A microwave multi-channel product online calibration automatic test system and method

Abstract

This application discloses an online calibration and automatic testing system for microwave multi-channel products and a method thereof. The system includes a temperature chamber / airflow meter, a PXI chassis, a test instrument, an industrial computer, a first programmable calibration component group, a second programmable calibration component group, and a power supply. The first programmable calibration component group includes multiple first programmable calibration components; the second programmable calibration component group includes multiple second programmable calibration components; the device under test includes multiple groups of pathways, each group of pathways including a radio frequency channel and a through pathway; each group of pathways, the first programmable calibration component, and the second programmable calibration component have a one-to-one correspondence; the PXI chassis includes a first PXI radio frequency switch matrix and a second PXI radio frequency switch matrix; the first PXI radio frequency switch matrix is ​​connected to any one of the first programmable calibration components in the first programmable calibration component group. This application enables rapid and accurate testing of the room temperature, low temperature, and high temperature radio frequency performance of microwave multi-channel products.

Description

Technical Field

[0001] The present application relates to the field of radio frequency testing technology, and in particular to an online calibration automatic testing system and method for microwave multi-channel products. Background Art

[0002] With the advancement of microsystem integration technology, efficient and accurate testing of microwave products is becoming increasingly urgent. The current common microwave multi-channel component testing method involves: 1) calibrating the RF test link to eliminate errors in cables, connectors, and switches; 2) sequentially connecting the DUT test link or switching the DUT test link using a microwave switch; 3) setting ambient temperature parameters; 4) setting instrument test parameters; and 4) reading the test results. Key areas to note during the test process include impedance matching, temperature stability, cable loss, and shield grounding.

[0003] The problem with this test method is that errors introduced by cable bending, continuous plugging and unplugging, microwave switching, and cable stress changes at ambient temperature cannot be eliminated during the test. Secondly, the calibration process is performed at room temperature, while the calibration coefficients used in high and low temperature environment tests are generated at room temperature, so the errors cannot be eliminated.

[0004] The prior art CN104459647A "A Microwave Multi-channel Product Testing System" discloses a test system in which a single-pole multi-throw switch array, a multiple-select switch array and a multi-channel test piece are placed in a high and low temperature chamber, and a test control computer, test instrument, test signal source and switch matrix controller are placed outside the high and low temperature chamber. This can significantly reduce the number of high-frequency test cables that need to be connected inside and outside the high and low temperature chamber.

[0005] This test method has the following disadvantages: (1) It cannot solve the errors in phase, amplitude and other tests caused by bending of high-frequency test cables inside and outside the temperature chamber; (2) It cannot solve the temperature drift errors caused by the test cables under different temperature conditions; (3) It cannot eliminate the phase, amplitude and other test errors caused by inconsistent contacts when switching single-pole multi-throw switch arrays and multiple-select switch arrays; (4) When the single-pole multi-throw switch array and the multiple-select switch array are placed in a high and low temperature chamber, the switch array is required to have the ability to work reliably under high and low temperature conditions, which greatly increases the cost of system construction. Summary of the Invention

[0006] In view of this, the present application provides a microwave multi-channel product online calibration automatic testing system and method, which can be applied to the automatic testing of the RF performance of microwave products under different temperature conditions. It has the advantages of wide application range, high compatibility, no need for repeated disassembly and assembly of cables, high reliability, high testing accuracy, and high efficiency.

[0007] The present application discloses an automatic online calibration test system for microwave multi-channel products, which includes a temperature chamber / airflow meter, a PXI chassis, a test instrument, an industrial computer, a first program-controlled calibration component group, a second program-controlled calibration component group, and a power supply; the first program-controlled calibration component group includes multiple first program-controlled calibration components; the second program-controlled calibration component group includes multiple second program-controlled calibration components; the device under test includes multiple groups of pathways, each group of pathways includes a radio frequency channel and a through pathway; each group of pathways, the first program-controlled calibration component, and the second program-controlled calibration component are in one-to-one correspondence; the PXI chassis includes a first PXI radio frequency switch matrix and a second PXI radio frequency switch matrix; the first PXI radio frequency switch matrix is ​​connected to any one of the first program-controlled calibration components in the first program-controlled calibration component group; the first program-controlled calibration component is connected to any one of the second program-controlled calibration components in the second program-controlled calibration component group through the radio frequency channel or the through pathway in each group of pathways; the second PXI radio frequency switch matrix is ​​connected to any one of the second program-controlled calibration components in the second program-controlled calibration component group;

[0008] The test instrument is connected to the first PXI RF switch matrix and the second PXI RF switch matrix respectively; the industrial computer is connected to the first program-controlled calibration component group, the second program-controlled calibration component group, and the temperature chamber / air flow meter respectively; the device under test, the first program-controlled calibration component group, and the second program-controlled calibration component group are all placed in the temperature chamber / air flow meter, and the temperature chamber / air flow meter is used to provide a temperature environment; the power supply is connected to the device under test and the industrial computer respectively; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to realize program-controlled switching of different test channels of microwave multi-channel products; the test instrument is used to test the RF performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; the first program-controlled calibration component group and the second program-controlled calibration component group are used to online calibrate the RF test link of the device under test to complete the RF performance test of the device under test in different temperature environments; the different temperature environments include high temperature, normal temperature, and low temperature.

[0009] Furthermore, a PCI IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial computer; a PXI control card is installed in the PXI chassis; the PCI IO control card in the industrial computer is connected to the device under test and is used to control the working state of the device under test, which includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial computer is used to control and obtain the temperature of the temperature chamber / air flow meter, so that the device under test works in different temperature states; the PXI control card is used to control the conduction and disconnection of the first PXI RF switch matrix and the second PXI RF switch matrix; the PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis, so as to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is respectively connected to the test instrument and power supply, and controls the test instrument and power supply through the IEEE488.2 protocol.

[0010] The present application also discloses a microwave multi-channel product online calibration automatic test method, which is applicable to the microwave multi-channel product online calibration automatic test system described above, and comprises:

[0011] Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test;

[0012] Step 2: The measurement and control software of the industrial computer sends a command to the DUT, causing it to switch to the through path. The measurement and control software of the industrial computer sends a command to the test instrument to start RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing them to be in the load, open circuit, short circuit, and through states, respectively, to obtain calibration parameters and generate a calibration file.

