations, perform special type scans on storage particles, and obtain all scan results;

[0009] All scan results are analyzed to obtain the LUN unit encapsulation type of the storage particles.

[0010] In some implementations of the first aspect, the special LUN combination method includes: an additional CE model combination method, a first LUNLUNMAP model combination method, a second LUNLUNMAP model combination method, a third LUNLUNMAP model combination method, an "extra CE+LUNLUNMAP_2_3" combination model combination method, an additional CH model combination method, a mixed paste combination method of particles of different packaging types, and a mixed paste combination method of particles of the same packaging type. All special LUN combination methods are traversed, and special type scans are performed on storage particles to obtain all scan results, including:

[0011] A special type of scanning is performed on the storage particles by using an additional CE model combination method to obtain a first scanning result;

[0012] Performing a special type of scanning on the storage particles using the first LUNLUNMAP model combination method to obtain a second scanning result;

[0013] A special type of scanning is performed on the storage particles using the second LUNLUNMAP model combination method to obtain a third scanning result;

[0014] Performing a special type of scanning on the storage particles using the third LUNLUNMAP model combination method to obtain a fourth scanning result;

[0015] The fifth scanning result is obtained by performing a special type of scanning on the storage particles using the combination model of "extra pull CE+LUNLUNMAP_2_3";

[0016] A special type of scanning is performed on the storage particles using an additional CH model combination method to obtain a sixth scanning result;

[0017] A special type of scanning is performed on the storage particles by using a mixed combination of particles of different packaging types to obtain a seventh scanning result;

[0018] The eighth scanning result is obtained by performing a special type of scanning on the storage particles by using a combination of positive and negative mixed mounting of particles of the same packaging type.

[0019] In some implementations of the first aspect, all scanning results are analyzed to obtain the LUN unit encapsulation type of the storage particle, including:

[0020] Extract the corresponding type features from each scan result;

[0021] The type feature is matched with the special LUN unit encapsulation type in the feature library to obtain the LUN unit encapsulation type of the storage particle.

[0022] In some implementations of the first aspect, after performing a special type scan on the storage particles to obtain the LUN unit encapsulation type of the storage particles, the method further includes:

[0023] Perform erase / write / read tests on storage particles according to the LUN unit encapsulation type to obtain test results.

[0024] In some implementations of the first aspect, in response to a special type scan instruction, performing a special type scan on a storage particle to obtain a LUN unit encapsulation type of the storage particle includes:

[0025] In response to the scanning instruction, performing a conventional type scanning on the storage particles to determine whether the storage particles are conventional type storage particles;

[0026] If it is determined that the storage particle is not a conventional type of storage particle, a special type of scanning instruction is generated;

[0027] In response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

[0028] In some implementations of the first aspect, in response to a special type scan instruction, performing a special type scan on a storage particle to obtain a LUN unit encapsulation type of the storage particle includes:

[0029] When a special type scanning instruction is received, in response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

[0030] In a second aspect, an embodiment of the present application provides a storage particle identification device, including:

[0031] The scanning module is used to perform a special type scan on the storage particles in response to the special type scan instruction to obtain the LUN unit encapsulation type of the storage particles.

[0032] In a third aspect, an embodiment of the present application provides a terminal device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above-mentioned storage particle identification method when executing the computer program.

[0033] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps of the above-mentioned storage particle identification method are implemented.

[0034] In a fifth aspect, an embodiment of the present application provides a computer program product, which, when executed on a terminal device, enables the terminal device to execute the above-mentioned storage particle identification method.

[0035] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the embodiments of the present application perform a special type scan on the storage particles in response to the special type scan instruction to obtain the LUN unit encapsulation type of the storage particles. The embodiments of the present application can accurately identify the special LUN particle type through the preset scan strategy and the special type scan, thereby providing more comprehensive support for subsequent firmware development. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0037] Figure 1 It is a schematic diagram of an implementation flow of a storage particle identification method provided in an embodiment of the present application;

[0038] Figure 2 is a schematic structural diagram of a storage particle identification device provided in an embodiment of the present application;

[0039] Figure 3 It is a schematic diagram of the structure of the terminal device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0040] In order to make the purpose, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not intended to limit the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work are protected by the present application.

