Method and system for testing reliability of optical communication device

Abstract

The invention discloses a reliability test method and system for an optical communication device, and relates to the related technical field of optical communication devices, and the method comprises the steps: integrating test equipment; scanning the bar code of the target optical communication device, and matching a plurality of connecting devices for the target optical communication device to obtain a plurality of docking test groups; and matching a plurality of preset test parameters corresponding to the plurality of docking test groups, sequentially testing insertion loss, return loss and polarization dependent loss by the test equipment according to the plurality of preset test parameters, outputting a plurality of groups of test data sets, and comparing the plurality of groups of test data sets with a plurality of preset performance thresholds to obtain a performance test result. The technical problems that in the prior art, test programs of different elements need to be connected in a targeted mode, then test complexity is increased, and reliability test efficiency and accuracy are insufficient are solved, and the technical effect of improving reliability test efficiency and accuracy is achieved.

Description

Technical Field

[0001] This application relates to the technical field of optical communication devices, and specifically to a reliability test method and system for optical communication devices. Background Art

[0002] As a core component of an optical communication system, the performance of an optical communication device directly affects the stability and reliability of the entire optical communication system. From the lasers and modulators at the transmitting end, to the optical fibers and optical amplifiers during transmission, and then to the detectors at the receiving end, a malfunction in any optical communication device may lead to serious problems such as communication interruption and signal quality degradation. For example, in long-distance optical fiber communication, if the performance of the optical amplifier is unstable, the signal will experience severe distortion and attenuation after multiple amplifications, greatly affecting the communication quality. Therefore, strict reliability tests are required for optical communication devices to ensure the reliable operation of the optical communication system. However, there are a wide variety of optical communication devices, and each device often requires a specifically tailored test program for different components due to its unique functions and physical characteristics. For example, the test programs suitable for optical transmitting devices, optical receiving devices, and various optical passive devices during optical transmission are significantly different. This requires testers to not only be familiar with multiple different test processes but also frequently switch between different test programs and manually configure various parameters, greatly increasing the complexity of the test process. This not only results in low test efficiency but also easily introduces human errors during frequent operations, reducing the accuracy of test results.

[0003] Therefore, in the current related technologies, there is a technical problem that test programs need to be specifically tailored for different components, which further increases the test complexity and leads to insufficient efficiency and accuracy of reliability tests. Summary of the Invention

[0004] By providing a reliability test method and system for optical communication devices, this application solves the technical problem in the prior art that test programs need to be specifically tailored for different components, which further increases the test complexity and leads to insufficient efficiency and accuracy of reliability tests, and achieves the technical effect of improving the efficiency and accuracy of reliability tests.

[0005] The present application provides a reliability test method for an optical communication device. The method includes: integrating a test device, which includes an optical power meter, a spectrum analyzer, and a polarization controller. The optical power meter, the spectrum analyzer, and the polarization controller are connected to a host computer through a control interface; scanning the barcode of a target optical communication device, matching a plurality of connection devices for the target optical communication device, and sequentially docking the target optical communication device with the plurality of connection devices to obtain a plurality of docking test groups; matching a plurality of preset test parameters corresponding to the plurality of docking test groups. The test device sequentially performs insertion loss, return loss, and polarization-dependent loss tests according to the plurality of preset test parameters, outputs multiple sets of test data sets, compares the multiple sets of test data sets with a plurality of preset performance thresholds, and obtains a performance test result.

[0006] In a possible implementation, the reliability test method for the optical communication device further performs the following processing: the test device performs insertion loss, return loss, and polarization-dependent loss tests according to the plurality of preset test parameters; wherein, the optical power meter included in the test device is used to measure the input / output optical power of the target optical communication device to test the insertion loss, the spectrum analyzer is used to detect the reflection spectrum to test the return loss, and the polarization controller is used to adjust the polarization state to test the polarization-dependent loss; the plurality of preset test parameters include the optical power samples of the optical power meter, the high-power pulsed light samples of the spectrum analyzer, and the plurality of polarization state samples of the polarization controller.

[0007] In a possible implementation, the reliability test method for the optical communication device further performs the following processing: generating optical power samples for emission; when the target optical communication device is sequentially docked and tested according to the plurality of docking test groups, the optical power meter tests the target optical communication device according to the optical power samples to obtain the input optical power and the output optical power; calculating the insertion loss according to the input optical power and the output optical power, and outputting the insertion loss test data.

[0008] In a possible implementation, the reliability test method for the optical communication device further performs the following processing: generating high-power pulsed light samples for emission; when the target optical communication device is sequentially docked and tested according to the plurality of docking test groups, switching the spectrum analyzer to the optical reflection measurement mode, and based on the optical reflection measurement mode, testing the target optical communication device with the high-power pulsed light samples to obtain the reflected optical power; calculating the return loss according to the reflected optical power, and outputting the return loss test data.