[0013] Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated;

[0014] Step 4: The IPC's measurement and control software sends instructions to the power supply and DUT, powering on the DUT according to the established power-on sequence and delay to put the DUT into operation. The IPC's measurement and control software then sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files for the corresponding test paths, and read the test instrument data to complete the room-temperature RF performance test of all paths in the DUT.

[0015] Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test, and according to the established power-off sequence and delay power-off, the device under test is in a non-operating state. The software also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product.

[0016] Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated until all the RF channels of the DUT are calibrated at a low temperature and the corresponding calibration file is generated.

[0017] Step 7: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test, so that the device under test is powered on according to the established power-on sequence and delay, and the device under test is in a working state. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF channels, and retrieve the calibration file corresponding to the test channel in a low-temperature environment, read the test instrument data, and complete the low-temperature RF performance test of all channels of the device under test. Step 8: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test through the GPIB and IO control card, so that the device under test is in a non-working state according to the established power-off sequence and delay power-off. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instrument to disconnect the RF signal input to the device under test.

[0018] Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

[0019] The present application also discloses an online calibration automatic test system for microwave multi-channel products, which includes a temperature chamber / airflow meter, a PXI chassis, a test instrument, an industrial computer, a first program-controlled calibration component group, a second program-controlled calibration component group, a power supply, and a through path; the first program-controlled calibration component group includes a plurality of first program-controlled calibration components; the second program-controlled calibration component group includes a plurality of second program-controlled calibration components; the device under test includes a plurality of radio frequency channels; the PXI chassis includes a first PXI radio frequency switch matrix and a second PXI radio frequency switch matrix;

[0020] Each RF channel, the first program-controlled calibration component, and the second program-controlled calibration component are in one-to-one correspondence; the first PXI RF switch matrix is ​​connected to any first program-controlled calibration component in the first program-controlled calibration component group; the first program-controlled calibration component is connected to any second program-controlled calibration component in the second program-controlled calibration component group through each RF channel; the second PXI RF switch matrix is ​​connected to any second program-controlled calibration component in the second program-controlled calibration component group; any first program-controlled calibration component in the first program-controlled calibration component group is connected to any second program-controlled calibration component in the second program-controlled calibration component group through a direct path;

[0021] The test instrument is connected to the first PXI RF switch matrix and the second PXI RF switch matrix respectively; the industrial computer is connected to the first program-controlled calibration component group, the second program-controlled calibration component group, and the temperature chamber / air flow meter respectively; the device under test, the first program-controlled calibration component group, and the second program-controlled calibration component group are all placed in the temperature chamber / air flow meter, and the temperature chamber / air flow meter is used to provide a temperature environment; the power supply is connected to the device under test and the industrial computer respectively; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to realize program-controlled switching of different test channels of microwave multi-channel products; the test instrument is used to test the RF performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; the first program-controlled calibration component group and the second program-controlled calibration component group are used to online calibrate the RF test link of the device under test to complete the RF performance test of the device under test in different temperature environments; the different temperature environments include high temperature, normal temperature, and low temperature.

[0022] Furthermore, a PCI type IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial computer; and a PXI control card is installed in the PXI chassis;

[0023] The PCI IO control card in the industrial computer is connected to the device under test and is used to control the working status of the device under test, which includes the receiving state, transmitting state, attenuation state and phase shift state of the device under test; the serial port in the industrial computer is used to control and obtain the temperature of the incubator / air flow meter, and the PXI control card is used to control the conduction and disconnection of the first PXI RF switch matrix and the second PXI RF switch matrix; the PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

[0024] The present application also discloses a microwave multi-channel product online calibration automatic test method, which is applicable to the microwave multi-channel product online calibration automatic test system described above, and comprises:

[0025] Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test;

[0026] Step 2: The measurement and control software of the industrial computer sends a command to the device under test, causing it to switch to the external direct path. The measurement and control software of the industrial computer sends a command to the test instrument to start the RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing the first program-controlled calibration component and the second program-controlled calibration component to be respectively placed in the load, open circuit, short circuit, and direct circuit states to obtain calibration parameters and generate a calibration file.

[0027] Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated;

[0028] Step 4: The measurement and control software of the industrial computer sends instructions to the first and second PXI RF switch matrices to switch different RF channels, retrieve the calibration files for the corresponding test paths, read the test instrument data, and complete the room-temperature RF performance test of all paths of the device under test.

[0029] Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT to control the power-on and power-off status of the DUT. It also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product.

[0030] Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated until all the RF channels of the DUT are calibrated at a low temperature and the corresponding calibration file is generated.

[0031] Step 7: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch different RF channels, retrieve the calibration files corresponding to the test channels in a low-temperature environment, read the test instrument data, and complete the low-temperature RF performance test of all channels of the DUT. Step 8: The IPC's measurement and control software sends instructions to the power supply and DUT via the GPIB card and PCI-type IO control card, putting the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The IPC's measurement and control software then sends instructions to the first and second PXI RF switch matrices and the test instrument to disconnect the RF signal input to the DUT.

[0032] Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

[0033] The present application also discloses an online calibration automatic test system for microwave multi-channel products, which includes a first PXI RF switch matrix, a second PXI RF switch matrix, a PXI chassis, a test instrument, an industrial computer, a first program-controlled calibration component group, a second program-controlled calibration component group, a power supply, and a through path; the first program-controlled calibration component group includes a plurality of first program-controlled calibration components; the second program-controlled calibration component group includes a plurality of second program-controlled calibration components; the test instrument is respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial computer is respectively connected to the first program-controlled calibration component group and the second program-controlled calibration component group; the power supply is connected to the industrial computer;

[0034] When the device under test is connected to perform a full two-port calibration under normal temperature conditions, any first program-controlled calibration component in the first program-controlled calibration component group is connected to the DC path; any second program-controlled calibration component in the second program-controlled calibration component group is connected to the DC path; the test instrument is used to test the RF performance of the through path; the industrial computer is used to control the test instrument to test the through path; the first program-controlled calibration component group and the second program-controlled calibration component group are used to calibrate the through path online to complete the RF performance test of the through path in a normal temperature environment;