[0041] It should be noted that the terms "include", "comprises" and "have" and any variations thereof in the specification and claims of the present application and the above-mentioned drawings are intended to cover non-exclusive inclusions. For example, a process, method, terminal, product or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units that are not listed, or may optionally include other steps or units that are inherent to these processes, methods, products or devices. In the claims, specification and drawings of the present application, relational terms such as "first" and "second" are merely used to distinguish one entity / operation / object from another entity / operation / object, and do not necessarily require or imply any such real-time relationship or order between these entities / operations / objects.

[0042] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0043] In the manufacturing process of storage particles, it is often necessary to encapsulate special types of storage particles. Since there are multiple LUN (logical unit) particle types for storage particles with the same ID, it is impossible to determine which LUN particle type the storage particle belongs to based on the particle ID and particle appearance alone. If the LUN particle type of the storage particle cannot be identified, support cannot be provided for subsequent firmware development, resulting in the inability to support special LUN particle types. In related technologies, usually only conventional LUN particle types can be identified, and special LUN particle types of storage particles cannot be identified.

[0044] In view of this, the embodiments of the present application can accurately identify special LUN particle types through preset scanning strategies and special type scanning, thereby providing more comprehensive support for subsequent firmware development.

[0045] In order to illustrate the technical solution of the present application, a specific embodiment is provided below for illustration.

[0046] Figure 1 The present invention provides a schematic diagram of the implementation process of a storage particle identification method provided in an embodiment of the present invention, which can be applied to a terminal device, which can be a mobile phone, a tablet computer, a notebook computer, an ultra-mobile personal computer (UMPC), a netbook, etc.

[0047] Based on this, specifically, the above storage particle identification method may include the following steps S101.

[0048] Step S101 , in response to a special type scanning instruction, performing a special type scanning on a storage particle to obtain a LUN unit encapsulation type of the storage particle.

[0049] The special type scanning instruction is an instruction issued by a terminal device or a user, and is used to trigger a special type scanning process for storage particles.

[0050] Storage particles are physical units used to store data, usually packaged inside storage devices (such as solid-state drives (SSDs), memory sticks, etc.). Storage particles can be of various types, such as NAND flash memory and DRAM.

[0051] The LUN unit encapsulation type refers to the way in which the LUN units of storage particles are encapsulated.

[0052] In the implementation mode of the present application, first, the terminal device can receive a special type of scanning instruction issued by an external system or user through an interface. This interface can be a hardware interface (such as USB, Ethernet, etc.) or a software interface (such as API, command line interface, etc.). Then, the terminal device can parse the received scanning instruction and determine the parameters required for scanning (such as scanning speed, scanning depth, scanning mode, etc.). At the same time, prepare the hardware and software environment required for scanning, such as connecting storage particles, loading necessary drivers and algorithm libraries, etc. Then, the hardware interface of the storage device or test device is used to communicate with the storage particles and send specific scanning commands or test sequences. These commands or sequences can include inquiries about the internal structure of storage particles, read or write operations on specific registers, etc. The response data of the storage particles can also be parsed according to the corresponding driver and algorithm, and the LUN unit encapsulation type of the storage particles can be determined based on these data. Specifically, it can be achieved by analyzing the electrical characteristics, timing characteristics or data format of the storage particles. Finally, the terminal device can determine the LUN unit encapsulation type of the storage particles based on the scanning results and preset algorithms or rules. Then, this result is returned to the external system or user in a standard format. The returned result may be a code, a string, or other identifier, etc., to indicate a specific packaging type of the storage particle.

[0053] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the embodiments of the present application perform a special type scan on the storage particles in response to the special type scan instruction to obtain the LUN unit encapsulation type of the storage particles. The embodiments of the present application can accurately identify the special LUN particle type through the preset scan strategy and the special type scan, thereby providing more comprehensive support for subsequent firmware development.

[0054] In some implementations of the present application, the above-mentioned special type scanning of the storage particles to obtain the LUN unit encapsulation type of the storage particles may specifically include steps S401 to S403.