[0009] In a possible implementation, the reliability test method for the optical communication device further performs the following processing: setting a plurality of polarization state samples; when the target optical communication device performs docking tests in sequence according to the plurality of docking test groups, the polarization controller tests the target optical communication device according to the plurality of polarization state samples, and records a plurality of output optical powers corresponding to the plurality of polarization state samples; calculating polarization-dependent loss according to the plurality of output optical powers, and outputting polarization-dependent loss test data.

[0010] In a possible implementation, the reliability test method for the optical communication device further performs the following processing: scanning the barcode of the target optical communication device to determine the device type of the target optical communication device; constructing a device connection relationship network by inputting a plurality of optical communication circuits, where the nodes in the device connection relationship network represent each device, and the edges represent the cumulative connection times of two devices; based on the device type, identifying a plurality of devices with connection weights greater than a preset connection weight in the device connection relationship network as the plurality of connected devices for output.

[0011] In a possible implementation, the reliability test method for the optical communication device further performs the following processing: sorting the plurality of connected devices according to the magnitude of their connection weights, and outputting a switching sequence list of the plurality of connected devices; setting the switching time between two adjacent connected devices in the switching sequence list to be greater than a preset switching time.

[0012] In a possible implementation, the reliability test method for the optical communication device further performs the following processing: comparing the plurality of groups of test data sets with a plurality of preset performance thresholds to obtain a performance test result, where the performance test result includes pass and fail; if any one of the plurality of groups of test data sets is not within the corresponding preset performance threshold, outputting a fail result; if all of the plurality of groups of test data sets are within the plurality of preset performance thresholds, outputting a pass result.

[0013] The present application also provides a reliability test system for optical communication devices. The system includes: a test equipment integration module for integrating test equipment, where the test equipment includes an optical power meter, a spectrum analyzer, and a polarization controller, and the optical power meter, spectrum analyzer, and polarization controller are connected to a host computer through a control interface; a docking test group obtaining module for scanning the barcode of a target optical communication device, matching multiple connection devices for the target optical communication device, and sequentially docking the target optical communication device with the multiple connection devices to obtain multiple docking test groups; and a performance test result obtaining module for matching multiple preset test parameters corresponding to the multiple docking test groups, where the test equipment sequentially performs insertion loss, return loss, and polarization-related loss tests according to the multiple preset test parameters, outputs multiple sets of test data sets, compares the multiple sets of test data sets with multiple preset performance thresholds, and obtains performance test results.

[0014] It is intended to integrate test equipment through the reliability test method and system for optical communication devices proposed in the present application; scan the barcode of a target optical communication device, match multiple connection devices for the target optical communication device to obtain multiple docking test groups; match multiple preset test parameters corresponding to the multiple docking test groups, where the test equipment sequentially performs insertion loss, return loss, and polarization-related loss tests according to the multiple preset test parameters, outputs multiple sets of test data sets, compares the multiple sets of test data sets with multiple preset performance thresholds, and obtains performance test results. This solves the technical problem in the prior art that it is necessary to specifically dock the test procedures of different components, thereby increasing the test complexity and resulting in insufficient efficiency and accuracy of the reliability test, and achieves the technical effect of improving the efficiency and accuracy of the reliability test. Description of the Drawings

[0015] To more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings of the embodiments of the present disclosure will be briefly introduced below. Flowcharts are used in this application to illustrate the operations performed by the system according to the embodiments of the present application. It should be understood that the operations before or below do not necessarily need to be precisely executed in sequence. On the contrary, according to needs, they can be executed in reverse order or simultaneously. At the same time, other operations can also be added to these processes, or one or several steps of operations can be removed from these processes.

[0016] Figure 1 It is a schematic flowchart of the reliability test method for optical communication devices provided by an embodiment of the present application.

[0017] Figure 2 It is a schematic structural diagram of the reliability test system for optical communication devices provided by an embodiment of the present application.

[0018] Description of the reference numerals: Test equipment integration module 10, docking test group obtaining module 20, performance test result obtaining module 30. Detailed implementation manners

[0019] The above description is only an overview of the technical solution of the present application. In order to understand the technical means of the present application more clearly, it can be implemented according to the content of the specification. And in order to make the above and other purposes, features and advantages of the present application more obvious and understandable, the following specifically gives the detailed implementation manners of the present application.

[0020] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings. The described embodiments should not be regarded as limitations of the present application. All other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the scope of protection of the present application.

[0021] In the following description, "some embodiments" are involved, which describe a subset of all possible embodiments. However, it can be understood that "some embodiments" can be the same subset or different subsets of all possible embodiments, and can be combined with each other without conflict. The terms "first / second" involved are only used to distinguish similar objects and do not represent a specific order for the objects. The terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or server including a series of steps or units does not necessarily limit to those steps or units clearly listed, but may include other steps or modules not clearly listed or inherent to these processes, methods, products or devices. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present application belongs. The terms used herein are only for the purpose of describing the embodiments of the present application.

[0022] The embodiment of the present application provides a method for testing the reliability of an optical communication device, as Figure 1 shown. The method includes:

[0023] Step S100, integrating a test device. The test device includes an optical power meter, a spectrum analyzer and a polarization controller. The optical power meter, the spectrum analyzer and the polarization controller are connected to a host computer through a control interface.

