Index test method, device and equipment of seismic exploration instrument and storage medium

Abstract

The invention discloses an index test method, device and equipment of a seismic exploration instrument and a storage medium, and relates to the field of geoscience and applied science. The method comprises the steps that seismic signals and standard time information are acquired, the seismic signals are analog signals collected after seismic waves are propagated in an underground medium, and the standard time information is used for calibrating the acquisition time of the seismic signals; the seismic signals are input to an analog-to-digital conversion device for signal conditioning, digital signals to be detected are obtained, and the analog-to-digital conversion device is used for converting analog signals into digital signals; based on the to-be-detected digital signal and a digital-analog chip selection signal, obtaining a chip selection analog signal, the digital-analog chip selection signal being used for indicating a combination mode of the digital-analog conversion device; and based on the standard time information and the chip selection analog signal, analyzing the to-be-tested digital signal to obtain a test index parameter. According to the method, the seismic exploration instrument is automatically tested, the test period is shortened, and the test working efficiency is improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the fields of earth science and applied science, and in particular to an index testing method, device, equipment and storage medium for a seismic exploration instrument. Background Art

[0002] In the field of seismic exploration technology, there are more than ten types of instruments and equipment used for seismic exploration, and the number of instruments and equipment used in seismic exploration projects is huge. In order to ensure the normal development of exploration and production, it is necessary to test and evaluate the key technical characteristics of the instruments and equipment.

[0003] In related technologies, for the testing and maintenance of instruments and equipment, a testing device is used to test the station circuit board. If the test fails, the station shell needs to be disassembled, the station circuit board needs to be repaired, and then the repaired station circuit board needs to be tested. The above process is repeated until the test passes.

[0004] In the related art, the process of testing and repairing instruments and equipment is relatively complicated, and due to the large number of instruments and equipment used in seismic exploration projects, the testing efficiency is low. Summary of the Invention

[0005] The present invention provides a method, apparatus, device, and storage medium for testing indicators of a seismic exploration instrument. The technical solutions provided by the present invention are as follows:

[0006] According to one aspect of an embodiment of the present application, a method for testing an index of a seismic exploration instrument is provided, the method comprising:

[0007] Acquiring seismic signals and standard time information, wherein the seismic signals are analog signals collected after seismic waves propagate through underground media, and the standard time information is used to calibrate the acquisition time of the seismic signals;

[0008] Inputting the seismic signal into an analog-to-digital converter for signal conditioning to obtain a digital signal to be measured, wherein the analog-to-digital converter is used to convert the analog signal into a digital signal;

[0009] Based on the digital signal to be measured and the digital-to-analog chip select signal, a chip select analog signal is obtained, wherein the digital-to-analog chip select signal is used to indicate a combination mode of a digital-to-analog conversion device; wherein the digital-to-analog conversion device is used to convert a digital signal into an analog signal;

[0010] Based on the standard time information and the chip selection analog signal, the digital signal to be tested is analyzed to obtain test index parameters.

[0011] According to one aspect of an embodiment of the present application, a device for testing an index of a seismic exploration instrument is provided, the device comprising:

[0012] A signal acquisition module, configured to acquire seismic signals and standard time information, wherein the seismic signals are analog signals collected after seismic waves propagate through underground media, and the standard time information is used to calibrate the acquisition time of the seismic signals;

[0013] A signal conditioning module, configured to input the seismic signal into an analog-to-digital converter for signal conditioning to obtain a digital signal to be measured, wherein the analog-to-digital converter is configured to convert the analog signal into a digital signal;

[0014] A digital-to-analog conversion module, configured to obtain a chip-select analog signal based on the digital signal to be measured and a digital-to-analog chip select signal, wherein the digital-to-analog chip select signal is used to indicate a combination mode of a digital-to-analog conversion device; wherein the digital-to-analog conversion device is used to convert a digital signal into an analog signal;

[0015] The signal analysis module is used to analyze the digital signal to be tested based on the standard time information and the chip selection analog signal to obtain test index parameters.