[0055] Step S401, obtaining multiple preset special LUN combination modes.

[0056] Among them, the special LUN combination method can refer to a series of preset special scanning or testing conditions for storage particles. These conditions may involve different voltages, currents, timings, command sequences, etc., which are used to trigger specific responses of storage particles, thereby identifying their packaging types.

[0057] In the implementation manner of the present application, the terminal device may obtain a plurality of special LUN combinations from a database or configuration file of the storage device. The special LUN combination may be obtained through experiments, experience or technical documents, and is intended to cover various possible packaging types of storage particles, thereby ensuring that there are enough scanning conditions to trigger potential responses of storage particles, thereby increasing the accuracy of identifying their packaging types.

[0058] Step S402, traverse all special LUN combination modes, perform special type scanning on storage particles, and obtain all scanning results.

[0059] In the implementation manner of the present application, the terminal device may apply these special LUN combinations one by one to scan the storage particles. The scanning process may specifically include sending a specific command sequence, adjusting voltage and current levels, monitoring the response of the storage particles, etc. By applying different scanning conditions, specific responses of the storage particles are triggered, and these response data are collected for subsequent analysis.

[0060] Step S403: Analyze all scan results to obtain the LUN unit encapsulation type of the storage particle.

[0061] In the implementation mode of the present application, the terminal device can collect and record the scan results under each special LUN combination mode. The scan results may include response data, error codes, response time, etc. of the storage particles. Then, these results are analyzed using a preset algorithm or rule to determine the packaging type of the storage particles. By analyzing the scan results, the specific packaging type of the storage particles is identified, providing key information for subsequent storage device manufacturing or firmware development.

[0062] The implementation method of the present application can more comprehensively trigger the potential response of storage particles by traversing multiple preset special LUN combinations, identify storage particles of multiple different packaging types, and thus improve the accuracy of identifying their packaging types, so that storage device manufacturers and firmware developers can optimize the design for specific types of storage particles, thereby improving the read and write speed, durability and stability of the storage device.

[0063] In some specific implementations of the present application, the above-mentioned special type scanning of the storage particles to obtain all scanning results may further include steps S501 to S508.

[0064] Among them, special LUN combination methods include: additional CE model combination method, first LUNLUNMAP model combination method, second LUNLUNMAP model combination method, third LUNLUNMAP model combination method, "extra CE+LUNLUNMAP_2_3" combination model combination method, additional CH model combination method, mixed pasting combination method of particles of different packaging types and mixed pasting combination method of front and back of particles of the same packaging type.

[0065] Step S501 : performing a special type scan on storage particles by using an additional CE model combination method to obtain a first scan result.

[0066] The additional CE model combination may be to perform additional operations or adjustments on the chip enable (CE) pin of the storage particle during the scanning process to trigger a specific response of the storage particle. This combination may involve different CE pin operation sequences or level states.

[0067] In an embodiment of the present application, the terminal device may first determine the pin configuration and electrical characteristics of the storage particles, and then connect to the test equipment to ensure that all connections are correct. Then, according to the specifications of the storage particles, the test equipment is configured to apply the additional pull CE model, which can be achieved by adjusting the level state, timing or command sequence of the CE pin. Then, according to the "2CHx1CE_2LUN" combination mode, two channels and one CE pin are selected for scanning, and the logical unit to be scanned (LUN1, etc.) is determined. Then, the selected scanning conditions are applied to scan the storage particles, and the responses of the storage particles are monitored, such as data reading, error code return, etc. Next, the response of the storage particles under the additional pull CE model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage particles to obtain the first scanning result.

[0068] Step S502: Perform a special type scan on the storage particles using the first LUNLUNMAP model combination method to obtain a second scan result.

[0069] The LUNLUNMAP model combination method may refer to testing the response of storage particles to LUN mapping through a specific command sequence or operation mode.