[0024] Preferably, a combination of test devices with multiple different functions is used to meet the requirements for comprehensive and integrated testing of optical communication devices, avoiding the cumbersome operation problems brought by using multiple independent devices, thereby improving the testing efficiency. Among them, the test devices include an optical power meter, a spectrum analyzer, and a polarization controller. Specifically, the optical power meter is used to accurately measure the power of the optical signal. The optical power parameter in the optical communication system directly affects the transmission distance and quality of the optical signal. For example, in long-distance optical fiber communication, too weak optical power may cause excessive attenuation of the signal during transmission, and the receiving end cannot correctly identify the signal; while too strong optical power may damage the optical communication device. By measuring the optical power at the input and output ends of the optical communication device with an optical power meter, the optical power loss of the device can be evaluated. The spectrum analyzer is used to analyze the spectral characteristics of the optical signal, such as wavelength, spectral bandwidth, spectral shape, etc. Different optical communication systems and devices have different requirements for the spectral characteristics of the optical signal. For example, in a wavelength division multiplexing (WDM) system, it is necessary to accurately control the wavelength of each channel to ensure that there is no mutual interference between different channels. The spectrum analyzer detects whether the spectrum of the optical signal meets the system requirements, and can evaluate the influence of the optical communication device on the spectral characteristics. The optical signal has polarization characteristics, and the performance of the optical communication device is affected by the polarization state of the optical signal. The role of the polarization controller is to adjust and control the polarization state of the optical signal. By changing the polarization state of the optical signal, the performance of the optical communication device under different polarization conditions can be tested, so as to more comprehensively evaluate the reliability of the device.

[0025] Preferably, the optical power meter, the optical spectrum analyzer, and the polarization controller are connected to the host computer through a control interface. The control interface is a bridge for communication and data transmission between the test equipment and the host computer. Common control interfaces include USB, GPIB (General Purpose Interface Bus), Ethernet interface, etc. Different interfaces have different characteristics and application scenarios. For example, the USB interface is convenient to use and has a moderate transmission speed, suitable for most small test equipment; the GPIB interface has high reliability and transmission accuracy and is often used in test equipment with high requirements for data transmission; the Ethernet interface is suitable for scenarios that require remote control and large data volume transmission. The host computer generally refers to a computer with strong data processing and control capabilities, installed with dedicated test software. After being connected to the test equipment through the control interface, it can realize equipment control, data acquisition and processing, and test process automation. Specifically, the operator can send various control commands to the test equipment on the software interface of the host computer, such as setting the measurement range of the optical power meter, the scanning wavelength range of the optical spectrum analyzer, and the polarization state adjustment of the polarization controller, so as to realize remote control and parameter configuration of the test equipment; the test equipment transmits the measured data to the host computer through the control interface, and these data can be collected, stored, and analyzed. For example, statistical analysis is performed on the optical power data measured by the optical power meter, and a curve of power changing with time is drawn; the spectral data collected by the optical spectrum analyzer is processed to calculate parameters such as the central wavelength and bandwidth of the spectrum; the host computer can also automatically control the test equipment to complete various test tasks in sequence according to the preset test process and parameters, realizing the automation of the test process to optimize the complex reliability test process of optical communication devices, thereby improving the test efficiency and the accuracy of test results.

[0026] Step S200: Scan the bar code of the target optical communication device, match multiple connection devices for the target optical communication device, and dock the target optical communication device with the multiple connection devices in sequence to obtain multiple docking test groups.

[0027] Preferably, during the production process of optical communication devices, each device is assigned a unique barcode, just like the "ID card" of the device, which contains important information of the device, such as model, specification, production batch, technical parameters, etc. By using a barcode scanning device (such as a barcode scanner) to scan the barcode on the target optical communication device, the test device can quickly and accurately obtain the detailed information of the device and transmit it to the host computer to quickly and accurately identify the type and characteristics of the optical communication device; then, based on the information of the target optical communication device obtained by scanning the barcode, and based on parameters such as the interface type, optical characteristics, and transmission rate of the device, multiple connection devices suitable for the device are selected from a pre-set database to ensure that the connection devices can be compatible with the target optical communication device and meet the requirements of the test. Among them, the connection device is a device or component used to connect and cooperate with the target optical communication device for testing, and may include optical communication devices such as fiber optic jumpers, optical couplers, and optical attenuators. Different types of target optical communication devices may require different connection devices to complete the test.

[0028] Preferably, after determining multiple connection devices suitable for the target optical communication device, the automated test device will physically connect the target optical communication device with each connection device in a pre-set order, and ensure the stability and accuracy of the connection, avoiding loosening, misalignment, etc., so as not to affect the test results. Specifically, after each successful docking of the target optical communication device with a connection device, a docking test group is formed. Each docking test group represents a different test scenario. By testing multiple docking test groups, the performance and reliability of the target optical communication device under different connection conditions can be comprehensively evaluated. For example, by connecting fiber optic jumpers of different lengths to the target optical communication device, the performance of the device at different transmission distances can be tested; by connecting optical attenuators with different attenuation values to the device, the performance of the device under different optical power attenuation conditions can be tested. Through barcode identification, the automation and precision of the reliability test of optical communication devices are realized, and multiple different test scenarios can be efficiently created for the target optical communication device, so as to more comprehensively and accurately evaluate its performance and reliability and reduce the complexity of the test process and improve the test efficiency.