[0016] According to one aspect of an embodiment of the present application, a computer device is provided, comprising a processor and a memory, wherein a computer program is stored in the memory, and the computer program is loaded and executed by the processor to implement the above-mentioned index testing method for seismic exploration instruments.

[0017] According to one aspect of an embodiment of the present application, a computer-readable storage medium is provided, in which a computer program is stored. The computer program is loaded and executed by a processor to implement the above-mentioned index testing method for seismic exploration instruments.

[0018] According to one aspect of an embodiment of the present application, a computer program product is provided. The computer program product includes a computer program, and the computer program is loaded and executed by a processor to implement the above-mentioned index testing method of the seismic exploration instrument.

[0019] The technical solutions provided by the embodiments of the present application include at least the following beneficial effects:

[0020] By performing signal conditioning on the collected seismic signal, an easy-to-process digital signal to be tested is obtained. Then, based on the digital signal to be tested and the digital-to-analog chip select signal, a corresponding chip-selected analog signal is obtained. Finally, based on the above chip-selected analog signal and standard time information, the digital signal to be tested is analyzed to obtain test index parameters. This realizes automatic testing of the performance of the seismic instrument, reduces the test cycle, improves the test efficiency of various seismic exploration instruments, facilitates the monitoring of signal conditions, and ensures the smooth progress of seismic exploration work. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is a schematic diagram of an implementation environment for a solution provided by an embodiment of the present application;

[0022] Figure 2 This is a flow chart of an index testing method for a seismic exploration instrument provided by one embodiment of the present application;

[0023] Figure 3 This is a block diagram of an implementation method for testing an index of a seismic exploration instrument provided by an embodiment of the present application;

[0024] Figure 4 This is a block diagram of an index testing device for a seismic exploration instrument provided by one embodiment of the present application;

[0025] Figure 5 This is a structural block diagram of a computer device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0026] In order to make the objectives, technical solutions and advantages of this application clearer, the implementation methods of this application will be further described in detail below with reference to the accompanying drawings.

[0027] Please refer to Figure 1 , which shows a schematic diagram of an implementation environment of a solution provided by an embodiment of the present application. The implementation environment of the solution may include: a computer device 10.

[0028] In the method provided in the embodiments of the present application, each step may be performed by a computer device, which refers to an electronic device capable of data calculation, processing, and storage. The computer device may be a terminal device such as a mobile phone, tablet computer, laptop computer, or desktop computer, or a server. The server may be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing cloud computing services. The computer device 10 is used to analyze the acquired seismic signals.

[0029] Exemplarily, terminal devices include but are not limited to mobile phones, computers, intelligent voice interaction devices, smart home appliances, vehicle-mounted terminals, aircraft, game consoles, wearable devices, multimedia playback devices, augmented reality (AR) devices, virtual reality (VR) devices and other electronic devices.

[0030] Please refer to Figure 2 , which shows a flow chart of an index testing method for a seismic exploration instrument provided by an embodiment of the present application. The execution subject of each step of the method may be a computer device, for example, the computer device may be Figure 1The computer device 10 in the solution implementation environment shown. The method may include at least one of the following steps (210-240):

[0031] Step 210: Acquire seismic signals and standard time information. Seismic signals are analog signals collected after seismic waves propagate in underground media. Standard time information is used to calibrate the acquisition time of seismic signals.

[0032] Seismic data is collected by artificially stimulating seismic waves at the surface during geophysical exploration. As these waves propagate downward, they are reflected and refracted by the inconsistencies in the strata's media and lithology. These waves are then received by seismic geophones at the surface, generating data on the reflected waves. This data includes recorded information such as the reflected waves, their arrival time, and their intensity.

[0033] Seismic signals are obtained by converting the vibrations of seismic waves reflected from the earth's surface or underground into analog signals through seismic survey instruments. These analog signals change over time and record information such as the vibration intensity and frequency of the seismic waves.

[0034] Standard time information refers to a time standard that is widely accepted and adopted internationally and is used to synchronize and calibrate time in a global location. Optionally, the standard time information may be Universal Time Coordinated (UTC), Greenwich Mean Time (GMT), International Atomic Time (TAI), etc. Optionally, the standard time information may be provided by a satellite system, for example, the Global Positioning System (GPS) or the BeiDou satellite system may provide accurate standard time. The satellite system uses a high-precision atomic clock or other clock device to generate an accurate time signal, and transmits it to the ground or instruments and equipment via a satellite signal to provide time services.