[0070] In an embodiment of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage particles are correct, and then connect the test equipment to ensure that all connections are stable and reliable. Then, according to the specification of the storage particles, the test equipment can be configured to apply the first LUNLUNMAP model, which can be achieved by setting a specific command sequence, adjusting the pin level, or configuring the logic unit mapping strategy. Then, according to the requirements of the "LUNLUNMAP_1_3 model", appropriate scanning conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scanning conditions are applied to scan the storage particles, and the response of the storage particles is controlled, such as data reading, error code return, etc. Next, the response of the storage particles under the first LUNLUNMAP model combination is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage particles, such as data consistency, response time, etc., to obtain the second scanning result.

[0071] Step S503: perform a special type scan on the storage particles using the second LUNLUNMAP model combination method to obtain a third scanning result.

[0072] In an embodiment of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage particles are correct, and then connect the test equipment to ensure that all connections are stable and reliable. Then, according to the specification of the storage particles, the test equipment can be configured to apply the second LUNLUNMAP model, which can be achieved by setting a specific command sequence, adjusting the pin level, or configuring the logic unit mapping strategy. Then, according to the requirements of the "LUNLUNMAP_2_3 model", appropriate scanning conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scanning conditions are applied to scan the storage particles, and the responses of the storage particles are controlled, such as data reading, error code return, etc. Next, the responses of the storage particles under the second LUNLUNMAP model combination are recorded, and the response data is analyzed to determine the specific behaviors or characteristics of the storage particles, such as data consistency, response time, etc., to obtain the third scanning result.

[0073] Step S504: perform a special type scan on the storage particles using the third LUNLUNMAP model combination method to obtain a fourth scanning result.

[0074] In an embodiment of the present application, the terminal device may first confirm that the electrical connection and pin configuration of the storage particles are correct, and then connect the test equipment to ensure that all connections are stable and reliable. Then, according to the specification of the storage particles, the test equipment may be configured to apply the third LUNLUNMAP model, which may be achieved by setting a specific command sequence, adjusting the pin level, or configuring the logic unit mapping strategy. Then, according to the requirements of the "LUNLUNMAP_1_2_3 model", appropriate scanning conditions may be selected, which may specifically include determining the logic units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scanning conditions are applied to scan the storage particles, and the responses of the storage particles are controlled, such as data reading, error code return, etc. Next, the responses of the storage particles under the third LUNLUNMAP model combination are recorded, and the response data is analyzed to determine the specific behaviors or characteristics of the storage particles, such as data consistency, response time, etc., to obtain the fourth scanning result.

[0075] Step S505 , performing a special type scan on the storage particles by using the “extra CE+LUNLUNMAP_2_3” combined model combination mode to obtain a fifth scanning result.

[0076] Among them, the “extra pull CE+LUNLUNMAP_2_3” combined model combination method is a scanning method that combines the extra pull CE model with the second and third LUNLUNMAP models, aiming to trigger a specific response of the storage particles by combining the two test conditions.

[0077] In the implementation mode of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage particles are correct, and then connect the test equipment to ensure that all connections are stable and reliable. Then, according to the specification of the storage particles, the test equipment can be configured to apply the "extra pull CE+LUNLUNMAP_2_3" combination model, which can be implemented by setting a specific command sequence, adjusting the pin level or configuring the logic unit mapping strategy. Then, according to the requirements of the "extra pull CE+LUNLUNMAP_2_3" combination model, appropriate scanning conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scanning conditions are applied to scan the storage particles, and the responses of the storage particles are controlled, such as data reading, error code return, etc. Next, the responses of the storage particles under the combination mode of the "extra pull CE+LUNLUNMAP_2_3" combination model are recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage particles, such as data consistency, response time, etc., to obtain the fifth scanning result.

[0078] Step S506 , performing a special type scan on the storage particles by using an additional CH model combination method to obtain a sixth scan result.

[0079] Among them, the combination method of the additional pull CH model is similar to the additional pull CE model. Here, "extra pull CH" can refer to additional operation or adjustment of a channel (Channel, CH) pin of the storage particle to trigger a specific response.