[0035] When the device under test is connected and single-port calibration is performed separately as needed, a temperature chamber / air flow meter is also included, and the device under test includes multiple RF channels; each RF channel, the first program-controlled calibration component, and the second program-controlled calibration component are in one-to-one correspondence; the first PXI RF switch matrix is ​​connected to any first program-controlled calibration component in the first program-controlled calibration component group; the first program-controlled calibration component is connected to any second program-controlled calibration component in the second program-controlled calibration component group through each RF channel; the second PXI RF switch matrix is ​​connected to any second program-controlled calibration component in the second program-controlled calibration component group; any first program-controlled calibration component in the first program-controlled calibration component group is connected to the second program-controlled calibration component through a direct path. any second program-controlled calibration component in the group is connected; the device under test, the first program-controlled calibration component group and the second program-controlled calibration component group are all placed in an incubator / air flow meter, which is used to provide a temperature environment; the power supply is connected to the device under test; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to realize program-controlled switching of different test channels of microwave multi-channel products; the test instrument is used to test the RF performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; the first program-controlled calibration component group and the second program-controlled calibration component group are used to calibrate the RF test link of the device under test online to complete the RF performance test of the device under test in low and high temperature environments.

[0036] Furthermore, a PCI IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial computer; a PXI control card and a PXI switch matrix are installed in the PXI chassis;

[0037] The PCI IO control card in the industrial computer is connected to the device under test and is used to control the working status of the device under test, which includes the receiving state, transmitting state, attenuation state and phase shift state of the device under test; the serial port in the industrial computer is used to control and obtain the temperature of the temperature chamber / air flow meter; the PXI control card is used to control the conduction and disconnection of the first PXI RF switch matrix and the second PXI RF switch matrix; the PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

[0038] The present application also discloses a microwave multi-channel product online calibration automatic test method, which is applicable to the microwave multi-channel product online calibration automatic test system described above, and comprises:

[0039] Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test;

[0040] Step 2: The measurement and control software of the industrial computer sends a command to the device under test, causing it to switch to the through path. The measurement and control software of the industrial computer sends a command to the test instrument to start the RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing the first program-controlled calibration component and the second program-controlled calibration component to be respectively placed in the load, open circuit, short circuit, and through states to obtain calibration parameters and generate a calibration file.

[0041] Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated;

[0042] Step 4: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files for the corresponding through-paths, and read the test instrument data to complete the RF performance test of all through-paths of the DUT at room temperature.

[0043] Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT to control the power-on and power-off status of the DUT. It also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product.

[0044] Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated to perform single-port calibration until the single-port calibration of all the RF channels under test of the DUT is completed at a low temperature and a corresponding calibration file is generated with the through-calibration of the corresponding channel obtained in step 2.

[0045] Step 7: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch different RF channels. It also retrieves the calibration file corresponding to the test channel in a low-temperature environment, reads the test instrument data, and completes the low-temperature RF performance test of all channels of the DUT.

[0046] Step 8: The IPC's measurement and control software sends instructions to the power supply and DUT via the GPIB card and PCI IO control card, placing the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The IPC's measurement and control software then sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal input to the DUT.

[0047] Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

[0048] Due to the adoption of the above technical solution, the present application has the following advantages: the present application can realize rapid and accurate testing of the radio frequency performance of microwave products at room temperature, low temperature, and high temperature. The invention has the following beneficial effects: (1) the temperature chamber is used to realize the automatic control switching of the product between normal temperature, low temperature and high temperature, and the temperature control is accurate and efficient; (2) the PXI RF switch matrix is ​​used to realize the automatic switching of different RF channels, and the efficiency is improved; (4) the measurement and control software is used to realize the automatic control of temperature rise and fall, power control on and off, RF signal on and off, and automatic switching of different RF or low-frequency channels, and the test process is automated; (5) the online calibration solves the problem of errors in phase, amplitude and other tests caused by bending of high-frequency test cables inside and outside the temperature chamber; (6) the temperature drift error caused by the test cable under different temperature conditions is solved; (7) the phase, amplitude and other test errors caused by inconsistent contacts when switching single-pole multi-throw switch arrays and multiple-select switch arrays are solved; (8) the single-pole multi-throw switch arrays and multiple-select switch arrays are placed at room temperature, which reduces the working conditions of the switch array and reduces the system construction cost; (9) the system can be calibrated online as needed to reduce test errors; (10) the power-on sequence of the programmable power supply is used to avoid burning of the device under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments recorded in the embodiments of the present application. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0050] Figure 1 This is a schematic diagram of an automatic online calibration test system for microwave multi-channel products according to an embodiment of the present application;

[0051] Figure 2 This is a schematic diagram of an automatic online calibration test method for a microwave multi-channel product according to an embodiment of the present application;

[0052] Figure 3 This is a schematic diagram of another microwave multi-channel product online calibration automatic test system according to an embodiment of the present application;

[0053] Figure 4 This is a schematic diagram of another method for online calibration and automatic testing of microwave multi-channel products according to an embodiment of the present application;

[0054] FIG5( a ) is a schematic diagram of another microwave multi-channel product online calibration automatic test system according to an embodiment of the present application;

[0055] FIG5( b ) is a schematic diagram of another microwave multi-channel product online calibration automatic test system according to an embodiment of the present application;

[0056] Figure 6 This is a schematic diagram of another method for online calibration and automatic testing of microwave multi-channel products according to an embodiment of the present application. DETAILED DESCRIPTION

[0057] The present application is further described with reference to the accompanying drawings and embodiments. The embodiments described are only a part of the embodiments of the present application, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field should fall within the scope of protection of the embodiments of the present application.

[0058] This application proposes three online calibration modes:

[0059] Mode 1: The DUT has a built-in RF pass-through path to achieve dual-port online calibration (SOLT). The microwave test system is connected as follows: Figure 1 As shown, this mode is simple to connect and can start short-open-load-thru (SOLT) calibration online on demand. The disadvantage is that it requires a built-in through calibration channel in the device under test.