[0035] In seismic exploration, standard time information is used for time synchronization, time calibration, data processing and analysis, instrument calibration, and debugging. Standard time information provides the time calibration period and clock source operating parameters for instruments and equipment used in seismic exploration. The time calibration period refers to the time interval for adjusting and calibrating the time of a device, system, or instrument. For example, standard time information is used to accurately synchronize seismic signals to ensure that the time of the instruments and equipment used for seismic exploration remains synchronized. For example, in seismic exploration, accurate time calibration of earthquake events is required to determine the time, location, and magnitude of the earthquake, providing basic data for earthquake monitoring and research. For example, standard time information is used to process collected seismic waveforms, interpret underground structures, and locate earthquake events.

[0036] An analog signal is a continuously changing signal whose value changes continuously with time, while a digital signal is a discrete signal whose value is discrete in both time and amplitude.

[0037] In step 220 , the seismic signal is input to an analog-to-digital converter for signal conditioning to obtain a digital signal to be measured. The analog-to-digital converter is used to convert the analog signal into a digital signal.

[0038] Signal conditioning refers to converting analog signals into digital signals for use in data acquisition, process control, computation, display, readout, or other purposes. Optionally, signal conditioning can include at least one of the following processes: amplification, filtering, compensation, linearization, digitization, etc. Signal conditioning may also include other processes, which are not limited in this application.

[0039] An analog-to-digital converter (ADC) is a circuit structure that converts a continuous analog signal into a discrete digital signal. ADCs include the following types: Successive Approximation Analog to Digital Converter (SAADC), Integrating Analog to Digital Converter (IADC), Flash Analog to Digital Converter (FADC), and Sigma-Delta Analog to Digital Converter (Σ-ΔADC). For example, an ADC may be the ADS1284, a high-precision, low-power 24-bit ADC.

[0040] In some embodiments, the seismic signal is preprocessed by an analog-to-digital conversion device to obtain a preprocessed seismic signal; and the preprocessed seismic signal is converted by the analog-to-digital conversion device to obtain a digital signal to be measured.

[0041] In some embodiments, the analog-to-digital converter includes a signal conditioning circuit configured to pre-process the seismic signal input to the analog-to-digital converter. The seismic signal processed by the signal conditioning circuit meets the input requirements of the analog-to-digital converter.

[0042] The analog-to-digital converter converts the pre-processed seismic signal into a digital signal to be measured by performing operations such as sampling, quantization, and encoding on the pre-processed seismic signal.

[0043] In some embodiments, the pre-processing includes at least one of the following: filtering processing, amplification processing, calibration processing, and signal smoothing processing.

[0044] Filtering processing refers to using a filter to filter the above seismic signals to remove interference or noise from the environment and retain the required signal components.

[0045] Amplification processing refers to amplifying the amplitude of the above-mentioned seismic signal to increase the strength of the seismic signal for subsequent data processing and analysis.

[0046] Calibration is the process of adjusting the parameters of a signal conditioning circuit or seismic sensor to ensure that its output is consistent with a standard or reference signal.

[0047] Signal smoothing is used to remove spikes or mutations in the above-mentioned seismic signals, making them smoother and more continuous so as to be easier to process or analyze.

[0048] Through the above-mentioned method, the collected seismic signals are preprocessed and digitized, which is beneficial to improving the quality, stability and reliability of the seismic signals.

[0049] Step 230: Obtain a chip select analog signal based on the digital signal to be measured and the digital-analog chip select signal. The digital-analog chip select signal is used to indicate the combination mode of the digital-to-analog converter device; wherein the digital-to-analog converter device is used to convert the digital signal into an analog signal.