[0080] In an embodiment of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage particles are correct, and then connect the test equipment to ensure that all connections are stable and reliable. Then, according to the specification of the storage particles, the test equipment can be configured to apply the additional pull CH model, which can be achieved by setting a specific command sequence, adjusting the pin level, or configuring the logic unit mapping strategy. Then, according to the requirements of the additional pull CH model, appropriate scanning conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scanning conditions are applied to scan the storage particles, and the responses of the storage particles are controlled, such as data reading, error code return, etc. Next, the response of the storage particles in the additional pull CH model combination mode is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage particles, such as data consistency, response time, etc., to obtain the sixth scanning result.

[0081] Step S507 , performing a special type scan on the storage particles by using a mixed combination of particles of different packaging types to obtain a seventh scanning result.

[0082] The mixed combination of particles of different package types corresponds to mixing storage particles of different package types together for testing to observe whether their responses to specific scanning conditions are different.

[0083] In the implementation mode of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage particles are correct, and then connect the test equipment to ensure that all connections are stable and reliable. Then, according to the specification of the storage particles, the test equipment can be configured to apply the mixed paste model of particles of different package types, which can be realized by setting a specific command sequence, adjusting the pin level or configuring the logic unit mapping strategy. Then, according to the requirements of the mixed paste model of particles of different package types, appropriate scanning conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scanning conditions are applied to scan the storage particles, and the response of the storage particles is controlled, such as data reading, error code return, etc. Next, the response of the storage particles under the mixed paste combination mode of particles of different package types is recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage particles, such as data consistency, response time, etc., to obtain the seventh scanning result.

[0084] Step S508 , performing a special type scan on the storage particles by using a combination of positive and negative mixed mounting of particles of the same packaging type to obtain an eighth scanning result.

[0085] Among them, the forward and reverse mixed mounting combination method of particles of the same package type is to mix storage particles of the same package type but in opposite directions together for testing to evaluate the impact of direction on the scanning results.

[0086] In the implementation mode of the present application, the terminal device can first confirm that the electrical connection and pin configuration of the storage particles are correct, and then connect the test equipment to ensure that all connections are stable and reliable. Then, according to the specification of the storage particles, the test equipment can be configured to apply the positive and negative mixed paste model of the same package type particles, which can be specifically realized by setting a specific command sequence, adjusting the pin level or configuring the logic unit mapping strategy. Then, according to the requirements of the positive and negative mixed paste model of the same package type particles, appropriate scanning conditions can be selected, which can specifically include determining the logical units (LUN0, LUN1, etc.) and corresponding channels (CH0, CH1, etc.) to be scanned. Next, the selected scanning conditions are applied to scan the storage particles, and the responses of the storage particles are controlled, such as data reading, error code return, etc. Next, the responses of the storage particles under the positive and negative mixed paste combination mode of the same package type particles are recorded, and the response data is analyzed to determine the specific behavior or characteristics of the storage particles, such as data consistency, response time, etc., to obtain the eighth scanning result.

[0087] The embodiments of the present application trigger the potential response of storage particles through different combinations and collect these response data for subsequent analysis. Each combination can test the behavior of storage particles under different conditions, thereby increasing the accuracy of identifying their packaging types, and can more comprehensively test the response of storage particles, thereby more accurately identifying their packaging types. By understanding the packaging type and response characteristics of storage particles, it helps storage device manufacturers optimize their designs and improve the performance and stability of storage devices.

[0088] In some specific implementations of the present application, the above analysis of all scan results to obtain the LUN unit encapsulation type of the storage particle may specifically include step S601 and step S602.

[0089] Step S601, extracting corresponding type features from each scanning result.

[0090] The type feature is key information or data extracted from the scan result that can reflect the packaging type of storage particles or LUN units. These features can be numerical values, character strings, binary codes, etc.

[0091] In the implementation of the present application, the terminal device can use a specific algorithm or tool to process the scan result and extract key information or data therein. By extracting features, the subsequent matching process with the feature library can be simplified and the recognition efficiency can be improved.

[0092] Step S602: Match the type feature with the special LUN unit encapsulation type in the feature library to obtain the LUN unit encapsulation type of the storage particle.

[0093] The feature library is a pre-established database that contains various LUN unit encapsulation types and their corresponding type features. This database can be used to match the type features in the scan results to identify the LUN unit encapsulation type of the storage particle.