[0060] See also Figure 1 The present application provides an embodiment of an automatic online calibration test system for a microwave multi-channel product, which includes an incubator / airflow meter, a PXI chassis, a test instrument, an industrial computer, a first program-controlled calibration component group, a second program-controlled calibration component group, and a power supply; the first program-controlled calibration component group includes multiple first program-controlled calibration components; the second program-controlled calibration component group includes multiple second program-controlled calibration components; the device under test includes multiple groups of pathways, each group of pathways includes a radio frequency channel and a through pathway; each group of pathways, the first program-controlled calibration component, and the second program-controlled calibration component are in one-to-one correspondence; the PXI chassis includes a first PXI radio frequency switch matrix and a second PXI radio frequency switch matrix; the first PXI radio frequency switch matrix is ​​connected to any one of the first program-controlled calibration components in the first program-controlled calibration component group; the first program-controlled calibration component is connected to any one of the second program-controlled calibration components in the second program-controlled calibration component group through the radio frequency channel or the through pathway in each group of pathways; the second PXI radio frequency switch matrix is ​​connected to any one of the second program-controlled calibration components in the second program-controlled calibration component group;

[0061] The test instrument is connected to the first PXI RF switch matrix and the second PXI RF switch matrix respectively; the industrial computer is connected to the first program-controlled calibration component group, the second program-controlled calibration component group, and the temperature chamber / air flow meter respectively; the device under test, the first program-controlled calibration component group, and the second program-controlled calibration component group are all placed in the temperature chamber / air flow meter, and the temperature chamber / air flow meter is used to provide a temperature environment; the power supply is connected to the device under test and the industrial computer respectively; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to realize program-controlled switching of different test channels of microwave multi-channel products; the test instrument is used to test the RF performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; the first program-controlled calibration component group and the second program-controlled calibration component group are used to online calibrate the RF test link of the device under test to complete the RF performance test of the device under test in different temperature environments; the different temperature environments include high temperature, normal temperature, and low temperature.

[0062] Optionally, a PCI IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial computer; a PXI control card is installed in the PXI chassis; the PCI IO control card in the industrial computer is connected to the device under test to control the working state of the device under test, which includes the receiving state, transmitting state, attenuation state, and phase shift state of the device under test; the serial port in the industrial computer is used to control and obtain the temperature of the temperature chamber / air flow meter, so that the device under test works in different temperature states; the PXI control card is used to control the conduction and disconnection of the first PXI RF switch matrix and the second PXI RF switch matrix; the PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

[0063] The low temperature, normal temperature and high temperature in the embodiments of the present application are relative. For example, a certain temperature range can be divided into low temperature, normal temperature and high temperature, and the normal temperature is higher than the low temperature and lower than the high temperature.

[0064] The working principle of the test system is as follows: when the RF cable connection and the ambient temperature have not changed, the calibration process can be omitted by using the previous calibration file. Alternatively, the calibration process can be started at any time to eliminate errors when needed. Figure 2 The present application also provides an embodiment of a microwave multi-channel product online calibration automatic test method, which is applicable to the microwave multi-channel product online calibration automatic test system described in the above embodiment, and includes:

[0065] Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test;

[0066] Step 2: The measurement and control software of the industrial computer sends instructions to the device under test, making the device under test switch to the straight-through path. The measurement and control software of the industrial computer sends instructions to the test instrument to start the RF channel calibration. The measurement and control software of the industrial computer synchronously sends instructions to the first programmable calibration component and the second programmable calibration component, making the first programmable calibration component and the second programmable calibration component respectively in the load, open circuit, and short circuit state to correct the directional error of the single-port signal leakage to the receiving end, the source matching error of the signal source impedance mismatch reflection, and the reflection tracking error of the transmission path difference with the reflection. The first programmable calibration component and the second programmable calibration component are placed in the straight-through state to correct the transmission tracking error of the forward transmission amplitude phase deviation and the load matching error of the impedance adaptation between the ports. Finally, the calibration parameters are obtained and a calibration file is formed. The load, open circuit, short circuit, and straight-through involved in this application are all for this purpose and will not be repeated hereafter.

[0067] Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated;

[0068] Step 4: The IPC's measurement and control software sends instructions to the power supply and DUT, powering on the DUT according to the established power-on sequence and delay to put the DUT into operation. The IPC's measurement and control software then sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files for the corresponding test paths, read the test instrument data, and complete the room-temperature RF performance test of all paths in the DUT. If necessary (if the cable position, switch contacts, or temperature change, the online calibration function (steps 2 to 3) can be started at any time), perform a single-port calibration on the test instrument, then switch to the DUT's through-path and perform through-path calibration on the test instrument. The calibration end face is the DUT's input and output ports to eliminate errors caused by RF cable bending, switch contact changes, and temperature changes within the calibration end face.

[0069] Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test, and according to the established power-off sequence and delay power-off, the device under test is in a non-operating state. The software also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product.

[0070] Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated until all the RF channels of the DUT are calibrated at a low temperature and the corresponding calibration file is generated.

[0071] Step 7: The IPC's measurement and control software sends instructions to the power supply and DUT, ensuring that the DUT is powered on according to the specified power-on sequence and delay, and that the DUT is in working condition. The IPC's measurement and control software also sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files corresponding to the test channels in a low-temperature environment, read the test instrument data, and complete the low-temperature RF performance test of all channels in the DUT. If necessary (if the cable position, switch contacts, or temperature change), the online calibration function (steps 2 to 3) can be activated at any time to eliminate errors caused by RF cable bending, switch contact changes, and temperature changes within the calibration end face.

[0072] Step 8: The IPC's measurement and control software sends instructions to the power supply and DUT via the GPIB and IO control card, placing the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The IPC's measurement and control software then sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal input to the DUT.

[0073] Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

[0074] Mode 2: External RF direct path microwave test system, external RF direct path connection mode, the device under test has an external direct path, and the RF switch matrix is ​​switched to the direct state to achieve online two-port calibration (SOLT), such as Figure 3 This mode can start short-open-load-through (SOLT) calibration online on demand. The disadvantage is that the switch and cable errors connecting the programmable calibration device and the device under test cannot be calibrated, and the uncalibrated part of the link needs to be de-embedded in advance.