[0050] A digital-to-analog converter (DAC) is a circuit structure that converts discrete digital signals into continuous analog signals. DACs include the following types: serial digital-to-analog converter (SDAC), parallel digital-to-analog converter (PDAC), voltage output digital-to-analog converter (VODAC), and resolution digital-to-analog converter (RDAC). For example, an ADC can be the ADS1284, a 16-bit high-speed parallel DAC.

[0051] In some embodiments, the digital signal to be measured is input into a plurality of digital-to-analog conversion devices to obtain a plurality of converted analog signals; and the plurality of converted analog signals are processed according to a digital-to-analog chip select signal to obtain a chip select analog signal.

[0052] For example, Figure 3 , which shows a block diagram of an implementation method of an index test method of a seismic exploration instrument provided by an embodiment of the present application, Figure 3 The four digital-to-analog converter devices are digital-to-analog converter device-1, digital-to-analog converter device-2, digital-to-analog converter device-3 and digital-to-analog converter device-4. Assuming that the test environment at this time is in the southwest region, the digital-to-analog chip select signal indicates the selection of digital-to-analog converter device-1 and digital-to-analog converter device-3, indicating that after the digital signals to be tested are input to digital-to-analog converter device-1, digital-to-analog converter device-2, digital-to-analog converter device-3 and digital-to-analog converter device-4 respectively, the converted analog signals output by digital-to-analog converter device-1 and digital-to-analog converter device-3 are selected as the chip select analog signals.

[0053] In some embodiments, the digital-analog chip select signal is determined according to a test environment.

[0054] In seismic exploration, the requirements for seismic instrument technical characteristics vary depending on the geological objectives and construction environments of different exploration areas. For example, when conducting exploration in the southwest, the impact of GPS signal duration and timing quality on node instrument information collection in dense forests and urban areas must be considered. When conducting exploration in western regions, the impact of drastic temperature fluctuations on clocks and noise must be considered. Furthermore, for specific exploration areas, instrument suitability testing is required before commencing geoexploration projects.

[0055] Based on the actual situation and test requirements, the digital-to-analog chip select signal can be used to determine whether to test multiple acquisition units or a single acquisition unit, and the four analog-to-digital converters can be switched or used in any combination for testing. Among them, the acquisition unit refers to the unit used to collect seismic signals.

[0056] Through the above method, according to different test environments and requirements, different digital-to-analog chip select signal instructions are used to process multiple converted analog signals, thereby improving adaptability to different test scenarios.

[0057] Step 240 : Analyze the digital signal to be tested based on the standard time information and the chip selection analog signal to obtain test index parameters.

[0058] In some embodiments, based on the standard time information and the chip-selected analog signal, a seismic instrument technical indicator algorithm is used to analyze the digital signal to obtain the test indicator parameters. The seismic instrument technical indicator algorithm refers to an algorithm for extracting the test indicator parameters from the digital signal to be tested.

[0059] Test index parameters are obtained through testing and are used to reflect the key technical characteristics of the instrument, such as the performance level of the seismic instrument and the adaptability of the seismic instrument to the environment.

[0060] Key technical characteristics of an instrument refer to important parameters or characteristics used to evaluate the performance and quality of an instrument used for seismic exploration. Key technical characteristics of an instrument may include at least one of the following indicators: noise drift, common-mode rejection ratio, inter-channel crosstalk isolation, harmonic distortion, gain error, system delay, timing error, high-cut filtering, etc. Other indicators used to evaluate the performance and quality of a seismic instrument may also be used, and this application does not limit these indicators.

[0061] Noise drift refers to the drift or fluctuation in the signal output by a seismic instrument or sensor over time during measurement or testing. This drift is typically caused by changes in the instrument's internal circuitry, components, or environmental conditions, resulting in continuous changes in the output signal even in the absence of external interference.

[0062] Common-Mode Rejection Ratio (CMRR) is an indicator that measures the ability of a circuit or signal processing system to suppress common-mode signals.

[0063] Inter-channel crosstalk isolation refers to the degree of mutual induction between signals of different simulated seismic channels, which is calculated by the ratio of effective signal to induced signal.

[0064] Harmonic distortion refers to the presence of nonlinear distortion in seismic signals, which results in the appearance of additional harmonic components in the seismic signal spectrum. This parameter is used to assess the clarity and accuracy of signals acquired by seismic instruments.