[0094] In the implementation manner of the present application, the terminal device can compare the extracted type features with the features of each special LUN unit encapsulation type in the feature library one by one, and use a matching algorithm (such as similarity calculation, distance measurement, etc.) to determine the most matching LUN unit encapsulation type. Through matching, the LUN unit encapsulation type of the storage particle can be identified.

[0095] The implementation of the present application can quickly and accurately identify the LUN unit packaging type of the storage particle by extracting type features and matching with the feature library without tedious manual analysis, thereby reducing the possibility of misidentification. Since the feature library can contain features of multiple LUN unit packaging types, the implementation of the present application can be applicable to different types of storage particles.

[0096] In some implementations of the present application, after performing a special type scan on the storage particles to obtain the LUN unit encapsulation type of the storage particles, the above method may further include the following steps:

[0097] Perform erase / write / read tests on storage particles according to the LUN unit encapsulation type to obtain test results.

[0098] In the implementation of the present application, the terminal device can select appropriate test strategies and parameters according to the LUN unit encapsulation type information, and use professional test equipment or software to perform erase, write and read operations on the storage particles. In addition, during the test, key indicators such as the response time, error rate, read and write speed of the storage particles are recorded to verify whether the LUN unit is accessed normally.

[0099] In some specific implementations of the present application, the above test process may adopt a cross-testing method to verify whether there is overlap in LUN units, etc.

[0100] In some implementations of the present application, in response to the special type scan instruction, performing a special type scan on the storage particle to obtain the LUN unit encapsulation type of the storage particle may specifically include steps S701 to S703.

[0101] Step S701 , in response to a scan instruction, performing a conventional type scan on a storage particle to determine whether the storage particle is a conventional type storage particle.

[0102] In an embodiment of the present application, when a scanning instruction is received, the terminal device may first start a conventional type scanning program. Specifically, the conventional type scanning program may check the basic properties of the storage particles such as manufacturer information, capacity, health status, etc., and may also perform particle parameter analysis to obtain information such as the number of LUNs and LUN addresses. Then, based on the scanning results, the terminal device may determine whether the storage particles are conventional type storage particles, thereby quickly identifying whether the storage particles are conventional types, providing a basis for subsequent operations. If the storage particles are of conventional type, the LUN unit encapsulation type of the storage particles may be directly identified.

[0103] Step S702: If it is determined that the storage particle is not a regular type storage particle, a special type scan instruction is generated.

[0104] In an embodiment of the present application, if the conventional type scan result shows that the storage particle is not of a conventional type, the terminal device can generate a special type scan instruction, which instructs the terminal device to perform a deeper and more professional scan on the storage particle to obtain specific information such as its LUN unit encapsulation type.

[0105] Step S703: In response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

[0106] In an implementation manner of the present application, after receiving a special type of scanning instruction, the terminal device can start a corresponding special type of scanning program, use specific algorithms and parameters to scan according to the characteristics of the storage particles, and during the scanning process, collect and identify key information such as the LUN unit encapsulation type of the storage particles.

[0107] The implementation method of the present application can avoid unnecessary complex scanning of conventional storage particles by first performing conventional type scanning and then generating special type scanning instructions as needed, thereby improving scanning efficiency. It can also process various types of storage particles, including unconventional types, thereby enhancing the compatibility of the system.

[0108] When identifying the LUN unit encapsulation type of the storage particle, in addition to setting the terminal device to perform a regular scan first and then a special type scan, the user can also directly send a scan instruction to the terminal device to directly perform a special type scan on the storage particle. Based on this, in other specific embodiments of the present application, the above-mentioned response to the special type scan instruction to perform a special type scan on the storage particle to obtain the LUN unit encapsulation type of the storage particle can specifically include the following steps:

[0109] When a special type scanning instruction is received, in response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

[0110] In the implementation of the present application, the terminal device can continuously monitor the instructions from the upper management software or the user interface. When receiving an instruction marked as "special type scan", the terminal device can enter the special type scan process, configure the scanning device or algorithm according to the parameters and settings in the special type scan instruction, and perform a special type of scan operation on the target storage particle, record and analyze the response of the storage particle to extract key information such as the LUN unit encapsulation type.