[0075] See also Figure 3 The present application also provides an embodiment of an online calibration automatic test system for a microwave multi-channel product, which includes an incubator / airflow meter, a PXI chassis, a test instrument, an industrial computer, a first programmable calibration component group, a second programmable calibration component group, a power supply, and a through path; the first programmable calibration component group includes a plurality of first programmable calibration components; the second programmable calibration component group includes a plurality of second programmable calibration components; the device under test includes a plurality of RF channels; the PXI chassis includes a first PXI RF switch matrix and a second PXI RF switch matrix;

[0076] Each RF channel, the first program-controlled calibration component, and the second program-controlled calibration component are in one-to-one correspondence; the first PXI RF switch matrix is ​​connected to any first program-controlled calibration component in the first program-controlled calibration component group; the first program-controlled calibration component is connected to any second program-controlled calibration component in the second program-controlled calibration component group through each RF channel; the second PXI RF switch matrix is ​​connected to any second program-controlled calibration component in the second program-controlled calibration component group; any first program-controlled calibration component in the first program-controlled calibration component group is connected to any second program-controlled calibration component in the second program-controlled calibration component group through a direct path;

[0077] The test instrument is connected to the first PXI RF switch matrix and the second PXI RF switch matrix respectively; the industrial computer is connected to the first program-controlled calibration component group, the second program-controlled calibration component group, and the temperature chamber / air flow meter respectively; the device under test, the first program-controlled calibration component group, and the second program-controlled calibration component group are all placed in the temperature chamber / air flow meter, and the temperature chamber / air flow meter is used to provide a temperature environment; the power supply is connected to the device under test and the industrial computer respectively; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to realize program-controlled switching of different test channels of microwave multi-channel products; the test instrument is used to test the RF performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; the first program-controlled calibration component group and the second program-controlled calibration component group are used to online calibrate the RF test link of the device under test to complete the RF performance test of the device under test in different temperature environments; the different temperature environments include high temperature, normal temperature, and low temperature.

[0078] Optionally, a PCI IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial computer; and a PXI control card is installed in the PXI chassis;

[0079] The PCI IO control card in the industrial computer is connected to the device under test and is used to control the working status of the device under test, which includes the receiving state, transmitting state, attenuation state and phase shift state of the device under test; the serial port in the industrial computer is used to control and obtain the temperature of the incubator / air flow meter, and the PXI control card is used to control the conduction and disconnection of the first PXI RF switch matrix and the second PXI RF switch matrix; the PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

[0080] The working principle of the test system is as follows: when the RF cable connection and the ambient temperature have not changed, the calibration process can be omitted by using the previous calibration file. Alternatively, the calibration process can be started at any time to eliminate errors when needed. Figure 4The present application also provides an embodiment of a microwave multi-channel product online calibration automatic test method, which is applicable to the microwave multi-channel product online calibration automatic test system described in the above embodiment, and includes:

[0081] Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test;

[0082] Step 2: The measurement and control software of the industrial computer sends a command to the device under test, causing it to switch to the external direct path. The measurement and control software of the industrial computer sends a command to the test instrument to start the RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing the first program-controlled calibration component and the second program-controlled calibration component to be respectively placed in the load, open circuit, short circuit, and direct circuit states to obtain calibration parameters and generate a calibration file.

[0083] Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated;

[0084] Step 4: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files for the corresponding test paths, read the test instrument data, and complete the room-temperature RF performance test of all paths of the DUT. If necessary (if the cable position, switch contacts, or temperature change, the online calibration function (steps 2 to 3) can be activated at any time), perform a single-port calibration on the test instrument, switch to the external through-path, and perform through-path calibration on the test instrument. The calibration end face is the port of the programmable calibration component to eliminate errors caused by RF cable bending, switch contact changes, and temperature changes within the calibration end face.

[0085] Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT to control the power-on and power-off status of the DUT. It also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product.

[0086] Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated until all the RF channels of the DUT are calibrated at a low temperature and the corresponding calibration file is generated.

[0087] Step 7: The IPC's measurement and control software sends commands to the first and second PXI RF switch matrices to switch between different RF channels. It also retrieves the calibration file corresponding to the test channel in a low-temperature environment, reads the test instrument data, and completes the low-temperature RF performance test of all channels of the DUT. If necessary (if the cable position, switch contacts, or temperature change), the online calibration function (steps 2 to 3) can be initiated at any time to eliminate errors caused by RF cable bending, switch contact changes, and temperature changes within the calibration end face.

[0088] Step 8: The IPC's measurement and control software sends instructions to the power supply and DUT via the GPIB card and PCI IO control card, placing the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The IPC's measurement and control software then sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal input to the DUT.

[0089] Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

[0090] Mode 3: Two-step calibration of microwave test system. The advantage of this method is that online calibration can be achieved without adding hardware conditions. The disadvantage is that online calibration can only perform single-port reflection parameter calibration (SOL), and the transmission parameters of the first step of offline calibration are used to achieve dual-port calibration (SOLT). Referring to Figures 5(a) and 5(b), the present application also provides an embodiment of an online calibration automatic test system for microwave multi-channel products, which includes a first PXI RF switch matrix, a second PXI RF switch matrix, a PXI chassis, a test instrument, an industrial computer, a first programmable calibration component group, a second programmable calibration component group, a power supply, and a through path; the first programmable calibration component group includes a plurality of first programmable calibration components; the second programmable calibration component group includes a plurality of second programmable calibration components; the test instrument is respectively connected to the first PXI RF switch matrix and the second PXI RF switch matrix; the industrial computer is respectively connected to the first programmable calibration component group and the second programmable calibration component group; the power supply is connected to the industrial computer;

[0091] When the device under test is connected to perform a full two-port calibration under normal temperature conditions, any first program-controlled calibration component in the first program-controlled calibration component group is connected to the DC path; any second program-controlled calibration component in the second program-controlled calibration component group is connected to the DC path; the test instrument is used to test the RF performance of the through path; the industrial computer is used to control the test instrument to test the through path; the first program-controlled calibration component group and the second program-controlled calibration component group are used to calibrate the through path online to complete the RF performance test of the through path in a normal temperature environment;