[0065] Gain Error refers to the difference between the actual gain and the ideal gain in a circuit or instrument.

[0066] System delay refers to the time it takes for a seismic signal to enter a seismic instrument and then reach the output of the seismic instrument.

[0067] Timing error refers to the error in the measurement or timing process, that is, the difference between the actual measurement result and the true value.

[0068] High-pass filtering is a signal processing technique used to remove low-frequency components and retain only high-frequency components. High-cut filters typically pass signals above a certain frequency while suppressing or eliminating signals below that frequency.

[0069] In some embodiments, based on standard time information, the chip select analog signal and the digital signal to be tested are time-calibrated to obtain a calibrated chip select analog signal and a calibrated digital signal to be tested; based on the calibrated chip select analog signal and the index standard signal, the calibrated digital signal to be tested is analyzed to obtain test index parameters, and the index standard signal is used to compare with the test index parameters.

[0070] The index standard signal is set according to the key technical characteristic indicators of the above-mentioned instruments, including standard signals such as sine signals, DC signals, pulse signals, and Ricker wavelet signals, which are used to analyze the obtained test index parameters for comparison and verify whether the performance of the seismic instrument meets the specifications or standard requirements. The index standard signal can indicate the standard indicators of the key technical characteristic indicators of the above-mentioned instruments. For example, the sine signal in the index standard signal can indicate the following standard indicators of the seismic instrument: noise zero drift, common mode rejection ratio, inter-channel crosstalk isolation, harmonic distortion, gain error, system delay, timing error, and high-cut filtering. Assuming that the obtained test index parameters also include noise zero drift, common mode rejection ratio, inter-channel crosstalk isolation, harmonic distortion, gain error, system delay, timing error, and high-cut filtering, the standard indicators in the standard signal can be compared with the indicators corresponding to the test index parameters to evaluate the performance of the seismic instrument.

[0071] In summary, the technical solution provided by the embodiment of the present application obtains an easy-to-process digital signal to be tested by signal conditioning the collected seismic signal, and then obtains the corresponding chip-selected analog signal based on the digital signal to be tested and the digital-to-analog chip select signal. Finally, based on the above-mentioned chip-selected analog signal and standard time information, the digital signal to be tested is analyzed to obtain test index parameters, thereby realizing automatic testing of the performance of the seismic instrument, reducing the test cycle, improving the testing efficiency of each seismic exploration instrument, facilitating the monitoring of the signal situation, and ensuring the smooth progress of the seismic exploration work.

[0072] The following is a brief introduction to the implementation process of the index testing method of seismic exploration instruments.

[0073] Please refer to Figure 3 , which shows a block diagram of an implementation method for testing indicators of seismic exploration instruments provided by one embodiment of the present application. The implementation process mainly includes seven main units: a main control unit, a timing unit, an analog-to-digital conversion unit, a digital-to-analog conversion unit, a data storage unit, a network transmission unit, and an on-camera display unit.

[0074] The main control unit is implemented using a Field-Programmable Gate Array (FPGA), which is used to store indicator standard signals and transmit each signal to the corresponding unit.

[0075] The timing unit uses a satellite timing system to provide accurate standard time information.

[0076] The analog-to-digital conversion unit includes an analog-to-digital conversion device for converting the collected seismic signal into a digital signal.

[0077] The digital-to-analog conversion unit includes four digital-to-analog conversion devices, namely digital-to-analog conversion device-1, digital-to-analog conversion device-2, digital-to-analog conversion device-3 and digital-to-analog conversion device-4, which are used to obtain a chip select analog signal based on the analog-to-digital chip select signal and the digital signal to be measured.

[0078] The data storage unit is used to store standard time information, digital signals to be measured, index standard signals and chip selection analog signals.

[0079] The network transmission unit is used to transmit standard time information, digital signals to be tested, index standard signals and chip selection analog signals to the upper machine position display unit.

[0080] The upper display unit is used to analyze the digital signal to be tested using the seismic instrument technical indicator algorithm and display the obtained test indicator parameters.

