Inertial measurement assembly bulk testing system
CN120927032BActive Publication Date: 2026-08-28BEIJING INST OF COMP TECH & APPL
Patent Information
- Application Number
- CN202511211474.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-27
- Publication Date
- 2026-08-28
- Estimated Expiration
- 2045-08-27
AI Technical Summary
Technical Problem
这种测试系统一次只能测试一台惯性测量组件,测试效率和设备利用率极低,有必要提出一种惯性测量组件的批量测试系统,以提高生产和测试效率
Benefits of technology
[0018]本发明能够充分利用高精度电流源的驱动能力,将模拟电流以串行方式依次流过多个惯性测量组件。每一个惯性测量组件都能接受到相同幅值和精度的模拟电流信号,从而实现惯性测量组件的批量测试任务。本发明能够大幅度提升惯性测量组件的测试效率,提升测试设备的利用率。
✦ Generated by Eureka AI based on patent content.
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Figure CN120927032B_ABST
Abstract
The application discloses a batch test system for an inertial measurement assembly, and belongs to the technical field of inertial measurement assembly testing.The batch test system comprises a total power supply, a batch test box, a three-channel high-precision current source, a host computer test table and a test cable, wherein the total power supply is used for supplying power to the test system; the batch test box comprises a test box body, a switch panel and test positions, each test position comprising a secondary power supply module, a connector and an inertial measurement assembly; the three-channel high-precision current source is used for providing an analog current signal to the inertial measurement assembly; and the host computer test table is used for receiving an acceleration measurement value, storing and analyzing test data.The application can fully utilize the driving capacity of the high-precision current source, and make the analog current flow through multiple inertial measurement assemblies in a serial manner. Each inertial measurement assembly can receive an analog current signal with the same amplitude and precision, thereby realizing the batch test task of the inertial measurement assembly. The application can greatly improve the test efficiency of the inertial measurement assembly and the utilization rate of the test equipment.
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Citation Information
Patent Citations
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