[0029] Further, step S200 further includes step S210, scanning the barcode of the target optical communication device to determine the device type of the target optical communication device; step S220, constructing a device connection relationship network by inputting multiple optical communication circuits, where the nodes in the device connection relationship network represent each device, and the edges represent the cumulative connection times of two devices; step S230, based on the device type, identifying multiple devices with connection weights greater than a preset connection weight in the device connection relationship network as the multiple connection devices for output.

[0030] Preferably, a bar code scanning device (such as a bar code scanner) is used to scan the bar code on the target optical communication device, and the scanned information is transmitted to the host computer for information parsing, so as to accurately identify the specific type of the target optical communication device, such as an optical transmitter, an optical receiver, an optical amplifier, or an optical filter, etc.; then, multiple actual optical communication circuit information is collected from the optical communication system design document, the actually operating network topology, etc., including each optical communication device contained in the circuit and the connection relationship between them, and is input into the test device to construct an optical communication device connection relationship network. Among them, each optical communication device represents a node. For example, an optical transmitter and an optical receiver each correspond to a node, and the connection relationship between two devices represents an edge, and the weight of the edge is set to the cumulative connection times of the two devices. That is to say, if in the multiple input optical communication circuits, a certain two devices are connected together multiple times, the weight of the edge between them is greater, so as to construct a network that can reflect the actual connection frequency between optical communication devices; then, according to the determined type of the optical communication device, search in the device connection relationship network, and output the optical communication devices with connection weights greater than the preset connection weight as connectors. The preset connection weight is a preset threshold for screening the devices that are more frequently connected and have a closer relationship with the target optical communication device. Specifically, find the edges connected to the target optical communication device in the network, and the weights of these edges (i.e., the cumulative connection times) are greater than the preset connection weight, and output the devices connected by these edges as multiple connection devices of the target optical communication device. Usually, they are often used in cooperation with the target optical communication device in the actual optical communication circuit. Selecting them as connection devices for subsequent docking tests can more realistically simulate the performance of the target optical communication device in the actual working environment, thereby improving the accuracy and effectiveness of the test.

[0031] Further, step S200 further includes step S240, sorting according to the connection weight sizes of the multiple connection devices, and outputting a switching sequence list of the multiple connection devices; step S250, setting the switching time between two adjacent connection devices in the switching sequence list to be greater than a preset switching time.

[0032] Preferably, the greater the connection weight of a connection device, the higher the frequency of connection and use of these two devices in an actual optical communication circuit, and the stronger the correlation. The multiple connection devices matched for the target optical communication device are sorted from largest to smallest according to their connection weights with the target optical communication device, that is, the connection device with the largest connection weight is ranked first, and the connection device with the smallest connection weight is ranked last, thereby generating a list containing all connection devices, called the switching sequence list of connection devices, which stipulates the order of docking between each connection device and the target optical communication device when testing the target optical communication device. For example, in a list containing multiple connection devices such as an optical transmitter, an optical receiver, and an optical amplifier, the connection weight between the optical amplifier and the target optical communication device is the largest, so the optical amplifier is docked with the target optical communication device first during the test; the preset switching time is a time threshold preset according to the characteristics of the optical communication device, the response time of the test equipment, and the actual requirements of the test operation, etc., to ensure that there is enough time to complete necessary operations during the process of switching connection devices, such as the stabilization of the equipment, the acquisition and processing of data, etc. When switching from one connection device to the next connection device, ensure that the switching time between adjacent connection devices is greater than the preset switching time, that is, ensure an interval of time to maintain the recovery of the device. For example, if the preset switching time is 5 seconds, the time spent in the entire process of disconnecting one connection device from the target optical communication device and then connecting the next connection device must exceed 5 seconds to avoid problems such as inaccurate test data and equipment damage caused by too fast switching, and ensure the stability and reliability of the test process.

[0033] Step S300, match the multiple preset test parameters corresponding to the multiple docking test groups. The test equipment sequentially performs insertion loss, return loss, and polarization-dependent loss tests according to the multiple preset test parameters, outputs multiple sets of test data sets, and compares the multiple sets of test data sets with multiple preset performance thresholds to obtain performance test results.