[0081] based on Figure 3 ,The implementation process of the index test method of seismic exploration instruments is as follows:

[0082] (1) The timing unit obtains standard time information and sends the standard time information to the main control unit;

[0083] (2) Storing the index standard signal in the read-only memory (ROM) of the main control unit;

[0084] (3) The analog-to-digital conversion unit converts the collected seismic signal into a digital signal to be measured through the analog-to-digital conversion device after filtering, amplification and digitization by the signal conditioning circuit, and transmits the digital signal to be measured to the main control unit;

[0085] (4) According to the test requirements and actual application conditions, the digital-analog chip select signal is sent through the main control signal to determine the test acquisition unit, the four digital-analog conversion devices included in the digital-analog conversion unit are switched or combined for testing, and the chip select analog signal is obtained, and the chip select analog signal is transmitted to the main control unit;

[0086] (5) The main control unit sends the standard time signal, the digital signal to be measured, the chip selection analog signal and the index standard signal to the data storage unit;

[0087] (6) The main control unit sends the standard time signal, the digital signal to be measured, the chip selection analog signal and the index standard signal to the upper machine position display unit through the network transmission unit;

[0088] (7) The upper display unit adopts the seismic instrument technical index algorithm, analyzes and compares the digital signal to be tested based on the standard time signal, the chip selection analog signal and the index standard signal, obtains the test index parameter, and displays the test index parameter.

[0089] Figure 3 The crystal oscillator, also known as the crystal oscillator, is an electronic oscillator component used to generate a stable frequency; the power supply unit is used to provide the power required by the seismic exploration instrument; the Joint Test Action Group (JTAG) debugging unit is a universal interface for standardized interfaces and protocols used to debug integrated circuits (ICs).

[0090] The following are device embodiments of the present application, which can be used to implement the method embodiments of the present application. For details not disclosed in the device embodiments of the present application, please refer to the method embodiments of the present application.

[0091] Please refer to Figure 4, which shows a block diagram of an index testing device for a seismic exploration instrument provided by an embodiment of the present application. The device has the function of implementing the above-mentioned method example, and the function can be implemented by hardware or by hardware executing corresponding software. The device can be the computer device 10 described above, or it can be set in the computer device 10. Figure 4 As shown, the apparatus 400 may include a signal acquisition module 410 , a signal conditioning module 420 , a digital-to-analog conversion module 430 and a signal analysis module 440 .

[0092] The signal acquisition module 410 is used to acquire seismic signals and standard time information. The seismic signals are analog signals collected after seismic waves propagate in underground media. The standard time information is used to calibrate the acquisition time of the seismic signals.

[0093] The signal conditioning module 420 is used to input the seismic signal into an analog-to-digital converter for signal conditioning to obtain a digital signal to be measured. The analog-to-digital converter is used to convert an analog signal into a digital signal.

[0094] The digital-to-analog conversion module 430 is used to obtain a chip select analog signal based on the digital signal to be tested and the digital-to-analog chip select signal, wherein the digital-to-analog chip select signal is used to indicate the combination mode of the digital-to-analog conversion device; wherein the digital-to-analog conversion device is used to convert the digital signal into an analog signal.

[0095] The signal analysis module 440 is configured to analyze the digital signal to be tested based on the standard time information and the chip selection analog signal to obtain test index parameters.

[0096] In some embodiments, the digital-to-analog converter 430 is used to input the digital signal to be tested into multiple digital-to-analog conversion devices to obtain multiple converted analog signals; and process the multiple converted analog signals according to the digital-to-analog chip select signal to obtain the chip select analog signal.

[0097] In some embodiments, the digital-analog chip select signal is determined according to a test environment.

[0098] In some embodiments, the signal conditioning module 420 is used to preprocess the seismic signal through the analog-to-digital conversion device to obtain a preprocessed seismic signal; and convert the preprocessed seismic signal through the analog-to-digital conversion device to obtain the digital signal to be measured.

[0099] In some embodiments, the preprocessing includes at least one of the following: filtering processing, amplification processing, calibration processing, and signal smoothing processing.