[0111] The implementation manner of the present application can more accurately identify the LUN unit encapsulation type of the storage particle by performing a special type of scanning, thereby avoiding misjudgment or omission.

[0112] Figure 2 A schematic diagram of the structure of a storage particle identification device provided in an embodiment of the present application is shown. The storage particle identification device 2 may be configured on a terminal device. Specifically, the storage particle identification device 2 may include:

[0113] The scanning module 201 is used to perform a special type scan on the storage particles in response to a special type scan instruction to obtain the LUN unit encapsulation type of the storage particles.

[0114] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the embodiments of the present application perform a special type scan on the storage particles in response to the special type scan instruction to obtain the LUN unit encapsulation type of the storage particles. The embodiments of the present application can accurately identify the special LUN particle type through the preset scan strategy and the special type scan, thereby providing more comprehensive support for subsequent firmware development.

[0115] In some embodiments of the present application, the scanning module 201 may also be used for:

[0116] Get multiple preset special LUN combinations;

[0117] Traverse all special LUN combinations, perform special type scans on storage particles, and obtain all scan results;

[0118] All scan results are analyzed to obtain the LUN unit encapsulation type of the storage particles.

[0119] In some implementations of the present application, the special LUN combination method includes: an additional CE model combination method, a first LUNLUNMAP model combination method, a second LUNLUNMAP model combination method, a third LUNLUNMAP model combination method, an "extra CE+LUNLUNMAP_2_3" combination model combination method, an additional CH model combination method, a mixed paste combination method of particles of different package types, and a mixed paste combination method of particles of the same package type. The above scanning module 201 can also be used for:

[0120] A special type of scanning is performed on the storage particles by using an additional CE model combination method to obtain a first scanning result;

[0121] Performing a special type of scanning on the storage particles using the first LUNLUNMAP model combination method to obtain a second scanning result;

[0122] A special type of scanning is performed on the storage particles using the second LUNLUNMAP model combination method to obtain a third scanning result;

[0123] Performing a special type of scanning on the storage particles using the third LUNLUNMAP model combination method to obtain a fourth scanning result;

[0124] The fifth scanning result is obtained by performing a special type of scanning on the storage particles using the combination model of "extra pull CE+LUNLUNMAP_2_3";

[0125] A special type of scanning is performed on the storage particles using an additional CH model combination method to obtain a sixth scanning result;

[0126] A special type of scanning is performed on the storage particles by using a mixed combination of particles of different packaging types to obtain a seventh scanning result;

[0127] The eighth scanning result is obtained by performing a special type of scanning on the storage particles by using a combination of positive and negative mixed mounting of particles of the same packaging type.

[0128] In some embodiments of the present application, the scanning module 201 may also be used for:

[0129] Extract the corresponding type features from each scan result;

[0130] The type feature is matched with the special LUN unit encapsulation type in the feature library to obtain the LUN unit encapsulation type of the storage particle.

[0131] In some embodiments of the present application, the storage particle identification device 2 further includes a testing module for:

[0132] Perform erase / write / read tests on storage particles according to the LUN unit encapsulation type to obtain test results.

[0133] In some embodiments of the present application, the scanning module 201 may also be used for:

[0134] In response to the scanning instruction, performing a conventional type scanning on the storage particles to determine whether the storage particles are conventional type storage particles;

[0135] If it is determined that the storage particle is not a conventional type of storage particle, a special type of scanning instruction is generated;

[0136] In response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

[0137] In some embodiments of the present application, the scanning module 201 may also be used for:

[0138] When a special type scanning instruction is received, in response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

[0139] like Figure 3FIG. 3 is a schematic diagram of a terminal device provided in an embodiment of the present application. The terminal device 3 may include: a processor 301, a memory 302, and a computer program 303 stored in the memory 302 and executable on the processor 301, such as a program for identifying storage particles. When the processor 301 executes the computer program 303, the steps in the above-mentioned storage particle identification method embodiments are implemented, such as Figure 1 Step S101 shown.