[0034] Preferably, for each docking test group, since different test scenarios will be formed when the target optical communication device is docked with different connection devices, corresponding preset test parameters (such as the wavelength, power range, polarization state, etc. of the test light) are configured and matched according to the device specifications, test standards, and actual application requirements, etc., to ensure that the performance of the target optical communication device in various connection situations can be accurately evaluated. Then, the test equipment sequentially performs insertion loss, return loss, and polarization-dependent loss tests according to multiple preset test parameters. Specifically, the insertion loss test (i.e., the insertion loss test) means that the test equipment sends an optical signal to the docking test group composed of the target optical communication device and the connection device according to the preset test parameters, and then measures the reduction in the power of the optical signal after passing through the docking system. Among them, the reduction in power is the insertion loss. Through the insertion loss test, the energy loss situation of the optical signal during transmission can be understood; the return loss test means that the test equipment detects the optical power reflected from the docking test group and compares it with the incident optical power to obtain the return loss value. The return loss test is used to measure the power loss caused by reflection during the transmission of the optical signal, and further evaluate the impact of reflection on signal transmission in the optical communication system. Excessive return loss may cause problems such as signal distortion and reflection noise; the polarization state of the optical signal may change in the optical communication system. The polarization-dependent loss test means that the test equipment analyzes the power change situation of the optical signal in different polarization states according to the preset polarization-related parameters, that is, measures the optical power loss caused by the change in the polarization state.

[0035] Preferably, the test equipment performs insertion loss, return loss, and polarization-dependent loss tests respectively for each docking test group, and records the data obtained from each test to form multiple sets of test data sets. Each set of test data sets contains the specific values of the insertion loss, return loss, and polarization-dependent loss of the docking test group under specific preset test parameters. Then, the values of the insertion loss, return loss, and polarization-dependent loss in each set of test data sets are respectively compared with the corresponding preset performance thresholds. Among them, the preset performance threshold is a standard value formulated according to the performance indicators of the optical communication device and the actual application requirements. There are corresponding preset performance thresholds for insertion loss, return loss, and polarization-dependent loss, etc. Specifically, if the test data of a certain docking test group are all within the corresponding preset performance threshold range, it means that the combined performance of the target optical communication device and the connection device in this docking test group meets the requirements; if any one of the test data exceeds the preset performance threshold, it indicates that there is a problem with this combination; thus, the performance test results of the target optical communication device in different docking situations can be obtained comprehensively and accurately.

[0036] Further, step S300 further includes step S310, where the test device performs insertion loss, return loss, and polarization-dependent loss tests according to the multiple preset test parameters; wherein, the optical power meter included in the test device is used to measure the input / output optical power of the target optical communicator to test the insertion loss, the spectral analyzer is used to detect the reflection spectrum to test the return loss, and the polarization controller is used to adjust the polarization state to test the polarization-dependent loss; the multiple preset test parameters include the optical power samples of the optical power meter, the high-power pulsed light samples of the spectral analyzer, and the multiple polarization state samples of the polarization controller.

[0037] Preferably, the test device performs insertion loss, return loss, and polarization-dependent loss tests according to multiple preset test parameters. Among them, the optical power samples of the optical power meter refer to the optical power reference values set when the optical power meter performs measurements, which are determined according to the specifications and test requirements of the device under test. For example, to measure the insertion loss of the device under different input optical powers, corresponding optical power samples need to be set; the high-power pulsed light samples of the spectral analyzer refer to the preset optical signal parameters for emission, including the power size, pulse width, repetition frequency, etc. of the optical pulse. Appropriate high-power pulsed light samples can make the detection of the reflection spectrum more accurate; and the multiple polarization state samples of the polarization controller refer to multiple preset polarization state parameters, such as the angle of the linear polarization state, the axis ratio and rotation direction of the elliptical polarization state, etc., to test optical communication devices under different polarization states.

[0038] Further, step S310 further includes step S311, generating optical power samples for emission; step S312, when the target optical communicator performs docking tests in sequence according to the multiple docking test groups, the optical power meter tests the target optical communicator according to the optical power samples to obtain the input optical power and the output optical power; step S313, calculating the insertion loss according to the input optical power and the output optical power, and outputting the insertion loss test data.

[0039] Preferably, the optical power meter is used to measure the input / output optical power of the target optical communicator to test the insertion loss, that is, to measure the power loss when the optical signal passes through the device under test (DUT). Specifically, optical power samples for emission are generated; when the target optical communicator performs docking tests in sequence according to multiple docking test groups, the optical power meter tests the target optical communicator according to the optical power samples to obtain the input optical power and the output optical power, including connecting the device under test (DUT) to the optical path, ensuring that the fiber end face is clean (using dust-free wiping paper), turning on the light source to emit stable optical power, and measuring the input optical power P in and the output optical power P out , and then calculating the insertion loss test data according to the formula to reflect the energy loss degree of light during device transmission, where TL represents the insertion loss value.

[0040] Further, step S310 further includes step S314 of generating a high-power pulsed light sample for transmission; step S315 of, when the target optical communicator performs docking tests in sequence according to the multiple docking test groups, switching the spectral analyzer to an optical reflection measurement mode, and based on the optical reflection measurement mode, testing the target optical communicator with the high-power pulsed light sample to obtain the reflected optical power; and step S316 of calculating the return loss according to the reflected optical power and outputting return loss test data.