[0092] When the device under test is connected and single-port calibration is performed separately as needed, a temperature chamber / air flow meter is also included, and the device under test includes multiple RF channels; each RF channel, the first program-controlled calibration component, and the second program-controlled calibration component are in one-to-one correspondence; the first PXI RF switch matrix is ​​connected to any first program-controlled calibration component in the first program-controlled calibration component group; the first program-controlled calibration component is connected to any second program-controlled calibration component in the second program-controlled calibration component group through each RF channel; the second PXI RF switch matrix is ​​connected to any second program-controlled calibration component in the second program-controlled calibration component group; any first program-controlled calibration component in the first program-controlled calibration component group is connected to the second program-controlled calibration component through a direct path. any second program-controlled calibration component in the group is connected; the device under test, the first program-controlled calibration component group and the second program-controlled calibration component group are all placed in an incubator / air flow meter, which is used to provide a temperature environment; the power supply is connected to the device under test; the first PXI RF switch matrix and the second PXI RF switch matrix are both used to realize program-controlled switching of different test channels of microwave multi-channel products; the test instrument is used to test the RF performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; the first program-controlled calibration component group and the second program-controlled calibration component group are used to calibrate the RF test link of the device under test online to complete the RF performance test of the device under test in low and high temperature environments.

[0093] Optionally, a PCI IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software are installed on the industrial computer; a PXI control card and a PXI switch matrix are installed in the PXI chassis;

[0094] The PCI IO control card in the industrial computer is connected to the device under test and is used to control the working status of the device under test, which includes the receiving state, transmitting state, attenuation state and phase shift state of the device under test; the serial port in the industrial computer is used to control and obtain the temperature of the temperature chamber / air flow meter; the PXI control card is used to control the conduction and disconnection of the first PXI RF switch matrix and the second PXI RF switch matrix; the PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

[0095] The working principle of the test system is as follows Figure 6 , connect the DUT at room temperature and perform a full two-port calibration. Then, perform a single-port calibration as needed. Finally, use the full-port calibration data at room temperature to complete the online calibration. Perform a full parameter calibration before testing, and perform a single-port calibration during testing to correct the first calibration data.

[0096] See also Figure 6The present application also provides an embodiment of a microwave multi-channel product online calibration automatic test method, which is applicable to the microwave multi-channel product online calibration automatic test system described in the above embodiment, and includes:

[0097] Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test;

[0098] Step 2: The measurement and control software of the industrial computer sends a command to the device under test, causing it to switch to the through path. The measurement and control software of the industrial computer sends a command to the test instrument to start the RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing the first program-controlled calibration component and the second program-controlled calibration component to be respectively placed in the load, open circuit, short circuit, and through states to obtain calibration parameters and generate a calibration file.

[0099] Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated;

[0100] Step 4: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch different RF channels, retrieve the corresponding through-path calibration files, read the test instrument data, and complete the RF performance test of all through-paths of the DUT under normal temperature conditions. If necessary (if the cable position, switch contacts, or temperature change, the online calibration function (steps 2 to 3) can be started at any time), perform a single-port calibration on the test instrument. That is, calibrate each RF channel of the DUT to generate a single-port calibration file. The calibration end face is the input and output port of the DUT. The single-port file and the through-path calibration file in step 2 are combined to form a dual-port full calibration file to eliminate errors caused by RF cable bending, switch contact changes, and temperature changes within the calibration end face.

[0101] Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT to control the power-on and power-off status of the DUT. It also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product.

[0102] Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated to perform single-port calibration until the single-port calibration of all the RF channels under test of the DUT is completed at a low temperature and a corresponding calibration file is generated with the through-calibration of the corresponding channel obtained in step 2.

[0103] Step 7: The IPC's measurement and control software sends commands to the first and second PXI RF switch matrices to switch between different RF channels. It also retrieves the calibration file corresponding to the test channel in a low-temperature environment, reads the test instrument data, and completes the low-temperature RF performance test of all channels in the DUT. If necessary (if the cable position, switch contacts, or temperature change), the online calibration function (steps 2 to 3) can be initiated at any time to eliminate errors caused by RF cable bending, switch contact changes, and temperature changes within the calibration end face.

[0104] Step 8: The IPC's measurement and control software sends instructions to the power supply and DUT via the GPIB card and PCI IO control card, placing the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The IPC's measurement and control software then sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal input to the DUT.

[0105] Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

[0106] The present application can set the power-on sequence and interval time through program control, thereby avoiding burning of the device under test due to incorrect power-on sequence; the industrial computer serves as the main control unit, utilizing the PCI and PCI-e bus extensions in the industrial computer and the PXI bus in the PXI chassis, and can match PCI, PCI-e and PXI boards, with stronger system expansion capabilities; the industrial computer measurement and control software sends temperature control instructions, responds to the ready interrupt issued by the temperature chamber / air flow meter and then proceeds to the next operation, without using a timing loop to query the temperature chamber / air flow meter status word to determine the next operation, which can effectively reduce the computing load of the industrial computer and improve the effect speed; the proposed device under test can be multiple pieces, connected through a switch matrix, and online calibration is implemented, and its test accuracy is not affected by the addition of switches and cables.

[0107] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and not to limit them. Although the present application has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present application can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present application should be included in the scope of protection of the claims of the present application.

Claims

1. A microwave multi-channel product online calibration automatic test system, characterized in that: Includes temperature chamber / air flow meter, PXI chassis, test instrument, industrial computer, first program-controlled calibration component set, second program-controlled calibration component set, and power supply; The first program-controlled calibration component set includes a plurality of first program-controlled calibration components; The second program-controlled calibration component group includes a plurality of second program-controlled calibration components; the device under test includes a plurality of groups of paths, each group of paths includes a radio frequency channel and a through path; Each group of channels, the first programmable calibration component, and the second programmable calibration component correspond to each other; the PXI chassis includes a first PXI RF switch matrix and a second PXI RF switch matrix; The first PXI radio frequency switch matrix is ​​connected to any first program-controlled calibration component in the first program-controlled calibration component group; The first programmable calibration component is connected to any second programmable calibration component in the second programmable calibration component group through the radio frequency channel or the direct path in each group of paths; The second PXI radio frequency switch matrix is ​​connected to any second program-controlled calibration component in the second program-controlled calibration component group; The test instruments are connected to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix respectively; The industrial computer is connected to the first program-controlled calibration component set, the second program-controlled calibration component set, and the temperature chamber / air flow meter. The device under test, the first program-controlled calibration component set, and the second program-controlled calibration component set are all placed in the temperature chamber / air flow meter, which is used to provide a temperature environment. The power supply is connected to the device under test and the industrial computer respectively. The first PXI RF switch matrix and the second PXI RF switch matrix are both used to implement program-controlled switching of different test channels of the microwave multi-channel product. The test instrument is used to test the radio frequency performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; The first program-controlled calibration component group and the second program-controlled calibration component group are used to calibrate the radio frequency test link of the device under test online to complete the radio frequency performance test of the device under test in different temperature environments; the different temperature environments include high temperature, normal temperature and low temperature.