[0100] In some embodiments, the signal analysis module 440 is used to perform time calibration on the chip select analog signal and the digital signal to be tested based on the standard time information to obtain a calibrated chip select analog signal and a calibrated digital signal to be tested; based on the calibrated chip select analog signal and the index standard signal, the calibrated digital signal to be tested is analyzed to obtain the test index parameters, and the index standard signal is used to compare with the test index parameters.

[0101] In summary, the technical solution provided by the embodiment of the present application obtains an easy-to-process digital signal to be tested by signal conditioning the collected seismic signal, and then obtains the corresponding chip-selected analog signal based on the digital signal to be tested and the digital-to-analog chip select signal. Finally, based on the above-mentioned chip-selected analog signal and standard time information, the digital signal to be tested is analyzed to obtain test index parameters, thereby realizing automatic testing of the performance of the seismic instrument, reducing the test cycle, improving the testing efficiency of each seismic exploration instrument, facilitating the monitoring of the signal situation, and ensuring the smooth progress of the seismic exploration work.

[0102] It should be noted that the apparatus provided in the above embodiments, when implementing its functions, is only illustrated by the division of the above functional modules. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the apparatus and method embodiments provided in the above embodiments are based on the same concept. The specific implementation process is detailed in the method embodiment and will not be repeated here.

[0103] Please refer to Figure 5 , which shows a block diagram of a computer device 500 provided in one embodiment of the present application. The computer device 500 may be Figure 1 The computer device 10 in the illustrated implementation environment is used to implement the index testing method for seismic exploration instruments provided in the above embodiments. Specifically:

[0104] Typically, the computer device 500 includes a processor 510 and a memory 520 .

[0105] The processor 510 may include one or more processing cores, such as a 4-core processor, an 8-core processor, etc. The processor 510 may be implemented in at least one hardware form of digital signal processing (DSP), field programmable gate array (FPGA), and programmable logic array (PLA). The processor 510 may also include a main processor and a coprocessor. The main processor is a processor for processing data in the awake state, also known as a central processing unit (CPU); the coprocessor is a low-power processor for processing data in the standby state. In some embodiments, the processor 510 may be integrated with a graphics processing unit (GPU), which is responsible for rendering and drawing the content to be displayed on the display screen. In some embodiments, the processor 510 may also include an AI processor for processing computing operations related to machine learning.

[0106] The memory 520 may include one or more computer-readable storage media, which may be non-transitory. The memory 520 may also include high-speed random access memory and non-volatile memory, such as one or more magnetic disk storage devices or flash memory storage devices. In some embodiments, the non-transitory computer-readable storage media in the memory 520 is used to store a computer program, which is configured to be executed by one or more processors to implement the aforementioned index testing method for seismic exploration instruments.

[0107] Those skilled in the art will understand that Figure 5 The structure shown in the figure does not constitute a limitation on the computer device 500, and the computer device 500 may include more or fewer components than shown in the figure, or combine some components, or adopt a different component arrangement.

[0108] In an exemplary embodiment, a computer-readable storage medium is further provided, wherein a computer program is stored in the storage medium, and when the computer program is executed by a processor, the computer program implements the above-mentioned index testing method of the seismic exploration instrument. Optionally, the computer-readable storage medium may include: a read-only memory, a random access memory (RAM), a solid-state drive (SSD), or an optical disk. Among them, the random access memory may include a resistance random access memory (ReRAM) and a dynamic random access memory (DRAM).

[0109] In an exemplary embodiment, a computer program product is also provided, comprising a computer program stored in a computer-readable storage medium. A processor of a computer device reads the computer program from the computer-readable storage medium and executes the computer program, causing the computer device to perform the aforementioned index testing method for a seismic exploration instrument.

[0110] In this document, "plurality" refers to two or more. "And / or" describes a relationship between associated objects, indicating that three possible relationships exist. For example, "A and / or B" can mean: A exists alone, A and B exist simultaneously, or B exists alone. The character " / " generally indicates an "or" relationship between the associated objects.

[0111] The term “greater than or equal to” mentioned herein may mean greater than or equal to, or greater than, and the term “less than or equal to” may mean less than or equal to, or less than.