[0041] Preferably, the spectral analyzer is used to detect the reflection spectrum to test the return loss, that is, to measure the power loss caused by reflection during the transmission of the optical signal. Specifically, the light source, the device under test (DUT), and the spectral analyzer are connected in a specific order, and appropriate parameters are set on the spectral analyzer, such as the measurement wavelength range (which needs to cover the working wavelength of the device under test), the scanning resolution, the number of averages (which can improve the measurement stability), etc. The light source is turned on to generate a high-power pulsed light sample for transmission (i.e., emit a stable optical signal), which is injected into the device under test. When the target optical communicator performs docking tests in sequence according to the multiple docking test groups, the spectral analyzer is switched to the optical reflection measurement mode, and based on the optical reflection measurement mode, the target optical communicator is tested with the high-power pulsed light sample to obtain the reflected optical power and analyze the reflection spectrum. The spectral analyzer calculates the ratio of the reflected optical power to the incident optical power according to the detected reflection spectrum data, and calculates the return loss test data according to the return loss calculation formula where RL is the return loss value, P r is the reflected optical power, and P i is the incident optical power.

[0042] Further, step S310 further includes step S317 of setting multiple polarization state samples; step S318 of, when the target optical communicator performs docking tests in sequence according to the multiple docking test groups, the polarization controller testing the target optical communicator according to the multiple polarization state samples and recording the multiple output optical powers corresponding to the multiple polarization state samples; and step S319 of calculating the polarization-dependent loss according to the multiple output optical powers and outputting polarization-dependent loss test data.

[0043] Preferably, the polarization controller is used to adjust the polarization state to test the polarization-dependent loss. Connect the devices in the order of light source - polarization controller - device under test (DUT) - optical power meter. Turn on the light source, set its output stable optical power and appropriate wavelength (i.e., multiple polarization state samples), perform zeroing and calibration operations on the optical power meter to ensure accurate measurement. Through the polarization controller, according to the preset polarization state samples (such as parameters like different linear polarization angles, the axis ratio and the rotation direction of elliptical polarization, etc.), when the target optical communication device is docked and tested in sequence according to multiple docking test groups, the polarization controller tests the target optical communication device according to multiple polarization state samples, and records the multiple output optical powers corresponding to the multiple polarization state samples. Specifically, it includes sequentially adjusting the polarization state of the optical signal input to the device under test, that is, cyclically switching the polarization state (0°, 45°, 90°, and 135°) through the polarization controller (PC). For each adjusted polarization state, measure the output optical power after passing through the device under test with the optical power meter and record it. After all the preset polarization states are tested, find out the measured maximum output optical power P max and the minimum output optical power P min , and calculate the polarization-dependent loss test data according to the formula . Among them, PDL is the polarization-dependent loss value.

[0044] Furthermore, step S300 further includes step S320, comparing the multiple groups of test data sets with multiple preset performance thresholds to obtain a performance test result, where the performance test result includes passing the test and failing the test; step S330, if any one of the multiple groups of test data sets is not within the corresponding preset performance threshold, output the result of failing the test; step S340, if all the multiple groups of test data sets are within the multiple preset performance thresholds, output the result of passing the test.

[0045] Preferably, in the reliability test process of an optical communication device, after completing the insertion loss, return loss, and polarization-dependent loss tests, multiple sets of test data sets will be obtained. Among them, each data set corresponds to the test values of a docking test group under specific preset test parameters. The preset performance threshold is a standard value determined according to the quality standard of the optical communication device and the actual application requirements, etc. For different test items (insertion loss, return loss, polarization-dependent loss), there are corresponding preset performance threshold ranges respectively. Specifically, when comparing multiple sets of test data sets with multiple preset performance thresholds, as long as a certain test value in any one of the test data sets (such as the insertion loss value in a certain data set) is not within the preset performance threshold range corresponding to this test item, it indicates that the performance of the target optical communication device in this test scenario does not meet the requirements, and then an unqualified test result is output; on the contrary, if the test values (the values of insertion loss, return loss, and polarization-dependent loss) in all sets of test data sets are respectively within their corresponding preset performance threshold ranges, this indicates that the performance of the target optical communication device meets the standards in all test scenarios, and a qualified test result is output, thereby clearly determining whether the optical communication device passes the reliability test.

[0046] In the foregoing, reference is made to Figure 1 described in detail the reliability test method for an optical communication device according to an embodiment of the present invention. Next, reference will be made to Figure 2 describe the reliability test system for an optical communication device according to an embodiment of the present invention.

[0047] The reliability test system for an optical communication device according to an embodiment of the present invention is used to solve the technical problem in the prior art that it is necessary to specifically dock the test procedures of different components, thereby increasing the test complexity and resulting in insufficient efficiency and accuracy of the reliability test, and achieves the technical effect of improving the efficiency and accuracy of the reliability test. As Figure 2 shown, the reliability test system for an optical communication device includes: a test equipment integration module 10, a docking test group acquisition module 20, and a performance test result acquisition module 30.