2. The microwave multi-channel product online calibration automatic test system according to claim 1 is characterized in that: The industrial computer is equipped with a PCI IO control card, a PCI-PXI control card, a GPIB card, and measurement and control software. The PXI control card is installed in the PXI chassis. The PCI IO control card in the industrial computer is connected to the device under test to control its operating state, including its receiving, transmitting, attenuation, and phase shifting states. The serial port in the industrial computer is used to control and obtain the temperature of the temperature chamber / airflow meter, allowing the device under test to operate at different temperature states. The PXI control card is used to control the first PXI RF switch matrix and the second PXI RF switch matrix to be turned on and off; The PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

3. A microwave multi-channel product online calibration automatic test method, applicable to the microwave multi-channel product online calibration automatic test system according to claim 1 or 2, characterized in that: include: Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial computer sends a command to the DUT, causing it to switch to the through path. The measurement and control software of the industrial computer sends a command to the test instrument to start RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing them to be in the load, open circuit, short circuit, and through states, respectively, to obtain calibration parameters and generate a calibration file. Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated; Step 4: The IPC's measurement and control software sends instructions to the power supply and DUT, powering on the DUT according to the established power-on sequence and delay to put the DUT into operation. The IPC's measurement and control software then sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files for the corresponding test paths, and read the test instrument data to complete the room-temperature RF performance test of all paths in the DUT. Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test, and according to the established power-off sequence and delay power-off, the device under test is in a non-operating state. The software also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product. Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated until all the RF channels of the DUT are calibrated at a low temperature and the corresponding calibration file is generated. Step 7: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test, so that the device under test is powered on according to the established power-on sequence and delay, and the device under test is in a working state. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to switch different RF channels, and retrieve the calibration file corresponding to the test channel in a low-temperature environment, read the test instrument data, and complete the low-temperature RF performance test of all channels of the device under test. Step 8: The measurement and control software of the industrial computer sends instructions to the power supply and the device under test through the GPIB and IO control card, so that the device under test is in a non-working state according to the established power-off sequence and delay power-off. The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix and the test instrument to disconnect the RF signal input to the device under test. Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

4. A microwave multi-channel product online calibration automatic test system, characterized in that: Includes temperature chamber / air flow meter, PXI chassis, test instrument, industrial computer, first program-controlled calibration component set, second program-controlled calibration component set, power supply, and direct access; The first program-controlled calibration component set includes a plurality of first program-controlled calibration components; The second program-controlled calibration component group includes a plurality of second program-controlled calibration components; the device under test includes a plurality of radio frequency channels; The PXI chassis includes a first PXI RF switch matrix and a second PXI RF switch matrix; Each radio frequency channel, the first program-controlled calibration component, and the second program-controlled calibration component have a one-to-one correspondence; The first PXI radio frequency switch matrix is ​​connected to any first program-controlled calibration component in the first program-controlled calibration component group; The first programmable calibration component is connected to any second programmable calibration component in the second programmable calibration component group through each radio frequency channel; The second PXI radio frequency switch matrix is ​​connected to any second program-controlled calibration component in the second program-controlled calibration component group; Any first programmable calibration component in the first programmable calibration component group is connected to any second programmable calibration component in the second programmable calibration component group through a through passage; The test instruments are connected to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix respectively; The industrial computer is connected to the first program-controlled calibration component set, the second program-controlled calibration component set, and the temperature chamber / air flow meter. The device under test, the first program-controlled calibration component set, and the second program-controlled calibration component set are all placed in the temperature chamber / air flow meter, which is used to provide a temperature environment. The power supply is connected to the device under test and the industrial computer respectively. The first PXI RF switch matrix and the second PXI RF switch matrix are both used to implement program-controlled switching of different test channels of the microwave multi-channel product. The test instrument is used to test the radio frequency performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; The first program-controlled calibration component group and the second program-controlled calibration component group are used to calibrate the radio frequency test link of the device under test online to complete the radio frequency performance test of the device under test in different temperature environments; the different temperature environments include high temperature, normal temperature and low temperature.

5. The microwave multi-channel product online calibration automatic test system according to claim 4 is characterized in that: Install PCI IO control card, PCI-PXI control card, GPIB card, and measurement and control software on the industrial computer; install PXI control card in the PXI chassis; The PCI IO control card in the industrial computer is connected to the device under test and is used to control the working state of the device under test, including the receiving state, transmitting state, attenuation state, and phase shift state of the device under test. The serial port in the industrial computer is used to control and obtain the temperature of the incubator / air flow meter. The PXI control card is used to control the conduction and disconnection of the first PXI RF switch matrix and the second PXI RF switch matrix. The PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

6. A microwave multi-channel product online calibration automatic test method, applicable to the microwave multi-channel product online calibration automatic test system according to claim 4 or 5, characterized in that: include: Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial computer sends a command to the device under test, causing it to switch to the external direct path. The measurement and control software of the industrial computer sends a command to the test instrument to start the RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing the first program-controlled calibration component and the second program-controlled calibration component to be respectively placed in the load, open circuit, short circuit, and direct circuit states to obtain calibration parameters and generate a calibration file. Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated; Step 4: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files for the corresponding test paths, and read the test instrument data to complete the room-temperature RF performance test of all paths of the DUT. Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT to control the power-on and power-off status of the DUT. It also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product. Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / air flow meter through the serial port to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated until all the RF channels of the DUT are calibrated at a low temperature and the corresponding calibration file is generated. Step 7: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch different RF channels, retrieve the calibration files corresponding to the test channels in a low-temperature environment, read the test instrument data, and complete the low-temperature RF performance test of all channels of the DUT. Step 8: The IPC's measurement and control software sends instructions to the power supply and DUT via the GPIB card and PCI-type IO control card, putting the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The IPC's measurement and control software then sends instructions to the first and second PXI RF switch matrices and the test instrument to disconnect the RF signal input to the DUT. Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