[0112] In addition, the step numbers described in this document only illustrate a possible execution order between the steps. In some other embodiments, the above steps may not be executed in the order of the numbers, such as two steps with different numbers are executed at the same time, or two steps with different numbers are executed in the opposite order of the diagram. The embodiments of the present application are not limited to this.

[0113] The above description is merely an exemplary embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A method for testing an index of a seismic exploration instrument, characterized in that: The method comprises: Acquiring seismic signals and standard time information, wherein the seismic signals are analog signals collected after seismic waves propagate through underground media, and the standard time information is used to calibrate the acquisition time of the seismic signals; Inputting the seismic signal into an analog-to-digital converter for signal conditioning to obtain a digital signal to be measured, wherein the analog-to-digital converter is used to convert the analog signal into a digital signal; Based on the digital signal to be measured and the digital-to-analog chip select signal, a chip select analog signal is obtained, wherein the digital-to-analog chip select signal is used to indicate a combination mode of a digital-to-analog conversion device; wherein the digital-to-analog conversion device is used to convert a digital signal into an analog signal; Based on the standard time information and the chip selection analog signal, the digital signal to be tested is analyzed to obtain test index parameters.

2. The method according to claim 1, characterized in that The step of obtaining a chip select analog signal based on the digital signal to be measured and the digital-to-analog chip select signal includes: Inputting the digital signal to be measured into the plurality of digital-to-analog conversion devices to obtain a plurality of converted analog signals; The multiple converted analog signals are processed according to the digital-to-analog chip select signal to obtain the chip select analog signal.

3. The method according to claim 1, characterized in that The digital-analog chip select signal is determined according to a test environment.

4. The method according to claim 1, wherein The step of inputting the seismic signal into an analog-to-digital converter for signal conditioning to obtain a digital signal to be measured comprises: preprocessing the seismic signal by the analog-to-digital conversion device to obtain a preprocessed seismic signal; The pre-processed seismic signal is converted by the analog-to-digital conversion device to obtain the digital signal to be measured.

5. The method according to claim 4, characterized in that The preprocessing includes at least one of the following: filtering processing, amplification processing, calibration processing, and signal smoothing processing.

6. The method according to claim 1, characterized in that The step of parsing the digital signal to be tested based on the standard time information and the chip select analog signal to obtain test index parameters includes: Based on the standard time information, time-calibrate the chip-select analog signal and the digital signal to be measured to obtain a calibrated chip-select analog signal and a calibrated digital signal to be measured; Based on the calibrated chip selection analog signal and the index standard signal, the calibrated digital signal to be tested is analyzed to obtain the test index parameter, and the index standard signal is used for comparison with the test index parameter.

7. An index testing device for a seismic exploration instrument, characterized in that: The device comprises: A signal acquisition module, configured to acquire seismic signals and standard time information, wherein the seismic signals are analog signals collected after seismic waves propagate through underground media, and the standard time information is used to calibrate the acquisition time of the seismic signals; A signal conditioning module, configured to input the seismic signal into an analog-to-digital converter for signal conditioning to obtain a digital signal to be measured, wherein the analog-to-digital converter is configured to convert the analog signal into a digital signal; A digital-to-analog conversion module, configured to obtain a chip-select analog signal based on the digital signal to be measured and a digital-to-analog chip select signal, wherein the digital-to-analog chip select signal is used to indicate a combination mode of a digital-to-analog conversion device; wherein the digital-to-analog conversion device is used to convert a digital signal into an analog signal; The signal analysis module is used to analyze the digital signal to be tested based on the standard time information and the chip selection analog signal to obtain test index parameters.

8. A computer device, characterized in that: The computer device includes a processor and a memory, wherein a computer program is stored in the memory, and the computer program is loaded and executed by the processor to implement the method according to any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that The storage medium stores a computer program, and the computer program is configured to be executed by a processor to implement the method according to any one of claims 1 to 6.

10. A computer program product, characterized in that The computer program product comprises a computer program, which is loaded and executed by a processor to implement the method according to any one of claims 1 to 6.

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