[0140] It should be noted that, for the convenience and brevity of description, the structure of the above-mentioned terminal device can also refer to the specific description of the structure in the method embodiment, which will not be repeated here.

[0141] The embodiment of the present application further provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps in the above-mentioned storage particle identification method can be implemented.

[0142] An embodiment of the present application provides a computer program product. When the computer program product is run on a mobile terminal, the steps in the above storage particle identification method can be implemented when the mobile terminal executes the computer program product.

[0143] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A method for identifying stored particles, characterized in that: include: In response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

2. The storage particle identification method according to claim 1, characterized in that: The performing a special type scan on the storage particle to obtain the LUN unit encapsulation type of the storage particle includes: Get multiple preset special LUN combinations; Traversing all the special LUN combination modes, performing special type scanning on the storage particles, and obtaining all scanning results; All the scanning results are analyzed to obtain the LUN unit encapsulation type of the storage particle.

3. The storage particle identification method according to claim 2, characterized in that: The special LUN combination methods include: an additional CE model combination method, a first LUNLUNMAP model combination method, a second LUNLUNMAP model combination method, a third LUNLUNMAP model combination method, an "extra CE+LUNLUNMAP_2_3" combination model combination method, an additional CH model combination method, a mixed paste combination method of particles of different packaging types, and a mixed paste combination method of particles of the same packaging type. All the special LUN combination methods are traversed, and a special type scan is performed on the storage particles to obtain all scan results, including: Performing a special type scan on the storage particles by using the additional CE model combination method to obtain a first scan result; Performing a special type of scanning on the storage particles by using the first LUNLUNMAP model combination method to obtain a second scanning result; Performing a special type of scanning on the storage particles by using the second LUNLUNMAP model combination method to obtain a third scanning result; Performing a special type scan on the storage particles by using the third LUNLUNMAP model combination method to obtain a fourth scanning result; Perform a special type scan on the storage particles by using the "extra pull CE+LUNLUNMAP_2_3" combination model combination mode to obtain a fifth scanning result; Performing a special type scan on the storage particles by using the additional CH model combination method to obtain a sixth scan result; Performing a special type scan on the storage particles by using the mixed combination of particles of different packaging types to obtain a seventh scanning result; The storage particles are scanned in a special manner by using the front and back mixed mounting combination of particles of the same packaging type to obtain an eighth scanning result.

4. The storage particle identification method according to claim 2, characterized in that: The analyzing all the scanning results to obtain the LUN unit encapsulation type of the storage particle includes: Extracting corresponding type features from each of the scanning results; The type feature is matched with a special LUN unit encapsulation type in a feature library to obtain the LUN unit encapsulation type of the storage particle.

5. The storage particle identification method according to claim 1, characterized in that: After performing a special type scan on the storage particle to obtain the LUN unit encapsulation type of the storage particle, the method further includes: Performing an erase / write / read test on the storage particle according to the LUN unit encapsulation type to obtain a test result.

6. The storage particle identification method according to claim 1, characterized in that: The step of performing a special type scan on the storage particle in response to the special type scan instruction to obtain the LUN unit encapsulation type of the storage particle includes: In response to the scanning instruction, performing a conventional type scanning on the storage particles to determine whether the storage particles are conventional type storage particles; If it is determined that the storage particle is not a conventional type of storage particle, generating the special type scanning instruction; In response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

7. The storage particle identification method according to claim 1, characterized in that: The step of performing a special type scan on the storage particle in response to the special type scan instruction to obtain the LUN unit encapsulation type of the storage particle includes: When a special type scanning instruction is received, in response to the special type scanning instruction, a special type scanning is performed on the storage particle to obtain the LUN unit encapsulation type of the storage particle.

8. A storage particle identification device, characterized in that: include: The scanning module is used to perform a special type scan on the storage particle in response to a special type scan instruction to obtain the LUN unit encapsulation type of the storage particle.

9. A terminal device, characterized in that: The method comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the storage particle identification method according to any one of claims 1 to 7 when executing the computer program.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the storage particle identification method according to any one of claims 1 to 7 are implemented.

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