7. A microwave multi-channel product online calibration automatic test system, characterized in that: It includes a first PXI radio frequency switch matrix, a second PXI radio frequency switch matrix, a PXI chassis, a test instrument, an industrial computer, a first program-controlled calibration component group, a second program-controlled calibration component group, a power supply, and a through path; The first program-controlled calibration component set includes a plurality of first program-controlled calibration components; The second program-controlled calibration component group includes a plurality of second program-controlled calibration components; The test instruments are connected to the first PXI radio frequency switch matrix and the second PXI radio frequency switch matrix respectively; the industrial computer is connected to the first program-controlled calibration component group and the second program-controlled calibration component group respectively; The power supply is connected to the industrial computer; When the device under test is connected to perform full two-port calibration under normal temperature, any one of the first program-controlled calibration components in the first program-controlled calibration component group is connected to the DC path; Any second programmable calibration component in the second programmable calibration component group is connected to the DC path; test The instrument is used to test the radio frequency performance of the direct path; the industrial computer is used to control the test instrument to test the direct path; The first program-controlled calibration component set and the second program-controlled calibration component set are used for online calibration of the through-path to complete the RF performance test of the through-path in a room temperature environment; When the device under test is connected and single-port calibration is performed as needed, a temperature chamber / air flow meter is also included. The device under test includes multiple RF channels; each RF channel has a one-to-one correspondence with the first program-controlled calibration component and the second program-controlled calibration component; The first PXI radio frequency switch matrix is ​​connected to any first program-controlled calibration component in the first program-controlled calibration component group; The first programmable calibration component is connected to any second programmable calibration component in the second programmable calibration component group through each radio frequency channel; The second PXI radio frequency switch matrix is ​​connected to any second program-controlled calibration component in the second program-controlled calibration component group; Any first programmable calibration component in the first programmable calibration component group is connected to any second programmable calibration component in the second programmable calibration component group through a direct path; the device under test, the first programmable calibration component group, and the second programmable calibration component group are all placed in an incubator / airflow meter, which is used to provide a temperature environment; a power supply is connected to the device under test; and the first PXI RF switch matrix and the second PXI RF switch matrix are both used to implement programmable switching of different test channels of a microwave multi-channel product; The test instrument is used to test the radio frequency performance of the device under test; the industrial computer is used to control the test instrument to test the device under test; The first program-controlled calibration component set and the second program-controlled calibration component set are used to calibrate the radio frequency test link of the device under test online to complete the radio frequency performance test of the device under test in low temperature and high temperature environments.

8. The microwave multi-channel product online calibration automatic test system according to claim 7, characterized in that: Install PCI IO control card, PCI-PXI control card, GPIB card, and measurement and control software on the industrial computer; install PXI control card and PXI switch matrix in the PXI chassis; The PCI IO control card in the industrial computer is connected to the device under test and is used to control the operating state of the device under test, including the receiving state, transmitting state, attenuation state, and phase shift state. The serial port in the industrial computer is used to control and obtain the temperature of the incubator / air flow meter. The PXI control card is used to control the conduction and disconnection of the first and second PXI RF switch matrices. The PCI-PXI control card in the industrial computer is connected to the PXI control card in the PXI chassis to incorporate the resources in the PXI chassis into the control system of the industrial computer; the GPIB card in the industrial computer is connected to the test instrument and power supply respectively, and controls the test instrument and power supply through the IEEE488.2 protocol.

9. A microwave multi-channel product online calibration automatic test method, applicable to the microwave multi-channel product online calibration automatic test system according to claim 7 or 8, characterized in that: include: Step 1: The measurement and control software of the industrial computer sends instructions to the first PXI RF switch matrix and the second PXI RF switch matrix to connect the RF channels of the test instrument, the first programmable calibration component, the second programmable calibration component, and the device under test; Step 2: The measurement and control software of the industrial computer sends a command to the device under test, causing it to switch to the through path. The measurement and control software of the industrial computer sends a command to the test instrument to start the RF channel calibration. The measurement and control software of the industrial computer simultaneously sends a command to the first program-controlled calibration component and the second program-controlled calibration component, causing the first program-controlled calibration component and the second program-controlled calibration component to be respectively placed in the load, open circuit, short circuit, and through states to obtain calibration parameters and generate a calibration file. Step 3: Repeat steps 1 and 2 until all RF channels of the device under test are calibrated and the corresponding calibration files are generated; Step 4: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch between different RF channels, retrieve the calibration files for the corresponding through-paths, and read the test instrument data to complete the RF performance test of all through-paths of the DUT at room temperature. Step 5: The measurement and control software of the industrial computer sends instructions to the power supply and the DUT to control the power-on and power-off status of the DUT. It also sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal of the microwave multi-channel product. Step 6: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to adjust the temperature of the environment where the DUT is located to a low temperature. After the low temperature lasts for the time required by the DUT, steps 2 and 3 are repeated to perform single-port calibration until the single-port calibration of all the RF channels under test of the DUT is completed at a low temperature and a corresponding calibration file is generated with the through-calibration of the corresponding channel obtained in step 2. Step 7: The IPC's measurement and control software sends instructions to the first and second PXI RF switch matrices to switch different RF channels. It also retrieves the calibration file corresponding to the test channel in a low-temperature environment, reads the test instrument data, and completes the low-temperature RF performance test of all channels of the DUT. Step 8: The IPC's measurement and control software sends instructions to the power supply and DUT via the GPIB card and PCI IO control card, placing the DUT in a non-operating state according to the established power-off sequence and delayed power-off. The IPC's measurement and control software then sends instructions to the first PXI RF switch matrix, the second PXI RF switch matrix, and the test instrument to disconnect the RF signal input to the DUT. Step 9: The measurement and control software of the industrial computer sends a command to the temperature chamber / airflow meter to cool the DUT to room temperature and then remove it. All instruments and equipment are turned off to complete the RF performance test of the DUT in different temperature environments.

Images