[0048] The test equipment integration module 10 is used to integrate test equipment. The test equipment includes an optical power meter, a spectrum analyzer, and a polarization controller. The optical power meter, the spectrum analyzer, and the polarization controller are connected to a host computer through a control interface; the docking test group acquisition module 20 is used to scan the bar code of the target optical communication device, match multiple connection devices for the target optical communication device, and dock the target optical communication device with the multiple connection devices in sequence to obtain multiple docking test groups; the performance test result acquisition module 30 is used to match multiple preset test parameters corresponding to the multiple docking test groups. The test equipment performs insertion loss, return loss, and polarization-dependent loss tests in sequence according to the multiple preset test parameters, outputs multiple sets of test data sets, compares the multiple sets of test data sets with multiple preset performance thresholds, and obtains performance test results.

[0049] Next, the specific configuration of the performance test result acquisition module 30 will be described in detail. The performance test result acquisition module 30 further includes: the test equipment performs insertion loss, return loss, and polarization-dependent loss tests according to the multiple preset test parameters; among them, the optical power meter included in the test equipment is used to measure the input / output optical power of the target optical communication device to test the insertion loss, the spectrum analyzer is used to detect the reflection spectrum to test the return loss, and the polarization controller is used to adjust the polarization state to test the polarization-dependent loss; the multiple preset test parameters include the optical power samples of the optical power meter, the high-power pulsed light samples of the spectrum analyzer, and multiple polarization state samples of the polarization controller.

[0050] Next, the specific configuration of the performance test result acquisition module 30 will be further described in detail. The performance test result acquisition module 30 further includes: generating optical power samples for emission; when the target optical communication device is tested by docking in sequence according to the multiple docking test groups, the optical power meter tests the target optical communication device according to the optical power samples to obtain the input optical power and the output optical power; calculating the insertion loss according to the input optical power and the output optical power, and outputting the insertion loss test data.

[0051] Next, the specific configuration of the performance test result acquisition module 30 will be further described in detail. The performance test result acquisition module 30 further includes: generating high-power pulsed light samples for emission; when the target optical communication device is tested by docking in sequence according to the multiple docking test groups, the spectrum analyzer is switched to the optical reflection measurement mode, and based on the optical reflection measurement mode, the target optical communication device is tested by the high-power pulsed light samples to obtain the reflected optical power; calculating the return loss according to the reflected optical power, and outputting the return loss test data.

[0052] Next, the specific configuration of the performance test result acquisition module 30 will be further described in detail. The performance test result acquisition module 30 further includes: setting a plurality of polarization state samples; when the target optical communicator performs docking tests in sequence according to the plurality of docking test groups, the polarization controller tests the target optical communicator according to the plurality of polarization state samples, and records a plurality of output optical powers corresponding to the plurality of polarization state samples; calculating polarization-dependent loss according to the plurality of output optical powers, and outputting polarization-dependent loss test data.

[0053] Next, the specific configuration of the docking test group acquisition module 20 will be described in detail. The docking test group acquisition module 20 further includes: scanning the barcode of the target optical communication device to determine the device type of the target optical communication device; constructing a device connection relationship network by inputting a plurality of optical communication circuits, where the nodes in the device connection relationship network represent each device, and the edges represent the cumulative number of connections between two devices; based on the device type, identifying a plurality of devices with connection weights greater than a preset connection weight in the device connection relationship network as the plurality of connected devices for output.

[0054] Next, the specific configuration of the docking test group acquisition module 20 will be further described in detail. The docking test group acquisition module 20 further includes: sorting according to the connection weight sizes of the plurality of connected devices, and outputting a switching sequence list of the plurality of connected devices; setting the switching time between two adjacent connected devices in the switching sequence list to be greater than a preset switching time.

[0055] Next, the specific configuration of the docking test group acquisition module 20 will be further described in detail. The docking test group acquisition module 20 further includes: comparing the multiple groups of test data sets with a plurality of preset performance thresholds to obtain a performance test result, where the performance test result includes test qualified and test unqualified; if any one of the multiple groups of test data sets is not within the corresponding preset performance threshold, outputting a test unqualified result; if all the multiple groups of test data sets are within the plurality of preset performance thresholds, outputting a test qualified result.

[0056] The reliability test system for optical communication devices provided by the embodiments of the present invention can execute the reliability test method for optical communication devices provided by any embodiment of the present invention, and has functional modules and beneficial effects corresponding to the execution of the method.

[0057] Although the present application makes various references to certain modules in the system according to the embodiments of the present application, however, any number of different modules can be used and run on the user terminal and / or the server. The various units and modules included are only divided according to the functional logic, but are not limited to the above division as long as the corresponding functions can be achieved; in addition, the specific names of the functional units are only for the convenience of mutual distinction and do not limit the protection scope of the present invention.

[0058] The above specific embodiments do not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations and substitutions can be made according to the design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principle of the present application shall be included within the protection scope of the present application.

Claims

1. A reliability test method for an optical communication device, characterized in that: The method comprises: An integrated test device, the test device comprising an optical power meter, a spectrum analyzer and a polarization controller, the optical power meter, the spectrum analyzer and the polarization controller being connected to a host computer via a control interface; Scanning a barcode of a target optical communication device, matching a plurality of connection devices for the target optical communication device, and sequentially docking the target optical communication device with the plurality of connection devices to obtain a plurality of docking test groups; Matching multiple preset test parameters corresponding to the multiple docking test groups, the test equipment performs insertion loss, return loss and polarization-dependent loss tests in sequence according to the multiple preset test parameters, outputs multiple groups of test data sets, compares the multiple groups of test data sets with multiple preset performance thresholds, and obtains performance test results.

2. The reliability testing method of an optical communication device according to claim 1, characterized in that: The test equipment performs insertion loss, return loss and polarization-dependent loss tests according to the plurality of preset test parameters; The optical power meter included in the test equipment is used to measure the input / output optical power of the target optical communicator to test the insertion loss, the optical spectrum analyzer is used to detect the reflection spectrum to test the return loss, and the polarization controller is used to adjust the polarization state to test the polarization-dependent loss; The plurality of preset test parameters include optical power samples of the optical power meter, high-power pulse light samples of the optical spectrum analyzer, and a plurality of polarization state samples of the polarization controller.

3. The reliability testing method of an optical communication device according to claim 2, characterized in that: The optical power meter is used to measure the input / output optical power of the target optical communicator to test the insertion loss, and the method includes: generating optical power samples for transmission; When the target optical communicator is docked and tested in sequence according to the multiple docking test groups, the optical power meter tests the target optical communicator according to the optical power sample to obtain input optical power and output optical power; Insertion loss is calculated according to the input optical power and the output optical power, and insertion loss test data is output.

4. The reliability testing method of an optical communication device according to claim 2, characterized in that: The spectrum analyzer is used to detect the reflection spectrum to test the return loss, and the method includes: generating a high power pulsed light sample for emission; When the target optical communicator is docked and tested in sequence according to the multiple docking test groups, the optical spectrum analyzer is switched to a light reflection measurement mode, and based on the light reflection measurement mode, the target optical communicator is tested by the high-power pulse light sample to obtain reflected light power; The return loss is calculated according to the reflected light power, and the return loss test data is output.

5. The reliability testing method of an optical communication device according to claim 2, characterized in that: The polarization controller is used to adjust the polarization state to test the polarization-dependent loss, and the method includes: Setting a plurality of polarization state samples; When the target optical communicator is docked and tested in sequence according to the multiple docking test groups, the polarization controller tests the target optical communicator according to the multiple polarization state samples, and records the multiple output optical powers corresponding to the multiple polarization state samples; Polarization-dependent loss is calculated according to the multiple output optical powers, and polarization-dependent loss test data is output.

6. The reliability testing method of an optical communication device according to claim 1, characterized in that: Scanning a barcode of a target optical communication device and matching a plurality of connecting devices for the target optical communication device, the method comprising: Scanning a barcode of a target optical communication device to determine the device type of the target optical communication device; By recording a plurality of optical communication circuits, a device connection relationship network is constructed, wherein nodes in the device connection relationship network represent individual devices, and edges represent the cumulative number of connections between two devices; Based on the device type, a plurality of devices having connection weights greater than a preset connection weight are identified in the device connection relationship network as the plurality of connected device outputs.

7. The reliability testing method of an optical communication device according to claim 6, characterized in that: The method of sequentially docking the target optical communication device with the plurality of connection devices comprises: Sorting the plurality of connecting devices according to their connection weights, and outputting a switching sequence list of the plurality of connecting devices; The switching time of two adjacent connecting devices in the switching sequence table is set to be greater than the preset switching time.

8. The reliability testing method of an optical communication device according to claim 6, characterized in that: Comparing the multiple test data sets with multiple preset performance thresholds to obtain performance test results, wherein the performance test results include a qualified test and a unqualified test; If any of the multiple test data sets is not within the corresponding preset performance threshold, outputting a test failure result; If the multiple test data sets are all within the multiple preset performance thresholds, a test passing result is output.

9. A reliability test system for optical communication devices, characterized in that: The system is used to implement the reliability testing method of the optical communication device according to any one of claims 1 to 8, and the system comprises: A test equipment integration module, used for integrating test equipment, wherein the test equipment includes an optical power meter, a spectrum analyzer and a polarization controller, and the optical power meter, the spectrum analyzer and the polarization controller are connected to a host computer via a control interface; A docking test group obtaining module, used for scanning a barcode of a target optical communication device, matching a plurality of connecting devices for the target optical communication device, and sequentially docking the target optical communication device with the plurality of connecting devices to obtain a plurality of docking test groups; A performance test result acquisition module is used to match multiple preset test parameters corresponding to the multiple docking test groups. The test equipment performs insertion loss, return loss and polarization-related loss tests in sequence according to the multiple preset test parameters, outputs multiple groups of test data sets, and compares the multiple groups of test data sets with multiple preset performance thresholds to obtain performance test results.

Images